JP2001264974A - Phenolic resin for photoresist - Google Patents

Phenolic resin for photoresist

Info

Publication number
JP2001264974A
JP2001264974A JP2000073451A JP2000073451A JP2001264974A JP 2001264974 A JP2001264974 A JP 2001264974A JP 2000073451 A JP2000073451 A JP 2000073451A JP 2000073451 A JP2000073451 A JP 2000073451A JP 2001264974 A JP2001264974 A JP 2001264974A
Authority
JP
Japan
Prior art keywords
region
area
cresol
reaction
molecular weight
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000073451A
Other languages
Japanese (ja)
Inventor
Kazuo Nakanishi
一雄 中西
Osamu Onishi
治 大西
Hiroshi Nishisako
宏志 西佐古
Yasushi Arita
靖 有田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Durez Co Ltd
Original Assignee
Sumitomo Durez Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Durez Co Ltd filed Critical Sumitomo Durez Co Ltd
Priority to JP2000073451A priority Critical patent/JP2001264974A/en
Publication of JP2001264974A publication Critical patent/JP2001264974A/en
Pending legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To provide a phenolic resin for a high resolution photoresist having both high heat resistance and high sensitivity. SOLUTION: The phenolic resin is obtained by reacting specified phenols with formaldehyde and/or p-formaldehyde in the presence of an acidic catalyst and has a weight average molecular weight of 1,500-15,000. The following regions (A), (B) and (C) of the resin are 10-45%, 35-85% and 0-40%, respectively, and the area ratio of (the region B)+(the region C) to the region A is 1.2-4.5. The sum of the regions (A), (B) and (C) is 100%. The region (A) is the area of the molecular weight range of 150 to <500 (with the exception of free phenols), the region (B) is the area of the molecular weight range of 500 to <5,000 and the region (C) is the area of the molecular weight range of >=5,000.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、半導体やLCDな
どを製造する際のリソグラフィ−に使用されるフォトレ
ジストのベ−ス樹脂として使用され、高耐熱性、高解像
度、高感度であるフォトレジストの製造を可能にするフ
ォトレジスト用フェノ−ル樹脂に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a photoresist having high heat resistance, high resolution and high sensitivity, which is used as a base resin of a photoresist used for lithography in manufacturing semiconductors and LCDs. The present invention relates to a phenolic resin for a photoresist which enables the production of a phenol resin.

【0002】[0002]

【従来の技術】一般にポジ型フォトレジストにはナフト
キノンジアジド化合物等のキノンジアジド基を有する感
光剤とアルカリ可溶性樹脂(例えば、ノボラック型フェ
ノ−ル樹脂)が用いられている。このような組成からな
るポジ型フォトレジストは、露光後にアルカリ溶液によ
る現像によって高い解像力を示し、IC、LSI等の半
導体製造、LCDなどの回路基材の製造に利用されてい
る。またノボラック型フェノ−ル樹脂は露光後のプラズ
マドライエッチングに対し、芳香環を多く持つ構造に起
因する高い耐熱性も有しており、これまでノボラック型
フェノ−ル樹脂とナフトキノンジアジド系感光剤とを含
有する数多くのポジ型フォトレジストが開発され実用化
され、大きな成果を挙げてきている。
2. Description of the Related Art Generally, a positive type photoresist uses a photosensitive agent having a quinonediazide group such as a naphthoquinonediazide compound and an alkali-soluble resin (for example, a novolak phenol resin). Positive photoresists having such a composition exhibit high resolution by exposure to an alkaline solution after exposure, and are used in the manufacture of semiconductors such as ICs and LSIs and the manufacture of circuit substrates such as LCDs. In addition, novolak type phenolic resin also has high heat resistance to plasma dry etching after exposure due to the structure having many aromatic rings, so far novolak type phenolic resin and naphthoquinonediazide-based photosensitizer Numerous positive photoresists containing have been developed and put into practical use, and have achieved great results.

【0003】ポジ型フォトレジスト用フェノール樹脂と
して、メタクレゾール・パラクレゾ−ルとホルムアルデ
ヒドを酸性触媒の存在下で反応させて得られたノボラッ
ク型フェノ−ル樹脂が一般的に使用されている。そし
て、フォトレジストの特性を調整または向上させるため
に、フェノ−ル樹脂中のメタクレゾール・パラクレゾ−
ルの比率や分子量、分子量分布などの検討がなされ、半
導体やLCDなどのリソグラフィー技術に適用されてき
た。しかし近年、LSIの高集積化に伴い、更なる高精
度微細パターンの形成が必要になってきている。そのた
め、フォトレジストに対して種々の特性を向上するよう
要求が高まっている。半導体用フォトレジストの分野で
は、高耐熱性,高解像度,高感度などの特性が要求され
ており、高耐熱化のためにアルキルフェノ−ル類や芳香
族アルデヒドなどのモノマ−の適用が検討され、高感度
化のためにヒドロキシベンズアルデヒドなどの検討例が
ある。しかしいずれも、若干の向上は見られるものの、
飛躍的な効果は得られていない。
As a phenol resin for a positive photoresist, a novolak phenol resin obtained by reacting metacresol / paracresol with formaldehyde in the presence of an acidic catalyst is generally used. Then, in order to adjust or improve the characteristics of the photoresist, meta-cresol / para-cresol in phenol resin is used.
The ratio, molecular weight, molecular weight distribution, and the like of the metal have been studied and applied to lithography techniques such as semiconductors and LCDs. However, in recent years, with higher integration of LSIs, it has become necessary to form finer patterns with higher precision. Therefore, there is an increasing demand for photoresists to improve various characteristics. In the field of photoresists for semiconductors, characteristics such as high heat resistance, high resolution, and high sensitivity are required, and applications of monomers such as alkylphenols and aromatic aldehydes are being studied to increase the heat resistance. There are examples of studies on hydroxybenzaldehyde for increasing the sensitivity. However, in each case, although a slight improvement is seen,
No dramatic effect has been obtained.

【0004】高解像度化のためには、分子構造制御の観
点からフェノ−ル樹脂の結合基が芳香環のオルソ−オル
ソ位で結合した構造を多く含むハイオルソ樹脂を適用し
た例がある。この樹脂を使用した場合、高解像度化は図
れるものの、耐熱性が低下することと感度が悪くなるな
どの欠点が発生し、実用化には至っていない。また、種
々のモノマー類が検討された例はあるが、いずれも一長
一短があり実用化まで至っていない。
In order to increase the resolution, there is an example in which a high-ortho resin containing a large number of structures in which a bonding group of a phenol resin is bonded at an ortho-ortho position of an aromatic ring is used from the viewpoint of controlling the molecular structure. When this resin is used, high resolution can be achieved, but disadvantages such as a decrease in heat resistance and a decrease in sensitivity occur, and the resin has not been put to practical use. In addition, there are examples in which various monomers have been studied, but all of them have advantages and disadvantages and have not been put to practical use.

