JP2002050792A - Semiconductor light-emitting diode - Google Patents

Semiconductor light-emitting diode

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Publication number
JP2002050792A
JP2002050792A JP2000233553A JP2000233553A JP2002050792A JP 2002050792 A JP2002050792 A JP 2002050792A JP 2000233553 A JP2000233553 A JP 2000233553A JP 2000233553 A JP2000233553 A JP 2000233553A JP 2002050792 A JP2002050792 A JP 2002050792A
Authority
JP
Japan
Prior art keywords
light emitting
semiconductor light
layer
emitting diode
emitting layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000233553A
Other languages
Japanese (ja)
Inventor
Kaoru Nakamura
薫 中村
Kenji Shibata
憲治 柴田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Cable Ltd
Original Assignee
Hitachi Cable Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Cable Ltd filed Critical Hitachi Cable Ltd
Priority to JP2000233553A priority Critical patent/JP2002050792A/en
Publication of JP2002050792A publication Critical patent/JP2002050792A/en
Pending legal-status Critical Current

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Abstract

PROBLEM TO BE SOLVED: To provide an epitaxial semiconductor light-emitting diode, where with no light loss at an upper electrode, current is fully supplied to the entire light-emitting layer for high luminance. SOLUTION: A semiconductor light-emitting diode is provided, which comprises a conductive substrate, an epitaxially grown semiconductor light- emitting layer, and a metal electrode. Here, the metal electrode is arranged so that the light emitted from the semiconductor light-emitting layer is reflected on the metal electrode, which travels to the outside. A metal electrode surface is, for example, tilted by 45 deg. with respect to the light-emitting layer.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は半導体発光ダイオー
ドに関し、特に、導電性基板上にエピタキシャル成長に
より成長した半導体発光層を有する半導体発光ダイオー
ドに関する。
The present invention relates to a semiconductor light emitting diode, and more particularly to a semiconductor light emitting diode having a semiconductor light emitting layer grown on a conductive substrate by epitaxial growth.

【0002】[0002]

【従来の技術】主に交通信号、自動車のブレーキランプ
やフォグランプ等の用途に対し、高輝度の半導体発光ダ
イオードの需要が大幅に伸びている。この半導体発光ダ
イオードは、エピタキシャル成長した半導体ウェハから
製造される。
2. Description of the Related Art The demand for high-luminance semiconductor light-emitting diodes is increasing significantly, mainly for applications such as traffic signals, brake lights and fog lights for automobiles. This semiconductor light emitting diode is manufactured from a semiconductor wafer that has been epitaxially grown.

【0003】図6は、従来の一般的な半導体発光ダイオ
ードの製造に用いられる、エピタキシャル半導体ウェハ
の構造を示す。GaAs基板61上に発光層62とウィ
ンドウ層63をエピタキシャル成長させたもので、エピ
タキシャル層の成長には一般に有機金属気相エピタキシ
ャル成長法(MOVPE)や液相エピタキシャル成長法
(LPE)が用いられる。n型GaAsから成る基板6
1の上の発光層62は、n型バッファ層62a、n型ク
ラッド層62b、アンドープ活性層62c、p型クラッ
ド層62dの4層から成る。ウィンドウ層63もエピタ
キシャル成長したp型導電層である。基板61はp型の
GaAsから成るものでもよく、その場合バッファ層6
2aとクラッド層62bはp型、クラッド層62dとウ
ィンドウ層63はn型とする。
FIG. 6 shows a structure of an epitaxial semiconductor wafer used for manufacturing a conventional general semiconductor light emitting diode. A light emitting layer 62 and a window layer 63 are epitaxially grown on a GaAs substrate 61. In general, an organic metal vapor phase epitaxy (MOVPE) or a liquid phase epitaxy (LPE) is used to grow the epitaxial layer. Substrate 6 made of n-type GaAs
The light emitting layer 62 above the first layer is composed of four layers: an n-type buffer layer 62a, an n-type cladding layer 62b, an undoped active layer 62c, and a p-type cladding layer 62d. The window layer 63 is also a p-type conductive layer epitaxially grown. The substrate 61 may be made of p-type GaAs, in which case the buffer layer 6
2a and the cladding layer 62b are p-type, and the cladding layer 62d and the window layer 63 are n-type.

