JP2002123931A - Method for polishing glass substrate for information recording medium and glass substrate for information recording medium polished by the method - Google Patents

Method for polishing glass substrate for information recording medium and glass substrate for information recording medium polished by the method

Info

Publication number
JP2002123931A
JP2002123931A JP2000313481A JP2000313481A JP2002123931A JP 2002123931 A JP2002123931 A JP 2002123931A JP 2000313481 A JP2000313481 A JP 2000313481A JP 2000313481 A JP2000313481 A JP 2000313481A JP 2002123931 A JP2002123931 A JP 2002123931A
Authority
JP
Japan
Prior art keywords
polishing
glass substrate
peripheral end
recording medium
work
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2000313481A
Other languages
Japanese (ja)
Inventor
Yoichi Tajima
洋一 田島
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Sheet Glass Co Ltd
Original Assignee
Nippon Sheet Glass Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Sheet Glass Co Ltd filed Critical Nippon Sheet Glass Co Ltd
Priority to JP2000313481A priority Critical patent/JP2002123931A/en
Publication of JP2002123931A publication Critical patent/JP2002123931A/en
Withdrawn legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To provide a method for polishing a glass substrate for an information recording medium by which the roughening of the outer edge face of the glass substrate is prevented in a step for lapping the recording surface and the smoothness of the outer edge face can be enhanced, and to provide a glass substrate for an information recording medium polished by the method. SOLUTION: A lapping step P3 for lapping the recording surface of a discoid glass substrate work 30 with an inner hole in the central part is carried out before a polishing step P4 for polishing the outer edge face of the work 30, a polishing step P5 for polishing the inner edge face of the work 30, a first polishing step P6 for polishing the recording surface of the work 30 and a second polishing step P6 for polishing the recording surface of the work 30.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、情報記録媒体用ガ
ラス基板の研磨方法、及び該方法により研磨された情報
記録媒体用ガラス基板に関する。
The present invention relates to a method for polishing a glass substrate for an information recording medium and a glass substrate for an information recording medium polished by the method.

【0002】[0002]

【従来の技術】情報記録媒体には磁気ディスク等があ
り、この磁気ディスク用の基板としては、ガラス基板が
用いられる。このガラス基板は、磁気ディスクの小型
化、薄板化に適しているのに加えて、高密度記録化のた
めに基板記録面の平坦性及び基板強度が優れている。ガ
ラス基板としては、一般に、化学強化や結晶化によって
基板強度を向上させた化学強化ガラス基板や結晶化ガラ
ス基板が用いられている。
2. Description of the Related Art An information recording medium includes a magnetic disk and the like, and a glass substrate is used as a substrate for the magnetic disk. This glass substrate is suitable not only for reducing the size and thickness of the magnetic disk, but also has excellent flatness of the substrate recording surface and excellent substrate strength for high-density recording. As the glass substrate, generally, a chemically strengthened glass substrate or a crystallized glass substrate whose substrate strength is improved by chemical strengthening or crystallization is used.

【0003】また、磁気ディスク上に記録された情報を
読取る磁気ヘッドも、高密度記録化に伴って薄膜ヘッド
から磁気抵抗型ヘッド(MRヘッド)、大型磁気抵抗型
ヘッド(GMRヘッド)へと推移してきている。
[0003] Magnetic heads for reading information recorded on a magnetic disk have also changed from thin film heads to magnetoresistive heads (MR heads) and large magnetoresistive heads (GMR heads) as recording density has increased. Have been doing.

【0004】このような磁気ディスク用ガラス基板は、
以下に述べるような製造方法により製造される(例え
ば、特開平11−221742号公報)。
[0004] Such a glass substrate for a magnetic disk is
It is manufactured by the manufacturing method described below (for example, JP-A-11-221742).

【0005】円盤加工工程 まず、アルミノシリケートガラスを母材とするガラス素
板を研削砥石で円盤状に切り出して比較的粗いダイヤモ
ンド砥石で研削加工することにより、ディスク状のガラ
ス基板ワークを作製し、ガラス基板ワークの記録面を所
定の寸法精度及び形状精度とするためにラッピングす
る。このラッピングは、回転ナイロンブラシにより粒度
#400のアルミナ砥粒研磨剤を用いて行う。このとき
の表面粗さ(Rmax)(JISB0601で測定)は
6μm程度である。
Disk processing step First, a disk-shaped glass substrate work is prepared by cutting a glass base material made of aluminosilicate glass as a base material into a disk shape with a grinding wheel and grinding with a relatively rough diamond wheel. Lapping is performed on the recording surface of the glass substrate work in order to obtain predetermined dimensional accuracy and shape accuracy. This lapping is performed by a rotating nylon brush using an alumina abrasive having a grain size of # 400. At this time, the surface roughness (Rmax) (measured according to JIS B0601) is about 6 μm.

【0006】内外周端面面取り工程 次に、円筒状の砥石を用いてガラス基板ワークの中心部
に円孔をあけると共に、外周端面及び内周端面に所定の
面取り加工を施す。このときの内外周端面の表面粗さ
(Rmax)は14μmである。
[0006] Then the outer peripheral edge chamfering process, by using a cylindrical grindstone with opening a round hole in the center of the glass substrate workpiece is subjected to a predetermined chamfering the outer peripheral end face and the inner peripheral end face. At this time, the surface roughness (Rmax) of the inner and outer peripheral end faces is 14 μm.

【0007】内周端面研磨工程 ガラス基板ワークを重ね合わせた状態でガラス基板ワー
クの内周端面を回転ナイロンブラシにより粒度#400
のアルミナ砥粒研磨剤を用いて研磨する。
Inner Peripheral End Surface Polishing Step The inner peripheral end surface of the glass substrate work is ground with a rotating nylon brush to a grain size of # 400 with the glass substrate works superposed.
Is polished using an alumina abrasive polishing agent.

【0008】記録面ラッピング工程 両面ラッピングマシンにより、自公転する樹脂製キャリ
アのホール内に収容されたガラス基板ワークの記録面を
鋳鉄製の一対の定盤で粒度#1000のアルミナ砥粒研
磨剤を用いて表面粗さ(Rmax)2μm程度にラッピ
ングする。
Recording surface lapping process The recording surface of the glass substrate work housed in the hole of the resin carrier that revolves around by a double-sided lapping machine is coated with a pair of cast iron platens using an alumina abrasive abrasive having a grain size of # 1000. And lapping to a surface roughness (Rmax) of about 2 μm.

