JP2003110011A - Suscepter - Google Patents

Suscepter

Info

Publication number
JP2003110011A
JP2003110011A JP2001302722A JP2001302722A JP2003110011A JP 2003110011 A JP2003110011 A JP 2003110011A JP 2001302722 A JP2001302722 A JP 2001302722A JP 2001302722 A JP2001302722 A JP 2001302722A JP 2003110011 A JP2003110011 A JP 2003110011A
Authority
JP
Japan
Prior art keywords
susceptor
temperature distribution
eddy current
current loss
flat
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2001302722A
Other languages
Japanese (ja)
Inventor
Takashi Nishimura
貴志 西村
Toshiaki Ono
敏明 小野
Eiji Yamanaka
英二 山中
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokin Corp
Original Assignee
NEC Tokin Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Tokin Corp filed Critical NEC Tokin Corp
Priority to JP2001302722A priority Critical patent/JP2003110011A/en
Publication of JP2003110011A publication Critical patent/JP2003110011A/en
Pending legal-status Critical Current

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  • Chemical Vapour Deposition (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

PROBLEM TO BE SOLVED: To obtain a suscepter which does not generate temperature difference in a wafer by increasing thickness of the low temperature area L on the suscepter S focusing on that eddy current loss is proportional to thickness of suscepter S and is inversely proportional to a specific resistance thereof. SOLUTION: The suscepter S can obtain a flat intra-surface temperature distribution by providing the region which is thicker than the internal region at the outer most circumferential region in order to make larger the eddy current loss of the external circumferential part than that of the internal region.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、Si(シリコン)
等の半導体単結晶基板上への気相成長等で使用される、
高周波誘導加熱炉用サセプタに関わり、特にサセプタ面
内の温度分布の改善に関わるものである。
TECHNICAL FIELD The present invention relates to Si (silicon).
Used for vapor phase growth on semiconductor single crystal substrates such as
It relates to a susceptor for a high-frequency induction heating furnace, and particularly relates to improvement of temperature distribution in the susceptor plane.

【0002】[0002]

【従来の技術】従来、単結晶気相成長炉の代表的なもの
としては、図4に示すような、縦型構造の所謂パンケー
キ型の炉が最も多く使用されているが、その構成として
は気密性良く仕切られた透明石英製のベルジャーBの内
部に、高周波磁界を発生させるためのワークコイルK
と、その直上に回転可能なターンテーブルTを配置し、
更にその直上にサセプタSが置かれる。又、ターンテー
ブルTの回転軸中央には原料ガスを炉内に供給するため
のノズルnが配置されて炉の構成を成している。
2. Description of the Related Art Conventionally, a so-called pancake type furnace having a vertical structure as shown in FIG. 4 has been most commonly used as a typical single crystal vapor phase growth furnace. Is a work coil K for generating a high frequency magnetic field inside a bell jar B made of transparent quartz that is airtightly partitioned.
And arrange the rotatable turntable T directly above it,
Further, the susceptor S is placed directly above it. Further, a nozzle n for supplying the raw material gas into the furnace is arranged at the center of the rotary shaft of the turntable T to constitute the furnace.

【0003】実際の気相成長に際しては、被成長物であ
るSi等のウェハーWが上記サセプタS上に密着して搭
載され、成長原料である、例えばSiClやSiHC
はノズルnの小孔からHをキャリアーガスとし
て、ベルジャーB内に供給される。その時、ウェハーは
1000℃以上の温度に加熱されるのであるが、その加
熱原理は、コイルKに高周波電流を印可することによっ
て、サセプタSの厚み方向で上下に向きを変える高周波
磁界Hが作用させられ、図1(c)に示すようにサセプ
タS内に、磁力線の周りを渦状に流れる渦電流が発生
し、その渦電流とサセプタSの素材固有の比抵抗ρ(Ω
cm)とで決まる損失(渦電流損失)により、サセプタ
が発熱するというものである。
In actual vapor phase growth, a wafer W of Si or the like to be grown is closely mounted on the susceptor S, and a growth raw material such as SiCl 4 or SiHC.
L 3 is supplied from the small hole of the nozzle n into the bell jar B using H 2 as a carrier gas. At that time, the wafer is heated to a temperature of 1000 ° C. or higher. The principle of heating is that by applying a high frequency current to the coil K, a high frequency magnetic field H that vertically changes in the thickness direction of the susceptor S acts. As shown in FIG. 1C, an eddy current that flows around the magnetic field lines in a vortex shape is generated in the susceptor S, and the eddy current and the specific resistance p (Ω) peculiar to the material of the susceptor S are generated.
cm) causes a loss (eddy current loss), which causes the susceptor to generate heat.