【0004】図7は、このような半導体エピタキシャル
ウェハから製造される発光ダイオードの、従来一般的な
構造を示す。発光ダイオードは、半導体エピタキシャル
ウェハを加工したチップ(例えば、ダイシングにより加
工され、300X300マイクロメートル)と、その両面に設け
た電極で構成される。GaAs基板61上にエピタキシ
ャル成長させた発光層62とウィンドウ層63、ウィン
ドウ層63の上面に設けられた上部電極64、GaAs
基板の下面に設けられた下部電極65を有する。上部電
極64及び下部電極65から発光層62に電流を供給す
ると、発光層62内の、特に活性層が発光する。発生し
た光は、チップ上面の電極がない部分から外部に取り出
される。
FIG. 7 shows a conventional general structure of a light emitting diode manufactured from such a semiconductor epitaxial wafer. The light emitting diode is composed of a chip (for example, processed by dicing, 300 × 300 micrometers) obtained by processing a semiconductor epitaxial wafer, and electrodes provided on both surfaces thereof. A light emitting layer 62 and a window layer 63 epitaxially grown on a GaAs substrate 61; an upper electrode 64 provided on the upper surface of the window layer 63;
It has a lower electrode 65 provided on the lower surface of the substrate. When a current is supplied to the light emitting layer 62 from the upper electrode 64 and the lower electrode 65, the active layer in the light emitting layer 62 emits light. The generated light is extracted to the outside from the portion of the chip upper surface where there is no electrode.

【0005】図8は、従来のこのような半導体発光ダイ
オードの発光の状態を示す。電流は上部電極64直下の
位置に最も効率的に供給されるが、この位置には上部電
極64が存在し、発光は電極により反射されて、チップ
上面から外部に取り出すことができない。そのため光の
取り出し効率が低い。
FIG. 8 shows a light emitting state of such a conventional semiconductor light emitting diode. The current is most efficiently supplied to a position directly below the upper electrode 64, but the upper electrode 64 is present at this position, and light emission is reflected by the electrode and cannot be taken out from the upper surface of the chip. Therefore, the light extraction efficiency is low.

【0006】上部電極直下以外の発光層に電流が供給さ
れるのは上部電極の近傍に限られ、素子の外周寄りの部
分の発光層は、電流が充分供給されないので、機能しな
い。従って、発光ダイオード全体としての輝度が低い。
Current is supplied to the light emitting layer other than immediately below the upper electrode only in the vicinity of the upper electrode, and the light emitting layer near the outer periphery of the device does not function because the current is not sufficiently supplied. Therefore, the brightness of the entire light emitting diode is low.

【0007】図7に示す構造の従来の半導体発光ダイオ
ードは、このように、ウィンドウ層上部の金属電極によ
り発光光が遮られるため、光取り出し効率が低く、また
光が遮られない部分の発光層には充分な電流が供給され
ないので、この部分の輝度が低い。その結果、有効発光
面積が小さく、全体としての輝度が低い。
In the conventional semiconductor light emitting diode having the structure shown in FIG. 7, since the emitted light is blocked by the metal electrode on the window layer, the light extraction efficiency is low and the light emitting layer is not blocked. Is not supplied with a sufficient current, so that the brightness of this portion is low. As a result, the effective light emitting area is small, and the overall luminance is low.

【0008】図9は、別の構造をもつ従来の半導体発光
ダイオードを示す。この発光ダイオードは電流阻止部が
埋め込まれた構造(電流阻止部埋め込み構造)になって
いる。上部電極94直下のウィンドウ層93に電流阻止
部96が埋め込まれており、上部電極直下以外の部分の
発光層へ優先的に電流が供給されるようにしている。発
光光の上部電極94による損失も相対的に小さくなると
考えられている。しかし図7に示す構造と比べて上部電
極の面積、従って光の取り出しが可能な面積は変わらな
い。
FIG. 9 shows a conventional semiconductor light emitting diode having another structure. This light-emitting diode has a structure in which a current blocking portion is embedded (current blocking portion embedded structure). A current blocking portion 96 is buried in the window layer 93 directly below the upper electrode 94, so that current is preferentially supplied to the light emitting layer in a portion other than immediately below the upper electrode 94. It is considered that the loss of the emitted light due to the upper electrode 94 is also relatively small. However, as compared with the structure shown in FIG. 7, the area of the upper electrode, that is, the area from which light can be extracted does not change.

