JP2003279544A - Detection device for magnetic permeability - Google Patents

Detection device for magnetic permeability

Info

Publication number
JP2003279544A
JP2003279544A JP2002079577A JP2002079577A JP2003279544A JP 2003279544 A JP2003279544 A JP 2003279544A JP 2002079577 A JP2002079577 A JP 2002079577A JP 2002079577 A JP2002079577 A JP 2002079577A JP 2003279544 A JP2003279544 A JP 2003279544A
Authority
JP
Japan
Prior art keywords
circuit
coil
magnetic permeability
digital
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2002079577A
Other languages
Japanese (ja)
Other versions
JP4071515B2 (en
Inventor
Noboru Sawayama
昇 沢山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ricoh Co Ltd
Original Assignee
Ricoh Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ricoh Co Ltd filed Critical Ricoh Co Ltd
Priority to JP2002079577A priority Critical patent/JP4071515B2/en
Publication of JP2003279544A publication Critical patent/JP2003279544A/en
Application granted granted Critical
Publication of JP4071515B2 publication Critical patent/JP4071515B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Dry Development In Electrophotography (AREA)
  • Measuring Magnetic Variables (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To improve detection accuracy by reducing interference between a digital circuit and an analog circuit. <P>SOLUTION: A coil 2 is installed at the center of a substrate 1 and a connector 3 for power supply is connected to one end of the substrate 1. The analog circuit 4 including an operational amplifier is arranged between this connector 3 and the coil 2. The digital circuit 6 with the digital IC (IC1) 5 of a CMOS including an ceramic oscillator and 4 circuits of XOR logic circuits is arranged at the other side of the connector 3 with placing the coil 2 between the circuits 4 and 6. <P>COPYRIGHT: (C)2004,JPO

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、乾式電子写真方式
を用いた画像形成装置で用いられるトナー等の磁性体の
有無又は量を非接触で検知する透磁率検知装置に関し、
例えば上記画像形成装置のトナー濃度センサ等に用いら
れるものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a magnetic permeability detecting device for contactlessly detecting the presence or the amount of a magnetic substance such as toner used in an image forming apparatus using a dry electrophotographic system.
For example, it is used for a toner concentration sensor of the image forming apparatus.

【0002】[0002]

【従来の技術】電子写真技術を用いた複写機等の画像形
成装置においては、感光体ドラムの表面を帯電器により
一様に帯電させ、この感光体を画像情報に応じて露光す
ることにより静電潜像を形成し、この静電潜像にトナー
を付着させて現像し、そのトナー像を用紙に転写した
後、定着して最終画像を得るようにしている。
2. Description of the Related Art In an image forming apparatus such as a copying machine using electrophotography, the surface of a photoconductor drum is uniformly charged by a charger, and the photoconductor is exposed in accordance with image information so as to be statically charged. An electrostatic latent image is formed, toner is attached to the electrostatic latent image for development, the toner image is transferred to a sheet, and then fixed to obtain a final image.

【0003】このような画像形成装置においては、現像
器に収容されているトナーを常に所定レベル範囲に維持
する必要があり、このために、現像剤中のトナー濃度を
検知するTセンサと呼ばれるトナー濃度センサが設けら
れている。このトナー濃度センサは、コイルとコンデン
サにより共振回路を構成し、この共振回路を発振器に接
続して現像器の近傍に置き、磁性体としてのトナーの量
が所定範囲にあるとき共振するように発振周波数を設定
することでトナーを検知できるようにしたものである。
In such an image forming apparatus, it is necessary to always maintain the toner contained in the developing device within a predetermined level range. Therefore, a toner called a T sensor for detecting the toner concentration in the developer is used. A concentration sensor is provided. This toner concentration sensor has a resonance circuit composed of a coil and a capacitor. The resonance circuit is connected to an oscillator and placed near a developing device to oscillate so as to resonate when the amount of toner as a magnetic material falls within a predetermined range. The toner can be detected by setting the frequency.

【0004】[0004]

【発明が解決しようとする課題】しかしながら従来のト
ナー濃度センサは、発振器を含むデジタル回路部分とア
ナログ回路部分とがあり、発振器の高周波輻射によりア
ナログ回路が影響を受けることがあった。また、従来の
センサは必ずしも検知精度がよくなかった。
However, the conventional toner concentration sensor has a digital circuit part including an oscillator and an analog circuit part, and the analog circuit may be affected by the high frequency radiation of the oscillator. Further, the conventional sensor does not always have high detection accuracy.

