JP2001151929A - Method for manufacturing porous polyimide film and film - Google Patents

Method for manufacturing porous polyimide film and film

Info

Publication number
JP2001151929A
JP2001151929A JP33744599A JP33744599A JP2001151929A JP 2001151929 A JP2001151929 A JP 2001151929A JP 33744599 A JP33744599 A JP 33744599A JP 33744599 A JP33744599 A JP 33744599A JP 2001151929 A JP2001151929 A JP 2001151929A
Authority
JP
Japan
Prior art keywords
film
porous
polyimide
polyimide precursor
poor solvent
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP33744599A
Other languages
Japanese (ja)
Other versions
JP3687448B2 (en
Inventor
Kenji Fukunaga
謙二 福永
Yukihiko Asano
之彦 浅野
Shigeru Yao
滋 八尾
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ube Corp
Original Assignee
Ube Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ube Industries Ltd filed Critical Ube Industries Ltd
Priority to JP33744599A priority Critical patent/JP3687448B2/en
Priority to US09/539,929 priority patent/US20030129379A1/en
Publication of JP2001151929A publication Critical patent/JP2001151929A/en
Priority to US10/785,413 priority patent/US7303811B2/en
Priority to US10/784,982 priority patent/US20040241419A1/en
Application granted granted Critical
Publication of JP3687448B2 publication Critical patent/JP3687448B2/en
Priority to US11/516,045 priority patent/US7311966B2/en
Priority to US11/802,557 priority patent/US20070275222A1/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To provide a method for manufacturing a film having a porous layer in the central part thereof and dense layers on the both surfaces in a simple operation. SOLUTION: The method for manufacturing a porous polyimide film having dense layers on the both surfaces thereof and the central part comprising a porous layer comprises imidization by a heat treatment of a film-like composition (C) comprising a homogeneous solution (A) of a polyimide precursor and a poor solvent of the polyimide precursor, the poor solvent (B) having a boiling point or a thermal decomposition temperature higher than or equal to the imidization initiation temperature of the polyimide precursor.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、両表面に緻密層を
有し中央部が多孔質層である多孔質ポリイミドフィルム
の製造法およびフィルムに関し、特に、電子分野で有用
な低誘電率フィルムに関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for producing a porous polyimide film having a dense layer on both surfaces and a porous layer in the center, and more particularly to a low dielectric constant film useful in the electronic field. .

【0002】[0002]

【従来の技術】従来より耐熱性、耐薬品性、機械的強度
に優れたポリイミド多孔質膜として、高性能のガス分離
用途のものが知られている。このガス分離用ポリイミド
多孔質膜は、例えば、特開昭49−45152号公報に
記載されているように、芳香族テトラカルボン酸二無水
物と芳香族ジアミンとの重合反応によって得られたポリ
アミック酸の溶液を液状の薄膜に流延し、該薄膜を非溶
媒中でイミド化しながら析出する、芳香族ポリイミドガ
ス分離膜の製造方法によって得られる。
2. Description of the Related Art Hitherto, a porous polyimide membrane having excellent heat resistance, chemical resistance and mechanical strength has been known for high performance gas separation. As described in JP-A-49-45152, for example, a polyamic acid obtained by a polymerization reaction between an aromatic tetracarboxylic dianhydride and an aromatic diamine is used as the porous polyimide membrane for gas separation. Is cast onto a liquid thin film, and the thin film is precipitated while being imidized in a non-solvent by a method for producing an aromatic polyimide gas separation membrane.

【0003】また、テトラカルボン酸二無水物と芳香族
ジアミンとの重縮合反応で得られたポリアミック酸の溶
液を調製し、そのポリアミック酸の溶液で液状の薄膜を
形成し、その薄膜を非溶媒中で析出し、最後にそのポリ
アミック酸の半透膜を製造する方法によって得られる。
さらに、ポリアミック酸の溶液で薄膜を形成しながら一
部イミド化を進めて、その薄膜を非溶媒中で析出し、最
後にそのポリアミック酸−イミドの半透膜を加熱してイ
ミド化を完結させてポリイミドの半透膜を製造する方法
が知られている。また、ポリアミック酸の液状の薄膜
を、イミド化剤含有非溶媒中で、イミド化しながら析出
し、得られたイミド膜を加熱する方法が知られている。
そして、溶媒中に溶解したポリアミック酸をフィルム状
に流延した後、非溶媒と接触させてポリアミック酸の相
分離析出を誘起する方法が知られている。
Further, a solution of a polyamic acid obtained by a polycondensation reaction between a tetracarboxylic dianhydride and an aromatic diamine is prepared, a liquid thin film is formed with the solution of the polyamic acid, and the thin film is mixed with a non-solvent. And finally obtained by a method for producing a semipermeable membrane of the polyamic acid.
Furthermore, while partially forming imidation while forming a thin film with a solution of polyamic acid, the thin film is deposited in a non-solvent, and finally, the semipermeable membrane of polyamic acid-imide is heated to complete imidization. There is known a method for producing a semipermeable membrane of polyimide by using the method. Further, a method is known in which a liquid thin film of a polyamic acid is precipitated in an imidizing agent-containing non-solvent while being imidized, and the obtained imide film is heated.
Then, a method is known in which a polyamic acid dissolved in a solvent is cast into a film and then brought into contact with a non-solvent to induce phase separation and precipitation of the polyamic acid.

【0004】これらの製造法によるポリイミド多孔質膜
は、非溶媒と接触する一方の面に緻密層が他方の面に多
孔質層が形成され、膜表面に形成された上記緻密層はガ
スの分離能を発現する。しかし、このようなポリイミド
多孔質膜は、上記片面の多孔質層が多孔構造のために塗
布タイプの接着剤が使用される低誘電率フィルムとして
適しているとはいえなかった。
[0004] The polyimide porous membrane produced by these methods has a dense layer formed on one surface and a porous layer formed on the other surface in contact with a non-solvent. Express the ability. However, such a polyimide porous film cannot be said to be suitable as a low dielectric constant film in which a coating type adhesive is used because the porous layer on one side has a porous structure.