【0009】記録面第1研磨工程 記録面ラッピング工程でラッピングされたガラス基板ワ
ークの記録面を、当該記録面ラッピング工程で残留した
傷や歪みを除去するために酸化セリウム懸濁液を用いて
ポリシャ(硬質布)により研磨する。
Recording Surface First Polishing Step The recording surface of the glass substrate work wrapped in the recording surface lapping step is polished using a cerium oxide suspension to remove scratches and distortion remaining in the recording surface lapping step. (Hard cloth).

【0010】記録面第2研磨工程 記録面第1研磨工程で研磨されたガラス基板ワークの記
録面を、さらに、酸化セリウム懸濁液を用いてポリシャ
(軟質布)により研磨する。
Recording surface second polishing step The recording surface of the glass substrate work polished in the recording surface first polishing step is further polished with a polisher (soft cloth) using a cerium oxide suspension.

【0011】このように、従来の製造方法では、ガラス
基板加工の各工程のうち記録面ラッピング工程は端面面
取り工程や研磨工程の後に行われている。
As described above, in the conventional manufacturing method, the recording surface lapping step is performed after the end face chamfering step and the polishing step in each step of processing the glass substrate.

【0012】[0012]

【発明が解決しようとする課題】しかしながら、記録面
ラッピング工程に先立って端面面取り工程や内外周端面
研磨工程が行われると、端面面取り研磨の際に生じた異
物がガラス基板の記録面に付着する場合があり、この記
録面に異物が付着していると、磁気記録媒体製造時の薄
膜スパッタ工程でのバイアス電圧を不安定にして記録面
上に形成する薄膜の膜欠陥の原因となったり、薄膜表面
の凸部となって、適正なグライドハイト(滑空高さ)が
得られないといった問題を引き起こす。
However, if the end face chamfering step or the inner / outer peripheral end face polishing step is performed prior to the recording surface lapping step, foreign matter generated during the end face chamfering polishing adheres to the recording surface of the glass substrate. In some cases, if foreign matter adheres to the recording surface, the bias voltage in the thin film sputtering process during the production of the magnetic recording medium becomes unstable, causing a film defect of the thin film formed on the recording surface, It becomes a convex on the surface of the thin film, causing a problem that an appropriate glide height (glide height) cannot be obtained.

【0013】上述したようなガラス基板の記録面への異
物の付着の原因は、ガラス基板の内外周端面の表面状態
が平滑でないために、ガラス基板の記録面が両面ラッピ
ングマシンの樹脂製キャリア内でラッピングされるとき
に、ガラス基板の外周端面とキャリアの壁面との擦過に
よって発生する樹脂やガラスのパーティクルやガラス基
板の内外周端面に捕捉されているその他のパーティクル
が、ガラス基板の記録面に付着するためである。
The cause of the adhesion of foreign substances to the recording surface of the glass substrate as described above is that the recording surface of the glass substrate is not smooth because the surface condition of the inner and outer peripheral end surfaces of the glass substrate is not smooth. When wrapped with the resin, particles of resin or glass generated by friction between the outer peripheral end surface of the glass substrate and the wall surface of the carrier and other particles trapped on the inner and outer peripheral end surfaces of the glass substrate are applied to the recording surface of the glass substrate. This is to adhere.

【0014】本発明の目的は、記録面ラッピング工程時
におけるガラス基板の外周端面荒れを防止して外周端面
の平滑度の向上させることができる磁気記録媒体用ガラ
ス基板の研磨方法、及び該方法により研磨された磁気記
録媒体用ガラス基板を提供することにある。
An object of the present invention is to provide a method for polishing a glass substrate for a magnetic recording medium, which can prevent the outer peripheral end surface of the glass substrate from being roughened in the recording surface lapping step and improve the smoothness of the outer peripheral end surface. An object of the present invention is to provide a polished glass substrate for a magnetic recording medium.

【0015】[0015]

【課題を解決するための手段】上述の目的を達成するた
めに、請求項1記載の研磨方法は、中心部に内孔を有す
るディスク状のガラス基板ワークの記録面をラッピング
する記録面ラッピング工程と、前記ワークの外周端面を
研磨する外周端面研磨工程と、前記ワークの内周端面を
研磨する内周端面研磨工程と、前記ワークの記録面を研
磨する記録面研磨工程とを有する情報記録媒体用ガラス
基板の研磨方法において、前記記録面ラッピング工程を
前記外周端面研磨工程の前に行うことを特徴とする。
According to a first aspect of the present invention, there is provided a polishing method for lapping a recording surface of a disk-shaped glass substrate work having an inner hole at a central portion. An information recording medium, comprising: an outer peripheral end surface polishing step of polishing an outer peripheral end surface of the work, an inner peripheral end surface polishing step of polishing an inner peripheral end surface of the work, and a recording surface polishing step of polishing a recording surface of the work. In the method for polishing a glass substrate for use, the recording surface lapping step is performed before the outer peripheral end face polishing step.

【0016】請求項1記載の研磨方法によれば、記録面
ラッピング工程を外周端面研磨工程の前に行うので、記
録面ラッピング工程時におけるガラス基板の外周端面荒
れを防止して内外周端面の平滑度の向上させることがで
きる。
According to the polishing method of the present invention, since the recording surface lapping step is performed before the outer peripheral end surface polishing step, the outer peripheral end surface of the glass substrate is prevented from being roughened during the recording surface lapping step, and the inner and outer peripheral end surfaces are smoothed. The degree can be improved.

【0017】請求項2記載の研磨方法は、請求項1記載
の研磨方法において、前記記録面ラッピング工程を前記
内周端面研磨工程の前に行うことを特徴とする。
A polishing method according to a second aspect is characterized in that, in the polishing method according to the first aspect, the recording surface lapping step is performed before the inner peripheral end face polishing step.

【0018】請求項3記載の研磨方法は、請求項1記載
の研磨方法において、前記記録面ラッピング工程を前記
内周端面研磨工程の後に行うことを特徴とする。
A polishing method according to a third aspect is characterized in that, in the polishing method according to the first aspect, the recording surface lapping step is performed after the inner peripheral end face polishing step.

【0019】請求項4記載の研磨方法は、請求項1乃至
3のいずれか1項に記載の研磨方法において、前記外周
端面研磨工程及び前記内周端面研磨工程の少なくとも一
方は、前記情報記録媒体用ガラス基板を1枚毎にスペー
サを挟んで積層した状態で回転ブラシにより研磨する工
程から成ることを特徴とする。
According to a fourth aspect of the present invention, in the polishing method according to any one of the first to third aspects, at least one of the outer peripheral end surface polishing step and the inner peripheral end surface polishing step is the information recording medium. A polishing process using a rotating brush in a state where the glass substrates for use are laminated one by one with a spacer interposed therebetween.

