JP2002068888A - Method of disassembling semiconductor single crystal pulling device and piping for exhaust gas - Google Patents

Method of disassembling semiconductor single crystal pulling device and piping for exhaust gas

Info

Publication number
JP2002068888A
JP2002068888A JP2000252610A JP2000252610A JP2002068888A JP 2002068888 A JP2002068888 A JP 2002068888A JP 2000252610 A JP2000252610 A JP 2000252610A JP 2000252610 A JP2000252610 A JP 2000252610A JP 2002068888 A JP2002068888 A JP 2002068888A
Authority
JP
Japan
Prior art keywords
exhaust gas
single crystal
gas pipe
piping
pipe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2000252610A
Other languages
Japanese (ja)
Other versions
JP3846620B2 (en
Inventor
Yukinobu Takeyasu
志信 竹安
Atsumi Wakabayashi
篤見 若林
Toshiharu Uesugi
敏治 上杉
Takashi Mori
隆 森
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shin Etsu Handotai Co Ltd
Original Assignee
Shin Etsu Handotai Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shin Etsu Handotai Co Ltd filed Critical Shin Etsu Handotai Co Ltd
Priority to JP2000252610A priority Critical patent/JP3846620B2/en
Publication of JP2002068888A publication Critical patent/JP2002068888A/en
Application granted granted Critical
Publication of JP3846620B2 publication Critical patent/JP3846620B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Crystals, And After-Treatments Of Crystals (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide a method of disassembling a silicon single crystal pulling device, by which an activated silicon oxide accumulated in a piping for an exhaust gas can be made inert so as to prevent a small ignition at the time of cleaning work of the inside of the piping for the exhaust gas when the silicon single crystal pulling device is disassembled, and to provide a piping for the exhaust gas, whose inside can be easily cleaned. SOLUTION: The method of disassembling the silicon single crystal pulling device comprises introducing at least one time air into a chamber and/or the piping for the exhaust gas before disassembling the chamber, insulating the chamber from the outside, exhausting the introduced air, and disassembling the chamber. The piping for the exhaust gas is used in the silicon single crystal pulling device, and a leak valve is installed to the piping for the exhaust gas, and the whole body of the piping is formed using electro-conductive tubes and an earth is attached to the piping.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、シリコン単結晶引
上げ装置における解体方法および排ガス配管に関するも
のである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for dismantling a silicon single crystal pulling apparatus and an exhaust gas pipe.

【0002】[0002]

【従来の技術】半導体集積回路の基板として使用される
シリコン単結晶ウエーハは、チョクラルスキー法(CZ
法)によりシリコン単結晶を引上げて製造される。ここ
で図2に例示した従来のCZ法シリコン単結晶引上げ装
置とその排ガス配管について説明する。
2. Description of the Related Art A silicon single crystal wafer used as a substrate of a semiconductor integrated circuit is manufactured by a Czochralski method (CZ).
) To produce a silicon single crystal. Here, a conventional CZ method silicon single crystal pulling apparatus illustrated in FIG. 2 and its exhaust gas piping will be described.

【0003】シリコン単結晶引上げ装置1は、プルチャ
ンバ2とメインチャンバ3をゲートバルブ4を介して結
合したチャンバから構成され、メインチャンバ3の下部
に排ガス配管6を接続した構造になっている。
[0003] The silicon single crystal pulling apparatus 1 comprises a chamber in which a pull chamber 2 and a main chamber 3 are connected via a gate valve 4, and has a structure in which an exhaust gas pipe 6 is connected to a lower part of the main chamber 3.

【0004】そしてメインチャンバ3内に設置した石英
ルツボ(不図示)内に原料の多結晶シリコンを充填し、
石英ルツボを黒鉛ルツボで保持してその外周に設けた円
筒状の黒鉛ヒータで加熱し、多結晶シリコンを溶融した
後、プルチャンバ2上部の結晶巻上げ機構(不図示)か
らワイヤを繰り出して単結晶の種結晶をシリコン融液に
浸し、石英ルツボと種結晶をそれぞれ反対方向に回転さ
せながら、種結晶をシリコン融液より引上げて単結晶を
所望の直径と長さまで成長させることができる構成にな
っている。
A quartz crucible (not shown) installed in the main chamber 3 is filled with polycrystalline silicon as a raw material,
The quartz crucible is held by a graphite crucible and heated by a cylindrical graphite heater provided on the outer periphery of the quartz crucible to melt the polycrystalline silicon. Then, a wire is drawn out from a crystal winding mechanism (not shown) at the upper part of the pull chamber 2 to obtain a single crystal. The seed crystal is immersed in the silicon melt, and while rotating the quartz crucible and the seed crystal in opposite directions, the seed crystal is pulled up from the silicon melt and a single crystal can be grown to a desired diameter and length. I have.

【0005】単結晶引上げ中は、プルチャンバ2の上部
からアルゴン等の不活性ガスを導入してシリコン酸化物
等の反応生成物を排除して単結晶の汚染を防止し、メイ
ンチャンバ3下部からの排ガス配管6により排気してい
る。排ガス配管6には、排気ボール弁15、真空ポンプ
11およびブロア12等が接続されており、最終的には
排ガスを大気中に放出している。真空ポンプ以降の排ガ
ス配管6としては、塩化ビニル等のプラスチック管やプ
ラスチック製のフレキシブル管が大量に使用され、ユー
ティリティ配管14を避けるエルボ13(屈曲部)箇所
も多い配管となっている。
During the pulling of the single crystal, an inert gas such as argon is introduced from the upper part of the pull chamber 2 to eliminate reaction products such as silicon oxide, thereby preventing the single crystal from being contaminated. The exhaust gas is exhausted by the exhaust gas pipe 6. The exhaust gas pipe 6 is connected with an exhaust ball valve 15, a vacuum pump 11, a blower 12, and the like, and finally discharges the exhaust gas into the atmosphere. As the exhaust gas pipe 6 after the vacuum pump, plastic pipes such as vinyl chloride or flexible pipes made of plastic are used in large quantities, and there are many elbows 13 (bent portions) that avoid the utility pipes 14.

