JP2002139524A - Voltage detection device - Google Patents

Voltage detection device

Info

Publication number
JP2002139524A
JP2002139524A JP2000335408A JP2000335408A JP2002139524A JP 2002139524 A JP2002139524 A JP 2002139524A JP 2000335408 A JP2000335408 A JP 2000335408A JP 2000335408 A JP2000335408 A JP 2000335408A JP 2002139524 A JP2002139524 A JP 2002139524A
Authority
JP
Japan
Prior art keywords
voltage
impedance
detection
voltage detection
detection device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2000335408A
Other languages
Japanese (ja)
Other versions
JP4238474B2 (en
Inventor
Hisayoshi Tsuchiya
久義 土屋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Meidensha Corp
Meidensha Electric Manufacturing Co Ltd
Original Assignee
Meidensha Corp
Meidensha Electric Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Meidensha Corp, Meidensha Electric Manufacturing Co Ltd filed Critical Meidensha Corp
Priority to JP2000335408A priority Critical patent/JP4238474B2/en
Publication of JP2002139524A publication Critical patent/JP2002139524A/en
Application granted granted Critical
Publication of JP4238474B2 publication Critical patent/JP4238474B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Measurement Of Current Or Voltage (AREA)

Abstract

PROBLEM TO BE SOLVED: To solve such problem in voltage detection of the line of such as a power system that a malfunction or the like is caused by a voltage wraparound through an impedance carried by another device when being disconnected. SOLUTION: When detecting the change of an input voltage as much as a prescribed value or more in detection of an RT interphase voltage by being connected to a system line together with another measuring device 2, this voltage detection device 1 closes a contact Y and reduces the input impedance by a resistance R. Hereby, the influence caused by the voltage wraparound through an input impedance Z carried by the measuring device can be reduced.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、電力系統や電気機
器の電圧検出装置に係り、特に多相ラインでの線間電圧
検出装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a voltage detecting device for a power system or an electric device, and more particularly to a line voltage detecting device for a polyphase line.

【0002】[0002]

【従来の技術】この種の電圧検出装置は、例えば、配電
系統や電気機器の保護継電器における電源ラインの電圧
検出器として設けられたり、三相インバータの負荷電圧
検出手段として設けられる。
2. Description of the Related Art This type of voltage detecting device is provided, for example, as a voltage detector of a power supply line in a distribution relay or a protective relay of an electric device, or as a load voltage detecting means of a three-phase inverter.

【0003】これら電圧検出装置は、検出機能部分のイ
ンピーダンスを高くしておき、定常時の電源ラインや計
器用変圧器にかける負担(負荷)を軽減している。特
に、ディジタル形保護継電システムなど、小型化と微小
電流を取り扱う装置では電圧検出装置の負荷インピーダ
ンスを高くしている。
[0003] In these voltage detection devices, the impedance of the detection function portion is increased to reduce the load (load) applied to the power supply line and the instrument transformer during normal operation. In particular, in a device that handles miniaturization and a small current, such as a digital protection relay system, the load impedance of the voltage detection device is increased.

【0004】[0004]

【発明が解決しようとする課題】従来の電圧検出装置で
は、測定対象系統(計器用変圧器回路も含む)の1線に
断線が発生すると、他の相の計器や継電器等により電圧
の回り込みが起き、検出相の電圧を正確に検出できない
ばかりか、不足電圧検出等の機能も発揮できない場合が
ある。
In the conventional voltage detecting device, when one line of the system to be measured (including the transformer circuit for the instrument) is broken, the voltage is wrapped around by a meter or relay of another phase. In some cases, not only cannot the voltage of the detection phase be accurately detected, but also the function of detecting an undervoltage cannot be exhibited.

