JP2003279331A - Appearance examining apparatus - Google Patents

Appearance examining apparatus

Info

Publication number
JP2003279331A
JP2003279331A JP2002083173A JP2002083173A JP2003279331A JP 2003279331 A JP2003279331 A JP 2003279331A JP 2002083173 A JP2002083173 A JP 2002083173A JP 2002083173 A JP2002083173 A JP 2002083173A JP 2003279331 A JP2003279331 A JP 2003279331A
Authority
JP
Japan
Prior art keywords
image
inspection
data
storage unit
unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2002083173A
Other languages
Japanese (ja)
Other versions
JP3829280B2 (en
Inventor
Shigeo Nishino
重夫 西野
Masatoshi Magara
雅利 真柄
Hirokazu Hirakawa
浩和 平川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Hitachi Information and Control Systems Inc
Original Assignee
Hitachi Ltd
Hitachi Information and Control Systems Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd, Hitachi Information and Control Systems Inc filed Critical Hitachi Ltd
Priority to JP2002083173A priority Critical patent/JP3829280B2/en
Publication of JP2003279331A publication Critical patent/JP2003279331A/en
Application granted granted Critical
Publication of JP3829280B2 publication Critical patent/JP3829280B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
  • Supply And Installment Of Electrical Components (AREA)
  • Image Analysis (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To register dictionary data and a decision parameter with a high recognition rate without depending upon an ability in a short time without stopping a production to regulate a decision registering means. <P>SOLUTION: An appearance examining apparatus comprises an image processing unit 103 for processing an imaged image of a mounting component 2 imaged by a camera 6, an image storage unit 201 for storing the image, a decision parameter section 203 having a decided threshold value, a standard dictionary section 204 and a user dictionary section 205 having feature data of a character, an examined result storage unit 207 for storing a decided result, and a data processing unit 102 for forming examined data for examining and processing a decision of good or not. The apparatus automatically stores the image in the storage unit, conducts an examining simulation using the image stored in the storage unit by the data processing unit, processes an examination simulation of the recognition rate after the change of the parameter for deciding the good or not by using the imaged image stored in the storage unit and change of the dictionary data registering the feature of the component, and verifies the rate. <P>COPYRIGHT: (C)2004,JPO

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、外観検査装置に係
り、特に、半導体部品などの電子部品を実装したプリン
ト基板の部品実装の外観検査装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a visual inspection apparatus, and more particularly to a visual inspection apparatus for mounting components on a printed circuit board on which electronic components such as semiconductor components are mounted.

【0002】[0002]

【従来の技術】従来、この種の外観検査装置は、プリン
ト基板上に実装された被検査対象物である電子部品の実
装もれ、逆取り付け、定数違い、実装ずれの良否を判定
する機能を有する。従来技術として、特開平9−126
727号公報には、画像処理部がカメラで撮像している
画像中より基板上の部品の画像を取込み、寸法計測部が
画像処理により検査情報、例えばパッドの寸法、配置関
係を測定し、寸法計測部による検査情報を受け取ったデ
ータ処理部は、そのデータと一致する部品の検査情報を
部品ライブラリ部から検索する方式が記載されている。
また、特開平8−254501号公報には、検査装置に
通常の検査モードとティーチングモードとを設置する。
ティーチングモードで前処理としてサンプルデータによ
り判別分析を用いて判定基準を作成し、次に、検査モー
ドに移り、その判定基準により検査を行う。ここで、誤
判定を生じる部品については、教示を行い、サンプルデ
ータに追加し、再度判定基準を作成する方式が記載され
ている。しかし、いずれの技術も実基板の範囲内での最
適な判定値を算出する手法であり、最終的な判定基準値
については、一定量の被検査対象部品の検査を試行し、
経験的要素によるチューニングを行うことが必要であ
る。
2. Description of the Related Art Conventionally, a visual inspection apparatus of this type has a function of determining whether or not an electronic component, which is an object to be inspected and mounted on a printed circuit board, is missing, is reversely mounted, has a constant difference, or is misaligned. Have. As a conventional technique, Japanese Patent Laid-Open No. 9-126
In Japanese Patent No. 727, the image processing unit captures an image of a component on a board from the image captured by the camera, and the dimension measuring unit measures inspection information, for example, the dimensions of the pad and the positional relationship by image processing. The data processing unit that receives the inspection information from the measuring unit searches the component library unit for the inspection information of the component that matches the data.
Further, in Japanese Patent Application Laid-Open No. 8-254501, an inspection apparatus is provided with a normal inspection mode and a teaching mode.
In the teaching mode, discriminant analysis is performed using sample data as pre-processing to create a criterion, then the inspection mode is entered, and the inspection is performed according to the criterion. Here, a method is described in which a component that causes an erroneous determination is taught, added to sample data, and a determination criterion is created again. However, any of the techniques is a method of calculating an optimum judgment value within the range of the actual board, and for the final judgment reference value, an inspection of a certain amount of the inspection target component is tried,
Tuning based on empirical factors is necessary.