【0006】そして引上げられた単結晶棒は、プルチャ
ンバ2内に引き込まれ、ゲートバルブ4を閉じて、メイ
ンチャンバ3とは遮断される。その後冷却を待って、プ
ルチャンバ2に設けられた単結晶棒取り出し用のプルチ
ャンバドア5からチャンバ外へ搬出する。あるいは単結
晶製造が終了した後に炉内温度が所定温度に冷却されて
から単結晶棒をプルチャンバドア5から取り出すことが
できる。
The pulled single crystal rod is drawn into the pull chamber 2, closes the gate valve 4 and is cut off from the main chamber 3. Thereafter, after cooling, the wafer is carried out of the pull chamber door 5 for pulling out a single crystal rod provided in the pull chamber 2 to the outside of the chamber. Alternatively, the single crystal rod can be taken out from the pull chamber door 5 after the furnace temperature is cooled to a predetermined temperature after the completion of the single crystal production.

【0007】単結晶棒の取り出し完了後、単結晶育成中
に引上げ装置チャンバやルツボ、ヒータ、断熱材等の炉
内部材(以下、ホットゾーンということがある)あるい
は主に排ガス配管に付着したシリコン酸化物を除去した
り、消耗部品等の交換を行い、次回の引上げに備えるた
めに単結晶引上げ装置の解体、整備作業に入る。
After the removal of the single crystal rod, during the growth of the single crystal, silicon adhered to the furnace equipment (hereinafter sometimes referred to as a hot zone) such as a pulling apparatus chamber, a crucible, a heater, a heat insulating material or mainly to an exhaust gas pipe. Oxide removal, replacement of consumable parts, etc. are performed, and disassembly and maintenance work of the single crystal pulling apparatus is started in preparation for the next pulling.

【0008】先ず、プルチャンバ2を引上げ装置横へ移
動し、続いてメインチャンバ3を引上げ装置横へ移動す
る。次に、ルツボ、ヒータ、断熱材等の炉内部材を引上
げ装置外へ搬出して解体し、清掃、整備、交換作業を行
う。これらの作業終了後上記と逆の順序で炉内部材を引
上げ装置の原位置に移動、組立てた後、メインチャンバ
3を元の位置に戻して所定のルツボや原料を仕込み、最
後にメインチャンバ3上にプルチャンバ2を設置してメ
ンテナンスおよび仕込みを完了し、次の単結晶引上げに
備えることになる。
First, the pull chamber 2 is moved to the side of the pulling device, and then the main chamber 3 is moved to the side of the pulling device. Next, the in-furnace members such as crucibles, heaters, and heat insulating materials are carried out of the pulling apparatus, disassembled, and cleaned, maintained, and replaced. After completion of these operations, the furnace inner member is moved to the original position of the pulling device in the reverse order to the above, assembled, the main chamber 3 is returned to the original position, a predetermined crucible and raw materials are charged, and finally the main chamber 3 The pull chamber 2 is installed on the upper side to complete the maintenance and preparation, and prepare for the next pulling of the single crystal.

【0009】この単結晶の育成中に、シリコン融液によ
り石英ルツボ内面が侵蝕され、石英(SiO2 )とシリ
コン(Si)が反応してシリコン酸化物(SiOX 、以
下活性シリコン酸化物ということがある)を生成し、融
液表面から活性シリコン酸化物のガスとして気化する。
気化した活性シリコン酸化物は、融液上部から流入する
不活性ガスと混合して、真空ポンプ11により排ガス配
管6を通って炉外へ排出される。この気化した活性シリ
コン酸化物を含んだ不活性ガスを排気する際、気体の活
性シリコン酸化物が炉内の比較的低温な部材と接触して
冷却され、さらに低温の排ガス配管6の内面に接触する
とそこに粉塵となって付着し堆積するようになる。結晶
成長速度が1mm/min前後であるシリコン単結晶の
育成は長時間を要するため、単結晶製造中に多量の活性
シリコン酸化物が生成し、主として不活性ガスを排気す
る排ガス配管内面に付着してゆき、数mm厚さの堆積層
を形成するようになる。
During the growth of the single crystal, the inner surface of the quartz crucible is eroded by the silicon melt, and quartz (SiO 2 ) and silicon (Si) react to produce silicon oxide (SiO x , hereinafter referred to as active silicon oxide). ) Is vaporized from the surface of the melt as a gas of active silicon oxide.
The vaporized active silicon oxide is mixed with an inert gas flowing from the upper portion of the melt, and discharged out of the furnace through the exhaust gas pipe 6 by the vacuum pump 11. When exhausting the inert gas containing the vaporized active silicon oxide, the gaseous active silicon oxide comes into contact with a relatively low-temperature member in the furnace and is cooled, and further contacts the inner surface of the low-temperature exhaust gas pipe 6. Then, it becomes dust and adheres and accumulates there. Since the growth of a silicon single crystal having a crystal growth rate of about 1 mm / min requires a long time, a large amount of active silicon oxide is generated during the production of the single crystal, and adheres to the inner surface of an exhaust gas pipe for exhausting mainly inert gas. As a result, a deposited layer having a thickness of several mm is formed.

【0010】[0010]

【発明が解決しようとする課題】上記したように排ガス
配管内に堆積した活性シリコン酸化物は単結晶育成終了
後もしばらくは高温の粉末状であり、単結晶引上げ装置
の解体時に外界の空気と反応した際には発火する恐れが
あった。このため、排ガス配管には圧抜き弁などを備え
て万が一に対処しているが、排ガス配管内を清掃する時
に局部的に小発火することがあった。このため、配管の
一部が破損したりすることもあった。
As described above, the active silicon oxide deposited in the exhaust gas pipe remains in a powdery state at a high temperature for a while after the completion of the growth of the single crystal. There was a risk of fire when reacted. For this reason, the exhaust gas pipe is provided with a depressurizing valve or the like in order to cope with it. However, when the inside of the exhaust gas pipe is cleaned, a small fire may occur locally. For this reason, part of the piping was sometimes damaged.

【0011】そこで本発明は、このような従来の問題点
に鑑みてなされたもので、単結晶引上げ装置の解体に際
し、特に排ガス配管の管内清掃作業におけるこのような
小発火を未然に防止するため、排ガス配管内に堆積して
いる活性シリコン酸化物を不活性化した後にチャンバを
解体することができるシリコン単結晶引上げ装置の解体
方法を提供すると共に、管内に活性シリコン酸化物の堆
積が少なく、かつ、管内が簡単に掃除できる排ガス配管
を提供することを主たる目的とする。
The present invention has been made in view of such a conventional problem, and is intended to prevent such a small ignition in the disassembly of a single crystal pulling apparatus, particularly in a cleaning operation of an exhaust gas pipe. A method for dismantling a silicon single crystal pulling apparatus capable of disassembling a chamber after inactivating active silicon oxide deposited in an exhaust gas pipe, and reducing the deposition of active silicon oxide in the pipe, Another object of the present invention is to provide an exhaust gas pipe that can easily clean the inside of the pipe.

