JP2001255657A - Positive type photosensitive resin composition - Google Patents

Positive type photosensitive resin composition

Info

Publication number
JP2001255657A
JP2001255657A JP2000114388A JP2000114388A JP2001255657A JP 2001255657 A JP2001255657 A JP 2001255657A JP 2000114388 A JP2000114388 A JP 2000114388A JP 2000114388 A JP2000114388 A JP 2000114388A JP 2001255657 A JP2001255657 A JP 2001255657A
Authority
JP
Japan
Prior art keywords
parts
weight
photosensitive resin
resin composition
polyimide
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000114388A
Other languages
Japanese (ja)
Inventor
Tatsuyoshi Uemitsu
達義 上光
Tsunetomo Nakano
常朝 中野
Tsugio Yamaoka
亜夫 山岡
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tohto Chemical Industry Co Ltd
Original Assignee
Tohto Chemical Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tohto Chemical Industry Co Ltd filed Critical Tohto Chemical Industry Co Ltd
Priority to JP2000114388A priority Critical patent/JP2001255657A/en
Publication of JP2001255657A publication Critical patent/JP2001255657A/en
Pending legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To provide a positive type photosensitive resin composition which satisfies heat resistance, adhesion and low dielectric properties and can form a good image. SOLUTION: The positive type photosensitive resin composition comprises (A) an organic solvent-soluble polyimide having an acid group, (B) a diethyl vinyl ether which imparts low dielectric properties and (C) a photo-acid generating agent. A coating of the photosensitive resin composition is irradiated with UV through a mask and the irradiated part is leached with an aqueous alkali solution to obtain a positive type heat resistant relief.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、半導体素子用保護
絶縁膜、液晶素子用配向膜、多層プリント基板用絶縁膜
等として有用な感光性樹脂組成物に関する。
The present invention relates to a photosensitive resin composition useful as a protective insulating film for a semiconductor device, an alignment film for a liquid crystal device, an insulating film for a multilayer printed board, and the like.

【0002】[0002]

【従来の技術】従来から感光性ポリイミドまたはその前
駆体を用いてなる耐熱性フォトレジストとその用途につ
いては良く知られており、例えばネガ型フォトレジスト
としてポリイミド前駆体にエステル結合(特開昭49−
115541)やイオン結合(特開昭54−14579
4)により光架橋する基を導入したものが実用化されて
いる。
2. Description of the Related Art Heat-resistant photoresists using photosensitive polyimides or precursors thereof and their uses are well known. For example, ester bonding to a polyimide precursor as a negative photoresist (Japanese Patent Laid-Open No. −
115541) and ionic bonds (JP-A-54-14579).
Those in which a group capable of photocrosslinking according to 4) is introduced have been put to practical use.

【0003】一方ポジ型レジストとしては、ナフトキノ
ンジアジドを可溶性ヒドロキシルイミドまたはポリオキ
サゾール前駆体に混合する方法(特公昭64−6063
0)をはじめとして各種のナフトキノンジアジドを用い
る方法が多数提案されている。また化学増幅型のポリイ
ミド(特開平3−763)も報告されている。
On the other hand, as a positive resist, a method of mixing naphthoquinonediazide with a soluble hydroxylimide or polyoxazole precursor (Japanese Patent Publication No. 64-6063).
A number of methods using various types of naphthoquinonediazides including 0) have been proposed. Also, a chemically amplified polyimide (JP-A-3-763) has been reported.

【0004】しかしながら、ネガ型ホリイミドではその
機能上、解像度に問題があったり、造膜性に問題があり
用途によっては不向きなところがある。一方ポジ型ポリ
イミドでは前駆体を使用した場合には、画像形成後の高
温処理による膜減りの問題がある。しかもこれらのポリ
イミドレジストは半導体工業における固体素子や回路基
板の保護膜、絶縁膜を形成するための材料として考案さ
れているものの、近年の情報通信機器の高周波数化へ対
応するための低誘電性化は検討されていない。従って現
状の高温処理を伴う感光性ポリイミドは、従来の非感光
性ポリイミド並みの誘電特性を有し、高温処理を伴わな
い感光性ポリイミドでは変性化剤や添加剤を含有するた
め通常のポリイミドの誘電率よドでは変性化剤や添加剤
を含有するため通常のポリイミドの誘電率より高いと予
想される。
[0004] However, the negative type polyimide has a problem in resolution in terms of its function and a problem in film forming properties, and is not suitable for some applications. On the other hand, in the case of using a positive type polyimide, when a precursor is used, there is a problem that the film is reduced due to a high temperature treatment after image formation. In addition, although these polyimide resists have been devised as materials for forming protective films and insulating films for solid-state devices and circuit boards in the semiconductor industry, they have low dielectric properties to respond to the recent trend toward higher frequencies in information and communication equipment. Has not been considered. Therefore, the photosensitive polyimide with current high-temperature treatment has dielectric properties comparable to conventional non-photosensitive polyimide, and the photosensitive polyimide without high-temperature treatment contains denaturing agents and additives. It is expected that the dielectric constant of the polyimide is higher than that of ordinary polyimide since it contains a modifying agent and additives.