【0005】一方、低誘電率ポリマ−フィルムとして、
特開平9−100363号公報には低誘電率発砲樹脂フ
ィルムとラミネ−トとからなる低誘電率プラスチック絶
縁フィルムが開示されている。そして、具体例として発
砲体の両面を多孔質でないフィルムで張り付けたものが
記載されている。つまり、表面層は発砲のない平坦なフ
ィルムが好適であるとされる。
On the other hand, as a low dielectric constant polymer film,
Japanese Patent Application Laid-Open No. Hei 9-100363 discloses a low dielectric constant plastic insulating film composed of a low dielectric constant foamed resin film and a laminate. As a specific example, a foam body in which both surfaces are bonded with a non-porous film is described. That is, it is considered that a flat film without firing is suitable for the surface layer.

【0006】[0006]

【発明が解決しようとする課題】しかし、上記の製造法
では低誘電率発砲樹脂フィルムと多孔質でないフィルム
との積層という2種類の基材と接着剤が必要であり、接
着剤によってはかえって低誘電率プラスチック絶縁フィ
ルムの耐熱性が低下したり、また2種類の基材を積層す
るという工程が必要であった。本発明の目的は、簡単な
操作でフィルム中央部に多孔質層を有し且つ両表面に緻
密層を有するフィルムの製造法を提供することである。
また、本発明の他の目的は、簡単な操作で得られるフィ
ルム中央部に多孔質層を有し且つ両表面に緻密層を有す
る多孔質フィルムおよび低誘電率フィルムを提供するこ
とである。
However, the above-mentioned production method requires two kinds of base materials, that is, a laminate of a low dielectric constant foamed resin film and a non-porous film, and an adhesive. The heat resistance of the dielectric plastic insulating film is reduced, and a step of laminating two types of base materials is required. An object of the present invention is to provide a method for producing a film having a porous layer at the center of the film and a dense layer on both surfaces by a simple operation.
Another object of the present invention is to provide a porous film and a low dielectric constant film having a porous layer at the center of the film and a dense layer on both surfaces obtained by a simple operation.

【0007】[0007]

【課題を解決するための手段】本発明は、ポリイミド前
駆体の均一溶液(A)と、該ポリイミド前駆体の貧溶媒
(B)からなるフィルム状組成物(C)であって、上記
貧溶媒はポリイミド前駆体のイミド化開始温度より高い
温度あるいはそれと同等の温度に沸点または熱分解点を
有し、前記フィルム状組成物を加熱処理してイミド化す
ることを特徴とするフィルム両面に緻密層を有し、フィ
ルム中央部は多孔質層からなる多孔質ポリイミドフィル
ムの製造法に関する。また、本発明は、上記の製造法に
よって得られる多孔質ポリイミドフィルムを構成要素と
して含む単層または複層の多孔質フィルムに関する。ま
た、本発明は、上記の製造法によって得られる多孔質ポ
リイミドからなる低誘電率フィルムに関する。
The present invention provides a film composition (C) comprising a homogeneous solution (A) of a polyimide precursor and a poor solvent (B) of the polyimide precursor, wherein the poor solvent is Has a boiling point or a thermal decomposition point at a temperature higher than or equal to the imidation start temperature of the polyimide precursor, and heat-treats the film-like composition to imidize the film, characterized in that a dense layer is formed on both surfaces of the film. And a film central portion relates to a method for producing a porous polyimide film comprising a porous layer. The present invention also relates to a single-layer or multi-layer porous film containing, as a constituent element, the porous polyimide film obtained by the above-mentioned production method. The present invention also relates to a low-dielectric-constant film made of a porous polyimide obtained by the above production method.

【0008】[0008]

【発明の実施の形態】以下に本発明の好ましい態様を列
記する。 1)ポリイミド前駆体の均一溶液(A)が、ポリイミド
前駆体0.3〜60重量%と良溶媒99.7〜40重量
%からなるものである上記の多孔質ポリイミドフィルム
の製造法。 2)フィルム状組成物(C)が、ポリイミド前駆体の均
一溶液(A)100重量部に対して貧溶媒(B)10〜
40重量部を加えて均一な混合溶液とし、この混合溶液
を基板上に流延することによって得られるものである上
記の多孔質ポリイミドフィルムの製造法。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Preferred embodiments of the present invention will be listed below. 1) The method for producing a porous polyimide film described above, wherein the homogeneous solution (A) of the polyimide precursor comprises 0.3 to 60% by weight of the polyimide precursor and 99.7 to 40% by weight of a good solvent. 2) The film-form composition (C) is prepared by adding 100 parts by weight of the homogeneous solution (A) of the polyimide precursor to the poor solvent (B) 10 to 10 parts by weight.
The above method for producing a porous polyimide film, which is obtained by adding 40 parts by weight to form a uniform mixed solution and casting the mixed solution on a substrate.

【0009】3)フィルム状組成物(C)が、ポリイミ
ド前駆体の均一溶液(A)を基板上に流延して溶液フィ
ルムとし、この溶液フィルムを貧溶媒(B)の凝固浴に
浸漬してフィルム状物を析出させ、このフィルム状物を
凝固浴から取り出して得られるものである上記の多孔質
ポリイミドフィルムの製造法。 4)貧溶媒(B)が、ポリイミド前駆体を加熱処理して
イミド化が進行する工程中において、気化または熱分解
によってフィルム状組成物(C)から除去される上記の
多孔質ポリイミドフィルムの製造法。
3) The film composition (C) is prepared by casting a homogeneous solution (A) of a polyimide precursor on a substrate to form a solution film, and immersing the solution film in a coagulation bath of a poor solvent (B). The method for producing a porous polyimide film as described above, which is obtained by removing a film-like material from a coagulation bath by depositing the film-like material. 4) Production of the above porous polyimide film in which the poor solvent (B) is removed from the film-like composition (C) by vaporization or thermal decomposition during a step in which the polyimide precursor is heat-treated and imidization proceeds. Law.

