JP2004109431A - Flash photographing control method for camera - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a flash photographing control method for a camera for realizing the common use of an AF sensor and a sensor for light control with inexpensive and simple constitution. <P>SOLUTION: The flash photographing control method is used for the camera equipped with the AF sensor 16 receiving reflected light transmitted through a photographic lens 22 and outputting a signal, an AF control means performing focusing based on the detection signal from the sensor 16, and light emitting parts 27a and 27b radiating the light toward an object. Before normal light emission, the light emitting parts 27a and 27b are made to perform preliminary light emission several times so that emitted light quantity may differ, and normal emitted light quantity is decided by selecting one signal optimum for photography out of the signals from the sensor 16 corresponding to the reflected light by the preliminary light emission performed by each emitted light quantity. <P>COPYRIGHT: (C)2004,JPO

Description

【００８８】
次に本発光量算出処理中の各ステップについて詳細に説明する。
【００８９】
（オーバーフロー判定処理）
図１５は、ステップ１００のオーバーフロー判定処理の詳細な処理の流れを示すフロー図である。オーバーフロー判定処理（Ｓ１００）では、オーバーフローしたエリアの数及びどのアイランドがオーバーフローしたかの判定を行う。オーバーフローしている場合は、各アイランドを構成するセンサのモニタ出力が許容量を超えていることを意味し、これは予備発光時の発光量が大きすぎるか、被写体距離が短いなどの理由によりフラッシュの発光量が過分であることを意味する。
【００９０】
まず、処理を開始するにあたって、オーバーフローしていないエリア数を示す情報Ｎｎｏｖを０にリセットし、各アイランドごとのオーバーフロー判定フラグＮＯＶ（ｎ）にｆｆｈを入力し、リセットの状態にする（Ｓ１０１）。
【００９１】
次に、各アイランドことにフラッシュ発光時において実際に積分処理を行った電荷積分時間Ｔｆ（ｎ）が所定の積分時間Ｔｒｅｆであるかどうかについて判定する。すなわち、まず、第１アイランドについてＴｆ（１）の値がＴｒｅｆの値（２ｍｓ）であるかを判定し、そうでない場合はオーバーフローであるとして次の第２アイランドへの判定処理（Ｓ１０４）に移動する。
【００９２】
第１アイランドについてＴｆ（１）の値がＴｒｅｆの値（２ｍｓ）である場合は、所定時間の間強制的に電荷積分操作が終了しないということであるから、当該第１アイランドで構成されるエリアについては、オーバーフローはしておらず、Ｎｎｏｖに１を加えるとともに第１アイランドがオーバーフローしていないことを示すＮＯＶ（１）に０を入力する（Ｓ１０３）。
【００９３】
第２アイランドについてもＴｆ（２）の値がＴｒｅｆの値（２ｍｓ）であるかを判定し、そうでない場合はオーバーフローであると判断して次の第３アイランドの判定処理（Ｓ１０６）に移動する。
【００９４】
第２アイランドについても、Ｔｆ（２）の値がＴｒｅｆの値（２ｍｓ）である場合は、モニタ出力がオーバーフローしていないと判断される。そして、第２アイランドがオーバーフローしていないことを示すＮＯＶ（２）に０を入力する（Ｓ１０５）。なお、第２アイランドについては、第４アイランドとともに１つのエリアを構成するため、この段階ではオーバーフローしていないエリア数Ｎｎｏｖに１を加える処理は行われない。
【００９５】
引き続き、第３アイランドについては、上述の第１アイランドと同様の判定処理がなされ（Ｓ１０６，Ｓ１０７）、第４アイランドについては、上述の第２アイランドと同様の判定処理がなされる（Ｓ１０８，Ｓ１０９）。
【００９６】
そして、最後に第２アイランド又は第４アイランドのＴｆ（２）及びＴｆ（４）の値のうちいずれか一方がＴｒｅｆの値（２ｍｓ）であるであるかどうかについて再度判定し（Ｓ１１０）、いずれかがＴｒｅｆである場合は、当該中央エリアがオーバーフローしているとしてＮｎｏｖに１を加える処理を行う（Ｓ１１１）。
【００９７】
上記の処理により、すべてのアイランド及びエリアについてオーバーフローしているかどうかについての判定が終了する。
【００９８】
（反射光有無判定処理）
図１６は、ステップ１５０の反射光有無判定処理の詳細な処理の流れを示すフロー図である。反射光判定処理（Ｓ１５０）では、出力がオーバーフローでなくかつ反射光があったエリア数及び、どのアイランドからの出力がオーバーフロー出なくかつ反射光があったかについての判定を行う。反射光の有無は後述するように、定常光時のモニタ出力Ｖｔ（ｎ）と予備発光時のモニタ出力Ｖｆ（ｎ）との差をとることにより行われ、差が閾値を超えていない場合、すなわち、比発光時と予備発光時の被写体輝度に差が小さい場合は、予備発光時の発光量が小さすぎるか被写体距離が遠すぎるかなどの理由により、フラッシュの発光量が不足していることを意味する。
【００９９】
まず、処理を開始するにあたって、オーバーフローしておらずかつ反射光があるエリア数を示す情報Ｎｒｔｌを０にリセットし、オーバーフローしておらずかつ反射光があるかどうかを各アイランドごとに判定するフラグＲＴＬ（ｎ）をｆｆｈのコードを入力し、デフォルトの状態とする（Ｓ１５１）。
【０１００】
次に、各アイランドごとにモニタ出力がオーバーフローしていないか、かつ反射光が所定値以上であるかについて判断する。すなわち、まず、第１アイランドについて、先のオーバーフロー判定処理（Ｓ１０２）で判定したオーバーフロー判定フラグＮＯＶ（１）が０（すなわち、第１アイランドのモニタ出力がオーバーフローしていない。）であり、予備発光時のモニタ出力Ｖｆ（１）と定常光時のモニタ出力Ｖｔ（１）との差が第１アイランドについての閾値電圧Ｔｈ１よりも大きいかについて判断する（Ｓ１５２）。これらの条件を満たさない場合は、第１アイランドがオーバーフローである又は反射光が存在しないとして、次の第２アイランドへの判定処理（Ｓ１５４）に移動する。
【０１０１】
第１アイランドについてＮＯＶ（１）が０であり、かつ予備発光時のモニタ出力Ｖｆ（１）と定常光時のモニタ出力Ｖｔ（１）との差が第１アイランドについての閾値電圧Ｔｈ１よりも大きい場合は、オーバーフローしておらずかつ反射光があるエリア数を示す情報Ｎｒｔｌに１を加え、かつ、第１アイランドについて、オーバーフローなしかつ反射光ありを示す、ＲＴＬ（１）＝０を入力する（Ｓ１５３）。
【０１０２】
第２アイランドについても第１アイランドと同様のを判定を行い（Ｓ１５４）、条件を満たさない場合は次の第３アイランドの判定処理（Ｓ１５６）に移動する。
【０１０３】
第２アイランドについて、条件を満たすと判定された場合は（Ｓ１５４）、第２アイランドについて、オーバーフローなしかつ反射光ありを示す、ＲＴＬ（２）＝０を入力する（Ｓ１５５）。なお、第２アイランドについては、第４アイランドとともに１つの中央エリアを構成するため、オーバーフローしておらずかつ反射光があるエリア数を示す情報Ｎｒｔｌに１を加える処理は行われない。
【０１０４】
引き続き、第３アイランドについては、上述の第１アイランドと同様の判定処理がなされ（Ｓ１５６，Ｓ１５７）、第４アイランドについては、上述の第２アイランドと同様の判定処理がなされる（Ｓ１５８，Ｓ１５９）。
【０１０５】
そして、最後に第２アイランド（Ｓ１６０）又は第４アイランド（Ｓ１６１）について、モニタ出力がオーバーフローしていないか、かつ反射光が所定値以上であるかについて再度判断する。いずれかのアイランドにおいて条件を満たしている場合は、オーバーフローしておらずかつ反射光があるエリア数を示す情報Ｎｒｔｌに１を加える（Ｓ１６２）。
【０１０６】
上記の処理により、すべてのアイランド及びエリアについてオーバーフローしているかどうかについてかつ反射光が存在するかについての判定が終了する。
【０１０７】
なお、各アイランドごとに設定されている閾値電圧Ｔｈ１〜Ｔｈ４については、それぞれ同じ値でもよいし、各アイランドごとに変えていてもよい。本実施形態では、各アイランドごとの閾値電圧は一定に設定している。Ｔｈ１〜Ｔｈ４がそれぞれ異なる値を取る場合はそれぞれのアイランドの相対レベルをそろえることができる。すなわち、ＡＦセンサモジュールの光学的特性（開口面積）、各センサのモニタ出力特性や感度特性、温度や電源条件による出力のばらつき等の諸条件により、各アイランドが同じ出力結果となるように調整することができる。
【０１０８】
（モニタ電圧補正処理第１処理例）
図１７及び図１８は、ステップ２００のモニタ電圧補正処理の第１処理例について詳細な処理の流れを示すフロー図である。この第１処理例では、ＡＦセンサの合焦エリアのモニタ出力を基準として最終モニタ電圧係数Ｅｇａを算出する。そして、合焦エリアの出力が無効である場合、すなわち、オーバーフローしているか反射光が存在しない場合は、最大出力エリアから最終モニタ電圧係数Ｅｇａを算出する。
【０１０９】
この処理では、まず、各アイランドが合焦エリアであるか、かつ各アイランドのモニタ出力がオーバーフローでなく反射光が存在するかについて判断する。この判断は、多点焦点検出処理（図１０参照）において決定された合焦エリア（Ｓ４６）の情報を合焦エリア格納用ＲＡＭの情報及び、反射光有無判定処理（図１６）において決定された各アイランドごとのオーバーフローしておらずかつ反射光があるかどうかを判定するフラグＲＴＬ（ｎ）（Ｓ１５３，Ｓ１５５，Ｓ１５７，Ｓ１５９）の情報に基づいて行う。
【０１１０】
まず、第１アイランドについて、ＦｌＮａが１であり、かつフラグＲＴＬ（１）が０であるかについて判断する（Ｓ２０１）。これらの条件を満たさない場合は、順次第２、第４、第３アイランドの順に同様の判断を行う（Ｓ２０３，Ｓ２０５，Ｓ２０７）。なお、第２及び第４アイランドは２つで中央エリアを構成しているので、連続して判断処理を行っている。
【０１１１】
上記各ステップにおいて、合焦エリアであってかつモニタ出力がオーバーフローでなく反射光が存在する条件を満たす場合、このアイランドのモニタ出力を用いて最終モニタ電圧係数Ｅｇａを算出する（Ｓ２０２，Ｓ２０４、Ｓ２０６、Ｓ２０８）。最終モニタ電圧係数Ｅｇａは式（２）の演算式に基づいて算出される。
【０１１２】
【数２】

式（２）において、Ｃ（ｎ）は第ｎアイランドの電圧補正係数、Ｇ（ｎ）は第ｎアイランドのＣＣＤゲイン補正係数を示す。
【０１１３】
上記までのステップにおいて最終モニタ電圧係数Ｅｇａが算出されると、ガイドナンバーの算出ができる準備が完了したことを示すガイドナンバー算出ＮＧフラグに０を入力し（Ｓ２１０）、モニタ電圧補正処理を終了させる。
【０１１４】
合焦エリアであってかつモニタ出力がオーバーフローでなく反射光が存在する条件を満たすアイランドが存在しない場合、すなわち、合焦エリアのモニタ出力がオーバーフローしていたり、反射光が存在しないような場合は、引き続いてオーバーフローでないアイランドであってかつ最大出力電圧エリアの出力に基づいて最終モニタ電圧係数Ｅｇａの算出を行う処理を行う。
【０１１５】
当該処理においては、最初に最大のモニタ出力、すなわち定常光時のモニタ出力とフラッシュの予備発光時のモニタ出力の差が最大となるアイランドを判断する。そのために、最大モニタ出力の出力値を示すＶｍａｘの値を初期値記０に戻し、当該最大モニタ出力のアイランドを示すフラグＳｅｌＡｒｅａを０にリセットする（Ｓ２０９）。
【０１１６】
そして、第１アイランドから順にＲＴＬが０であるか、すなわち、モニタ出力がオーバーフローでなく、当該出力がそのときのＶｍａｘより大きいかを判断する（Ｓ２１１）。そして、条件を満たす場合は、Ｖｍａｘの値を置き換えるとともに、最大モニタ出力のアイランドを示すフラグＳｅｌＡｒｅａに１を入力する（Ｓ２１２）。なお、第１アイランドではＶｍａｘは０に戻されているため、ＲＴＬが０の値を有する場合は、無条件に第１アイランドのモニタ出力がそのときのＶｍａｘとなる。一方、条件を満たさない場合は、引き続き他のアイランドについての処理に移行する。
【０１１７】
