JP2004194028A - Pulse mask waveform shaping supporting device - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To support the correction of a transceiver output setting value when the pulse mask measurement problem of communication equipment occurs. <P>SOLUTION: An output pulse 101 from the communication equipment 2 is measured by the pulse measurement part 11 of a pulse mask waveform shaping supporting device 1 and is compared with mask data 103 in a mask data storage part 12 in a mask judgement part 13. In the case that the result is not settled in a mask, the appropriate register setting value of a transceiver part 21 is computed in a shaping computation part 14 and setting is performed from a control terminal 3. Thus, all required pulse mask measurements can be cleared. <P>COPYRIGHT: (C)2004,JPO&NCIPI

Description

[0001]
TECHNICAL FIELD OF THE INVENTION
The present invention relates to a pulse mask waveform shaping support device that assists when shaping a pulse mask waveform of a communication device. Here, the communication device covers general devices having a communication interface such as a LAN port of a personal computer in addition to general communication devices such as a router and an exchange.
[0002]
[Prior art]
FIG. 8 is a block diagram showing a configuration of a conventional pulse waveform measurement system. A pulse mask is drawn on the screen of the digital oscilloscope 85 based on the pulse mask data indicating the allowable range of the digital pulse signal waveform stored in the data storage unit 82 of the personal computer 81.
[0003]
The control unit 84 receives an instruction from the personal computer 81, generates a digital pulse signal from the device 86, and similarly displays a waveform on the screen of the digital oscilloscope 85. The normality of the waveform of the digital pulse signal is determined based on whether or not the waveform of the digital pulse signal falls within the pulse mask. (For example, refer to Patent Document 1).
[0004]
[Patent Document 1]
FIG. 9 is a block diagram showing a configuration of a conventional waveform shaping circuit of an interface circuit. The resistors R ₁ and R ₂ are connected to the terminals X 1 and X 2 of the driver 10, and the respective diodes D ₁ and D ₂ constituting the waveform shaping circuit 20 are connected to the terminals X 1 and X 2. the commonly connected anode of _{D 1,} D ₂ - de is connected to the connection point of the resistors _R 3, _{R 4.} A pair of diodes D ₁ and D ₂ are connected to the pair of terminals X 1 and X ₂ , respectively, so that the potential is pulled up near the high level of the pair of terminals. As a result, the undershoot of the transmission pulse waveform can be reduced, and the transmission pulse waveform can be contained in a predetermined pulse mask. (For example, see Patent Document 2).
[0005]
[Patent Document 2]
JP-A-03-198414 [0006]
[Problems to be solved by the invention]
However, the conventional pulse mask determination device attempts to determine the mask itself of the pulse output from the communication device. That is, the main purpose is to perform pulse mask determination, and there is a problem that waveform shaping when there is a problem in the determination result is not considered. Although the output pulse can be originally contained in the mask by making the circuit around the transceiver a circuit recommended by the maker, the output pulse may actually deviate from the mask due to the wiring conditions of the substrate and the like. Some transceivers can be fine-tuned by changing the output level. However, pulse mask measurement is not one type, and it is necessary to clear multiple conditions for one interface such as data pulse and link pulse, speed difference such as 10Mbps and 100Mbps, peak voltage and jitter measurement, etc. It is difficult to find a set value that satisfies all conditions.
[0007]
Further, the conventional waveform shaping circuit aims to correct only the undershoot, and when there is a problem in the measurement result after the correction, there is a problem that further waveform shaping is not considered.
[0008]
The present invention has been made in view of the above problems, and the present invention makes it possible to easily perform a waveform shaping operation on a pulse mask waveform output from a communication device when the determination result has a problem. It is an object of the present invention to provide a possible pulse mask waveform shaping support device.
[0009]
[Means for Solving the Problems]
The present invention relates to a pulse measuring unit that measures a pulse output from a communication device, a mask data storing unit that stores mask data, and a mask that compares a measurement result of the pulse measuring unit with the mask data to determine a mask. Determining means; shaping means for shaping the pulse so as to be within the mask data; and display means for displaying the calculation result, wherein the shaping means adjusts the output level of the transceiver used in the communication device. It is characterized by calculating a register set value.
[0010]
BEST MODE FOR CARRYING OUT THE INVENTION
Next, embodiments of the present invention will be described in detail with reference to the drawings. FIG. 1 is a block diagram showing the configuration of the pulse mask waveform shaping support device according to the first embodiment of the present invention. In FIG. 1, the pulse mask waveform shaping support device 1 is assumed to be, for example, a personal computer having a digital oscilloscope function, and a communication device 2 is connected outside the pulse mask waveform shaping support device 1. The communication device 2 is connected to the control terminal 3. The pulse mask waveform shaping support device 1 and the communication device 2 are connected by a communication interface such as a LAN, for example, and the communication device 2 and the control terminal 3 are connected by a serial interface such as an RS232C.
[0011]
Further, the pulse mask waveform shaping support device 1 includes a pulse measuring unit 11, a mask data storage unit 12, a mask determining unit 13, a shaping operation unit 14, a result display unit 15, and a line termination unit 16. I have.
