JP2002137429A - Apparatus for measuring value of resistance of heating element of thermal head, and apparatus for judging breakage - Google Patents

Apparatus for measuring value of resistance of heating element of thermal head, and apparatus for judging breakage

Info

Publication number
JP2002137429A
JP2002137429A JP2000336511A JP2000336511A JP2002137429A JP 2002137429 A JP2002137429 A JP 2002137429A JP 2000336511 A JP2000336511 A JP 2000336511A JP 2000336511 A JP2000336511 A JP 2000336511A JP 2002137429 A JP2002137429 A JP 2002137429A
Authority
JP
Japan
Prior art keywords
heating element
value
voltage value
capacitor
charging
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000336511A
Other languages
Japanese (ja)
Inventor
Yasuo Nishio
保夫 西尾
Minoru Ito
稔 伊藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Semiconductor Equipment Inc
Original Assignee
Canon NTC Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon NTC Inc filed Critical Canon NTC Inc
Priority to JP2000336511A priority Critical patent/JP2002137429A/en
Publication of JP2002137429A publication Critical patent/JP2002137429A/en
Pending legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To solve a problem in which when value of resistance of a heating element is measured and connection of a condenser is released, change in electric voltage can be sped up but the electric voltage is easily influenced by noises and changes in electric voltage of an electric source to generate an error in the result of the measurement. SOLUTION: A capacitor C is forcibly charged for a first specified time and after the charge is finished, the capacitor C is forcibly discharged for a second specified time and after the discharge is finished, the heating element r is energized and the value of electric voltage or electric current of the heating element r when the third specified time passes from the beginning of the energization is detected and the value of resistance of the heating element r is measured from the detected value of the electric voltage or the electric current.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、サーマルヘッドの
発熱素子の抵抗値を測定する抵抗値測定装置、及び、発
熱素子の破損の有無を判定する破損判定装置に関する。
[0001] 1. Field of the Invention [0002] The present invention relates to a resistance value measuring device for measuring the resistance value of a heating element of a thermal head, and a damage judging device for judging whether or not the heating element is damaged.

【0002】[0002]

【従来の技術】一般に、サーマルプリンタに用いられる
サーマルヘッドには、インクフィルムや感熱記録材料を
加熱するための発熱素子が複数配置され、これらの発熱
素子は電源に対して並列に接続されている。また、サー
マルヘッドには、発熱素子にかかる電圧に対するノイズ
や電源電圧の変化の影響を除去するために、該電源に対
してこれら発熱素子と並列にコンデンサが接続されてい
る。
2. Description of the Related Art Generally, a thermal head used in a thermal printer is provided with a plurality of heating elements for heating an ink film or a heat-sensitive recording material, and these heating elements are connected in parallel to a power supply. The thermal head is connected with a capacitor in parallel with the heating element in order to eliminate the influence of noise on the voltage applied to the heating element and changes in the power supply voltage.

【0003】ところで、上記発熱素子の抵抗値は各発熱
素子毎にばらつきがあり、また、経時変化するため、そ
のままインクフィルム等の加熱に用いると印字や画像記
録等に濃度むらが生じる。この濃度むらを防止するた
め、従来より、発熱素子に一個ずつ順に通電して通電中
の発熱素子の電圧値又は電流値を検出し、該検出した電
圧値又は電流値から該発熱素子の抵抗値を測定し、該測
定した抵抗値に基づいて出力補正を行なっている。
[0003] The resistance value of the above-mentioned heating elements varies from one heating element to another and changes with time. Therefore, if the heating element is used as it is for heating an ink film or the like, density unevenness occurs in printing or image recording. Conventionally, in order to prevent the density unevenness, the heating elements are sequentially energized one by one to detect a voltage value or a current value of the heating element during energization, and to determine a resistance value of the heating element from the detected voltage value or current value. Is measured, and the output is corrected based on the measured resistance value.

【0004】このようなサーマルヘッドの発熱素子の抵
抗値を測定する抵抗値測定装置として、例えば、特開平
2−248262号公報に記載されたものが知られてい
る。この従来の抵抗値測定装置は、発熱素子と並列に接
続されたコンデンサに対してスイッチ手段を直列接続
し、発熱素子の抵抗値を測定する場合には、スイッチ手
段を開状態にしてコンデンサの接続を解除するように構
成されている。
As a resistance value measuring device for measuring the resistance value of a heating element of such a thermal head, for example, one described in Japanese Patent Application Laid-Open No. 2-248262 is known. In this conventional resistance value measuring device, a switch means is connected in series to a capacitor connected in parallel with a heating element, and when measuring the resistance value of the heating element, the switch means is opened to connect the capacitor. Is configured to be released.