【0020】請求項4記載の研磨方法によれば、情報記
録媒体用ガラス基板を1枚毎にスペーサを挟んで積層し
た状態で回転ブラシにより研磨するので、ガラス基板ワ
ークの面取り面の全ての領域を研磨することができる。
According to the polishing method of the present invention, the glass substrate for the information recording medium is polished by the rotating brush in a state where the glass substrates are laminated one by one with the spacer interposed therebetween, so that the entire area of the chamfered surface of the glass substrate work is provided. Can be polished.

【0021】請求項5記載の研磨方法は、請求項1乃至
3のいずれか1項に記載の研磨方法において、前記内周
端面研磨工程及び前記内周端面研磨工程の少なくとも一
方は、前記ワークを回転ブラシにより研磨する工程から
成り、前記回転ブラシのブラシ毛先形状が山形であるこ
とを特徴とする。
According to a fifth aspect of the present invention, in the polishing method according to any one of the first to third aspects, at least one of the inner peripheral end face polishing step and the inner peripheral end face polishing step includes the step of polishing the workpiece. The method comprises the step of polishing with a rotating brush, and the brush tip of the rotating brush has a mountain shape.

【0022】請求項5記載の研磨方法によれば、回転ブ
ラシのブラシ毛先形状が山形であるので、スペーサを用
いることなくガラス基板ワークの面取り面の全ての領域
を研磨することができる。
According to the polishing method of the present invention, since the brush tip of the rotary brush has a mountain shape, it is possible to polish the entire chamfered surface of the glass substrate work without using a spacer.

【0023】請求項6記載の研磨方法は、請求項1乃至
3のいずれか1項に記載の研磨方法において、前記内周
端面研磨工程及び前記内周端面研磨工程の少なくとも一
方は、前記ワークを回転ブラシにより研磨する工程から
成り、前記回転ブラシは、ブラシ毛の方向が前記ガラス
基板の面取り面に沿って配向するように構成されている
ことを特徴とする。
According to a sixth aspect of the present invention, in the polishing method according to any one of the first to third aspects, at least one of the inner peripheral end face polishing step and the inner peripheral end face polishing step includes the step of polishing the workpiece. The method comprises a step of polishing with a rotating brush, wherein the rotating brush is configured such that the direction of the bristles is oriented along the chamfered surface of the glass substrate.

【0024】請求項6記載の研磨方法によれば、回転ブ
ラシは、ブラシ毛の方向がガラス基板の面取り面に沿っ
て配向するように構成されているので、スペーサを用い
ることなくガラス基板ワークの面取り面の全ての領域を
研磨することができる。
According to the polishing method of the sixth aspect, since the rotating brush is configured so that the direction of the brush bristles is oriented along the chamfered surface of the glass substrate, the rotating brush can be used without using spacers. All areas of the chamfer can be polished.

【0025】請求項7記載の情報記録媒体用ガラス基板
は、請求項1乃至6のいずれか1項に記載の情報記録媒
体用ガラス基板の研磨方法によって研磨されたことを特
徴とする。
According to a seventh aspect of the present invention, a glass substrate for an information recording medium is polished by the method for polishing a glass substrate for an information recording medium according to any one of the first to sixth aspects.

【0026】請求項7記載の情報記録媒体用ガラス基板
によれば、内外周端面の平滑度が向上した情報記録媒体
用ガラス基板を得ることができる。
According to the glass substrate for an information recording medium of the present invention, a glass substrate for an information recording medium having an improved inner and outer peripheral end surface smoothness can be obtained.

【0027】[0027]

【発明の実施の形態】以下、本発明の実施の形態に係る
磁気記録媒体用ガラス基板の研磨方法を図面を参照しな
がら説明する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS A method for polishing a glass substrate for a magnetic recording medium according to an embodiment of the present invention will be described below with reference to the drawings.

【0028】本発明の実施の形態に係る磁気記録媒体用
ガラス基板の研磨方法は、図1に記載の工程により、磁
気記録媒体用ガラス基板の内外周端面や記録面を研磨す
る。
In the method for polishing a glass substrate for a magnetic recording medium according to the embodiment of the present invention, the inner and outer peripheral end faces and the recording surface of the glass substrate for a magnetic recording medium are polished by the steps shown in FIG.

【0029】図1は、本発明の実施の形態に係る磁気記
録媒体用ガラス基板の研磨方法を実行する工程図であ
る。
FIG. 1 is a process chart for executing a method for polishing a glass substrate for a magnetic recording medium according to an embodiment of the present invention.

【0030】円盤加工工程P1 まず、アルミノシリケートガラスを母材とするガラス素
板をガラスカッター又はエアドリルで、例えば、外径8
5mmφ×内径24mmφのディスク状に切り出して比
較的粗いダイヤモンド砥石で研削加工することにより、
ディスク状のガラス基板ワークを作製し、ガラス基板ワ
ークの記録面を所定の寸法精度及び形状精度とするため
にラッピングする。このラッピングは、砥粒研磨剤を用
いて回転ナイロンブラシにより行う。このときの表面粗
さ(Rmax)(JISB0601で測定)は6μm程
度である。
Disc Processing Step P1 First, a glass base plate made of aluminosilicate glass as a base material is cut with a glass cutter or an air drill, for example, to an outer diameter of 8 mm.
By cutting into a disk shape of 5mmφ x 24mmφ inner diameter and grinding with a relatively coarse diamond grindstone,
A disk-shaped glass substrate work is produced, and lapping is performed so that the recording surface of the glass substrate work has predetermined dimensional accuracy and shape accuracy. This lapping is performed by a rotating nylon brush using an abrasive abrasive. At this time, the surface roughness (Rmax) (measured according to JIS B0601) is about 6 μm.

【0031】アルミノシリケイトガラスとしては、例え
ば、モル%表示で、SiO2を57〜74%、MgOを
1〜5%、CaOを1〜6%、Al23を3〜15%、
LiO2を5〜16%で、NaO2を4〜14%を主成分
として含有する化学強化ガラスが使用される。
As the aluminosilicate glass, for example, in terms of mol%, SiO 2 is 57 to 74%, MgO is 1 to 5%, CaO is 1 to 6%, Al 2 O 3 is 3 to 15%,
The LiO 2 with 5 to 16%, chemically strengthened glass containing NaO 2 as a main component 4 to 14 percent are used.

【0032】内外周端面面取り工程P2 次に、円筒状の砥石を用いてガラス基板ワークの中心部
に、例えば直径20mmφの円孔をあけると共に外周端
面及び内周端面に所定の面取り加工を施す。このときの
内外周端面の表面粗さ(Rmax)は14μmである。
[0032] Then the outer peripheral edge chamfering process P2, the center portion of the glass substrate workpiece by using a cylindrical grindstone, for example, performs a predetermined chamfering the outer peripheral end face and the inner peripheral end face with drilling circular holes with a diameter of 20 mm.phi. At this time, the surface roughness (Rmax) of the inner and outer peripheral end faces is 14 μm.