【0005】[0005]

【発明が解決しようとする課題】本発明の目的は、従来
の感光性ポリイミドが有する感度や解像度等の一般的な
特性は満足した上で、低誘電性を備えた耐熱性ポジ型感
光性樹脂組成物を提供することにある。
SUMMARY OF THE INVENTION An object of the present invention is to provide a heat-resistant, positive-type photosensitive resin having low dielectric properties while satisfying the general characteristics such as sensitivity and resolution of a conventional photosensitive polyimide. It is to provide a composition.

【0006】[0006]

【課題を解決するための手段】本発明者等は鋭意検討を
重ねた結果、ポリイミド成分として一部脂環式化合物や
フッ素含有化合物(A)を使用することと、下記の
Means for Solving the Problems As a result of intensive studies, the present inventors have found that a partly alicyclic compound or a fluorine-containing compound (A) is used as a polyimide component, and

【化2】(1)で示される特定の低誘電性を与えるビニ
ルエーテル化合物(B)を光酸発生剤(C)のもとに配
合することによって、上記本発明の目的を達成できる組
成物が得られることを見い出し、本発明の完成に至っ
た。
A composition which can achieve the above object of the present invention by blending a vinyl ether compound (B) giving a specific low dielectric property shown by (1) with a photoacid generator (C) is obtained. We have found what we can do and have completed the present invention.

【化2】 Embedded image

【0007】即ち、本発明の耐熱性ポジ型感光性ポリイ
ミドは、従来ポリイミドの合成に使用されてきた酸無水
物とジアミンが使用可能である。つまり酸無水物として
That is, as the heat-resistant positive photosensitive polyimide of the present invention, acid anhydrides and diamines conventionally used in the synthesis of polyimide can be used. In other words, as an acid anhydride

【化3】に示す二酸無水物である。It is a dianhydride shown in the following formula.

【化3】 Embedded image

【0008】一方、ジアミンとしてはOn the other hand, as a diamine,

【化4】に示すものと、酸基を有するものとしてAnd those having an acid group

【化5】に示すジアミンである。It is a diamine represented by the following formula.

【化4】 Embedded image

【化5】 Embedded image

【0009】低誘電性ポリイミドを合成するには、酸無
水物、ジアミンと共にフッ素含有化合物やシリコーン含
有化合物を使用することは周知であり、酸無水物ではモ
ノマー中に占めるカルボニル基の比が小さい方が優位と
か、極性基を有しないものや脂環状化合物が好ましいと
されている。
It is well known that a fluorine-containing compound or a silicone-containing compound is used together with an acid anhydride and a diamine to synthesize a low dielectric polyimide. Are preferred, those having no polar group, and alicyclic compounds are preferred.

【0010】しかし、感光性ポリイミドとして使用する
場合機能を持たせるためにあるいは用途上の特性を出す
ために、低誘電性主体に分子設計出来ない矛盾が生じ
る。用途に応じて最小限満足出来るもので従来品より低
誘電性という範囲に落ち着く。
However, when used as a photosensitive polyimide, there is a contradiction in which a molecule cannot be designed mainly for a low dielectric substance in order to provide a function or to obtain characteristics in use. It is the one that can be satisfied at least according to the application, and settles in the range of lower dielectric constant than the conventional product.

【0011】そこで本発明では、その妥協より踏み込ん
で低誘電性にするため低誘電性を付与する架橋剤として
ジエチルビニルエーテル化合物を配合する事により低誘
電性ポジ型感光性樹脂組成物を提案する。
In view of the above, the present invention proposes a low-dielectric positive photosensitive resin composition by blending a diethyl vinyl ether compound as a cross-linking agent for imparting low-dielectric properties in order to reduce the dielectric properties by taking the compromise.

【0012】エチルビニルエーテル基は酸基と熱反応に
よりエステル結合するためジエチルビニルエーテルを含
有する化合物は酸基を有するポリイミドと熱反応により
架橋し、酸基が失われるためアルカリ水溶液に不溶とな
る。ジエチルビニルエーテルとして市販の脂肪族化合物
では熱反応を行わせる段階で飛散しポリイミドが架橋し
ないことが確認されている。従って本発明では、熱反応
中に全く飛散しない沸点が高く耐熱性を有するビスフェ
ノール型の骨格を持つジエチルビニルエーテルを使用す
る。
Since the ethyl vinyl ether group is ester-bonded to the acid group by a thermal reaction, the compound containing diethyl vinyl ether crosslinks with the polyimide having an acid group by a thermal reaction, and the acid group is lost, so that the compound becomes insoluble in an aqueous alkaline solution. It has been confirmed that a commercially available aliphatic compound as diethyl vinyl ether is scattered at the stage of performing a thermal reaction and does not crosslink polyimide. Therefore, in the present invention, diethyl vinyl ether having a bisphenol type skeleton having a high boiling point and high heat resistance which is not scattered at all during the thermal reaction is used.