【0005】[0005]

【発明が解決しようとする課題】本発明の目的は、高耐
熱性・高解像度・高感度を兼ね備えたフォトレジストの
製造を可能にするフォトレジスト用フェノ−ル樹脂を提
供することである。本発明者は、ベ−ス樹脂となるフェ
ノ−ル樹脂において、フォトレジストの耐熱性向上のた
めには、高密度な三次元分子構造が好ましく、解像度、
感度向上のためには、分子の末端部分に感光剤との相互
作用が高いフェノール化合物を結合させて感光剤との相
互作用を有効に発現させることがよい分子構造であると
考えた。本発明は、感光剤との相互作用が強いキシレノ
ール、トリメチルフェノール類のうち、ホルマリンとの
重縮合反応において1官能性のフェノールを適用するこ
とにより、末端に感光剤との相互作用の高いフェノール
化合物を効率よく配置することができ、望ましい分子構
造を得ることが可能との知見を得、さらに鋭意研究を行
なった結果として完成されたものである。
SUMMARY OF THE INVENTION An object of the present invention is to provide a phenolic resin for a photoresist which enables the production of a photoresist having high heat resistance, high resolution and high sensitivity. The present inventors have proposed that a phenolic resin serving as a base resin preferably has a high-density three-dimensional molecular structure in order to improve the heat resistance of a photoresist, and has a high resolution and a high resolution.
In order to improve the sensitivity, it was considered that the molecular structure should be such that a phenol compound having a high interaction with the photosensitizer is bonded to the terminal portion of the molecule to effectively express the interaction with the photosensitizer. The present invention provides a phenol compound having a high interaction with a photosensitizer at the end by applying a monofunctional phenol in a polycondensation reaction with formalin, among xylenol and trimethylphenols having a strong interaction with a photosensitizer. Have been found to be able to be efficiently arranged and a desirable molecular structure can be obtained, and as a result of further intensive studies, they have been completed.

【0006】[0006]

【課題を解決するための手段】本発明は、メタクレゾー
ル30−70重量%,パラクレゾール1−50重量%及
び2,4−キシレノール、2,6−キシレノール、2,
3,6−トリメチルフェノールの1種以上からなる1官
能性フェノール1−50重量%からなるフェノール類
と、ホルムアルデヒド及び/又はパラホルムアルデヒド
からなるアルデヒド類とを酸性触媒のもとで反応させて
得られる重量平均分子量が1500−15000のフェ
ノール樹脂であって、下記(A)領域が10−45%、
(B)領域が35−85%、(C)領域が0−40%で
あり、かつ(B領域+C領域)/A領域の面積比が1.
2−4.5であることを特徴とするフォトレジスト用フ
ェノール樹脂である。ただし、(A)領域、(B)領域
及び(C)領域の合計は100%である。(A)領域は
分子量が150以上500未満(遊離のフェノール類を
除く)の範囲の面積であり、(B)領域は分子量が50
0以上5000未満の範囲の面積であり、(C)領域は
分子量が5000以上の範囲の面積である。
SUMMARY OF THE INVENTION The present invention relates to a method for preparing 30-70% by weight of meta-cresol, 1-50% by weight of para-cresol and 2,4-xylenol, 2,6-xylenol,
It is obtained by reacting a phenol comprising 1 to 50% by weight of a monofunctional phenol comprising at least one kind of 3,6-trimethylphenol with an aldehyde comprising formaldehyde and / or paraformaldehyde under an acidic catalyst. A phenol resin having a weight average molecular weight of 1500 to 15000, wherein the following (A) region is 10 to 45%,
The (B) region is 35-85%, the (C) region is 0-40%, and the area ratio of (B region + C region) / A region is 1.
It is a phenol resin for photoresists, which is 2-4.5. However, the total of the area (A), the area (B) and the area (C) is 100%. The (A) region is an area having a molecular weight of 150 or more and less than 500 (excluding free phenols), and the (B) region has a molecular weight of 50 or less.
The area is in the range of 0 to less than 5000, and the region (C) is the area in the range of molecular weight of 5,000 or more.

【0007】以下、本発明について詳細に説明する。ま
ず、本発明のフェノール樹脂を反応手順に沿って説明す
る。合成反応は、攪拌機、温度計、熱交換機のついた反
応容器にフェノ−ル類、アルデヒド類、酸性触媒を仕込
み、反応を開始する。反応の反応温度や時間はフェノ−
ル類の反応性、目的とする特性によって適宜設定できる
が、安定かつ経済的に製造可能なレベルとして反応時間
で0.5−8時間、反応温度で40−120℃が特に好
ましい。また反応において、必要によって反応溶媒を添
加使用することもでき、特に溶媒の種類は限定されない
が、フェノ−ル樹脂を溶解する溶媒であることが好まし
い。一般的なものとして、アセトン、メチルエチルケト
ン、メチルイソブチルケトンなどのケトン類、メタノー
ル、エタノール、プロパノール、ブタノ−ルなどのアル
コ−ル類、エチルセロソルブのようなエ−テルアルコ−
ル類、テトラヒドロフラン、ジオキサンなどの環状エー
テル類、酢酸エチル、酢酸ブチルなどのエステル類など
が上げられる。
Hereinafter, the present invention will be described in detail. First, the phenolic resin of the present invention will be described along the reaction procedure. In the synthesis reaction, phenols, aldehydes, and an acidic catalyst are charged into a reaction vessel equipped with a stirrer, a thermometer, and a heat exchanger to start the reaction. The reaction temperature and time of the reaction are pheno-
The reaction time and the reaction temperature are particularly preferably 0.5 to 8 hours and the reaction temperature of 40 to 120 ° C. as stable and economical production levels. In the reaction, a reaction solvent can be added and used if necessary. The type of the solvent is not particularly limited, but a solvent that dissolves the phenol resin is preferable. Generally, ketones such as acetone, methyl ethyl ketone and methyl isobutyl ketone, alcohols such as methanol, ethanol, propanol and butanol, ether alcohols such as ethyl cellosolve and the like.
And cyclic ethers such as tetrahydrofuran and dioxane, and esters such as ethyl acetate and butyl acetate.

【0008】反応終了後、常圧下及び減圧下で脱水・脱
モノマ−を行い、フォトレジスト用フェノ−ル樹脂を得
ることができる。脱水・脱モノマ−の条件は限定されな
いが、得られたフェノ−ル樹脂の安定性(バラツキ)や
粘度を考慮すると、減圧度は、0.1torrから20
0torr程度で行うのが特に好ましい。脱水・脱モノ
マ−後に反応釜からフェノール樹脂をの取り出す温度
は、フェノール樹脂の特性や粘度などにより適宜設定で
きるが、樹脂の安定性の観点から150−250℃で行
うのが好ましい。また場合によっては、フォトレジスト
に使用する溶媒に溶解し、液状として出すことも可能で
ある。
After the completion of the reaction, dehydration and de-monomerization are carried out under normal pressure and reduced pressure to obtain a phenol resin for photoresist. The conditions for dehydration and demonomerization are not limited. However, considering the stability (variability) and viscosity of the obtained phenol resin, the degree of pressure reduction is from 0.1 torr to 20 torr.
It is particularly preferable to perform the process at about 0 torr. The temperature at which the phenol resin is removed from the reactor after the dehydration and de-monomerization can be appropriately set depending on the characteristics and viscosity of the phenol resin, but is preferably from 150 to 250 ° C. from the viewpoint of the stability of the resin. In some cases, it can be dissolved in a solvent used for a photoresist and discharged as a liquid.