【0033】記録面ラッピング工程P3 本工程は、図2に示す両面ラッピングマシンを用いて実
行される。図2に示すラッピングマシン20は、鋳鉄製
の水平な上定盤21と、同じく鋳鉄製の水平な下定盤2
2とから成る。上定盤21のラッピング面はピッチ20
mmの格子状に幅2.5mmの溝が切られており、下定
盤22のラッピング面はピッチ30mmの格子状に幅
2.5mmの溝が切られている。また、上定盤21は、
回転支持軸23を有し、この回転支持軸23の回りにス
ラリー状のアルミナ砥粒研磨剤の供給口24が16個等
角度間隔で設けられている。
Recording surface lapping step P3 This step is performed using a double-sided lapping machine shown in FIG. The lapping machine 20 shown in FIG. 2 includes a horizontal upper platen 21 made of cast iron and a horizontal lower platen 2 also made of cast iron.
2 The lapping surface of the upper platen 21 is pitch 20
The lower lapping surface of the lower platen 22 is cut into a 2.5 mm wide groove in a 30 mm pitch grid pattern. In addition, the upper surface plate 21
A rotary support shaft 23 is provided. Around the rotary support shaft 23, supply ports 24 of slurry-like alumina abrasive polishing agents are provided at equal angular intervals.

【0034】上定盤21は、上から見て時計回りに(以
下、時計回り及び反時計回りという場合は全て上から見
た回転方向をいう。)16〜18rpmで、下定盤22
は、反時計回りに50〜55rpmで回転する。
The upper stool 21 is clockwise as viewed from above (hereinafter, clockwise and counterclockwise all refer to the rotation direction as viewed from above) at 16 to 18 rpm, and the lower stool 22.
Rotates counterclockwise at 50-55 rpm.

【0035】下定盤22の中心部には、太陽歯車25が
配されており、同外周部には、内歯歯車26が配されて
いる。また、下定盤22上には、太陽歯車25及び内歯
歯車26の双方に噛合する遊星歯車を備えるキャリア2
7が5個配されている。本両面ラッピングマシン20で
は、太陽歯車25が、例えば15〜22rpmで反時計
回りに回転すると共に、内歯歯車26は、例えば21〜
29rpmで反時計回りに回転するときに、キャリア2
7は、下定盤22上で時計回りに自転しながら、例えば
50rpmで反時計回りに公転する。キャリア27は、
ガラス繊維入りエポキシ樹脂であり、その厚さは、ガラ
ス基板ワークの仕上げ厚さ(例えば1mm)より、例え
ば0.2〜0.6mm小さい値である。キャリア27の
材料は、アラミド繊維入りエポキシであってもよい。
A sun gear 25 is arranged at the center of the lower platen 22, and an internal gear 26 is arranged at the outer periphery. A carrier 2 having a planetary gear meshing with both the sun gear 25 and the internal gear 26 is provided on the lower platen 22.
7 are arranged. In the double-sided lapping machine 20, the sun gear 25 rotates counterclockwise at, for example, 15 to 22 rpm, and the internal gear 26 has, for example, 21 to 22 rpm.
When rotating counterclockwise at 29 rpm, carrier 2
7 revolves counterclockwise at, for example, 50 rpm while rotating clockwise on the lower platen 22. The carrier 27 is
It is an epoxy resin containing glass fiber, and its thickness is, for example, 0.2 to 0.6 mm smaller than the finished thickness (for example, 1 mm) of the glass substrate work. The material of the carrier 27 may be an epoxy containing aramid fiber.

【0036】図3は、図2におけるキャリア27の拡大
斜視図である。キャリア27は、ガラス基板ワークを収
容するホール28を、例えば7個周方向に等角度間隔で
備えている。また、ホール28の直径は、図4に示すよ
うに、ガラス基板ワーク30の外径より、例えば2.2
5mm大きく設定されている。このようにホール28の
直径を設定すると、ガラス基板ワーク30の外周端面の
損傷を少なくすることができる。ホール28の直径とガ
ラス基板ワーク30の外径との差は1〜2mmであって
もよい。また、ホール28を規定するキャリア27の壁
にスポンジのような柔軟な介在物を貼り付けてもよい。
FIG. 3 is an enlarged perspective view of the carrier 27 in FIG. The carrier 27 has, for example, seven holes 28 for accommodating a glass substrate work at equal angular intervals in the circumferential direction. The diameter of the hole 28 is, for example, 2.2 times smaller than the outer diameter of the glass substrate work 30 as shown in FIG.
It is set to be 5 mm larger. By setting the diameter of the hole 28 in this manner, damage to the outer peripheral end surface of the glass substrate work 30 can be reduced. The difference between the diameter of the hole 28 and the outer diameter of the glass substrate work 30 may be 1 to 2 mm. Further, a flexible inclusion such as a sponge may be attached to the wall of the carrier 27 that defines the hole 28.

【0037】上記両面ラッピングマシン20により、自
公転するキャリア27内に収容されたガラス基板ワーク
30の記録面を粒度#1000(平均粒径9〜10μ
m)のアルミナ砥粒研磨剤を用いて表面粗さ(Rma
x)2μm程度にラッピングする。これにより、ガラス
基板ワーク30の厚さを、1バッチ50〜100枚とし
て最大20μm/バッチから3μm/バッチ以下に低減
して、各ガラス基板ワーク30の厚さを揃えることがで
き、且つガラス基板ワーク30の平坦度を、15μmか
ら5μmに低減することができる。ここで平坦度とは、
ガラス基板ワーク30の反りの程度を表す指標であっ
て、反ったガラス基板ワーク30の最大厚さから正味厚
さを引いた値で示すものである。
By the double-sided lapping machine 20, the recording surface of the glass substrate work 30 accommodated in the carrier 27 which revolves on its own is given a particle size of # 1000 (average particle size of 9 to 10 μm).
surface roughness (Rma)
x) Lapping to about 2 μm. As a result, the thickness of the glass substrate work 30 can be reduced from a maximum of 20 μm / batch to 3 μm / batch or less at a maximum of 50 to 100 sheets per batch, and the thickness of each glass substrate work 30 can be made uniform. The flatness of the work 30 can be reduced from 15 μm to 5 μm. Here, the flatness is
This is an index indicating the degree of warpage of the glass substrate work 30, and is indicated by a value obtained by subtracting the net thickness from the maximum thickness of the warped glass substrate work 30.