【0013】ビスフェノール骨格をエポキシ化した際の
誘電率の検討においてビスフェノールの芳香核に置換基
が多く付くほど、また大きく嵩張ったものが付くほど誘
電率は小さくなり、さらにビスフェノール間にフェニル
基が挿入される方が誘電率は小さくなることが報告され
ている。(住友化学 精密化学品研究所報告書1995
−I)
In examining the dielectric constant when the bisphenol skeleton is epoxidized, the more the substituents are attached to the aromatic nucleus of bisphenol, and the larger and bulky the aromatic nucleus is, the lower the dielectric constant becomes. It is reported that the dielectric constant becomes smaller when inserted. (Sumitomo Chemical Fine Chemicals Laboratory Report 1995
-I)

【0014】[0014]

【化1】(1)で示されるビニルエーテル化合物はR
1,R2,R3の置換基を有するビフェノール化合物に
2−クロロエチルビニルエーテルを反応させて得ること
が出来る。市販の脂肪族のビニルエーテルも使用する事
は出来るが、その際感光性樹脂組成物とししてプリベー
クする際に蒸発飛散しない沸点のものであれば併用する
ことも出来る。
The vinyl ether compound represented by the formula (1) is represented by R
It can be obtained by reacting 2-chloroethyl vinyl ether with a biphenol compound having a substituent of 1, R2 and R3. Commercially available aliphatic vinyl ethers can also be used, but they can also be used together with a photosensitive resin composition having a boiling point that does not evaporate and scatter during prebaking.

【0015】ビニルエーテル化合物は前記のポリイミド
100重量部に対して1〜100部、好ましくは10〜
60重量部の範囲で含有させる。含有量が10重量部以
下では架橋が不十分のため現像時における未露光の膜減
りが大きくなり、また、含有量が60重量部以上では架
橋出来ない余分のビニルエーテルが存在するため高温加
熱時に膜減りが大きくなって最終皮膜の物性に悪影響を
及ぼして好ましくない。
The vinyl ether compound is used in an amount of 1 to 100 parts, preferably 10 to 100 parts by weight, based on 100 parts by weight of the polyimide.
It is contained in the range of 60 parts by weight. When the content is 10 parts by weight or less, the unexposed film is greatly reduced during development due to insufficient crosslinking, and when the content is 60 parts by weight or more, excess vinyl ether that cannot be cross-linked is present, so that the film is heated at a high temperature. It is not preferable because the decrease is large and the physical properties of the final film are adversely affected.

【0016】本発明の感光性樹脂組成物の一つである光
酸発生剤としてはジアリルスルホニウム塩、トリアリル
スルホニウム塩、ジアニシルフェナシルスルホニウム塩
などのオニウム塩や、芳香族テトラカルボン酸エステ
ル、芳香族スルホン酸エステル、ニトロベンジルエステ
ル、芳香族スルファミド、ナフトキノンジアジド酸エス
テルなどが挙げられる。
Examples of the photoacid generator, which is one of the photosensitive resin compositions of the present invention, include onium salts such as diallylsulfonium salts, triallylsulfonium salts, dianisylphenacylsulfonium salts, aromatic tetracarboxylic acid esters, and aromatic tetracarboxylic acid esters. Aliphatic sulfonic acid esters, nitrobenzyl esters, aromatic sulfamides, naphthoquinonediazido acid esters and the like.

【0017】これらの化合物は前記のポリイミド100
重量部に対して1〜50重量部、好ましくは1〜20重
量部の範囲で含有させる。含有量が1重量部以下では光
照射した際に光感度が十分でないため溶解性コントラス
トが不鮮明となりやすく、また50重量部を超えると感
光性樹脂溶液の保存安定性が悪くなったり光照射後の現
像性にも悪影響を及ぼす。
These compounds are those of the above-mentioned polyimide 100
It is contained in an amount of 1 to 50 parts by weight, preferably 1 to 20 parts by weight based on parts by weight. When the content is 1 part by weight or less, the solubility contrast tends to be unclear due to insufficient light sensitivity when irradiated with light, and when the content is more than 50 parts by weight, the storage stability of the photosensitive resin solution is deteriorated or after light irradiation. It also has an adverse effect on developability.

