JP2004045811A - Liquid crystal display and its manufacturing method - Google Patents

Liquid crystal display and its manufacturing method Download PDF

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Publication number
JP2004045811A
JP2004045811A JP2002203775A JP2002203775A JP2004045811A JP 2004045811 A JP2004045811 A JP 2004045811A JP 2002203775 A JP2002203775 A JP 2002203775A JP 2002203775 A JP2002203775 A JP 2002203775A JP 2004045811 A JP2004045811 A JP 2004045811A
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Prior art keywords
insulating film
liquid crystal
capacitor
crystal display
gate insulating
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JP2002203775A
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JP4147845B2 (en
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Yoshiro Okawa
大川 善郎
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Sony Corp
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Sony Corp
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  • Thin Film Transistor (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To form the gate insulating film of a driving transistor and the capacitor insulating film of an auxiliary capacitor out of insulating films different from each other in a liquid crystal display. <P>SOLUTION: The liquid crystal display device is manufactured by filling the gap between two substrates disposed opposing to each other with a liquid crystal, and by forming a driving transistor and an auxiliary capacitor on one substrate. The gate insulating film of the driving transistor is deposited on the surface of the substrate, the gate insulating film is partially removed and patterned into a specified pattern, and then the capacitor insulating film of the auxiliary capacitor is formed from a material different from that of the gate insulating film in the area where the gate insulating film is removed. <P>COPYRIGHT: (C)2004,JPO

Description

【0001】
【発明の属する技術分野】
本発明は、液晶表示装置及びその製造方法に関するものである。
【0002】
【従来の技術】
従来の液晶表示装置は、ガラス又は石英からなる透明の液晶駆動基板と対向基板とをスペーサやシール材を介して対向させて配置するとともに、両基板間に液晶を充填して構成しており、液晶駆動基板と対向基板とに対向する複数の透明電極を格子配列状にそれぞれ形成し、両透明電極間に所定の駆動信号を印加することによって両透明電極間の液晶の光透過率を変更することで種々の表示を行うようにしていた。
【0003】
ここで、図5に示すように、液晶駆動基板100には、各透明電極101に所定の駆動信号を選択的に印加するための駆動用トランジスタ102(薄膜トランジスタ:TFT(Thin Film Transistor))を形成するとともに、透明電極101で形成されるキャパシタに蓄えられる電荷を一定時間安定的に保持することによって表示動作を安定させるための補助キャパシタ103を形成しており、各駆動用トランジスタ102のソース端子に透明電極101を直列接続するとともに、各駆動用トランジスタ102のソース端子と接地線104との間に補助キャパシタ103を接続し、さらには、縦方向に並設した駆動用トランジスタ102のドレイン端子同士を駆動信号線105で接続し、横方向に並設した駆動用トランジスタ102のゲート端子同士を選択信号線106で接続している。
【0004】
そして、液晶表示装置107は、選択信号線106で供給される選択信号と駆動信号線105で供給される駆動信号とによって駆動用トランジスタ102に接続した透明電極101のいずれかに選択的に駆動信号を印加し、その画素での表示を行うようにしている。
【0005】
上記液晶表示装置107の液晶駆動基板100は、次のようにして製造していた(図6参照)。
【0006】
まず、図6(a)に示すように、ガラス基板108の上面に所定形状のポリシリコン膜109を形成する。
【0007】
次に、図6(b)に示すように、ポリシリコン膜109の上面に所定形状の絶縁膜110(酸化膜)を形成し、同絶縁膜110の所定位置(駆動用トランジスタ102の形成位置)にヒ素又はリンをドーピングする。
【0008】
次に、図6(c)に示すように、絶縁膜110の上面の所定位置(駆動用トランジスタ102の形成位置及び補助キャパシタ103の形成位置)にポリシリコン膜によって所定形状のゲート電極111とキャパシタ電極112とを形成する。
【0009】
次に、図6(d)に示すように、ガラス基板108の上面に層間絶縁膜113(PSG膜)を成膜するとともに、同層間絶縁膜113の一部にポリシリコン膜109に連通するコンタクトホール114を形成し、同コンタクトホール114にアルミニウム配線115(駆動信号線105)を形成する。
【0010】
次に、図6(e)に示すように、層間絶縁膜113の上面にさらに層間絶縁膜116(PSG膜)を成膜するとともに、所定位置にポリシリコン膜109に連通するコンタクトホール117を形成する。
【0011】
最後に、図6(f)に示すように、層間絶縁膜116の上面の所定位置にITO膜(Indium−Tin Oxide膜)によって透明電極101を形成する。
【0012】
このように、従来の液晶表示装置107は、ポリシリコン膜109の上面に絶縁膜110を形成し、同絶縁膜110の上面に駆動用トランジスタ102のゲート電極111と補助キャパシタ103のキャパシタ電極112とを形成していた。すなわち、駆動用トランジスタ102のゲート絶縁膜と補助キャパシタ103のキャパシタ絶縁膜とを共通の絶縁膜110で形成していた。
【0013】
ここで、図6(f)に示すように、駆動用トランジスタ102及び補助キャパシタ103を形成した部分は光が透過しない非透過領域118となっており、それ以外の部分は光が透過する透過領域119となっている。
【0014】
【発明が解決しようとする課題】
ところが、一般的には、液晶表示装置は、非透過領域の面積を削減することによって、その分だけ透過領域の面積を増大させることができ、透過領域の面積を増大させることによって液晶表示装置の高輝度化を図ることができるが、上記従来の液晶表示装置107にあっては、駆動用トランジスタ102のゲート絶縁膜と補助キャパシタ103のキャパシタ絶縁膜とを共通の絶縁膜110で形成していたため、非透過領域118の面積を削減することができず、透過領域119の面積の増大による液晶表示装置107の高輝度化を図ることができなかった。これは、以下に説明する理由によるものであった。