【0010】5)フィルム状組成物(C)を加熱処理し
てイミド化することによって得られるフィルムが、全体
の厚さが5〜150μmであり、緻密層の厚さが各側で
10nm以上であり、さらにフィルム両側の緻密層の厚
さの和がフィルム全体の厚さの約50%以下である上記
の多孔質ポリイミドフィルムの製造法。 6)絶縁材料と金属層とを必須の構成材料として含む金
属層−絶縁材料積層体において、絶縁材料として使用さ
れる上記の製造法による低誘電率フィルム。
5) A film obtained by subjecting the film composition (C) to heat treatment and imidization has a total thickness of 5 to 150 μm and a dense layer having a thickness of 10 nm or more on each side. And the sum of the thicknesses of the dense layers on both sides of the film is not more than about 50% of the total thickness of the film. 6) A low dielectric constant film according to the above manufacturing method, which is used as an insulating material in a metal layer-insulating material laminate including an insulating material and a metal layer as essential constituent materials.

【0011】本発明におけるポリイミド前駆体とは、テ
トラカルボン酸成分とジアミン成分の好ましくは芳香族
化合物に属するモノマ−を重合して得られたポリアミッ
ク酸或いはその部分的にイミド化したものであり、加熱
処理して熱イミド化或いは化学イミド化することで閉環
してポリイミド樹脂とすることができる。ポリイミド樹
脂とは、後述のイミド化率が約50%以上の耐熱性ポリ
マ−である。
The polyimide precursor in the present invention is a polyamic acid obtained by polymerizing a monomer of a tetracarboxylic acid component and a diamine component, preferably a monomer belonging to an aromatic compound, or a partially imidized polyamic acid. By heat treatment and thermal imidization or chemical imidization, the ring can be closed to obtain a polyimide resin. The polyimide resin is a heat-resistant polymer having an imidization ratio of about 50% or more, which will be described later.

【0012】テトラカルボン酸成分と芳香族ジアミン成
分とを、有機溶媒中に大略等モル溶解、重合して、好適
には対数粘度(30℃、濃度;0.5g/100mL
NMP)が0.3以上、特に0.5〜7であるポリアミ
ック酸であるポリイミド前駆体が製造される。また、重
合を約80℃以上の温度で行った場合には、部分的に閉
環してイミド化したポリイミド前駆体が製造される。
A tetracarboxylic acid component and an aromatic diamine component are dissolved and polymerized in an approximately equimolar amount in an organic solvent, preferably with a logarithmic viscosity (30 ° C., concentration; 0.5 g / 100 mL).
A polyimide precursor which is a polyamic acid having an NMP of 0.3 or more, especially 0.5 to 7 is produced. When the polymerization is carried out at a temperature of about 80 ° C. or higher, a polyimide precursor which is partially closed and imidized is produced.

【0013】前記のポリイミド前駆体を製造するための
有機溶媒としては、パラクロロフェノ−ル、N−メチル
−2−ピロリドン(NMP)、ピリジン、N,N−ジメ
チルアセトアミド(DMAc)、N,N−ジメチルホル
ムアミド、ジメチルスルホキシド、テトラメチル尿素、
フェノ−ル、クレゾ−ルなどが挙げられる。
The organic solvent for producing the above polyimide precursor includes parachlorophenol, N-methyl-2-pyrrolidone (NMP), pyridine, N, N-dimethylacetamide (DMAc), N, N -Dimethylformamide, dimethylsulfoxide, tetramethylurea,
Phenol, cresol and the like.

【0014】前記のテトラカルボン酸成分としては、
3,3’,4,4’−ビフェニルテトラカルボン酸二無
水物(以下、s−BPDAと略記することもある)、
2,3,3’,4’−ビフェニルテトラカルボン酸二無
水物(以下、a−BPDAと略記することもある)など
のビフェニルテトラカルボン酸二無水物が好ましいが、
2,3,3’,4’−又は3,3’,4,4’−ビフェ
ニルテトラカルボン酸、あるいは2,3,3’,4’−
又は3,3’,4,4’−ビフェニルテトラカルボン酸
の塩またはそれらのエステル化誘導体であってもよい。
ビフェニルテトラカルボン酸成分は、上記の各ビフェニ
ルテトラカルボン酸類の混合物であってもよい。
The above-mentioned tetracarboxylic acid component includes:
3,3 ′, 4,4′-biphenyltetracarboxylic dianhydride (hereinafter sometimes abbreviated as s-BPDA),
Biphenyltetracarboxylic dianhydride such as 2,3,3 ′, 4′-biphenyltetracarboxylic dianhydride (hereinafter sometimes abbreviated as a-BPDA) is preferable,
2,3,3 ', 4'- or 3,3', 4,4'-biphenyltetracarboxylic acid, or 2,3,3 ', 4'-
Alternatively, a salt of 3,3 ′, 4,4′-biphenyltetracarboxylic acid or an esterified derivative thereof may be used.
The biphenyltetracarboxylic acid component may be a mixture of the above biphenyltetracarboxylic acids.

【0015】また、上記のテトラカルボン酸成分は、前
述のビフェニルテトラカルボン酸類のほかに、テトラカ
ルボン酸として、ピロメリット酸、3,3’,4,4’
−ベンゾフェノンテトラカルボン酸、2,2−ビス
(3,4−ジカルボキシフェニル)プロパン、ビス
(3,4−ジカルボキシフェニル)スルホン、ビス
(3,4−ジカルボキシフェニル)エ−テル、ビス
(3,4−ジカルボキシフェニル)チオエ−テル、ブタ
ンテトラカルボン酸、あるいはそれらの酸無水物、塩ま
たはエステル化誘導体などのテトラカルボン酸類であっ
てもよく、これらが全テトラカルボン酸成分中10モル
%以下、特に5モル%以下の割合で含有するものが好ま
しい。
The above-mentioned tetracarboxylic acid component includes pyromellitic acid, 3,3 ', 4,4' as tetracarboxylic acid in addition to the above-mentioned biphenyltetracarboxylic acids.
-Benzophenonetetracarboxylic acid, 2,2-bis (3,4-dicarboxyphenyl) propane, bis (3,4-dicarboxyphenyl) sulfone, bis (3,4-dicarboxyphenyl) ether, bis ( Tetracarboxylic acids such as (3,4-dicarboxyphenyl) thioether, butanetetracarboxylic acid, or acid anhydrides, salts or esterified derivatives thereof may be used. %, Particularly preferably 5 mol% or less.