【0009】続いて、本発明に使用される原料について
説明する。フェノ−ル類としてはメタクレゾ−ル、パラ
クレゾール、及び1官能性フェノール(キシレノールで
は2,4−キシレノ−ル、2,6−キシレノ−ル、トリ
メチルフェノールでは2,3,6−トリメチルフェノ−
ル)を使用する。1官能性フェノールは単独でも2種以
上を混合使用してもよい。フェノ−ル類におけるメタク
レゾールの割合は30−70重量%であり、40−60
重量%が特に好ましく、30重量%より少ない場合はフ
ォトレジストの感度が低くなりすぎ、70重量%より多
い場合は逆に感度が高すぎると同時に解像度が低下する
ため実使用に適さない。パラクレゾールの割合は1−5
0重量%であり、20−40重量%が特に好ましく、5
0重量%より多い場合はフォトレジストの感度が低くな
り、1重量%より少ない場合は解像度が低下する。1官
能性フェノールの割合は1−50重量%であり、20−
40重量%が特に好ましい。1官能性フェノールが50
重量%より多い場合は分子量が大きくならないため耐熱
性が低く、フォトレジストの感度も低くなってしまい実
用に適さない。1重量%より少ない場合は1官能性フェ
ノールの効果を引き出すことができず、耐熱性と解像度
を満足することができない。
Next, the raw materials used in the present invention will be described. Phenols include meta-cresol, para-cresol, and monofunctional phenols (2,4-xylenol, 2,6-xylenol for xylenol, 2,3,6-trimethylphenol for trimethylphenol)
Use). The monofunctional phenols may be used alone or in combination of two or more. The proportion of metacresol in phenols is 30-70% by weight, and 40-60%.
If the amount is less than 30% by weight, the sensitivity of the photoresist is too low. If the amount is more than 70% by weight, the sensitivity is too high and the resolution is lowered, which is not suitable for practical use. The proportion of paracresol is 1-5
0% by weight, particularly preferably 20-40% by weight.
When the content is more than 0% by weight, the sensitivity of the photoresist is lowered, and when the content is less than 1% by weight, the resolution is reduced. The proportion of monofunctional phenol is 1-50% by weight, 20-
40% by weight is particularly preferred. 50 monofunctional phenols
When the content is more than 10% by weight, the molecular weight does not increase so that the heat resistance is low and the sensitivity of the photoresist is low, which is not suitable for practical use. When the amount is less than 1% by weight, the effect of the monofunctional phenol cannot be brought out, and the heat resistance and the resolution cannot be satisfied.

【0010】アルデヒド類としては、ホルムアルデヒド
及び/又はパラホルムアルデヒドが使用される。ホルム
アルデヒドは、通常水溶液(ホルマリン)として使用さ
れる。また、アルデヒド類とフェノ−ル類のモル比率は
0.1−1.0であり、特に好ましくは0.2−0.9
である。0.1より低い場合は、重量平均分子量が小さ
く耐熱性が得られない。1.0より高い場合は、重量平
均分子量が大きくなりすぎ感度が低すぎて実使用に適さ
ない。
As aldehydes, formaldehyde and / or paraformaldehyde are used. Formaldehyde is usually used as an aqueous solution (formalin). The molar ratio of aldehydes to phenols is 0.1-1.0, particularly preferably 0.2-0.9.
It is. When it is lower than 0.1, the weight average molecular weight is too small to obtain heat resistance. When it is higher than 1.0, the weight average molecular weight becomes too large and the sensitivity is too low, which is not suitable for practical use.

【0011】酸性触媒としては、塩酸、硫酸、燐酸、ホ
ウ酸などの無機酸類、蓚酸、酢酸、安息香酸、パラトル
エンスルホン酸などの有機酸類があげられ、特に限定さ
れることなく単独及び混合して使用することができる。
使用量は、一般的にフェノール類に対して0.01重量
%から5重量%が好ましいが、5重量%より多すぎる場
合は反応が過激に進みすぎてコントロールしにくく、
0.1重量%より少ない場合は、反応の進みが遅く経済
的に好ましくない。しかしながら、フォトレジスト用樹
脂の特性のためには上記範囲内でも極力少ない方が好ま
しい。
Examples of the acidic catalyst include inorganic acids such as hydrochloric acid, sulfuric acid, phosphoric acid and boric acid, and organic acids such as oxalic acid, acetic acid, benzoic acid and paratoluenesulfonic acid. Can be used.
In general, the amount used is preferably from 0.01% by weight to 5% by weight based on the phenol. However, if the amount is more than 5% by weight, the reaction proceeds excessively and is difficult to control.
When the amount is less than 0.1% by weight, the progress of the reaction is slow, which is not economically preferable. However, for the characteristics of the photoresist resin, it is preferable that the amount is as small as possible even within the above range.

【0012】続いて本発明のフェノール樹脂の特性につ
いて説明する。重量平均分子量は、GPCにより測定
し、ポリスチレン標準物質を用いて作成した検量線をも
とに計算されたものである。GPC測定はテトラヒドロ
フランを溶出溶媒として使用し、流量1.0ml/分、
カラム温度40℃の条件で実施した。装置は、本体:T
OSOH製HLC−8020、検出器:波長280nm
にセットしたTOSOH製UV−8011、分析用カラ
ム:昭和電工製SHODEX KF−802 1本、K
F−803 1本、KF−805 1本、それぞれを使
用した。
Next, the characteristics of the phenol resin of the present invention will be described. The weight average molecular weight is measured by GPC and calculated based on a calibration curve created using a polystyrene standard substance. GPC measurement uses tetrahydrofuran as an elution solvent, flow rate 1.0 ml / min,
The test was performed at a column temperature of 40 ° C. The device is: T
OSLC HLC-8020, detector: wavelength 280 nm
UV-8011 made by TOSOH, analytical column: 1 SHOdex KF-802 made by Showa Denko, K
One F-803 and one KF-805 were used.

【0013】本発明におけるフォトレジスト用フェノ−
ル樹脂の重量平均分子量は、特に限定されないが、フォ
トレジストの性能や製造上のハンドリング性から150
0〜15000であるのが好ましい。重量平均分子量が
1500より小さい場合は感度が高すぎて耐熱性に劣
り、15000より大きい場合は感度が低すぎて実使用
に適さない。また、下記(A)領域が10−45%、
(B)領域が35−85%、(C)領域が0−40%で
あり、かつ(B領域+C領域)/A領域の面積比が1.
2−4.5である。ただし、(A)領域、(B)領域及
び(C)領域の合計は100%である。(A)領域は分
子量が150以上500未満(遊離のフェノール類を除
く)の範囲の面積であり、(B)領域は分子量が500
以上5000未満の範囲の面積であり、(C)領域は分
子量が5000以上の範囲の面積である。(B領域+C
領域)/A領域の面積比が1.2より小さい場合は感度
が高すぎて耐熱性に劣り、4.0より大きい場合は感度
が低すぎて実使用に適さない。また、フェノール樹脂中
に残存する遊離フェノール類の量は特に限定されない
が、取り扱い上及びフォトレジストの特性上から、GP
Cのピーク面積で8%以下が好ましく、特に好ましくは
4%以下である。遊離フェノール類のコントロールは、
減圧下で脱水・脱モノマーを行う時に、減圧度と終了温
度により行うのが最も容易である。
[0013] Pheno for photoresist in the present invention
The weight average molecular weight of the resin is not particularly limited.
It is preferably from 0 to 15000. When the weight average molecular weight is less than 1500, the sensitivity is too high and the heat resistance is inferior. When it is more than 15,000, the sensitivity is too low and it is not suitable for practical use. The following (A) region is 10-45%,
The (B) region is 35-85%, the (C) region is 0-40%, and the area ratio of (B region + C region) / A region is 1.
2-4.5. However, the total of the area (A), the area (B) and the area (C) is 100%. The (A) region is an area having a molecular weight of 150 to less than 500 (excluding free phenols), and the (B) region has a molecular weight of 500
The area (C) is an area having a molecular weight of 5,000 or more. (B area + C
When the area ratio of the (area) / A area is smaller than 1.2, the sensitivity is too high and the heat resistance is inferior. When the area ratio is larger than 4.0, the sensitivity is too low and not suitable for practical use. Further, the amount of free phenols remaining in the phenol resin is not particularly limited.
The peak area of C is preferably 8% or less, particularly preferably 4% or less. Control of free phenols
It is easiest to perform dehydration and demonomerization under reduced pressure depending on the degree of reduced pressure and the end temperature.