引き続いて第２アイランドについても同様の判断を行う。すなわち、ＲＴＬが０であるか、また、モニタ出力が先のステップまでにおいて決定されたそのときのＶｍａｘの値よりも大きいかについて判断する（Ｓ２１３）。条件を満たす場合は、Ｖｍａｘの値を第２アイランドのモニタ出力に置き換えるとともに、最大モニタ出力のアイランドを示すフラグＳｅｌＡｒｅａに２を入力する（Ｓ２１４）。一方、条件を満たさない場合は、引き続き第３アイランドについての処理に移行する。
【０１１８】
第３及び第４アイランドについても同様に判断し（Ｓ２１５，Ｓ２１７）、条件を満たす場合は、ＶｍａｘとＳｅｌＡｒｅａの入力を行う（Ｓ２１６，Ｓ２１８）。
【０１１９】
ここまでのステップによって、ＳｅｌＡｒｅａの値が最大のモニタ出力を有するアイランドを示すため、ＳｅｌＡｒｅａの値を判断する（Ｓ２１９〜Ｓ２２２）。ＳｅｌＡｒｅａの値が０以外の場合は、ＳｅｌＡｒｅａの値のアイランドのモニタ出力を用いて最終モニタ電圧係数Ｅｇａを算出する（Ｓ２０２，Ｓ２０４，Ｓ２０６，Ｓ２０８）。上記までのステップにおいて最終モニタ電圧係数Ｅｇａが算出されると、ガイドナンバー算出ＮＧフラグに０を入力し、ガイドナンバーの算出ができることを示し（Ｓ２１０）て、モニタ電圧補正処理を終了させる。
【０１２０】
一方、Ｓ２１１〜Ｓ２１８までのいずれのステップにおいてもＶｍａｘおよびＳｅｌＡｒｅａの値が書き換えられなかった場合については、Ｓ２０９で設定されたようにＶｍａｘ＝０、ＳｅｌＡｒｅａ＝０となっている。すなわち、Ｓ２１９〜Ｓ２２２までの各ステップにおいて、ＳｅｌＡｒｅａの値が０である場合は、最大モニタ出力を有するアイランドが存在しないことになり、式（２）に基づいて最終モニタ電圧係数Ｅｇａの算出を行うことができない。この場合は、引き続き以下の処理を行うことによって最終モニタ電圧係数Ｅｇａを決定する。
【０１２１】
まず、先のオーバーフロー判定処理（図１５参照）において決定されたオーバーフローをしていないエリア数を示すフラグＮｎｏｖの値が３以下であるかどうかを判断する（Ｓ２２３）。
【０１２２】
Ｎｎｏｖ＝３である場合、すなわち、すべてのエリアがオーバーフローしている場合は、最大ガイドナンバー制御を行い、最終モニタ電圧係数Ｅｇａとして、あらかじめ定められている最大の最大ガイドナンバー制御時用電圧係数Ｅｇ＿ＧＮｍａｘを用いる（Ｓ２２４）。
【０１２３】
一方、Ｎｎｏｖが３より小さい場合、すなわち、少なくとも１つ以上のエリアがオーバーフローである場合は、最小ガイドナンバー制御を行い、最終モニタ電圧係数Ｅｇａとして、あらかじめ定められている最小の最小ガイドナンバー制御時用電圧係数Ｅｇ＿ＧＮｍｉｎを用いる（Ｓ２２５）。
【０１２４】
最後に、最終モニタ電圧係数Ｅｇａの算出ができず、本発光のガイドナンバーの算出ができないことを示すガイドナンバー算出ＮＧフラグに１を入力し（Ｓ２２６）、処理を終了させる。
【０１２５】
（モニタ電圧補正処理第２処理例）
次に、モニタ電圧補正処理（Ｓ２００）の第２処理例について説明する。図１９及び図２０は、モニタ電圧補正処理（Ｓ２００）の第２処理例について詳細な処理の流れを示すフロー図である。この第２処理例では、出力有効エリアのモニタ出力のみを加重平均して本発光時において用いられる最終モニタ電圧係数Ｅｇａを算出する。
【０１２６】
この処理では、各アイランドごとにオーバーフローしておらずかつ反射光があるかどうかを判断し、それぞれのアイランドごとの最終モニタ電圧係数Ｅｇａの値を算出する。すなわち、反射光有無判定処理（図１６参照）において、判断した各アイランドごとのＲＴＬに基づいて有効なモニタ出力があるか否かについて判断する。
【０１２７】
まず、第１アイランドについてＲＴＬ＝０であるかどうか、すなわち、第１アイランドのモニタ出力がオーバーフローしておらずかつ反射光が存在するかについて確認する（Ｓ２５０）。ＲＴＬ＝０である場合は、第１アイランドの電圧係数Ｅｇ１を０とする（Ｓ２５１）。
【０１２８】
一方、ＲＴＬが０でない場合、すなわち、有効なモニタ出力が存在する場合は、第１アイランドの電圧係数Ｅｇ１について、式（３）によって算出する。
【０１２９】
【数３】

式（３）において、Ｃ（ｎ）は第ｎアイランドの電圧補正係数、Ｇ（ｎ）は第ｎアイランドのＣＣＤゲイン補正係数を示す。
【０１３０】
以下、同様にして第２アイランドから第４アイランドについても判断処理を行い（Ｓ２５３，Ｓ２５６，Ｓ２５９）、各アイランドの電圧係数を決定する（Ｓ２５４，Ｓ２５５，Ｓ２５７，Ｓ２５８，Ｓ２６０，Ｓ２６１）。ただし、第４アイランドについては、第２アイランドが有効なモニタ出力を有しないことが条件として付加されており、中央エリアのアイランドの電圧係数Ｅｇｎについてどちらか一方のみを用いるようにしている。
【０１３１】
このようにして各アイランドごとの電圧係数Ｅｇｎの値が決定すると、図２０に示すように、オーバーフローでなくかつ反射光があるエリアのみ加算して最終モニタ電圧係数Ｅｇａを算出する。すなわち、まず、先の反射光有無判定処理において決定した、オーバーフローでなくかつ反射光があるエリアの数を表すＮｒｔｌの値が０であるかについて判断する（Ｓ２６２）。Ｎｒｔｌが０でない場合は、先のステップにより算出された各アイランドの電圧係数を合計し、Ｎｒｔｌの値（すなわち、有効なモニタ出力を有するエリア数）で割ることによって、各アイランドごとの平均を最終モニタ電圧係数Ｅｇａとする（Ｓ２６３ａ）。次いで、ガイドナンバーの算出ができる準備が完了したことを示すガイドナンバー算出ＮＧフラグに０を入力し（Ｓ２６４）、モニタ電圧補正処理を終了させる。
【０１３２】
一方、Ｎｒｔｌ＝０である場合、すなわちすべてのアイランドからのモニタ出力がオーバーフロー又は反射光がない場合ような場合は、オーバーフローしたアイランドの数によって最終モニタ電圧係数Ｅｇａを変化させるようにしている。
【０１３３】
まず、先のオーバーフロー判定処理（図１５参照）において決定されたオーバーフローをしていないエリア数を示すフラグＮｎｏｖの値が３以下であるかどうかを判断する（Ｓ２６５）。
【０１３４】
Ｎｎｏｖ＝３である場合、すなわち、すべてのエリアがオーバーフローしている場合は、最大ガイドナンバー制御を行い、最終モニタ電圧係数Ｅｇａとして、あらかじめ定められている最大の最大ガイドナンバー制御時用電圧係数Ｅｇ＿ＧＮｍａｘを用いる（Ｓ２６６）。
【０１３５】
一方、Ｎｎｏｖが３より小さい場合、すなわち、少なくとも１つ以上のエリアがオーバーフローである場合は、最小ガイドナンバー制御を行い、最終モニタ電圧係数Ｅｇａとして、あらかじめ定められている最小の最小ガイドナンバー制御時用電圧係数Ｅｇ＿ＧＮｍｉｎを用いる（Ｓ２６７）。
【０１３６】
最後に、最終モニタ電圧係数Ｅｇａの算出ができず、本発光のガイドナンバーの算出ができないことを示すガイドナンバー算出ＮＧフラグに１を入力し（Ｓ２６８）、処理を終了させる。
【０１３７】
（モニタ電圧補正処理第３処理例）
次に、モニタ電圧補正処理（Ｓ２００）の第３処理例について説明する。図２１は、モニタ電圧補正処理（Ｓ２００）の第３処理例について詳細な処理の流れを示すフロー図である。この第３処理例では、出力有効エリアのモニタ出力のみを指数平均して本発光時において用いられる最終モニタ電圧係数Ｅｇａを算出する。第３処理例においては、出力有効モニタの判定は、第２処理例と同様に行う（Ｓ２５０〜Ｓ２６１）。本処理例では、最終モニタ電圧係数Ｅｇａの算出において、大きいモニタ出力により大きなウェイトをおいて算出することができる。すなわち、モニタ出力が大きい場合、すなわち、近い距離にある被写体を優先して最終モニタ電圧係数Ｅｇａを決定する場合に有利な処理方法である。
【０１３８】
第２処理例と同様の処理により、各アイランドごとの電圧係数Ｅｇｎの値が決定すると、図２１に示すように、オーバーフローでなくかつ反射光があるエリアのみを指数平均して最終モニタ電圧係数Ｅｇａを算出する。すなわち、まず、先の反射光有無判定処理において決定した、オーバーフローでなくかつ反射光があるエリアの数を表すＮｒｔｌの値が０であるかについて判断する（Ｓ２６２）。Ｎｒｔｌが０でない場合は、式（４）に基づいて最終モニタ電圧係数を算出する（Ｓ２６３ｂ）。
【０１３９】
【数４】

【０１４０】
次いで、ガイドナンバーの算出ができる準備が完了したことを示すガイドナンバー算出ＮＧフラグに０を入力し（Ｓ２６４）、モニタ電圧補正処理を終了させる。
【０１４１】
一方、Ｎｒｔｌ＝０である場合、すなわちすべてのアイランドからのモニタ出力がオーバーフロー又は反射光がない場合ような場合は、オーバーフローしたアイランドの数によって最終モニタ電圧係数Ｅｇａを変化させるようにしている。
【０１４２】
まず、先のオーバーフロー判定処理（図１５参照）において決定されたオーバーフローをしていないエリア数を示すフラグＮｎｏｖの値が３以下であるかどうかを判断する（Ｓ２６５）。
【０１４３】
Ｎｎｏｖ＝３である場合、すなわち、すべてのエリアがオーバーフローしている場合は、最大ガイドナンバー制御を行い、最終モニタ電圧係数Ｅｇａとして、あらかじめ定められている最大の最大ガイドナンバー制御時用電圧係数Ｅｇ＿ＧＮｍａｘを用いる（Ｓ２６６）。
【０１４４】
一方、Ｎｎｏｖが３より小さい場合、すなわち、少なくとも１つ以上のエリアがオーバーフローである場合は、最小ガイドナンバー制御を行い、最終モニタ電圧係数Ｅｇａとして、あらかじめ定められている最小の最小ガイドナンバー制御時用電圧係数Ｅｇ＿ＧＮｍｉｎを用いる（Ｓ２６７）。
【０１４５】
最後に、最終モニタ電圧係数Ｅｇａの算出ができず、本発光のガイドナンバーの算出ができないことを示すガイドナンバー算出ＮＧフラグに１を入力し（Ｓ２６８）、処理を終了させる。
【０１４６】
（モニタ電圧補正処理第４処理例）
次に、モニタ電圧補正処理（Ｓ２００）の第４処理例について説明する。図２２及び図２３は、モニタ電圧補正処理（Ｓ２００）の第４処理例について詳細な処理の流れを示すフロー図である。この第４処理例では、オーバーフローしたアイランドの出力については、実際に積分された時間Ｖ０を用いて補正するとともに、補正されたモニタ出力を用いて出力最大エリアを選択し、最終モニタ電圧係数Ｅｇａを算出する。
【０１４７】
まず、各アイランドについて定常光時の積分時間の補正を行う（Ｓ２７０）。すなわち、所定積分時間Ｔｒｅｆ（２ｍｓ）と各アイランドの定常光時の積分時間Ｔｔ（ｎ）の比率に定常光時のモニタ出力電圧Ｖｔ（ｎ）を乗じて算出される補正された積分時間でのモニタ出力Ｖｔ’（ｎ）を算出する。すなわち、補正された積分時間でのモニタ出力Ｖｔ’（ｎ）は、積分時間と蓄積電荷とが比例の関係にあることを前提として、各アイランドごとに、飽和積分時間にわたって電荷積分が行われたと仮定した場合、該モニタ出力としての電圧Ｖｔ（ｎ）はどのような値を有するかについてを仮想的に算出するものである。
【０１４８】
次いで、各アイランドについての予備発光時の積分時間の補正を行う（Ｓ２７１）。すなわち、予備発光時でのモニタ出力についても、補正された積分時間でのモニタ出力Ｖｆ’（ｎ）を算出する。
【０１４９】
その後、補正された積分時間でのモニタ出力Ｖｔ’（ｎ）及びＶｆ’（ｎ）を用いて、式（５）に基づいて各アイランドごとに電圧係数Ｅｇｎを算出する（２７２〜Ｓ２７５）。
【０１５０】
【数５】

式（５）において、Ｃ（ｎ）は第ｎアイランドの電圧補正係数、Ｇ（ｎ）は第ｎアイランドのＣＣＤゲイン補正係数を示す。
【０１５１】
次に、図２３に示すように、先のステップで算出された各アイランドのＥｇｎのうち最大のものを用いて最終モニタ電圧係数Ｅｇａを算出する処理を行う。まず、オーバーフロー判定処理（図１５参照）において導かれたオーバーフローしていないエリア数を示すＮｎｏｖが３であって、かつ、反射光有無判定処理（図１６参照）において導かれたオーバーフローしておらず反射光を有するエリア数を示すＮｒｔｌが０であるかについて判断する（Ｓ２８０）。すなわち、このステップでは、３つのエリアのモニタ出力がすべて定常光時のモニタ出力と予備発光時のモニタ出力の差が閾値Ｔｈを超えていないかについてを判断する。
【０１５２】
このステップの条件を満たす場合は、最大ガイドナンバー制御を行い、最終モニタ電圧係数Ｅｇａとして、あらかじめ定められている最大の最大ガイドナンバー制御時用電圧係数Ｅｇ＿ＧＮｍａｘを用いる（Ｓ２９４）。そして、最終モニタ電圧係数Ｅｇａの算出ができず、本発光のガイドナンバーの算出ができないことを示すガイドナンバー算出ＮＧフラグに１を入力し（Ｓ２９５）、処理を終了させる。
【０１５３】
一方、上記Ｓ２８０の条件を満たさない場合は、最大出力エリアの選択を開始する。まず、Ｅｇｍａｘを０にリセットする（Ｓ２８１）。そして、先のステップでそれぞれ算出されたＥｇｎがＥｇｍａｘの値を超えているかについて、各アイランドごとに判断する。
【０１５４】
すなわち、第１アイランドについては、先のＳ２７２で算出されたＥｇ１がＥｇｍａｘよりも大きいかについて判断し（Ｓ２８２）、Ｅｇ１＞Ｅｇｍａｘである場合には、Ｅｇｍａｘの値をＥｇ１の値に書き換える（Ｓ２８３）。
【０１５５】
同様に、第２から第４アイランドについてもＥｇｎとＥｇｍａｘの比較を行い（Ｓ２８４，Ｓ２８６，Ｓ２８８）、そのときのＥｇｍａｘよりも大きい値を有している場合は、当該アイランドのＥｇｎの値をＥｇｍａｘの値に書き換える（Ｓ２８５，Ｓ２８７、Ｓ２８９）。
【０１５６】