【0015】
すなわち、非透過領域118の面積を削減するためには、非透過領域118において補助キャパシタ103が占有する面積を縮小する必要がある。一方、表示動作を安定させるためには補助キャパシタ103として所定の容量を確保する必要がある。そのため、表示動作の安定性を考慮しつつ液晶表示装置107の高輝度化を図るには、補助キャパシタ103の容量を所定値以上に確保したまま占有面積を縮小しなければならず、その方法としては、補助キャパシタ103のキャパシタ絶縁膜の膜厚を薄膜化する方法や、補助キャパシタ103のキャパシタ絶縁膜を高誘電率化する方法が考えられる。
【0016】
しかしながら、従来の液晶表示装置107にあっては、駆動用トランジスタ102のゲート絶縁膜と補助キャパシタ103のキャパシタ絶縁膜とを共通の絶縁膜110で形成していたため、補助キャパシタ103のキャパシタ絶縁膜の膜厚を薄膜化した場合には、駆動用トランジスタ102のゲート絶縁膜までもが薄膜化してしまい、駆動用トランジスタ102の耐圧が低減してしまい、液晶表示装置107の信頼性が低減するおそれがあり、一方、絶縁膜110としてシリコン酸化膜に替えて誘電率が高いシリコンナイトライド膜を用いることによって補助キャパシタ103のキャパシタ絶縁膜を高誘電率化した場合には、駆動用トランジスタ102のゲート酸化膜としてもシリコンナイトライド膜を使用しなければならず、駆動用トランジスタ102のリーク電流が増大してしまい、これによっても液晶表示装置107の信頼性が低減するおそれがあった。
【0017】
このように、上記従来の液晶表示装置107にあっては、駆動用トランジスタ102のゲート絶縁膜と補助キャパシタ103のキャパシタ絶縁膜とを共通の絶縁膜110で形成していたため、透過領域119の面積の増大による液晶表示装置107の高輝度化を図ることができなかった。
【0018】
他方、駆動用トランジスタのゲート絶縁膜と補助キャパシタのキャパシタ絶縁膜とを別々の絶縁膜で形成することによって非透過領域の面積を削減し、その分だけ透過領域の面積を増大させて液晶表示装置の高輝度化を図ることも考えられる。その方法としては、補助キャパシタを駆動用トランジスタの下方に形成することによって駆動用トランジスタと補助キャパシタとを積層化する方法や、補助キャパシタを半導体基板の縦方向(深さ方向)に向けて形成することによって補助キャパシタを縦型化する方法が考えられる。
【0019】
しかしながら、駆動用トランジスタと補助キャパシタとを積層化する方法や補助キャパシタを縦型化する方法では、液晶表示装置の製造工程が複雑化してしまい、液晶表示装置の製造コストが増大してしまうおそれがあった。
【0020】
このように、駆動用トランジスタのゲート絶縁膜と補助キャパシタのキャパシタ絶縁膜とを別々の絶縁膜で形成した場合には、液晶表示装置の製造コストが増大してしまい実用化が困難であった。
【0021】
【課題を解決するための手段】
そこで、本発明では、対向状に配置した2枚の基板の間に液晶を充填し、一方の基板に駆動用トランジスタと補助キャパシタとを形成してなる液晶表示装置において、補助キャパシタのキャパシタ絶縁膜は、基板の表面に形成した駆動用トランジスタのゲート絶縁膜を一部除去した部分に同ゲート絶縁膜とは異なる素材で形成することにした。
【0022】
また、対向状に配置した2枚の基板の間に液晶を充填し、一方の基板に駆動用トランジスタと補助キャパシタとを形成してなる液晶表示装置において、駆動用トランジスタのゲート絶縁膜は、基板の表面に形成した補助キャパシタのキャパシタ絶縁膜を一部除去した部分に同キャパシタ絶縁膜とは異なる素材で形成することにした。
【0023】
また、前記キャパシタ絶縁膜は、ゲート絶縁膜よりも誘電率が高い素材で形成することにした。
【0024】
また、対向状に配置した2枚の基板の間に液晶を充填し、一方の基板に駆動用トランジスタと補助キャパシタとを形成してなる液晶表示装置の製造方法において、基板の表面に駆動用トランジスタのゲート絶縁膜を成膜するとともに、同ゲート絶縁膜の一部を除去して所定形状にパターニングし、その後、ゲート絶縁膜を除去した部分に同ゲート絶縁膜とは異なる素材からなる補助キャパシタのキャパシタ絶縁膜を形成することにした。
【0025】
また、対向状に配置した2枚の基板の間に液晶を充填し、一方の基板に駆動用トランジスタと補助キャパシタとを形成してなる液晶表示装置の製造方法において、基板の表面に補助キャパシタのキャパシタ絶縁膜を成膜するとともに、同キャパシタ絶縁膜の一部を除去して所定形状にパターニングし、その後、キャパシタ絶縁膜を除去した部分に同キャパシタ絶縁膜とは異なる素材からなる駆動用トランジスタのゲート絶縁膜を形成することにした。
【0026】
また、前記キャパシタ絶縁膜は、ゲート絶縁膜よりも誘電率が高い素材で形成することにした。
【0027】
【発明の実施の形態】
本発明に係る液晶表示装置は、ガラス又は石英などからなる透明の液晶駆動基板と対向基板とをスペーサやシール材を介して対向させて配置するとともに、両基板間に液晶を充填し、液晶駆動基板と対向基板とに対向する複数の透明電極を格子配列状にそれぞれ形成したものである。
【0028】
液晶駆動基板には、従来の液晶表示装置と同様に、各透明電極に所定の駆動信号を選択的に印加するための駆動用トランジスタ(薄膜トランジスタ:TFT(Thin Film Transistor))を形成するとともに、透明電極で形成されるキャパシタに蓄えられる電荷を一定時間安定的に保持することによって表示動作を安定させるための補助キャパシタを形成しており、各駆動用トランジスタのソース端子に透明電極を直列接続するとともに、各駆動用トランジスタのソース端子と接地線との間に補助キャパシタを接続し、さらには、縦方向に並設した駆動用トランジスタのドレイン端子同士を駆動信号線で接続し、横方向に並設した駆動用トランジスタのゲート端子同士を選択信号線で接続している。
【0029】
そして、本発明に係る液晶表示装置では、液晶駆動基板の構造及び製造方法に特徴を有している。
【0030】
すなわち、本発明に係る液晶表示装置の液晶駆動基板は、液晶駆動基板の表面に駆動用トランジスタのゲート絶縁膜を成膜した後に、同ゲート絶縁膜の一部を除去して所定形状にパターニングし、その後、ゲート絶縁膜を除去した部分に同ゲート絶縁膜とは異なる素材からなる補助キャパシタのキャパシタ絶縁膜を形成することによって製造したものである。
【0031】
また、液晶駆動基板は、液晶駆動基板の表面に補助キャパシタのキャパシタ絶縁膜を成膜した後に、同キャパシタ絶縁膜の一部を除去して所定形状にパターニングし、その後、キャパシタ絶縁膜を除去した部分に同キャパシタ絶縁膜とは異なる素材からなる駆動用トランジスタのゲート絶縁膜を形成することによって製造したものである。
【0032】
このように、本発明では、従来の液晶表示装置の製造方法を適宜組合わせて利用することによって従来の製造技術の延長線上にて製造可能とし、これにより液晶表示装置の製造コストの増大を可及的に抑制しつつ、駆動用トランジスタのゲート絶縁膜と補助キャパシタのキャパシタ絶縁膜とを別々の絶縁膜で形成することができるものである。
【0033】
特に、キャパシタ絶縁膜を、ゲート絶縁膜よりも誘電率が高い素材で形成した場合には、補助キャパシタの容量を確保しつつ占有面積を可及的に小さくすることができ、これによって非透過領域の面積を縮小し、その分だけ透過領域の面積を増大させることができ、液晶表示装置の高輝度化を図ることができるようにしたものである。
【0034】
以下に、本発明の具体的な実施の形態について図面を参照しながら説明する。
【0035】
[実施の形態1]
本発明の実施の形態1に係る液晶表示装置1は、図1に示すように、液晶駆動基板2の表面に駆動用トランジスタ3のゲート絶縁膜4を成膜した後に、同ゲート絶縁膜4の一部を除去して所定形状にパターニングし、その後、ゲート絶縁膜4を除去した部分に同ゲート絶縁膜4とは異なる素材からなる補助キャパシタ5のキャパシタ絶縁膜6を形成することによって製造したものである。
【0036】
以下に、液晶駆動基板2の具体的な製造方法について説明する。
【0037】
まず、図1(a)に示すように、ガラス基板7の上面にポリシリコン膜8を所定の膜厚で成膜した後に、フォトリソグラフィによって一部分を除去することで所定形状にパターニングする。ここで、ポリシリコン膜8は、モノシランのみを用いた減圧CVD(Chemical Vapor Deposition:化学気相成長)法で形成した後に、膜抵抗値を低減するために所定濃度のリン又はボロンなどを添加して成膜してもよく、また、モノシランとホスフィン・ジボランなどのガスを同時に使用したCVD法で成膜してもよい。