【0004】しかしながら、上記のような従来の気相成
長に際しては、サセプタSの温度分布は図1(b)に示
すように外周部において低くなる傾向が有り、サセプタ
S上に搭載されたウェハーWの内、外周部に位置するウ
ェハーWの外側部分が温度差のためスリップと称する結
晶欠陥が多発し、該当部分に対応する製品が不良とな
り、結果的に歩留まりを大きく低下させる原因となって
いた。
However, in the conventional vapor phase growth as described above, the temperature distribution of the susceptor S tends to be low in the outer peripheral portion as shown in FIG. 1 (b), and the wafer W mounted on the susceptor S tends to be low. Among them, the outer portion of the wafer W located on the outer peripheral portion frequently suffers from crystal defects called slip due to the temperature difference, and the product corresponding to the relevant portion becomes defective, resulting in a large decrease in yield. .

【0005】[0005]

【発明が解決しようとする課題】従って、本発明が解決
しようとする課題は、上記従来の問題点を克服し、サセ
プタS上の温度分布を改善し、その上に搭載された全て
のウェハーWにおいて温度差を発生させないようなサセ
プタ構造を提供することである。
Therefore, the problem to be solved by the present invention is to overcome the above-mentioned conventional problems, improve the temperature distribution on the susceptor S, and all the wafers W mounted thereon. The purpose of the present invention is to provide a susceptor structure that does not generate a temperature difference in.

【0006】[0006]

【課題を解決するための手段】本発明は、渦電流損失が
サセプタSの厚みに比例し、比抵抗に反比例することに
着目し、サセプタS上の温度の低い部分Lの肉厚を厚く
するようにして、ウェハーにおいて温度差を発生させな
いサセプタを提供するものである。
The present invention focuses on the fact that the eddy current loss is proportional to the thickness of the susceptor S and inversely proportional to the specific resistance, and increases the wall thickness of the low temperature portion L on the susceptor S. Thus, the susceptor that does not generate a temperature difference in the wafer is provided.

【0007】即ち、本発明は、最外周部に内部領域より
も肉厚の厚い部分を設けることにより、外周部の渦電流
損失を内部よりも大きくし、平坦な面内温度分布が得ら
れるようにした手段によって課題を解決しようとするも
のである。
That is, according to the present invention, the outermost peripheral portion is provided with a portion thicker than the inner region so that the eddy current loss in the outer peripheral portion is larger than that in the inner portion, and a flat in-plane temperature distribution can be obtained. The problem is solved by the means.

【0008】又、本発明は、最外周部にサセプタS本体
と同質の発熱ブロックを積み重ねることにより、外周部
の渦電流損失を内部よりも大きくし、平坦な面内温度分
布が得られるようにした手段によって課題を解決しよう
とするものである。
Further, according to the present invention, by stacking heat generating blocks of the same quality as the susceptor S main body on the outermost peripheral portion, the eddy current loss in the outer peripheral portion is made larger than that in the inner portion so that a flat in-plane temperature distribution can be obtained. The problem is solved by the means.