【0016】前記の芳香族ジアミンとしては、例えば、
次式 H2N−Bz(R1m−[A−(R2nBz]l−NH2 (ただし、前記一般式において、Bzはベンゼン環で、
1またはR2は、水素、低級アルキル、低級アルコキシ
などの置換基で、Aは、独立に直接結合、O、S、C
O、SO2、SO、CH2、C(CH32などの二価の基
であり、lは0または1〜2の整数、mまたはnは1〜
4の整数である。)で示される芳香族ジアミン化合物が
好ましい。
As the aromatic diamine, for example,
Following formula H 2 N-Bz (R 1 ) m - [A- (R 2) n Bz] l -NH 2 ( where in the general formula, Bz is a benzene ring,
R 1 or R 2 is a substituent such as hydrogen, lower alkyl, lower alkoxy, etc., and A is independently a direct bond, O, S, C
A divalent group such as O, SO 2 , SO, CH 2 , C (CH 3 ) 2 , 1 is an integer of 0 or 1-2, and m or n is 1 to
4 is an integer. The aromatic diamine compound represented by the formula (1) is preferred.

【0017】前記式で示される芳香族ジアミンの具体的
な化合物としては、4,4’−ジアミノジフェニルエー
テル(以下、DADEと略記することもある)、3,
3’−ジメチル−4,4’−ジアミノジフェニルエ−テ
ル、3,3’−ジエトキシ−4,4’−ジアミノジフェ
ニルエ−テル、パラ−フェニレンジアミン(PPD)な
どが挙げられる。また上記各化合物の混合物であっても
よい。あるいは、芳香族ジアミンとしては、ジアミノピ
リジンであってもよく、具体的には、2,6−ジアミノ
ピリジン、3,6−ジアミノピリジン、2,5−ジアミ
ノピリジン、3,4−ジアミノピリジンなどが挙げられ
る。
Specific compounds of the aromatic diamine represented by the above formula include 4,4'-diaminodiphenyl ether (hereinafter sometimes abbreviated as DADE), 3,3
3'-dimethyl-4,4'-diaminodiphenyl ether, 3,3'-diethoxy-4,4'-diaminodiphenyl ether, para-phenylenediamine (PPD) and the like. Also, a mixture of the above compounds may be used. Alternatively, the aromatic diamine may be diaminopyridine, and specific examples include 2,6-diaminopyridine, 3,6-diaminopyridine, 2,5-diaminopyridine, and 3,4-diaminopyridine. No.

【0018】本発明においては、ポリイミド前駆体の均
一溶液(A)と、該ポリイミド前駆体の貧溶媒(B)と
からなるフィルム状組成物(C)を加熱処理してイミド
化する。本発明におけるポリイミド前駆体の均一溶液
(A)とは、上記のポリイミド前駆体と良溶媒とからな
るものである。このポリイミド前駆体の均一溶液(A)
は、重合溶液をそのまま使用してもよくあるいはポリイ
ミド前駆体を分離取得あるいは濃縮して良溶媒と混合し
溶解することによって得ててもよい。
In the present invention, the film-like composition (C) comprising the homogeneous solution (A) of the polyimide precursor and the poor solvent (B) of the polyimide precursor is heat-treated to imidize it. The homogeneous solution (A) of the polyimide precursor in the present invention comprises the above-mentioned polyimide precursor and a good solvent. Homogeneous solution of this polyimide precursor (A)
May be used as it is, or may be obtained by separating and obtaining or concentrating a polyimide precursor, mixing with a good solvent and dissolving.

【0019】前記のポリイミド前駆体の良溶媒として
は、パラクロロフェノ−ル、N−メチル−2−ピロリド
ン(NMP)、ピリジン、N,N−ジメチルアセトアミ
ド(DMAc)、N,N−ジメチルホルムアミド、ジメ
チルスルホキシド、テトラメチル尿素などが挙げられ
る。
Examples of good solvents for the polyimide precursor include parachlorophenol, N-methyl-2-pyrrolidone (NMP), pyridine, N, N-dimethylacetamide (DMAc), N, N-dimethylformamide, Dimethyl sulfoxide, tetramethyl urea and the like can be mentioned.

【0020】前記のポリイミド前駆体の均一溶液(A)
は、好適にはポリイミド前駆体0.3〜60重量%、特
に1〜30重量%およびポリイミド前駆体の良溶媒9
9.7〜40重量%、特に99〜70重量%からなる溶
液である。ポリイミド前駆体の割合が0.3重量%より
少ないとフィルムの機械的強度が小さくなり、ポリイミ
ド前駆体の割合が60重量%より多いと均一な溶液を得
ることが困難になるので好ましくない。また、ポリイミ
ド前駆体の均一溶液(A)は、10〜10000ポイ
ズ、特に40〜3000ポイズの溶液粘度であるものが
好ましい。ポリイミド前駆体の均一溶液(A)の溶液粘
度が10ポイズより小さいと得られる多孔質フィルムの
強度が低下するので好ましくなく、10000ポイズよ
り大きいとフィルム状に流延することが困難になるので
好ましくない。
A homogeneous solution of the above polyimide precursor (A)
Is preferably 0.3 to 60% by weight, especially 1 to 30% by weight of the polyimide precursor and a good solvent 9 for the polyimide precursor.
It is a solution consisting of 9.7 to 40% by weight, especially 99 to 70% by weight. When the proportion of the polyimide precursor is less than 0.3% by weight, the mechanical strength of the film becomes small, and when the proportion of the polyimide precursor is more than 60% by weight, it becomes difficult to obtain a uniform solution, which is not preferable. The homogeneous solution (A) of the polyimide precursor preferably has a solution viscosity of 10 to 10,000 poise, particularly 40 to 3000 poise. If the solution viscosity of the homogeneous solution (A) of the polyimide precursor is less than 10 poise, the strength of the obtained porous film is decreased, and if it is more than 10,000 poise, it is difficult to cast the film into a film. Absent.