【0003】[0003]

【発明が解決しようとする課題】上記従来技術では、検
査で使用する辞書データ及び判定パラメータの設定につ
いては、実基板または実部品による検証とチューニング
により設定するため、また、過去の基板と部品について
は、検証できないので、認識率の高い辞書登録をするた
めには、一定量の検査試行と経験的要素に基づく判断に
よらければならないため、個人の力量と労力と時間を必
要とするという課題があった。また、誤認識された検査
対象において、認識率の高い辞書登録をするためには、
誤認識された実検査対象を使用して辞書データをチュー
ニングするため、生産を停止して検証するという課題が
あった。
In the above prior art, the dictionary data and the judgment parameters used in the inspection are set by the verification and tuning using the actual board or the actual parts, and the past boards and the parts are also set. Cannot be verified. Therefore, in order to register a dictionary with a high recognition rate, a certain amount of test trials and judgment based on empirical factors must be used, which requires individual competence, effort, and time. was there. In addition, in order to register a dictionary with a high recognition rate for the inspection target that was erroneously recognized,
Since the dictionary data is tuned using the actual inspection target that was erroneously recognized, there was a problem of stopping the production and verifying it.

【0004】本発明の課題は、生産を停止せずに、短時
間で、力量によらない認識率の高い辞書データと判定パ
ラメータの登録が可能な外観検査装置を提供することに
ある。
An object of the present invention is to provide an appearance inspection apparatus capable of registering dictionary data and determination parameters having a high recognition rate without depending on the ability in a short time without stopping production.

【0005】[0005]

【課題を解決するための手段】上記課題を解決するため
に、被検査対象物を撮像した撮像画像を前記画像記憶部
に自動保存し、データ処理部によって画像記憶部に保存
した撮像画像を使った検査シュミレーションを行い、良
否判定するための判定パラメータの変更及び部品の特徴
を登録した辞書データの変更後の認識率を、実基板また
は実部品を使用せずに、画像記憶部に保存した撮像画像
を使って検査シュミレーション処理して検証する。
In order to solve the above problems, a picked-up image obtained by picking up an object to be inspected is automatically stored in the image storage unit, and the picked-up image stored in the image storage unit by a data processing unit is used. The image recognition rate is stored in the image storage unit without using the actual board or actual component after the inspection simulation is performed, and the recognition rate after the change of the judgment parameter for judging the quality and the change of the dictionary data in which the feature of the part is registered are changed. Verification is performed by using inspection simulation processing using images.

【0006】[0006]

