JP2003067440A - スタティックゲートの入力におけるノイズをシミュレートして出力におけるノイズを求めるための方法 - Google Patents

スタティックゲートの入力におけるノイズをシミュレートして出力におけるノイズを求めるための方法

Info

Publication number
JP2003067440A
JP2003067440A JP2002126588A JP2002126588A JP2003067440A JP 2003067440 A JP2003067440 A JP 2003067440A JP 2002126588 A JP2002126588 A JP 2002126588A JP 2002126588 A JP2002126588 A JP 2002126588A JP 2003067440 A JP2003067440 A JP 2003067440A
Authority
JP
Japan
Prior art keywords
output
noise
gate
branch
node
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2002126588A
Other languages
English (en)
Japanese (ja)
Other versions
JP2003067440A5 (https=
Inventor
S Brandon Keller
エス・ブランドン・ケラー
Gregory D Rogers
グレゴリー・ディー・ロジャース
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HP Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of JP2003067440A publication Critical patent/JP2003067440A/ja
Publication of JP2003067440A5 publication Critical patent/JP2003067440A5/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00Computer-aided design [CAD]
    • G06F30/30Circuit design
    • G06F30/36Circuit design at the analogue level
    • G06F30/367Design verification, e.g. using simulation, simulation program with integrated circuit emphasis [SPICE], direct methods or relaxation methods

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Evolutionary Computation (AREA)
  • Geometry (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
JP2002126588A 2001-04-30 2002-04-26 スタティックゲートの入力におけるノイズをシミュレートして出力におけるノイズを求めるための方法 Pending JP2003067440A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/845,437 US6502223B1 (en) 2001-04-30 2001-04-30 Method for simulating noise on the input of a static gate and determining noise on the output
US09/845437 2001-04-30

Publications (2)

Publication Number Publication Date
JP2003067440A true JP2003067440A (ja) 2003-03-07
JP2003067440A5 JP2003067440A5 (https=) 2005-04-07

Family

ID=25295234

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002126588A Pending JP2003067440A (ja) 2001-04-30 2002-04-26 スタティックゲートの入力におけるノイズをシミュレートして出力におけるノイズを求めるための方法

Country Status (2)

Country Link
US (1) US6502223B1 (https=)
JP (1) JP2003067440A (https=)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7552040B2 (en) * 2003-02-13 2009-06-23 International Business Machines Corporation Method and system for modeling logical circuit blocks including transistor gate capacitance loading effects
US7107552B2 (en) * 2003-06-10 2006-09-12 Intel Corporation Method and apparatus to analyze noise in a pulse logic digital circuit design
EP1577801A1 (en) * 2004-03-15 2005-09-21 Infineon Technologies AG Device characterization concept
US7400167B2 (en) * 2005-08-16 2008-07-15 Altera Corporation Apparatus and methods for optimizing the performance of programmable logic devices
US7269809B2 (en) * 2004-06-23 2007-09-11 Sioptical, Inc. Integrated approach for design, simulation and verification of monolithic, silicon-based opto-electronic circuits

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6253351B1 (en) * 1998-03-24 2001-06-26 Matsushita Electric Industrial Co., Ltd. Circuit optimization system
JP3068065B2 (ja) * 1998-09-25 2000-07-24 日本電気株式会社 回路設計方法
US6405347B1 (en) * 1999-06-30 2002-06-11 Hewlett-Packard Company Method and apparatus for determining the maximum permitted and minimum required width of a feedback FET on a precharge node

Also Published As

Publication number Publication date
US6502223B1 (en) 2002-12-31
US20020194573A1 (en) 2002-12-19

Similar Documents

Publication Publication Date Title
US6851095B1 (en) Method of incremental recharacterization to estimate performance of integrated disigns
US7337416B1 (en) Method of using strongly coupled components to estimate integrated circuit performance
US6327542B1 (en) System and method for approximating the coupling voltage noise on a node
US7761828B2 (en) Partitioning electronic circuit designs into simulation-ready blocks
US6550041B1 (en) Method and apparatus for evaluating the design quality of network nodes
US20060206845A1 (en) Hybrid linear wire model approach to tuning transistor widths of circuits with RC interconnect
US6077717A (en) System and method for detecting NOR gates and NAND gates
US6654936B2 (en) Method and apparatus for determining the strengths and weaknesses of paths in an integrated circuit
US6560571B1 (en) Method and apparatus for prioritizing the order in which checks are performed on a node in an integrated circuit
US6305003B1 (en) System and method for propagating clock nodes in a netlist of circuit design
US6249899B1 (en) System and method for detecting pass FETs
US6449578B1 (en) Method and apparatus for determining the RC delays of a network of an integrated circuit
US6311314B1 (en) System and method for evaluating the loading of a clock driver
US6308301B1 (en) System and method for detecting multiplexers in a circuit design
US7031889B1 (en) Method and apparatus for evaluating the design quality of network nodes
US6367055B1 (en) Method and apparatus for determining certain characteristics of circuit elements
JP2003067440A (ja) スタティックゲートの入力におけるノイズをシミュレートして出力におけるノイズを求めるための方法
US6301691B1 (en) System and method for detecting NFETs that pull up to VDD and PFETs that pull down to ground
US6507807B1 (en) Method and apparatus for determining which branch of a network of an integrated circuit has the largest total effective RC delay
US6910193B1 (en) System and method for executing tests on an integrated circuit design
US6321365B1 (en) System and method for detecting storage nodes that are susceptible to charge sharing
US6542860B1 (en) System and method for detecting nodes that are susceptible to floating
US6434723B1 (en) System and method for evaluating a very large scale integrated circuit for potential design errors
US6718522B1 (en) Electrical rules checker system and method using tri-state logic for electrical rule checks
US20030195736A1 (en) Method of storing cross-hierarchy coupling data in a hierarchical circuit model

Legal Events

Date Code Title Description
A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20040524

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20040524

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20070116

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20070703