【0005】[0005]

【発明が解決しようとする課題】上記従来のものでは、
発熱素子の抵抗値を測定する場合にコンデンサの接続を
解除しているので、発熱素子の電圧値や電流値がコンデ
ンサの充放電による影響を受けずに速やかに定常状態に
安定し、測定時間の短縮を図れるものの、端子間電圧が
ノイズや電源電圧の変化の影響を受けやすくなり、測定
結果に誤差が生じやすいといった問題があった。
SUMMARY OF THE INVENTION In the above prior art,
Since the connection of the capacitor is disconnected when measuring the resistance of the heating element, the voltage and current values of the heating element are quickly stabilized in a steady state without being affected by the charging and discharging of the capacitor, and the measurement time is reduced. Although shortening can be achieved, there has been a problem that the voltage between terminals is easily affected by noise and a change in power supply voltage, and an error easily occurs in the measurement result.

【0006】そこで本発明は、上記の問題点に鑑み、ノ
イズや電源電圧の変化の影響を受けにくく、正確かつ速
やかに発熱素子の抵抗値を測定することが可能なサーマ
ルヘッドの発熱素子の抵抗値測定装置を提供することを
第1の課題とする。また、ノイズや電源電圧の変化の影
響を受けにくく、かつ、正確かつ速やかに発熱素子の破
損の有無を判定することが可能なサーマルヘッドの発熱
素子の破損判定方法を提供することを第2の課題とす
る。
Accordingly, the present invention has been made in view of the above-described problems, and is not susceptible to the effects of noise and variations in power supply voltage. It is possible to measure the resistance of a heating element accurately and quickly. A first object is to provide a value measuring device. It is another object of the present invention to provide a method for determining the damage of a heating element of a thermal head, which is less susceptible to noise and a change in power supply voltage, and is capable of accurately and quickly determining whether or not the heating element is damaged. Make it an issue.

【0007】[0007]

【課題を解決するための手段】上記第1の課題を解決す
るために、本発明の第1の特徴によれば、電源に対して
並列に接続された複数の発熱素子と、該電源に対してこ
れら発熱素子と並列に接続されたコンデンサとを備えた
サーマルヘッドの各発熱素子の抵抗値を測定する測定装
置であって、これら発熱素子に一個ずつ順に通電し、通
電中の発熱素子の電圧値又は電流値を検出し、該検出し
た電圧値又は電流値から該発熱素子の抵抗値を測定する
ものにおいて、通電順位が先の発熱素子への通電後に上
記コンデンサを強制的に第1の所定時間充電する充電手
段と、該充電手段による充電の後、コンデンサを強制的
に第2の所定時間放電する放電手段とを備え、該放電手
段による放電の後に通電順位が後の発熱素子に通電し、
該通電の開始から第3の所定時間経過時における該発熱
素子の電圧値又は電流値を検出し、該検出した電圧値又
は電流値から該発熱素子の抵抗値を測定するようにして
いる。
According to a first aspect of the present invention, a plurality of heating elements connected in parallel to a power supply, and a plurality of heating elements connected to the power supply are provided. A measuring device for measuring the resistance value of each heating element of a thermal head comprising a heating element and a capacitor connected in parallel. Detecting the resistance value of the heating element from the detected voltage value or current value, and forcing the capacitor to a first predetermined value after energizing the heating element in a prioritized order. Charging means for charging for a time, and discharging means for forcibly discharging a capacitor for a second predetermined time after charging by the charging means. ,
A voltage value or a current value of the heating element at a time when a third predetermined time has elapsed from the start of the energization is detected, and a resistance value of the heating element is measured from the detected voltage value or current value.