【0012】[0012]

【課題を解決するための手段】上記課題を解決するため
に本発明に関わるシリコン単結晶引上げ装置の解体方法
は、シリコン単結晶引上げ装置の解体方法であって、チ
ャンバを解体する前に少なくとも1回、空気をチャンバ
および/または排ガス配管内に導入し、外界と遮断した
後、導入空気を排気し、その後チャンバを解体すること
を特徴としている(請求項1)。
According to the present invention, there is provided a method for disassembly of a silicon single crystal pulling apparatus according to the present invention, comprising the steps of: The method is characterized in that air is introduced into the chamber and / or the exhaust gas pipe at a time, and after shutting off from the outside world, the introduced air is exhausted and then the chamber is disassembled.

【0013】このようにすれば、チャンバおよび/また
は排ガス配管内に導入した空気を排ガス配管内を通して
強制的に排気することになるので、特に排ガス配管内面
に堆積している活性シリコン酸化物は空気によって酸化
されて不活性なシリコン酸化物になり、同時に空気中の
水分と反応して発生した水素ガスは導入空気流によって
十分希釈され、管内に滞留することなく排気されるの
で、チャンバおよび/または排ガス配管内の発火因子の
殆どを排除することができる。従って、その後のチャン
バの解体作業や排ガス配管の清掃作業を極めて安全に行
うことができる。
[0013] In this case, the air introduced into the chamber and / or the exhaust gas pipe is forcibly exhausted through the exhaust gas pipe. Therefore, the active silicon oxide deposited on the inner surface of the exhaust gas pipe is particularly air. Hydrogen gas generated by reacting with the moisture in the air at the same time as being oxidized into an inert silicon oxide is sufficiently diluted by the introduced air flow and exhausted without staying in the pipe, so that the chamber and / or Most of the ignition factors in the exhaust gas pipe can be eliminated. Therefore, the subsequent disassembly of the chamber and the cleaning of the exhaust gas pipe can be performed extremely safely.

【0014】この場合、空気の導入に、排ガス配管のリ
ーク弁を使用することが好ましい(請求項2)。このよ
うにすると、直接排ガス配管内全体に空気がゆきわた
り、排ガス配管内面に堆積している活性シリコン酸化物
の不活性化反応が容易に進行して、効率よく不活性シリ
コン酸化物とすることができる。また、単結晶棒取り出
し用のプルチャンバドアを開閉して空気を導入するのに
比べて、簡単な操作で排ガス配管内に空気を導入する作
業をすることができ、作業時間を短縮できる利点があ
る。
In this case, it is preferable to use a leak valve of an exhaust gas pipe for introducing the air. In this way, the air is directly blown into the entire exhaust gas pipe, and the deactivation reaction of the active silicon oxide deposited on the inner surface of the exhaust gas pipe proceeds easily, so that the inert silicon oxide is efficiently converted to the inert silicon oxide. Can be. Also, compared to opening and closing the pull chamber door for taking out the single crystal rod and introducing air, the operation of introducing air into the exhaust gas pipe can be performed with a simple operation, which has the advantage of shortening the operation time. is there.

【0015】本発明に関わるシリコン単結晶引上げ装置
における排ガス配管では、排ガス配管にリーク弁を設け
たことを特徴としている(請求項3)。このようにすれ
ば、上記のように簡単に排ガス配管内に空気を導入し
て、活性シリコン酸化物を不活性化することができる。
In the exhaust gas piping of the silicon single crystal pulling apparatus according to the present invention, a leak valve is provided in the exhaust gas piping. By doing so, air can be easily introduced into the exhaust gas pipe to deactivate the active silicon oxide as described above.

【0016】そしてこの場合、排ガス配管全体を導体管
で配管し、該導体管に接地アースを設けておくことが好
ましい(請求項4)。このようにすれば、導体管内で発
生する恐れのある静電気を速やかに除去することがで
き、導体管内での発火の可能性を一層低減することがで
きる。
In this case, it is preferable that the entire exhaust gas pipe is piped with a conductor pipe, and the conductor pipe is provided with a grounding earth. With this configuration, static electricity that may be generated in the conductor tube can be quickly removed, and the possibility of ignition in the conductor tube can be further reduced.

【0017】そしてこの場合、排ガス配管が継ぎ目のな
いシームレス管であることが好ましい(請求項5)。こ
のようにすれば、排ガス配管内には継ぎ目による凹凸や
面粗れがないので活性シリコン酸化物が配管内面に堆積
する量を少なくすることができる。
In this case, it is preferable that the exhaust gas pipe is a seamless pipe without any joints. With this configuration, since there is no unevenness or surface roughness due to the seam in the exhaust gas pipe, the amount of active silicon oxide deposited on the pipe inner surface can be reduced.

【0018】さらにこの場合、排ガス配管のエルボ部分
に盲蓋を設けたものとすることが好ましい(請求項
6)。このようにすれば、シリコン単結晶引上げ装置の
解体作業に伴う排ガス配管内の点検(例えば、活性シリ
コン酸化物の付着状態の観察)や清掃作業を容易に行う
ことができ、清掃後に活性シリコン酸化物の取り残しが
発生することもない。
In this case, it is preferable that a blind cover is provided at an elbow portion of the exhaust gas pipe. In this way, inspection (for example, observation of the adhesion state of active silicon oxide) in the exhaust gas pipe and cleaning work accompanying the dismantling work of the silicon single crystal pulling apparatus can be easily performed. No leftovers occur.

【0019】[0019]

【発明の実施の形態】本発明者等は、シリコン単結晶引
上げ装置の解体時や排ガス配管掃除時に発火が発生する
原因は、主として活性シリコン酸化物と空気中の水分
(水蒸気)が反応して水素ガスが発生することにあると
推定し、次のような調査、実験でこれを確認した。
DETAILED DESCRIPTION OF THE INVENTION The inventors of the present invention have found that ignition is mainly caused by the reaction between active silicon oxide and water (water vapor) in the air when the silicon single crystal pulling apparatus is disassembled or when exhaust gas piping is cleaned. It was presumed that hydrogen gas would be generated, and this was confirmed in the following surveys and experiments.

