JP2002098738A5 - - Google Patents
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- Publication number
- JP2002098738A5 JP2002098738A5 JP2000293726A JP2000293726A JP2002098738A5 JP 2002098738 A5 JP2002098738 A5 JP 2002098738A5 JP 2000293726 A JP2000293726 A JP 2000293726A JP 2000293726 A JP2000293726 A JP 2000293726A JP 2002098738 A5 JP2002098738 A5 JP 2002098738A5
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000293726A JP2002098738A (en) | 2000-09-27 | 2000-09-27 | Ic tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000293726A JP2002098738A (en) | 2000-09-27 | 2000-09-27 | Ic tester |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2002098738A JP2002098738A (en) | 2002-04-05 |
| JP2002098738A5 true JP2002098738A5 (en) | 2005-12-08 |
Family
ID=18776470
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000293726A Pending JP2002098738A (en) | 2000-09-27 | 2000-09-27 | Ic tester |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2002098738A (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007132905A (en) * | 2005-11-14 | 2007-05-31 | Yokogawa Electric Corp | Ic tester |
| JP2007147469A (en) * | 2005-11-29 | 2007-06-14 | Yokogawa Electric Corp | Ic tester |
| JP4745809B2 (en) * | 2005-12-06 | 2011-08-10 | 株式会社幸大ハイテック | Current / voltage application / measurement device and semiconductor inspection device |
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2000
- 2000-09-27 JP JP2000293726A patent/JP2002098738A/en active Pending