【0008】また、上記第2の課題を解決するために、
本発明の第2の特徴によれば、電源に対して並列に接続
された複数の発熱素子と、該電源に対してこれら発熱素
子と並列に接続されたコンデンサとを備えたサーマルヘ
ッドの各発熱素子の破損の有無を判定する判定装置であ
って、これら発熱素子に一個ずつ順に通電し、通電中の
発熱素子の電圧値又は電流値を検出し、該検出した電圧
値又は電流値から該発熱素子の破損の有無を判定するも
のにおいて、通電順位が先の発熱素子への通電後に上記
コンデンサを強制的に第1の所定時間充電する充電手段
と、該充電手段による充電の後、コンデンサを強制的に
第2の所定時間放電する放電手段とを備え、該放電手段
による放電の後に通電順位が後の発熱素子に通電し、該
通電の開始から第3の所定時間経過時における該発熱素
子の電圧値又は電流値を検出し、該検出した電圧値又は
電流値から該発熱素子の破損の有無を判定するようにし
ている。
In order to solve the second problem,
According to the second feature of the present invention, each heat generation of the thermal head including a plurality of heating elements connected in parallel to the power supply and a capacitor connected in parallel to the heating elements with respect to the power supply. A determining device for determining whether or not the heating elements are damaged; energizing the heating elements one by one in order, detecting a voltage value or a current value of the heating element being energized, and detecting the heating value based on the detected voltage value or current value; In the method for determining the presence or absence of damage to the element, charging means for forcibly charging the capacitor for a first predetermined time after energizing the heating element having the earlier energization order, and forcing the capacitor after charging by the charging means Discharging means for discharging a second predetermined time, and after the discharge by the discharging means, power is supplied to the heating element having a higher power supply order, and the heating element is turned off when a third predetermined time has elapsed from the start of the power supply. Voltage or voltage Detecting the value, and so as to determine the presence or absence of breakage of the heat generating element from the voltage value or current value the detected.

【0009】上記第1の特徴によれば、コンデンサを接
続した状態で発熱素子に通電するので、発熱素子の電圧
値又は電流値がノイズや電源電圧の変化の影響を受けに
くく、正確に発熱素子の抵抗値を測定することができ
る。一方、コンデンサを接続した状態で発熱素子に通電
するため、発熱素子の電圧値又は電流値は通電開始時の
値から漸近的に変化し、安定するまでに時間がかかる。
しかし本発明によれば、発熱素子に対して通電する前に
コンデンサを強制的に第1の所定時間充電し、該充電後
コンデンサを強制的に第2の所定時間放電するので、通
電開始時の発熱素子の電圧値又は電流値を略一定値にす
ることができる。そのため、該一定値が所定の値、例え
ば、発熱素子の平均抵抗値に対応する電圧値又は電流値
となるように上記第1及び第2の所定時間を設定するこ
とにより、発熱素子の電圧値又は電流値が定常状態に安
定するまでの時間を短くすることができる。したがっ
て、上記第3の所定時間を短く設定でき、測定時間の短
縮化を図れる。
According to the first feature, since the heating element is energized in a state where the capacitor is connected, the voltage or current value of the heating element is hardly affected by noise or a change in the power supply voltage, and the heating element can be accurately measured. Can be measured. On the other hand, since the heating element is energized with the capacitor connected, the voltage value or the current value of the heating element changes asymptotically from the value at the start of energization, and it takes time to stabilize.
However, according to the present invention, the capacitor is forcibly charged for the first predetermined time before energizing the heating element, and the capacitor is forcibly discharged for the second predetermined time after the charging. The voltage value or the current value of the heating element can be made substantially constant. Therefore, by setting the first and second predetermined times so that the constant value becomes a predetermined value, for example, a voltage value or a current value corresponding to the average resistance value of the heating element, the voltage value of the heating element is set. Alternatively, the time until the current value stabilizes in the steady state can be shortened. Therefore, the third predetermined time can be set short, and the measurement time can be shortened.

【0010】また、上記第2の特徴によれば、上記検出
した電圧値又は電流値から発熱素子の破損の有無を判定
することができる。すなわち、破損している発熱素子の
抵抗値は無限大であるため、所定時間経過時に発熱素子
の電圧値は電源電圧と同じ値となり、また、発熱素子の
電流は0Aとなる。したがって、放電手段による放電終
了時のコンデンサの電圧値が所定の値になるように上記
第1及び第2の所定時間を設定することにより、速やか
に発熱素子の破損の有無を判定することができる。例え
ば、上記放電終了時のコンデンサの電圧値が、発熱素子
への通電後の定常状態における正常な発熱素子の電圧値
の範囲よりも大きい値になるように上記第1及び第2の
所定時間を設定すれば、発熱素子が破損している場合、
発熱素子への通電により発熱素子の電圧値が上がり、ま
た、発熱素子の電流値が下がる。したがって上記第3の
所定時間を短く設定しても発熱素子の破損の有無を正確
に判定することができ、判定時間の短縮化を図れる。
Further, according to the second feature, it is possible to determine whether or not the heating element is damaged based on the detected voltage value or current value. That is, since the resistance value of the damaged heating element is infinite, the voltage value of the heating element becomes equal to the power supply voltage after a predetermined time has elapsed, and the current of the heating element becomes 0 A. Therefore, by setting the first and second predetermined times so that the voltage value of the capacitor at the end of discharging by the discharging means becomes a predetermined value, it is possible to quickly determine whether the heating element is damaged. . For example, the first and second predetermined times are set so that the voltage value of the capacitor at the end of the discharge becomes larger than the range of the voltage value of the normal heating element in the steady state after the heating element is energized. If set, if the heating element is damaged,
The energization of the heating element increases the voltage value of the heating element and decreases the current value of the heating element. Therefore, even if the third predetermined time is set to be short, it is possible to accurately determine whether or not the heating element is damaged, thereby shortening the determination time.