【発明の実施の形態】以下、本発明の実施形態を図面を
用いて説明する。図1は、本発明の一実施形態による外
観検査装置の構成を示す。図1において、プリント基板
1の上面に被検査対象物である実装部品2が実装され、
下面にも被検査対象物である実装部品3が実装される。
上面はCCDカメラ6とプリント基板1の間に下方に向
かって環状照明装置4を配置し、下面も同様にCCDカ
メラ10と上方に向かって環状照明装置8を配置する。
外観検査装置は、上面側では、CCDカメラ6と環状照
明装置4をXYロボット制御部101でX軸移動軸5と
Y軸移動軸7を移動しながら、検査対象となる実装部品
2を環状照明装置4で照射し、CCDカメラ6で画像を
撮像する。また、下面側では、CCDカメラ10と環状
照明装置8をXYロボット制御部101によって上面側
とは独立してX軸移動軸9とY軸移動軸11を移動しな
がら、検査対象となる実装部品3を環状照明装置8で照
射し、CCDカメラ10で画像を撮像する。また、本実
施形態の外観検査装置は、撮像した画像の特徴を画像処
理により抽出する画像処理部103と、撮像した画像を
記憶する画像記憶部201と、部品の文字列方向などの
データを持つ部品ライブラリ部202と、判定閾値を持
つ判定パラメータ部203と、文字の特徴データを持つ
標準辞書部204及びユーザ辞書部205と、部品の実
装位置情報を持つ部品配置部206と、判定結果を保存
する検査結果記憶部207と、検査するための検査デー
タを作成及び良否判定処理をするデータ処理部102を
有する。撮像された画像は、データ処理部102により
文字列の方向、文字の色などの情報を持つ部品ライブラ
リ部202のデータを元に画像処理部103で画像処理
され、特徴を抽出する。次に、文字の特徴をデータとす
る辞書データをもつ標準辞書部204とユーザ辞書部2
05のデータを元に、前記で特徴を抽出した画像をOC
R(Optical Character Reade
r)方式により文字の照合を画像処理部103で行う。
次に、照合結果と判定パラメータ部203のデータを元
にデータ処理部102で良否判定処理される。判定パラ
メータ部203では、撮像された画像の保存条件に関す
る情報をもち、その情報と良否判定結果により画像を画
像記憶部201に保存する。また、撮像画像を保存した
時点で、その撮像画像を管理する情報となる基板ID、
実装面、デバイス、画像ファイルNOを画像データ管理
データ501(図4)として検査結果記憶部207に保
存する。基板ID、実装面、デバイスは、検査結果記憶
部207に保存される良否判定結果との関連付けをする
情報であり、画像ファイルNOは保存した撮像画像のフ
ァイル名称との関連付けをする情報である。
BEST MODE FOR CARRYING OUT THE INVENTION Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 shows the configuration of a visual inspection apparatus according to an embodiment of the present invention. In FIG. 1, a mounting component 2 which is an object to be inspected is mounted on the upper surface of a printed circuit board 1,
The mounting component 3, which is the object to be inspected, is also mounted on the lower surface.
The annular illumination device 4 is arranged downward between the CCD camera 6 and the printed circuit board 1 on the upper surface, and the CCD camera 10 and the annular illumination device 8 are similarly arranged upward on the lower surface.
On the upper surface side, the appearance inspection apparatus moves the CCD camera 6 and the annular illumination device 4 along the X-axis moving axis 5 and the Y-axis moving axis 7 by the XY robot control unit 101 while annularly illuminating the mounted component 2 to be inspected. The device 4 illuminates and the CCD camera 6 captures an image. Further, on the lower surface side, the CCD camera 10 and the annular illumination device 8 are moved by the XY robot control unit 101 independently of the upper surface side while moving the X-axis moving axis 9 and the Y-axis moving axis 11 while mounting components to be inspected. 3 is illuminated by the annular illumination device 8 and an image is taken by the CCD camera 10. Further, the appearance inspection apparatus of the present embodiment has an image processing unit 103 that extracts the characteristics of a captured image by image processing, an image storage unit 201 that stores the captured image, and data such as the character string direction of parts. A component library unit 202, a determination parameter unit 203 having a determination threshold, a standard dictionary unit 204 and a user dictionary unit 205 having character feature data, a component placement unit 206 having component mounting position information, and a determination result saved. It has an inspection result storage unit 207 that performs inspection, and a data processing unit 102 that creates inspection data for inspection and performs quality determination processing. The captured image is subjected to image processing by the image processing unit 103 based on the data of the component library unit 202 having information such as the direction of the character string and the color of the character by the data processing unit 102, and the features are extracted. Next, the standard dictionary unit 204 and the user dictionary unit 2 having dictionary data having character characteristics as data.
The image from which the features were extracted was
R (Optical Character Read
The image processing unit 103 collates characters according to the r) method.
Next, the data processing unit 102 performs a quality determination process based on the collation result and the data of the determination parameter unit 203. The determination parameter unit 203 has information regarding the storage condition of the captured image, and stores the image in the image storage unit 201 based on the information and the quality determination result. In addition, when the captured image is stored, the board ID which is information for managing the captured image,
The mounting surface, device, and image file No. are saved in the inspection result storage unit 207 as image data management data 501 (FIG. 4). The board ID, the mounting surface, and the device are information to be associated with the quality determination result stored in the inspection result storage unit 207, and the image file NO is information to be associated with the file name of the stored captured image.