【0020】シリコン単結晶を育成する前に排ガス配管
の途中にサンプリング用トラップ(密封可能な容器) を
取り付け、単結晶育成中にトラップ内面に活性シリコン
酸化物を堆積させ、単結晶育成終了後に空気と未反応の
活性シリコン酸化物を含んだ炉内ガスを前記トラップ内
に採取し、該トラップ内に純水を導入して反応させたと
ころ、およそ16000ppmという高濃度の水素が検
出された。空気中の水素が燃焼する濃度範囲の下限が4
%(40000ppm)であることから、条件によって
は発火、燃焼する危険性が高いことが判る。
Before growing the silicon single crystal, a sampling trap (sealable container) is attached in the middle of the exhaust gas pipe, and active silicon oxide is deposited on the inner surface of the trap during the growth of the single crystal. The furnace gas containing active silicon oxide unreacted with the furnace was collected in the trap, and pure water was introduced into the trap to cause a reaction. As a result, hydrogen having a high concentration of about 16000 ppm was detected. The lower limit of the concentration range in which hydrogen in air burns is 4
% (40000 ppm), it is understood that there is a high risk of ignition and burning depending on the conditions.

【0021】排ガス配管内の活性シリコン酸化物が発火
する危険性を回避するためには、活性シリコン酸化物が
空気中の酸素や水分により十分酸化され、不安定なSi
Xから安定で不活性なSiO2 に変化することが重要
である。しかし、活性シリコン酸化物が冷めない内に急
激に酸化されると、発生した水素が酸化物の熱により発
火する可能性が高いと考えられる。従って、この発生し
た水素をすばやく除去することが必要となる。
In order to avoid the danger of igniting the active silicon oxide in the exhaust gas pipe, the active silicon oxide is sufficiently oxidized by oxygen or moisture in the air and the
It is important from O X changes to stabilize an inactive SiO 2. However, if the active silicon oxide is rapidly oxidized before being cooled, it is considered that there is a high possibility that the generated hydrogen is ignited by the heat of the oxide. Therefore, it is necessary to quickly remove the generated hydrogen.

【0022】この推論を実証するために、シリコン単結
晶引上げ装置の排ガス配管に前記と同様のサンプリング
用トラップを設け、シリコン単結晶育成後の排ガス配管
内の窒素ガス中の酸素濃度を徐々に上げて排気し、その
後酸素と反応したシリコン酸化物を含んだ炉内ガスをト
ラップ内に採取し、前記と同様にトラップ内に純水を導
入して反応させたところ、水素濃度がおよそ4000p
pm(約0.4%)と検出され、燃焼下限値の約1/1
0にまで減少していることが判った。
In order to verify this inference, a sampling trap similar to the above was provided in the exhaust gas pipe of the silicon single crystal pulling apparatus, and the oxygen concentration in the nitrogen gas in the exhaust gas pipe after growing the silicon single crystal was gradually increased. The furnace gas containing the silicon oxide reacted with oxygen was collected in the trap, and pure water was introduced into the trap in the same manner as described above.
pm (about 0.4%), and about 1/1 of the lower limit of combustion
It turned out that it has decreased to zero.

【0023】以上述べた知見を基にして、本発明では、
シリコン単結晶引上げ装置の解体に際し、先ずチャンバ
を解体する前に、少なくとも1回、空気をチャンバおよ
び/または排ガス配管内に導入し、外界と遮断した後、
導入空気を排気し、その後チャンバを解体するようにし
た。このように本発明では、導入された空気を一旦排気
することにより、排ガス配管内の活性シリコン酸化物を
確実に不活性化することができるとともに、この時発生
する水素もすばやく排出して、酸化物が発火するような
ことはなくなった。
Based on the findings described above, the present invention provides:
At the time of disassembly of the silicon single crystal pulling apparatus, air is introduced at least once into the chamber and / or the exhaust gas pipe before the chamber is disassembled, and is shut off from the outside world.
The inlet air was evacuated and then the chamber was dismantled. As described above, according to the present invention, once the introduced air is exhausted, the active silicon oxide in the exhaust gas pipe can be reliably deactivated, and the hydrogen generated at this time is also quickly exhausted, thereby oxidizing. Things no longer ignite.

【0024】具体的には、図1に示した本発明の排ガス
配管を具備したシリコン単結晶引上げ装置において、例
えば次のような順序でシリコン単結晶引上げ装置の解体
を行った。先ずシリコン単結晶引上げ装置1のプルチャ
ンバ2内に収容した単結晶棒を取り出した後、チャンバ
を解体する前に、プルチャンバ2の単結晶棒取り出し用
のプルチャンバドア5およびゲートバルブ4を開き、こ
の状態で外界空気を数分間チャンバ内に取り込む。その
後ドア5を閉じ、真空ポンプ11にてチャンバ内の不活
性ガス(Ar)と空気の混合ガスを、排ガス配管6を通
して、チャンバ内が約100mbarになるように排気
ボール弁15を絞って約10分間真空排気する。この真
空排気を少なくとも1回、好ましくは2回以上行うこと
が重要である。
Specifically, in the silicon single crystal pulling apparatus having the exhaust gas pipe of the present invention shown in FIG. 1, the silicon single crystal pulling apparatus was disassembled in the following order, for example. First, after the single crystal rod contained in the pull chamber 2 of the silicon single crystal pulling apparatus 1 is taken out, before the chamber is disassembled, the pull chamber door 5 and the gate valve 4 for taking out the single crystal rod of the pull chamber 2 are opened. Under the condition, outside air is taken into the chamber for several minutes. Thereafter, the door 5 is closed, and a mixed gas of inert gas (Ar) and air in the chamber is evacuated by the vacuum pump 11 through the exhaust gas pipe 6 to squeeze the exhaust ball valve 15 so that the inside of the chamber becomes about 100 mbar. Evacuate for minutes. It is important that the evacuation is performed at least once, preferably at least twice.