【0011】[0011]

【発明の実施の形態】図1を参照して、1はサーマルヘ
ッドであり、インクフィルムや感熱記録材料を加熱し、
印字や画像記録等を行なうためのものである。サーマル
ヘッド1は、電源部2に対して接続され、1列に配置さ
れた複数の発熱素子r(r1、r2、・・・、rn)
と、電源部2に対してこれら発熱素子と並列に接続され
たコンデンサCとを備えている。各発熱素子rにはそれ
ぞれ該発熱素子への通電を制御するためのトランジスタ
T(T1、T2、・・・、Tn)が直列接続されてい
る。また、サーマルヘッド1は、シフトレジスタ3とラ
ッチアレイ4とANDゲートアレイ5とを備えている。
該シフトレジスタ3及びラッチアレイ4、ANDゲート
アレイ5は、サーマルヘッド1外の制御部6とそれぞれ
接続されている。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Referring to FIG. 1, reference numeral 1 denotes a thermal head for heating an ink film or a thermosensitive recording material.
This is for performing printing, image recording, and the like. The thermal head 1 is connected to the power supply unit 2 and has a plurality of heating elements r (r1, r2,..., Rn) arranged in a line.
And a capacitor C connected to the power supply unit 2 in parallel with these heating elements. Each heating element r is connected in series with a transistor T (T1, T2,..., Tn) for controlling the energization of the heating element. The thermal head 1 includes a shift register 3, a latch array 4, and an AND gate array 5.
The shift register 3, the latch array 4, and the AND gate array 5 are connected to a control unit 6 outside the thermal head 1, respectively.

【0012】印字等を行なう場合には、印字する画像デ
ータに対応するシリアル信号が制御部6からシフトレジ
スタ3に送られ、該シフトレジスタ3は該シリアル信号
をパラレル信号に変換する。該パラレル信号は制御部6
からのラッチ信号と同期してラッチアレイ4にラッチさ
れる。ANDゲートアレイ5は制御部6からストローブ
信号が入力されたときに、該パラレル信号に対応して各
トランジスタTに信号を出力する。信号を受けたトラン
ジスタTはON状態となり、該トランジスタTに直列接
続された発熱素子rが電源部2の直流電源により通電さ
れ、インクフィルム等を加熱して印字等を行なう。
When performing printing or the like, a serial signal corresponding to the image data to be printed is sent from the control unit 6 to the shift register 3, and the shift register 3 converts the serial signal into a parallel signal. The parallel signal is supplied to the control unit 6
Latched by the latch array 4 in synchronization with the latch signal from When a strobe signal is input from the control unit 6, the AND gate array 5 outputs a signal to each transistor T in accordance with the parallel signal. Upon receiving the signal, the transistor T is turned on, and the heating element r connected in series to the transistor T is energized by the DC power supply of the power supply unit 2 to heat the ink film or the like to perform printing or the like.

【0013】サーマルヘッド1と電源部2との間には基
準抵抗Rが設けられている。また、制御部6には充電手
段である充電回路7及び放電手段である放電回路8が接
続され、該充電回路7及び放電回路8は、コンデンサC
の高電位側に接続されている。制御部6から充電回路7
に対して充電信号が出力されると、該充電信号が充電回
路7に入力されている間、充電回路7はコンデンサCを
強制的に充電する。また、制御部5から放電回路8に対
して放電信号が出力されると、該放電信号が放電回路8
に入力されている間、放電回路8はコンデンサCを強制
的に放電する。
A reference resistor R is provided between the thermal head 1 and the power supply unit 2. The control unit 6 is connected to a charging circuit 7 serving as charging means and a discharging circuit 8 serving as discharging means. The charging circuit 7 and the discharging circuit 8
Is connected to the high-potential side. Control unit 6 to charging circuit 7
When the charging signal is output to the charging circuit 7, the charging circuit 7 forcibly charges the capacitor C while the charging signal is being input to the charging circuit 7. When a discharge signal is output from the control unit 5 to the discharge circuit 8, the discharge signal is output to the discharge circuit 8.
, The discharging circuit 8 forcibly discharges the capacitor C.