【0005】例えば、図2では、RST三相のうち、電
圧検出装置1はRS相の線間電圧を検出するにおいて、
RT相間に他の計測装置2が接続されている場合、R相
が断線すると、電圧検出装置1はRS間の電圧0として
検出すべきである。しかし、RT相間の計測装置2を通
してT相電圧がC点からA点に印加され、電圧検出装置
1がA’点とB点に接続されるため、その検出電圧は、
[0005] For example, in FIG. 2, among the three RST phases, the voltage detecting device 1 detects the RS-phase line voltage.
When another measuring device 2 is connected between the RT phases, if the R phase is broken, the voltage detecting device 1 should detect the voltage as 0 between the RS. However, since the T-phase voltage is applied from the point C to the point A through the measuring device 2 between the RT phases, and the voltage detecting device 1 is connected to the points A ′ and B, the detected voltage is

【0006】[0006]

【数1】VST*X/(X+Z) となる。ただし、VSTはST間の電圧、Xは電圧検出
装置のインピーダンス、ZはRT相間の計測装置インピ
ーダンスである。
## EQU1 ## V ST * X / (X + Z) Here, VST is the voltage between STs, X is the impedance of the voltage detection device, and Z is the measurement device impedance between the RT phases.

【0007】以上のように、電圧検出装置のインピーダ
ンスがRT相間のインピーダンスに比較して大きいとき
は検出電圧がVSTの値に近づくことになり、電圧検出装
置の不動作、誤動作を招くことになる。
[0007] As described above, when the impedance of the voltage detecting device is large compared to the impedance of the RT phase will be detected voltage approaches the value of V ST, non operation of the voltage detection device, to cause a malfunction Become.

【0008】本発明の目的は、電圧検出対象ラインに接
続される他の装置の影響を受けることなく確実に電圧検
出できる電圧検出装置を提供することにある。
An object of the present invention is to provide a voltage detection device capable of reliably detecting a voltage without being affected by another device connected to a voltage detection target line.

【0009】[0009]

【課題を解決するための手段】本発明は、上記の課題を
解決するため、電圧が急変したときに電圧検出装置の入
力インピーダンスを下げ、他の計測装置などがもつイン
ピーダンスを通した電圧の回り込みにも検出電圧への影
響を取り除くことができるようにしたもので、以下の構
成を特徴とする。
SUMMARY OF THE INVENTION In order to solve the above-mentioned problems, the present invention lowers the input impedance of a voltage detecting device when the voltage suddenly changes, and wraps around the voltage through the impedance of other measuring devices. Also, it is possible to remove the influence on the detection voltage, and it is characterized by the following configuration.

【0010】電圧検出対象ラインに他の装置と共に接続
され、該ラインの相間電圧を検出する電圧検出装置であ
って、前記ラインに接続された入力電圧が一定値以上に
変化したことを検出する検出手段と、前記検出手段の検
出信号によって前記他の装置がもつ入力インピーダンス
による電圧回り込みの影響を少なくする入力インピーダ
ンスを検出入力回路に挿入する手段とを備えたことを特
徴とする。
A voltage detecting device connected to a voltage detection target line together with another device to detect an inter-phase voltage of the line, the detection device detecting that an input voltage connected to the line has changed to a predetermined value or more. And a means for inserting an input impedance into a detection input circuit for reducing an influence of a voltage sneak caused by an input impedance of the other device according to a detection signal of the detection means.

【0011】[0011]

【発明の実施の形態】図1は、本発明の実施形態を示す
回路構成図である。同図が図2と異なる部分は、電圧検
出装置1にインピーダンス切換機能を設けた点にある。
FIG. 1 is a circuit diagram showing an embodiment of the present invention. 2 differs from FIG. 2 in that the voltage detection device 1 is provided with an impedance switching function.

【0012】電圧検出装置1は、インピーダンスXをも
つ絶縁トランス3によって電圧波形を取り込み、電圧検
出回路4によって電圧検出する。ここで、絶縁トランス
3の一次側には並列に常開接点Yとインピーダンス切換
用抵抗Rの直列回路を設け、接点Yは検出回路4が検出
電圧が所定レベル以上変化したことを検出したときに閉
じる構成とする。
The voltage detecting device 1 captures a voltage waveform by an insulating transformer 3 having an impedance X, and detects a voltage by a voltage detecting circuit 4. Here, a serial circuit of a normally open contact Y and an impedance switching resistor R is provided in parallel on the primary side of the insulating transformer 3, and the contact Y is connected when the detection circuit 4 detects that the detection voltage has changed by a predetermined level or more. Close the structure.