【0021】前記のポリイミド前駆体の貧溶媒(B)と
しては、該ポリイミド前駆体のイミド化開始温度(通
常、170℃程度)より高い温度あるいはそれと同等の
温度に沸点または熱分解温点を有する溶媒が使用され
る。このような溶媒としては、ポリイミド前駆体を全く
溶解しない溶剤であってもよい。ここで、イミド化開始
温度と同等な温度とは、170℃の前後10〜20℃程
度の温度を意味する。また、前記の貧溶媒(B)は、好
適には前記ポリイミド前駆体の良溶媒と相溶する溶媒が
好ましい。また、上記貧溶媒(B)は、上記イミド化開
始温度より低い温度に沸点または熱分解点を有するポリ
イミド前駆体の非溶媒、例えば水、メタノ−ル、エタノ
−ルなどを50体積%以下の割合で含むことができる。
The poor solvent (B) for the polyimide precursor has a boiling point or a thermal decomposition temperature at a temperature higher than or equal to the imidation start temperature of the polyimide precursor (generally, about 170 ° C.). Solvent is used. Such a solvent may be a solvent that does not dissolve the polyimide precursor at all. Here, the temperature equivalent to the imidization start temperature means a temperature of about 10 to 20 ° C. before and after 170 ° C. Further, the poor solvent (B) is preferably a solvent that is compatible with a good solvent of the polyimide precursor. The poor solvent (B) is a non-solvent of a polyimide precursor having a boiling point or a thermal decomposition point at a temperature lower than the imidization start temperature, for example, water, methanol, ethanol or the like in an amount of 50% by volume or less. Can be included in proportions.

【0022】特に、貧溶媒(B)として、前記ポリイミ
ド前駆体の均一溶液(A)を構成するポリイミド前駆体
の良溶媒よりも高い沸点を有する貧溶媒が好ましい。具
体的には、沸点あるいは熱分解点が150〜500℃の
貧溶媒、さらに好ましくは沸点あるいは熱分解点が17
0〜300℃の貧溶媒である。
In particular, as the poor solvent (B), a poor solvent having a higher boiling point than the good solvent of the polyimide precursor constituting the homogeneous solution (A) of the polyimide precursor is preferable. Specifically, a poor solvent having a boiling point or a thermal decomposition point of 150 to 500 ° C., more preferably a boiling point or a thermal decomposition point of 17 to
It is a poor solvent of 0 to 300 ° C.

【0023】また、前記のポリイミド前駆体の貧溶媒
(B)として、前記ポリイミド前駆体の加熱イミド化が
進行する工程中において、気化または熱分解によりフィ
ルム状組成物(C)から除去されるものが望ましい。貧
溶媒(B)が加熱イミド化が進行する工程中において、
フィルム状組成物(C)から除去されない場合、得られ
る多孔質フィルムは電子材料の分野で好ましくなくな
る。
As the poor solvent (B) for the polyimide precursor, one which is removed from the film-like composition (C) by vaporization or thermal decomposition during the step of heat imidization of the polyimide precursor proceeds Is desirable. During the step in which the poor solvent (B) undergoes thermal imidization,
If not removed from the film-like composition (C), the resulting porous film is not preferred in the field of electronic materials.

【0024】上記の条件を満足する貧溶媒(B)として
は、脂肪族炭素数7以上の直鎖状一級アルコ−ル、炭素
数7以上の二級アルコ−ル、分岐アルコ−ル、環状アル
コ−ル、脂環式アルコ−ル、芳香族アルコ−ル、または
これ以外の高沸点アルコ−ルなどが挙げられる。具体的
には、例えば、n−ヘプタノ−ル(沸点176.3
℃)、n−オクタノ−ル(沸点1793℃)、n−ノナ
−ル(沸点203℃)、n−デカノ−ル(沸点231
℃)、n−ウンデカノ−ル(沸点243℃)、2−オク
タノ−ル(沸点179℃)、2−エチルヘキサノ−ル
(沸点184.7℃)、2,6−ジメチル−4−ヘプタ
ノ−ル(沸点178℃)、3,5,5−トリメチル−1
−ヘキサノ−ル(沸点194℃)、テトラヒドロフルフ
リルアルコ−ル(沸点178℃)、α−テルピネオ−ル
(沸点219℃)、フルフリルアルコ−ル(沸点170
℃)、ベンジルアルコ−ル(沸点205.8℃)などが
挙げられる。特に、n−デカノ−ルを好適に使用するこ
とができる。
The poor solvent (B) which satisfies the above conditions includes a linear primary alcohol having 7 or more carbon atoms, a secondary alcohol having 7 or more carbon atoms, a branched alcohol, and a cyclic alcohol. Alcohol, alicyclic alcohol, aromatic alcohol, and other high-boiling alcohols. Specifically, for example, n-heptanol (boiling point 176.3)
° C), n-octanol (bp 1793 ° C), n-nonal (boiling point 203 ° C), n-decanol (boiling point 231)
° C), n-undecanol (boiling point 243 ° C), 2-octanol (boiling point 179 ° C), 2-ethylhexanol (boiling point 184.7 ° C), 2,6-dimethyl-4-heptanol ( Boiling point 178 ° C), 3,5,5-trimethyl-1
-Hexanol (boiling point 194 ° C), tetrahydrofurfuryl alcohol (boiling point 178 ° C), α-terpineol (boiling point 219 ° C), furfuryl alcohol (boiling point 170
° C) and benzyl alcohol (boiling point: 205.8 ° C). In particular, n-decanol can be suitably used.