【0014】サーマルヘッド1と基準抵抗Rとの間には
A/D入力線Lの一端が接続され、該A/D入力線Lの
多端は制御部6に接続されている。該A/D入力線Lに
より、サーマルヘッド1の端子間電圧値V、すなわち発
熱素子rの電圧値Vが制御部6のA/D入力で検出され
る。
One end of an A / D input line L is connected between the thermal head 1 and the reference resistor R, and the other end of the A / D input line L is connected to the control unit 6. With the A / D input line L, a voltage value V between terminals of the thermal head 1, that is, a voltage value V of the heating element r is detected by an A / D input of the control unit 6.

【0015】発熱素子rの抵抗値測定を行なう場合に
は、トランジスタT1をオン状態にしトランジスタT1
以外のトランジスタTをオフ状態にするように設定され
たシリアル信号が、制御部6からシフトレジスタ3に送
られ、該シフトレジスタ3は該シリアル信号をパラレル
信号に変換する。該パラレル信号は制御部6からのラッ
チ信号と同期してラッチアレイ4にラッチされる。これ
ら一連の処理と並行して、図2に示すように、制御部6
から充電回路7に対してパルス幅t1の充電信号が出力
されてコンデンサCは強制的に第1の所定時間t1充電
され、該充電後、制御部6から放電回路8に対してパル
ス幅t2の放電信号が出力されてコンデンサCは強制的
に第2の所定時間t2放電される。該放電後、ANDゲ
ートアレイ5に制御部6からストローブ信号が入力さ
れ、該ANDゲートアレイ5はラッチアレイ4からパラ
レル信号を受け、該パラレル信号に対応してトランジス
タT1にのみ信号を出力する。信号を受けたトランジス
タT1はON状態となり、該トランジスタT1に直列接
続された発熱素子r1が電源部2の直流電源により通電
される。該通電の開始から第3の所定時間t3経過時
に、A/D入力線Lを介し制御部6のA/D入力で発熱
素子rの電圧値Vが検出される。そして、該電圧値Vを
用いて、発熱素子r1の抵抗値が式r=V・R/(E−
V)により測定される。以下同様の手順で、コンデンサ
Cに対して充電・放電を行なった後、発熱素子r2〜r
nに1個づつ順に通電し、該発熱素子r2〜rnについ
て電圧値Vを検出し、それぞれ抵抗値を測定する。
When measuring the resistance value of the heating element r, the transistor T1 is turned on and the transistor T1 is turned on.
A serial signal set to turn off the other transistors T is sent from the control unit 6 to the shift register 3, and the shift register 3 converts the serial signal into a parallel signal. The parallel signal is latched by the latch array 4 in synchronization with the latch signal from the control unit 6. In parallel with these series of processes, as shown in FIG.
A charging signal having a pulse width t1 is output to the charging circuit 7, and the capacitor C is forcibly charged for a first predetermined time t1. After the charging, the control unit 6 sends a pulse width t2 to the discharging circuit 8 to the discharging circuit 8. The discharge signal is output, and the capacitor C is forcibly discharged for the second predetermined time t2. After the discharge, a strobe signal is input from the control unit 6 to the AND gate array 5, the AND gate array 5 receives a parallel signal from the latch array 4, and outputs a signal only to the transistor T1 in response to the parallel signal. Upon receiving the signal, the transistor T1 is turned on, and the heating element r1 connected in series to the transistor T1 is energized by the DC power supply of the power supply unit 2. When a third predetermined time t3 has elapsed from the start of the energization, the voltage value V of the heating element r is detected by the A / D input of the control unit 6 via the A / D input line L. Then, using the voltage value V, the resistance value of the heating element r1 is calculated by the equation r = VRR / (E−
V). After charging and discharging of the capacitor C in the same procedure, the heating elements r2 to r
n is sequentially energized one by one, and the voltage value V is detected for each of the heating elements r2 to rn, and the resistance value is measured.

【0016】尚、上記実施の形態では、発熱素子rの電
圧値Vを検出することにより該発熱素子rの抵抗値を算
出したが、電圧値Vの代わりに発熱素子rに流れる電流
値を検出して該発熱素子rの抵抗値を算出するようにし
ても良い。
In the above embodiment, the resistance value of the heating element r is calculated by detecting the voltage value V of the heating element r, but the current value flowing through the heating element r is detected instead of the voltage value V. Then, the resistance value of the heating element r may be calculated.

【0017】また、上記実施の形態では、発熱素子rの
抵抗値を測定する抵抗値測定装置について説明したが、
上記検出した電圧値又は電流値から発熱素子rの破損の
有無を判定する破損判定装置を構成することもできる。
以下、図3を参照して発熱素子の破損判定について説明
する。
In the above embodiment, the resistance value measuring device for measuring the resistance value of the heating element r has been described.
It is also possible to configure a damage determination device that determines whether the heating element r is damaged based on the detected voltage value or current value.
Hereinafter, the determination of the damage of the heating element will be described with reference to FIG.