【0038】上記粒度#1000(平均粒径9〜10μ
m)のアルミナ砥粒研磨剤は、粒度#2000(4〜5
μm)のものに置き換えてもよい。
The above particle size # 1000 (average particle size 9 to 10 μm)
m) of the alumina abrasive particles having a particle size of # 2000 (4-5
μm).

【0039】上記両面ラッピングマシン20を用いて所
定の厚さに研磨されたガラス基板ワーク30は、その記
録面上に付着したアルミナ砥粒研磨剤の汚れの除去する
ために、該記録面を1〜10%程度のフッ酸(HF)エ
ッチング液で1〜5μmエッチングする。次いで、超音
波(US)洗浄によりエッチング液をすすぐ。本工程P
3により、ガラス基板ワーク30の記録面への異物の持
ち込み及び該記録面の汚れを防止することができる。
The glass substrate work 30 polished to a predetermined thickness using the double-sided lapping machine 20 has a recording surface of 1 mm in order to remove dirt of the alumina abrasive abrasive adhered to the recording surface. Etching is performed with a hydrofluoric acid (HF) etching solution of about 10 to 10% to 1 to 5 μm. The etchant is then rinsed by ultrasonic (US) cleaning. This process P
According to 3, it is possible to prevent foreign substances from being brought into the recording surface of the glass substrate work 30 and to prevent the recording surface from being stained.

【0040】外周端面研磨工程P4 本工程は、図5に示す外周端面研磨機を用いて実行され
る。図5に示す外周端面研磨機50は、約1mm厚さの
ガラス基板を約350〜400枚重ねた状態で保持する
一対のワークシャフト51と、ガラス基板ワーク30の
一対の束の双方に、夫々当接してガラス基板ワーク30
の束の外周端面及び面取り面を研磨する一対の回転ナイ
ロンブラシ52とから成る。ブラシ52は、上下方向に
往復運動も行う。ブラシ52のブラシ毛線径は0.1〜
0.5mmφ、好ましくは0.1〜0.3mmφであ
る。
Outer Edge Polishing Step P4 This step is performed by using an outer edge polishing machine shown in FIG. The outer peripheral end surface polishing machine 50 shown in FIG. 5 includes a pair of work shafts 51 for holding about 350 to 400 glass substrates having a thickness of about 1 mm in a stacked state, and a pair of bundles of glass substrate works 30, respectively. Contact glass substrate work 30
And a pair of rotating nylon brushes 52 for polishing the outer peripheral end surface and the chamfered surface of the bundle. The brush 52 also performs a reciprocating motion in the vertical direction. The brush bristle diameter of the brush 52 is 0.1 to
It is 0.5 mmφ, preferably 0.1 to 0.3 mmφ.

【0041】ワークシャフト51に保持されたガラス基
板ワーク30には、図6(a)に示すように、ガラス基
板ワーク1枚毎に80mmφ×26mmφ×0.3mm
厚さのポリプロピレン製のスペーサ31を挿入する。こ
れにより、スペーサ31によって間隔があけられた一対
のガラス基板ワーク30の面取り面の全ての領域に回転
ナイロンブラシ52が届くため、削り残しが無くなり面
取り面の品質を向上させることができる。スペーサ31
を用いない場合は、図6(b)に示すように削り残し部
32が生じる。スペーサ31は、柔軟な発泡ポリウレタ
ン製であってもよく、その厚さは0.4〜0.6mmで
あってもよい。
As shown in FIG. 6A, the glass substrate work 30 held on the work shaft 51 has a size of 80 mmφ × 26 mmφ × 0.3 mm for each glass substrate work.
A polypropylene spacer 31 having a thickness is inserted. Thereby, the rotating nylon brush 52 reaches all the areas of the chamfered surfaces of the pair of glass substrate works 30 spaced by the spacer 31, so that there is no uncut portion and the quality of the chamfered surface can be improved. Spacer 31
When no is used, an uncut portion 32 occurs as shown in FIG. The spacer 31 may be made of flexible foamed polyurethane, and may have a thickness of 0.4 to 0.6 mm.

【0042】代案として、ブラシ52のブラシ毛先形状
をガラス基板ワーク30の面取り面の形状に合わせて山
形にするか、又はブラシ52をブラシ毛の方向がガラス
基板ワーク30の面取り面に沿うように構成することに
よりスペーサ31を省略することができる。
As an alternative, the brush bristles of the brush 52 may be shaped like a chevron in accordance with the shape of the chamfered surface of the glass substrate work 30, or the brush 52 may be oriented such that the direction of the bristles is along the chamfered surface of the glass substrate work 30. In this configuration, the spacer 31 can be omitted.

【0043】上記外周端面研磨機50により、ガラス基
板ワーク30の束の外周端面及び面取り面を酸化セリウ
ム研磨剤を用いて研磨する。これにより、ガラス基板ワ
ーク30の外周端面及び面取り面の平滑度を向上させる
ことができ、ひいてはカレット異物発生を防ぐことがで
きる。
The outer peripheral end surface polishing machine 50 grinds the outer peripheral end surface and the chamfered surface of the bundle of the glass substrate works 30 using a cerium oxide abrasive. Thereby, the smoothness of the outer peripheral end surface and the chamfered surface of the glass substrate work 30 can be improved, and the generation of cullet foreign matter can be prevented.

【0044】本工程P4により、ガラス基板ワーク30
の外周端面及び面取り面の平滑度が向上する。
In this step P4, the glass substrate work 30
The smoothness of the outer peripheral end surface and the chamfered surface is improved.

【0045】次いで、ガラス基板ワーク30の束からス
ペーサ31を抜き取る。
Next, the spacer 31 is extracted from the bundle of the glass substrate works 30.

【0046】内周端面研磨工程P5 本工程は、図7に示す内周端面研磨機によって実行され
る。図7に示す内周端面研磨機70は、約1mm厚さの
ガラス基板ワーク30を約100枚重ねた状態で保持す
るワークホルダ71と、ガラス基板ワーク30の束の内
に挿入され、ガラス基板ワーク30の束の内周端面及び
面取り面を研磨する回転ナイロンブラシ72とから成
る。
Inner Peripheral End Surface Polishing Step P5 This step is performed by the inner peripheral end surface polishing machine shown in FIG. The inner peripheral end surface polishing machine 70 shown in FIG. 7 includes a work holder 71 for holding about 100 glass substrate works 30 each having a thickness of about 1 mm in a stacked state, and a glass substrate work 30 inserted into a bundle. A rotating nylon brush 72 for polishing the inner peripheral end surface and the chamfered surface of the bundle of the works 30.