このようにして各アイランドの電圧係数のうち最大のものが決定すると、当該Ｅｇｍａｘの値が所定の最小ガイドナンバー制御時用電圧係数Ｅｇ＿ＧＮｍｉｎよりも大きいか否かについて判断する（Ｓ２９０）。Ｅｇｍａｘの値がＥｇ＿ＧＮｍｉｎの値よりも大きい場合には、最終モニタ電圧係数Ｅｇａに所定の最小ガイドナンバー制御時用電圧係数Ｅｇ＿ＧＮｍｉｎを採用する（Ｓ２９３）。そして、最終モニタ電圧係数Ｅｇａの算出ができず、本発光のガイドナンバーの算出ができないことを示すガイドナンバー算出ＮＧフラグＧＮＣａｌｃＮＧ＿Ｆに１を入力し（Ｓ２９５）、処理を終了させる。
【０１５７】
一方、Ｓ２９０でＥｇｍａｘの値がＥｇ＿ＧＮｍｉｎの値よりも小さい場合には、最終モニタ電圧係数Ｅｇａとして、Ｅｇｍａｘを採用し（Ｓ２９１）、ガイドナンバーの算出ができる準備が完了したことを示すガイドナンバー算出ＮＧフラグに０を入力し（Ｓ２９２）、モニタ電圧補正処理を終了させる。
【０１５８】
（モニタ電圧補正処理第５処理例）
次に、モニタ電圧補正処理（Ｓ２００）の第５処理例について説明する。図２４は、モニタ電圧補正処理（Ｓ２００）の第５処理例について詳細な処理の流れを示すフロー図である。この第２処理例においては、オーバーフローしたアイランドの出力については、実際に積分された時間Ｖ０を用いて補正するとともに、補正されたモニタ出力から算出された電圧係数を加重平均して最終モニタ電圧係数Ｅｇａを算出する。
【０１５９】
オーバーフローしたアイランドの出力について補正し、各アイランドの電圧係数を算出する処理（Ｓ２７０〜Ｓ２７５）については、第４処理例と同様に行う（図２２参照）。
【０１６０】
次に、オーバーフロー判定処理（図１５参照）において導かれたオーバーフローしていないエリア数を示すＮｎｏｖが３であって、かつ、反射光有無判定処理（図１６参照）において導かれたオーバーフローしておらず反射光を有するエリア数を示すＮｒｔｌが０であるかについて判断する（Ｓ３００）。すなわち、このステップでは、３つのエリアのモニタ出力がすべて定常光時のモニタ出力と予備発光時のモニタ出力の差が閾値Ｔｈを超えていないことを判断する。
【０１６１】
このステップの条件を満たす場合は、最大ガイドナンバー制御を行い、最終モニタ電圧係数Ｅｇａとして、あらかじめ定められている最大の最大ガイドナンバー制御時用電圧係数Ｅｇ＿ＧＮｍａｘを用いる（Ｓ３０６）。そして、最終モニタ電圧係数Ｅｇａの算出ができず、本発光のガイドナンバーの算出ができないことを示すガイドナンバー算出ＮＧフラグに１を入力し（Ｓ３０７）、処理を終了させる。
【０１６２】
一方、上記Ｓ２８０の条件を満たさない場合は、第２アイランドと第４アイランドのうち出力の大きいほうのアイランド（Ｓ３０１）と、他のアイランドの電圧係数Ｅｇｎを加重平均し（Ｓ３０２）、この算出結果を仮の最終モニタ電圧係数Ｅｇａとして採用する。
【０１６３】
このようにして仮のＥｇａが決定すると、当該Ｅｇａの値が所定の最小ガイドナンバー制御時用電圧係数Ｅｇ＿ＧＮｍｉｎよりも大きいか否かについて判断する（Ｓ３０３）。Ｅｇａの値がＥｇ＿ＧＮｍｉｎの値よりも大きい場合には、最終モニタ電圧係数Ｅｇａに所定の最小ガイドナンバー制御時用電圧係数Ｅｇ＿ＧＮｍｉｎを採用する（Ｓ３０５）。そして、最終モニタ電圧係数Ｅｇａの算出ができず、本発光のガイドナンバーの算出ができないことを示すガイドナンバー算出ＮＧフラグＧＮＣａｌｃＮＧ＿Ｆに１を入力し（Ｓ３０７）、処理を終了させる。
【０１６４】
一方、Ｓ３０２でＥｇｍａｘの値がＥｇ＿ＧＮｍｉｎの値よりも小さい場合には、最終モニタ電圧係数Ｅｇａとして、当該仮のＥｇａの値を採用し、ガイドナンバーの算出ができる準備が完了したことを示すガイドナンバー算出ＮＧフラグに０を入力する（Ｓ３０４）、モニタ電圧補正処理を終了させる。
【０１６５】
（モニタ電圧補正処理第６処理例）
次に、モニタ電圧補正処理（Ｓ２００）の第６処理例について説明する。図２５は、モニタ電圧補正処理（Ｓ２００）の第６処理例について詳細な処理の流れを示すフロー図である。この第２処理例においては、オーバーフローしたアイランドの出力については、実際に積分された時間Ｖ０を用いて補正するとともに、全エリア出力を指数平均して最終モニタ電圧係数Ｅｇａを算出する。オーバーフローしたアイランドの出力について補正する処理については、第４処理例と同様に行う。
【０１６６】
オーバーフローしたアイランドの出力について補正し、各アイランドの電圧係数を算出する処理（Ｓ２７０〜Ｓ２７５）については、第４処理例と同様に行う（図２２参照）。
【０１６７】
次に、オーバーフロー判定処理（図１５参照）において導かれたオーバーフローしていないエリア数を示すＮｎｏｖが３であって、かつ、反射光有無判定処理（図１６参照）において導かれたオーバーフローしておらず反射光を有するエリア数を示すＮｒｔｌが０であるかについて判断する（Ｓ３１０）。すなわち、このステップでは、３つのエリアのモニタ出力がすべて定常光時のモニタ出力と予備発光時のモニタ出力の差が閾値Ｔｈを超えていないことを判断する。
【０１６８】
このステップの条件を満たす場合は、最大ガイドナンバー制御を行い、最終モニタ電圧係数Ｅｇａとして、あらかじめ定められている最大の最大ガイドナンバー制御時用電圧係数Ｅｇ＿ＧＮｍａｘを用いる（Ｓ３１５）。そして、最終モニタ電圧係数Ｅｇａの算出ができず、本発光のガイドナンバーの算出ができないことを示すガイドナンバー算出ＮＧフラグに１を入力し（Ｓ３１６）、処理を終了させる。
【０１６９】
一方、上記Ｓ２８０の条件を満たさない場合は、各アイランドごとの電圧係数Ｅｇｎを指数平均し（Ｓ３１１）、この算出結果を仮の最終モニタ電圧係数Ｅｇａとして採用する。
【０１７０】
このようにして仮のＥｇａが決定すると、当該Ｅｇａの値が所定の最小ガイドナンバー制御時用電圧係数Ｅｇ＿ＧＮｍｉｎよりも大きいか否かについて判断する（Ｓ３１２）。Ｅｇａの値がＥｇ＿ＧＮｍｉｎの値よりも大きい場合には、最終モニタ電圧係数Ｅｇａに所定の最小ガイドナンバー制御時用電圧係数Ｅｇ＿ＧＮｍｉｎを採用する（Ｓ３１４）。そして、最終モニタ電圧係数Ｅｇａの算出ができず、本発光のガイドナンバーの算出ができないことを示すガイドナンバー算出ＮＧフラグＧＮＣａｌｃＮＧ＿Ｆに１を入力し（Ｓ３１６）、処理を終了させる。
【０１７１】
一方、Ｓ３１２でＥｇｍａｘの値がＥｇ＿ＧＮｍｉｎの値よりも小さい場合には、最終モニタ電圧係数Ｅｇａとして、当該仮のＥｇａの値を採用し、ガイドナンバーの算出ができる準備が完了したことを示すガイドナンバー算出ＮＧフラグに０を入力する（Ｓ３１３）、モニタ電圧補正処理を終了させる。
【０１７２】
このように上述の第１乃至第６処理例のいずれかのモニタ電圧補正処理により求められた最終モニタ電圧係数Ｅｇａは、図１４に示すように、本発光のガイドナンバーを算出するために用いられる（Ｓ３５０）。
【０１７３】
なお、第１乃至第６処理例のいずれかのモニタ電圧補正処理が、図８及び図９における撮影動作処理において行われた場合は、本発光のガイドナンバーの算出ができないことを示すガイドナンバー算出ＮＧフラグＧＮＣａｌｃＮＧ＿Ｆに１が入力されると、１回目の予備発光では予備発光のやり直しを行い、２回目の予備発光では求められた最終モニタ電圧係数を用いて本発光量の算出を行うこととなる。
【０１７４】
（フラッシュ本発光制御）
図２６は、ステップ２５のフラッシュ本発光制御処理の処理の流れを示すフロー図である。まず、予備発光に用いるフラッシュ内蔵フラッシュが外付けフラッシュであるかを判断する（Ｓ９１）。
【０１７５】
外付けフラッシュを用いる場合は、カメラ−フラッシュ交信を行い（Ｓ９２）、先のモニタ電圧補正処理において求められた最終モニタ電圧係数Ｅｇａを用いて算出された本発光用のガイドナンバーをセットする。一方、内蔵フラッシュを用いて予備発光させる場合は、カメラＣＰＵ１１はフラッシュ制御モジュール２６に本発光用のガイドナンバーを送信し、発光準備処理を行う（Ｓ７３）。
【０１７６】
フラッシュの発光準備が終了すると、フラッシュの発光が開始される（Ｓ９４）。フラッシュ制御モジュール２６は、本発光用のガイドナンバーにしたがって所定光量の制御を行う（Ｓ９５）。そして、発光量が所定光量に達するとフラッシュの発光が終了する（Ｓ９６）。
【０１７７】
以上説明したように、本実施形態にかかる閃光撮影制御方法によれば、ＡＦセンサをフラッシュの調光用のセンサとしても利用するため、部品点数を少なくすることができるとともに、本発光に先立って予備発光させて、その結果に基づいて本発光のガイドナンバーを決定することとしているため、被写体光をＡＦセンサに導くための構成を簡単なものとすることができる。
【０１７８】
また、制御可能範囲の狭いＡＦセンサを用いた場合であっても、調光制御に用いるモニタ出力を選択して採用することにより、本発光の発光量を的確に算出することができる。
【０１７９】
なお、本発明は上記実施形態に限定されるものではなく、その他種々の態様で実施可能である。
【０１８０】
例えば、上記実施形態では、メインミラーのある銀塩フィルム用の一眼レフカメラに用いられる閃光撮影制御方法について説明しているが、この方法は一眼レフタイプのデジタルカメラにおいても使用することができる。この場合、オートフォーカス用のＡＦセンサとして、撮影用の撮像素子が用いられていることが多く、当該撮像素子の一部をＡＦセンサ及び調光制御用のセンサとして用いる。
【図面の簡単な説明】
【図１】外付けのフラッシュ装置を用いた本発明の一実施形態に係るカメラの構成図である。
【図２】カメラ本体に内蔵されているフラッシュ装置を用いた本発明の一実施形態に係るカメラの構成図である。
【図３】図１及び図２のカメラの制御系の構成を示すブロック図である。
【図４】図１及び図２のカメラに用いられているマルチＡＦセンサの構成を示す図である。
【図５】本実施形態にかかるカメラの撮影動作全体の処理の流れを示すフロー図である。
【図６】図５の撮影処理におけるフラッシュの発光制御の各信号のタイミングチャートである。
【図７】図５の第１変形例にかかるカメラの撮影動作の処理の流れを示すフロー図である。
【図８】図５の第２変形例にかかるカメラの撮影動作の処理の流れを示すフロー図である。
【図９】図９は図５の第３変形例にかかるカメラの撮影動作の処理の流れを示すフロー図である。
【図１０】多点測距の処理の流れを示すフロー図である。
【図１１】モニタ積分（定常光）での処理の流れを示すフロー図である。
【図１２】積分時間と蓄積電荷との関係を示す図である。
【図１３】フラッシュ予備発光の処理の流れを示すフロー図である。
【図１４】本発光量算出の処理の流れの概略を示すフロー図である。
【図１５】オーバーフロー判定処理（Ｓ１００）の詳細な処理の流れを示すフロー図である。
【図１６】反射光有無判定処理の詳細な処理の流れを示すフロー図である。
【図１７】モニタ電圧補正処理の第１処理例について詳細な処理の流れを示すフロー図である。
【図１８】モニタ電圧補正処理の第１処理例について詳細な処理の流れを示すフロー図である。
【図１９】モニタ電圧補正処理の第２処理例について詳細な処理の流れを示すフロー図である。
【図２０】モニタ電圧補正処理の第２処理例について詳細な処理の流れを示すフロー図である。
【図２１】モニタ電圧補正処理の第３処理例について詳細な処理の流れを示すフロー図である。
【図２２】モニタ電圧補正処理の第４処理例について詳細な処理の流れを示すフロー図である。
【図２３】モニタ電圧補正処理の第４処理例について詳細な処理の流れを示すフロー図である。
【図２４】モニタ電圧補正処理の第５処理例について詳細な処理の流れを示すフロー図である。
【図２５】モニタ電圧補正処理の第６処理例について詳細な処理の流れを示すフロー図である。
【図２６】フラッシュ本発光制御処理の処理の流れを示すフロー図である。
【符号の説明】
１ａ，１ｂ　カメラ
２　カメラ本体
３　レンズ
４　外付けフラッシュ装置
１０　カメラ筐体
１１　カメラＣＰＵ
１２　ペンタプリズム
１３　メインミラー
１４　サブミラー
１５　焦点検出モジュール
１６　マルチＡＦセンサ
１７　シャッター
１８　撮像手段
１９　シャッター制御ユニット
２０　測光モジュール
２１　レンズ筐体
２２　撮影レンズ
２３　ズームエンコーダ
２４　レンズＣＰＵ
２５　外付けフラッシュ装置筐体
２６　フラッシュ制御モジュール
２７ａ，２７ｂ　発光部
２８　ＤＸ回路
２９　絞り駆動部[0001]
TECHNICAL FIELD OF THE INVENTION
The present invention relates to a flash photography control method used for flash photography in a camera having a TTL autofocus device such as a single-lens reflex camera using a film or a single-lens reflex digital camera, and particularly to a pre-flash, and as a result, a pre-flash is obtained. A flash photography control method for controlling the main light emission amount based on the obtained information.