【0007】図2は、画像記憶部201に保存した撮像
画像と検査結果を検査結果記憶部207に保存するフロ
ーを示す。検査を開始し(301)、データ処理部10
2が検査不良と判定したとき(302)、データ処理部
102は一時停止する。この時点では、データ処理部1
02の判定結果が正報であるか誤報であるか不明である
ため、撮像画像を画面に表示してブザーなどによりオペ
レータを呼ぶ(303)。オペレータは、撮像画面と照
合文字情報を比較して良品と不良品の最終判断をし(3
04)、判定結果を入力部(図示せず)からデータ処理
部102に入力する(305)。入力結果は、検査結果
記憶部207に記憶され、判定パラメータ部203の画
像保存条件を元に撮像画像を画像記憶部201に保存す
る。判定パラメータ203では、撮像画像の保存条件と
して、全ての画像を保存、データ処理部102が不良と
判定した画像を保存、オペレータが入力した最終結果が
不良品である画像を保存の3条件を部品の種類を区別す
る部品ID単位に持つ。前記の条件については予め設定
しておく。検査結果は、1基板の検査が全て終了後、検
査結果記憶部207に検査結果データ502(図4)と
して保存される(306)。
FIG. 2 shows a flow of saving the captured image and the inspection result saved in the image storage unit 201 in the inspection result storage unit 207. The inspection is started (301), and the data processing unit 10
When it is determined that the inspection item 2 is defective (302), the data processing unit 102 temporarily stops. At this point, the data processing unit 1
Since it is unclear whether the determination result of 02 is a correct report or a false report, the captured image is displayed on the screen and the operator is called by a buzzer or the like (303). The operator compares the image pickup screen with the collation character information to make a final judgment as to whether the product is a good product or a defective product (3
04), the determination result is input to the data processing unit 102 from an input unit (not shown) (305). The input result is stored in the inspection result storage unit 207, and the captured image is stored in the image storage unit 201 based on the image storage condition of the determination parameter unit 203. In the determination parameter 203, as the storage condition of the captured image, three conditions are stored: all images are stored, images determined by the data processing unit 102 to be defective, and images whose final result input by the operator is defective are stored. It has for each component ID that distinguishes the type. The above conditions are set in advance. The inspection result is stored as the inspection result data 502 (FIG. 4) in the inspection result storage unit 207 after the inspection of one substrate is completed (306).