【0009】更に、本発明は、面内で温度の低い領域
L’に、高周波磁界Hを印可することにより、渦電流損
失を発生する材料からなる発熱ブロックを積み重ねるこ
とによって、平坦な面内温度分布が得られるようにした
手段によって課題を解決しようとするものである。
Further, according to the present invention, a high-frequency magnetic field H is applied to a region L'having a low temperature in the plane to stack a heat generating block made of a material which causes an eddy current loss, so that a flat in-plane temperature is obtained. The problem is to be solved by means of which distribution is obtained.

【0010】[0010]

【発明の実施の形態】以下、図面を参照しながら、本発
明の実施の形態のサセプタについて、説明する。
DETAILED DESCRIPTION OF THE INVENTION A susceptor according to an embodiment of the present invention will be described below with reference to the drawings.

【0011】(実施の形態1)図1は、本発明の実施の
形態1のサセプタの説明図である。図1に、Si単結晶
基板上に気相成長を施す際に使用されるカーボンサセプ
タSに対し、本発明の第一の実施形態を適用した例を示
す。 図1(a)は、カーボンサセプタSの断面概略図
であり、図1(b)は、上から見た平面図であり、図1
(c)は、サセプタ全面の平坦な温度分布の図である。
最外周領域Hが厚くなっているため、図4(b)に示し
た従来のサセプタ構造における外周部の温度低下(図中
波線)が補われ、図1(c)のようにサセプタS全面に
亘り平坦な温度分布となるのである。
(First Embodiment) FIG. 1 is an explanatory diagram of a susceptor according to a first embodiment of the present invention. FIG. 1 shows an example in which the first embodiment of the present invention is applied to a carbon susceptor S used when performing vapor phase growth on a Si single crystal substrate. 1A is a schematic sectional view of the carbon susceptor S, and FIG. 1B is a plan view seen from above.
(C) is a diagram of a flat temperature distribution over the entire surface of the susceptor.
Since the outermost peripheral region H is thick, the temperature drop (the wavy line in the figure) of the outer peripheral portion in the conventional susceptor structure shown in FIG. This results in a flat temperature distribution.

【0012】(実施の形態2) 図2は、本発明の実
施の形態2のサセプタの説明図である。図2(a)は、
従来の平板構造のサセプタSの上に、リング形状の同質
の発熱ブロックS’を載せて図2と同様の効果を持たせ
るようにしたものである。上記と同様にサセプタ全面に
亘り平坦な温度分布が得られる。
(Second Embodiment) FIG. 2 is an explanatory view of a susceptor according to a second embodiment of the present invention. Figure 2 (a) shows
On the susceptor S having a conventional flat plate structure, a ring-shaped heat generating block S ′ of the same quality is placed so as to have the same effect as in FIG. Similar to the above, a flat temperature distribution can be obtained over the entire surface of the susceptor.

【0013】(実施の形態3) 図3は、本発明の実
施の形態3のサセプタの説明図である。ベルジャーBの
覗き窓から赤外線カメラでサセプタS面の温度分布を観
察した際に、例えば、特定のウェハー位置の領域が温度
が低いような場合(図中L’)、そのウェハー位置を取
り囲むような形状のサセプタと同質(ここではカーボ
ン)の発熱ブロックS’を載せて温度を補うようにし
て、サセプタ全面に亘っての均一な温度分布を実現する
のである。
(Third Embodiment) FIG. 3 is an explanatory diagram of a susceptor according to a third embodiment of the present invention. When observing the temperature distribution on the susceptor S surface with an infrared camera through the viewing window of the bell jar B, for example, when the temperature of a specific wafer position region is low (L ′ in the figure), the wafer position is surrounded. A heating block S ′ of the same quality (here, carbon) as the shaped susceptor is placed to compensate for the temperature, and a uniform temperature distribution is realized over the entire surface of the susceptor.

【0014】ここで、温度を補うための発熱ブロック
S’は、サセプタS本体と同質でも良いが、例えばグラ
ッシーカーボン等の高周波磁界の作用によって、渦電流
損が発生するような材質であれば必ずしも同質である必
要はない。
Here, the heat generating block S'for compensating the temperature may be of the same quality as the main body of the susceptor S, but it is not limited as long as it is a material such as glassy carbon which causes an eddy current loss due to the action of a high frequency magnetic field. It does not have to be homogeneous.