[0002]
[Prior art]
As a method of controlling the amount of light emitted from the camera flash, so-called flashmatic control that controls the amount of light emission based on the subject distance and the set aperture value, or measuring the amount of reflected light from the film surface in parallel with the exposure of the film, TTL direct light control, which stops flash emission when the light amount reaches a predetermined value, is known.
[0003]
For example, Japanese Patent Application Laid-Open No. 62-66239 discloses a technique in which a light flux at the time of flash emission is measured by an AF sensor, and a light quantity integrated output of the AF sensor is detected to arbitrate the flash light quantity. In this technique, light reflected from the film surface during exposure of the film is guided to an AF sensor. Then, the flash emission is stopped when the light emission amount reaches a certain value by TTL direct light control.
[0004]
The above technology uses a dimming sensor for detecting reflected light of a subject together with an autofocus sensor (hereinafter abbreviated as an AF sensor) used for distance measurement and focus detection, so that dimming can be performed with one sensor. By performing distance measurement and focus detection, the space for disposing the light control sensor is omitted to reduce the size of the camera, and the light control sensor is omitted to reduce the cost of the camera.
[0005]
However, this technology can reflect the subject light by the mirror at the autofocus stage and guide the subject light to the AF sensor. However, since the mirror needs to be retracted at the time of shooting, the mirror can be used. As a result, a means for guiding the subject light reflected from the film surface to the AF sensor is required separately (see FIGS. 1 and 2 of the publication). Therefore, the mechanism in the vicinity of the mirror becomes complicated, and the number of necessary parts increases, resulting in an increase in size and cost of the camera.
[0006]
Further, Japanese Patent Application Laid-Open No. H11-190871 discloses a technique of performing flash light control by detecting the amount of light reflected from a film surface by an AF sensor during flash photography. That is, similarly to the above-mentioned technology, the same element unit is shared for autofocus and TTL direct light control. However, this technique also requires a configuration to guide the subject light to the AF sensor and to guide the subject light to the AF sensor at the autofocus stage.
[0007]
As described above, in order to share the AF sensor and the flash dimming sensor, it is necessary to solve the problem of how to guide the subject light having different reflection angles to the AF sensor before and after the mirror is retracted. However, in the TTL direct light control, it is difficult to reduce the number of components by omitting a mechanism for guiding the subject light reflected on the film surface by retracting the main mirror during photographing to the AF sensor.
[0008]
On the other hand, in Japanese Patent Application Laid-Open No. 8-248468, the reflectance of the subject is obtained from preliminary light emission information measured by the AF sensor before the mirror is retracted, and the reflectance is the most standard using a dimming sensor different from the AF sensor. A technology for performing TTL direct light control in a cell close to the above has been disclosed.
[0009]
However, in the above-described technology, the AF sensor and the light control sensor are not shared, and thus the size and cost of the camera cannot be reduced.
[0010]
On the other hand, in the flash dimming control, the flash is preliminarily fired at the time of release, the amount of reflected light from the subject due to the preflash is monitored, and control for determining the main flash amount based on the output from the monitor (so-called preflash) Dimming control). In this preliminary light emission dimming control, a special light emission is performed before the mirror is retracted, the light emission amount of the main light emission is calculated based on the subject luminance at the time of the preliminary light emission, and then the mirror is retracted to start the exposure. It is also considered that the AF sensor and the dimming sensor can be shared without providing a simple mechanism.
[0011]
However, the controllable range of the monitor of the AF sensor is generally narrow, and it is difficult to use the monitor as a light control sensor when the subject light is guided to the AF sensor along the same optical path as the AF control. In other words, when preliminary light emission before shooting is performed, if a subject with a high reflectance or a subject distance is short, there is a large amount of reflected light, and overflow occurs. Conversely, if a subject with a low reflectance or the subject distance is long, there is little reflected light. Therefore, in any case, information necessary for calculating the main light emission amount cannot be accurately obtained, and highly accurate dimming control cannot be performed.
[0012]
On the other hand, if a high-performance light receiving element having a wide controllable range is used for the AF sensor, the cost of the camera will increase.
[0013]
[Patent Document 1]
JP-A-62-66239
[Patent Document 2]
JP-A-11-190871
[Patent Document 3]
JP-A-8-248468
[0014]
[Problems to be solved by the invention]
Therefore, a technical problem to be solved by the present invention is to provide a flash photography control method for a camera which enables realization of sharing of an AF sensor and a dimming sensor with a low-cost and simple configuration.
[0015]
[Means for Solving the Problems and Their Functions and Effects]
In order to solve the above-mentioned technical problem, the present invention preliminarily emits the light emitting portion a plurality of times by varying the light emission amount prior to the main light emission, and corresponds to the reflected light due to the preliminary light emission at the respective light emission amounts. A flash photography control method for a camera, characterized in that one of the signals optimal for photography is selected from the signals from the AF sensor to determine the main light emission amount.
[0016]
A flash photographing control method for a camera according to the present invention includes an AF sensor that receives reflected light transmitted through a photographing lens and outputs a signal; an AF control unit that performs focus adjustment based on a detection signal from the AF sensor; And a light emitting unit that emits light toward the camera.
[0017]
The camera used in the flash photography control method according to the present invention is a camera having a so-called TTL autofocus function. The AF sensor of the camera is commonly used for the autofocus function and the control for determining the main light emission amount.
[0018]
In this flash photography control method, the light-emitting unit is made to perform preliminary light emission a plurality of times by varying the amount of light emission, and among the signals from the AF sensor in each preliminary light emission, a signal optimal for photographing is selected. Although the number of times of preliminary light emission is not limited, an increase in the number of times of preliminary light emission performed during the release routine increases the time lag from the start of release to the start of exposure, so it is preferable to set an upper limit. The light emission amount of the main light emission is determined based on the selected signal.
[0019]
According to the above-described method, the light emission amount of the preliminary light emission is changed to emit light a plurality of times, thereby reducing the probability of being out of the controllable range of the AF sensor. That is, the controllable range of the AF sensor can be substantially expanded, and a camera using an AF sensor with a narrow controllable range as a light control sensor can be put to practical use. Therefore, a member for securing the optical path of the subject light can be omitted, and the configuration of the camera can be simplified and the cost can be reduced.
[0020]
Further, in a single-lens reflex digital camera, TTL light control can be performed without a monitor function for a CCD for image capturing.
[0021]
In a second aspect of the present invention, the signal corresponding to the reflected light in the light emission amount of the first preliminary light emission is the light emission amount of the light emitting unit at the time of the main light emission. This is done when there is no valid value that can be determined.
[0022]
Therefore, when a valid signal is output in the previous preliminary light emission, the subsequent preliminary light emission is not performed, so that the release time lag can be shortened.
[0023]
According to a third aspect of the present invention, the light emission amount in the second and subsequent preliminary light emission of the plurality of preliminary light emission changes according to whether the signal is in an overflow state or in a state without reflected light. It was made.
[0024]
For example, if the light emission amount in the previous preliminary light emission is large and the signal of the AF sensor is in an overflow state, the light emission amount in the subsequent preliminary light emission is made smaller, and conversely, the light emission amount of the previous preliminary light emission is Is small and there is no reflected light, the amount of light emission at the time of preliminary light emission can be further increased.
[0025]
According to the above method, the light emission amount can be adjusted according to the state of the signal from the AF sensor in the previous preliminary light emission so that the signal in the subsequent preliminary light emission becomes a valid value. Therefore, it is possible to reduce the probability that the detection result at the time of the preliminary light emission is out of the controllable range of the AF sensor.
[0026]
Further, in the invention according to claim 4, the light emission amount of the light emitting unit at the time of the main light emission is determined based on the estimated accumulated charge value calculated based on the integration time information when the signal is in an overflow state. And a method for controlling flash photography of a camera.
[0027]
A flash photographing control method according to the present invention includes: an AF sensor that receives reflected light transmitted through a photographing lens and outputs a signal; an AF control unit that performs focus adjustment based on a detection signal from the AF sensor; A light-emitting unit for irradiating light toward the light-emitting unit, and preliminarily emits the light-emitting unit prior to main light emission, based on a signal including integration time information from the multipoint AF sensor corresponding to reflected light due to the preliminary light emission. Used for a camera that determines the main light emission amount.
[0028]
In the above method, the signal output from the AF sensor that detects the reflected light from the subject at the time of the preliminary light emission of the light emitting unit performed prior to the main light emission has information on the integration time. When it is determined that the signal from the AF sensor in the preliminary light emission is in an overflow state, the estimated accumulated charge value is calculated based on the integration time information, and the main light emission amount is determined based on this information.
[0029]
Therefore, according to the above-described method, even when it is impossible to obtain an accurate signal due to a signal overflow state, it is possible to derive the estimated accumulated charge value based on the integration time information, Can be determined.
[0030]
BEST MODE FOR CARRYING OUT THE INVENTION
Hereinafter, a camera using a flash photography control method according to an embodiment of the present invention will be described with reference to the drawings. 1 and 2 show the configuration of a camera using the flash photography control method of the present invention. FIG. 1 is a configuration diagram of a camera when an external flash device is used without using a flash device built in the camera body, and FIG. 2 is a configuration when a flash device built in the camera body is used. FIG.
[0031]
The camera 1a provided with an external flash device is a single-lens reflex camera using a silver halide film, and has a configuration in which a lens 3 and an external flash device 4 are attached to a camera body 2. The flash device 4 includes a flash light emitting unit 27a and a flash control module 26 for controlling the light emission amount (guide number level) and light emission timing of the flash light emitting unit. The camera body 2 used for the camera 1a may be provided with a built-in flash device. However, when the external flash device 4 is attached, the built-in flash device is not used.