【0008】図3は、画像記憶部201に保存された保
存画像を使った検査シュミレーションのフローを示す。
ここでは、認識率の高い辞書データと判定パラメータを
登録することが目的であり、検査シュミレーションによ
り認識率を検証し、最終登録データを決める方式とな
る。文字認識する辞書データには、文字の特徴がデフォ
ルト値として登録されている標準辞書データと、ユーザ
が追加で登録するユーザ辞書データの2種類があり、判
定は、この2種類の辞書データと判定パラメータを使用
してデータ処理部102及び画像処理部103で処理さ
れる。標準辞書データは、標準辞書部204にその情報
を持ち、追加、変更、削除ができない方式となってい
る。一方、ユーザ辞書データは、ユーザ辞書部205に
その情報を持ち、追加、変更、削除を可能としている。
従って、認識率向上は、ユーザ辞書データの追加、変
更、削除と文字照合の合否閾値を設定する判定パラメー
タ部203の判定パラメータの変更により行う。検査シ
ュミレーションの流れについては、ユーザ辞書登録又は
判定パラメータの変更後(401)、シュミレーション
範囲を設定する(402)。ここでは、どの部品種類を
対象とするか、何時から何時までの期間に保存された画
像を対象とするか、全ての画像を対象とするか、それと
もデータ処理部102が誤認識した画像だけを対象とす
るか、などの条件を設定する。次に、検査シュミレーシ
ョン処理を実行する(403)。検査シュミレション
は、画像記憶部201に保存した撮像画像と検査アルゴ
リズムによりデータ処理部102と画像処理部103で
処理される。処理の方式は、画像撮像以降の処理を通常
検査と同じ処理で実施し、検査(良否判定)結果を出力
する(404)。検査シュミレーションでは、検査シュ
ミレーションデータ503(図4)などのデータを元に
処理を実行し、検査ショミレーション結果504(図
4)を出力し、検査結果記憶部207に保存する。検査
ショミレーション結果504では、誤報の状態を確認
し、不良品を良品と判定する見逃しが発生していないこ
とを確認する(405)。見逃しが発生している場合
は、ユーザ辞書登録又は判定パラメータの変更と検査シ
ュミレーションを再度実施する。また、良品を不良品と
判定する虚報については、ユーザ辞書登録又は判定パラ
メータの変更と検査シュミレーションを複数回実施し
て、その比較データとしてデータ処理部102より出力
される検査シュミレーション結果まとめ505(図4)
により、最終設定データを決定し(406)、変更内容
を登録する(407)。
FIG. 3 shows a flow of the inspection simulation using the saved image saved in the image storage unit 201.
The purpose here is to register dictionary data and determination parameters with a high recognition rate, and the method is to determine the final registered data by verifying the recognition rate by inspection simulation. There are two types of dictionary data for character recognition, standard dictionary data in which the characteristics of characters are registered as default values, and user dictionary data additionally registered by the user. The determination is made as these two types of dictionary data. The parameters are processed by the data processing unit 102 and the image processing unit 103. The standard dictionary data has the information in the standard dictionary unit 204 and cannot be added, changed or deleted. On the other hand, the user dictionary data has the information in the user dictionary unit 205 and can be added, changed, or deleted.
Therefore, the recognition rate is improved by changing the determination parameter of the determination parameter unit 203 that sets the pass / fail threshold value for the addition, change, and deletion of the user dictionary data and the character matching. Regarding the flow of the inspection simulation, after the user dictionary is registered or the judgment parameter is changed (401), the simulation range is set (402). Here, which part type is to be targeted, which image is to be stored in the period from what time to what time, all images, or only the image which the data processing unit 102 has erroneously recognized. Set conditions such as target. Next, an inspection simulation process is executed (403). The inspection simulation is processed by the data processing unit 102 and the image processing unit 103 according to the captured image stored in the image storage unit 201 and the inspection algorithm. As for the processing method, the processing after the image capturing is performed by the same processing as the normal inspection, and the inspection (quality judgment) result is output (404). In the inspection simulation, processing is executed based on the data such as the inspection simulation data 503 (FIG. 4), and the inspection simulation result 504 (FIG. 4) is output and stored in the inspection result storage unit 207. In the inspection simulation result 504, the state of the false alarm is confirmed, and it is confirmed that there is no oversight that the defective product is judged as a good product (405). If an oversight has occurred, the user dictionary is registered or the determination parameter is changed and the inspection simulation is performed again. In addition, regarding false reports that determine non-defective products as defective products, user dictionary registration or change of determination parameters and inspection simulation are performed multiple times, and the inspection simulation result summary 505 (FIG. 4)
Thus, the final setting data is determined (406) and the changed content is registered (407).

【0009】このように、本実施形態では、検査により
撮像した撮像画像を画像記憶部に自動保存し、この画像
記憶部に保存した撮像画像を使った検査シュミレーショ
ンを行い、良否判定するための判定パラメータの変更及
び部品の特徴を登録した辞書データの変更を行い、この
判定登録条件変更後の認識率を、実基板または実部品を
使用せずに、画像記憶部に保存した撮像画像を使って検
査シュミレーション処理して検証するので、認識率の高
い辞書データと判定パラメータを登録することが可能と
なり、また、誤認識発生時の判定登録条件の調整が生産
を停止せずにできるため、設備稼働率を向上させること
ができる。
As described above, in the present embodiment, the picked-up image picked up by the inspection is automatically stored in the image storage unit, and the inspection simulation is performed using the picked-up image stored in the image storage unit to make a judgment for judging the quality. By changing the parameters and changing the dictionary data in which the features of the parts are registered, the recognition rate after the change of the judgment registration condition can be obtained by using the captured image saved in the image storage section without using the actual board or the actual parts. Since inspection simulation processing is performed for verification, it is possible to register dictionary data and judgment parameters with a high recognition rate, and because it is possible to adjust judgment registration conditions when erroneous recognition occurs without stopping production, equipment operation is possible. The rate can be improved.