【0018】本発明のポジ型感光性樹脂組成物からは以
下のような機構のもとに所望のパターンが形成される。
つまり、感光性樹脂組成物は支持体に塗布後乾燥して溶
剤を飛散させるが、この工程でビニルエーテル基はポリ
イミドの酸基と熱によって架橋反応をおこす。この後塗
布膜にマスクを通して露光すれば光照射された部分は光
酸発生剤が作用して酸を発生する。この露光された塗布
膜を加熱すれば発生していた酸が熱によってビニルエー
テル基とポリイミドの酸基の結合を分解する。分解され
た露光部は、以前の酸基を有したポリイミドにもどりア
ルカリ可溶性となり非露光部との溶解コントラストが生
じて所望のポジ型パターンを得ることが出来る。
A desired pattern is formed from the positive photosensitive resin composition of the present invention under the following mechanism.
In other words, the photosensitive resin composition is applied to the support and then dried to disperse the solvent. In this step, the vinyl ether group undergoes a crosslinking reaction with the acid group of the polyimide by heat. Thereafter, when the coating film is exposed through a mask, the photo-irradiated portion acts on the irradiated portion to generate an acid. When the exposed coating film is heated, the generated acid decomposes the bond between the vinyl ether group and the acid group of the polyimide by heat. The decomposed exposed portion returns to the previous polyimide having an acid group, becomes alkali-soluble, and has a dissolution contrast with the non-exposed portion, so that a desired positive pattern can be obtained.

【0019】本発明のポジ型感光性樹脂組成物による画
像形成方法は、まず該組成物を適当な支持体、例えばシ
リコンウェハー、アルミ基板、銅板等に塗布する。塗布
は、スピンナーによる回転塗布、スプレー、浸漬、印
刷、ロールコーティングなどで行う。次に、90〜13
0℃でプリベークして塗膜を乾燥後、所望のパターン形
状に紫外線照射する。次に、80〜150℃でポストベ
ークして照射部を現像液で溶解除去する。現像液として
は、水酸化ナトリウム、水酸化カリウム、炭酸ナトリウ
ム、ケイ酸ナトリウムなどの無機アルカリ類、エチルア
ミン、n−プロピルアミン、等の第一アミン類、ジエチ
ルアミン、ジ−n−プロピルアミン等の第二アミン類、
トリエチルアミン、メチルジエチルアミン等の第三アミ
ン、ジメチルエタノールアミン、トリエタノールアミ
ン、等のアルコールアミン類、テトラメチルアンモニウ
ムヒドロキシド、テトラエチルアンモニウムヒドロキシ
ド、等の第四級アンモニウム塩等のアルカリ類の水溶
液、およびこれにメタノール、エタノールのごときアル
コール類等の水溶性有機溶剤や界面活性剤を適当量添加
した水溶液を好適に使用することが出来る。最後に現像
によって形成したレリーフパターンは蒸留水ないしアル
コール含有蒸留水によってリンスされる。
In the image forming method using the positive photosensitive resin composition of the present invention, the composition is first applied to a suitable support, for example, a silicon wafer, an aluminum substrate, a copper plate or the like. Coating is performed by spin coating using a spinner, spraying, dipping, printing, roll coating, or the like. Next, 90-13
After pre-baking at 0 ° C. and drying the coating film, it is irradiated with ultraviolet rays in a desired pattern shape. Next, post-baking is performed at 80 to 150 ° C. to dissolve and remove the irradiated portion with a developer. Examples of the developer include inorganic alkalis such as sodium hydroxide, potassium hydroxide, sodium carbonate and sodium silicate; primary amines such as ethylamine and n-propylamine; and secondary amines such as diethylamine and di-n-propylamine. Diamines,
Triethylamine, tertiary amines such as methyldiethylamine, dimethylethanolamine, alcoholamines such as triethanolamine, tetramethylammonium hydroxide, aqueous solutions of alkalis such as quaternary ammonium salts such as tetraethylammonium hydroxide, and An aqueous solution to which an appropriate amount of a water-soluble organic solvent such as alcohol such as methanol or ethanol or a surfactant is added can be suitably used. Finally, the relief pattern formed by development is rinsed with distilled water or distilled water containing alcohol.

【0020】本発明による感光性樹脂組成物は半導体用
途のみならず、多層回路の層間絶縁やフレキシブル銅張
板のカバーコート、ソルダーレジスト膜や液晶配向膜と
しても有用である。
The photosensitive resin composition according to the present invention is useful not only for semiconductor applications but also for interlayer insulation of multilayer circuits, cover coats of flexible copper clad boards, solder resist films and liquid crystal alignment films.