【0009】図10はさらに別の構造をもつ従来の半導
体発光ダイオードを示す。これは、上部電極64の形状
を変更して、上部電極の面積はできるだけ保ち、光の取
り出せる面積の拡大をはかっている。上部電極64の細
い枝の部分への電流の供給が充分行なわれないので、図
7の構造と比べて輝度は大して向上しない。
FIG. 10 shows a conventional semiconductor light emitting diode having another structure. This is done by changing the shape of the upper electrode 64, keeping the area of the upper electrode as much as possible, and expanding the area from which light can be extracted. Since the current is not sufficiently supplied to the thin branches of the upper electrode 64, the brightness is not much improved as compared with the structure of FIG.

【0010】[0010]

【発明が解決しようとする課題】図7の構造をもつ従来
の一般的な半導体発光ダイオードは、前述のように、ウ
ィンドウ層上の金属電極の存在により光取り出し効率が
低く、また有効な発光面積が小さいために全体としての
輝度が低い。
As described above, the conventional general semiconductor light emitting diode having the structure shown in FIG. 7 has a low light extraction efficiency due to the presence of the metal electrode on the window layer, and has an effective light emitting area. Is small, the overall luminance is low.

【0011】図9の電流阻止部埋め込み構造をもつ従来
の半導体発光ダイオードは、光の取り出しが可能な面積
において図7のものと変わりがない。
The conventional semiconductor light emitting diode having the current blocking portion buried structure of FIG. 9 is the same as that of FIG. 7 in the area from which light can be extracted.

【0012】図10の構造をもつ従来の半導体発光ダイ
オードも、図7の構造と比べて輝度の向上は小さい。
The conventional semiconductor light emitting diode having the structure shown in FIG. 10 also has a small improvement in luminance as compared with the structure shown in FIG.

【0013】本発明の目的は、上部電極による光の損失
がなく、かつ発光層全体に電流が充分供給されるため
に、高い発光輝度が得られる、エピタキシャル半導体発
光ダイオードを提供することにある。
It is an object of the present invention to provide an epitaxial semiconductor light emitting diode which has no light loss due to the upper electrode and which can supply a high current luminance to the entire light emitting layer so that high light emission luminance can be obtained.

【0014】[0014]

【課題を解決するための手段】本発明の半導体発光ダイ
オードは、上記目的を達成するため、基板上にエピタキ
シャル成長により成長した半導体発光層と、半導体発光
層の基板と反対側に設けた金属電極を有する半導体発光
ダイオードにおいて、金属電極は光反射性を有し、半導
体発光層から生じた光を反射して、所定の出射方向に出
射させるように配されていることを特徴とする。
In order to achieve the above object, a semiconductor light emitting diode according to the present invention comprises a semiconductor light emitting layer grown on a substrate by epitaxial growth, and a metal electrode provided on the opposite side of the semiconductor light emitting layer from the substrate. In the semiconductor light emitting diode, the metal electrode has light reflectivity, and is arranged so as to reflect light generated from the semiconductor light emitting layer and emit the light in a predetermined emission direction.

【0015】金属電極は、エピタキシャル成長した半導
体発光層の面に対し傾斜した面をもつように、設けられ
る。すなわち、金属電極の面の延長は、エピタキシャル
成長した半導体発光層の成長面と交わることができる。
The metal electrode is provided so as to have a surface inclined with respect to the surface of the semiconductor light emitting layer epitaxially grown. That is, the extension of the surface of the metal electrode can intersect with the growth surface of the semiconductor light emitting layer that has been epitaxially grown.

【0016】基板上にエピタキシャル成長により成長し
た半導体発光層をもつ半導体発光ダイオードは、一般
に、エピタキシャル成長した半導体発光層の上にウィン
ドウ層を有する。ウィンドウ層を、その上面(半導体発
光層から遠い面)が半導体発光層に対して斜めになるよ
うな形状にし、そこに金属電極を設ければ、金属電極
が、エピタキシャル成長した半導体発光層に対し傾斜し
た面をもつようにできる。
A semiconductor light emitting diode having a semiconductor light emitting layer grown on a substrate by epitaxial growth generally has a window layer on the semiconductor light emitting layer grown epitaxially. The window layer is shaped such that its upper surface (the surface far from the semiconductor light emitting layer) is inclined with respect to the semiconductor light emitting layer, and if a metal electrode is provided thereon, the metal electrode is inclined with respect to the epitaxially grown semiconductor light emitting layer. Can be made to have a flat surface.