【0014】[0014]

【実施例】以下本発明を実施例により詳細に説明する。
ここに記載されている「%」はすべて「重量%」を示
す。なお、本発明はこれら実施例により何ら制約される
ものではない。各例において、樹脂の重量平均分子量と
(B領域+C領域)/A領域の値は、上記GPC測定に
より求めた。
DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described below in detail with reference to embodiments.
All “%” described herein indicate “% by weight”. The present invention is not limited by these embodiments. In each example, the weight average molecular weight of the resin and the value of (B region + C region) / A region were determined by the GPC measurement.

【0015】《実施例1》攪拌機、温度計、熱交換機の
ついた3Lの四つ口フラスコにメタクレゾ−ル658
g、パラクレゾール392g、2,4−キシレノ−ル3
50g(メタクレゾール/パラクレゾール/1官能性フ
ェノール重量比=47/28/25)、37%のホルマ
リン553.4g(A/Pモル比=0.630)、蓚酸
2.8gを仕込み、反応温度58−62℃で60分間反
応を行った。その後、段階的に昇温させ、最終的に還流
温度(97−103℃)で4時間反応させた。反応終了
後、常圧下で内温140℃まで脱水し、さらに70to
rrの減圧下で内温195℃まで脱水・脱モノマ−を行
い、フォトレジスト用フェノ−ル樹脂を得た。得られた
樹脂の重量平均分子量は3400、A領域は22.0
%、B領域は64.9%、C領域は10.0%、(B領
域+C領域)/A領域の面積比は3.40であった。
Example 1 Metacresol 658 was placed in a 3 L four-necked flask equipped with a stirrer, thermometer and heat exchanger.
g, paracresol 392 g, 2,4-xylenol 3
50 g (weight ratio of meta-cresol / para-cresol / 1-functional phenol = 47/28/25), 553.4 g of 37% formalin (A / P molar ratio = 0.630), and 2.8 g of oxalic acid were charged, and the reaction temperature was increased. The reaction was performed at 58-62 ° C for 60 minutes. Thereafter, the temperature was raised stepwise, and finally the reaction was carried out at a reflux temperature (97-103 ° C) for 4 hours. After the completion of the reaction, the mixture was dehydrated under normal pressure to an internal temperature of 140 ° C.
Dehydration and demonomerization were carried out to an internal temperature of 195 ° C. under a reduced pressure of rr to obtain a phenol resin for photoresist. The weight average molecular weight of the obtained resin is 3400, and the A region is 22.0.
%, The B region was 64.9%, the C region was 10.0%, and the area ratio of (B region + C region) / A region was 3.40.

【0016】《実施例2》実施例1と同様の反応装置に
メタクレゾ−ル658g、パラクレゾール392g、
2,6−キシレノ−ル350g(メタクレゾール/パラ
クレゾール/1官能性フェノール重量比=47/28/
25)、37%のホルマリン733.5g(A/Pモル
比=0.835)、蓚酸2.8gを仕込み、反応温度5
8−62℃で60分間反応を行った。その後、段階的に
昇温させ、最終的に還流温度(97−103℃)で4時
間反応させた。反応終了後、常圧下で内温140℃まで
脱水し、さらに70torrの減圧下で内温195℃ま
で脱水・脱モノマ−を行い、フォトレジスト用フェノ−
ル樹脂を得た。得られた樹脂の重量平均分子量は680
0、A領域は21.7%、B領域は52.0%、C領域
は24.5%、(B領域+C領域)/A領域の面積比は
3.53であった。
Example 2 658 g of meta-cresol and 392 g of para-cresol were placed in the same reactor as in Example 1.
350 g of 2,6-xylenol (weight ratio of meta-cresol / para-cresol / 1-functional phenol = 47/28 /
25), 733.5 g of 37% formalin (A / P molar ratio = 0.835) and 2.8 g of oxalic acid were charged, and the reaction temperature was 5%.
The reaction was performed at 8-62 ° C for 60 minutes. Thereafter, the temperature was raised stepwise, and finally the reaction was carried out at a reflux temperature (97-103 ° C) for 4 hours. After completion of the reaction, the mixture was dehydrated to an internal temperature of 140 ° C. under normal pressure, and further dehydrated and de-monomerized to an internal temperature of 195 ° C. under a reduced pressure of 70 torr.
Resin was obtained. The weight average molecular weight of the obtained resin is 680.
0, the A region was 21.7%, the B region was 52.0%, the C region was 24.5%, and the area ratio of (B region + C region) / A region was 3.53.

【0017】《実施例3》実施例1と同様の反応装置に
メタクレゾ−ル658g、パラクレゾール392g、
2,3,6−トリメチルフェノール350g(メタクレ
ゾール/パラクレゾール/1官能性フェノール重量比=
47/28/25)、37%のホルマリン720.6g
(A/Pモル比=0.840)、蓚酸2.8gを仕込
み、反応温度58−62℃で60分間反応を行った。そ
の後、段階的に昇温させ、最終的に還流温度(97−1
03℃)で4時間反応させた。反応終了後、常圧下で内
温140℃まで脱水し、さらに70torrの減圧下で
内温195℃まで脱水・脱モノマ−を行い、フォトレジ
スト用フェノ−ル樹脂を得た。得られた樹脂の重量平均
分子量は4100、A領域は23.5%、B領域は5
8.1%、C領域は14.3%、(B領域+C領域)/
A領域の面積比は3.08であった。
Example 3 658 g of meta-cresol, 392 g of para-cresol,
350 g of 2,3,6-trimethylphenol (weight ratio of meta-cresol / para-cresol / 1-functional phenol =
47/28/25), 720.6 g of 37% formalin
(A / P molar ratio = 0.840) and 2.8 g of oxalic acid were charged and reacted at a reaction temperature of 58-62 ° C. for 60 minutes. Thereafter, the temperature is increased stepwise, and finally the reflux temperature (97-1)
(03 ° C.) for 4 hours. After completion of the reaction, the mixture was dehydrated under normal pressure to an internal temperature of 140 ° C, and further dehydrated and demonomerized to an internal temperature of 195 ° C under a reduced pressure of 70 torr to obtain a phenolic resin for a photoresist. The weight average molecular weight of the obtained resin is 4100, the A region is 23.5%, and the B region is 5%.
8.1%, C area is 14.3%, (B area + C area) /
The area ratio of the region A was 3.08.