【0021】以下実施例により本発明を具体的に説明す
る。 実施例1.ポリイミドの合成 錠型攪拌機、窒素導入管及び凝集水捕集管付コンデンサ
ーを備えた、1lの四つ口フラスコにマレイン化メチル
シクロヘキサン四塩基無水物13.2重量部と3,5ジ
アミノ安息香酸15.2重量部を仕込み、N−メチルピ
ロリドン100重量部、トルエン20重量部、リン酸2
−エチルヘキシル3重量部を溶解した液を窒素雰囲気
下、室温で攪拌し、一時間後にあらかじめ185℃に加
熱しておいたオイルバスに浸し、2時間反応させる。そ
の後オイルバスをはずして反応器を室温に戻しビシクロ
オクテン酸二無水物24.8重量部、ジアミノオキシシ
ラン46.7重量部、N−メチルピロリドン100重量
部、トルエン20重量部を注入する。同様に室温で1時
間攪拌後185℃のオイルバスに浸し4時間反応させ黒
色高粘度のポリイミド溶液が得られる。この溶液を攪拌
中のメタノールに滴下して生じる灰白色の沈殿物は乾燥
後83.6重量部であった。(酸価59.3)ジエチルビニルエーテルの合成 2,2−ビス(4−ヒドロキシフェニル)ヘキサフルオ
ロプロパン33.6重量部とジメチルスルホキシド50
重量部を1l四つ口セパラブル平底フラスコに入れ窒素
雰囲気下にて室温で攪拌して溶解させる。粉末にしたカ
性ソーダ10重量部を添加し、ホットプレートの外温を
90℃にして30分攪拌する。その後、2−クロロエチ
ルビニルエーテル32.0重量部を2時間かけて滴下す
る。外温を90℃に保ったまま4時間攪拌し続ける。そ
の後、水200重量部、メチルエチルケトン300重量
部を注入して下層のアルカリ水溶層が中性を示すまで水
洗する。上層のメチルエチルケトン層は乾燥剤を入れて
6時間放置後濾過してロータリーエバポレーターで溶剤
を除けば2,2−ビス(4−ヒドロキシフェニル)ヘキ
サフルオロプロパンのジエチルビニルエーテル(BIS
−AF−DEVE)43重量部が得られた。光酸発生剤ジメトキシアントラセン−2−スルホン酸ジ
フェニルヨードニウム塩(DIAS)の合成 9,10−ジメトキシアントラセン−2−スルホン酸ソ
ーダ17重量部を亜鉛粉末5重量部、エタノール10重
量部を80℃の20%カ性ソーダ水溶液20重量部に溶
解し硫酸ジメチル30重量部を滴下する。室温に冷却し
沈殿物を得る。この沈殿物を精製したもの2重量部を8
0℃の水200重量部に溶かしジフェニルヨードニウム
クロライド2.1重量部を125重量部の80℃の湯に
溶かしたものを加え30分間反応を行う。これを冷却す
れば9,10−ジメトキシアントラセン−2−スルホン
酸ジフェニルヨードニウム塩の白色結晶が得られる。再
結、濾過、乾燥後の結晶は2.5重量部であった。感光性樹脂組成物の調製 実施例1で合成したポリイミド100重量部、フッ素含
有ビニルエーテル30重量部、光酸発生剤DIAS3重
量部をジエチレングリコールモノブチルエーテルに溶解
させ0.2μmのテフロン(登録商標)フィルターで濾
過し感光性ワニスを得た。
Hereinafter, the present invention will be described specifically with reference to examples. Embodiment 1 FIG. 13.2 parts by weight of maleic methylcyclohexane tetrabasic anhydride and 3,5 diaminobenzoic acid 15 in a 1 l four-necked flask equipped with a polyimide synthetic tablet stirrer, a condenser with a nitrogen inlet tube and a flocculated water collecting tube. 2 parts by weight, 100 parts by weight of N-methylpyrrolidone, 20 parts by weight of toluene,
-A solution in which 3 parts by weight of ethylhexyl is dissolved is stirred at room temperature under a nitrogen atmosphere, and after one hour, immersed in an oil bath which has been heated to 185 ° C in advance, and reacted for 2 hours. Thereafter, the oil bath was removed, the reactor was returned to room temperature, and 24.8 parts by weight of bicyclooctenoic dianhydride, 46.7 parts by weight of diaminooxysilane, 100 parts by weight of N-methylpyrrolidone, and 20 parts by weight of toluene were injected. Similarly, after stirring at room temperature for 1 hour, the mixture is immersed in an oil bath at 185 ° C. and reacted for 4 hours to obtain a black highly viscous polyimide solution. This solution was dropped into methanol while stirring, and an off-white precipitate produced was 83.6 parts by weight after drying. (Acid value: 59.3) Synthesis of diethyl vinyl ether 33.6 parts by weight of 2,2-bis (4-hydroxyphenyl) hexafluoropropane and 50 parts of dimethyl sulfoxide
The weight part is put into a 1 l four-necked separable flat bottom flask and dissolved by stirring at room temperature under a nitrogen atmosphere. 10 parts by weight of powdered sodium hydroxide is added, and the external temperature of the hot plate is set to 90 ° C., followed by stirring for 30 minutes. Thereafter, 32.0 parts by weight of 2-chloroethyl vinyl ether is added dropwise over 2 hours. The stirring is continued for 4 hours while maintaining the external temperature at 90 ° C. Thereafter, 200 parts by weight of water and 300 parts by weight of methyl ethyl ketone are injected, and the mixture is washed with water until the lower alkaline aqueous layer shows neutrality. The upper methyl ethyl ketone layer was put in a desiccant, left for 6 hours, filtered, and the solvent was removed with a rotary evaporator, and diethyl vinyl ether (BIS) of 2,2-bis (4-hydroxyphenyl) hexafluoropropane was removed.
-AF-DEV) 43 parts by weight were obtained. Photoacid generator dimethoxyanthracene-2-sulfonic acid di
Synthesis of phenyliodonium salt (DIAS) 17 parts by weight of sodium 9,10-dimethoxyanthracene-2-sulfonate were dissolved in 5 parts by weight of zinc powder, and 10 parts by weight of ethanol were dissolved in 20 parts by weight of a 20% aqueous solution of sodium hydroxide at 80 ° C. 30 parts by weight of dimethyl sulfate are added dropwise. Cool to room temperature to obtain a precipitate. 2 parts by weight of the purified precipitate was added to 8 parts by weight.
A solution prepared by dissolving 2.1 parts by weight of diphenyliodonium chloride in 200 parts by weight of water at 0 ° C. and 125 parts by weight of hot water at 80 ° C. is added, and a reaction is carried out for 30 minutes. When this is cooled, white crystals of 9,10-dimethoxyanthracene-2-sulfonic acid diphenyliodonium salt are obtained. The crystals after reconsolidation, filtration and drying were 2.5 parts by weight. Preparation of Photosensitive Resin Composition 100 parts by weight of the polyimide synthesized in Example 1, 30 parts by weight of fluorine-containing vinyl ether, and 3 parts by weight of a photoacid generator DIAS were dissolved in diethylene glycol monobutyl ether and filtered with a 0.2 μm Teflon (registered trademark) filter. After filtration, a photosensitive varnish was obtained.