【0017】金属電極は、半導体発光層の周縁を通って
半導体発光層に垂直な直線で囲まれた柱状体の断面を全
て覆うことができるような、面積および形状をもつこと
が好ましい。すなわち、ウィンドウ層の上面を半導体発
光層に対して斜めになるようにし、この面に金属電極を
設ける場合、金属電極がウィンドウ層の上面全体を覆う
ようにすることが、好ましい。
The metal electrode preferably has an area and a shape that can cover the entire cross section of the columnar body surrounded by a straight line passing through the periphery of the semiconductor light emitting layer and perpendicular to the semiconductor light emitting layer. That is, when the upper surface of the window layer is inclined with respect to the semiconductor light emitting layer and a metal electrode is provided on this surface, it is preferable that the metal electrode covers the entire upper surface of the window layer.

【0018】[0018]

【発明の実施の形態】図1は,本発明による半導体発光
ダイオード(素子)を示す。半導体発光ダイオードは、
基板1の上に、4層から成る薄いエピタキシャル半導体
発光層2、厚いウィンドウ層3、ウィンドウ層3の傾斜
した上面4に上部電極5、基板1のそれらと反対側に下
部電極6を有する。エピタキシャル半導体発光層2の厚
さは、例えば合計3マイクロメートル、ウィンドウ層3の厚さ
は、例えば200マイクロメートルである。ウィンドウ層3の上
面4は、エピタキシャル半導体発光層2と接する面3a
に対し45°傾斜している。図中、電流の流れの方向を
矢印で、光の進路を波形の矢印で、それぞれ示してあ
る。
FIG. 1 shows a semiconductor light emitting diode (element) according to the present invention. Semiconductor light emitting diodes
On the substrate 1, a thin epitaxial semiconductor light emitting layer 2 composed of four layers, a thick window layer 3, an upper electrode 5 on the inclined upper surface 4 of the window layer 3, and a lower electrode 6 on the opposite side of the substrate 1 are provided. The thickness of the epitaxial semiconductor light emitting layer 2 is, for example, 3 micrometers in total, and the thickness of the window layer 3 is, for example, 200 micrometers. The upper surface 4 of the window layer 3 has a surface 3 a in contact with the epitaxial semiconductor light emitting layer 2.
45 °. In the figure, the direction of current flow is indicated by arrows, and the path of light is indicated by waveform arrows.

【0019】図2は、本発明による半導体発光ダイオー
ドの製造に用いるエピタキシャルウェハの断面の詳細を
示す。n型GaAsから成る基板1の上のエピタキシャ
ル半導体発光層2は、n型GaAs/Teバッファ層2
a、n型AlGaAs/Teクラッド層2b、AlGa
As活性層2c、p型AlGaAs/Znクラッド層2
dの4層から成る。AlGaAs層2cはド−プされて
いない(/Te、/Zn等は、Zn、Te等でド−プさ
れていることを示す)。ウィンドウ層3はエピタキシャ
ル成長した導電層で、p型AlGaAs/Zn層であ
る。基板1はp型のGaAsから成るものでもよく、そ
の場合バッファ層2aとクラッド層2bはp型、クラッ
ド層2dとウィンドウ層3はn型とする。
FIG. 2 shows details of a cross section of an epitaxial wafer used for manufacturing a semiconductor light emitting diode according to the present invention. The epitaxial semiconductor light emitting layer 2 on the substrate 1 made of n-type GaAs is composed of an n-type GaAs / Te buffer layer 2
a, n-type AlGaAs / Te cladding layer 2b, AlGa
As active layer 2c, p-type AlGaAs / Zn clad layer 2
d. The AlGaAs layer 2c is not doped (/ Te, / Zn, etc. indicate that it is doped with Zn, Te, etc.). The window layer 3 is a conductive layer epitaxially grown and is a p-type AlGaAs / Zn layer. The substrate 1 may be made of p-type GaAs. In this case, the buffer layer 2a and the cladding layer 2b are p-type, and the cladding layer 2d and the window layer 3 are n-type.