[0012]
The pulse measurement unit 11 receives the output pulse 101 from the communication device 2 and outputs pulse data 102 to the mask determination unit 13. The mask data storage unit 12 outputs the mask data 103 to the mask determination unit 13. The mask determination unit 13 receives the pulse data 102 from the pulse measurement unit 11 and the mask data 103 from the mask data storage unit 12, and outputs pulse mask data 104 to the shaping operation unit 14.
[0013]
The shaping operation unit 14 receives the pulse mask data 104 from the mask determination unit 13 and outputs register correction data 105 to the result display unit 15. The result display unit 15 receives the register correction data 105 from the shaping operation unit 14. The line termination unit 16 receives the output pulse 101 from the communication device 2 and terminates the line of the interface of the communication device. The line terminating unit 16 can be changed depending on the interface to be measured and the pulse mask.
[0014]
The communication device 2 has a transceiver unit 21 and an input / output unit 22. Transceiver unit 21 receives setting data 202 from control terminal 3 and outputs output data 201 to input / output unit 22. The input / output unit 22 receives the output data 201 from the transceiver 21 and outputs an output pulse 101 to the pulse measuring unit 11 and the line terminating unit 16. When the input / output unit 22 needs to detect a reception link as a condition for outputting a pulse, the line termination unit 16 may transmit a data pattern requested to the input / output unit 22. It is possible.
[0015]
The control terminal 3 outputs the setting data 202 to the transceiver unit 21. The control terminal 3 can correspond to any communication device by adjusting to the interface of the transceiver unit 21. However, in this case, it is also assumed that the setting data 202 is output in a method suitable for the transceiver unit 21 or that initial settings necessary for the transceiver unit 21 are performed via the setting data 202.
[0016]
Next, the operation of the pulse mask waveform shaping support apparatus according to the first embodiment of the present invention will be described in detail with reference to the drawings. FIG. 2 is a flowchart illustrating the operation of the pulse mask waveform shaping support device according to the first embodiment. FIG. 3 is a flowchart showing a detailed operation relating to the calculation of the output pulse level. First, the overall operation will be described with reference to FIG. In FIG. 2, after selecting a pulse mask to be measured in step (hereinafter referred to as “S”) 1 processing, pulse mask measurement is performed in step S2. Here, the selection of the pulse mask includes the selection of the line termination unit 16 in addition to the selection of the mask waveform.
[0017]
If there is no problem in the process of S2 (it fits in the mask), the process of S3 is performed. If there is a problem in the process of S2 (it does not fit in the mask), the process of S4 is performed. If all the necessary pulse mask measurements have been completed in the process of S3, the process is terminated. If the process has not been completed in S3, the process returns to S1 to change to an unmeasured pulse mask, and then performs measurement again. After calculating the changed register setting value in the process of S4, the result is displayed on the result display unit 15 in the process of S5. Further, the register value of the transceiver unit 21 is updated based on the result of S5 in the process of S6, and the process of S2 is performed again.
[0018]
Next, the processing content of S4 will be described with reference to FIG. In FIG. 3, after a list of points determined to be NG as a result of the pulse mask measurement is made in the process of S4-1, a correction plan of each NG point, that is, a plan of adjusting the output level of the transceiver is made in the process of S4-2. Create At this time, it is assumed that the pulse mask which has become a problem in the measurement of S2 reaches a level at which the pulse mask can be cleared.
[0019]
Next, a simulation is performed for all of the pulse masks required in the process of S4-3. If there is a problem with the pulse mask measurement, the process returns to S4-1 to correct the NG point again. However, since the accuracy of the simulation is limited, it is complemented by the actual measurement from S2 to S6. If there is no problem in the processing in S4-3, a register value to be set in the transceiver unit 21 is derived from the processing result in S4-2 in the processing in S4-4.
[0020]
In this embodiment, as shown in FIG. 4, for example, the functions of the mask data storage unit 12, the mask determination unit 13, the shaping operation unit 14, and the result display unit 15 of the pulse mask waveform shaping support device 1 are controlled by the control terminal 3. It may be realized. In this case, the configuration of the pulse mask waveform shaping support device 1 can be reduced, and the calculation result obtained by the shaping calculation unit 14 can be directly updated to the transceiver unit 21 without manual intervention. Become.
[0021]
Next, a second embodiment of the present invention will be described. FIG. 5 is a block diagram showing a configuration of a pulse mask waveform shaping support device according to the second embodiment of the present invention. The second embodiment shown in FIG. 5 is characterized in that the control terminal 3 and the setting data 202 shown in FIG. 1 are deleted, and the register correction data 105 is replaced with the circuit correction data 106. Are denoted by the same reference numerals.
[0022]
The functional difference between the second embodiment and the first embodiment is realized by adjusting the output level of the transceiver unit 21 in the first embodiment as means for shaping the waveform of the output pulse 101. On the other hand, the second embodiment is realized by changing the circuit configuration around the transceiver.
[0023]