【0022】特性評価 この感光性ワニスをシリコンウェハー上にスピンコート
した後120℃のホットプレート上に10分間置いて膜
厚3μmの塗膜を得た。この塗膜ウェハー上にテストマ
スクを密着させ365nmの光を200mJ照射した。
さらに120℃のホットプレート上で10分間加熱後5
%カ性カリ水溶液に2分間浸漬後純水で30秒間リンス
した。その結果良好な20μmのL/Sおよびビアホー
ルが観察された。この感光性ワニスをステンレス板にコ
ートして200℃30分オーブンで乾燥させたフィルム
について誘電率を測定したところ3.0(1MHZ)で
あった。
Evaluation of Characteristics The photosensitive varnish was spin-coated on a silicon wafer and then placed on a hot plate at 120 ° C. for 10 minutes to obtain a coating having a thickness of 3 μm. A test mask was brought into close contact with the coated film wafer and irradiated with light of 365 nm at 200 mJ.
After heating on a hot plate at 120 ° C for 10 minutes, 5
After immersing in a 2% aqueous solution of potassium hydroxide for 2 minutes, the substrate was rinsed with pure water for 30 seconds. As a result, good 20 μm L / S and via holes were observed. The photosensitive varnish was coated on a stainless steel plate and dried at 200 ° C. for 30 minutes in an oven. The dielectric constant of the film was 3.0 (1 MHZ).

【0023】実施例2 実施例1の装置を用いてマレイン化メチルシクロヘキセ
ン四塩化酸無水物10.6重量部、1,4ビス(4−ア
ミノフェノキシ)ベンゼン7.3重量部、3,3’ジヒ
ドロキシ−4,4’ジアミノビフェニル3.2重量部を
同時に仕込み同様にして合成した酸価85.5のポリイ
ミド10重量部に対しジエチルビニルエーテルBIS−
3M6C−P−DEVE((1)式においてR1: H 3重量部、DIAS 0.3重量部を含有するN−メチ
ルピロリドン溶液をロールコータで銅箔上にコートし、
120℃4分熱風乾燥機中でプリベークした。この膜厚
7μmの塗膜にテストマスクを密着させて3KWの超高
圧水銀灯を用いて300mJ照射した。直ちに120℃
で2分間ポストベークして10%のカ性カリ水溶液に5
分間浸漬後、純水で30秒リンスした。30μmのL/
Sとビアホールが観察された。この感光性ワニスをステ
ンレス板にコートして200℃30分オーブンで乾燥さ
せたフィルムについて誘電率を測定したところ2.9
(1MHZ)であった。
Example 2 Using the apparatus of Example 1, 10.6 parts by weight of maleated methylcyclohexene tetrachloric anhydride, 7.3 parts by weight of 1,4 bis (4-aminophenoxy) benzene, 3,3 ' 3.2 parts by weight of dihydroxy-4,4'diaminobiphenyl were simultaneously charged and 10 parts by weight of a polyimide having an acid value of 85.5 synthesized in the same manner and diethyl vinyl ether BIS-
3M6CP-DEV (in the formula (1), R1: H An N-methylpyrrolidone solution containing 3 parts by weight and 0.3 parts by weight of DIAS was coated on a copper foil with a roll coater,
Prebaked in a hot air dryer at 120 ° C for 4 minutes. A test mask was brought into close contact with the coating film having a thickness of 7 μm, and irradiation was performed at 300 mJ using a 3 KW ultrahigh pressure mercury lamp. Immediately 120 ° C
And post-bake for 2 minutes in 10% potassium hydroxide solution
After immersion for minutes, it was rinsed with pure water for 30 seconds. 30 μm L /
S and via holes were observed. The photosensitive varnish was coated on a stainless steel plate and dried at 200 ° C. for 30 minutes in an oven.
(1 MHZ).

