JP2002048673A5 - - Google Patents
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- JP2002048673A5 JP2002048673A5 JP2000236748A JP2000236748A JP2002048673A5 JP 2002048673 A5 JP2002048673 A5 JP 2002048673A5 JP 2000236748 A JP2000236748 A JP 2000236748A JP 2000236748 A JP2000236748 A JP 2000236748A JP 2002048673 A5 JP2002048673 A5 JP 2002048673A5
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- JP
- Japan
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Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000236748A JP4768904B2 (en) | 2000-08-04 | 2000-08-04 | Method for measuring physical quantity of optical element or optical system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000236748A JP4768904B2 (en) | 2000-08-04 | 2000-08-04 | Method for measuring physical quantity of optical element or optical system |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2002048673A JP2002048673A (en) | 2002-02-15 |
| JP2002048673A5 true JP2002048673A5 (en) | 2007-09-27 |
| JP4768904B2 JP4768904B2 (en) | 2011-09-07 |
Family
ID=18728747
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000236748A Expired - Fee Related JP4768904B2 (en) | 2000-08-04 | 2000-08-04 | Method for measuring physical quantity of optical element or optical system |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP4768904B2 (en) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4000086B2 (en) * | 2003-04-17 | 2007-10-31 | 株式会社トーメーコーポレーション | Measuring method and measuring device for basic data of lens |
| JP2004325880A (en) * | 2003-04-25 | 2004-11-18 | Olympus Corp | Design method of optical system |
| JP5721420B2 (en) * | 2010-12-17 | 2015-05-20 | キヤノン株式会社 | Measuring method and measuring device |
| JP6029429B2 (en) * | 2012-11-19 | 2016-11-24 | キヤノン株式会社 | Wavefront aberration measuring method, wavefront aberration measuring apparatus, and optical system manufacturing method |
| JPWO2022224344A1 (en) * | 2021-04-20 | 2022-10-27 | ||
| CN115436016B (en) * | 2022-07-29 | 2024-04-12 | 中国人民解放军32181部队 | Integrated test evaluation method for zooming and penetrating capacity of laser destroying equipment |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05226228A (en) * | 1992-02-14 | 1993-09-03 | Fujitsu Ltd | X-ray generation apparatus and optical-axis alignment method of x-ray reflector |
| JP3597222B2 (en) * | 1993-09-01 | 2004-12-02 | オリンパス株式会社 | Eccentricity measurement method for lenses, reflectors, etc., and machines using it |
| US6747702B1 (en) * | 1998-12-23 | 2004-06-08 | Eastman Kodak Company | Apparatus and method for producing images without distortion and lateral color aberration |
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2000
- 2000-08-04 JP JP2000236748A patent/JP4768904B2/en not_active Expired - Fee Related