Next, the operation of the second embodiment will be described in detail with reference to the drawings. FIG. 6 is a flowchart illustrating the operation of the pulse mask waveform shaping support device according to the second embodiment. FIG. 7 is a flowchart illustrating a detailed operation relating to the output pulse level calculation according to the second embodiment. First, the overall operation will be described with reference to FIG. In FIG. 6, after selecting a pulse mask to be measured in the process of S1, pulse mask measurement is performed in the process of S2. Here, the selection of the pulse mask includes the selection of the line termination unit 16 in addition to the selection of the mask waveform.
[0024]
If there is no problem in the process of S2 (it fits in the mask), the process of S3 is performed. If there is a problem in the processing of S2 (it does not fit in the mask), the processing of S4 'is performed. If all the necessary pulse mask measurements have been completed in the process of S3, the process is terminated. If the process has not been completed in S3, the process returns to S1 to change to an unmeasured pulse mask, and then performs measurement again.
[0025]
In the process of S4 ', a database of output pulses according to circuit and pattern wiring conditions is input in advance, and a proposal for changing constants of resistors and capacitors to be changed is presented from a simulation result obtained based on the circuit configuration of the communication device 2. I do. In the processing of S5 ', the processing content of S4' is displayed on the result display unit 15, and the circuit is changed in the processing of S6 'based on the display result of S5'.
[0026]
Next, the processing content of S4 'will be described with reference to FIG. In FIG. 7, after a list of points determined as NG as a result of the pulse mask measurement is made in the processing of S4-1, a correction plan of the circuit is created from the results of the NG points in the processing of S4′-2.
[0027]
Next, a simulation is performed for all of the pulse masks required in the process of S4-3. If there is a problem with the pulse mask measurement, the process returns to S4-1 to correct the NG point again. If there is no problem in the processing of S4-3, a correction circuit is determined from the result of the simulation in the processing of S4'-4.
[0028]
【The invention's effect】
As described above, according to the present invention, when a problem occurs due to the pulse mask measurement of the communication device, the setting value of the transceiver is automatically calculated, and the setting value satisfying the plurality of pulse mask conditions is calculated without trial and error. It is possible to do. Further, the calculated set values are considered for all necessary pulse masks, and there is no need to determine the optimum value while repeating measurement of different pulse masks.
[Brief description of the drawings]
FIG. 1 is a block diagram illustrating a configuration of a pulse mask waveform shaping support device according to a first embodiment of the present invention.
FIG. 2 is a flowchart illustrating an overall operation of the pulse mask waveform shaping support device according to the first embodiment.
FIG. 3 is a flowchart illustrating a detailed operation of an output pulse level calculation of the pulse mask waveform shaping support device according to the first embodiment.
FIG. 4 is a block diagram showing another example of the first embodiment.
FIG. 5 is a block diagram illustrating a configuration of a pulse mask waveform shaping support device according to a second embodiment of the present invention.
FIG. 6 is a flowchart illustrating an overall operation of the pulse mask waveform shaping support device according to the second embodiment.
FIG. 7 is a flowchart illustrating a detailed operation of an output pulse level calculation of the pulse mask waveform shaping support device according to the second embodiment.
FIG. 8 is a block diagram showing a configuration of a conventional pulse mask measurement method.
FIG. 9 is a block diagram showing a configuration of a conventional waveform shaping method of an interface circuit.
[Explanation of symbols]
Reference Signs List 1 pulse mask waveform shaping support device 2 communication device 3 control terminal 11 pulse measurement unit 12 mask data storage unit 13 mask determination unit 14 shaping calculation unit 15 result display unit 16 line termination unit 21 transceiver unit 22 input / output unit 101 output pulse 102 pulse Data 103 Mask data 104 Pulse mask data 105 Register correction data 106 Circuit correction data 201 Output data 202 Setting data

Claims (5)

Pulse measurement means for measuring a pulse output from the communication device, mask data storage means for storing mask data, mask determination means for performing a mask determination by comparing the measurement result of the pulse measurement means and the mask data, A shaping operation means for shaping the pulse to be included in the mask data; and a display means for displaying the operation result, wherein the shaping operation means sets a register setting value for adjusting an output level of a transceiver used in the communication device. A pulse mask waveform shaping support device characterized by performing calculations. 2. The pulse mask waveform shaping support apparatus according to claim 1, wherein the register value is updated automatically when the register setting value of the transceiver is changed. 2. The pulse mask waveform shaping support apparatus according to claim 1, further comprising a line terminating unit for terminating an interface of the communication device. 4. The pulse mask waveform shaping support apparatus according to claim 3, wherein a link detection data pattern is transmitted from said line termination means to a communication apparatus. 2. The pulse mask waveform shaping support apparatus according to claim 1, wherein said shaping calculation means calculates a circuit correction plan around a transceiver used in said communication device.

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