【0025】このように、真空ポンプにより強制的に排
ガス配管を通して空気を排気することにより、排ガス配
管内に堆積している活性シリコン酸化物と空気(含水
分)とを徐々に反応させ、排ガス配管内の活性シリコン
酸化物を不活性化することができるとともに、発生した
水素ガスも速やかに希釈されて排気することができるの
で、その後のシリコン単結晶引上げ装置の解体、および
排ガス配管内の清掃作業に伴って発生し易い発火、燃焼
等を防止することができる。
As described above, by forcibly exhausting the air through the exhaust gas pipe by the vacuum pump, the active silicon oxide deposited in the exhaust gas pipe and the air (containing moisture) gradually react with each other. The active silicon oxide inside can be inactivated, and the generated hydrogen gas can be quickly diluted and exhausted, so the subsequent disassembly of the silicon single crystal pulling apparatus and the cleaning work in the exhaust gas piping It is possible to prevent ignition, combustion, and the like, which are likely to occur with the above.

【0026】また、排ガス配管内に発生外界の空気を導
入するには、前述のようにプルチャンバから入れること
もできるが、排ガス配管6のメインチャンバ3側入口付
近にリーク弁7を設けて、このリーク弁7を開放して外
界の空気を導入するようにしても良い。リーク弁7を設
けて空気を導入すると、単結晶棒取り出し用のプルチャ
ンバドア5を開閉するのに比べて、直接排ガス配管内に
空気を入れることができるとともに、簡単な操作で作業
することができ、効率的で作業時間も短縮できる利点が
ある。
In order to introduce the external air generated into the exhaust gas pipe, the air can be introduced from the pull chamber as described above. However, a leak valve 7 is provided near the inlet of the exhaust gas pipe 6 on the main chamber 3 side. The leak valve 7 may be opened to introduce outside air. When the air is introduced by providing the leak valve 7, the air can be directly introduced into the exhaust gas pipe, and the operation can be performed with a simple operation as compared with opening and closing the pull chamber door 5 for removing the single crystal rod. It has the advantage that it is efficient and the working time can be reduced.

【0027】さらに排ガス配管内に付着、堆積する活性
シリコン酸化物が少ないほど発火等の可能性が少ないた
め、排ガス配管内に活性シリコン酸化物が堆積しにくい
ように排ガスがスムーズに流れる配管構造が好ましく、
かつ、堆積したシリコン酸化物を除去するために排ガス
配管を清掃する回数が多いほど好ましい。しかし、単結
晶引上げ装置の周辺には不活性ガスの供給設備配管、排
ガス回収設備配管および冷却水配管等のユーティリティ
配管14が存在し、これら配管の流路が排ガス配管内の
排ガスのスムーズな流れを妨げないように配管すること
は困難であり、どうしても曲折した箇所が数箇所できて
しまう。そして、これらの曲折した部分(エルボ)に活
性シリコン酸化物が特に堆積し易い傾向があり、また、
清掃する場合に掃除用ブラシが通り難いために、清掃し
ても酸化物を除去しきれないことが多かった。また、例
えば真空ポンプ以降の排ガス配管の材質が塩ビ等の不導
体であると、静電気の発生により管内に堆積した活性シ
リコン酸化物が着火する心配もある。
Further, the less active silicon oxide that adheres and accumulates in the exhaust gas pipe, the lower the possibility of ignition, etc., so that a pipe structure in which the exhaust gas flows smoothly so that the active silicon oxide does not easily accumulate in the exhaust gas pipe. Preferably
Further, it is preferable that the number of times of cleaning the exhaust gas pipe to remove the deposited silicon oxide is larger. However, there are utility pipes 14 such as an inert gas supply facility pipe, an exhaust gas recovery facility pipe, and a cooling water pipe around the single crystal pulling apparatus, and the flow path of these pipes allows a smooth flow of the exhaust gas in the exhaust gas pipe. It is difficult to provide piping so as not to hinder the operation, and several bent parts are inevitably formed. Active silicon oxide tends to be particularly easily deposited on these bent portions (elbows).
Oxides cannot be completely removed by cleaning because the cleaning brush is difficult to pass when cleaning. Further, for example, when the material of the exhaust gas pipe after the vacuum pump is a non-conductive material such as PVC, there is a concern that active silicon oxide deposited in the pipe may be ignited due to generation of static electricity.

【0028】そこで本発明に関わるシリコン単結晶引上
げ装置における排ガス配管6は、例えばメインチャンバ
3から真空ポンプ11まではフレキシブル導体管8を使
用し、真空ポンプ11からブロア12までは導体管9を
使用し、共に接地アース10を設けている。また、各種
ユーティリティ配管14を回避するのに、エルボ13
(屈曲部)を出来るだけ使用せず、直管で配管した。止
むを得ず使用したエルボ13部分には盲蓋20を設けて
いる。
Therefore, the exhaust gas pipe 6 in the silicon single crystal pulling apparatus according to the present invention uses, for example, a flexible conductor pipe 8 from the main chamber 3 to the vacuum pump 11 and a conductor pipe 9 from the vacuum pump 11 to the blower 12. In both cases, a grounding earth 10 is provided. In order to avoid various utility pipes 14, an elbow 13
(Bent portion) was not used as much as possible, and was piped with a straight pipe. A blind lid 20 is provided on the elbow 13 which is unavoidably used.

【0029】また、本発明に関わるシリコン単結晶引上
げ装置における排ガス配管の発明では、ステンレス鋼
管、鋼管(SGP)、フレキシブル鋼管等を使用して、
配管全体を導体管で配管し、導体管に接地アースを設け
ておくようにした。このようにすれば、導体管内で発生
する恐れのある静電気を速やかに除去することができ、
これが原因で発火するようなこともない。
Further, in the invention of the exhaust gas piping in the silicon single crystal pulling apparatus according to the present invention, a stainless steel pipe, a steel pipe (SGP), a flexible steel pipe and the like are used.
The entire pipe was piped with a conductor pipe, and the conductor pipe was provided with a grounding earth. This makes it possible to quickly remove static electricity that may be generated in the conductor tube,
This does not cause a fire.

【0030】そしてこの場合、排ガス配管が継ぎ目のな
いシームレス管であることが好ましく、シームレス導体
管で配管した排ガス配管内には継ぎ目による凹凸や面粗
れがないので、特に継ぎ目位置に活性シリコン酸化物等
の粉塵が堆積する量を少なくすることができる。以上、
述べたような配管構造とすることで、発火、燃焼等が発
生する可能性は殆どなくなり、排ガス配管の安全性を保
持することができる。
In this case, it is preferable that the exhaust gas pipe is a seamless pipe without a seam. Since there is no unevenness or surface roughness due to the seam in the exhaust gas pipe formed by the seamless conductor pipe, the active silicon oxide is particularly located at the seam position. It is possible to reduce the amount of accumulation of dust such as objects. that's all,
With the piping structure described above, there is almost no possibility that ignition, combustion, or the like will occur, and the safety of the exhaust gas piping can be maintained.