【0047】ワークホルダ71の内直径は約85mmφ
であり、高さは120mmである、回転ナイロンブラシ
72は、直径が25mmφであり、長さが130mmで
ある。ワークホルダ71は時計回りに40〜60rpm
で回転し、ブラシ72は時計回りに4500rpmで回
転する。上記研磨は酸化セリウム砥粒研磨液を用いて行
われる。
The inner diameter of the work holder 71 is about 85 mmφ
And the height is 120 mm. The rotating nylon brush 72 has a diameter of 25 mmφ and a length of 130 mm. Work holder 71 is clockwise at 40-60 rpm
, And the brush 72 rotates clockwise at 4500 rpm. The polishing is performed by using a cerium oxide abrasive polishing liquid.

【0048】ワークホルダ71には、外周端面研磨機5
0の場合と同様に、ガラス基板ワーク1枚毎に80mm
φ×35mmφ×0.3mm厚さのポリプロピレン製の
スペーサが挿入された状態でガラス基板ワーク30が保
持される。これにより、スペーサによって間隔があけら
れた一対のガラス基板ワーク30の面取り面の全ての領
域にブラシ72が届くため、削り残しが無くなり面取り
面の品質を向上させることができる。
The work holder 71 has an outer peripheral end surface polishing machine 5.
0 mm, 80 mm for each glass substrate work
The glass substrate work 30 is held in a state in which a spacer made of polypropylene having a size of φ × 35 mmφ × 0.3 mm is inserted. This allows the brush 72 to reach all areas of the chamfered surfaces of the pair of glass substrate works 30 spaced by the spacer, so that there is no uncut portion and the quality of the chamfered surface can be improved.

【0049】上記内周端面研磨機70により、ガラス基
板ワーク30の束の内外周端面及び面取り面を酸化セリ
ウム研磨剤を用いて研磨する。これにより、ガラス基板
ワーク30の内周端面及び面取り面の平滑度を向上させ
ることができ、ひいてはカレット異物発生を防ぐことが
できる。
The inner peripheral end surface polishing machine 70 grinds the inner and outer peripheral end surfaces and the chamfered surface of the bundle of glass substrate works 30 using a cerium oxide abrasive. Thereby, the smoothness of the inner peripheral end surface and the chamfered surface of the glass substrate work 30 can be improved, and the occurrence of cullet foreign matter can be prevented.

【0050】上記内周端面研磨機70を用いて内周端面
及び面取り面が研磨されたガラス基板ワーク30は、そ
の内周端面及び面取り面上の汚れの除去するために、超
音波(US)洗浄が行われる。本工程P5により、ガラ
ス基板ワーク30の内周端面及び面取り面の平滑度が向
上する。
The glass substrate work 30 having the inner peripheral end face and the chamfered surface polished using the inner peripheral end face polisher 70 is subjected to ultrasonic waves (US) to remove dirt on the inner peripheral end face and the chamfered surface. Washing is performed. By this process P5, the smoothness of the inner peripheral end surface and the chamfered surface of the glass substrate work 30 is improved.

【0051】次いで、ガラス基板ワーク30の束からス
ペーサを抜き取る。
Next, the spacer is extracted from the bundle of the glass substrate works 30.

【0052】記録面第1研磨工程P6 上記工程P5で内周端面が研磨されたガラス基板ワーク
30の記録面を、記録面ラッピング工程P3で残留した
傷や歪みを除去するために酸化セリウム懸濁液を用いて
ポリシャ(硬質布)により研磨する。
Recording Surface First Polishing Step P6 The recording surface of the glass substrate work 30 whose inner peripheral end face has been polished in the above step P5 is subjected to cerium oxide suspension to remove the scratches and distortion remaining in the recording surface lapping step P3. Polish with a polisher (hard cloth) using the liquid.

【0053】記録面第2研磨工程P7 第1研磨工程P6で研磨されたガラス基板ワークの記録
面を、さらに、酸化セリウム懸濁液を用いてポリシャ
(軟質布)により研磨する。
Recording Surface Second Polishing Step P7 The recording surface of the glass substrate work polished in the first polishing step P6 is further polished with a polisher (soft cloth) using a cerium oxide suspension.

【0054】洗浄工程P8 上記研磨工程P7が施されたガラス基板ワーク30は、
その記録面等に付着した酸化セリウム懸濁液の汚れの除
去するために、紫外線(UV)洗浄を行う。
Cleaning Step P8 The glass substrate work 30 subjected to the polishing step P7 is
Ultraviolet (UV) cleaning is performed to remove stains of the cerium oxide suspension adhered to the recording surface or the like.

【0055】本実施の形態によれば、ガラス基板加工の
各工程のうち記録面ラッピング工程P3を端面研磨工程
P4及びP5や研磨工程P6及びP7の前に行っている
ので、記録面ラッピング工程P3時におけるガラス基板
の外周端面荒れを防止して内外周端面の平滑度の向上さ
せることができる。
According to the present embodiment, the recording surface lapping process P3 is performed before the end surface polishing processes P4 and P5 and the polishing processes P6 and P7 among the glass substrate processing processes. In this case, it is possible to prevent the outer peripheral end surface of the glass substrate from being roughened, thereby improving the smoothness of the inner and outer peripheral end surfaces.

【0056】また、本実施の形態においては、記録面ラ
ッピング工程P3を端面研磨工程P4及びP5や研磨工
程P6及びP7の前に行っているが、内周端面研磨工程
P5→記録面ラッピング工程P3→外周端面研磨工程P
4の順であってもよく、記録面ラッピング工程P3→記
録面第1研磨工程P6→外周端面研磨工程P4→内周端
面研磨工程P5→記録面第2研磨工程P7の順であって
もよい。要するに、記録面ラッピング工程P3が外周端
面研削工程P4の前に行うものであればよい。
In this embodiment, the recording surface lapping step P3 is performed before the end face polishing steps P4 and P5 and the polishing steps P6 and P7. However, the inner peripheral end face polishing step P5 → the recording surface lapping step P3 → Outer edge polishing process P
4, the recording surface lapping step P3 → the recording surface first polishing step P6 → the outer peripheral end surface polishing step P4 → the inner peripheral end surface polishing step P5 → the recording surface second polishing step P7. . In short, it suffices if the recording surface lapping step P3 is performed before the outer peripheral end face grinding step P4.

【0057】[0057]

【発明の効果】請求項1記載の研磨方法によれば、記録
面ラッピング工程を外周端面研磨工程の前に行うので、
記録面ラッピング工程時におけるガラス基板の外周端面
荒れを防止して内外周端面の平滑度の向上させることが
できる。
According to the polishing method of the first aspect, the recording surface lapping step is performed before the outer peripheral end face polishing step.
Roughness of the outer peripheral end surface of the glass substrate during the recording surface lapping step can be prevented, and the smoothness of the inner and outer peripheral end surfaces can be improved.