【0005】本発明は上記の問題を解決するためになさ
れたもので、デジタル・アナログの干渉を低減すると共
に、検知精度の高い透磁率検知装置を得ることを目的と
している。
The present invention has been made to solve the above problems, and it is an object of the present invention to obtain a magnetic permeability detecting device which has a high detection accuracy while reducing digital / analog interference.

【0006】[0006]

【課題を解決するための手段】上記の目的を達成するた
めに、本発明による透磁率検知装置は、空間的に近接し
た領域の透磁率や電気電導率に応じてインピーダンスが
変化するように配置されたコイルと、前記コイルに直列
又は並列に接続され共振回路を形成するコンデンサと、
固有の周波数の交番電圧を発生し前記共振回路を駆動す
るデジタルの発振回路を含むデジタル回路と、前記共振
回路中の電圧又は電流を取り出しアナログ信号を作り出
すアナログ回路とを基板に配置した透磁率検知装置にお
いて、前記基板上に前記コイルを挟んで一方側に前記ア
ナログ回路を配置し他方側に前記デジタル回路を配置し
たものである。
In order to achieve the above object, the magnetic permeability detecting device according to the present invention is arranged so that the impedance changes in accordance with the magnetic permeability and electric conductivity of spatially adjacent regions. And a capacitor connected in series or in parallel with the coil to form a resonance circuit,
Magnetic permeability detection in which a digital circuit including a digital oscillation circuit that generates an alternating voltage of a specific frequency and drives the resonance circuit, and an analog circuit that takes out the voltage or current in the resonance circuit and generates an analog signal are arranged on a substrate. In the device, the analog circuit is arranged on one side and the digital circuit is arranged on the other side with the coil interposed therebetween on the substrate.

【0007】[0007]

【発明の実施の形態】以下、本発明の実施の形態を図面
と共に説明する。図1に請求項1から3に関する第1の
実施の形態による透磁率検知装置を示す構成図である。
図1において、基板1のほぼ中央にコイル2が張り付け
られ、基板1の一端に電源供給用のコネクタ3が取り付
けられている。コイル2は1次コイルと2次コイルを有
する。このコネクタ3とコイル2の間にオペアンプを含
むアナログ回路4が配置されている。また、コイル2を
挟んでコネクタ3と反対側にはセラミック発振子やXO
Rの論理回路が4回路入ったCMOSのデジタルIC
(IC1)5を含むデジタル回路6が配置されている。
BEST MODE FOR CARRYING OUT THE INVENTION Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 is a configuration diagram showing a magnetic permeability detection device according to a first embodiment of claims 1 to 3.
In FIG. 1, a coil 2 is attached to a substantially central portion of a substrate 1, and a power supply connector 3 is attached to one end of the substrate 1. The coil 2 has a primary coil and a secondary coil. An analog circuit 4 including an operational amplifier is arranged between the connector 3 and the coil 2. On the side opposite to the connector 3 with the coil 2 interposed, a ceramic oscillator or XO
CMOS digital IC with four R logic circuits
A digital circuit 6 including (IC1) 5 is arranged.

【0008】図2はデジタル回路6とアナログ回路4の
構成を示す回路図である。ここでは、概略を説明する。
XORの論理回路(1/4IC1)入力の一端をHiレ
ベルにプルアップし、XORの論理回路のもう一方の入
力と出力の間にセラミック発振子OSCを配置すること
により、発信回路を形成している。ここでは、基本周波
数4MHzで発振し、波形は矩形である。この発振出力
電圧は、論理回路入力の一端をHiレベルにプルアップ
したもう一つのXOR論理回路(2/4IC1)に入力
されている。この2段目の論理回路2/4IC1の出力
は、1段目の論理回路1/4IC1の出力を反転するだ
けのものであるが、2段目に接続される負荷の影響を発
振回路(1段目)に伝えない役割を果たす。但し、負荷
の容量成分が大きくなると発振が止まる場合がある。
FIG. 2 is a circuit diagram showing the configurations of the digital circuit 6 and the analog circuit 4. Here, the outline will be described.
An oscillator circuit is formed by pulling up one end of the input of the XOR logic circuit (1 / 4IC1) to Hi level and arranging the ceramic oscillator OSC between the other input and output of the XOR logic circuit. There is. Here, it oscillates at a fundamental frequency of 4 MHz and the waveform is rectangular. This oscillation output voltage is input to another XOR logic circuit (2 / 4IC1) in which one end of the logic circuit input is pulled up to the Hi level. The output of the logic circuit 2 / 4IC1 of the second stage only inverts the output of the logic circuit 1 / 4IC1 of the first stage. However, the influence of the load connected to the second stage of the oscillation circuit (1 It plays a role that does not convey to (step). However, the oscillation may stop when the capacitance component of the load increases.