【0018】発熱素子の破損判定においては、強制的に
充電する第1の所定時間t1´及び強制的に放電する第
2の所定時間t2´は、放電終了時のコンデンサの電圧
値が、通電開始から第3の所定時間t3´(例えば5m
msec)経過時における正常な発熱素子の電圧値の範
囲(ここでは2.0V〜3.4V)よりも大きい値(例
えば3.6V程度)になるように設定する。
In the damage determination of the heating element, the first predetermined time t1 'for forcibly charging and the second predetermined time t2' for forcibly discharging are determined by the voltage value of the capacitor at the end of the discharge. From the third predetermined time t3 ′ (for example, 5 m
msec) is set to a value (for example, about 3.6 V) larger than the range of the voltage value of the normal heating element (here, 2.0 V to 3.4 V) at the time of elapse of msec.

【0019】このような設定のもとでは、正常な発熱素
子の場合、図3の発熱素子r1、r2のように、電圧値
Vのグラフが右下がりとなり、第3の所定時間t3´経
過時の発熱素子の電圧値Vは、通電開始時の電圧値より
も小さくなる。それに対し、破損している発熱素子の場
合、発熱素子の抵抗値が正常な発熱素子の抵抗値と比べ
て非常に高いため、図3のr4のように、電圧値Vのグ
ラフが右上がりとなり、第3の所定時間t3´経過時の
発熱素子の電圧値Vは、通電開始時の電圧値よりも大き
くなる。したがって、通電開始から第3の所定時間t3
´経過時の発熱素子の電圧値Vを検出し、検出された電
圧値Vが測定開始時の電圧値よりも上がっている場合に
破損していると判定する。実際は閾値として3.8V以
上に上がった場合に発熱素子が破損していると判定す
る。
Under these settings, in the case of a normal heating element, the graph of the voltage value V falls to the right like the heating elements r1 and r2 in FIG. 3, and when the third predetermined time t3 'has elapsed. Is smaller than the voltage value at the start of energization. On the other hand, in the case of the damaged heating element, the resistance value of the heating element is much higher than the resistance value of the normal heating element, so that the graph of the voltage value V rises to the right as shown by r4 in FIG. When the third predetermined time t3 'has elapsed, the voltage value V of the heating element becomes larger than the voltage value at the start of energization. Therefore, the third predetermined time t3 from the start of energization
'The voltage value V of the heating element at the time of elapse is detected, and if the detected voltage value V is higher than the voltage value at the start of the measurement, it is determined that the heating element is damaged. Actually, when the threshold value rises to 3.8 V or more, it is determined that the heating element is damaged.

【0020】尚、本発明の電圧値や時間の数値は、本実
施の形態に説明した数値に限定されるものでないことは
いうまでもない。特に、破損判定の際の第1の所定時間
t1´及び第2の所定時間t2´は、充電・放電の結果
コンデンサの電圧値が正常な発熱素子において検出され
る範囲以上になればよく、できるだけ短時間であること
が好ましい。また、発熱素子の電流値を検出する場合に
は、その電流値が測定開始時の電流値よりも下がってい
る場合に発熱素子が破損していると判定する。
It is needless to say that the numerical values of the voltage value and the time of the present invention are not limited to the numerical values described in the present embodiment. In particular, the first predetermined time t1 'and the second predetermined time t2' at the time of the damage determination need only be longer than the range in which the voltage value of the capacitor is detected by the normal heating element as a result of charging and discharging. Preferably, it is short. When the current value of the heating element is detected, if the current value is lower than the current value at the start of the measurement, it is determined that the heating element is damaged.

【0021】[0021]

【発明の効果】以上の説明から明らかなように、本発明
は、コンデンサを接続した状態で発熱素子に通電するの
で、発熱素子の電圧値又は電流値がノイズや電源電圧の
変化の影響を受けにくく、正確に発熱素子の抵抗値を測
定することができる。また、同様に、正確に発熱素子の
破損の有無を判定することができる。
As is clear from the above description, according to the present invention, since the heating element is energized with the capacitor connected, the voltage value or the current value of the heating element is affected by noise or a change in the power supply voltage. It is difficult to accurately measure the resistance value of the heating element. Similarly, it is possible to accurately determine whether the heating element is damaged.