【0020】本発明の半導体発光ダイオードは、以下の
ような方法で製造される。LPE法で、図2に示した断
面をもつエピタキシャルウェハを製作する。エピタキシ
ャルウェハからダイシングによりチップを製作する。チ
ップを45°傾けて固定し、ウィンドウ層3の部分を研
磨する。
The semiconductor light emitting diode of the present invention is manufactured by the following method. An epitaxial wafer having the cross section shown in FIG. 2 is manufactured by the LPE method. A chip is manufactured from the epitaxial wafer by dicing. The chip is fixed at an angle of 45 ° and the window layer 3 is polished.

【0021】図3は、45°傾斜したウィンドウ層の上
面を得るための、チップの研磨方法を示す。あるチップ
11のウィンドウ層3の上面3bが、隣のチップ12の
エピタキシャル半導体発光層2とウィンドウ層3との界
面3aと同じ平面内に位置するように、チップを45°
傾けて固定し、図3に示すようにウィンドウ層3を平面
に研磨する。
FIG. 3 shows a method of polishing a chip to obtain a top surface of a window layer inclined at 45 °. The chip is set at 45 ° so that the upper surface 3b of the window layer 3 of a certain chip 11 is located in the same plane as the interface 3a between the epitaxial semiconductor light emitting layer 2 and the window layer 3 of the adjacent chip 12.
The window layer 3 is polished to a flat surface as shown in FIG.

【0022】45°傾斜したウィンドウ層3の上面4に
上部電極5、例えばAuZn−Ni−Au積層電極を蒸
着し、基板1の下面に下部電極6、例えばAuGe電極
を蒸着すると、図1に示す半導体発光ダイオード素子が
できあがる。
When an upper electrode 5, for example, an AuZn—Ni—Au laminated electrode is deposited on the upper surface 4 of the window layer 3 inclined at 45 °, and a lower electrode 6, for example, an AuGe electrode is deposited on the lower surface of the substrate 1, as shown in FIG. A semiconductor light emitting diode device is completed.

【0023】[0023]

【実施例】以下に、実施例により本発明の効果を具体的
に示す。LPE法で、図2に示した断面をもつエピタキ
シャルウェハを製作し、ダイシングにより一辺200マイ
クロメートルの正方形のチップを製作した。図3に示すように
ウィンドウ層3を垂直方向で140マイクロメートルの厚さだけ
平面に研磨し、研磨した面(ウィンドウ層3の上面4)
に上部電極5としてAuZn−Ni−Au積層電極を、
基板1の下面に下部電極6としてAuGe電極を、それ
ぞれ蒸着し、図1に示す半導体発光ダイオード素子を得
た。
EXAMPLES The effects of the present invention will be specifically described below with reference to examples. An epitaxial wafer having the cross section shown in FIG. 2 was manufactured by the LPE method, and a square chip having a side of 200 μm was manufactured by dicing. As shown in FIG. 3, the window layer 3 is polished to a flat surface by a thickness of 140 micrometers in the vertical direction, and the polished surface (the upper surface 4 of the window layer 3)
An AuZn—Ni—Au laminated electrode as the upper electrode 5,
An AuGe electrode was deposited as a lower electrode 6 on the lower surface of the substrate 1 to obtain a semiconductor light emitting diode device shown in FIG.

【0024】比較のため、本発明の半導体発光ダイオー
ド素子Aのほかに、図7に示す一般的構造のエピタキシ
ャル半導体発光ダイオードB、図10に示す上部電極の
形状を変えたもの(C)、図9に示す電流阻止部埋め込
み構造のエピタキシャル半導体発光ダイオードDも、そ
れぞれ製作した。チップの寸法はいずれも一辺200マイ
クロメートルの正方形、上部電極は直径130マイクロメートルの円形
とした。
For comparison, in addition to the semiconductor light-emitting diode element A of the present invention, an epitaxial semiconductor light-emitting diode B having a general structure shown in FIG. 7 and a structure (C) in which the shape of the upper electrode shown in FIG. The epitaxial semiconductor light emitting diodes D having a current blocking portion embedded structure shown in FIG. 9 were also manufactured. The size of each chip was a square with a side of 200 micrometers, and the upper electrode was a circle with a diameter of 130 micrometers.

【0025】本発明の半導体発光ダイオード素子A、従
来の半導体発光ダイオード素子B,C,Dの性能を比較
するため、発光輝度を測定した。
In order to compare the performance of the semiconductor light emitting diode device A of the present invention and the conventional semiconductor light emitting diode devices B, C and D, the emission luminance was measured.