【0024】実施例3 実施例1の装置を用いてマレイン化メチルシクロヘキセ
ン四塩化酸無水物10.6重量部、3,9−ビス(3−
アミノプロピル)2,4,8,10−テトラオキサスピ
ロ[5,5]ウンデカン5.0重量部、ジアミノ安息香
酸3.4重量部を同時に仕込み合成した酸価65.0の
ポリイミド10部に対しBIS−AF−DEVE3部、
DISA0.3部を含有するN−メチルピロリドン溶液
をバーコーターで銅箔上にコートした。120℃、10
分間ホットプレート上に放置した後の膜厚は12μmで
あった。これにテストマスクを密着させ365nmの光
を300mJ照射させ、120℃のホットプレート上に
10分間静置後5%カ性カリ水溶液に2分間浸漬して3
0μmのL/Sとビアホールが得られた。この感光性ワ
ニスをフィルム化して誘電率を測定したところ2.8
(1MHZ)であった。
Example 3 Using the apparatus of Example 1, 10.6 parts by weight of maleated methylcyclohexenetetrachloric anhydride, 3,9-bis (3-
Aminopropyl) 5.0 parts by weight of 2,4,8,10-tetraoxaspiro [5,5] undecane and 3.4 parts by weight of diaminobenzoic acid were simultaneously charged and synthesized with 10 parts of polyimide having an acid value of 65.0. BIS-AF-DEV3 part,
An N-methylpyrrolidone solution containing 0.3 parts of DISA was coated on a copper foil with a bar coater. 120 ° C, 10
The film thickness after being left on a hot plate for 12 minutes was 12 μm. A test mask was brought into close contact with this and irradiated with 300 mJ of light at 365 nm, allowed to stand on a hot plate at 120 ° C. for 10 minutes, and then immersed in a 5% potassium hydroxide aqueous solution for 2 minutes.
An L / S of 0 μm and a via hole were obtained. This photosensitive varnish was formed into a film, and the dielectric constant was measured.
(1 MHZ).

【0025】比較例1 実施例2の組成においてジエチルビニルエーテルとして
DIS−3M6C−P−DEVEの代わりにビスフェノ
ールAのDEVEを使用したところパターン形成に何ら
不都合はなかったが誘電率は3.3(1MHZ)であっ
た。
COMPARATIVE EXAMPLE 1 When the DEV of bisphenol A was used as the diethyl vinyl ether in place of DIS-3M6C-P-DEV in the composition of Example 2, there was no inconvenience in pattern formation, but the dielectric constant was 3.3 (1 MHZ). )Met.

【0026】比較例2 実施例3のポリイミド合成においてマレイン化メチルシ
クロヘキセン四塩化酸無水物10.6重量部、3,9−
ビス(3−アミノプロピル)2,4,8,10−テトラ
オキサスピロ[5,5]ウンデカン6.9重量部、ジア
ミノ安息香酸2.3重量部よりなる酸価42のポリイミ
ド10部に対し、BIS−AF−DEVE3部、DIS
A0.3部の組成よりなる感光性ポリイミドでは塗布し
た膜は脆く現像によるコントラストのあるパターン形成
は出来ず全体が最終的に流れた。
Comparative Example 2 In the synthesis of the polyimide of Example 3, 10.6 parts by weight of maleated methylcyclohexenetetrachloric anhydride, 3,9-
With respect to 10 parts of polyimide having an acid value of 42 consisting of 6.9 parts by weight of bis (3-aminopropyl) 2,4,8,10-tetraoxaspiro [5,5] undecane and 2.3 parts by weight of diaminobenzoic acid, BIS-AF-DEV3 part, DIS
With photosensitive polyimide having a composition of A0.3 parts, the applied film was brittle and a pattern having a contrast could not be formed by development, and the whole flowed finally.

フロントページの続き (51)Int.Cl.7 識別記号 FI テーマコート゛(参考) G03F 7/029 G03F 7/029 7/037 501 7/037 501 H01L 21/027 H01L 21/30 502R Fターム(参考) 2H025 AA01 AA02 AA10 AB15 AB16 AB17 AC01 AD03 BE00 BE07 BE10 CA43 CB25 CC17 FA01 FA12 4J002 CM041 EE056 EH146 EV246 EV296 FD206 GP03 4J043 PA15 PC015 PC016 PC065 PC145 PC165 QB15 QB26 RA35 SA05 SA54 TA22 UA082 UA121 UA122 UA131 UA132 UA141 UB011 UB021 UB061 UB062 UB121 UB302 UB331 UB401 UB402 VA011 VA021 VA031 VA051 VA071 VA091 VA101 YB02 YB19 YB21 ZA43 ZB22 Continued on the front page (51) Int.Cl. 7 Identification symbol FI Theme coat II (reference) G03F 7/029 G03F 7/029 7/037 501 7/037 501 H01L 21/027 H01L 21/30 502R F-term (reference) 2H025 AA01 AA02 AA10 AB15 AB16 AB17 AC01 AD03 BE00 BE07 BE10 CA43 CB25 CC17 FA01 FA12 4J002 CM041 EE056 EH146 EV246 EV296 FD206 GP03 4J043 PA15 PC015 PC016 PC065 PC145 PC165 QB15 QB26 RA35 SA05 SA12 TA1 UA1 UA1 UA1 UA1 UB331 UB401 UB402 VA011 VA021 VA031 VA051 VA071 VA091 VA101 YB02 YB19 YB21 ZA43 ZB22