【0031】さらに、排ガス配管のエルボ部分に盲蓋を
設けるのが好ましい。排ガス配管には曲折箇所が可能な
限り少なくなるように配管するが、止む無く屈折した配
管部分には、堆積した活性シリコン酸化物を除去し易い
ように配管のエルボ部分にT字型の継ぎ手を設け、その
開口部に開閉が容易な盲蓋を取り付けることで、管内清
掃作業時は、この盲蓋をはずして屈折部の清掃を容易に
行うことができるようにした。
Further, it is preferable to provide a blind cover at an elbow portion of the exhaust gas pipe. In the exhaust gas pipe, pipes are to be bent so as to have as few bends as possible, but in the pipe section that has been bent without interruption, a T-shaped joint is connected to the elbow of the pipe so that the deposited active silicon oxide can be easily removed. By providing a blind cover that can be easily opened and closed at the opening, the blind cover is removed during the cleaning operation in the pipe, so that the bending portion can be easily cleaned.

【0032】具体的な盲蓋とその開閉機構の一例を図3
に示した。この盲蓋とその開閉機構は、T字型継ぎ手の
開口部24に盲蓋20をかぶせ、クランプ21を盲蓋2
0に対して垂直に立て、押えネジ23を回して押え板2
2を盲蓋20に圧着して開口部24を閉じるようになっ
ている。開口は逆の手順で行うことができるワンタッチ
式の開閉機構である。
FIG. 3 shows an example of a specific blind lid and its opening / closing mechanism.
It was shown to. This blind lid and its opening / closing mechanism cover the opening 24 of the T-shaped joint with the blind lid 20 and connect the clamp 21 to the blind lid 2.
0, and turn the holding screw 23 to turn the holding plate 2
2 is pressed against the blind lid 20 to close the opening 24. Opening is a one-touch opening and closing mechanism that can be performed in the reverse order.

【0033】[0033]

【実施例】以下、本発明の実施例と比較例を挙げて本発
明を具体的に説明するが、本発明はこれらに限定される
ものではない。 (実施例)シリコン単結晶を引上げる前に排ガス配管の
途中にサンプリング用トラップ(密封可能な容器)を取
り付け、単結晶引上げ中にトラップ内面に活性シリコン
酸化物が堆積するようにした。シリコン単結晶の育成終
了後、結晶をプルチャンバ内に引上げ、ゲートバルブを
閉めた後、プルチャンバドアから結晶を取り出した。単
結晶引上げ装置内の石英ルツボ内に残余したシリコン融
液が固化して十分に冷却されるまで、メインチャンバ内
を大気圧のアルゴンガス雰囲気で密封して2時間程放置
した後、ゲートバルブとプルチャンバの単結晶取り出し
用ドアを10分間開放し、外界の空気を導入した。その
後、前記ドアを閉じて外界と遮断した後、引上げ装置の
排ガス配管に接続している真空ポンプにてプルチャンバ
およびメインチャンバ内の不活性ガス(Ar)と空気の
混合ガスを10分間ほど排気し、排ガス配管内の活性シ
リコン酸化物と空気とを徐々に反応させた。
EXAMPLES Hereinafter, the present invention will be described specifically with reference to Examples and Comparative Examples of the present invention, but the present invention is not limited to these. (Example) Before pulling up a silicon single crystal, a sampling trap (sealable container) was attached in the middle of an exhaust gas pipe, and active silicon oxide was deposited on the inner surface of the trap during pulling up the single crystal. After the growth of the silicon single crystal, the crystal was pulled into the pull chamber, the gate valve was closed, and the crystal was taken out from the pull chamber door. The main chamber is sealed in an argon gas atmosphere at atmospheric pressure until the silicon melt remaining in the quartz crucible in the single crystal pulling apparatus solidifies and is sufficiently cooled. The single crystal take-out door of the pull chamber was opened for 10 minutes, and outside air was introduced. Then, after the door is closed and shut off from the outside, a mixed gas of inert gas (Ar) and air in the pull chamber and the main chamber is exhausted for about 10 minutes by a vacuum pump connected to an exhaust gas pipe of the pulling device. The active silicon oxide in the exhaust gas pipe and the air were gradually reacted.

【0034】前記10分間の排気作業を終了した後、引
上げ装置内にArガスを導入し、前記サンプリング用ト
ラップを含む排ガス配管内と引上げ装置内を大気圧にし
た。その後、空気中の酸素と反応したシリコン酸化物を
含んだ炉内ガスを前記トラップ内に密封して採取し、該
トラップ内に純水を導入して反応させたところ、水素ガ
ス濃度がおよそ3800ppm(約0.38%)と検出
され、水素ガスの燃焼濃度範囲下限値の1/10以下と
なり、発火、燃焼等の可能性は殆どないことがわかっ
た。
After completing the evacuation operation for 10 minutes, Ar gas was introduced into the pulling device, and the inside of the exhaust gas pipe including the sampling trap and the inside of the pulling device were brought to atmospheric pressure. Thereafter, a furnace gas containing silicon oxide reacted with oxygen in the air was sealed in the trap and collected, and pure water was introduced into the trap to cause a reaction. The hydrogen gas concentration was about 3800 ppm. (About 0.38%), which is less than or equal to 1/10 of the lower limit of the combustion concentration range of the hydrogen gas, indicating that there is almost no possibility of ignition or combustion.