【0018】《実施例4》実施例1と同様の反応装置に
メタクレゾ−ル798g、パラクレゾール462g、
2,4−キシレノール140g(メタクレゾール/パラ
クレゾール/1官能性フェノール重量比=57/33/
10)、37%のホルマリン518.5g(A/Pモル
比=0.580)、蓚酸2.8gを仕込み、反応温度5
8−62℃で60分間反応を行った。その後、段階的に
昇温させ、最終的に還流温度(97−103℃)で4時
間反応させた。反応終了後、常圧下で内温140℃まで
脱水し、さらに70torrの減圧下で内温195℃ま
で脱水・脱モノマ−を行い、フォトレジスト用フェノ−
ル樹脂を得た。得られた樹脂の重量平均分子量は360
0、A領域は22.0%、B領域は63.2%、C領域
は11.5%、(B領域+C領域)/A領域の面積比は
3.40であった。
Example 4 798 g of meta-cresol and 462 g of para-cresol were placed in the same reactor as in Example 1.
140 g of 2,4-xylenol (weight ratio of meta-cresol / para-cresol / 1-functional phenol = 57/33 /
10), 518.5 g of 37% formalin (A / P molar ratio = 0.580) and 2.8 g of oxalic acid were charged, and the reaction temperature was 5%.
The reaction was performed at 8-62 ° C for 60 minutes. Thereafter, the temperature was raised stepwise, and finally the reaction was carried out at a reflux temperature (97-103 ° C) for 4 hours. After completion of the reaction, the mixture was dehydrated to an internal temperature of 140 ° C. under normal pressure, and further dehydrated and de-monomerized to an internal temperature of 195 ° C. under a reduced pressure of 70 torr.
Resin was obtained. The weight average molecular weight of the obtained resin is 360
0, the A region was 22.0%, the B region was 63.2%, the C region was 11.5%, and the area ratio of (B region + C region) / A region was 3.40.

【0019】《実施例5》実施例1と同様の反応装置に
メタクレゾ−ル798g、パラクレゾール462g、
2,6−キシレノール140g(メタクレゾール/パラ
クレゾール/1官能性フェノール重量比=57/33/
10)、37%のホルマリン706.3g(A/Pモル
比=0.790)、蓚酸2.8gを仕込み、反応温度5
8−62℃で60分間反応を行った。その後、段階的に
昇温させ、最終的に還流温度(97−103℃)で4時
間反応させた。反応終了後、常圧下で内温140℃まで
脱水し、さらに70torrの減圧下で内温195℃ま
で脱水・脱モノマ−を行い、フォトレジスト用フェノ−
ル樹脂を得た。得られた樹脂の重量平均分子量は120
00、A領域は16.7%、B領域は51.2%、C領
域は30.1%、(B領域+C領域)/A領域の面積比
は4.87であった。
Example 5 798 g of meta-cresol and 462 g of para-cresol were placed in the same reactor as in Example 1.
140 g of 2,6-xylenol (weight ratio of meta-cresol / para-cresol / 1-functional phenol = 57/33 /
10), 706.3 g of 37% formalin (A / P molar ratio = 0.790) and 2.8 g of oxalic acid were charged, and the reaction temperature was 5%.
The reaction was performed at 8-62 ° C for 60 minutes. Thereafter, the temperature was raised stepwise, and finally the reaction was carried out at a reflux temperature (97-103 ° C) for 4 hours. After completion of the reaction, the mixture was dehydrated to an internal temperature of 140 ° C. under normal pressure, and further dehydrated and de-monomerized to an internal temperature of 195 ° C. under a reduced pressure of 70 torr.
Resin was obtained. The weight average molecular weight of the obtained resin is 120.
The area A was 16.7%, the area B was 51.2%, the area C was 30.1%, and the area ratio of (area B + area C) / area A was 4.87.

【0020】《実施例6》実施例1と同様の反応装置に
メタクレゾ−ル798g、パラクレゾール462g、
2,3,6−トリメチルフェノール140g(メタクレ
ゾール/パラクレゾール/1官能性フェノール重量比=
57/33/10)、37%のホルマリン699.8g
(A/Pモル比=0.790)、蓚酸2.8gを仕込
み、反応温度58−62℃で60分間反応を行った。そ
の後、段階的に昇温させ、最終的に還流温度(97−1
03℃)で4時間反応させた。反応終了後、常圧下で内
温140℃まで脱水し、さらに70torrの減圧下で
内温195℃まで脱水・脱モノマ−を行い、フォトレジ
スト用フェノ−ル樹脂を得た。得られた樹脂の重量平均
分子量は5200、A領域は21.6%、B領域は5
5.8%、C領域は19.3%、(B領域+C領域)/
A領域の面積比は3.48であった。
Example 6 798 g of meta-cresol and 462 g of para-cresol were placed in the same reactor as in Example 1.
140 g of 2,3,6-trimethylphenol (weight ratio of meta-cresol / para-cresol / 1-functional phenol =
57/33/10), 699.8 g of 37% formalin
(A / P molar ratio = 0.790) and 2.8 g of oxalic acid were charged and reacted at a reaction temperature of 58 to 62 ° C for 60 minutes. Thereafter, the temperature is increased stepwise, and finally the reflux temperature (97-1)
(03 ° C.) for 4 hours. After completion of the reaction, the mixture was dehydrated under normal pressure to an internal temperature of 140 ° C, and further dehydrated and demonomerized to an internal temperature of 195 ° C under a reduced pressure of 70 torr to obtain a phenolic resin for a photoresist. The weight average molecular weight of the obtained resin is 5200, the A region is 21.6%, and the B region is 5
5.8%, C area is 19.3%, (B area + C area) /
The area ratio of the A region was 3.48.

【0021】《実施例7》実施例1と同様の反応装置に
メタクレゾ−ル532g、パラクレゾール308g、
2,4−キシレノール560g(メタクレゾール/パラ
クレゾール/1官能性フェノール重量比=38/22/
40)、37%のホルマリン629.9g(A/Pモル
比=0.730)、蓚酸2.8gを仕込み、反応温度5
8−62℃で60分間反応を行った。その後、段階的に
昇温させ、最終的に還流温度(97−103℃)で4時
間反応させた。反応終了後、常圧下で内温140℃まで
脱水し、さらに70torrの減圧下で内温195℃ま
で脱水・脱モノマ−を行い、フォトレジスト用フェノ−
ル樹脂を得た。得られた樹脂の重量平均分子量は200
0、A領域は25.0%、B領域は64.3%、C領域
は6.3%、(B領域+C領域)/A領域の面積比は
2.82であった。
Example 7 532 g of meta-cresol, 308 g of para-cresol, and
560 g of 2,4-xylenol (weight ratio of meta-cresol / para-cresol / 1-functional phenol = 38/22 /
40), 629.9 g of 37% formalin (A / P molar ratio = 0.730) and 2.8 g of oxalic acid were charged, and the reaction temperature was 5%.
The reaction was performed at 8-62 ° C for 60 minutes. Thereafter, the temperature was raised stepwise, and finally the reaction was carried out at a reflux temperature (97-103 ° C) for 4 hours. After completion of the reaction, the mixture was dehydrated to an internal temperature of 140 ° C. under normal pressure, and further dehydrated and de-monomerized to an internal temperature of 195 ° C. under a reduced pressure of 70 torr.
Resin was obtained. The weight average molecular weight of the obtained resin is 200
0, the A region was 25.0%, the B region was 64.3%, the C region was 6.3%, and the area ratio of (B region + C region) / A region was 2.82.