【0058】請求項2記載の研磨方法は、請求項1記載
の研磨方法において、前記記録面ラッピング工程を前記
内周端面研磨工程の前に行うことを特徴とする。
A polishing method according to a second aspect is characterized in that, in the polishing method according to the first aspect, the recording surface lapping step is performed before the inner peripheral end face polishing step.

【0059】請求項3記載の研磨方法によれば、情報記
録媒体用ガラス基板を1枚毎にスペーサを挟んで積層し
た状態で回転ブラシにより研磨するので、ガラス基板ワ
ークの面取り面の全ての領域を研磨することができる。
According to the polishing method of the third aspect, since the glass substrate for the information recording medium is polished by the rotating brush in a state where the glass substrates are stacked one by one with the spacer interposed therebetween, the entire surface of the chamfered surface of the glass substrate work is polished. Can be polished.

【0060】請求項4記載の研磨方法によれば、回転ブ
ラシのブラシ毛先形状が山形であるので、スペーサを用
いることなくガラス基板ワークの面取り面の全ての領域
を研磨することができる。
According to the polishing method of the fourth aspect, since the tip of the rotating brush has a chevron shape, the entire area of the chamfered surface of the glass substrate work can be polished without using a spacer.

【0061】請求項5記載の研磨方法によれば、回転ブ
ラシは、ブラシ毛の方向が前記ガラス基板の面取り面に
沿って配向するように構成されているので、スペーサを
用いることなくガラス基板ワークの面取り面の全ての領
域を研磨することができる。
According to the polishing method of the fifth aspect, the rotating brush is configured such that the direction of the bristles is oriented along the chamfered surface of the glass substrate, so that the glass substrate work can be performed without using a spacer. All areas of the chamfered surface can be polished.

【0062】請求項6記載の情報記録媒体用ガラス基板
によれば、内外周端面の平滑度が向上した情報記録媒体
用ガラス基板を得ることができる。
According to the glass substrate for an information recording medium according to the sixth aspect, a glass substrate for an information recording medium with improved smoothness of inner and outer peripheral end faces can be obtained.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の実施の形態に係る磁気記録媒体用ガラ
ス基板の研磨方法を実行する工程図である。
FIG. 1 is a process chart for executing a method for polishing a glass substrate for a magnetic recording medium according to an embodiment of the present invention.

【図2】図1における記録面ラッピング工程P3で使用
される両面ラッピングマシンの主要部の部分切り欠き斜
視図である。
FIG. 2 is a partially cutaway perspective view of a main part of a double-sided lapping machine used in a recording surface lapping step P3 in FIG. 1;

【図3】図2におけるキャリア27の拡大斜視図であ
る。
FIG. 3 is an enlarged perspective view of a carrier 27 in FIG.

【図4】図2のキャリア27の部分説明図である。FIG. 4 is a partial explanatory view of a carrier 27 of FIG. 2;

【図5】図1における外周端面研磨工程P4で使用され
る外周端面研磨機の主要部の斜視図である。
FIG. 5 is a perspective view of a main part of an outer peripheral edge polishing machine used in an outer peripheral edge polishing step P4 in FIG. 1;

【図6】図5の外周端面研磨機50においてガラス基板
30の外周面取り面の研磨の様子を説明する図であり、
(a)はガラス基板30の間にスペーサが挿入された場
合を示し、(b)はスペーサが挿入されない場合を示
す。
FIG. 6 is a view for explaining a state of polishing the outer peripheral chamfered surface of the glass substrate 30 in the outer peripheral edge polishing machine 50 of FIG. 5,
(A) shows the case where the spacer is inserted between the glass substrates 30, and (b) shows the case where the spacer is not inserted.

【図7】図1における内周端面研磨工程P5で使用され
る内周端面研磨機の主要部の斜視図である。
FIG. 7 is a perspective view of a main part of the inner peripheral end face polishing machine used in the inner peripheral end face polishing step P5 in FIG. 1;

【符号の説明】[Explanation of symbols]

20 ラッピングマシン 21 上定盤 22 下定盤 25 太陽歯車 26 内歯歯車 27 キャリア 28 ホール 30 ガラス基板ワーク 50 外周端面研磨機 51 ワークシャフト 52 回転ナイロンブラシ 70 内周端面研磨機 71 ワークホルダ 72 回転ナイロンブラシ Reference Signs List 20 lapping machine 21 upper surface plate 22 lower surface plate 25 sun gear 26 internal gear 27 carrier 28 hole 30 glass substrate work 50 outer peripheral end surface polishing machine 51 work shaft 52 rotating nylon brush 70 inner peripheral end surface polishing machine 71 work holder 72 rotating nylon brush

フロントページの続き (51)Int.Cl.7 識別記号 FI テーマコート゛(参考) C03C 19/00 C03C 19/00 Z Continued on the front page (51) Int.Cl. 7 Identification symbol FI Theme coat II (reference) C03C 19/00 C03C 19/00 Z

Claims (7)