【0035】(比較例)シリコン単結晶を引上げる前に
排ガス配管の途中にサンプリング用トラップを取り付
け、単結晶引上げ中にトラップ内面に活性シリコン酸化
物が堆積するようにした。実施例と同様にしてシリコン
単結晶を引上げて取り出した後、単結晶引上げ装置内の
石英ルツボ内に残余したシリコン融液が固化して十分に
冷却されるまで、前記メインチャンバ内を大気圧のアル
ゴンガス雰囲気で密封して2時間程放置した後、ゲート
バルブを開き、プルチャンバとメインチャンバを切り離
して開放した。メインチャンバ内を開放して10分間程
経過した後、空気中の酸素と反応したシリコン酸化物を
含んだ炉内ガスをトラップ内に密封して採取し、トラッ
プ内に純水を導入して反応させたところ、水素ガス濃度
がおよそ19500ppm(約1.95%)と検出さ
れ、水素ガスの燃焼濃度範囲下限値の約1/2となっ
た。
(Comparative Example) Before the silicon single crystal was pulled, a sampling trap was installed in the exhaust gas pipe so that active silicon oxide was deposited on the inner surface of the trap during the single crystal pulling. After the silicon single crystal was pulled out and taken out in the same manner as in the example, the main chamber was kept at atmospheric pressure until the silicon melt remaining in the quartz crucible in the single crystal pulling apparatus was solidified and sufficiently cooled. After being sealed in an argon gas atmosphere and allowed to stand for about 2 hours, the gate valve was opened, and the pull chamber and the main chamber were separated and opened. After opening the main chamber for about 10 minutes, the furnace gas containing silicon oxide reacted with oxygen in the air is sealed in the trap and collected, and pure water is introduced into the trap to react. As a result, the hydrogen gas concentration was detected to be about 19500 ppm (about 1.95%), which was about 1/2 of the lower limit of the combustion concentration range of the hydrogen gas.

【0036】比較例において、実施例に比較して水素が
高濃度で検出された理由は、単にチャンバ内を開放した
だけでは、排ガス配管内に空気が十分流れ込まないた
め、活性シリコン酸化物の堆積層の表面だけが空気と反
応し、堆積層の内部には未反応の活性シリコン酸化物が
残存しているものと考えられる。従って、実施例のよう
にチャンバ内に導入した空気を少なくとも1回は真空ポ
ンプで排ガス配管を通して強制的に排気する工程が必要
である。
In the comparative example, the reason why hydrogen was detected at a higher concentration than that in the example is that simply opening the chamber does not allow sufficient air to flow into the exhaust gas pipe, so that active silicon oxide is deposited. It is considered that only the surface of the layer reacts with air, and unreacted active silicon oxide remains inside the deposition layer. Therefore, it is necessary to perform a step of forcibly exhausting the air introduced into the chamber through the exhaust gas pipe at least once using a vacuum pump as in the embodiment.

【0037】なお、本発明は、上記実施形態に限定され
るものではない。上記実施形態は、例示であり、本発明
の特許請求の範囲に記載された技術的思想と実質的に同
一な構成を有し、同様な作用効果を奏するものは、いか
なるものであっても本発明の技術的範囲に包含される。
The present invention is not limited to the above embodiment. The above embodiment is an exemplification, and has substantially the same configuration as the technical idea described in the scope of the claims of the present invention. It is included in the technical scope of the invention.

【0038】[0038]

【発明の効果】本発明によれば、チャンバを解体する前
に少なくとも1回、空気をチャンバおよび/または排ガ
ス配管内に導入し、外界と遮断した後、導入空気を強制
的に排気するので、排ガス配管内に堆積層を形成してい
る活性シリコン酸化物は導入空気と十分反応して不活性
化され、発生した水素ガスも速やかに希釈され排気され
る。従って、排ガス配管内を清掃する時等に活性シリコ
ン酸化物が発火したり、燃焼を起こしたりするようなこ
とはない。
According to the present invention, the air is introduced into the chamber and / or the exhaust gas pipe at least once before the chamber is disassembled, and the introduced air is forcibly exhausted after being shut off from the outside world. The active silicon oxide forming the deposited layer in the exhaust gas pipe reacts sufficiently with the introduced air to be inactivated, and the generated hydrogen gas is quickly diluted and exhausted. Therefore, the active silicon oxide does not ignite or burn when cleaning the inside of the exhaust gas pipe.

【0039】また、排ガス配管内に外界の空気を取り込
むためのリーク弁を設け、排ガス配管内に活性シリコン
酸化物が付着しにくく、かつ、静電気が発生しにくい導
体管で配管し、接地アースを設けた配管構造としたこと
で、排ガス配管内に容易に空気を取り込むことができ、
簡単に活性シリコン酸化物を不活性化することができる
ようになり、また静電気が原因で発火することもなくな
った。さらに、シームレス管を多用することで、活性シ
リコン酸化物が配管内に滞留したり付着、堆積しにくく
なった。そして、配管のエルボ部分にT字型継ぎ手を設
け、その開口部に開閉が容易な盲蓋を取り付けること
で、排ガス配管の清掃が簡単に行えるようになった。従
って、排ガス配管内に活性シリコン酸化物が堆積しにく
く、例え堆積したとしても、容易に不活性化することが
できるとともに、簡単に除去できるため、排ガス配管内
の清掃時にシリコン酸化物が発火したり燃焼したりする
ことは殆どない。
Further, a leak valve for taking in external air is provided in the exhaust gas pipe, and a pipe is formed with a conductor pipe in which active silicon oxide is hardly attached to the exhaust gas pipe and static electricity is hardly generated. With the piping structure provided, air can be easily taken into the exhaust gas piping,
The active silicon oxide can be easily passivated, and no longer ignites due to static electricity. Furthermore, the active silicon oxide is less likely to stagnate, adhere, or accumulate in the pipe by frequently using the seamless pipe. By providing a T-shaped joint at the elbow portion of the pipe and attaching a blind lid that can be easily opened and closed to the opening thereof, the exhaust gas pipe can be easily cleaned. Therefore, active silicon oxide does not easily accumulate in the exhaust gas pipe. Even if it accumulates, it can be easily deactivated and easily removed. It hardly burns or burns.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明のシリコン単結晶引上げ装置における排
ガス配管の一例を示す説明図である。
FIG. 1 is an explanatory view showing an example of an exhaust gas pipe in a silicon single crystal pulling apparatus of the present invention.

【図2】従来のシリコン単結晶引上げ装置における排ガ
ス配管を示す説明図である。
FIG. 2 is an explanatory view showing an exhaust gas pipe in a conventional silicon single crystal pulling apparatus.

【図3】盲蓋とその開閉機構の一例を示す説明図であ
る。
FIG. 3 is an explanatory view showing an example of a blind lid and an opening / closing mechanism thereof.