【0038】
次に、図1(b)に示すように、ポリシリコン膜8の上面に駆動用トランジスタ3のゲート絶縁膜4となるシリコン酸化膜を所定の膜厚で成膜する。ここで、ゲート絶縁膜4は、熱処理又はシラン系ガスと酸素との反応を用いて成膜する。また、ゲート絶縁膜4は、シリコン酸化膜に限られず、いかなる絶縁膜を用いてもよい。
【0039】
次に、図1(c)に示すように、ゲート絶縁膜4の一部分をエッチングによって除去して、所定形状にパターニングし、その後、同ゲート絶縁膜4の所定位置(駆動用トランジスタ3の形成位置)に所定濃度のヒ素又はリンをドーピングする。ここで、エッチングは、ウエットエッチングでもよく、また、ドライエッチングでもよい。
【0040】
次に、図1(d)に示すように、ゲート絶縁膜4の上面に補助キャパシタ5のキャパシタ絶縁膜6となるシリコンナイトライド膜を所定の膜厚で成膜する。ここで、キャパシタ絶縁膜6は、モノシラン又はSiHClとアンモニアを用いたCVD法で成膜している。また、キャパシタ絶縁膜6は、シリコンナイトライド膜に限られず、いかなる絶縁膜を用いてもよいが、誘電率の高い素材の方が好ましく、特に、ゲート絶縁膜4よりも誘電率の高い素材のほうが好ましい。
【0041】
次に、図1(e)に示すように、キャパシタ絶縁膜6の一部分であって、かつ、ゲート絶縁膜4を除去した部分以外の部分をエッチングによって除去して、所定形状にパターニングする。ここで、エッチングは、ラジカルを使用したドライエッチングでもよく、また、燐酸などを使用したウエットエッチングでもよい。
【0042】
次に、図1(f)に示すように、ゲート絶縁膜4に酸化処理を施して、ゲート絶縁膜4の耐圧を向上させるとともに、ダメージを除去し、その後、駆動用トランジスタ3のゲート絶縁膜4の上面及び補助キャパシタ5のキャパシタ絶縁膜6の上面にポリシリコン膜を所定の膜厚で成膜した後に、フォトリソグラフィによって一部分を除去することで所定形状にパターニングすることによって、駆動用トランジスタ3のゲート絶縁膜4の上面にゲート電極9を形成するとともに、補助キャパシタ5のキャパシタ絶縁膜6の上面にキャパシタ電極10を形成する。ここで、ゲート電極9及びキャパシタ電極10は、ポリシリコン膜に限られず、タングステン膜やタングステンシリサイド膜、又はこれらとポリシリコン膜とを積層した膜でもよい。
【0043】
次に、図2(a)に示すように、ガラス基板7の上面にリンガラス膜(PSG膜:Phosphrus Silicate Glass膜)からなる層間絶縁膜11を成膜するとともに、同層間絶縁膜11の一部にポリシリコン膜8に連通するコンタクトホール12を形成し、同コンタクトホール12にアルミニウム配線13(駆動信号線)を形成する。
【0044】
次に、図2(b)に示すように、層間絶縁膜11の上面にさらに層間絶縁膜14(PSG膜)を成膜するとともに、所定位置にポリシリコン膜8に連通するコンタクトホール15を形成する。
【0045】
最後に、図2(c)に示すように、層間絶縁膜14の上面の所定位置にITO膜(Indium−Tin Oxide膜)からなる透明電極16を形成する。
【0046】
ここで、図2(c)に示すように、駆動用トランジスタ3及び補助キャパシタ5を形成した部分は光が透過しない非透過領域17となっており、それ以外の部分は光が透過する透過領域18となっている。
【0047】
このように、液晶駆動基板2の表面に駆動用トランジスタ3のゲート絶縁膜4を成膜した後に、同ゲート絶縁膜4の一部を除去して所定形状にパターニングし、その後、ゲート絶縁膜4を除去した部分に同ゲート絶縁膜4とは異なる素材からなる補助キャパシタ5のキャパシタ絶縁膜6を形成することによって、補助キャパシタ5のキャパシタ絶縁膜6を、液晶駆動基板2の表面に形成した駆動用トランジスタ3のゲート絶縁膜4を一部除去した部分に同ゲート絶縁膜4とは異なる素材で形成した液晶表示装置1を製造することができる。
【0048】
かかる液晶表示装置1は、従来の液晶表示装置の製造方法(成膜工程及びエッチング工程)を適宜組合わせて利用することによって従来の製造技術の延長線上にて製造することができ、これにより液晶表示装置1の製造コストの増大を可及的に抑制しつつ、駆動用トランジスタ3のゲート絶縁膜4と補助キャパシタ5のキャパシタ絶縁膜6とを異なる素材の絶縁膜で形成することができる。
【0049】
特に、キャパシタ絶縁膜6を、ゲート絶縁膜4よりも誘電率が高い素材で形成することによって、補助キャパシタ5の容量を確保しつつ液晶駆動基板2において補助キャパシタ5が占有する面積を可及的に小さくすることができ、これによって非透過領域17の面積を縮小し、その分だけ透過領域18の面積を増大させることができ、液晶表示装置1の高輝度化を図ることができる。
【0050】
[実施の形態2]
本発明の実施の形態2に係る液晶表示装置21は、図3に示すように、液晶駆動基板22の表面に補助キャパシタ23のキャパシタ絶縁膜24を成膜した後に、同キャパシタ絶縁膜24の一部を除去して所定形状にパターニングし、その後、キャパシタ絶縁膜24を除去した部分に同キャパシタ絶縁膜24とは異なる素材からなる駆動用トランジスタ25のゲート絶縁膜26を形成することによって製造したものである。
【0051】
以下に、液晶駆動基板22の具体的な製造方法について説明する。
【0052】
まず、図3(a)に示すように、ガラス基板27の上面にポリシリコン膜28を所定の膜厚で成膜した後に、フォトリソグラフィによって一部分を除去することで所定形状にパターニングする。ここで、ポリシリコン膜28は、モノシランのみを用いた減圧CVD(Chemical Vapor Deposition:化学気相成長)法で形成した後に、膜抵抗値を低減するために所定濃度のリン又はボロンなどを添加して成膜してもよく、また、モノシランとホスフィン・ジボランなどのガスを同時に使用したCVD法で成膜してもよい。
【0053】
次に、図3(b)に示すように、ポリシリコン膜28の上面にシリコン酸化膜29を所定の膜厚で成膜する。
【0054】
次に、図3(c)に示すように、補助キャパシタ23のキャパシタ絶縁膜24となるシリコンナイトライド膜を所定の膜厚で成膜する。ここで、キャパシタ絶縁膜24は、モノシラン又はSiHClとアンモニアを用いたCVD法で成膜している。また、キャパシタ絶縁膜24は、シリコンナイトライド膜に限られず、いかなる絶縁膜を用いてもよいが、誘電率の高い素材の方が好ましく、特に、後述するゲート絶縁膜26よりも誘電率の高い素材のほうが好ましい。さらに、キャパシタ絶縁膜24は、後述するゲート絶縁膜26の形成における酸化処理を考慮して、シリコンよりも酸化係数の低い素材を用いた方が好ましい。
【0055】
次に、図3(d)に示すように、キャパシタ絶縁膜24の一部分をエッチングによって除去して、所定形状にパターニングする。ここで、エッチングは、ラジカルを使用したドライエッチングでもよく、また、燐酸などを使用したウエットエッチングでもよいが、特に、フッ素ラジカルを使用したケミカルドライエッチングによる場合には、シリコン酸化膜29がエッチングストッパーとして機能し、ポリシリコン膜28を保護することができる。
【0056】
次に、図3(e)に示すように、ポリシリコン膜28の上面であって、かつ、キャパシタ絶縁膜24を除去した部分に駆動用トランジスタ25のゲート絶縁膜26となるシリコン酸化膜を所定の膜厚で成膜し、その後、同ゲート絶縁膜26の所定位置(駆動用トランジスタ25の形成位置)に所定濃度のヒ素又はリンをドーピングする。ここで、ゲート絶縁膜26は、酸素雰囲気中で加熱する酸化処理によって所定形状の酸化膜を成膜している。これにより、キャパシタ絶縁膜24の上面にも酸化処理が施され、キャパシタ絶縁膜24の耐圧を向上させることができ、しかも、ゲート絶縁膜26をエッチングによってパターニングする必要がないために、ゲート絶縁膜26でのダメージの発生を可及的にするなくすることができる。なお、シリコンナイトライド膜からなるキャパシタ絶縁膜24の上面の方が、ポリシリコン膜28の上面よりも酸化膜の成長速度が遅いことから、キャパシタ絶縁膜24の上面にはポリシリコン膜28の上面よりも薄い酸化膜が成膜される。また、ゲート絶縁膜26は、シリコン酸化膜に限られず、いかなる絶縁膜を用いてもよい。
【0057】
次に、図3(f)に示すように、駆動用トランジスタ25のゲート絶縁膜26の上面及び補助キャパシタ23のキャパシタ絶縁膜24の上面にポリシリコン膜を所定の膜厚で成膜した後に、フォトリソグラフィによって一部分を除去することで所定形状にパターニングすることによって、駆動用トランジスタ25のゲート絶縁膜26の上面にゲート電極30を形成するとともに、補助キャパシタ23のキャパシタ絶縁膜24の上面にキャパシタ電極31を形成する。ここで、ゲート電極30及びキャパシタ電極31は、ポリシリコン膜に限られず、タングステン膜やタングステンシリサイド膜、又はこれらとポリシリコン膜とを積層した膜でもよい。