【0010】図5は、検査シュミレーションの適用例を
示す。基板に搭載されている部品601を検査した例で
あり、部品601の捺印文字は「HGlB」で、良品は
部品602の「HGLB」である場合の検査例を示す。
OCRでは、文字との照合率を示す確信度という指標で
照合していく方式であるが、ここでは、「l」を「L」
と認識してしまうと、見逃しが発生する。ここでの検査
では、「HGlB」の「l」は確信度86%で「l」、
確信度34%で「L」という結果例を示し、この文字は
「l」であると認識する。その結果、この部品は「l」
が「L」でないので、不良品と判定される。次に、部品
603では、良品であるが、不良品と認識した例を示
す。「LV42」をここでは「L」を確信度46%で
「l」、確信度35%で「L」という結果例となってい
る。その結果、「LV42」を「lV42」と判断し、
良品であるが、不良品と認識する誤報となる。この部品
603の認識率を高くするには、「L」という文字を確
実に「L」と認識できるように調整が必要となるが、こ
こでは、その文字「L」の特徴をユーザ辞書として登録
する例を示す。認識率を高くするようにユーザ辞書部2
05に文字「L」の特徴を新規に登録すると、登録した
結果が例えば「L」を確信度97%で「L」、確信度1
7%で「l」という結果になる場合がある。この場合
「LV42」を「LV42」と判断するため、誤報でな
くなる。次に、この辞書を登録したことによる影響とし
て、前記で不良検出できた部品601を検査すると、見
逃しが発生することがある。前回検査した時と辞書デー
タが変更になっているため、「HGlB」の「l」は確
信度57%で「L」、確信度47%で「l」というよう
に結果が変わってしまう場合があり、「HGlB」を
「HGLB」と誤認識し、その結果見逃しが発生する。
これらの検証は、過去の検査部品に遡って検証する必要
があるが、本実施形態では、実基板または実部品を使用
せずに、画像記憶部201に保存した撮像画像を使って
検査シュミレーション処理をして検証する方式をとるた
め、このような見逃しの発生を防ぐことができる。
FIG. 5 shows an application example of the inspection simulation. This is an example in which the component 601 mounted on the board is inspected, and an example in which the stamp character of the component 601 is “HG1B” and the non-defective product is “HGLB” of the component 602 is shown.
OCR is a method in which matching is performed using an index called a certainty factor, which indicates a matching ratio with a character. Here, "l" is replaced with "L".
If you recognize it, you will miss it. In the inspection here, “l” of “HG1B” is “l” with a certainty factor of 86%,
An example result of "L" is shown with a certainty factor of 34%, and this character is recognized as "l". As a result, this part is "l"
Is not “L”, it is determined to be a defective product. Next, an example in which the component 603 is recognized as a non-defective product but a defective product will be described. In this example, "LV42" is "L" when the certainty factor is 46%, and "L" when the certainty factor is 35%. As a result, "LV42" is judged to be "LV42",
Although it is a non-defective product, it is a false alarm to recognize it as a defective product. In order to increase the recognition rate of the component 603, it is necessary to make adjustment so that the character "L" can be recognized as "L" without fail. Here, the characteristics of the character "L" are registered as a user dictionary. Here is an example. User dictionary unit 2 to increase the recognition rate
When a new feature of the character “L” is registered in 05, the registered result is, for example, “L” with a certainty factor of 97%, “L”, and a certainty factor of 1
7% may result in "l". In this case, since "LV42" is determined to be "LV42", it is not a false alarm. Next, as an effect of registering this dictionary, when the component 601 in which the defect has been detected is inspected, an oversight may occur. Since the dictionary data has changed since the last check, the result may change to "L" for "HG1B" with a certainty of 57% and "l" with a certainty of 47%. Yes, "HGIB" is erroneously recognized as "HGLB", and as a result, it is overlooked.
These verifications need to be performed retroactively to the past inspection parts, but in the present embodiment, the inspection simulation process is performed using the captured image stored in the image storage unit 201 without using the actual board or the actual parts. Since such a method is used for verification, it is possible to prevent such an oversight.

