JP2002513144A5 - - Google Patents

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Publication number
JP2002513144A5
JP2002513144A5 JP2000546208A JP2000546208A JP2002513144A5 JP 2002513144 A5 JP2002513144 A5 JP 2002513144A5 JP 2000546208 A JP2000546208 A JP 2000546208A JP 2000546208 A JP2000546208 A JP 2000546208A JP 2002513144 A5 JP2002513144 A5 JP 2002513144A5
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000546208A
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JP2002513144A (ja
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Publication date
Application filed filed Critical
Priority claimed from PCT/US1999/009270 external-priority patent/WO1999056096A1/en
Publication of JP2002513144A publication Critical patent/JP2002513144A/ja
Publication of JP2002513144A5 publication Critical patent/JP2002513144A5/ja
Pending legal-status Critical Current

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JP2000546208A 1998-04-29 1999-04-29 補正された集光分光計 Pending JP2002513144A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US8347198P 1998-04-29 1998-04-29
US60/083,471 1998-04-29
PCT/US1999/009270 WO1999056096A1 (en) 1998-04-29 1999-04-29 Corrected concentric spectrometer

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2010060168A Division JP5550395B2 (ja) 1998-04-29 2010-03-17 補正された同心分光計

Publications (2)

Publication Number Publication Date
JP2002513144A JP2002513144A (ja) 2002-05-08
JP2002513144A5 true JP2002513144A5 (ja) 2006-06-22

Family

ID=22178567

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2000546208A Pending JP2002513144A (ja) 1998-04-29 1999-04-29 補正された集光分光計
JP2010060168A Expired - Fee Related JP5550395B2 (ja) 1998-04-29 2010-03-17 補正された同心分光計

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2010060168A Expired - Fee Related JP5550395B2 (ja) 1998-04-29 2010-03-17 補正された同心分光計

Country Status (6)

Country Link
US (1) US6266140B1 (ja)
EP (1) EP1073886A4 (ja)
JP (2) JP2002513144A (ja)
AU (1) AU4406299A (ja)
CA (1) CA2330311A1 (ja)
WO (1) WO1999056096A1 (ja)