【0013】これにより、例えば、R相に断線が発生
し、RS相間の電圧が変化したときに電圧検出装置1が
自身で接点Yを閉じ、その入力インピーダンスを低下さ
せ、他の相の計測装置2のインピーダンスを通した電圧
の回り込みによる誤動作等を防止する。これを以下に詳
細に説明する。
Thus, for example, when a disconnection occurs in the R phase and the voltage between the RS phases changes, the voltage detection device 1 closes the contact Y by itself, lowers the input impedance thereof, and measures the other phases. 2 prevents erroneous operation due to sneak of voltage through impedance. This will be described in detail below.

【0014】図1において、検出対象系統が健全な場合
には、系統のインピーダンスが十分に低いため、他の計
測装置2のインピーダンスの存在にも電圧検出装置1に
はRS相間の電圧がそのまま検出される。
In FIG. 1, when the system to be detected is sound, the impedance of the system is sufficiently low, so that the voltage between the RS phases is directly detected by the voltage detecting device 1 even when the impedance of the other measuring device 2 exists. Is done.

【0015】系統に断線が発生すると、RT相間の計測
装置2を通してT相電圧がC点からA点に印加される。
電圧検出装置1は、A’点とB点に接続されているた
め、その検出電圧は、
When a disconnection occurs in the system, a T-phase voltage is applied from point C to point A through the measuring device 2 between the RT phases.
Since the voltage detection device 1 is connected to the points A ′ and B, the detection voltage is

【0016】[0016]

【数2】VST*X/(X+Z) となる。ただし、VSTはST間の電圧、Xは電圧検出装
置のインピーダンス、ZはRT相間の計測装置インピー
ダンスである。
## EQU2 ## V ST * X / (X + Z) Here, V ST is the voltage between ST , X is the impedance of the voltage detection device, and Z is the measurement device impedance between the RT phases.

【0017】次に、電圧検出装置1内で断線時に検出さ
れる電圧変動ΔVは、
Next, the voltage fluctuation ΔV detected at the time of disconnection in the voltage detector 1 is:

【0018】[0018]

【数3】ΔV=電圧変化前の電圧値−電圧変化後の電圧
値 となる。この電圧変化ΔVが一定量を越えたとき、電圧
検出装置1は接点Yを閉じ、抵抗RをRS相間に挿入す
る。このとき、抵抗RをRT相間のインピーダンスZに
比べ十分に小さいものとしておくことにより、電圧検出
装置1の分担電圧が小さくなる。なお、断線でなく、系
統電圧が下がった場合は、電圧検出装置に印加される電
圧はあくまでもRS相間の電圧であり、負担Rを挿入す
るも電圧が下がることはない。
ΔV = voltage value before voltage change−voltage value after voltage change When the voltage change ΔV exceeds a certain amount, the voltage detection device 1 closes the contact Y and inserts the resistor R between the RS phases. At this time, by setting the resistance R sufficiently smaller than the impedance Z between the RT phases, the shared voltage of the voltage detection device 1 is reduced. In the case where the system voltage is lowered instead of the disconnection, the voltage applied to the voltage detection device is a voltage between the RS phases to the last, and the voltage does not decrease even if the load R is inserted.

【0019】電圧検出装置1における実際の電圧検出信
号の発生は、負担(抵抗)Rの挿入時の電圧変動ΔVを
演算する。
The generation of the actual voltage detection signal in the voltage detection device 1 calculates the voltage fluctuation ΔV when the burden (resistance) R is inserted.

【0020】[0020]

【数4】ΔV1=急変前の電圧値(または負担挿入前の
電圧)−負担挿入後の電圧 この演算を基に、負担Rを挿入することにより、ΔV1
が大きくなった場合、又は一定値を越えた場合を断線と
して検出する。
ΔV 1 = voltage value before sudden change (or voltage before burden insertion) −voltage after burden insertion Based on this calculation, by inserting burden R, ΔV 1
Is detected as a disconnection when the value of 大 き く increases or exceeds a certain value.