【0011】[0011]

【発明の効果】以上説明したように、本発明によれば、
認識率の高い辞書データと判定パラメータが個人差な
く、短期間でかつ少ない労力で登録可能となる効果があ
る。また、誤認識発生時の判定登録条件の調整が生産を
停止せずにできるため、設備稼働率を向上させることが
できる効果がある。
As described above, according to the present invention,
There is an effect that the dictionary data having a high recognition rate and the determination parameter can be registered in a short period of time and with a small labor without individual difference. Further, since the determination registration condition can be adjusted when the erroneous recognition occurs without stopping the production, there is an effect that the facility operation rate can be improved.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施形態による外観検査装置の構成
FIG. 1 is a configuration diagram of a visual inspection apparatus according to an embodiment of the present invention.

【図2】本発明の撮像画像と検査結果の保存を説明する
ためのフロー図
FIG. 2 is a flow chart for explaining storage of captured images and inspection results according to the present invention.

【図3】本発明の保存画像を使った検査シュミレーショ
ンのフロー図
FIG. 3 is a flow chart of an inspection simulation using a saved image of the present invention.

【図4】本発明の検査データの一例を示す説明図FIG. 4 is an explanatory diagram showing an example of inspection data of the present invention.

【図5】本発明の検査シュミレーションの適用例を説明
する説明図
FIG. 5 is an explanatory diagram illustrating an application example of the inspection simulation of the present invention.

【符号の説明】[Explanation of symbols]

1…プリント基板、2…上面実装部品、3…下面実装部
品、4…上面側環状照明装置、5…上面側Y軸移動軸、
6…上面側カメラ(CCD)、7…上面側X軸移動軸、
8…下面側環状照明装置、9…下面側X軸移動軸、10
…下面側カメラ(CCD)、11…下面側Y軸移動軸、
101…XYロボット制御部、102…データ処理部、
103…画像処理部、201…画像記憶部、202…部
品ライブラリ部、203…判定パラメータ部、204…
標準辞書部、205…ユーザ辞書部、206…部品配置
部、207…検査結果記憶部、501…画像データ管理
データ、502…検査結果データ、503…検査シュミ
レーションデータ、504…検査シュミレーション結
果、505…検査シュミレーション結果まとめ、601
…基板に搭載されていた不良部品、602…良品部品
DESCRIPTION OF SYMBOLS 1 ... Printed circuit board, 2 ... Top surface mounting component, 3 ... Bottom surface mounting component, 4 ... Top surface side annular illuminating device, 5 ... Top surface side Y-axis movement axis,
6 ... Top side camera (CCD), 7 ... Top side X-axis movement axis,
8: lower surface side annular illumination device, 9: lower surface side X-axis movement axis, 10
... lower surface side camera (CCD), 11 ... lower surface side Y-axis movement axis,
101 ... XY robot control unit, 102 ... Data processing unit,
103 ... Image processing unit, 201 ... Image storage unit, 202 ... Parts library unit, 203 ... Judgment parameter unit, 204 ...
Standard dictionary part, 205 ... User dictionary part, 206 ... Component placement part, 207 ... Inspection result storage part, 501 ... Image data management data, 502 ... Inspection result data, 503 ... Inspection simulation data, 504 ... Inspection simulation result, 505 ... Inspection simulation summary, 601
… Defective parts mounted on the board, 602… Non-defective parts