【0009】論理回路2/4IC1の出力は、抵抗R3
を介して1次コイルL1に入力される。1次コイルの終
端は2次コイルの終端L23と短絡されており、実質的
に一つのコンデンサ(これをステムコンデンサと呼ぶ)
C3に接続されている。論理IC1及びステムコンデン
サC3の他端はアースされている。また、2次コイルの
他端は小さな感度調整用の抵抗を介してアースされてい
る。従って、1次コイル、2次コイルともステムコンデ
ンサC3との共振回路を形成する。
The output of the logic circuit 2 / 4IC1 is a resistor R3.
Is input to the primary coil L1 via. The end of the primary coil is short-circuited with the end L23 of the secondary coil, and substantially one capacitor (this is called a stem capacitor)
It is connected to C3. The other ends of the logic IC1 and the stem capacitor C3 are grounded. The other end of the secondary coil is grounded via a small resistance adjusting resistor. Therefore, both the primary coil and the secondary coil form a resonance circuit with the stem capacitor C3.

【0010】ステムコンデンサC3の電圧はカットオフ
コンデンサC4を通じて論理回路3/4IC1に入力さ
れる。この入力端にはデジタルの電源電圧の半分の電圧
がバイアスとしてかかるように、デジタル電源とアース
を2つの同じ抵抗値の抵抗R15、R16を直列に繋い
だ中点T4に接続されている。CMOSトランジスタが
ON/OFFする閾値が電源電圧の丁度半分のところに
有るため、このようにすることで、カットオフコンデン
サC4を通じて論理回路3/4IC1に入力する微少な
電圧の変化を矩形波に変換することができる。4/4I
C1には、2/4IC1及び3/4IC1の出力が入力
されており、この2つの信号の位相差が抽出される。
The voltage of the stem capacitor C3 is input to the logic circuit 3/4 IC1 through the cutoff capacitor C4. A digital power source and a ground are connected to a midpoint T4 in which two resistors R15 and R16 having the same resistance value are connected in series so that a voltage half the digital power source voltage is applied as a bias to this input terminal. Since the threshold value for turning on / off the CMOS transistor is located at about half of the power supply voltage, by doing so, a minute change in voltage input to the logic circuit 3/4 IC1 through the cutoff capacitor C4 is converted into a rectangular wave. can do. 4 / 4I
The outputs of 2 / 4IC1 and 3 / 4IC1 are input to C1, and the phase difference between these two signals is extracted.

【0011】これらのデジタル回路の発振波形はきれい
な(角のとがった)矩形波をしているため、高調波成分
を多く含んでいる。高調波の輻射はかなり多く、近くに
アナログ回路がある場合は干渉を起こす可能性が高い。
従って、このデジタル回路6は、図1のように全てコイ
ル2の一方の側(コネクタ3と反対側)に配置されてい
る。即ち、コイル2のコネクタ3側にはアナログ回路4
のみが配置されている。
Since the oscillation waveforms of these digital circuits are clean (pointed) rectangular waves, they contain a lot of harmonic components. Harmonic radiation is quite large and is likely to cause interference if there are analog circuits nearby.
Therefore, the digital circuit 6 is all arranged on one side of the coil 2 (on the side opposite to the connector 3) as shown in FIG. That is, the analog circuit 4 is provided on the connector 3 side of the coil 2.
Only are placed.

【0012】次に、請求項4に関する第2の実施の形態
について説明する。図2において、デジタル回路6の電
源回路はデジタル側(コネクタ3と反対側)に配置した
抵抗R14とツェナーダイオードZDとコンデンサC7
で構成されている。従って、コイル2の下をアナログの
電源線が通っている。また、デジタル回路側のアースも
またコイル2の下を通る必要がある。一般に基板1上に
おいて、アースパターンと電源パターンは広い面積の方
が良いとされている。
Next, a second embodiment according to claim 4 will be described. In FIG. 2, the power supply circuit of the digital circuit 6 is a resistor R14, a Zener diode ZD, and a capacitor C7 arranged on the digital side (the side opposite to the connector 3).
It is composed of. Therefore, an analog power supply line runs under the coil 2. Further, the ground on the digital circuit side also needs to pass under the coil 2. Generally, on the substrate 1, it is said that the ground pattern and the power supply pattern should have a large area.