【0058】
次に、図4(a)に示すように、ガラス基板27の上面にリンガラス膜(PSG膜:Phosphrus Silicate Glass膜)からなる層間絶縁膜32を成膜するとともに、同層間絶縁膜32の一部にポリシリコン膜28に連通するコンタクトホール33を形成し、同コンタクトホール33にアルミニウム配線34(駆動信号線)を形成する。
【0059】
次に、図4(b)に示すように、層間絶縁膜32の上面にさらに層間絶縁膜35(PSG膜)を成膜するとともに、所定位置にポリシリコン膜28に連通するコンタクトホール36を形成する。
【0060】
最後に、図4(c)に示すように、層間絶縁膜35の上面の所定位置にITO膜(Indium−Tin Oxide膜)からなる透明電極37を形成する。
【0061】
ここで、図4(c)に示すように、駆動用トランジスタ3及び補助キャパシタ5を形成した部分は光が透過しない非透過領域38となっており、それ以外の部分は光が透過する透過領域39となっている。
【0062】
このように、液晶駆動基板22の表面に補助キャパシタ23のキャパシタ絶縁膜24を成膜した後に、同キャパシタ絶縁膜24の一部を除去して所定形状にパターニングし、その後、キャパシタ絶縁膜24を除去した部分に同キャパシタ絶縁膜24とは異なる素材からなる駆動用トランジスタ25のゲート絶縁膜26を形成することによって、駆動用トランジスタ25のゲート絶縁膜26は、液晶駆動基板22の表面に形成した補助キャパシタ23のキャパシタ絶縁膜24を一部除去した部分に同キャパシタ絶縁膜24とは異なる素材で形成した液晶表示装置21を製造することができる。
【0063】
かかる液晶表示装置21は、従来の液晶表示装置の製造方法(成膜工程及びエッチング工程)を適宜組合わせて利用することによって従来の製造技術の延長線上にて製造することができ、これにより液晶表示装置21の製造コストの増大を可及的に抑制しつつ、駆動用トランジスタ25のゲート絶縁膜26と補助キャパシタ23のキャパシタ絶縁膜24とを異なる素材の絶縁膜で形成することができる。
【0064】
特に、キャパシタ絶縁膜24を、ゲート絶縁膜26よりも誘電率が高い素材で形成することによって、補助キャパシタ23の容量を確保しつつ液晶駆動基板22において補助キャパシタ23が占有する面積を可及的に小さくすることができ、これによって非透過領域38の面積を縮小し、その分だけ透過領域39の面積を増大させることができ、液晶表示装置21の高輝度化を図ることができる。
【0065】
【発明の効果】
本発明は、以上に説明したような形態で実施され、以下に記載されるような効果を奏する。
【0066】
すなわち、本発明によれば、従来の液晶表示装置の製造方法を適宜組合わせて利用することによって従来の製造技術の延長線上にて製造可能とし、これにより液晶表示装置の製造コストの増大を可及的に抑制しつつ、駆動用トランジスタのゲート絶縁膜と補助キャパシタのキャパシタ絶縁膜とを別々の絶縁膜で形成することができる。
【0067】
特に、キャパシタ絶縁膜を、ゲート絶縁膜よりも誘電率が高い素材で形成した場合には、補助キャパシタの容量を確保しつつ補助キャパシタの占有面積を可及的に小さくすることができ、これによって非透過領域の面積を縮小し、その分だけ透過領域の面積を増大させることができ、液晶表示装置の高輝度化を図ることができる。
【図面の簡単な説明】
【図1】本発明の実施の形態1に係る液晶表示装置の製造方法(前半)を示す説明図。
【図2】本発明の実施の形態1に係る液晶表示装置の製造方法(後半)を示す説明図。
【図3】本発明の実施の形態2に係る液晶表示装置の製造方法(前半)を示す説明図。
【図4】本発明の実施の形態2に係る液晶表示装置の製造方法(後半)を示す説明図。
【図5】液晶表示装置の等価回路図。
【図6】従来の液晶表示装置の製造方法を示す説明図。
【符号の説明】
1,21 液晶表示装置
2,22 液晶駆動基板
3,25 駆動用トランジスタ
4,26 ゲート絶縁膜
5,23 補助キャパシタ
6,24 キャパシタ絶縁膜
7,27 ガラス基板
8,28 ポリシリコン膜
9,30 ゲート電極
10,31  キャパシタ電極
11,14,32,35  層間絶縁膜
12,15,33,36  コンタクトホール
13,34  アルミニウム配線
16,37  透明電極
17,38  非透過領域
18,39  透過領域
29 シリコン酸化膜
[0001]
TECHNICAL FIELD OF THE INVENTION
The present invention relates to a liquid crystal display device and a method for manufacturing the same.
[0002]
[Prior art]
A conventional liquid crystal display device has a configuration in which a transparent liquid crystal driving substrate made of glass or quartz and a counter substrate are arranged to face each other via a spacer or a sealing material, and a liquid crystal is filled between the two substrates. A plurality of transparent electrodes facing the liquid crystal driving substrate and the opposing substrate are formed in a lattice arrangement, respectively, and a predetermined driving signal is applied between the two transparent electrodes to change the light transmittance of the liquid crystal between the two transparent electrodes. Thus, various displays are performed.
[0003]
Here, as shown in FIG. 5, a driving transistor 102 (thin film transistor: TFT (Thin Film Transistor)) for selectively applying a predetermined driving signal to each transparent electrode 101 is formed on the liquid crystal driving substrate 100. In addition, an auxiliary capacitor 103 for stabilizing the display operation by stably holding the charge stored in the capacitor formed by the transparent electrode 101 for a certain time is formed. The transparent electrodes 101 are connected in series, the auxiliary capacitor 103 is connected between the source terminal of each driving transistor 102 and the ground line 104, and the drain terminals of the driving transistors 102 arranged in the vertical direction are connected to each other. Drive transistors connected by a drive signal line 105 and juxtaposed in the horizontal direction Connecting the gate terminals of the capacitor 102 by the selection signal line 106.