【0025】また、貧溶媒(B)としてエ−テル系で
は、メチルアニソ−ル(沸点171〜177℃)、エチ
ルベンジルエ−テル(沸点186℃)、ジイソアミルエ
−テル(沸点173.2℃)、1,8−シネオ−ル(沸
点176.4℃)、フェネト−ル(沸点170.3
℃)、ブチルフェニルエ−テル(沸点210.2℃)な
どが挙げられる。
In the ether system as the poor solvent (B), methyl anisole (boiling point 171 ° -177 ° C.), ethylbenzyl ether (boiling point 186 ° C.), diisoamyl ether (boiling point 173.2 ° C.), 1,8-cineole (boiling point 176.4 ° C), phenetole (boiling point 170.3 ° C)
° C) and butylphenyl ether (boiling point: 210.2 ° C).

【0026】さらにまた、貧溶媒(B)として多価アル
コ−ルおよびその誘導体では、エチレングリコ−ル(沸
点197℃)、ジプロピレングリコ−ル(沸点231.
8℃)、ジプロピレングリコ−ルモノエチルエ−テル
(沸点198℃)、ジプロピレングリコ−ルモノブチル
エ−テル(沸点231℃)、トリエチレングリコ−ルジ
メチルエ−テル(沸点216℃)、トリメチレングリコ
−ル(沸点213℃)、ヘキシレングリコ−ル(沸点2
13℃)などが挙げられる。特に、エチレングリコ−ル
などが好適に使用することができる。
Furthermore, polyhydric alcohols and their derivatives as poor solvents (B) include ethylene glycol (boiling point 197 ° C.) and dipropylene glycol (boiling point 231.
8 ° C.), dipropylene glycol monoethyl ether (bp 198 ° C.), dipropylene glycol monobutyl ether (boiling point 231 ° C.), triethylene glycol dimethyl ether (boiling point 216 ° C.), trimethylene glycol (boiling point 213 ° C), hexylene glycol (boiling point 2
13 ° C.). In particular, ethylene glycol and the like can be suitably used.

【0027】本発明においては、前記のポリイミド前駆
体の均一溶液(A)およびポリイミド前駆体の貧溶媒
(B)からなるフィルム状組成物(C)を加熱処理す
る。このフィルム状組成物(C)を得るためには、次の
二つの方法を用いることができる。
In the present invention, the film composition (C) comprising the above-mentioned homogeneous solution (A) of the polyimide precursor and the poor solvent (B) of the polyimide precursor is subjected to heat treatment. In order to obtain the film composition (C), the following two methods can be used.

【0028】第一の方法としては、前記のポリイミド前
駆体の均一溶液(A)100重量部に対して貧溶媒
(B)10〜40重量部、特に15〜30重量部を加え
て均一な混合溶液とし、この混合溶液を基板上に流延す
ることによってフィルム状組成物(C)を得ることがで
きる。前記の方法において、貧溶媒(B)の量が均一溶
液(A)100重量部に対して10重量部より少ないと
貧溶媒の添加効果が少なく、貧溶媒(B)の量が40重
量部より多いと均一な混合溶液になりにくいので前記の
割合が好適である。前記均一溶液(A)中の良溶媒およ
び貧溶媒(B)はそれぞれ1種類使用してもよく2種類
以上の混合溶媒であってもよい。
As the first method, 10 to 40 parts by weight, particularly 15 to 30 parts by weight, of the poor solvent (B) is added to 100 parts by weight of the homogeneous solution (A) of the polyimide precursor, and the mixture is uniformly mixed. A film composition (C) can be obtained by forming a solution and casting the mixed solution on a substrate. In the above method, if the amount of the poor solvent (B) is less than 10 parts by weight based on 100 parts by weight of the homogeneous solution (A), the effect of adding the poor solvent is small, and the amount of the poor solvent (B) is less than 40 parts by weight. If the amount is large, it is difficult to form a uniform mixed solution, so the above ratio is preferable. Each of the good solvent and the poor solvent (B) in the homogeneous solution (A) may be used alone or in combination of two or more.

【0029】第二の方法としては、前記のポリイミド前
駆体の均一溶液(A)を基板上に流延して溶液フィルム
とし、次いでこの溶液フィルムを貧溶媒(B)からなる
凝固浴に浸漬して貧溶媒(B)を含むフィルム状物を析
出させ、このフィルム状物を凝固浴から取り出すことに
よってフィルム状組成物(C)を得ることができる。
As a second method, the above-mentioned homogeneous solution (A) of the polyimide precursor is cast on a substrate to form a solution film, and then this solution film is immersed in a coagulation bath comprising a poor solvent (B). Thus, a film-like material containing the poor solvent (B) is precipitated, and the film-like material is taken out of the coagulation bath to obtain a film-like composition (C).

【0030】本発明における貧溶媒(B)を含むフィル
ム状組成物(C)を得る方法として、前記の2つのいず
れの方法を用いてもよいが、どちらの方法によっても得
られるフィルム状組成物(C)を貧溶媒(B)を含んだ
状態で加熱処理しイミド化させることによって、フィル
ム中央部が多孔質層でフィルムの両表面部分が緻密層で
ある多孔質ポリイミドフィルムを形成することができ
る。
As a method for obtaining the film composition (C) containing the poor solvent (B) according to the present invention, any of the above two methods may be used, but the film composition obtained by either method may be used. By heat-treating (C) in a state containing the poor solvent (B) and imidizing it, it is possible to form a porous polyimide film in which the central portion of the film is a porous layer and both surface portions of the film are dense layers. it can.