【0026】図4は、本発明および従来の半導体発光ダ
イオード素子の発光輝度を示す。上部電極の形状を変え
た素子Cおよび電流阻止部埋め込み構造の素子Dは、一
般的構造のエピタキシャル半導体発光ダイオードBの約
1.2ないし1.4倍程度であるが、本発明の半導体発光ダ
イオード素子Aは従来の半導体発光ダイオード素子Bの
約2倍の発光輝度を示した。
FIG. 4 shows the light emission luminance of the present invention and the conventional semiconductor light emitting diode device. The device C in which the shape of the upper electrode is changed and the device D having the current blocking portion embedded structure are about 1.2 to 1.4 times as large as the epitaxial semiconductor light emitting diode B having a general structure. The device A exhibited a light emission luminance approximately twice that of the conventional semiconductor light emitting diode device B.

【0027】図5は、半導体発光ダイオード素子A,
B,C,Dの光取り出し可能部の面積を示す。電流阻止
部埋め込み構造の素子Dは一般的構造の発光素子Bと同
じ、上部電極の形状を変えた素子Cは素子Bの1.1倍
であるのに対し、本発明の発光ダイオード素子Aは素子
Bの1.3倍である。従来の発光素子は光取り出しが可
能な部分での発光が弱い(電流阻止部埋め込み構造の素
子Dでも発光は主に電極近傍である)のに対し、本発明
の発光素子は発光層全体の発光を取り出せるため、発光
量の差がさらに大きくなる(図4参照)。
FIG. 5 shows a semiconductor light emitting diode element A,
The area of the light-extractable portions B, C, and D is shown. The element D having the current blocking portion embedded structure is the same as the light emitting element B having the general structure. The element C having the shape of the upper electrode is 1.1 times the element B, whereas the light emitting diode element A according to the present invention has the same structure. It is 1.3 times that of the element B. Whereas the conventional light emitting device has weak light emission at a portion from which light can be extracted (even in the device D having the current blocking portion embedded structure, light emission is mainly near the electrodes), whereas the light emitting device of the present invention has light emission of the entire light emitting layer. Can be taken out, so that the difference in the amount of light emission is further increased (see FIG. 4).

【0028】[0028]

【発明の効果】本発明によれば、上部電極による光の損
失が避けられ、また発光層全体に電流が充分供給される
ので、発光輝度の高いエピタキシャル半導体発光ダイオ
ードを得ることができる。
According to the present invention, light loss due to the upper electrode can be avoided, and sufficient current can be supplied to the entire light emitting layer, so that an epitaxial semiconductor light emitting diode having high light emission luminance can be obtained.

【0029】本発明の半導体発光ダイオードは、基板上
にエピタキシャル成長により成長した半導体発光層と、
半導体発光層の、基板と反対側に設けた金属電極を有す
る半導体発光ダイオードにおいて、金属電極が光反射性
を有し、半導体発光層から生じた光を反射して、所定の
方向に出射させるように配置されているため、半導体発
光層から生じた光を、金属電極に遮られることなく外部
に取り出すことができる。
A semiconductor light emitting diode according to the present invention comprises: a semiconductor light emitting layer grown on a substrate by epitaxial growth;
In a semiconductor light emitting diode having a metal electrode provided on a side opposite to a substrate of a semiconductor light emitting layer, the metal electrode has light reflectivity, and reflects light generated from the semiconductor light emitting layer to emit light in a predetermined direction. The light generated from the semiconductor light emitting layer can be extracted outside without being blocked by the metal electrode.

【0030】また本発明の半導体発光ダイオードは、発
光層からの光が金属電極に遮られずに外部に取り出せる
構造になっているため、発光層に電流を供給するための
金属電極の面積が制約を受けず、発光層の全体にわたり
電流が充分供給されるので、高い発光輝度が得られる。
従来の同種の半導体発光ダイオードでは発光層からの光
が金属電極に遮られる構造であるため、金属電極の面積
が制限され、発光層の有効に発光する部分の面積が小さ
かったのに対し、本発明の半導体発光ダイオードの構造
では、金属電極の面積が発光層の広い部分、あるいは全
体を占めるような大きさにすることができる。
Further, since the semiconductor light emitting diode of the present invention has a structure in which light from the light emitting layer can be extracted outside without being blocked by the metal electrode, the area of the metal electrode for supplying current to the light emitting layer is limited. The current is sufficiently supplied to the entire light emitting layer without receiving the light, so that high light emission luminance can be obtained.
Conventional semiconductor light-emitting diodes of the same type have a structure in which light from the light-emitting layer is blocked by the metal electrode, so the area of the metal electrode is limited and the area of the light-emitting layer where light is effectively emitted is small. In the structure of the semiconductor light emitting diode of the present invention, the area of the metal electrode can be made large so as to occupy a wide portion or the whole of the light emitting layer.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明による半導体発光ダイオード(素子)の
説明図。
FIG. 1 is an explanatory view of a semiconductor light emitting diode (element) according to the present invention.