[0004]
Then, the liquid crystal display device 107 selectively supplies a driving signal to one of the transparent electrodes 101 connected to the driving transistor 102 by a selection signal supplied through the selection signal line 106 and a driving signal supplied through the driving signal line 105. Is applied to perform display at the pixel.
[0005]
The liquid crystal drive substrate 100 of the liquid crystal display device 107 was manufactured as follows (see FIG. 6).
[0006]
First, as shown in FIG. 6A, a polysilicon film 109 having a predetermined shape is formed on the upper surface of a glass substrate.
[0007]
Next, as shown in FIG. 6B, an insulating film 110 (oxide film) having a predetermined shape is formed on the upper surface of the polysilicon film 109, and a predetermined position of the insulating film 110 (a position where the driving transistor 102 is formed). Is doped with arsenic or phosphorus.
[0008]
Next, as shown in FIG. 6C, a gate electrode 111 having a predetermined shape and a capacitor are formed by a polysilicon film at predetermined positions on the upper surface of the insulating film 110 (the position where the driving transistor 102 is formed and the position where the auxiliary capacitor 103 is formed). An electrode 112 is formed.
[0009]
Next, as shown in FIG. 6D, an interlayer insulating film 113 (PSG film) is formed on the upper surface of the glass substrate 108, and a contact communicating with the polysilicon film 109 is formed on a part of the interlayer insulating film 113. A hole 114 is formed, and an aluminum wiring 115 (drive signal line 105) is formed in the contact hole 114.
[0010]
Next, as shown in FIG. 6E, an interlayer insulating film 116 (PSG film) is further formed on the upper surface of the interlayer insulating film 113, and a contact hole 117 communicating with the polysilicon film 109 is formed at a predetermined position. I do.
[0011]
Finally, as shown in FIG. 6F, the transparent electrode 101 is formed at a predetermined position on the upper surface of the interlayer insulating film 116 by using an ITO film (Indium-Tin Oxide film).
[0012]
As described above, in the conventional liquid crystal display device 107, the insulating film 110 is formed on the upper surface of the polysilicon film 109, and the gate electrode 111 of the driving transistor 102 and the capacitor electrode 112 of the auxiliary capacitor 103 are formed on the upper surface of the insulating film 110. Had formed. That is, the gate insulating film of the driving transistor 102 and the capacitor insulating film of the auxiliary capacitor 103 are formed by the common insulating film 110.
[0013]
Here, as shown in FIG. 6F, the portion where the driving transistor 102 and the auxiliary capacitor 103 are formed is a non-transmissive region 118 through which light does not pass, and the other portion is a transmissive region through which light passes. 119.
[0014]
[Problems to be solved by the invention]
However, in general, the liquid crystal display device can increase the area of the transmission region by reducing the area of the non-transmission region, and can increase the area of the transmission region by increasing the area of the transmission region. Although high brightness can be achieved, in the above-described conventional liquid crystal display device 107, the gate insulating film of the driving transistor 102 and the capacitor insulating film of the auxiliary capacitor 103 are formed by the common insulating film 110. In addition, the area of the non-transmissive region 118 cannot be reduced, and the luminance of the liquid crystal display device 107 cannot be increased by increasing the area of the transmissive region 119. This was due to the reasons described below.
[0015]
That is, in order to reduce the area of the non-transmissive region 118, it is necessary to reduce the area occupied by the auxiliary capacitor 103 in the non-transmissive region 118. On the other hand, to stabilize the display operation, it is necessary to secure a predetermined capacitance as the auxiliary capacitor 103. Therefore, in order to increase the brightness of the liquid crystal display device 107 while considering the stability of the display operation, it is necessary to reduce the occupied area while securing the capacitance of the auxiliary capacitor 103 to a predetermined value or more. As the method, a method of reducing the thickness of the capacitor insulating film of the auxiliary capacitor 103 or a method of increasing the dielectric constant of the capacitor insulating film of the auxiliary capacitor 103 can be considered.
[0016]
However, in the conventional liquid crystal display device 107, since the gate insulating film of the driving transistor 102 and the capacitor insulating film of the auxiliary capacitor 103 are formed by the common insulating film 110, the capacitor insulating film of the auxiliary capacitor 103 In the case where the thickness is reduced, even the gate insulating film of the driving transistor 102 becomes thinner, the withstand voltage of the driving transistor 102 is reduced, and the reliability of the liquid crystal display device 107 may be reduced. On the other hand, when the dielectric constant of the capacitor insulating film of the auxiliary capacitor 103 is increased by using a silicon nitride film having a high dielectric constant instead of the silicon oxide film as the insulating film 110, the gate oxide of the driving transistor 102 is reduced. A silicon nitride film must be used as the film, and the driving transformer Leakage current Star 102 ends up increasing, whereby the reliability of the liquid crystal display device 107 there is a risk of reducing also.
[0017]
As described above, in the above-described conventional liquid crystal display device 107, since the gate insulating film of the driving transistor 102 and the capacitor insulating film of the auxiliary capacitor 103 are formed by the common insulating film 110, the area of the transmission region 119 is increased. However, it was not possible to increase the brightness of the liquid crystal display device 107 due to the increase in the brightness.
[0018]
On the other hand, by forming the gate insulating film of the driving transistor and the capacitor insulating film of the auxiliary capacitor by separate insulating films, the area of the non-transmissive region is reduced, and the area of the transmissive region is increased by that amount. It is also conceivable to increase the brightness of the image. As a method therefor, a method of laminating the driving transistor and the auxiliary capacitor by forming the auxiliary capacitor below the driving transistor, or forming the auxiliary capacitor in a vertical direction (depth direction) of the semiconductor substrate. Thus, a method of verticalizing the auxiliary capacitor can be considered.
[0019]
However, the method of laminating the driving transistor and the auxiliary capacitor and the method of vertically forming the auxiliary capacitor complicate the manufacturing process of the liquid crystal display device, and may increase the manufacturing cost of the liquid crystal display device. there were.
[0020]
As described above, when the gate insulating film of the driving transistor and the capacitor insulating film of the auxiliary capacitor are formed of different insulating films, the manufacturing cost of the liquid crystal display device increases, and it has been difficult to put the liquid crystal display device to practical use.
[0021]
[Means for Solving the Problems]
Therefore, according to the present invention, in a liquid crystal display device in which a liquid crystal is filled between two substrates arranged opposite to each other and a driving transistor and an auxiliary capacitor are formed on one substrate, a capacitor insulating film of the auxiliary capacitor is provided. Has been formed of a material different from the gate insulating film in a portion where the gate insulating film of the driving transistor formed on the surface of the substrate is partially removed.
[0022]
Further, in a liquid crystal display device in which a liquid crystal is filled between two substrates arranged opposite to each other and a driving transistor and an auxiliary capacitor are formed on one substrate, a gate insulating film of the driving transistor is formed on the substrate. Is formed of a material different from the capacitor insulating film in a portion where the capacitor insulating film of the auxiliary capacitor formed on the surface is partially removed.
[0023]
Further, the capacitor insulating film is formed of a material having a higher dielectric constant than the gate insulating film.
[0024]
In addition, in a method for manufacturing a liquid crystal display device in which a liquid crystal is filled between two substrates arranged opposite to each other and a driving transistor and an auxiliary capacitor are formed on one of the substrates, the driving transistor is provided on the surface of the substrate. A gate insulating film is formed, and a part of the gate insulating film is removed and patterned into a predetermined shape. Then, an auxiliary capacitor made of a material different from that of the gate insulating film is formed in a portion where the gate insulating film is removed. A capacitor insulating film is formed.
