JP2002250613A5 - - Google Patents

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Publication number
JP2002250613A5
JP2002250613A5 JP2001051467A JP2001051467A JP2002250613A5 JP 2002250613 A5 JP2002250613 A5 JP 2002250613A5 JP 2001051467 A JP2001051467 A JP 2001051467A JP 2001051467 A JP2001051467 A JP 2001051467A JP 2002250613 A5 JP2002250613 A5 JP 2002250613A5
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2001051467A
Other languages
Japanese (ja)
Other versions
JP2002250613A (ja
JP4001318B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2001051467A priority Critical patent/JP4001318B2/ja
Priority claimed from JP2001051467A external-priority patent/JP4001318B2/ja
Publication of JP2002250613A publication Critical patent/JP2002250613A/ja
Publication of JP2002250613A5 publication Critical patent/JP2002250613A5/ja
Application granted granted Critical
Publication of JP4001318B2 publication Critical patent/JP4001318B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

JP2001051467A 2001-02-27 2001-02-27 光学的三次元形状計測システム Expired - Fee Related JP4001318B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001051467A JP4001318B2 (ja) 2001-02-27 2001-02-27 光学的三次元形状計測システム

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001051467A JP4001318B2 (ja) 2001-02-27 2001-02-27 光学的三次元形状計測システム

Publications (3)

Publication Number Publication Date
JP2002250613A JP2002250613A (ja) 2002-09-06
JP2002250613A5 true JP2002250613A5 (enExample) 2006-03-09
JP4001318B2 JP4001318B2 (ja) 2007-10-31

Family

ID=18912245

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001051467A Expired - Fee Related JP4001318B2 (ja) 2001-02-27 2001-02-27 光学的三次元形状計測システム

Country Status (1)

Country Link
JP (1) JP4001318B2 (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007198988A (ja) * 2006-01-30 2007-08-09 National Institute Of Advanced Industrial & Technology 表面形状誤差の計測方法および装置
JP5449899B2 (ja) * 2009-07-22 2014-03-19 本田技研工業株式会社 撮像システム
JP2011191170A (ja) * 2010-03-15 2011-09-29 Omron Corp 画像処理装置
EP2375227A1 (en) * 2010-04-09 2011-10-12 Siemens Aktiengesellschaft Measurement of three-dimensional motion characteristics
US9538955B2 (en) 2011-10-21 2017-01-10 Koninklijke Philips N.V. Method and apparatus for determining anatomic properties of a patient
JP6459745B2 (ja) * 2015-04-20 2019-01-30 日産自動車株式会社 自己位置算出装置及び自己位置算出方法
JP7117595B2 (ja) * 2018-02-02 2022-08-15 パナソニックIpマネジメント株式会社 画像処理装置 及び画像処理方法
JP7735075B2 (ja) * 2021-04-26 2025-09-08 キヤノン株式会社 変位計、及び物品の製造方法

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