───────────────────────────────────────────────────── フロントページの続き (72)発明者 真柄 雅利 茨城県日立市大みか町五丁目2番1号 株 式会社日立製作所情報制御システム事業部 内 (72)発明者 平川 浩和 茨城県日立市大みか町五丁目2番1号 株 式会社日立情報制御システム内 Fターム(参考) 2F065 AA01 AA07 AA14 AA17 AA20 AA31 AA51 BB02 BB05 BB27 CC01 CC28 DD06 FF04 GG17 JJ03 JJ26 MM07 PP03 PP25 QQ21 QQ24 QQ25 QQ28 QQ31 RR05 2G051 AA65 AB14 AC11 AC21 CA04 DA03 EA12 EA14 5B057 AA03 BA02 DA03 DA12 DB02 DC33 DC39 5E313 CC04 FG08    ─────────────────────────────────────────────────── ─── Continued front page    (72) Inventor Magari Masatoshi             5-2-1 Omika-cho, Hitachi City, Ibaraki Prefecture             Information Control Systems Division, Hitachi, Ltd.             Within (72) Inventor Hirokazu Hirakawa             5-2-1 Omika-cho, Hitachi City, Ibaraki Prefecture             Inside the Hitachi Information Control System F-term (reference) 2F065 AA01 AA07 AA14 AA17 AA20                       AA31 AA51 BB02 BB05 BB27                       CC01 CC28 DD06 FF04 GG17                       JJ03 JJ26 MM07 PP03 PP25                       QQ21 QQ24 QQ25 QQ28 QQ31                       RR05                 2G051 AA65 AB14 AC11 AC21 CA04                       DA03 EA12 EA14                 5B057 AA03 BA02 DA03 DA12 DB02                       DC33 DC39                 5E313 CC04 FG08

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 プリント基板上に実装された被検査対象
物である電子部品の実装もれ、逆取り付け、定数違い、
実装ずれの良否を判定する外観検査装置において、前記
被検査対象物を撮像した撮像画像を画像処理する画像処
理部と、前記撮像した撮像画像を記憶する画像記憶部
と、判定閾値を持つ判定パラメータ部と、文字の特徴デ
ータを持つ標準辞書部及びユーザ辞書部と、判定結果を
保存する検査結果記憶部と、検査するための検査データ
を作成及び良否判定処理をするデータ処理部を有し、前
記撮像した撮像画像を前記画像記憶部に自動保存し、前
記データ処理部によって前記画像記憶部に保存した撮像
画像を使った検査シュミレーションを行い、良否判定す
るための判定パラメータの変更及び部品の特徴を登録し
た辞書データの変更後の認識率を前記画像記憶部に保存
した撮像画像を使って検査シュミレーション処理して検
証することを特徴とする外観検査装置。
1. An electronic component, which is an object to be inspected and is mounted on a printed circuit board, missed mounting, reverse mounting, difference in constant,
In an appearance inspection apparatus for determining the quality of mounting deviation, an image processing unit that performs image processing on a captured image of the inspection target object, an image storage unit that stores the captured image, and a determination parameter having a determination threshold value. Unit, a standard dictionary unit having a character feature data and a user dictionary unit, an inspection result storage unit that stores the determination result, and a data processing unit that creates inspection data for inspection and performs quality determination processing, The captured image captured is automatically stored in the image storage unit, and the data processing unit performs inspection simulation using the captured image stored in the image storage unit to change the determination parameter for determining the quality and the characteristics of parts. Characterized in that the recognition rate after the change of the registered dictionary data is verified by performing an inspection simulation process using the captured image stored in the image storage unit. That the visual inspection apparatus.
【請求項2】 請求項1において、前記辞書データと前
記判定パラメータ値の変更前と変更後の各々の検査のシ
ュミレーション結果を記憶し、前記結果の前後比較する
ことを特徴とする外観検査装置。
2. The appearance inspection apparatus according to claim 1, wherein the dictionary data and simulation results of each inspection before and after the change of the determination parameter value are stored, and the results are compared before and after.
JP2002083173A 2002-03-25 2002-03-25 Appearance inspection device Expired - Fee Related JP3829280B2 (en)

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Country Link
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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009075744A (en) * 2007-09-19 2009-04-09 Spirit21:Kk Management system for substrate mounted component
JP2015200595A (en) * 2014-04-09 2015-11-12 Ckd株式会社 Inspection apparatus, and ptp packaging machine
JP2016217861A (en) * 2015-05-20 2016-12-22 Juki株式会社 Inspection device, inspection method, and program used in inspection device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009075744A (en) * 2007-09-19 2009-04-09 Spirit21:Kk Management system for substrate mounted component
JP2015200595A (en) * 2014-04-09 2015-11-12 Ckd株式会社 Inspection apparatus, and ptp packaging machine
JP2016217861A (en) * 2015-05-20 2016-12-22 Juki株式会社 Inspection device, inspection method, and program used in inspection device

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