【0031】前記の2つの方法において、ポリイミド前
駆体の均一溶液(A)と貧溶媒(B)との混合溶液ある
いはポリイミド前駆体の均一溶液(A)からなるド−プ
を基板上に流延する方法としては、スプレ−法あるいは
ドクタ−ブレ−ド法を用いてコ−ティングする方法や、
Tダイから押出す方法など、好適にはガラス等の基板上
或いは可動式のベルトである基板上に流延する方法、該
ポリイミド前駆体溶液をT型ダイスから押出す方法が挙
げられる。前記の流延用のド−プ溶液には、界面活性
剤、難燃剤、着色剤、或いはガラス繊維、ケイ素系繊
維、無機粉末等の補強材が含まれても良い。これらの添
加剤及び補強材は上記ポリイミド前駆体の均一溶液
(A)に添加しておいてもよく、あるいは流延用のド−
プ溶液に添加してもよい。
In the above two methods, a dope consisting of a mixed solution of a homogeneous solution (A) of a polyimide precursor and a poor solvent (B) or a dope consisting of a homogeneous solution (A) of a polyimide precursor is cast on a substrate. Examples of the method include a method of coating using a spray method or a doctor blade method,
Suitable examples include a method in which the polyimide precursor solution is cast on a substrate such as glass or a movable belt, and a method in which the polyimide precursor solution is extruded from a T-die. The dope solution for casting may contain a surfactant, a flame retardant, a coloring agent, or a reinforcing material such as glass fiber, silicon-based fiber, or inorganic powder. These additives and reinforcing materials may be added to the homogeneous solution (A) of the above-mentioned polyimide precursor, or a dope for casting may be used.
May be added to the solution.

【0032】本発明においては、前記のようにして得ら
れるフィルム状組成物(C)を加熱して乾燥する。この
加熱処理はフィルム状物に流延した後直ちに加熱して、
イミド化が起こる温度で乾燥およびイミド化工程に移る
ことが好ましい。その際に、フィルム状組成物(C)は
加熱処理工程の極く初期に基板から離れる傾向があるた
め、基板から剥離したフィルムをピン、チャックあるい
はピンチロ−ルなどを用いて固定することが好ましい。
このフィルムの加熱処理によるイミド化は、大気中、好
適には280〜500℃で5〜90分程度行うことが好
ましい。また、イミド化は熱イミド化でもあるいは化学
イミド化でも行うことができる。
In the present invention, the film composition (C) obtained as described above is dried by heating. This heat treatment is heated immediately after casting on a film,
It is preferable to proceed to the drying and imidation steps at a temperature at which imidization occurs. At this time, since the film-like composition (C) tends to separate from the substrate at the very beginning of the heat treatment step, it is preferable to fix the film separated from the substrate using a pin, a chuck or a pinch roll. .
The imidation of this film by heat treatment is preferably performed in the air, preferably at 280 to 500 ° C. for about 5 to 90 minutes. Also, the imidization can be performed by thermal imidization or chemical imidization.

【0033】前記の化学イミド化は、脂肪族酸無水物、
芳香族酸無水物を脱水剤として用い、トリエチルアミン
等の第三級アミンを触媒として行われる。また、特開平
4−339835のように、イミダ−ル、ベンズイミダ
ゾ−ル、もしくはそれらの置換誘導体を用いても良い。
The above chemical imidization is carried out by using an aliphatic acid anhydride,
The reaction is carried out using an aromatic acid anhydride as a dehydrating agent and using a tertiary amine such as triethylamine as a catalyst. Further, as disclosed in JP-A-4-339835, imidal, benzimidazole, or a substituted derivative thereof may be used.

【0034】複層ポリイミド多孔質フィルムは、好適に
はフィルム状組成物(C)を複層化し、最後に熱処理し
てイミド化処理を行うことで複層ポリイミド多孔質フィ
ルムを製造することができる。
[0034] The multilayer polyimide porous film can be produced by suitably laminating the film-like composition (C), followed by heat treatment and imidization treatment. .

【0035】このようにして製造される多孔質ポリイミ
ドフィルムは200℃以上の耐熱性を有し、好適には膜
厚(全体厚)が5〜150μm、引張強さが200〜1
000kgf/cm2程度であり、緻密層の厚さが各側
で10nm以上であり、さらに緻密層厚みの合計がフィ
ルム全体の厚みの約50%以下であり、空孔率が30〜
85%、特に40〜70%、多孔質層の平均孔径が0.
01〜5μm、特に0.05〜1μm程度である。フィ
ルム全体の厚みが5μmより小さければフィルムの機械
的強度が劣り、150μmより大きいと可撓性が劣る。
また、緻密層が各側で10nmより小さいと、表面緻密
層部分に欠陥が生じやすくなるため好ましくない。また
緻密層の厚みの合計がフィルム全体の厚みの約50%以
上であると多孔質層の部分が少なすぎて、多孔質フィル
ムの効果、例えば低誘電率の効果などが減少するので好
ましくない。
The porous polyimide film thus produced has heat resistance of 200 ° C. or more, and preferably has a thickness (total thickness) of 5 to 150 μm and a tensile strength of 200 to 1
000 kgf / cm 2 , the thickness of the dense layer is 10 nm or more on each side, the total thickness of the dense layer is about 50% or less of the thickness of the entire film, and the porosity is 30 to
85%, especially 40-70%, the average pore size of the porous layer is 0.
It is about 0.01 to 5 μm, especially about 0.05 to 1 μm. If the thickness of the entire film is less than 5 μm, the mechanical strength of the film is poor, and if it is more than 150 μm, the flexibility is poor.
On the other hand, if the thickness of the dense layer is smaller than 10 nm on each side, it is not preferable because defects easily occur in the surface dense layer. On the other hand, if the total thickness of the dense layer is about 50% or more of the thickness of the entire film, the portion of the porous layer is too small, and the effect of the porous film, for example, the effect of a low dielectric constant, is not preferable.