【0015】又、上記発熱ブロックS’の形状は特に限
定するものではなく、リング状の他、円板状、角板状、
棒状等補うべき領域の形に合わせたサイズ及び小片の組
み合わせでも良く、要はサセプタ面上で温度の低い部分
L,L’の近傍に配することによって、温度を補い、均
一な温度分布が得られるようにすることが本発明の主旨
なのである。
The shape of the heat generating block S'is not particularly limited, and in addition to a ring shape, a disk shape, a square plate shape,
A combination of sizes and small pieces that match the shape of the region to be supplemented such as a rod may be used. In short, by arranging them in the vicinity of the low temperature portions L and L'on the susceptor surface, the temperature is compensated and a uniform temperature distribution is obtained. It is the gist of the present invention to be made possible.

【0016】[0016]

【発明の効果】以上説明したように、本発明によれば、
サセプタSの全面に亘り均一な温度分布とすることが出
来るため、その上に搭載されたウェハー等の被加工物
の、温度差に起因する歩留り低下を撲滅できるのであ
る。
As described above, according to the present invention,
Since a uniform temperature distribution can be made over the entire surface of the susceptor S, it is possible to eliminate a decrease in yield of a workpiece such as a wafer mounted thereon due to a temperature difference.

【0017】本実施の形態は、パンケーキ型の縦型気相
成長炉について例示したが、横型でも、又、サセプタ本
体がどんな形状、材質であっても本発明の適用が可能で
あることは当然であるし、本発明の内容を単独ではなく
複合して応用することも当然可能である。
Although the present embodiment exemplifies a vertical pancake type vapor phase growth reactor, the present invention can be applied to any horizontal type and any shape and material of the susceptor body. Naturally, the contents of the present invention can be applied not only individually but also in combination.

【0018】更に、本発明は、高周波のみならず誘導加
熱式の加熱炉であれば、如何なる装置であってもこれを
応用することは極めて容易なことである。
Further, according to the present invention, it is extremely easy to apply any apparatus as long as it is an induction heating type heating furnace as well as a high frequency.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施の形態1のサセプタの説明図。図
1(a)はカーボンサセプタSの断面概略図、図1
(b)は上から見た平面図、図1(c)は、サセプタS
全面の平坦な温度分布の図。
FIG. 1 is an explanatory diagram of a susceptor according to a first embodiment of the present invention. 1A is a schematic sectional view of the carbon susceptor S, FIG.
1B is a plan view seen from above, and FIG. 1C is a susceptor S.
The figure of the flat temperature distribution of the whole surface.

【図2】本発明の実施の形態2のサセプタの説明図。図
2(a)は、従来の平板構造のサセプタSの上に、リン
グ形状の同質の発熱ブロックS’を載せてた状態の図、
図2(b)は上から見た平面図、図2(c)は、サセプ
タS全面の平坦な温度分布の図
FIG. 2 is an explanatory diagram of a susceptor according to a second embodiment of the present invention. FIG. 2A is a diagram showing a state where a ring-shaped heat generating block S ′ of the same quality is placed on a conventional flat plate structure susceptor S,
2B is a plan view seen from above, and FIG. 2C is a diagram showing a flat temperature distribution over the entire surface of the susceptor S.

【図3】本発明の実施の形態3のサセプタの説明図。図
3(a)は、平板構造のサセプタSの図、図3(b)
は、サセプタ各部の温度分布の図。
FIG. 3 is an explanatory diagram of a susceptor according to a third embodiment of the present invention. FIG. 3A is a diagram of a susceptor S having a flat plate structure, and FIG.
Is a diagram of the temperature distribution of each part of the susceptor.