【符号の説明】[Explanation of symbols]

1…シリコン単結晶引上げ装置、 2…プルチャンバ、
3…メインチャンバ、 4…ゲートバルブ、 5…プル
チャンバドア、6…排ガス配管、 7…リーク弁、 8
…フレキシブル導体管、9…導体管、 10…接地アー
ス、 11…真空ポンプ、 12…ブロア、13…エル
ボ(屈曲部)、 14…ユーティリティ配管、15…排
気ボール弁、20…盲蓋、 21…クランプ(締め
具)、 22…押え板、23…押えネジ、 24…T字
型継ぎ手の開口部。
1 ... silicon single crystal pulling device 2 ... pull chamber
3 ... Main chamber, 4 ... Gate valve, 5 ... Pull chamber door, 6 ... Exhaust gas piping, 7 ... Leak valve, 8
... Flexible conductor tube, 9 ... Conductor tube, 10 ... Ground ground, 11 ... Vacuum pump, 12 ... Blower, 13 ... Elbow (bent part), 14 ... Utility piping, 15 ... Exhaust ball valve, 20 ... Blind lid, 21 ... Clamp (fastening), 22 ... holding plate, 23 ... holding screw, 24 ... opening of T-shaped joint.

───────────────────────────────────────────────────── フロントページの続き (72)発明者 上杉 敏治 福島県西白河郡西郷村大字小田倉字大平 150番地 信越半導体株式会社白河工場内 (72)発明者 森 隆 福井県武生市北府2丁目13番50号 信越半 導体株式会社武生工場内 Fターム(参考) 4G077 AA02 BA04 CF10 EG28 HA12 PA11 PA16 5F053 AA12 DD01 FF04 GG01 HH04 PP01 PP20 RR20  ──────────────────────────────────────────────────続 き Continuing on the front page (72) Inventor Toshiharu Uesugi 150 Odakura Osaikura, Nishigo-mura, Nishishirakawa-gun, Fukushima Prefecture Inside the Shirakawa Plant of Shin-Etsu Semiconductor Co., Ltd. No. Shin-Etsu Semiconductor Co., Ltd. Takefu Plant F-term (reference) 4G077 AA02 BA04 CF10 EG28 HA12 PA11 PA16 5F053 AA12 DD01 FF04 GG01 HH04 PP01 PP20 RR20

Claims (6)

【特許請求の範囲】[Claims] 【請求項1】 シリコン単結晶引上げ装置の解体方法で
あって、チャンバを解体する前に少なくとも1回、空気
をチャンバおよび/または排ガス配管内に導入し、外界
と遮断した後、導入空気を排気し、その後チャンバを解
体することを特徴とするシリコン単結晶引上げ装置の解
体方法。
1. A method for dismantling a silicon single crystal pulling apparatus, wherein air is introduced into a chamber and / or an exhaust gas pipe at least once before disassembling a chamber, and after shutting off from outside, the introduced air is exhausted. And then disassembling the chamber.
【請求項2】 前記空気の導入に排ガス配管のリーク弁
を使用することを特徴とする請求項1に記載したシリコ
ン単結晶引上げ装置の解体方法。
2. The disassembly method of a silicon single crystal pulling apparatus according to claim 1, wherein a leak valve of an exhaust gas pipe is used for introducing the air.
【請求項3】 シリコン単結晶引上げ装置における排ガ
ス配管であって、該排ガス配管にリーク弁を設けたこと
を特徴とするシリコン単結晶引上げ装置における排ガス
配管。
3. An exhaust gas pipe in a silicon single crystal pulling apparatus, wherein the exhaust gas pipe is provided with a leak valve.
【請求項4】 前記請求項3に記載した排ガス配管であ
って、配管全体を導体管で配管し、該導体管に接地アー
スを設けたことを特徴とするシリコン単結晶引上げ装置
における排ガス配管。
4. The exhaust gas pipe according to claim 3, wherein the entire pipe is piped with a conductor pipe, and the conductor pipe is provided with a grounding earth.
【請求項5】 前記排ガス配管が継ぎ目のないシームレ
ス管であることを特徴とする請求項3または請求項4に
記載したシリコン単結晶引上げ装置における排ガス配
管。
5. The exhaust gas pipe of the silicon single crystal pulling apparatus according to claim 3, wherein the exhaust gas pipe is a seamless pipe without a seam.
【請求項6】 前記排ガス配管のエルボ部分に盲蓋を設
けたことを特徴とする請求項3ないし請求項5のいずれ
か1項に記載したシリコン単結晶引上げ装置における排
ガス配管。
6. The exhaust gas pipe in the silicon single crystal pulling apparatus according to claim 3, wherein a blind lid is provided at an elbow portion of the exhaust gas pipe.
JP2000252610A 2000-08-23 2000-08-23 Disassembly method of silicon single crystal pulling apparatus and exhaust gas piping Expired - Lifetime JP3846620B2 (en)

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Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101044124B1 (en) * 2008-11-21 2011-06-28 주식회사 엘지실트론 Cleaning method and cleaning module for manufacturing apparatus for crystal ingot
JP2012066948A (en) * 2010-09-21 2012-04-05 Covalent Materials Corp Cleaning method of silicon single crystal pulling apparatus
CN109671641A (en) * 2017-10-17 2019-04-23 台湾积体电路制造股份有限公司 Semiconductor manufacturing equipment, coating equipment and its discharger
CN113966415A (en) * 2019-06-21 2022-01-21 胜高股份有限公司 Device and method for removing attached matter
JP7460010B1 (en) 2023-06-28 2024-04-02 信越半導体株式会社 Silicon single crystal manufacturing equipment

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101044124B1 (en) * 2008-11-21 2011-06-28 주식회사 엘지실트론 Cleaning method and cleaning module for manufacturing apparatus for crystal ingot
JP2012066948A (en) * 2010-09-21 2012-04-05 Covalent Materials Corp Cleaning method of silicon single crystal pulling apparatus
CN109671641A (en) * 2017-10-17 2019-04-23 台湾积体电路制造股份有限公司 Semiconductor manufacturing equipment, coating equipment and its discharger
CN109671641B (en) * 2017-10-17 2022-11-11 台湾积体电路制造股份有限公司 Semiconductor processing equipment, coating equipment and discharge device thereof
CN113966415A (en) * 2019-06-21 2022-01-21 胜高股份有限公司 Device and method for removing attached matter
CN113966415B (en) * 2019-06-21 2024-02-23 胜高股份有限公司 Attachment removing device and attachment removing method
JP7460010B1 (en) 2023-06-28 2024-04-02 信越半導体株式会社 Silicon single crystal manufacturing equipment

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