【0013】しかしながら、コイル2の近くにベタ面積
の大きなパターンがあると、そこに渦電流を生じ、この
渦電流の作る磁場がコイル2の磁場をキャンセルするよ
うに働いて、センサの感度を劣化させる。従って、コイ
ル近傍では前記の一般のルールを破る必要がある。実験
によると、コイル領域を通るパターンの面積が、コイル
面積の1/2以上になると感度が大きく阻害されるの
で、これ以下にする必要がある。
However, if there is a pattern having a large solid area near the coil 2, an eddy current is generated there, and the magnetic field created by this eddy current acts so as to cancel the magnetic field of the coil 2, degrading the sensitivity of the sensor. Let Therefore, it is necessary to violate the above general rule near the coil. According to an experiment, if the area of the pattern passing through the coil region becomes 1/2 or more of the coil area, the sensitivity is greatly impaired, so it is necessary to set it to this value or less.

【0014】図3は基板1に形成された回路部品以外の
ための配線パターンを示す。この図3では2本の太い線
が電源線7とアース線8である。また、コイル2の下
(近傍)を通る細い信号線9、10、11が3本ある
が、これは以下のものである。
FIG. 3 shows a wiring pattern other than the circuit components formed on the substrate 1. In FIG. 3, the two thick lines are the power line 7 and the ground line 8. Also, there are three thin signal lines 9, 10 and 11 that pass under (in the vicinity of) the coil 2, which are as follows.

【0015】信号線10:4/4IC1で位相差が抽出
された信号は、デジタル側に配置したCRの積分回路で
平均化された後にコイルの下を通ってアナログ回路側に
伝達される。 信号線11:バリキャップDにバイアスをかけ、静電容
量を変化させる制御電圧線がコネクタ3からコイル2の
下を通ってデジタル回路6に入る。 信号線9:オペアンプの最終段の基準電圧をツェナーダ
イオードZDで安定化されたデジタル電源電圧から作り
出すために、アナログ回路4にデジタル電圧線を(信号
線として=電力消費は殆どしない)コイル3の下に通し
た。
The signal of which the phase difference is extracted by the signal line 10: 4/4 IC1 is averaged by the CR integrating circuit arranged on the digital side and then transmitted under the coil to the analog circuit side. Signal line 11: A control voltage line that biases the varicap D and changes the capacitance enters the digital circuit 6 from below the coil 2 from the connector 3. Signal line 9: In order to generate the reference voltage of the final stage of the operational amplifier from the digital power supply voltage stabilized by the Zener diode ZD, the analog circuit 4 is provided with a digital voltage line (as a signal line, power consumption is almost zero) of the coil 3. I passed it down.

【0016】次に、請求項5に関する第3の実施の形態
について説明する。図4は基板1の回路部品接続用の配
線パターンを示す。コイル2の下の面に配線パターンが
あると、コイル2に近いためにロスが大きく、また、コ
イルを支える基板面に凹凸ができるのでコイル2の角度
が安定しない。このため、本実施の形態では図示のよう
にコイル近傍には配線パターンをなくしている。
Next, a third embodiment according to claim 5 will be described. FIG. 4 shows a wiring pattern for connecting circuit components on the substrate 1. If there is a wiring pattern on the lower surface of the coil 2, the loss is large because it is close to the coil 2, and the angle of the coil 2 is not stable because the surface of the substrate that supports the coil is uneven. Therefore, in the present embodiment, the wiring pattern is eliminated near the coil as shown in the figure.

【0017】[0017]

【発明の効果】請求項1から3記載の発明によれば、に
よれば、デジタル回路とアナログ回路の干渉を低減する
ことができると共に、検知精度を高くすることができ
る。また、請求項4、5記載の発明によれば、基板の配
線パターンに発生する渦電流う低減することができると
共に、検知精度を高くすることができる。
According to the invention described in claims 1 to 3, according to the present invention, it is possible to reduce the interference between the digital circuit and the analog circuit and to increase the detection accuracy. Further, according to the inventions of claims 4 and 5, the eddy current generated in the wiring pattern of the substrate can be reduced and the detection accuracy can be improved.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施の形態による透磁率検知装置の基
板上の部品配置を示す構成図である。
FIG. 1 is a configuration diagram showing an arrangement of components on a substrate of a magnetic permeability detection device according to an embodiment of the present invention.