【0022】また、コンデンサに対する充電・放電によ
り、発熱素子の通電開始時における電圧値又は電流値を
略一定値にすることができる。したがって、該一定値が
適当な値となるように充電時間・放電時間を設定するこ
とで、速やかに発熱素子の抵抗値を測定することができ
る。また、同様に、速やかに発熱素子の破損の有無を判
定することができる。
Further, by charging / discharging the capacitor, the voltage value or the current value at the start of energization of the heating element can be made substantially constant. Therefore, by setting the charging time and the discharging time so that the constant value becomes an appropriate value, the resistance value of the heating element can be quickly measured. Similarly, it is possible to quickly determine whether the heating element is damaged.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施の形態の構成を示す図FIG. 1 is a diagram showing a configuration of an embodiment of the present invention.

【図2】本発明の抵抗値測定装置の信号を示す図FIG. 2 is a diagram showing signals of the resistance value measuring device of the present invention.

【図3】本発明の破損判定装置の信号を示す図FIG. 3 is a diagram showing signals of the damage determination device of the present invention.

【符号の説明】[Explanation of symbols]

1 サーマルヘッド 7 充電回路 8 放電回路 r 発熱素子 C コンデンサ DESCRIPTION OF SYMBOLS 1 Thermal head 7 Charge circuit 8 Discharge circuit r Heating element C Capacitor

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 電源に対して並列に接続された複数の
発熱素子と、該電源に対してこれら発熱素子と並列に接
続されたコンデンサとを備えたサーマルヘッドの各発熱
素子の抵抗値を測定する測定装置であって、これら発熱
素子に一個ずつ順に通電し、通電中の発熱素子の電圧値
又は電流値を検出し、該検出した電圧値又は電流値から
該発熱素子の抵抗値を測定するものにおいて、通電順位
が先の発熱素子への通電後に上記コンデンサを強制的に
第1の所定時間充電する充電手段と、該充電手段による
充電の後、コンデンサを強制的に第2の所定時間放電す
る放電手段とを備え、該放電手段による放電の後に通電
順位が後の発熱素子に通電し、該通電の開始から第3の
所定時間経過時における該発熱素子の電圧値又は電流値
を検出し、該検出した電圧値又は電流値から該発熱素子
の抵抗値を測定するようにしたことを特徴とするサーマ
ルヘッドの発熱素子の抵抗値測定装置。
1. A resistance value of each heating element of a thermal head including a plurality of heating elements connected in parallel to a power supply and a capacitor connected in parallel with the heating element to the power supply. A heating device that sequentially energizes these heating elements one by one, detects a voltage value or a current value of the heating element during energization, and measures a resistance value of the heating element from the detected voltage value or current value. A charging means for forcibly charging the capacitor for a first predetermined time after energizing the heating element in the order of energization, and forcibly discharging the capacitor for a second predetermined time after charging by the charging means. A discharge means for performing a power supply to the heating element, which is energized after the discharge by the discharge means, and detects a voltage value or a current value of the heating element when a third predetermined time has elapsed from the start of the current supply. The detected An apparatus for measuring a resistance value of a heating element of a thermal head, wherein the resistance value of the heating element is measured from a voltage value or a current value.
【請求項2】 電源に対して並列に接続された複数の
発熱素子と、該電源に対してこれら発熱素子と並列に接
続されたコンデンサとを備えたサーマルヘッドの各発熱
素子の破損の有無を判定する判定装置であって、これら
発熱素子に一個ずつ順に通電し、通電中の発熱素子の電
圧値又は電流値を検出し、該検出した電圧値又は電流値
から該発熱素子の破損の有無を判定するものにおいて、
通電順位が先の発熱素子への通電後に上記コンデンサを
強制的に第1の所定時間充電する充電手段と、該充電手
段による充電の後、コンデンサを強制的に第2の所定時
間放電する放電手段とを備え、該放電手段による放電の
後に通電順位が後の発熱素子に通電し、該通電の開始か
ら第3の所定時間経過時における該発熱素子の電圧値又
は電流値を検出し、該検出した電圧値又は電流値から該
発熱素子の破損の有無を判定するようにしたことを特徴
とするサーマルヘッドの発熱素子の破損判定装置。
2. A thermal head comprising: a plurality of heating elements connected in parallel to a power supply; and a capacitor connected in parallel with the heating elements to the power supply. A determination device for determining whether the heating elements are energized one by one sequentially, detecting a voltage value or a current value of the heating elements during energization, and determining whether the heating elements are damaged based on the detected voltage value or current value. In the judgment,
Charging means for forcibly charging the capacitor for a first predetermined time after energizing the heating element whose energization order is earlier, and discharging means for forcibly discharging the capacitor for a second predetermined time after charging by the charging means. After the discharge by the discharge means, energizes the heating element whose energization order is later, and detects a voltage value or a current value of the heating element at a lapse of a third predetermined time from the start of the energization. A device for determining damage to a heating element of a thermal head, wherein the presence or absence of damage to the heating element is determined from the voltage value or the current value.
【請求項3】 上記放電手段による放電終了時のコン
デンサの電圧値が、発熱素子への通電後の定常状態にお
ける正常な発熱素子の電圧値の範囲よりも大きい値にな
るように上記第1及び第2の所定時間を設定したことを
特徴とする請求項2記載のサーマルヘッドの発熱素子の
破損判定装置。
3. The method according to claim 1, wherein the voltage value of the capacitor at the end of the discharging by the discharging means is larger than a range of a voltage value of a normal heating element in a steady state after energizing the heating element. 3. The apparatus according to claim 2, wherein the second predetermined time is set.
JP2000336511A 2000-11-02 2000-11-02 Apparatus for measuring value of resistance of heating element of thermal head, and apparatus for judging breakage Pending JP2002137429A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000336511A JP2002137429A (en) 2000-11-02 2000-11-02 Apparatus for measuring value of resistance of heating element of thermal head, and apparatus for judging breakage