[0025]
Further, in a method for manufacturing a liquid crystal display device in which a liquid crystal is filled between two substrates arranged opposite to each other and a driving transistor and an auxiliary capacitor are formed on one substrate, an auxiliary capacitor is formed on the surface of the substrate. A capacitor insulating film is formed, a part of the capacitor insulating film is removed and patterned into a predetermined shape, and then a part of the driving transistor made of a material different from the capacitor insulating film is formed in a portion where the capacitor insulating film is removed. A gate insulating film is formed.
[0026]
Further, the capacitor insulating film is formed of a material having a higher dielectric constant than the gate insulating film.
[0027]
BEST MODE FOR CARRYING OUT THE INVENTION
In the liquid crystal display device according to the present invention, a transparent liquid crystal driving substrate made of glass or quartz or the like and a counter substrate are arranged so as to face each other via a spacer or a sealing material, and a liquid crystal is filled between the two substrates. A plurality of transparent electrodes facing a substrate and a counter substrate are formed in a grid array.
[0028]
Like a conventional liquid crystal display device, a driving transistor (thin film transistor: TFT (Thin Film Transistor)) for selectively applying a predetermined driving signal to each transparent electrode is formed on the liquid crystal driving substrate, and a transparent transistor is formed. An auxiliary capacitor for stabilizing the display operation by stably holding the charge stored in the capacitor formed by the electrodes for a certain period of time is formed.A transparent electrode is connected in series to the source terminal of each driving transistor, and , An auxiliary capacitor is connected between the source terminal of each driving transistor and the ground line, and the drain terminals of the driving transistors arranged vertically are connected by a drive signal line, and are juxtaposed horizontally. The gate terminals of the driving transistors are connected by a selection signal line.
[0029]
The liquid crystal display device according to the present invention is characterized by the structure of the liquid crystal driving substrate and the manufacturing method.
[0030]
That is, in the liquid crystal driving substrate of the liquid crystal display device according to the present invention, after the gate insulating film of the driving transistor is formed on the surface of the liquid crystal driving substrate, a part of the gate insulating film is removed and patterned into a predetermined shape. Thereafter, a capacitor insulating film of an auxiliary capacitor made of a material different from that of the gate insulating film is formed in a portion where the gate insulating film is removed.
[0031]
Further, the liquid crystal driving substrate was formed by forming a capacitor insulating film of an auxiliary capacitor on the surface of the liquid crystal driving substrate, then removing a part of the capacitor insulating film and patterning it into a predetermined shape, and then removing the capacitor insulating film. It is manufactured by forming a gate insulating film of a driving transistor made of a material different from that of the capacitor insulating film in a portion.
[0032]
As described above, according to the present invention, the manufacturing method of the conventional liquid crystal display device can be manufactured on an extension of the conventional manufacturing technology by appropriately combining and using the manufacturing method, thereby increasing the manufacturing cost of the liquid crystal display device. The gate insulating film of the driving transistor and the capacitor insulating film of the auxiliary capacitor can be formed of different insulating films while suppressing the effect as much as possible.
[0033]
In particular, when the capacitor insulating film is formed of a material having a higher dielectric constant than the gate insulating film, the occupied area can be reduced as much as possible while securing the capacity of the auxiliary capacitor. And the area of the transmissive region can be increased by that amount, and the brightness of the liquid crystal display device can be increased.
[0034]
Hereinafter, specific embodiments of the present invention will be described with reference to the drawings.
[0035]
[Embodiment 1]
In the liquid crystal display device 1 according to the first embodiment of the present invention, as shown in FIG. 1, after forming a gate insulating film 4 of a driving transistor 3 on a surface of a liquid crystal driving substrate 2, A part manufactured by removing a part and patterning it into a predetermined shape, and then forming a capacitor insulating film 6 of an auxiliary capacitor 5 made of a material different from that of the gate insulating film 4 in a part where the gate insulating film 4 is removed. It is.
[0036]
Hereinafter, a specific method for manufacturing the liquid crystal driving substrate 2 will be described.
[0037]
First, as shown in FIG. 1A, a polysilicon film 8 having a predetermined thickness is formed on the upper surface of a glass substrate 7, and then a portion is removed by photolithography to be patterned into a predetermined shape. Here, the polysilicon film 8 is formed by a low-pressure CVD (Chemical Vapor Deposition) method using only monosilane, and then a predetermined concentration of phosphorus or boron is added to reduce the film resistance. The film may be formed by a CVD method using a gas such as monosilane and phosphine / diborane at the same time.
[0038]
Next, as shown in FIG. 1B, a silicon oxide film to be a gate insulating film 4 of the driving transistor 3 is formed on the upper surface of the polysilicon film 8 to a predetermined thickness. Here, the gate insulating film 4 is formed using heat treatment or a reaction between a silane-based gas and oxygen. Further, the gate insulating film 4 is not limited to the silicon oxide film, and any insulating film may be used.
[0039]
Next, as shown in FIG. 1C, a part of the gate insulating film 4 is removed by etching and patterned into a predetermined shape, and thereafter, a predetermined position of the gate insulating film 4 (a position where the driving transistor 3 is formed) ) Is doped with a predetermined concentration of arsenic or phosphorus. Here, the etching may be wet etching or dry etching.
[0040]
Next, as shown in FIG. 1D, a silicon nitride film to be a capacitor insulating film 6 of the auxiliary capacitor 5 is formed on the upper surface of the gate insulating film 4 to a predetermined thickness. Here, the capacitor insulating film 6 is made of monosilane or SiH 2 Cl 2 And a CVD method using ammonia. Further, the capacitor insulating film 6 is not limited to a silicon nitride film, and any insulating film may be used. However, a material having a higher dielectric constant is preferable, and a material having a higher dielectric constant than the gate insulating film 4 is particularly preferable. More preferred.
[0041]
Next, as shown in FIG. 1E, a part of the capacitor insulating film 6 other than the part from which the gate insulating film 4 is removed is removed by etching, and is patterned into a predetermined shape. Here, the etching may be dry etching using radicals or wet etching using phosphoric acid or the like.
[0042]
Next, as shown in FIG. 1F, the gate insulating film 4 is oxidized to improve the breakdown voltage of the gate insulating film 4 and remove the damage. 4 is formed on the upper surface of the capacitor 4 and the upper surface of the capacitor insulating film 6 of the auxiliary capacitor 5 with a predetermined thickness, and then is partially removed by photolithography to be patterned into a predetermined shape. The gate electrode 9 is formed on the upper surface of the gate insulating film 4 and the capacitor electrode 10 is formed on the upper surface of the capacitor insulating film 6 of the auxiliary capacitor 5. Here, the gate electrode 9 and the capacitor electrode 10 are not limited to the polysilicon film, but may be a tungsten film, a tungsten silicide film, or a film in which these are stacked with a polysilicon film.
[0043]
Next, as shown in FIG. 2A, an interlayer insulating film 11 made of a phosphorus glass film (PSG film: Phosphorus Silicate Glass film) is formed on the upper surface of the glass substrate 7 and one of the interlayer insulating films 11 is formed. In this portion, a contact hole 12 communicating with the polysilicon film 8 is formed, and an aluminum wiring 13 (drive signal line) is formed in the contact hole 12.
[0044]
Next, as shown in FIG. 2B, an interlayer insulating film 14 (PSG film) is further formed on the upper surface of the interlayer insulating film 11, and a contact hole 15 communicating with the polysilicon film 8 is formed at a predetermined position. I do.