[0032]
A camera 1b using a flash device built in the camera body 2 has a configuration in which a lens 3 is attached to the same camera body 2 as that used in the camera 1a. The camera 1b includes a light emitting unit 27 for flash photography and a flash control module 26 in the camera body 2.
[0033]
FIG. 3 is a block diagram showing a configuration of a control system of the camera shown in FIGS. The camera main body 2 used for the cameras 1a and 1b is provided with a camera CPU 11 constituted by a circuit composed of a microcomputer. The camera CPU 11 cooperates with a lens CPU 24, which will be described later, to centrally control the photographing operation of the camera 1a, such as focus adjustment, light control of a flash device, shutter control, and aperture control.
[0034]
The cameras 1a and 1b perform flashmatic control to control the amount of light emitted from the flash device, and light emission control by control for calculating a guide number of main light emission based on a monitor output when preliminary light emission is performed (so-called preliminary light emission dimming control). The camera CPU 11 has a function and a TTL autofocus function, and performs control such as calculation of the light emission amount of the flash device 4 by the flashmatic control and the preliminary light emission dimming control.
[0035]
The subject light beam L traveling to the cameras 1a and 1b passes through the lens 3 as shown in FIGS. 1 and 2, and reaches a main mirror 13 provided inside a housing 10 of the camera body 2. Most of the subject light beam L is reflected by the main mirror 13 and is imaged on a focusing screen. A photographer looking through a finder window (not shown) observes an image formed on the focusing screen as an erect real image via the pentaprism 12.
[0036]
Part of the subject light beam L that has reached the main mirror 13 passes through a half mirror (not shown) provided at the center of the main mirror 13 and is reflected by a sub-mirror 14 provided behind the main mirror 13. The focus detection module is led to the focus detection module 15. The focus detection module 15 includes a multi-AF sensor (hereinafter simply referred to as an AF sensor) 16 having a configuration as shown in FIG.
[0037]
The AF sensor 16 uses a part of the area for receiving the subject light transmitted through the photographing lens as a focus detection area, divides the subject light of the part into a plurality of areas, and according to each area according to the brightness of the subject light. Output a signal. The signal from the AF sensor is used for focus adjustment control of the camera and light quantity control of the flash device, as described later.
[0038]
As shown in FIG. 4, a CCD sensor composed of three areas and four lines (central cross) is used as the multi-AF sensor 16. A first island is provided in the left area of the screen, a third island is provided in the right area of the screen, and a second island and a fourth island are provided in the center area of the screen. The first to fourth islands include photodiodes 31a, 31b, 35a, 35b, 39a, 39b, 43a, 43b, shift registers 34, 38, 42, 45a, 45b, and monitor photodiodes (hereinafter referred to as monitors, respectively). (Abbreviated.) 32a, 32b, 36a, 36b, 40a, 40b, 44a, 44b, and output sections 33, 37, 41, 46a, 46b.
[0039]
The photodiode is a sensor portion that is composed of a plurality of pixels and that receives the subject light and integrates the charge. The shift register is a CCD unit that transfers the output of the photodiode to the output unit. The monitor is used for light quantity control, and when a predetermined output is obtained, the charge integration of the photodiode is automatically terminated. The multi-AF sensor measures the subject brightness for each island.
[0040]
When the signals from the AF sensors 16 of the cameras 1a and 1b according to the present embodiment are used for focus adjustment, the luminance information of the subject output from the AF sensor 16 by receiving the reflected light from the subject is: Sent to camera CPU 11. The camera CPU 11 determines which island is to be focused on the subject, and communicates with the lens CPU 24 to move the lens 22 to the in-focus position so that the focus is on the subject.
[0041]
On the other hand, when the signal from the AF sensor 16 is used for controlling the light amount of the flash device, the reflected light amounts of the case where the flash device is not pre-emitted (steady light component) and the case where the pre-emission is performed are respectively charge-integrated, and each island is integrated. The light amount in the main light emission is determined based on the output from the monitor.
[0042]
Since the AF sensor 16 has a narrow controllable range, the following phenomenon may occur in some or all of the islands when used for light amount control of the flash device. That is, when the amount of preliminary light emission from the flash device is large or the subject is near, the integration is automatically terminated almost simultaneously with the preliminary light emission, the monitor output overflows, and appropriate luminance information cannot be obtained. On the other hand, when the amount of preliminary light emission from the flash device is small or the subject is far, there is no difference between the monitor output at the time of preliminary light emission and the monitor output of the steady light component, and the amount of light emission at the time of main light emission cannot be calculated. The determination process in this case will be described later.
[0043]
The shutter control unit 19 controls the opening time of the shutter 17 and the drive timing based on an instruction from the camera CPU 11. The shutter control unit 19 is provided with a shutter drive unit 19a. When the shutter is opened by the shutter drive unit 19a, the subject light L reaches the film 18 and is exposed.
[0044]
The photometric module 20 measures the luminance of the subject, receives a part of the luminous flux transmitted through the pentaprism 12, and measures the light. Information on the subject brightness measured by the photometry module is sent to the camera CPU 11.
[0045]
The zoom encoder 23 provided on the lens 3 is an encoder that detects a focal length. The zoom encoder 23 detects the position of the lens 22 and outputs focal length information of the lens 3 to the lens CPU 24. The lens CPU 24 communicates the focal length information and the aperture information with the camera CPU 11.
[0046]
The DX circuit 28 is for reading a DX code attached to the film container. The DX code includes data on film sensitivity (ISO sensitivity) and the like.
[0047]
Next, a photographing operation of the camera according to the present embodiment will be described. FIG. 5 shows a flow of the entire photographing operation of the camera according to the present embodiment. First, the camera CPU 11 waits until the switch S1 is turned on (S11). The switch S1 is assigned to press (half-press) a shutter release button (not shown; hereinafter, abbreviated as a release button) up to the first stage in preparation for photographing by the photographer.
[0048]
When the switch S1 is turned on, various setting information is input to the camera CPU 11 (S12). The various setting information includes focal length information input from the lens CPU 24, aperture information, a DX code input from the DX circuit 28, and the like. Next, the camera CPU 11 determines a subject to be a main subject among subjects existing on any of the islands of the AF monitor 16, controls the lens 4 so that the main subject is in focus, and determines the position of the focus lens, The subject distance is measured (S13). Next, photometric processing is performed by the photometric module 20 (S14). When the AF / photometry processing is completed, the camera CPU 11 performs an AE calculation (S15), and determines whether or not to fire a flash, and determines an aperture value, a shutter speed, and the like.
[0049]
While the switch S1 is on, the camera CPU 11 repeats the above steps S12 to S15 until the release button is pressed down (fully pressed) (switch S2) to the second stage (S16). When the release button is fully pressed, the switch S2 is turned on, and the process proceeds to a release routine.
[0050]
In the release routine, it is determined by the AE operation (S15) whether or not the flash is fired at the time of shooting (S17). When the flash emission is not performed, the process proceeds to the release preparation process (S21) without performing the flash emission control.
[0051]
On the other hand, when flash emission is performed in shooting, flash emission control is performed. In the flash emission control, the subject light preliminarily fired at the moment of release and the stationary light (the subject light without flash emission) are measured and evaluated, and the guide number of the main emission is calculated. First, the subject brightness in the steady light is detected for each island (S18). Next, the flash is pre-emitted with a predetermined light emission amount, and the brightness of the subject at this time is detected for each island (S19). Next, the main light emission amount is calculated based on the information on the subject luminance (S20). The details of the light emission control process will be described later.
[0052]
When the flash is to be emitted during the exposure, the flash is emitted according to the guide number of the main emission calculated in step S20.
[0053]
In this case as well, the integration and data readout operations are performed again as described above. In this embodiment, after the start of the integration, the flash is pre-emitted with a predetermined light emission amount, and the reflected light amount is monitored. After the flash emission, the integration is performed for the same fixed time as when the above-mentioned steady light component is detected, and the integration is forcibly terminated.
[0054]
In the subsequent release preparation processing (S21), when the main mirror 13 is flipped up, shutter charge and flash emission are performed, communication between the camera CPU 11 and the flash control module is performed. Next, the aperture is controlled (S22), the shutter is opened (S23), and the film is exposed.
[0055]
If flash emission control is required while the shutter is open (S24), main flash emission control is performed based on the guide number obtained in the previous step (S20).
[0056]
After the shutter is opened, the shutter speed is counted so as to reach a predetermined shutter speed (S26). When the shutter is opened for a predetermined time, the shutter is closed (S27). Finally, the fact that the light control is completed is displayed on the operation / display unit of the camera body 2 (S28), and preparation for the next frame such as mirror down, writing of image information, and feeding of one frame of film is performed (S29). The shooting operation of the camera ends.
[0057]
FIG. 7 is a flowchart illustrating a flow of a shooting operation of the camera according to the first modification of FIG. In the modification shown in FIG. 7, the process of the monitor integration in the steady light in step 18 is performed while the switch S1 is pressed. In this modified example, since the monitoring integration of the steady light is performed before the timing of the full press of the release button, the time lag from the full press of the release button to the activation of the shutter can be shortened.
[0058]
FIG. 8 is a flowchart showing a flow of a shooting operation of the camera according to the second modification of FIG. FIG. 9 is a flowchart showing a flow of a photographing operation of the camera according to the third modified example of FIG. 5, and similarly to the processing of FIG. 7, charge integration of stationary light is performed in a state where the release button is half-pressed. In the modified examples shown in FIGS. 8 and 9, when the main light emission amount cannot be calculated in the flash light emission control, the process of re-executing the preliminary light emission of the flash only once is performed. It is preferable to change the guide number of the preliminary light emission from the guide number of the first preliminary light emission when re-executing the preliminary light emission of the flash.
[0059]
In each of the above modifications, the guide number of the preliminary light emission at the time of redoing is uniformly set to twice the first guide number. However, for example, when all the first monitor outputs overflow, the value is set to a half of the first guide number, and when the first monitor output does not differ from the monitor output at the time of steady light, That is, when there is no reflected light, the value may be set to a value twice as large as the first guide number.
[0060]
Next, the processing flow of each step during the photographing operation in FIGS. 5, 7, 8, and 9 will be described.
[0061]
(Multipoint focus detection)
FIG. 10 is a flowchart showing the flow of the multipoint focus detection processing in step 13. In the multipoint focus detection processing, charge integration is started for each island of the AF sensor 16 (S41). The charge integration time is set to 200 ms, and a predetermined time is counted simultaneously with the start of the integration (S42). When the predetermined time has elapsed, the charge integration ends (S43).
[0062]
At the same time as the completion of the charge integration, the output from the CCD (photodiode) of each island is read and A / D conversion is performed (S44). The camera CPU 11 receives this output, activates an area selection algorithm for determining which island should be the in-focus area, and performs focus adjustment based on the selected island (S45). As the area selection algorithm, for example, various known algorithms such as closest area priority are adopted.
[0063]
When the in-focus area is determined, the in-focus area storing RAM (FlNa) stores which area has become the in-focus area. In the present embodiment, if the focus area is the first island, FlNa is 1, if the focus area is the second or fourth island, 2 is FlNa, and if the focus area is the third island, FlNa. Are stored in the multi-point focus detection processing. The value of FlNa indicating the in-focus area is used later to determine an island that is a reference at the time of preliminary light emission.
[0064]
(Monitor integration (steady light))
FIG. 11 is a flowchart showing the flow of processing in the monitor integration (stationary light) in step 18. FIG. 6 is a timing chart of each signal of the flash emission control.
[0065]
Upon entering the release routine, the release start signal (REL) goes low, and after a predetermined time has elapsed, the step of monitor integration (steady light) is started. At the timing of t1, the charge integration start signal (ICG) becomes high, and the AF monitor 16 stores the charge of the stationary light component of the subject light L reflected by the sub mirror 14. The camera CPU 11 counts the elapse of a predetermined time (2 ms) from the start of integration (S52), and when the time elapses, sets the integration end / readout start signal (SHM) to high at timing t2 to end monitor integration (S53). .
[0066]
During the charge integration, the sensor output signal (integration information) (IMT) is high. If the monitor output reaches a certain level (allowable amount of accumulated charge) during this time, the integration is automatically performed for each island. finish. FIG. 12 shows the relationship between the integration time and the accumulated charge. As shown in FIG. 12, the integration time is proportional to the accumulated charge. If the subject light has high luminance, the inclination becomes steep. In the monitor integration, the integration time Tref is set to 2 ms as described above. If the accumulated charge does not reach the allowable amount Vref before this time elapses, the accumulated charge V0 and the integration time Tref at the time when the predetermined integration time Tref ends are output. On the other hand, if the set integration time Tref does not start before reaching the permissible amount Vref, the integration is terminated without a predetermined time, and the time T0 when the Vref is reached and the permissible amount Vref of the accumulated charge are obtained. Is output.
[0067]
As the sensor output signal (monitor information, pixel output) (OUT) signal during this period (t1 to t2), the monitor output of the representative island (the second island in the present embodiment) is output in real time. As the predetermined time Tref elapses, the SHM signal becomes high and the integration ends, and at the same time reading of the monitor output starts (S54). As the monitor output, in synchronization with the mode signal (MD) (t3 to t7), digital information on integration is output from the INT terminal and the monitor output at the end of integration of each island is serially output from the OUT terminal. A / D conversion of this monitor output allows the steady light component to be known.