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000336511A JP2002137429A (en) 2000-11-02 2000-11-02 Apparatus for measuring value of resistance of heating element of thermal head, and apparatus for judging breakage

Publications (1)

Publication Number Publication Date
JP2002137429A true JP2002137429A (en) 2002-05-14

Family

ID=18812061

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000336511A Pending JP2002137429A (en) 2000-11-02 2000-11-02 Apparatus for measuring value of resistance of heating element of thermal head, and apparatus for judging breakage

Country Status (1)

Country Link
JP (1) JP2002137429A (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01138744U (en) * 1988-03-18 1989-09-21
JPH1134380A (en) * 1997-07-15 1999-02-09 Ricoh Co Ltd Driver for thermal head

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01138744U (en) * 1988-03-18 1989-09-21
JPH1134380A (en) * 1997-07-15 1999-02-09 Ricoh Co Ltd Driver for thermal head

Similar Documents

Publication Publication Date Title
US4769657A (en) Fault detection device for thermal printing head heating circuits
KR20070023439A (en) Method and image forming apparatus for detecting the state of the print
US5760799A (en) Ink jet printer and method of adjusting the same
US7008036B2 (en) Ejection controlling device for inkjet printer and controlling method thereof with optimal density
US20070070110A1 (en) Apparatus and method of testing printhead nozzle
JPH07225530A (en) Diagnostic device for image recording thermal fixing device and image recorder
JP2003231291A (en) Thermal printer
JP2002137429A (en) Apparatus for measuring value of resistance of heating element of thermal head, and apparatus for judging breakage
US20070126454A1 (en) Apparatus and method of detecting defective substrate
JPS59773B2 (en) electronic thermometer
JP3310788B2 (en) Thermal head resistance measurement device and thermal printer
JPH1134380A (en) Driver for thermal head
JP2934334B2 (en) Printer print head burnout prevention device
JP2000071306A (en) Method and device for detecting disconnection of heater in injection molder
JPS6160781B2 (en)
JP2586373B2 (en) Thermal head drive control method
JP3856364B2 (en) Method and apparatus for measuring resistance value of thermal head and thermal printer equipped with the same
JPS61213171A (en) Bar code printer
JPH05238038A (en) Control system of resistance measurement of thermal head
JPH05212906A (en) Image forming device
JP2000326535A (en) Diagnosis circuit and diagnosis method for thermal head break and thermal printer
JP2528642Y2 (en) Printer device
JP2002144619A (en) Thermal printer and its operation controlling method
JP3488799B2 (en) Temperature control device
JP2001021941A (en) Battery check device for camera and adjusting device thereof

Legal Events

Date Code Title Description
A711 Notification of change in applicant

Free format text: JAPANESE INTERMEDIATE CODE: A712

Effective date: 20041021

RD03 Notification of appointment of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7423

Effective date: 20041215

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A821

Effective date: 20070518

RD02 Notification of acceptance of power of attorney

Effective date: 20070518

Free format text: JAPANESE INTERMEDIATE CODE: A7422

A621 Written request for application examination

Effective date: 20071102

Free format text: JAPANESE INTERMEDIATE CODE: A621

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A821

Effective date: 20090122

A711 Notification of change in applicant

Effective date: 20090122

Free format text: JAPANESE INTERMEDIATE CODE: A711

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20100520

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20100525

A02 Decision of refusal

Effective date: 20100928

Free format text: JAPANESE INTERMEDIATE CODE: A02