[0045]
Finally, as shown in FIG. 2C, a transparent electrode 16 made of an ITO film (Indium-Tin Oxide film) is formed at a predetermined position on the upper surface of the interlayer insulating film 14.
[0046]
Here, as shown in FIG. 2C, the portion where the driving transistor 3 and the auxiliary capacitor 5 are formed is a non-transmissive region 17 through which light does not pass, and the other portion is a transmissive region through which light passes. It is 18.
[0047]
As described above, after the gate insulating film 4 of the driving transistor 3 is formed on the surface of the liquid crystal driving substrate 2, a part of the gate insulating film 4 is removed and patterned into a predetermined shape. The capacitor insulating film 6 of the auxiliary capacitor 5 made of a material different from that of the gate insulating film 4 is formed in the portion where the gate insulating film 4 has been removed. The liquid crystal display device 1 in which the gate insulating film 4 of the transistor 3 is partially removed and made of a material different from that of the gate insulating film 4 can be manufactured.
[0048]
Such a liquid crystal display device 1 can be manufactured on an extension of the conventional manufacturing technology by appropriately combining and using a conventional method of manufacturing a liquid crystal display device (a film forming step and an etching step). The gate insulating film 4 of the driving transistor 3 and the capacitor insulating film 6 of the auxiliary capacitor 5 can be formed of insulating films of different materials while suppressing an increase in the manufacturing cost of the display device 1 as much as possible.
[0049]
In particular, by forming the capacitor insulating film 6 with a material having a higher dielectric constant than the gate insulating film 4, the area occupied by the auxiliary capacitor 5 in the liquid crystal driving substrate 2 while securing the capacity of the auxiliary capacitor 5 is as large as possible. As a result, the area of the non-transmissive region 17 can be reduced, and the area of the transmissive region 18 can be increased accordingly, so that the brightness of the liquid crystal display device 1 can be increased.
[0050]
[Embodiment 2]
As shown in FIG. 3, the liquid crystal display device 21 according to the second embodiment of the present invention forms the capacitor insulating film 24 of the auxiliary capacitor 23 on the surface of the liquid crystal driving substrate 22 and then forms one of the capacitor insulating films 24. The gate insulating film of the driving transistor 25 made of a material different from that of the capacitor insulating film 24 is formed on the portion where the capacitor insulating film 24 has been removed, by removing the portion and patterning into a predetermined shape. It is.
[0051]
Hereinafter, a specific method for manufacturing the liquid crystal drive substrate 22 will be described.
[0052]
First, as shown in FIG. 3A, a polysilicon film 28 having a predetermined thickness is formed on the upper surface of the glass substrate 27, and then a portion is removed by photolithography to be patterned into a predetermined shape. Here, the polysilicon film 28 is formed by a low-pressure CVD (Chemical Vapor Deposition) method using only monosilane, and then a predetermined concentration of phosphorus or boron is added to reduce the film resistance. The film may be formed by a CVD method using a gas such as monosilane and phosphine / diborane at the same time.
[0053]
Next, as shown in FIG. 3B, a silicon oxide film 29 having a predetermined thickness is formed on the upper surface of the polysilicon film.
[0054]
Next, as shown in FIG. 3C, a silicon nitride film to be a capacitor insulating film 24 of the auxiliary capacitor 23 is formed with a predetermined thickness. Here, the capacitor insulating film 24 is made of monosilane or SiH 2 Cl 2 And a CVD method using ammonia. Further, the capacitor insulating film 24 is not limited to a silicon nitride film, and any insulating film may be used. However, a material having a high dielectric constant is preferable, and in particular, a material having a higher dielectric constant than a gate insulating film 26 described later. Materials are preferred. Further, it is preferable that the capacitor insulating film 24 be made of a material having a lower oxidation coefficient than silicon in consideration of an oxidation process in forming a gate insulating film 26 described later.
[0055]
Next, as shown in FIG. 3D, a part of the capacitor insulating film 24 is removed by etching and patterned into a predetermined shape. Here, the etching may be dry etching using radicals or wet etching using phosphoric acid or the like. In particular, in the case of chemical dry etching using fluorine radicals, the silicon oxide film 29 is an etching stopper. , And can protect the polysilicon film 28.
[0056]
Next, as shown in FIG. 3E, a silicon oxide film to be the gate insulating film 26 of the driving transistor 25 is formed on the upper surface of the polysilicon film 28 and at a portion where the capacitor insulating film 24 is removed. Then, a predetermined concentration (arrangement position of the driving transistor 25) of the gate insulating film 26 is doped with a predetermined concentration of arsenic or phosphorus. Here, as the gate insulating film 26, an oxide film having a predetermined shape is formed by an oxidation process of heating in an oxygen atmosphere. Accordingly, the upper surface of the capacitor insulating film 24 is also oxidized, so that the withstand voltage of the capacitor insulating film 24 can be improved, and the gate insulating film 26 does not need to be patterned by etching. 26 can be prevented from occurring as much as possible. Since the growth rate of the oxide film is lower on the upper surface of the capacitor insulating film 24 made of a silicon nitride film than on the upper surface of the polysilicon film 28, the upper surface of the polysilicon film 28 is formed on the upper surface of the capacitor insulating film 24. A thinner oxide film is formed. Further, the gate insulating film 26 is not limited to the silicon oxide film, and any insulating film may be used.
[0057]
Next, as shown in FIG. 3F, after a polysilicon film is formed to a predetermined thickness on the upper surface of the gate insulating film 26 of the driving transistor 25 and the upper surface of the capacitor insulating film 24 of the auxiliary capacitor 23, The gate electrode 30 is formed on the upper surface of the gate insulating film 26 of the driving transistor 25 by patterning into a predetermined shape by removing a part by photolithography, and the capacitor electrode is formed on the upper surface of the capacitor insulating film 24 of the auxiliary capacitor 23. 31 are formed. Here, the gate electrode 30 and the capacitor electrode 31 are not limited to the polysilicon film, and may be a tungsten film, a tungsten silicide film, or a film in which these are stacked with a polysilicon film.
[0058]
Next, as shown in FIG. 4A, on the upper surface of the glass substrate 27, an interlayer insulating film 32 made of a phosphorus glass film (PSG film: Phosphous Silicate Glass film) is formed. A contact hole 33 communicating with the polysilicon film 28 is formed in the portion, and an aluminum wiring 34 (drive signal line) is formed in the contact hole 33.
[0059]
Next, as shown in FIG. 4B, an interlayer insulating film 35 (PSG film) is further formed on the upper surface of the interlayer insulating film 32, and a contact hole 36 communicating with the polysilicon film 28 is formed at a predetermined position. I do.
[0060]
Finally, as shown in FIG. 4C, a transparent electrode 37 made of an ITO film (Indium-Tin Oxide film) is formed at a predetermined position on the upper surface of the interlayer insulating film 35.
[0061]
Here, as shown in FIG. 4C, the portion where the driving transistor 3 and the auxiliary capacitor 5 are formed is a non-transmissive region 38 through which light does not pass, and the other portion is a transmissive region through which light passes. It is 39.
[0062]
As described above, after the capacitor insulating film 24 of the auxiliary capacitor 23 is formed on the surface of the liquid crystal driving substrate 22, a part of the capacitor insulating film 24 is removed and patterned into a predetermined shape. By forming the gate insulating film 26 of the driving transistor 25 made of a material different from that of the capacitor insulating film 24 in the removed portion, the gate insulating film 26 of the driving transistor 25 was formed on the surface of the liquid crystal driving substrate 22. It is possible to manufacture the liquid crystal display device 21 in which a part of the auxiliary capacitor 23 from which the capacitor insulating film 24 is partially removed is formed of a material different from that of the capacitor insulating film 24.