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US6573990B1 (en) * 2000-02-21 2003-06-03 Tektronix, Inc. Optical system providing concurrent detection of a calibration signal and a test signal in an optical spectrum analyzer
US20040018019A1 (en) * 2002-07-26 2004-01-29 Lacey Jonathan P. Interleaver-based multiplexer and demultiplexer
US6922240B2 (en) * 2003-08-21 2005-07-26 The Regents Of The University Of California Compact refractive imaging spectrometer utilizing immersed gratings
US7006217B2 (en) * 2003-09-09 2006-02-28 The Regents Of The University Of California Compact catadioptric imaging spectrometer utilizing immersed gratings
US7041979B2 (en) * 2003-09-09 2006-05-09 The Regents Of The University Of California Compact reflective imaging spectrometer utilizing immersed gratings
US6980295B2 (en) * 2003-10-06 2005-12-27 The Regents Of The University Of California Compact catadioptric imaging spectrometer utilizing reflective grating
US6977727B2 (en) * 2003-10-06 2005-12-20 The Regents Of The University Of California Compact imaging spectrometer utilizing immersed gratings
US7016037B2 (en) 2003-10-06 2006-03-21 The Regents Of The University Of California Imaging spectrometer utilizing immersed gratings with accessible entrance slit
US20050078911A1 (en) * 2003-10-14 2005-04-14 Mikes Thomas L. System and method for using a concentric spectrometer to multiplex or demultiplex optical signals
WO2005083352A1 (en) * 2004-02-11 2005-09-09 Filmetrics, Inc. Method and apparatus for high-speed thickness mapping of patterned thin films
US6985226B2 (en) 2004-05-11 2006-01-10 The Regents Of The University Of California Compact imaging spectrometer utilizing an immersed grating and anamorphic mirror
US7075082B2 (en) * 2004-06-22 2006-07-11 Wilmington Infrared Technology, Inc. Compact infrared spectrometer, and methods and systems for manufacture and assembly of components used in same
US7239386B2 (en) * 2004-08-17 2007-07-03 The Regents Of The University Of California Compact imaging spectrometer utilizing immersed gratings
US7016038B2 (en) * 2004-08-17 2006-03-21 The Regents Of The University Of California Compact imaging spectrometer utilizing immersed gratings
WO2006023712A2 (en) * 2004-08-19 2006-03-02 Headwall Photonics, Inc. Multi-channel, multi-spectrum imaging spectrometer
US7330258B2 (en) * 2005-05-27 2008-02-12 Innovative Technical Solutions, Inc. Spectrometer designs
US7414719B2 (en) * 2006-01-26 2008-08-19 Lawrence Livermore National Security, Llc Imaging spectrometer wide field catadioptric design
US7697137B2 (en) * 2006-04-28 2010-04-13 Corning Incorporated Monolithic Offner spectrometer
TWI345050B (en) * 2007-08-03 2011-07-11 Oto Photonics Inc Optical system and method of manufacturing the same
US9146155B2 (en) * 2007-03-15 2015-09-29 Oto Photonics, Inc. Optical system and manufacturing method thereof
US7817274B2 (en) 2007-10-05 2010-10-19 Jingyun Zhang Compact spectrometer
US8345226B2 (en) 2007-11-30 2013-01-01 Jingyun Zhang Spectrometers miniaturized for working with cellular phones and other portable electronic devices
FR2938059B1 (fr) * 2008-11-03 2011-03-11 Horiba Jobin Yvon Sas Spectrometre imageur de type dyson de qualite image amelioree et a faible distorsion.
CN101852649A (zh) * 2010-06-10 2010-10-06 上海理工大学 一种平像场凸面光栅分光系统
JP2013181926A (ja) * 2012-03-02 2013-09-12 Sony Corp 分光光学系及び分光測定装置
US9594201B2 (en) 2012-07-13 2017-03-14 The University Of North Carolina At Chapel Hill Curved volume phase holographic (VPH) diffraction grating with tilted fringes and spectrographs using same
US9546904B2 (en) 2013-03-15 2017-01-17 P & P Optica Inc. Apparatus and method for optimizing data capture and data correction for spectroscopic analysis
CN103411673B (zh) * 2013-08-22 2015-03-04 北京理工大学 基于同心离轴双反射系统的成像光谱仪
EP2857810A1 (en) * 2013-10-02 2015-04-08 Nederlandse Organisatie voor toegepast -natuurwetenschappelijk onderzoek TNO Monolith spectrometer
CN103604498A (zh) * 2013-12-04 2014-02-26 上海理工大学 一种宽光谱Offner成像光谱仪分光系统
EA024777B1 (ru) * 2013-12-04 2016-10-31 Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования "Самарский государственный аэрокосмический университет имени академика С.П. Королева (национальный исследовательский университет)" (СГАУ) Изображающий гиперспектрометр
JP6180954B2 (ja) * 2014-02-05 2017-08-16 浜松ホトニクス株式会社 分光器、及び分光器の製造方法
CN104019893B (zh) * 2014-05-20 2016-12-07 上海理工大学 Offner结构成像光谱仪
KR101523210B1 (ko) * 2014-07-17 2015-05-27 삼성탈레스 주식회사 볼록 회절 격자를 구비한 분광기를 이용한 수차 분석 장치
CN105739073B (zh) * 2014-12-11 2019-02-12 清华大学 自由曲面离轴三反光学系统
CN104614320A (zh) * 2014-12-25 2015-05-13 北京农业信息技术研究中心 一种全反射式成像高光谱观测系统
US10444069B2 (en) * 2015-06-07 2019-10-15 University Of Rochester Imaging spectrometer with freeform surfaces
CN109196391B (zh) * 2016-06-06 2021-05-07 株式会社岛津制作所 衍射光栅以及分光装置
TWI715599B (zh) 2016-07-12 2021-01-11 台灣超微光學股份有限公司 光譜儀模組及其製作方法
EP3385685A1 (en) * 2017-04-06 2018-10-10 ASML Netherlands B.V. Radiation receiving system
US11982616B2 (en) 2021-03-09 2024-05-14 Headwall Photonics Inc. Spectrally resolved imaging for agricultural product assessment
WO2023122314A1 (en) 2021-12-24 2023-06-29 Horiba Instruments Incorporated Multi-track raman well plate reader

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SE502809C2 (sv) 1994-05-16 1996-01-22 Now Optics Ab Anordning för spektralanalys av optisk ljuskälla med bilddetektion och uppdelning av spektralordningar
JPH08271335A (ja) * 1995-03-31 1996-10-18 Shimadzu Corp 回折格子および同回折格子を用いた回折格子分光器
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US5768040A (en) 1995-10-06 1998-06-16 Orbital Sciences Corporation Wide field-of-view imaging spectrometer
US5880834A (en) * 1996-10-16 1999-03-09 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Convex diffraction grating imaging spectrometer
DE29716331U1 (de) * 1997-09-11 1997-12-04 Bifo Berliner Institut für Optik GmbH, 12489 Berlin Abbildender Kompaktspektrograph

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