【図2】デジタル回路とアナログ回路の構成を示す回路
図である。
FIG. 2 is a circuit diagram showing configurations of a digital circuit and an analog circuit.

【図3】基板における回路部品以外の配線パターンを示
す構成図である。
FIG. 3 is a configuration diagram showing a wiring pattern other than a circuit component on a substrate.

【図4】基板における回路部品接続用の配線パターンを
示す構成図である。
FIG. 4 is a configuration diagram showing a wiring pattern for connecting circuit components on a substrate.

【符号の説明】[Explanation of symbols]

1 基板 2 コイル 3 電源供給用コネクタ 4 アナログ回路 6 デジタル回路 7 電源線 8 アース線 9、10、11 信号線 1 substrate 2 coils 3 Power supply connector 4 analog circuits 6 digital circuits 7 power line 8 ground wire 9, 10, 11 signal line

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】 空間的に近接した領域の透磁率や電気電
導率に応じてインピーダンスが変化するように配置され
たコイルと、前記コイルに直列又は並列に接続され共振
回路を形成するコンデンサと、固有の周波数の交番電圧
を発生し前記共振回路を駆動するデジタルの発振回路を
含むデジタル回路と、前記共振回路中の電圧又は電流を
取り出しアナログ信号を作り出すアナログ回路とを基板
に配置した透磁率検知装置において、 前記基板上に前記コイルを挟んで一方側に前記アナログ
回路を配置し、他方側に前記デジタル回路を配置するこ
とを特徴とする透磁率検知装置。
1. A coil arranged so that its impedance changes in accordance with magnetic permeability and electric conductivity of regions that are spatially close to each other, and a capacitor connected in series or in parallel with the coil to form a resonance circuit. Magnetic permeability detection in which a digital circuit including a digital oscillation circuit that generates an alternating voltage of a specific frequency and drives the resonance circuit, and an analog circuit that takes out the voltage or current in the resonance circuit and generates an analog signal are arranged on a substrate. In the device, the magnetic permeability detecting device, wherein the analog circuit is arranged on one side and the digital circuit is arranged on the other side with the coil interposed therebetween on the substrate.
【請求項2】 前記アナログ回路を電源供給側に配置
し、前記デジタル回路を電源から遠い側に配置したこと
を特徴とする請求項1記載の透磁率検知装置。
2. The magnetic permeability detection device according to claim 1, wherein the analog circuit is arranged on a power supply side and the digital circuit is arranged on a side far from a power supply.
【請求項3】 前記デジタル回路の電源回路構成するツ
ェナーダイオード又はそれに並列に接続されるコンデン
サとが、 前記コイルのデジタル回路側に配置されることを特徴と
する請求項1または2記載の透磁率検知装置。
3. The magnetic permeability according to claim 1, wherein the Zener diode constituting the power supply circuit of the digital circuit or the capacitor connected in parallel with the Zener diode is arranged on the digital circuit side of the coil. Detection device.
【請求項4】 前記基板のコイルと対向した面にコイル
の面積の1/2以上の面積の配線パターンが存在しない
ことを特徴とする請求項1から3のいずれか1項に記載
の透磁率検知装置。
4. The magnetic permeability according to claim 1, wherein a wiring pattern having an area equal to or more than ½ of the area of the coil does not exist on the surface of the substrate facing the coil. Detection device.
【請求項5】 前記基板の前記コイルと対向した面に配
線パターンが存在しないことを特徴とする請求項1から
3のいずれか1項に記載の透磁率検知装置。
5. The magnetic permeability detection device according to claim 1, wherein a wiring pattern is not present on a surface of the substrate facing the coil.
JP2002079577A 2002-03-20 2002-03-20 Permeability detector Expired - Fee Related JP4071515B2 (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1754647A2 (en) 2003-05-14 2007-02-21 Toyota Jidosha Kabushiki Kaisha Shock absorbing steering column support

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1754647A2 (en) 2003-05-14 2007-02-21 Toyota Jidosha Kabushiki Kaisha Shock absorbing steering column support
EP1854701A2 (en) 2003-05-14 2007-11-14 Toyota Jidosha Kabushiki Kaisha Shock absorbing steering apparatus

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