【0022】《実施例8》実施例1と同様の反応装置に
メタクレゾ−ル532g、パラクレゾール308g、
2,6−キシレノール560g(メタクレゾール/パラ
クレゾール/1官能性フェノール重量比=38/22/
40)、37%のホルマリン811.1g(A/Pモル
比=0.940)、蓚酸2.8gを仕込み、反応温度5
8−62℃で60分間反応を行った。その後、段階的に
昇温させ、最終的に還流温度(97−103℃)で4時
間反応させた。反応終了後、常圧下で内温140℃まで
脱水し、さらに70torrの減圧下で内温195℃ま
で脱水・脱モノマ−を行い、フォトレジスト用フェノ−
ル樹脂を得た。得られた樹脂の重量平均分子量は880
0、A領域は18.5%、B領域は51.8%、C領域
は27.4%、(B領域+C領域)/A領域の面積比は
4.28であった。
Example 8 532 g of meta-cresol, 308 g of para-cresol, and
560 g of 2,6-xylenol (weight ratio of meta-cresol / para-cresol / 1-functional phenol = 38/22 /
40), 811.1 g of 37% formalin (A / P molar ratio = 0.940) and 2.8 g of oxalic acid were charged, and the reaction temperature was 5%.
The reaction was performed at 8-62 ° C for 60 minutes. Thereafter, the temperature was raised stepwise, and finally the reaction was carried out at a reflux temperature (97-103 ° C) for 4 hours. After completion of the reaction, the mixture was dehydrated to an internal temperature of 140 ° C. under normal pressure, and further dehydrated and de-monomerized to an internal temperature of 195 ° C. under a reduced pressure of 70 torr.
Resin was obtained. The weight average molecular weight of the obtained resin is 880.
0, the A region was 18.5%, the B region was 51.8%, the C region was 27.4%, and the area ratio of (B region + C region) / A region was 4.28.

【0023】《実施例9》実施例1と同様の反応装置に
メタクレゾ−ル532g、パラクレゾール308g、
2,3,6−トリメチルフェノール560g(メタクレ
ゾール/パラクレゾール/1官能性フェノール重量比=
38/22/40)、37%のホルマリン780.1g
(A/Pモル比=0.940)、蓚酸2.8gを仕込
み、反応温度58−62℃で60分間反応を行った。そ
の後、段階的に昇温させ、最終的に還流温度(97−1
03℃)で4時間反応させた。反応終了後、常圧下で内
温140℃まで脱水し、さらに70torrの減圧下で
内温195℃まで脱水・脱モノマ−を行い、フォトレジ
スト用フェノ−ル樹脂を得た。得られた樹脂の重量平均
分子量は4300、A領域は22.4%、B領域は5
8.3%、C領域は15.6%、(B領域+C領域)/
A領域の面積比は3.30であった。
Example 9 The same reactor as in Example 1 was charged with 532 g of metacresol, 308 g of paracresol,
560 g of 2,3,6-trimethylphenol (weight ratio of meta-cresol / para-cresol / 1-functional phenol =
38/22/40), 780.1 g of 37% formalin
(A / P molar ratio = 0.940) and 2.8 g of oxalic acid were charged and reacted at a reaction temperature of 58 to 62 ° C for 60 minutes. Thereafter, the temperature is increased stepwise, and finally the reflux temperature (97-1)
(03 ° C.) for 4 hours. After completion of the reaction, the mixture was dehydrated under normal pressure to an internal temperature of 140 ° C, and further dehydrated and demonomerized to an internal temperature of 195 ° C under a reduced pressure of 70 torr to obtain a phenolic resin for a photoresist. The weight average molecular weight of the obtained resin was 4300, the A region was 22.4%, and the B region was 5
8.3%, C area is 15.6%, (B area + C area) /
The area ratio of the A region was 3.30.

【0024】《実施例10》実施例1と同様の反応装置
にメタクレゾ−ル658g、パラクレゾール392g、
2,4−キシレノール175g、2,6−キシレノール
175g(メタクレゾール/パラクレゾール/1官能性
フェノール重量比=47/28/25)、37%のホル
マリン645.7g(A/Pモル比=0.735)、蓚
酸2.8gを仕込み、反応温度58−62℃で60分間
反応を行った。その後、段階的に昇温させ、最終的に還
流温度(97−103℃)で4時間反応させた。反応終
了後、常圧下で内温140℃まで脱水し、さらに70t
orrの減圧下で内温195℃まで脱水・脱モノマ−を
行い、フォトレジスト用フェノ−ル樹脂を得た。得られ
た樹脂の重量平均分子量は5100、A領域は21.6
%、B領域は56.0%、C領域は18.7%、(B領
域+C領域)/A領域の面積比は3.46であった。
<< Example 10 >> 658 g of meta-cresol, 392 g of para-cresol,
175 g of 2,4-xylenol, 175 g of 2,6-xylenol (weight ratio of meta-cresol / para-cresol / 1-functional phenol = 47/28/25), 645.7 g of 37% formalin (A / P molar ratio = 0. 735) and 2.8 g of oxalic acid were charged and reacted at a reaction temperature of 58-62 ° C for 60 minutes. Thereafter, the temperature was raised stepwise, and finally the reaction was carried out at a reflux temperature (97-103 ° C) for 4 hours. After completion of the reaction, dehydration was performed under normal pressure to an internal temperature of 140 ° C.
Dehydration and demonomerization were performed to an internal temperature of 195 ° C. under a reduced pressure of orr to obtain a phenol resin for photoresist. The weight average molecular weight of the obtained resin is 5100, and the A region is 21.6.
%, The B region was 56.0%, the C region was 18.7%, and the area ratio of (B region + C region) / A region was 3.46.

【0025】《実施例11》実施例1と同様の反応装置
にメタクレゾ−ル658g、パラクレゾール392g、
2,4−キシレノール175g、2,3,6−トリメチ
ルフェノール175g(メタクレゾール/パラクレゾー
ル/1官能性フェノール重量比=47/28/25)、
37%のホルマリン638.1(A/Pモル比=0.7
35)、蓚酸2.8gを仕込み、反応温度58−62℃
で60分間反応を行った。その後、段階的に昇温させ、
最終的に還流温度(97−103℃)で4時間反応させ
た。反応終了後、常圧下で内温140℃まで脱水し、さ
らに70torrの減圧下で内温195℃まで脱水・脱
モノマ−を行い、フォトレジスト用フェノ−ル樹脂を得
た。得られた樹脂の重量平均分子量は3800、A領域
は22.5%、B領域は60.1%、C領域は12.8
%、(B領域+C領域)/A領域の面積比は3.24で
あった。
Example 11 658 g of meta-cresol and 392 g of para-cresol were placed in the same reactor as in Example 1.
175 g of 2,4-xylenol, 175 g of 2,3,6-trimethylphenol (weight ratio of meta-cresol / para-cresol / 1-functional phenol = 47/28/25),
Formalin 638.1 at 37% (A / P molar ratio = 0.7
35), 2.8 g of oxalic acid was charged, and the reaction temperature was 58-62 ° C.
For 60 minutes. Then, the temperature is increased step by step,
Finally, the reaction was carried out at a reflux temperature (97-103 ° C) for 4 hours. After completion of the reaction, the mixture was dehydrated under normal pressure to an internal temperature of 140 ° C, and further dehydrated and demonomerized to an internal temperature of 195 ° C under a reduced pressure of 70 torr to obtain a phenolic resin for a photoresist. The weight average molecular weight of the obtained resin is 3800, the A region is 22.5%, the B region is 60.1%, and the C region is 12.8.
%, And the area ratio of (B region + C region) / A region was 3.24.