【0021】また、RT相間に他の計測装置が無い場合
は、タミー抵抗を挿入する。すなわち、RT相間に他の
計測装置等のインピーダンス要素が接続されない場合
は、T相電圧が電圧検出装置に回り込まないため、RS
相間の電圧が検出できるとしてタミー抵抗は挿入しな
い。
If there is no other measuring device between the RT phases, a Tammy resistor is inserted. That is, when no impedance element such as another measurement device is connected between the RT phases, the T-phase voltage does not sneak into the voltage detection device.
No Tammy resistor is inserted because the voltage between phases can be detected.

【0022】なお、実施形態の回路構成において、接点
Yは他の半導体スイッチとすること、負担Rはインピー
ダンス回路要素とすることなど、適宜設計変更して同等
の作用効果を得ることができる。
In the circuit configuration of the embodiment, the same effect can be obtained by appropriately changing the design such that the contact Y is another semiconductor switch and the burden R is an impedance circuit element.

【0023】[0023]

【発明の効果】以上のとおり、本発明によれば、電圧が
急変したときに電圧検出装置の入力インピーダンスを下
げ、他の計測装置などがもつインピーダンスを通した電
圧の回り込みにも検出電圧への影響を取り除くことがで
きるようにしたため、検出対象系統に接続される他の装
置の影響を受けることなく確実に電圧検出できる。
As described above, according to the present invention, when the voltage suddenly changes, the input impedance of the voltage detection device is lowered, and the sneak of the voltage through the impedance of another measurement device or the like is reduced. Since the influence can be removed, the voltage can be reliably detected without being affected by other devices connected to the detection target system.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の実施形態を示す装置構成図。FIG. 1 is an apparatus configuration diagram showing an embodiment of the present invention.

【図2】従来の装置構成図。FIG. 2 is a configuration diagram of a conventional apparatus.

【符号の説明】[Explanation of symbols]

1…電圧検出装置 2…他の計測装置 3…絶縁トランス 4…電圧検出回路 Y…接点 R…インピーダンス切換用抵抗 DESCRIPTION OF SYMBOLS 1 ... Voltage detection device 2 ... Other measuring device 3 ... Insulation transformer 4 ... Voltage detection circuit Y ... Contact R ... Impedance switching resistance

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 電圧検出対象ラインに他の装置と共に接
続され、該ラインの相間電圧を検出する電圧検出装置で
あって、 前記ラインに接続された入力電圧が一定値以上に変化し
たことを検出する検出手段と、 前記検出手段の検出信号によって前記他の装置がもつ入
力インピーダンスによる電圧回り込みの影響を少なくす
る入力インピーダンスを検出入力回路に挿入する手段と
を備えたことを特徴とする電圧検出装置。
1. A voltage detection device connected to a voltage detection target line together with another device to detect an inter-phase voltage of the line, wherein the voltage detection device detects that an input voltage connected to the line has changed to a predetermined value or more. And a means for inserting into the detection input circuit an input impedance that reduces the influence of voltage sneak by the input impedance of the other device based on the detection signal of the detection means. .
JP2000335408A 2000-11-02 2000-11-02 Voltage detector Expired - Fee Related JP4238474B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000335408A JP4238474B2 (en) 2000-11-02 2000-11-02 Voltage detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000335408A JP4238474B2 (en) 2000-11-02 2000-11-02 Voltage detector

Publications (2)

Publication Number Publication Date
JP2002139524A true JP2002139524A (en) 2002-05-17
JP4238474B2 JP4238474B2 (en) 2009-03-18

Family

ID=18811161

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000335408A Expired - Fee Related JP4238474B2 (en) 2000-11-02 2000-11-02 Voltage detector

Country Status (1)

Country Link
JP (1) JP4238474B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004023548A1 (en) * 2002-09-02 2004-03-18 Tokyo Electron Limited Probing method and probe
JP7323245B1 (en) * 2023-04-07 2023-08-08 エクセン株式会社 Disconnection detector

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004023548A1 (en) * 2002-09-02 2004-03-18 Tokyo Electron Limited Probing method and probe
JP7323245B1 (en) * 2023-04-07 2023-08-08 エクセン株式会社 Disconnection detector

Also Published As

Publication number Publication date
JP4238474B2 (en) 2009-03-18

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