【図2】本発明による半導体発光ダイオードの製造に用
いるエピタキシャルウェハの断面説明図。
FIG. 2 is an explanatory sectional view of an epitaxial wafer used for manufacturing a semiconductor light emitting diode according to the present invention.

【図3】チップのウィンドウ層の研磨方法を示す断面説
明図。
FIG. 3 is an explanatory sectional view showing a method of polishing a window layer of a chip.

【図4】本発明および従来の半導体発光ダイオード素子
の発光輝度を示すグラフ。
FIG. 4 is a graph showing light emission luminances of the present invention and a conventional semiconductor light emitting diode device.

【図5】半導体発光ダイオード素子の光取り出し可能部
の面積を示すグラフ。
FIG. 5 is a graph showing an area of a light-extractable portion of the semiconductor light-emitting diode element.

【図6】従来の半導体発光ダイオードの製造に用いられ
る、エピタキシャル半導体ウェハの構造を示す説明図。
FIG. 6 is an explanatory view showing a structure of an epitaxial semiconductor wafer used for manufacturing a conventional semiconductor light emitting diode.

【図7】従来の半導体発光ダイオードの構造を示す説明
図。
FIG. 7 is an explanatory view showing the structure of a conventional semiconductor light emitting diode.

【図8】従来の半導体発光ダイオードの発光の状態を示
す説明図。
FIG. 8 is an explanatory diagram showing a light emitting state of a conventional semiconductor light emitting diode.

【図9】従来の半導体発光ダイオードと、その発光の状
態を示す、説明図。
FIG. 9 is an explanatory diagram showing a conventional semiconductor light emitting diode and its light emitting state.

【図10】従来の半導体発光ダイオードの構造を示す説
明図。
FIG. 10 is an explanatory view showing the structure of a conventional semiconductor light emitting diode.

【符号の説明】[Explanation of symbols]

1 基板 2 エピタキシャル半導体発光層 2a n型GaAs/Teバッファ層 2b n型AlGaAs/Teクラッド層 2c AlGaAs活性層 2d p型AlGaAs/Znクラッド層 3 ウィンドウ層 3a エピタキシャル半導体発光層とウィンドウ層との
界面 3b ウィンドウ層の上面 4 傾斜したウィンドウ層の上面 5 上部電極 6 下部電極 11 チップ 12 チップ 61 GaAs基板 62 発光層 62a n型バッファ層 62b n型クラッド層 62c アンドープ活性層 62d p型クラッド層 63 ウィンドウ層 64 上部電極 65 下部電極 93 ウィンドウ層 94 上部電極 96 電流阻止部
Reference Signs List 1 substrate 2 epitaxial semiconductor light emitting layer 2a n-type GaAs / Te buffer layer 2b n-type AlGaAs / Te cladding layer 2c AlGaAs active layer 2d p-type AlGaAs / Zn cladding layer 3 window layer 3a interface between epitaxial semiconductor light emitting layer and window layer 3b Upper surface of window layer 4 Upper surface of inclined window layer 5 Upper electrode 6 Lower electrode 11 Chip 12 Chip 61 GaAs substrate 62 Light emitting layer 62a N-type buffer layer 62b N-type cladding layer 62c Undoped active layer 62d P-type cladding layer 63 Window layer 64 Upper electrode 65 Lower electrode 93 Window layer 94 Upper electrode 96 Current blocking portion