【0026】《実施例12》実施例1と同様の反応装置
にメタクレゾ−ル658g、パラクレゾール392g、
2,6−キシレノール175g、2,3,6−トリメチ
ルフェノール175g(メタクレゾール/パラクレゾー
ル/1官能性フェノール重量比=47/28/25)、
37%のホルマリン729.2(A/Pモル比=0.8
40)、蓚酸2.8gを仕込み、反応温度58−62℃
で60分間反応を行った。その後、段階的に昇温させ、
最終的に還流温度(97−103℃)で4時間反応させ
た。反応終了後、常圧下で内温140℃まで脱水し、さ
らに70torrの減圧下で内温195℃まで脱水・脱
モノマ−を行い、フォトレジスト用フェノ−ル樹脂を得
た。得られた樹脂の重量平均分子量は5500、A領域
は22.5%、B領域は53.5%、C領域は20.7
%、(B領域+C領域)/A領域の面積比は3.30で
あった。
Example 12 In the same reactor as in Example 1, 658 g of meta-cresol, 392 g of para-cresol,
175 g of 2,6-xylenol, 175 g of 2,3,6-trimethylphenol (weight ratio of meta-cresol / para-cresol / 1-functional phenol = 47/28/25),
379.2% formalin 729.2 (A / P molar ratio = 0.8
40), 2.8 g of oxalic acid was charged, and the reaction temperature was 58-62 ° C.
For 60 minutes. Then, the temperature is increased step by step,
Finally, the reaction was carried out at a reflux temperature (97-103 ° C) for 4 hours. After completion of the reaction, the mixture was dehydrated under normal pressure to an internal temperature of 140 ° C, and further dehydrated and demonomerized to an internal temperature of 195 ° C under a reduced pressure of 70 torr to obtain a phenolic resin for a photoresist. The weight average molecular weight of the obtained resin was 5500, the A region was 22.5%, the B region was 53.5%, and the C region was 20.7%.
%, And the area ratio of (B region + C region) / A region was 3.30.

【0027】《実施例13》実施例1と同様の反応装置
にメタクレゾ−ル658g、パラクレゾール392g、
2,4−キシレノール117g、2,6−キシレノール
117g、2,3,6−トリメチルフェノール117g
(メタクレゾール/パラクレゾール/1官能性フェノー
ル重量比=47/28/25)、37%のホルマリン6
71.5g(A/Pモル比=0.770)、蓚酸2.8
gを仕込み、反応温度58−62℃で60分間反応を行
った。その後、段階的に昇温させ、最終的に還流温度
(97−103℃)で4時間反応させた。反応終了後、
常圧下で内温140℃まで脱水し、さらに70torr
の減圧下で内温195℃まで脱水・脱モノマ−を行い、
フォトレジスト用フェノ−ル樹脂を得た。得られた樹脂
の重量平均分子量は4800、A領域は22.3%、B
領域は56.3%、C領域は17.9%、(B領域+C
領域)/A領域の面積比は3.33であった。
Example 13 658 g of meta-cresol and 392 g of para-cresol were placed in the same reactor as in Example 1.
117 g of 2,4-xylenol, 117 g of 2,6-xylenol, 117 g of 2,3,6-trimethylphenol
(Meta-cresol / para-cresol / 1-functional phenol weight ratio = 47/28/25), 37% formalin 6
71.5 g (A / P molar ratio = 0.770), oxalic acid 2.8
g was charged and reacted at a reaction temperature of 58-62 ° C for 60 minutes. Thereafter, the temperature was raised stepwise, and finally the reaction was carried out at a reflux temperature (97-103 ° C) for 4 hours. After the reaction,
Dehydrate to 140 ° C under normal pressure, and then add 70 torr
Dehydration and de-monomerization to an internal temperature of 195 ° C under reduced pressure of
A phenol resin for photoresist was obtained. The weight average molecular weight of the obtained resin was 4800, the area A was 22.3%,
The area is 56.3%, the area C is 17.9%, (B area + C
The area ratio of (area) / A area was 3.33.

【0028】《比較例1》実施例1と同様の反応装置に
メタクレゾ−ル400g、パラクレゾ−ル600g、3
7%ホルマリン412.9g(A/Pモル比=0.55
0)、蓚酸2gを仕込み、還流温度(98−102℃)
で4時間反応させた。反応終了後、常圧下で内温140
℃まで脱水し、さらに80torrの減圧下で内温19
5℃まで脱水・脱モノマ−を行い、フォトレジスト用フ
ェノ−ル樹脂を得た。得られた樹脂の重量平均分子量は
2200、A領域は44.9%、B領域は45.3%、
C領域は4.3%、(B領域+C領域)/A領域の面積
比は1.10であった。
Comparative Example 1 400 g of meta-cresol, 600 g of para-cresol and 3 g of the same reactor were used as in Example 1.
412.9 g of 7% formalin (A / P molar ratio = 0.55)
0), 2 g of oxalic acid were charged, and the reflux temperature (98-102 ° C)
For 4 hours. After the reaction is completed, the internal temperature is 140
And dehydrated to 80 ° C. under reduced pressure of 80 torr.
Dehydration and demonomerization were performed to 5 ° C. to obtain a phenol resin for photoresist. The weight average molecular weight of the obtained resin was 2200, the A region was 44.9%, the B region was 45.3%,
The area C was 4.3%, and the area ratio of (area B + area C) / area A was 1.10.

【0029】《比較例2》実施例1と同様の反応装置に
メタクレゾ−ル400g、パラクレゾ−ル600g、3
7%ホルマリン563.1g(A/Pモル比=0.75
0)、蓚酸7gを仕込み、還流温度(96−100℃)
で5時間反応させた。反応終了後、常圧下で内温150
℃まで脱水し、さらに80torrの減圧下で内温19
5℃まで脱水・脱モノマ−を行い、フォトレジスト用フ
ェノ−ル樹脂を得た。得られた樹脂の重量平均分子量は
16000、A領域は16.9%、B領域は48.9
%、C領域は32.2%、(B領域+C領域)/A領域
の面積比は4.80であった。
Comparative Example 2 400 g of meta-cresol, 600 g of para-cresol and 3 g of the same reactor were used as in Example 1.
563.1 g of 7% formalin (A / P molar ratio = 0.75
0), 7 g of oxalic acid was charged, and the reflux temperature (96-100 ° C.)
For 5 hours. After the reaction is completed, the internal temperature is 150
And dehydrated to 80 ° C. under reduced pressure of 80 torr.
Dehydration and demonomerization were performed to 5 ° C. to obtain a phenol resin for photoresist. The weight average molecular weight of the obtained resin is 16000, the A region is 16.9%, and the B region is 48.9.
%, The C region was 32.2%, and the area ratio of (B region + C region) / A region was 4.80.

【0030】《評価例1》アルカリ溶解時間(ADR)
の評価方法 25%の樹脂−エチルセロソルブアセテ−ト溶液を使用
して、シリコンウエハ上に約1マイクロメ−タ−の厚み
になるようにスピンコ−タ−で塗布し、110℃で90
秒間ホットプレ−ト上で乾燥させた。その後、現像液
(2.38%テトラメチルアンモニウムヒドロオキサイ
ド水溶液)でシリコンウエハに塗布した樹脂を溶解し、
目視で溶解する時間を測定した。
<< Evaluation Example 1 >> Alkali dissolution time (ADR)
Using a 25% resin-ethyl cellosolve acetate solution, a silicon coater was applied on a silicon wafer to a thickness of about 1 micrometer using a spin coater.
Dry on hot plate for 2 seconds. Thereafter, the resin applied to the silicon wafer is dissolved with a developing solution (2.38% aqueous solution of tetramethylammonium hydroxide),
The dissolution time was measured visually.