【図4】従来の気相成長炉の概略構成とサセプタの温度
分布の説明図。図4(a)は、気相成長炉の構成図、図
4(b)は、サセプタ各部の温度分布の図。
FIG. 4 is an explanatory diagram of a schematic configuration of a conventional vapor phase growth reactor and temperature distribution of a susceptor. FIG. 4A is a configuration diagram of the vapor phase growth reactor, and FIG. 4B is a diagram of temperature distribution of each part of the susceptor.

【符号の説明】[Explanation of symbols]

B ベルジャー K ワークコイル T ターンテーブル S サセプタ W ウェハー n ノズル L、L’ サセプタ面上で温度の低い部分 H サセプタ上で肉厚を厚くした部分 S’ 発熱ブロック B bell jar K work coil T turntable S susceptor W wafer n nozzle L, L'Low temperature part on the susceptor surface H Thickened part on the susceptor S'heating block

フロントページの続き Fターム(参考) 4K030 AA06 AA17 BA29 BB02 CA04 FA10 GA02 JA10 KA23 LA15 5F031 CA02 HA02 HA37 HA59 MA28 PA30 5F045 BB02 DP03 DP15 EK03 EM02Continued front page    F-term (reference) 4K030 AA06 AA17 BA29 BB02 CA04                       FA10 GA02 JA10 KA23 LA15                 5F031 CA02 HA02 HA37 HA59 MA28                       PA30                 5F045 BB02 DP03 DP15 EK03 EM02

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 最外周部に内部領域よりも肉厚の厚い部
分を設けることにより、外周部の渦電流損失を内部より
も大きくし、平坦な面内温度分布が得られるようにした
ことを特徴とするサセプタ。
1. An eddy current loss in the outer peripheral portion is made larger than that in the inner portion by providing a portion thicker than the inner region in the outermost peripheral portion so that a flat in-plane temperature distribution can be obtained. Characteristic susceptor.
【請求項2】 最外周部にサセプタ本体と同質の発熱ブ
ロックを積み重ねることにより、外周部の渦電流損失を
内部よりも大きくし、平坦な面内温度分布が得られるよ
うにしたことを特徴とする請求項1に記載のサセプタ。
2. The eddy current loss in the outer peripheral portion is made larger than that in the inner portion by stacking heat generating blocks of the same quality as the susceptor body on the outermost peripheral portion, so that a flat in-plane temperature distribution can be obtained. The susceptor according to claim 1.
【請求項3】 面内で温度の低い領域に、高周波磁界を
印加することにより渦電流損失が発生する材料からなる
発熱ブロックを積み重ねることによって、平坦な面内温
度分布が得られるようにしたことを特徴とする請求項1
または2に記載のサセプタ。
3. A flat in-plane temperature distribution can be obtained by stacking a heating block made of a material that causes an eddy current loss by applying a high-frequency magnetic field in a region where the temperature is low in the plane. Claim 1 characterized by the above-mentioned.
Or the susceptor described in 2.
JP2001302722A 2001-09-28 2001-09-28 Suscepter Pending JP2003110011A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001302722A JP2003110011A (en) 2001-09-28 2001-09-28 Suscepter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001302722A JP2003110011A (en) 2001-09-28 2001-09-28 Suscepter

Publications (1)

Publication Number Publication Date
JP2003110011A true JP2003110011A (en) 2003-04-11

Family

ID=19122915

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001302722A Pending JP2003110011A (en) 2001-09-28 2001-09-28 Suscepter

Country Status (1)

Country Link
JP (1) JP2003110011A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016012679A (en) * 2014-06-30 2016-01-21 豊田合成株式会社 Susceptor and manufacturing method thereof
CN111508886A (en) * 2018-12-29 2020-08-07 美光科技公司 Bond chucks having individually controllable regions and associated systems and methods

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016012679A (en) * 2014-06-30 2016-01-21 豊田合成株式会社 Susceptor and manufacturing method thereof
CN111508886A (en) * 2018-12-29 2020-08-07 美光科技公司 Bond chucks having individually controllable regions and associated systems and methods

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