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】酸基含有有機溶媒可溶性ポリイミド
(A)、一般式(1)で表わされる(化1)の構造のジ
エチルビニルエーテル(B)および光酸発生剤(C)を
必須成分とするポジ型感光性樹脂組成物において、各成
分の配合割合が重量比で(B)/(A)=10〜60/
100、(C)/(A)=1〜20/100であること
を特徴とするポジ型感光性樹脂組成物。 【化1】
An organic solvent-soluble polyimide containing an acid group (A), diethyl vinyl ether (B) having a structure represented by the general formula (1) and a photoacid generator (C) as essential components. In the photosensitive resin composition, the mixing ratio of each component is (B) / (A) = 10 to 60 / by weight ratio.
100, wherein (C) / (A) = 1 to 20/100. Embedded image
【請求項2】酸基含有有機溶媒可溶性ポリイミド(A)
の酸価が50〜150(KOHmg/g)であることを
特徴とするポジ型感光性樹脂組成物。
2. A polyimide (A) soluble in an organic solvent containing an acid group.
Wherein the acid value of the positive photosensitive resin composition is 50 to 150 (KOH mg / g).
【請求項3】芳香族含有ジエチルビニルエーテル(B)
とエチルビニルエーテル基の割合が重量比で(B)/−
CHCHOCH=CH≧5.2であることを特徴
とするポジ型感光性樹脂組成物。
3. An aromatic-containing diethyl vinyl ether (B).
And the ratio of ethyl vinyl ether groups is (B) /-
A positive photosensitive resin composition, wherein CH 2 CH 2 OCH = CH 2 ≧ 5.2.
JP2000114388A 2000-03-13 2000-03-13 Positive type photosensitive resin composition Pending JP2001255657A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000114388A JP2001255657A (en) 2000-03-13 2000-03-13 Positive type photosensitive resin composition

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000114388A JP2001255657A (en) 2000-03-13 2000-03-13 Positive type photosensitive resin composition

Publications (1)

Publication Number Publication Date
JP2001255657A true JP2001255657A (en) 2001-09-21

Family

ID=18626200

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
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Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002097532A1 (en) * 2001-05-30 2002-12-05 Kaneka Corporation Photosensitive resin composition and photosensitive dry film resist and photosensitive cover ray film using the same
JP2006313237A (en) * 2005-05-09 2006-11-16 Hitachi Chemical Dupont Microsystems Ltd Positive photosensitive resin composition, method for manufacturing pattern, and electronic component
JP2008107419A (en) * 2006-10-23 2008-05-08 Pi R & D Co Ltd Positive photosensitive resin composition and photosensitive dry film
US7923173B1 (en) 2000-10-19 2011-04-12 Illinois Tool Works Inc. Photo definable polyimide film used as an embossing surface
US8501393B2 (en) * 2004-05-14 2013-08-06 Nissan Chemical Industries, Ltd. Anti-reflective coating forming composition containing vinyl ether compound
WO2016124493A1 (en) 2015-02-02 2016-08-11 Basf Se Latent acids and their use

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7923173B1 (en) 2000-10-19 2011-04-12 Illinois Tool Works Inc. Photo definable polyimide film used as an embossing surface
WO2002097532A1 (en) * 2001-05-30 2002-12-05 Kaneka Corporation Photosensitive resin composition and photosensitive dry film resist and photosensitive cover ray film using the same
KR100879668B1 (en) * 2001-05-30 2009-01-21 가부시키가이샤 가네카 Photosensitive resin composition and photosensitive dry film resist and photosensitive cover ray film using the same
US8501393B2 (en) * 2004-05-14 2013-08-06 Nissan Chemical Industries, Ltd. Anti-reflective coating forming composition containing vinyl ether compound
JP2006313237A (en) * 2005-05-09 2006-11-16 Hitachi Chemical Dupont Microsystems Ltd Positive photosensitive resin composition, method for manufacturing pattern, and electronic component
JP2008107419A (en) * 2006-10-23 2008-05-08 Pi R & D Co Ltd Positive photosensitive resin composition and photosensitive dry film
WO2016124493A1 (en) 2015-02-02 2016-08-11 Basf Se Latent acids and their use
US9994538B2 (en) 2015-02-02 2018-06-12 Basf Se Latent acids and their use

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