JP2002544501A5 - - Google Patents

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Publication number
JP2002544501A5
JP2002544501A5 JP2000617398A JP2000617398A JP2002544501A5 JP 2002544501 A5 JP2002544501 A5 JP 2002544501A5 JP 2000617398 A JP2000617398 A JP 2000617398A JP 2000617398 A JP2000617398 A JP 2000617398A JP 2002544501 A5 JP2002544501 A5 JP 2002544501A5
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JP
Japan
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JP2000617398A
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JP2002544501A (ja
JP4579423B2 (ja
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Priority claimed from US09/310,017 external-priority patent/US6268916B1/en
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Publication of JP2002544501A publication Critical patent/JP2002544501A/ja
Publication of JP2002544501A5 publication Critical patent/JP2002544501A5/ja
Application granted granted Critical
Publication of JP4579423B2 publication Critical patent/JP4579423B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2000617398A 1999-05-11 2000-05-03 試料を非破壊計測するためのシステム Expired - Fee Related JP4579423B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/310,017 1999-05-11
US09/310,017 US6268916B1 (en) 1999-05-11 1999-05-11 System for non-destructive measurement of samples
PCT/US2000/012008 WO2000068656A1 (en) 1999-05-11 2000-05-03 System for non-destructive measurement of samples

Publications (3)

Publication Number Publication Date
JP2002544501A JP2002544501A (ja) 2002-12-24
JP2002544501A5 true JP2002544501A5 (ja) 2007-07-19
JP4579423B2 JP4579423B2 (ja) 2010-11-10

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Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000617398A Expired - Fee Related JP4579423B2 (ja) 1999-05-11 2000-05-03 試料を非破壊計測するためのシステム

Country Status (3)

Country Link
US (1) US6268916B1 (ja)
JP (1) JP4579423B2 (ja)
WO (1) WO2000068656A1 (ja)

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