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】 基板上にエピタキシャル成長によ
り成長した半導体発光層と、この半導体発光層の、前記
基板の反対側に設けた金属電極を有する、半導体発光ダ
イオードにおいて、 前記金属電極は光反射性を有し、前記半導体発光層から
生じた光を反射して、所定の出射方向に出射させるよう
に配置されていることを特徴とする、半導体発光ダイオ
ード。
1. A semiconductor light emitting diode comprising: a semiconductor light emitting layer grown on a substrate by epitaxial growth; and a metal electrode provided on the side of the semiconductor light emitting layer opposite to the substrate, wherein the metal electrode has light reflectivity. The semiconductor light emitting diode is arranged so as to reflect light generated from the semiconductor light emitting layer and emit the light in a predetermined emission direction.
【請求項2】 前記金属電極が、前記エピタキシ
ャル成長した半導体発光層の面に対し傾斜した面をもつ
ように設けられる請求項1の半導体発光ダイオード。
2. The semiconductor light emitting diode according to claim 1, wherein said metal electrode is provided so as to have a surface inclined with respect to a surface of said epitaxially grown semiconductor light emitting layer.
【請求項3】 前記金属電極が、前記半導体発光
層の周縁を通って前記半導体発光層に垂直な直線で囲ま
れた柱状体の断面を全て覆うことができる形状を、もつ
ことを特徴とする、請求項1または2の半導体発光ダイ
オード。
3. The semiconductor device according to claim 2, wherein the metal electrode has a shape capable of covering the entire cross section of the columnar body surrounded by a straight line perpendicular to the semiconductor light emitting layer through the periphery of the semiconductor light emitting layer. The semiconductor light emitting diode according to claim 1 or 2.
【請求項4】 基板上にエピタキシャル成長によ
り成長した半導体発光層と、この半導体発光層の上に設
けられたウィンドウ層と、このウィンドウ層の上に設け
られた金属電極を有する、半導体発光ダイオードにおい
て、 前記ウィンドウ層の前記金属電極を設けた面は、前記半
導体発光層に対し傾斜しており、 前記金属電極は光反射性を有し、前記半導体発光層から
生じた光を反射して、所定の出射方向に出射させるよう
に配されていることを特徴とする、半導体発光ダイオー
ド。
4. A semiconductor light emitting diode comprising: a semiconductor light emitting layer grown on a substrate by epitaxial growth; a window layer provided on the semiconductor light emitting layer; and a metal electrode provided on the window layer. The surface of the window layer on which the metal electrode is provided is inclined with respect to the semiconductor light emitting layer. The metal electrode has light reflectivity, reflects light generated from the semiconductor light emitting layer, and has a predetermined shape. A semiconductor light emitting diode, which is arranged to emit light in an emission direction.
【請求項5】 前記金属電極は、前記ウィンドウ
層の全面を覆うように設けられていることを特徴とす
る、請求項4の半導体発光ダイオード。
5. The semiconductor light emitting diode according to claim 4, wherein said metal electrode is provided so as to cover the entire surface of said window layer.
JP2000233553A 2000-08-01 2000-08-01 Semiconductor light-emitting diode Pending JP2002050792A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000233553A JP2002050792A (en) 2000-08-01 2000-08-01 Semiconductor light-emitting diode

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000233553A JP2002050792A (en) 2000-08-01 2000-08-01 Semiconductor light-emitting diode

Publications (1)

Publication Number Publication Date
JP2002050792A true JP2002050792A (en) 2002-02-15

Family

ID=18726058

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000233553A Pending JP2002050792A (en) 2000-08-01 2000-08-01 Semiconductor light-emitting diode

Country Status (1)

Country Link
JP (1) JP2002050792A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7589355B2 (en) 2005-06-10 2009-09-15 Sony Corporation Light emitting diode, method of manufacturing light emitting diode, light emitting diode backlight, light emitting diode illuminating device, light emitting diode display, and electronic apparatus
JP2010135678A (en) * 2008-12-08 2010-06-17 Toshiba Corp Optical semiconductor device and method of manufacturing optical semiconductor device
US9705040B2 (en) 2014-11-13 2017-07-11 Samsung Electronics Co., Ltd. Light-emitting device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7589355B2 (en) 2005-06-10 2009-09-15 Sony Corporation Light emitting diode, method of manufacturing light emitting diode, light emitting diode backlight, light emitting diode illuminating device, light emitting diode display, and electronic apparatus
JP2010135678A (en) * 2008-12-08 2010-06-17 Toshiba Corp Optical semiconductor device and method of manufacturing optical semiconductor device
US9705040B2 (en) 2014-11-13 2017-07-11 Samsung Electronics Co., Ltd. Light-emitting device

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