[0063]
Such a liquid crystal display device 21 can be manufactured on an extension of the conventional manufacturing technology by appropriately combining and using a conventional manufacturing method of a liquid crystal display device (a film forming step and an etching step). The gate insulating film 26 of the driving transistor 25 and the capacitor insulating film 24 of the auxiliary capacitor 23 can be formed of insulating films of different materials while suppressing an increase in the manufacturing cost of the display device 21 as much as possible.
[0064]
In particular, by forming the capacitor insulating film 24 with a material having a higher dielectric constant than the gate insulating film 26, the area occupied by the auxiliary capacitor 23 in the liquid crystal drive substrate 22 while securing the capacity of the auxiliary capacitor 23 is as small as possible. As a result, the area of the non-transmissive region 38 can be reduced, and the area of the transmissive region 39 can be increased accordingly, so that the brightness of the liquid crystal display device 21 can be increased.
[0065]
【The invention's effect】
The present invention is implemented in the form described above, and has the following effects.
[0066]
That is, according to the present invention, it is possible to manufacture the liquid crystal display device on an extension of the conventional manufacturing technology by appropriately combining the conventional manufacturing methods of the liquid crystal display device, thereby increasing the manufacturing cost of the liquid crystal display device. The gate insulating film of the driving transistor and the capacitor insulating film of the auxiliary capacitor can be formed of different insulating films, while suppressing as much as possible.
[0067]
In particular, when the capacitor insulating film is formed of a material having a higher dielectric constant than the gate insulating film, the area occupied by the auxiliary capacitor can be reduced as much as possible while securing the capacity of the auxiliary capacitor. The area of the non-transmissive area can be reduced, and the area of the transmissive area can be increased accordingly, so that the brightness of the liquid crystal display device can be increased.
[Brief description of the drawings]
FIG. 1 is an explanatory diagram illustrating a method (first half) of manufacturing a liquid crystal display device according to a first embodiment of the present invention.
FIG. 2 is an explanatory view showing a method (second half) of manufacturing the liquid crystal display device according to the first embodiment of the present invention.
FIG. 3 is an explanatory view illustrating a method (first half) of manufacturing a liquid crystal display device according to Embodiment 2 of the present invention.
FIG. 4 is an explanatory view showing a method (second half) of manufacturing the liquid crystal display device according to the second embodiment of the present invention.
FIG. 5 is an equivalent circuit diagram of a liquid crystal display device.
FIG. 6 is an explanatory view showing a method for manufacturing a conventional liquid crystal display device.
[Explanation of symbols]
1,21 liquid crystal display
2,22 LCD drive board
3,25 Driving transistor
4,26 gate insulating film
5,23 Auxiliary capacitor
6,24 Capacitor insulating film
7,27 glass substrate
8,28 polysilicon film
9,30 Gate electrode
10,31 Capacitor electrode
11,14,32,35 interlayer insulating film
12, 15, 33, 36 contact holes
13,34 Aluminum wiring
16,37 transparent electrode
17,38 Non-transparent area
18, 39 Transmission area
29 Silicon oxide film

Claims (6)

対向状に配置した2枚の基板の間に液晶を充填し、一方の基板に駆動用トランジスタと補助キャパシタとを形成してなる液晶表示装置において、
補助キャパシタのキャパシタ絶縁膜は、基板の表面に形成した駆動用トランジスタのゲート絶縁膜を一部除去した部分に同ゲート絶縁膜とは異なる素材で形成したことを特徴とする液晶表示装置。
In a liquid crystal display device in which a liquid crystal is filled between two substrates arranged opposite to each other and a driving transistor and an auxiliary capacitor are formed on one substrate,
A liquid crystal display device wherein the capacitor insulating film of the auxiliary capacitor is formed of a material different from the gate insulating film in a portion where the gate insulating film of the driving transistor formed on the surface of the substrate is partially removed.
対向状に配置した2枚の基板の間に液晶を充填し、一方の基板に駆動用トランジスタと補助キャパシタとを形成してなる液晶表示装置において、
駆動用トランジスタのゲート絶縁膜は、基板の表面に形成した補助キャパシタのキャパシタ絶縁膜を一部除去した部分に同キャパシタ絶縁膜とは異なる素材で形成したことを特徴とする液晶表示装置。
In a liquid crystal display device in which a liquid crystal is filled between two substrates arranged opposite to each other and a driving transistor and an auxiliary capacitor are formed on one substrate,
A liquid crystal display device, wherein a gate insulating film of a driving transistor is formed of a material different from that of the capacitor insulating film at a portion where a capacitor insulating film of an auxiliary capacitor formed on a surface of a substrate is partially removed.
前記キャパシタ絶縁膜は、ゲート絶縁膜よりも誘電率が高い素材で形成したことを特徴とする請求項1又は請求項2記載の液晶表示装置。3. The liquid crystal display device according to claim 1, wherein the capacitor insulating film is formed of a material having a higher dielectric constant than a gate insulating film. 対向状に配置した2枚の基板の間に液晶を充填し、一方の基板に駆動用トランジスタと補助キャパシタとを形成してなる液晶表示装置の製造方法において、
基板の表面に駆動用トランジスタのゲート絶縁膜を成膜するとともに、同ゲート絶縁膜の一部を除去して所定形状にパターニングし、その後、ゲート絶縁膜を除去した部分に同ゲート絶縁膜とは異なる素材からなる補助キャパシタのキャパシタ絶縁膜を形成することを特徴とする液晶表示装置の製造方法。
In a method for manufacturing a liquid crystal display device, a liquid crystal is filled between two substrates arranged opposite to each other, and a driving transistor and an auxiliary capacitor are formed on one of the substrates.
A gate insulating film of the driving transistor is formed on the surface of the substrate, and a part of the gate insulating film is removed and patterned into a predetermined shape. A method for manufacturing a liquid crystal display device, comprising forming a capacitor insulating film of an auxiliary capacitor made of a different material.
対向状に配置した2枚の基板の間に液晶を充填し、一方の基板に駆動用トランジスタと補助キャパシタとを形成してなる液晶表示装置の製造方法において、
基板の表面に補助キャパシタのキャパシタ絶縁膜を成膜するとともに、同キャパシタ絶縁膜の一部を除去して所定形状にパターニングし、その後、キャパシタ絶縁膜を除去した部分に同キャパシタ絶縁膜とは異なる素材からなる駆動用トランジスタのゲート絶縁膜を形成することを特徴とする液晶表示装置の製造方法。
In a method for manufacturing a liquid crystal display device, a liquid crystal is filled between two substrates arranged opposite to each other, and a driving transistor and an auxiliary capacitor are formed on one of the substrates.
A capacitor insulating film of the auxiliary capacitor is formed on the surface of the substrate, and a part of the capacitor insulating film is removed and patterned into a predetermined shape. A method for manufacturing a liquid crystal display device, comprising forming a gate insulating film of a driving transistor made of a material.
前記キャパシタ絶縁膜は、ゲート絶縁膜よりも誘電率が高い素材で形成することを特徴とする請求項4又は請求項5記載の液晶表示装置の製造方法。The method according to claim 4, wherein the capacitor insulating film is formed of a material having a higher dielectric constant than a gate insulating film.
JP2002203775A 2002-07-12 2002-07-12 Liquid crystal display device and manufacturing method thereof Expired - Fee Related JP4147845B2 (en)

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