[0068]
In the present embodiment, when the AF sensor is used for dimming control, the integration time is set to be shorter (2 ms) than when it is used for focus adjustment. Under the condition (1), the monitor output has a relatively small value.
[0069]
Based on the monitor output from the AF sensor, the monitor output Vt (n) of each island under steady light is determined (S55). As the monitor output Vt (n) of accumulated charges for each n-th island (n indicates an island number), the smaller value of Vref or V0 described above is adopted.
[0070]
Next, the monitor output integration time Tt of each island under the steady light is determined (S56). As the monitor output integration time Tt (n) of the n-th island (n indicates the island number), the smaller one of the integration time Tref and the time T0 at which the monitor output is saturated is used.
[0071]
When the monitor output Vt and the monitor output time Tt of all the islands are output, the flag Npre indicating the number of times of preliminary light emission is reset, and the step of monitor integration (steady light) ends.
[0072]
(Flash preflash)
Next, a process of pre-emission of the flash and reintegration will be described. FIG. 13 is a flowchart showing the flow of the flash preliminary light emission process in step 19. In this step, first, it is determined whether the built-in flash used for preliminary light emission is an external flash (S61).
[0073]
When preliminary light emission is performed using an external flash, the guide number GNpre of the preliminary light emission is set to a predetermined external flash preliminary light emission guide number GNout (S62). In the present embodiment, the value of GNout is set to 2.8. On the other hand, when the preliminary light emission is performed using the built-in flash, the guide number GNpre of the preliminary light emission is set to a predetermined preliminary light emission guide number GNin for the built-in flash (S72). In the present embodiment, the value of GNin is set to 1.4. The values of GNout and GNin may be set to constant values irrespective of the shooting conditions, or may be changed after the shooting operation according to the shooting conditions. For example, a guide number obtained from the subject distance and the set aperture value can be used.
[0074]
Next, in each case, when the flag Npre indicating the number of preliminary flashes is not 0, that is, when the light amount of the main flash cannot be calculated in the first preliminary flash in the photographing operation according to FIGS. Then, the guide number GNpre of the preliminary light emission is set to a double value (S64, S74). Then, for the external flash, guide number information is exchanged between the camera CPU 11 and the flash CPU 26a (S65), and the light emission preparation processing ends.
[0075]
(Monitor integration (pre-flash))
Next, the process proceeds to the monitor integration step (S19b) during the preliminary light emission. In this process, the charge integration start signal (ICG) goes high at the timing t8, as in the step of monitor integration (steady light), and the AF monitor starts charge accumulation (S81). The camera CPU 11 counts the elapse of a predetermined time (2 ms) from the start of integration (S82), and when the time elapses, sets the integration end / readout start signal (SHM) to high at timing t10 to end monitor integration (S86). .
[0076]
At t9 during the integration of the charge from t8 to t10, the flash emission signal (FL) becomes high, and flash emission starts (S82). The flash control module 26 controls the predetermined amount of light according to the guide number GNpre determined in the previous steps S62, S72, S64, S74 (S83). Then, when the light emission amount reaches the predetermined light amount, the light emission of the flash ends (S84).
[0077]
Then, a predetermined charge integration time Tref (2 ms from the start of integration) is counted (S85), and when the time elapses, the integration end / readout start signal (SHM) is set high at timing t10 to end the monitor integration (S86). ).
[0078]
Even during the preliminary light emission, the sensor output signal (integration information) (IMT) is high during charge integration. The monitor output signal when the preliminary flash light is emitted rises almost at the same time as the flash light emission.However, since there is a time delay from charge accumulation to output in the monitor, the output according to the amount of reflected light after a certain time Reach level. Here, when the amount of reflected light is relatively large, the monitor voltage may reach a predetermined level during a predetermined integration time, and the integration may end automatically. In this case, the monitor output is corrected based on the automatically completed integration time. Note that whether or not the integration time has been automatically ended before the predetermined integration time has elapsed is used for overflow determination described later.
[0079]
The monitor output from each island is synchronized with the mode signal (MD) (t11 to t15), and digital information on integration is output from the INT terminal and the monitor output at the end of integration of each island is output from the OUT terminal in serial. . The monitor output is A / D converted in the same manner as in the case of monitor integration (steady light) (S87).
[0080]
In the process of monitor integration at the time of preliminary light emission, the monitor output Vf (n) of each island at the time of flash emission is determined based on the monitor output from the AF sensor, similarly to the process at the time of steady light (S88). . As the monitor output Vf (n) for each n-th island (n indicates the island number), the smaller value of Vref or V0 described above is adopted.
[0081]
Next, the monitor output integration time Tf of each island at the time of flash emission is determined (S89). As the monitor output integration time Tf (n) of the n-th island (n indicates the island number), the smaller one of the integration time Tref and the time T0 at which the monitor output is saturated is used.
[0082]
When the monitor outputs Vf (n) and the monitor output time Tf (n) of all the islands are output, the flag Npre indicating the number of times of preliminary light emission is incremented, and the step of monitor integration (preliminary light emission) ends.
[0083]
(Main light emission amount calculation)
Next, the step (S20) of the main light emission amount calculation will be described. FIG. 14 is a flowchart showing an outline of the flow of the main light emission amount calculation process. In the main light emission control process, a guide number GN for main light emission is calculated using a difference between two monitor outputs at the time of steady light and at the time of preliminary light emission.
[0084]
First, an overflow determination process as to whether or not an overflow has occurred is performed on the monitor output of the above (2) (S100). Then, a process of determining the presence or absence of reflected light is performed using the difference between the two monitor outputs (S150). These two determination processes will be described later in detail.
[0085]
Next, a monitor voltage correction process (S200) is performed based on the results of the above two determination processes. The monitor voltage correction process is a step of calculating the final monitor voltage coefficient Ega, and the calculation sequence differs depending on the values of the two monitor outputs. Each sequence of calculating the final monitor voltage coefficient Ega will be described later in detail.
[0086]
Finally, the main light emission guide number GN is calculated using the final monitor voltage coefficient Ega obtained in the monitor voltage correction process (S200) (S350). The guide number GN for main light emission is calculated by equation (1) using the final monitor voltage coefficient Ega and the guide number GNpre during preliminary light emission.
[0087]
(Equation 1)

[0088]
Next, each step in the main light emission amount calculation processing will be described in detail.
[0089]
(Overflow judgment processing)
FIG. 15 is a flowchart showing the detailed flow of the overflow determination process in step 100. In the overflow determination process (S100), the number of overflowed areas and which island overflowed are determined. If an overflow occurs, it means that the monitor output of the sensor that composes each island exceeds the allowable amount.This is because the flash output during pre-flash is too large or the subject distance is short, etc. Means that the light emission amount is excessive.
[0090]
First, at the start of the process, information Nnov indicating the number of areas not overflowing is reset to 0, ffh is input to an overflow determination flag NOV (n) for each island, and the island is reset (S101).
[0091]
Next, it is determined whether or not the charge integration time Tf (n) in which integration processing is actually performed for each island during flash emission is a predetermined integration time Tref. That is, first, it is determined whether the value of Tf (1) is the value of Tref (2 ms) for the first island, and if not, it is determined that an overflow has occurred, and the process moves to the next determination processing for the second island (S104). I do.
[0092]
If the value of Tf (1) for the first island is the value of Tref (2 ms), it means that the charge integration operation is not forcibly completed for a predetermined time, and thus the area constituted by the first island is not used. Does not overflow, 1 is added to Nnov and 0 is input to NOV (1) indicating that the first island has not overflown (S103).
[0093]
Also for the second island, it is determined whether the value of Tf (2) is the value of Tref (2 ms). If not, it is determined that an overflow has occurred, and the process moves to the next third island determination process (S106). .
[0094]
Also for the second island, when the value of Tf (2) is the value of Tref (2 ms), it is determined that the monitor output has not overflown. Then, 0 is input to NOV (2) indicating that the second island does not overflow (S105). Note that since the second island forms one area together with the fourth island, at this stage, the process of adding 1 to the number Nnov of the areas not overflowing is not performed.
[0095]
Subsequently, for the third island, the same determination processing as for the first island is performed (S106, S107), and for the fourth island, the same determination processing as for the second island is performed (S108, S109). .
[0096]
Finally, it is again determined whether one of the values of Tf (2) and Tf (4) of the second or fourth island is the value of Tref (2 ms) (S110). If the value is Tref, it is determined that the central area has overflown, and a process of adding 1 to Nnov is performed (S111).
[0097]
With the above processing, the determination as to whether or not all islands and areas have overflowed is completed.
[0098]
(Reflected light presence / absence determination processing)
FIG. 16 is a flowchart showing a detailed flow of the reflected light presence / absence determination processing in step 150. In the reflected light determination process (S150), a determination is made as to the number of areas where the output is not overflow and there is reflected light, and from which island the output is not overflow and there is reflected light. As will be described later, the presence or absence of reflected light is determined by taking the difference between the monitor output Vt (n) at the time of steady light and the monitor output Vf (n) at the time of preliminary light emission, and when the difference does not exceed the threshold value, In other words, if the difference between the subject brightness at the time of the specific flash and the preliminary flash is small, the flash emission amount may be insufficient due to the flash amount at the preliminary flash or the subject distance being too long. Means
[0099]
First, at the start of the process, information Nrtl indicating the number of areas where overflow does not occur and there is reflected light is reset to 0, and a flag for determining whether overflow has occurred and whether there is reflected light is performed for each island. The code of ffh is input to RTL (n) to set it in a default state (S151).
[0100]
Next, it is determined whether the monitor output does not overflow for each island and whether the reflected light is equal to or more than a predetermined value. That is, for the first island, the overflow determination flag NOV (1) determined in the previous overflow determination process (S102) is 0 (that is, the monitor output of the first island has not overflown), and the preliminary light emission is performed. It is determined whether the difference between the monitor output Vf (1) at the time and the monitor output Vt (1) at the time of the steady light is larger than the threshold voltage Th1 for the first island (S152). If these conditions are not satisfied, it is determined that the first island has overflowed or that there is no reflected light, and the process moves to the next determination processing for the second island (S154).
[0101]
NOV (1) is 0 for the first island, and the difference between the monitor output Vf (1) during preliminary light emission and the monitor output Vt (1) during steady light is greater than the threshold voltage Th1 for the first island. In this case, 1 is added to the information Nrtl indicating the number of areas where there is no overflow and there is reflected light, and RTL (1) = 0 indicating that there is no overflow and there is reflected light is input for the first island ( S153).
[0102]
The same judgment as that for the first island is performed for the second island (S154). If the condition is not satisfied, the process moves to the next third island judgment process (S156).
[0103]
When it is determined that the condition is satisfied for the second island (S154), RTL (2) = 0 indicating no overflow and reflected light is input for the second island (S155). Note that since the second island forms one central area together with the fourth island, the process of adding 1 to the information Nrtl indicating the number of areas that do not overflow and have reflected light is not performed.
[0104]
Subsequently, for the third island, the same determination processing as for the first island is performed (S156, S157), and for the fourth island, the same determination processing as for the second island is performed (S158, S159). .
[0105]
Finally, for the second island (S160) or the fourth island (S161), it is determined again whether the monitor output does not overflow and whether the reflected light is equal to or more than a predetermined value. If the condition is satisfied in any of the islands, 1 is added to the information Nrtl indicating the number of areas where the overflow does not occur and the reflected light exists (S162).
[0106]
With the above processing, the determination as to whether or not all the islands and areas have overflowed and whether or not the reflected light exists is completed.
[0107]
The threshold voltages Th1 to Th4 set for each island may be the same value, or may be changed for each island. In the present embodiment, the threshold voltage for each island is set constant. When Th1 to Th4 take different values, the relative levels of the islands can be made uniform. That is, adjustment is performed so that each island has the same output result by various conditions such as the optical characteristics (opening area) of the AF sensor module, monitor output characteristics and sensitivity characteristics of each sensor, and variations in output due to temperature and power supply conditions. be able to.
[0108]
(First example of monitor voltage correction processing)
FIGS. 17 and 18 are flowcharts showing the detailed processing flow of the first processing example of the monitor voltage correction processing in step 200. In the first processing example, the final monitor voltage coefficient Ega is calculated based on the monitor output of the focusing area of the AF sensor. If the output of the in-focus area is invalid, that is, if there is overflow or no reflected light, the final monitor voltage coefficient Ega is calculated from the maximum output area.
[0109]
In this process, first, it is determined whether each island is an in-focus area and whether the monitor output of each island is not an overflow but has reflected light. This determination is based on the information of the focusing area (S46) determined in the multipoint focus detection processing (see FIG. 10) and the information of the focusing area storage RAM and the reflected light presence / absence determination processing (FIG. 16). This is performed based on the information of the flag RTL (n) (S153, S155, S157, S159) for determining whether or not there is an overflow for each island.
[0110]
First, for the first island, it is determined whether FlNa is 1 and the flag RTL (1) is 0 (S201). If these conditions are not satisfied, similar determinations are made sequentially in the order of the second, fourth, and third islands (S203, S205, S207). Since the second and fourth islands constitute a central area, the determination process is performed continuously.