【特許請求の範囲】[Claims] 【請求項1】 中心部に内孔を有するディスク状のガラ
ス基板ワークの記録面をラッピングする記録面ラッピン
グ工程と、前記ワークの外周端面を研磨する外周端面研
磨工程と、前記ワークの内周端面を研磨する内周端面研
磨工程と、前記ワークの記録面を研磨する記録面研磨工
程とを有する情報記録媒体用ガラス基板の研磨方法にお
いて、前記記録面ラッピング工程を前記外周端面研磨工
程の前に行うことを特徴とする情報記録媒体用ガラス基
板の研磨方法。
1. A recording surface lapping step of lapping a recording surface of a disk-shaped glass substrate work having an inner hole at a center portion, an outer peripheral end surface polishing step of polishing an outer peripheral end surface of the work, and an inner peripheral end surface of the work In the method for polishing a glass substrate for an information recording medium having an inner peripheral end surface polishing step of polishing the surface and a recording surface polishing step of polishing the recording surface of the work, the recording surface lapping step is performed before the outer peripheral end surface polishing step. A method for polishing a glass substrate for an information recording medium.
【請求項2】 前記記録面ラッピング工程を前記内周端
面研磨工程の前に行うことを特徴とする請求項1記載の
情報記録媒体用ガラス基板の研磨方法。
2. The method for polishing a glass substrate for an information recording medium according to claim 1, wherein the recording surface lapping step is performed before the inner peripheral end surface polishing step.
【請求項3】 前記記録面ラッピング工程を前記内周端
面研磨工程の後に行うことを特徴とする請求項1記載の
情報記録媒体用ガラス基板の研磨方法。
3. The method for polishing a glass substrate for an information recording medium according to claim 1, wherein said recording surface lapping step is performed after said inner peripheral end face polishing step.
【請求項4】 前記外周端面研磨工程及び前記内周端面
研磨工程の少なくとも一方は、前記ワークを1枚毎にス
ペーサを挟んで積層した状態で回転ブラシにより研磨す
る工程から成ることを特徴とする請求項1乃至3のいず
れか1項に記載の情報記録媒体用ガラス基板の研磨方
法。
4. The method according to claim 1, wherein at least one of the outer peripheral end face polishing step and the inner peripheral end face polishing step comprises a step of polishing the work with a rotating brush in a state where the works are stacked one by one with a spacer interposed therebetween. The method for polishing a glass substrate for an information recording medium according to claim 1.
【請求項5】 前記内周端面研磨工程及び前記内周端面
研磨工程の少なくとも一方は、前記ワークを回転ブラシ
により研磨する工程から成り、前記回転ブラシのブラシ
毛先形状が山形であることを特徴とする請求項1乃至3
のいずれか1項に記載の情報記録媒体用ガラス基板の研
磨方法。
5. The method according to claim 1, wherein at least one of the inner peripheral end face polishing step and the inner peripheral end face polishing step comprises a step of polishing the work with a rotary brush, and the brush tip of the rotary brush has a mountain shape. Claims 1 to 3
The method for polishing a glass substrate for an information recording medium according to any one of the above items.
【請求項6】 前記内周端面研磨工程及び前記内周端面
研磨工程の少なくとも一方は、前記ワークを回転ブラシ
により研磨する工程から成り、前記回転ブラシは、ブラ
シ毛の方向が前記ガラス基板の面取り面に沿って配向す
るように構成されていることを特徴とする請求項1乃至
3のいずれか1項に記載の情報記録媒体用ガラス基板の
研磨方法。
6. At least one of the inner peripheral end face polishing step and the inner peripheral end face polishing step includes a step of polishing the work with a rotating brush, wherein the rotating brush has a direction of bristles chamfering the glass substrate. The method for polishing a glass substrate for an information recording medium according to any one of claims 1 to 3, wherein the method is configured to be oriented along a surface.
【請求項7】 請求項1乃至6のいずれか1項に記載の
情報記録媒体用ガラス基板の研磨方法によって研磨され
たことを特徴とする情報記録媒体用ガラス基板。
7. A glass substrate for an information recording medium, polished by the method for polishing a glass substrate for an information recording medium according to claim 1.
JP2000313481A 2000-10-13 2000-10-13 Method for polishing glass substrate for information recording medium and glass substrate for information recording medium polished by the method Withdrawn JP2002123931A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000313481A JP2002123931A (en) 2000-10-13 2000-10-13 Method for polishing glass substrate for information recording medium and glass substrate for information recording medium polished by the method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000313481A JP2002123931A (en) 2000-10-13 2000-10-13 Method for polishing glass substrate for information recording medium and glass substrate for information recording medium polished by the method

Publications (1)

Publication Number Publication Date
JP2002123931A true JP2002123931A (en) 2002-04-26

Family

ID=18792891

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Link
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Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006019170A1 (en) * 2004-08-17 2006-02-23 Showa Denko K.K. Method of manufacturing silicon substrates for magnetic recording medium, silicon substrate for magnetic recording medium, magentic recording medium, and magnetic recording apparatus
WO2006022413A1 (en) * 2004-08-26 2006-03-02 Showa Denko K.K. Method of polishing the inner peripheral end surfaces of substrates for a recording medium using a brush
JP2006095678A (en) * 2004-08-30 2006-04-13 Showa Denko Kk Polishing method for glass substrate for magnetic recording medium
JP2008302448A (en) * 2007-06-06 2008-12-18 Konica Minolta Opto Inc Method for manufacturing glass substrate for information recording medium, glass substrate for information recording medium, and magnetic recording medium
JP2009035461A (en) * 2007-08-03 2009-02-19 Asahi Glass Co Ltd Method for manufacturing glass substrate for magnetic disk
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US8231433B2 (en) 2007-02-20 2012-07-31 Showa Denko K.K. Polishing method and polishing apparatus
JP2012157971A (en) * 2005-09-29 2012-08-23 Hoya Corp Method for manufacturing magnetic disk glass substrate, polishing member and polishing device
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Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006019170A1 (en) * 2004-08-17 2006-02-23 Showa Denko K.K. Method of manufacturing silicon substrates for magnetic recording medium, silicon substrate for magnetic recording medium, magentic recording medium, and magnetic recording apparatus
WO2006022413A1 (en) * 2004-08-26 2006-03-02 Showa Denko K.K. Method of polishing the inner peripheral end surfaces of substrates for a recording medium using a brush
US8323071B2 (en) 2004-08-26 2012-12-04 Showa Denko K.K. Method of polishing the inner peripheral end surfaces of substrates for a recording medium using a brush
JP2006095678A (en) * 2004-08-30 2006-04-13 Showa Denko Kk Polishing method for glass substrate for magnetic recording medium
JP2012157971A (en) * 2005-09-29 2012-08-23 Hoya Corp Method for manufacturing magnetic disk glass substrate, polishing member and polishing device
US8231433B2 (en) 2007-02-20 2012-07-31 Showa Denko K.K. Polishing method and polishing apparatus
JP2008302448A (en) * 2007-06-06 2008-12-18 Konica Minolta Opto Inc Method for manufacturing glass substrate for information recording medium, glass substrate for information recording medium, and magnetic recording medium
JP2009035461A (en) * 2007-08-03 2009-02-19 Asahi Glass Co Ltd Method for manufacturing glass substrate for magnetic disk
JP2009048688A (en) * 2007-08-16 2009-03-05 Konica Minolta Opto Inc Manufacturing method of glass substrate for information recording medium, glass substrate for information recording medium and magnetic recording medium
JP2013012279A (en) * 2011-06-30 2013-01-17 Konica Minolta Advanced Layers Inc Method for manufacturing glass substrate for hdd
JP2013012280A (en) * 2011-06-30 2013-01-17 Konica Minolta Advanced Layers Inc Method for manufacturing glass substrate for hdd
JP2013012281A (en) * 2011-06-30 2013-01-17 Konica Minolta Advanced Layers Inc Method for manufacturing glass substrate for hdd
JP2013123790A (en) * 2011-12-16 2013-06-24 Asahi Glass Co Ltd Polishing brush, polishing method of end face of glass substrate, and method for manufacturing glass substrate

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