【0031】《評価例2》耐熱性の評価方法 ノボラック型フェノ−ル樹脂100部とナフトキノン
1,2−ジアジド−5−スルホン酸の2,3,4−トリ
ヒドロキシベンゾフェノンエステル30部とを乳酸エチ
ルに溶解し、レジスト溶液を調合した。これらを0.2
ミクロンメンブレンフィルタ−で濾過し、レジスト液と
した。これを常法によって塗布し、110℃で90秒間
ホットプレ−ト上で乾燥させた。その後縮小投影露光装
置を用い、テストチャ−トマスクを介して露光し、現像
液(2.38%テトラメチルアンモニウムヒドロオキサ
イド水溶液)を用い、50秒間現像した。得られたシリ
コンウエハ−を温度を変えたホットプレ−ト上で30分
間放置し、シリコウエハ−上のレジストパタ−ンの形状
変化を電子顕微鏡で観察し耐熱性を評価した。
Evaluation Example 2 Evaluation Method of Heat Resistance 100 parts of a novolak phenol resin and 30 parts of 2,3,4-trihydroxybenzophenone ester of naphthoquinone 1,2-diazido-5-sulfonic acid were mixed with ethyl lactate. And a resist solution was prepared. These are 0.2
The solution was filtered through a micron membrane filter to obtain a resist solution. This was applied by a conventional method and dried on a hot plate at 110 ° C. for 90 seconds. Thereafter, exposure was performed through a test chart mask using a reduction projection exposure apparatus, and development was performed for 50 seconds using a developing solution (2.38% aqueous solution of tetramethylammonium hydroxide). The obtained silicon wafer was allowed to stand on a hot plate at a varied temperature for 30 minutes, and the change in the shape of the resist pattern on the silicon wafer was observed with an electron microscope to evaluate the heat resistance.

【0032】《評価例3》限界解像度の評価方法 評価例2と同様に溶液調整、前処理、塗付、テストチャ
−トマスクによる露光・現像を行い、レジストパタ−ン
形状を電子顕微鏡で観察した。限界解像度は、最適露光
・現像条件での写真から解像しうる限界を目視で判定・
測定した。
<< Evaluation Example 3 >> Evaluation Method of Critical Resolution In the same manner as in Evaluation Example 2, solution preparation, pretreatment, coating, exposure and development using a test chart mask were performed, and the resist pattern shape was observed with an electron microscope. The limit resolution is a visual judgment of the limit that can be resolved from a photograph under optimal exposure and development conditions.
It was measured.

【0033】[0033]

【表1】 [Table 1]

【0034】[0034]

【発明の効果】本発明により、従来の方法では得られな
かった、高耐熱性・高感度を両立する解像度の高いフォ
トレジスト用フェノ−ル樹脂を提供することができるよ
うになる。そして、本発明のフェノ−ル樹脂を使用する
ことによって得られたフォトレジストは、高集積な半導
体を製造する際のリソグラフィ−に使用され、半導体の
今後のさらなる高集積化に役立つものと期待される。
According to the present invention, it is possible to provide a phenolic resin for a photoresist having a high resolution and having both high heat resistance and high sensitivity, which cannot be obtained by the conventional method. The photoresist obtained by using the phenolic resin of the present invention is used for lithography when manufacturing a highly integrated semiconductor, and is expected to be useful for further high integration of the semiconductor in the future. You.

───────────────────────────────────────────────────── フロントページの続き (72)発明者 有田 靖 東京都品川区東品川2丁目5番8号 住友 デュレズ株式会社内 Fターム(参考) 2H025 AA01 AA02 AA10 AB16 AB17 AC01 AD03 BE01 BJ10 CB29 CB55 CB56 FA03 FA17 4J033 CA02 CA03 CA12 CA29 CB03 CC03 CC08 CC09 CD03 HA02 HB10  ────────────────────────────────────────────────── ─── Continuing on the front page (72) Inventor Yasushi Arita 2-5-8 Higashishinagawa, Shinagawa-ku, Tokyo Sumitomo Durez Co., Ltd. F-term (reference) 2H025 AA01 AA02 AA10 AB16 AB17 AC01 AD03 BE01 BJ10 CB29 CB55 CB56 FA03 FA17 4J033 CA02 CA03 CA12 CA29 CB03 CC03 CC08 CC09 CD03 HA02 HB10

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 メタクレゾール30−70重量%,パラ
クレゾール1−50重量%及び2,4−キシレノール、
2,6−キシレノール、2,3,6−トリメチルフェノ
ールの1種以上からなる1官能性フェノール1−50重
量%からなるフェノール類と、ホルムアルデヒド及び/
又はパラホルムアルデヒドからなるアルデヒド類とを酸
性触媒のもとで反応させて得られる重量平均分子量が1
500−15000のフェノール樹脂であって、下記
(A)領域が10−45%、(B)領域が35−85
%、(C)領域が0−40%であり、かつ(B領域+C
領域)/A領域の面積比が1.2−4.5であることを
特徴とするフォトレジスト用フェノール樹脂。ただし、
(A)領域、(B)領域及び(C)領域の合計は100
%である。(A)領域は分子量が150以上500未満
(遊離のフェノール類を除く)の範囲の面積であり、
(B)領域は分子量が500以上5000未満の範囲の
面積であり、(C)領域は分子量が5000以上の範囲
の面積である。
1. A composition comprising 30-70% by weight of meta-cresol, 1-50% by weight of para-cresol and 2,4-xylenol;
A phenol comprising 1 to 50% by weight of a monofunctional phenol comprising at least one of 2,6-xylenol and 2,3,6-trimethylphenol, formaldehyde and / or
Or, the weight average molecular weight obtained by reacting with aldehydes composed of paraformaldehyde under an acidic catalyst is 1
500-15000 phenolic resin, wherein the following (A) region is 10-45%, and (B) region is 35-85%
%, (C) area is 0-40%, and (B area + C
A phenolic resin for a photoresist, wherein an area ratio of (area) / A area is 1.2 to 4.5. However,
The total of the (A) area, (B) area and (C) area is 100
%. The (A) region is an area having a molecular weight of 150 to less than 500 (excluding free phenols),
The (B) region has an area with a molecular weight of 500 or more and less than 5000, and the (C) region has an area with a molecular weight of 5000 or more.
JP2000073451A 2000-03-16 2000-03-16 Phenolic resin for photoresist Pending JP2001264974A (en)

Priority Applications (1)

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Country Link
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013186233A (en) * 2012-03-07 2013-09-19 Sumitomo Bakelite Co Ltd Photoresist resin composition
KR20180122613A (en) * 2016-03-09 2018-11-13 스미토모 베이클라이트 유럽 엔.브이. Process for producing novolac alkyl phenol resin

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013186233A (en) * 2012-03-07 2013-09-19 Sumitomo Bakelite Co Ltd Photoresist resin composition
KR20180122613A (en) * 2016-03-09 2018-11-13 스미토모 베이클라이트 유럽 엔.브이. Process for producing novolac alkyl phenol resin
JP2019510123A (en) * 2016-03-09 2019-04-11 スミトモ、ベークライト、ユーロップ、ナムローゼ、フェンノートシャップSumitomo Bakelite Europe N.V. Method for producing novolak alkylphenol resin
KR102401547B1 (en) 2016-03-09 2022-05-25 스미토모 베이클라이트 유럽 엔.브이. Method for producing novolac alkylphenol resin

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