[0111]
In each of the above steps, if the condition is that the area is in focus and the monitor output does not overflow and the reflected light is present, the final monitor voltage coefficient Ega is calculated using the monitor output of this island (S202, S204, S206). , S208). The final monitor voltage coefficient Ega is calculated based on the equation (2).
[0112]
(Equation 2)

In equation (2), C (n) represents the voltage correction coefficient of the n-th island, and G (n) represents the CCD gain correction coefficient of the n-th island.
[0113]
When the final monitor voltage coefficient Ega is calculated in the steps up to the above, 0 is input to a guide number calculation NG flag indicating that preparation for calculation of a guide number is completed (S210), and the monitor voltage correction processing is ended. .
[0114]
If there is no island that satisfies the condition that the reflected light exists because the monitor output is not an overflow in the focus area, that is, if the monitor output in the focus area overflows or there is no reflected light Then, a process of calculating the final monitor voltage coefficient Ega based on the output of the maximum output voltage area that is an island that does not overflow is performed.
[0115]
In this process, first, the island where the difference between the maximum monitor output, that is, the monitor output at the time of steady light and the monitor output at the time of preliminary light emission of the flash, is determined. For this purpose, the value of Vmax indicating the output value of the maximum monitor output is returned to the initial value of 0, and the flag SelArea indicating the island of the maximum monitor output is reset to 0 (S209).
[0116]
Then, it is determined whether RTL is 0 in order from the first island, that is, whether the monitor output is not overflow and the output is larger than Vmax at that time (S211). If the condition is satisfied, the value of Vmax is replaced, and 1 is input to the flag SelArea indicating the island of the maximum monitor output (S212). Since Vmax is returned to 0 in the first island, when RTL has a value of 0, the monitor output of the first island is unconditionally set to Vmax at that time. On the other hand, when the condition is not satisfied, the process proceeds to another island.
[0117]
Subsequently, the same determination is made for the second island. That is, it is determined whether the RTL is 0 and whether the monitor output is larger than the value of Vmax at that time determined up to the previous step (S213). If the condition is satisfied, the value of Vmax is replaced with the monitor output of the second island, and 2 is input to the flag SelArea indicating the island of the maximum monitor output (S214). On the other hand, when the condition is not satisfied, the process proceeds to the process for the third island.
[0118]
The same judgment is made for the third and fourth islands (S215, S217). If the conditions are satisfied, Vmax and SelArea are input (S216, S218).
[0119]
By the steps up to this point, the value of SelArea is determined to indicate the island having the maximum monitor output (S219 to S222). If the value of SelArea is other than 0, the final monitor voltage coefficient Ega is calculated using the monitor output of the island having the value of SelArea (S202, S204, S206, S208). When the final monitor voltage coefficient Ega is calculated in the steps up to the above, 0 is input to the guide number calculation NG flag, indicating that the guide number can be calculated (S210), and the monitor voltage correction processing is ended.
[0120]
On the other hand, when the values of Vmax and SelArea are not rewritten in any of steps S211 to S218, Vmax = 0 and SelArea = 0 as set in S209. That is, in each of the steps S219 to S222, if the value of SelArea is 0, there is no island having the maximum monitor output, and the final monitor voltage coefficient Ega is calculated based on equation (2). I can't. In this case, the following process is continuously performed to determine the final monitor voltage coefficient Ega.
[0121]
First, it is determined whether or not the value of the flag Nnov indicating the number of areas not overflowing determined in the previous overflow determination processing (see FIG. 15) is 3 or less (S223).
[0122]
If Nnov = 3, that is, if all areas overflow, the maximum guide number control is performed, and a predetermined maximum maximum guide number control voltage coefficient Eg_GNmax is determined as the final monitor voltage coefficient Ega. Is used (S224).
[0123]
On the other hand, when Nnov is smaller than 3, that is, when at least one or more areas overflow, the minimum guide number control is performed, and the final monitor voltage coefficient Ega is set to a predetermined minimum minimum guide number control. The use voltage coefficient Eg_GNmin is used (S225).
[0124]
Finally, 1 is input to the guide number calculation NG flag indicating that the final monitor voltage coefficient Ega cannot be calculated and the guide number for main light emission cannot be calculated (S226), and the process is terminated.
[0125]
(Second processing example of monitor voltage correction processing)
Next, a second processing example of the monitor voltage correction processing (S200) will be described. FIGS. 19 and 20 are flowcharts showing a detailed processing flow of the second processing example of the monitor voltage correction processing (S200). In the second processing example, only the monitor output of the output effective area is weighted and averaged to calculate the final monitor voltage coefficient Ega used at the time of main light emission.
[0126]
In this process, it is determined whether or not there is overflow for each island and there is reflected light, and the value of the final monitor voltage coefficient Ega for each island is calculated. That is, in the reflected light presence / absence determination processing (see FIG. 16), it is determined whether or not there is a valid monitor output based on the determined RTL for each island.
[0127]
First, it is checked whether RTL = 0 for the first island, that is, whether the monitor output of the first island does not overflow and the reflected light exists (S250). If RTL = 0, the voltage coefficient Eg1 of the first island is set to 0 (S251).
[0128]
On the other hand, when RTL is not 0, that is, when there is a valid monitor output, the voltage coefficient Eg1 of the first island is calculated by Expression (3).
[0129]
(Equation 3)

In equation (3), C (n) represents the voltage correction coefficient of the n-th island, and G (n) represents the CCD gain correction coefficient of the n-th island.
[0130]
Hereinafter, the determination process is similarly performed for the second to fourth islands (S253, S256, S259), and the voltage coefficient of each island is determined (S254, S255, S257, S258, S260, S261). However, for the fourth island, a condition is added that the second island does not have a valid monitor output, and only one of the voltage coefficients Egn of the island in the central area is used.
[0131]
When the value of the voltage coefficient Egn for each island is determined in this way, as shown in FIG. 20, only the area where there is no overflow and there is reflected light is added to calculate the final monitor voltage coefficient Ega. That is, first, it is determined whether or not the value of Nrtl indicating the number of areas where there is no overflow and there is reflected light, which is determined in the above reflected light presence / absence determination processing, is 0 (S262). If Nrtl is not zero, the average for each island is finalized by summing the voltage coefficients for each island calculated in the previous step and dividing by the value of Nrtl (ie, the number of areas with valid monitor output). The monitor voltage coefficient Ega is set (S263a). Next, 0 is input to the guide number calculation NG flag indicating that preparation for calculation of the guide number is completed (S264), and the monitor voltage correction process is terminated.
[0132]
On the other hand, when Nrtl = 0, that is, when the monitor outputs from all islands have no overflow or no reflected light, the final monitor voltage coefficient Ega is changed according to the number of overflowed islands.
[0133]
First, it is determined whether or not the value of the flag Nnov indicating the number of areas not overflowing determined in the previous overflow determination processing (see FIG. 15) is 3 or less (S265).
[0134]
If Nnov = 3, that is, if all areas overflow, the maximum guide number control is performed, and a predetermined maximum maximum guide number control voltage coefficient Eg_GNmax is determined as the final monitor voltage coefficient Ega. Is used (S266).
[0135]
On the other hand, when Nnov is smaller than 3, that is, when at least one or more areas overflow, the minimum guide number control is performed, and the final monitor voltage coefficient Ega is set to a predetermined minimum minimum guide number control. The use voltage coefficient Eg_GNmin is used (S267).
[0136]
Finally, 1 is input to the guide number calculation NG flag indicating that the final monitor voltage coefficient Ega cannot be calculated and the guide number for main light emission cannot be calculated (S268), and the process is terminated.
[0137]
(Third example of monitor voltage correction processing)
Next, a third processing example of the monitor voltage correction processing (S200) will be described. FIG. 21 is a flowchart showing a detailed processing flow of the third processing example of the monitor voltage correction processing (S200). In the third processing example, only the monitor output in the output effective area is exponentially averaged to calculate the final monitor voltage coefficient Ega used in the main light emission. In the third processing example, the determination of the output valid monitor is performed in the same manner as in the second processing example (S250 to S261). In the present processing example, in the calculation of the final monitor voltage coefficient Ega, a large monitor output can be calculated with a large weight. In other words, this is an advantageous processing method when the monitor output is large, that is, when the final monitor voltage coefficient Ega is determined with priority given to a subject at a short distance.
[0138]
When the value of the voltage coefficient Egn for each island is determined by the same processing as in the second processing example, as shown in FIG. 21, only the area where there is no overflow and there is reflected light is subjected to exponential averaging to obtain the final monitor voltage coefficient Ega. Is calculated. That is, first, it is determined whether or not the value of Nrtl indicating the number of areas where there is no overflow and there is reflected light, which is determined in the above reflected light presence / absence determination processing, is 0 (S262). If Nrtl is not 0, a final monitor voltage coefficient is calculated based on equation (4) (S263b).
[0139]
(Equation 4)

[0140]
Next, 0 is input to the guide number calculation NG flag indicating that preparation for calculation of the guide number is completed (S264), and the monitor voltage correction process is terminated.
[0141]
On the other hand, when Nrtl = 0, that is, when the monitor outputs from all islands have no overflow or no reflected light, the final monitor voltage coefficient Ega is changed according to the number of overflowed islands.
[0142]
First, it is determined whether or not the value of the flag Nnov indicating the number of areas not overflowing determined in the previous overflow determination processing (see FIG. 15) is 3 or less (S265).
[0143]
If Nnov = 3, that is, if all areas overflow, the maximum guide number control is performed, and a predetermined maximum maximum guide number control voltage coefficient Eg_GNmax is determined as the final monitor voltage coefficient Ega. Is used (S266).
[0144]
On the other hand, when Nnov is smaller than 3, that is, when at least one or more areas overflow, the minimum guide number control is performed, and the final monitor voltage coefficient Ega is set to a predetermined minimum minimum guide number control. The use voltage coefficient Eg_GNmin is used (S267).
[0145]
Finally, 1 is input to the guide number calculation NG flag indicating that the final monitor voltage coefficient Ega cannot be calculated and the guide number for main light emission cannot be calculated (S268), and the process is terminated.
[0146]
(Fourth processing example of monitor voltage correction processing)
Next, a fourth processing example of the monitor voltage correction processing (S200) will be described. FIGS. 22 and 23 are flowcharts showing the detailed processing flow of the fourth processing example of the monitor voltage correction processing (S200). In the fourth processing example, the output of the overflowed island is corrected using the actually integrated time V0, the maximum output area is selected using the corrected monitor output, and the final monitor voltage coefficient Ega is calculated. calculate.
[0147]
First, for each island, the integration time during steady light is corrected (S270). That is, the corrected integration time calculated by multiplying the ratio between the predetermined integration time Tref (2 ms) and the integration time Tt (n) of each island in the steady light by the monitor output voltage Vt (n) in the steady light is obtained. The monitor output Vt '(n) is calculated. That is, the monitor output Vt '(n) at the corrected integration time indicates that the charge integration has been performed over the saturation integration time for each island, assuming that the integration time and the accumulated charge are in a proportional relationship. If it is assumed, what value the voltage Vt (n) as the monitor output has is virtually calculated.
[0148]
Next, the integration time at the time of preliminary light emission for each island is corrected (S271). That is, the monitor output Vf '(n) at the corrected integration time is also calculated for the monitor output during the preliminary light emission.
[0149]
Thereafter, using the monitor output Vt '(n) and Vf' (n) at the corrected integration time, the voltage coefficient Egn is calculated for each island based on the equation (5) (272 to S275).
[0150]
(Equation 5)

In equation (5), C (n) represents the voltage correction coefficient of the nth island, and G (n) represents the CCD gain correction coefficient of the nth island.
[0151]
Next, as shown in FIG. 23, a process of calculating the final monitor voltage coefficient Ega using the largest one of the Egns of the respective islands calculated in the previous step is performed. First, Nnov indicating the number of non-overflow areas derived in the overflow determination process (see FIG. 15) is 3, and no overflow derived in the reflected light presence / absence determination process (see FIG. 16). It is determined whether Nrtl indicating the number of areas having the reflected light is 0 (S280). That is, in this step, it is determined whether or not the difference between the monitor output in the steady light and the monitor output in the preliminary light emission in all three areas does not exceed the threshold Th.
[0152]
When the condition of this step is satisfied, maximum guide number control is performed, and a predetermined maximum maximum guide number control voltage coefficient Eg_GNmax is used as the final monitor voltage coefficient Ega (S294). Then, 1 is input to the guide number calculation NG flag indicating that the final monitor voltage coefficient Ega cannot be calculated and the guide number for main light emission cannot be calculated (S295), and the process is terminated.
[0153]
On the other hand, when the condition of S280 is not satisfied, selection of the maximum output area is started. First, Egmax is reset to 0 (S281). Then, it is determined for each island whether the Egn calculated in the previous step exceeds the value of Egmax.
[0154]
That is, for the first island, it is determined whether Eg1 calculated in S272 is larger than Egmax (S282). If Eg1> Egmax, the value of Egmax is rewritten to the value of Eg1 (S283). .
[0155]
Similarly, Egn and Egmax are compared for the second to fourth islands (S284, S286, S288). If the second and fourth islands have a value greater than Egmax at that time, the Egn value of the island is set to Egmax. (S285, S287, S289).
[0156]
When the largest one of the voltage coefficients of each island is determined in this way, it is determined whether or not the value of Egmax is greater than a predetermined minimum guide number control voltage coefficient Eg_GNmin (S290). If the value of Egmax is larger than the value of Eg_GNmin, a predetermined minimum guide number control voltage coefficient Eg_GNmin is adopted as the final monitor voltage coefficient Ega (S293). Then, 1 is input to the guide number calculation NG flag GNCalcNG_F, which indicates that the final monitor voltage coefficient Ega cannot be calculated and the guide number for main light emission cannot be calculated (S295), and the process ends.
[0157]
On the other hand, if the value of Egmax is smaller than the value of Eg_GNmin in S290, Egmax is adopted as the final monitor voltage coefficient Ega (S291), and a guide number calculation NG indicating that preparation for calculation of a guide number is completed is completed. "0" is input to the flag (S292), and the monitor voltage correction process ends.
[0158]
(Fifth example of monitor voltage correction processing)
Next, a fifth processing example of the monitor voltage correction processing (S200) will be described. FIG. 24 is a flowchart showing the detailed processing flow of the fifth processing example of the monitor voltage correction processing (S200). In the second processing example, the output of the overflowed island is corrected using the actually integrated time V0, and the voltage coefficient calculated from the corrected monitor output is weighted to obtain the final monitor voltage coefficient. Ega is calculated.
[0159]
The process of correcting the output of the overflowed island and calculating the voltage coefficient of each island (S270 to S275) is performed in the same manner as in the fourth processing example (see FIG. 22).
[0160]
Next, Nnov indicating the number of non-overflow areas derived in the overflow determination process (see FIG. 15) is 3, and the overflow derived in the reflected light presence / absence determination process (see FIG. 16) is performed. It is determined whether Nrtl indicating the number of areas having reflected light is 0 (S300). That is, in this step, it is determined that the difference between the monitor output in the steady light and the monitor output in the preliminary light emission in all three areas does not exceed the threshold Th.
[0161]
When the condition of this step is satisfied, maximum guide number control is performed, and a predetermined maximum maximum guide number control voltage coefficient Eg_GNmax is used as the final monitor voltage coefficient Ega (S306). Then, 1 is input to the guide number calculation NG flag indicating that the final monitor voltage coefficient Ega cannot be calculated and the guide number for main light emission cannot be calculated (S307), and the process is terminated.
[0162]
On the other hand, when the condition of S280 is not satisfied, the island (S301) having the larger output of the second and fourth islands and the voltage coefficient Egn of the other island are weighted and averaged (S302). Is adopted as a temporary final monitor voltage coefficient Ega.
[0163]
When the temporary Ega is determined in this way, it is determined whether or not the value of the Ega is larger than a predetermined minimum guide number control voltage coefficient Eg_GNmin (S303). When the value of Ega is larger than the value of Eg_GNmin, a predetermined minimum guide number control voltage coefficient Eg_GNmin is adopted as the final monitor voltage coefficient Ega (S305). Then, 1 is input to the guide number calculation NG flag GNCalcNG_F indicating that the final monitor voltage coefficient Ega cannot be calculated and the guide number for main light emission cannot be calculated (S307), and the process is terminated.
[0164]
On the other hand, if the value of Egmax is smaller than the value of Eg_GNmin in S302, the provisional Ega value is adopted as the final monitor voltage coefficient Ega, and the guide number indicating that preparation for calculating the guide number is completed. When 0 is input to the calculation NG flag (S304), the monitor voltage correction process ends.
[0165]
(Sixth processing example of monitor voltage correction processing)
Next, a sixth processing example of the monitor voltage correction processing (S200) will be described. FIG. 25 is a flowchart showing a detailed processing flow for the sixth processing example of the monitor voltage correction processing (S200). In the second processing example, the output of the overflowed island is corrected using the actually integrated time V0, and the final monitor voltage coefficient Ega is calculated by exponentially averaging the outputs of all areas. The processing for correcting the output of the overflowed island is performed in the same manner as in the fourth processing example.
[0166]
The process of correcting the output of the overflowed island and calculating the voltage coefficient of each island (S270 to S275) is performed in the same manner as in the fourth processing example (see FIG. 22).
[0167]
Next, Nnov indicating the number of non-overflow areas derived in the overflow determination process (see FIG. 15) is 3, and the overflow derived in the reflected light presence / absence determination process (see FIG. 16) is performed. It is determined whether Nrtl indicating the number of areas having reflected light is 0 (S310). That is, in this step, it is determined that the difference between the monitor output in the steady light and the monitor output in the preliminary light emission in all three areas does not exceed the threshold Th.
[0168]
When the condition of this step is satisfied, the maximum guide number control is performed, and a predetermined maximum maximum guide number control voltage coefficient Eg_GNmax is used as the final monitor voltage coefficient Ega (S315). Then, 1 is input to the guide number calculation NG flag indicating that the final monitor voltage coefficient Ega cannot be calculated and the guide number for main light emission cannot be calculated (S316), and the process ends.
[0169]
On the other hand, when the condition of S280 is not satisfied, the voltage coefficient Egn of each island is averaged exponentially (S311), and the calculation result is adopted as a temporary final monitor voltage coefficient Ega.
[0170]
When the temporary Ega is determined in this way, it is determined whether the value of the Ega is larger than a predetermined minimum guide number control voltage coefficient Eg_GNmin (S312). If the value of Ega is larger than the value of Eg_GNmin, a predetermined minimum guide number control voltage coefficient Eg_GNmin is adopted as the final monitor voltage coefficient Ega (S314). Then, 1 is input to the guide number calculation NG flag GNCalcNG_F indicating that the final monitor voltage coefficient Ega cannot be calculated and the guide number for main light emission cannot be calculated (S316), and the process ends.
[0171]
On the other hand, if the value of Egmax is smaller than the value of Eg_GNmin in S312, the provisional Ega value is adopted as the final monitor voltage coefficient Ega, and the guide number indicating that the preparation for calculating the guide number is completed. When 0 is input to the calculation NG flag (S313), the monitor voltage correction process ends.
[0172]
The final monitor voltage coefficient Ega obtained by the monitor voltage correction processing in any of the above-described first to sixth processing examples is used for calculating the guide number of the main light emission as shown in FIG. (S350).
[0173]
When the monitor voltage correction processing in any of the first to sixth processing examples is performed in the photographing operation processing in FIGS. 8 and 9, the guide number calculation indicating that the guide number of the main light emission cannot be calculated. When 1 is input to the NG flag GNCalcNG_F, the preliminary light emission is redone in the first preliminary light emission, and the main light emission amount is calculated in the second preliminary light emission using the obtained final monitor voltage coefficient. .
[0174]
(Flash main light emission control)
FIG. 26 is a flowchart showing the processing flow of the main flash light emission control processing in step S25. First, it is determined whether the built-in flash used for preliminary light emission is an external flash (S91).
[0175]
When an external flash is used, camera-flash communication is performed (S92), and a guide number for main emission calculated using the final monitor voltage coefficient Ega obtained in the previous monitor voltage correction processing is set. On the other hand, when performing preliminary light emission using the built-in flash, the camera CPU 11 transmits a guide number for main light emission to the flash control module 26 and performs light emission preparation processing (S73).
[0176]
When the preparation for flash emission is completed, flash emission is started (S94). The flash control module 26 controls a predetermined amount of light according to the guide number for main light emission (S95). Then, when the light emission amount reaches the predetermined light amount, the light emission of the flash ends (S96).
[0177]
As described above, according to the flash photography control method according to the present embodiment, since the AF sensor is also used as a flash dimming sensor, the number of components can be reduced, and prior to the main light emission. Since the preliminary light emission is performed and the guide number of the main light emission is determined based on the result, the configuration for guiding the subject light to the AF sensor can be simplified.
[0178]
Further, even when an AF sensor having a narrow controllable range is used, the amount of main light emission can be accurately calculated by selecting and adopting a monitor output used for dimming control.
[0179]
The present invention is not limited to the above embodiment, but can be implemented in various other modes.
[0180]
For example, in the above embodiment, the flash photography control method used in a single-lens reflex camera for a silver halide film having a main mirror is described, but this method can be used in a single-lens reflex digital camera. In this case, an image sensor for photographing is often used as an AF sensor for autofocus, and a part of the image sensor is used as an AF sensor and a sensor for dimming control.
[Brief description of the drawings]
FIG. 1 is a configuration diagram of a camera according to an embodiment of the present invention using an external flash device.
FIG. 2 is a configuration diagram of a camera according to an embodiment of the present invention using a flash device built in the camera body.
FIG. 3 is a block diagram showing a configuration of a control system of the camera shown in FIGS. 1 and 2;
FIG. 4 is a diagram showing a configuration of a multi-AF sensor used in the cameras of FIGS. 1 and 2;
FIG. 5 is a flowchart showing a processing flow of the entire photographing operation of the camera according to the embodiment;
6 is a timing chart of each signal of flash emission control in the photographing process of FIG. 5;
FIG. 7 is a flowchart showing a processing flow of a photographing operation of the camera according to a first modification of FIG. 5;
FIG. 8 is a flowchart showing a flow of a shooting operation of a camera according to a second modification of FIG. 5;
FIG. 9 is a flowchart showing a processing flow of a photographing operation of the camera according to a third modification of FIG. 5;
FIG. 10 is a flowchart showing the flow of multipoint ranging processing.
FIG. 11 is a flowchart showing the flow of processing in monitor integration (steady light).
FIG. 12 is a diagram showing a relationship between integration time and accumulated charge.
FIG. 13 is a flowchart showing the flow of flash preliminary light emission processing.
FIG. 14 is a flowchart showing an outline of a flow of a main light emission amount calculation process.
FIG. 15 is a flowchart showing a detailed processing flow of an overflow determination process (S100).
FIG. 16 is a flowchart showing a detailed processing flow of reflected light presence / absence determination processing.
FIG. 17 is a flowchart showing a detailed processing flow of a first processing example of monitor voltage correction processing;
FIG. 18 is a flowchart showing a detailed processing flow of a first processing example of monitor voltage correction processing.
FIG. 19 is a flowchart showing a detailed processing flow of a second processing example of the monitor voltage correction processing.
FIG. 20 is a flowchart showing a detailed processing flow of a second processing example of the monitor voltage correction processing.
FIG. 21 is a flowchart showing a detailed processing flow of a third processing example of the monitor voltage correction processing.
FIG. 22 is a flowchart showing a detailed processing flow of a fourth processing example of the monitor voltage correction processing.
FIG. 23 is a flowchart showing a detailed processing flow of a fourth processing example of the monitor voltage correction processing.
FIG. 24 is a flowchart showing a detailed processing flow of a fifth processing example of the monitor voltage correction processing.
FIG. 25 is a flowchart showing a detailed processing flow of a sixth processing example of the monitor voltage correction processing.
FIG. 26 is a flowchart showing the flow of a main flash light emission control process.
[Explanation of symbols]
1a, 1b camera
2 Camera body
3 lens
4 External flash unit
10 Camera housing
11 Camera CPU
12 Penta prism
13 Main mirror
14 Submirror
15 Focus detection module
16 Multi AF sensor
17 Shutter
18 imaging means
19 Shutter control unit
20 Photometric module
21 Lens housing
22 Shooting lens
23 Zoom encoder
24 lens CPU
25 External flash unit housing
26 Flash control module
27a, 27b light emitting unit
28 DX circuit
29 Aperture drive unit

Claims (4)

An AF sensor that receives reflected light transmitted through the photographing lens and outputs a signal, an AF control unit that performs focus adjustment based on a detection signal from the AF sensor, and a light emitting unit that irradiates light to a subject. A flash photography control method used for a camera provided with
Prior to the main light emission, the light emission unit is caused to emit preliminary light a plurality of times by varying the light emission amount, and one signal optimal for photographing is obtained from the signal from the AF sensor corresponding to the reflected light due to the preliminary light emission at each of the light emission amounts. A flash light emission control method for a camera, wherein the main light emission amount is determined by selecting a flash light amount. In the second and subsequent preliminary light emission of the plurality of preliminary light emission, the signal corresponding to the reflected light in the light emission amount of the first preliminary light emission is effective in determining the light emission amount of the light emitting unit at the time of the main light emission. 2. The method according to claim 1, wherein the method is performed when the value has no value. The light emission amount in the second and subsequent preliminary light emission of the plurality of preliminary light emission changes according to whether the signal is in an overflow state or in a state without reflected light. 3. The flash photography control method for a camera according to 1 or 2. An AF sensor that receives reflected light transmitted through the photographing lens and outputs a signal, an AF control unit that performs focus adjustment based on a detection signal from the AF sensor, and a light emitting unit that irradiates light to a subject. The camera is provided with a light emission unit that performs preliminary light emission prior to main light emission, and determines a main light emission amount based on a signal including integration time information from the multipoint AF sensor corresponding to reflected light due to the preliminary light emission. A flash photography control method,
The amount of light emitted by the light emitting unit during the main light emission is determined based on an estimated accumulated charge value calculated based on the integration time information when the signal is in an overflow state. Shooting control method.

Images