【0036】本発明の多孔質ポリイミドフィルムは低誘
電率フィルムである。本発明の多孔質ポリイミドフィル
ムの誘電率は、空孔率にもよるが、25℃、103Hz
の条件で、バルクのポリイミドフィルムの誘電率が3.
2〜3.4であるのに対し、1.3〜2.8である。
The porous polyimide film of the present invention is a low dielectric constant film. The dielectric constant of the porous polyimide film of the present invention will depend on the porosity, 25 ° C., 10 3 Hz
Under the conditions described above, the dielectric constant of the bulk polyimide film is 3.
It is 1.3 to 2.8 while it is 2 to 3.4.

【0037】本発明によって得られる多孔質ポリイミド
フィルムは、1層あるいは2層以上組み合わせて用いて
もよい。2層以上を組み合わせることにより、用途によ
っては補強用として、あるいは厚物に用いることができ
る。また、他の材料、他のポリマ−フィルム、繊維、無
機物と組み合わせて用いてもよい。
The porous polyimide film obtained by the present invention may be used alone or in combination of two or more layers. By combining two or more layers, it can be used for reinforcement or for thick objects depending on the application. Further, it may be used in combination with another material, another polymer film, fiber, or inorganic substance.

【0038】本発明の多孔質ポリイミドフィルムは、実
装に際しては単独あるいは多孔質ポリイミドフィルムの
複数層を積層し、さらには新たに緻密なポリイミドフィ
ルムを該多孔質ポリイミドフィルムに積層して用いるこ
とも可能である。また、例えばポリイミドフィルム、シ
リコン基板やガラス基板やカ−ボン基板やアルミニウム
基板などの有機、無機あるいは金属の基板に耐熱性接着
剤を介して本発明の多孔質ポリイミドフィルムを積層す
ることもできる。
When mounting the porous polyimide film of the present invention, it is also possible to use a single layer or a plurality of layers of the porous polyimide film, and a new dense polyimide film to be laminated on the porous polyimide film. It is. Further, for example, the porous polyimide film of the present invention can be laminated on an organic, inorganic or metal substrate such as a polyimide film, a silicon substrate, a glass substrate, a carbon substrate, or an aluminum substrate via a heat-resistant adhesive.

【0039】また、本発明の多孔質ポリイミドフィルム
の片面あるいは両面に、熱可塑性ポリイミドやポリイミ
ドシロキサン−エポキシ樹脂などの耐熱性でフィルム状
の接着剤層を積層し、さらにその上に芳香族ポリイミ
ド、芳香族ポリエステル、ポリエチレン、ポリプロピレ
ン、ポリブテン−1などの樹脂フィルムからなる保護フ
ィルムを設けて、積層体を得ることができる。この積層
体によって埃の付着を防止して運搬が容易になり、使用
時に保護フィルムを引き剥がして、電解銅箔、圧延銅
箔、圧延アルミニウム箔などそれ自体公知の電子回路用
の導電性金属箔を積層して回路基板を容易に得ることが
できる。
On one or both sides of the porous polyimide film of the present invention, a heat-resistant film-like adhesive layer such as thermoplastic polyimide or polyimide siloxane-epoxy resin is laminated, and an aromatic polyimide, A laminate can be obtained by providing a protective film made of a resin film such as an aromatic polyester, polyethylene, polypropylene, or polybutene-1. This laminate prevents dust from adhering and facilitates transportation, peels off the protective film at the time of use, and is a conductive metal foil for electronic circuits known per se such as electrolytic copper foil, rolled copper foil, and rolled aluminum foil. And a circuit board can be easily obtained.

【0040】また、本発明の多孔質ポリイミドフィルム
の片面あるいは両面に耐熱性接着剤溶液を塗布、乾燥
し、次いでその上に電子回路用の導電性金属箔を積層し
て積層体を得ることができる。
Further, a heat-resistant adhesive solution is applied to one or both sides of the porous polyimide film of the present invention, dried, and then a conductive metal foil for an electronic circuit is laminated thereon to obtain a laminate. it can.

【0041】また、本発明の多孔質ポリイミドフィルム
と、シリコン基板、ガラス基板やカ−ボン基板などの無
機基板あるいはアルミニウム基板などの金属基板とを、
耐熱性の接着剤層で挟んで重ねて、加熱圧着し、次いで
この積層体の多孔質絶縁材料である多孔質ポリイミドフ
ィルムの他の面と導電性金属箔とを耐熱性の接着剤層で
加熱圧着して積層基板である積層体を得ることができ
る。さらに、本発明の多孔質ポリイミドフィルムの片面
に耐熱性接着剤を介してシリコン基板などの無機、有機
あるいは金属の基板が、他の面に直接あるいは耐熱性接
着剤を介して回路用の導電性金属層が設けられた積層体
としてもよい。この場合、回路用の導電性金属層として
は銅、ニッケル、クロム、アルミニウムなどのそれ自体
公知の金属を蒸着法(真空蒸着あるいはスパッタ)−メ
ッキ(無電解メッキ、電気メッキ)の各種組み合わせに
よって回路用の導電性金属層を形成してもよい。なお、
本発明の多孔質ポリイミドフィルムは、環境によっては
孔あるいはポリイミドに含まれる水分を加熱乾燥して除
去した後に使用してもよい。
Further, the porous polyimide film of the present invention and an inorganic substrate such as a silicon substrate, a glass substrate or a carbon substrate, or a metal substrate such as an aluminum substrate may be used.
The laminate is sandwiched between heat-resistant adhesive layers, and then heat-pressed. Then, the other surface of the porous polyimide film, which is the porous insulating material of the laminate, and the conductive metal foil are heated with the heat-resistant adhesive layer. The laminate can be obtained by pressure bonding. Furthermore, an inorganic, organic or metal substrate such as a silicon substrate is bonded to one surface of the porous polyimide film of the present invention via a heat-resistant adhesive, and the other surface is directly or via a heat-resistant adhesive. A laminate provided with a metal layer may be used. In this case, as the conductive metal layer for the circuit, a metal known per se such as copper, nickel, chromium, or aluminum is used in various combinations of vapor deposition (vacuum vapor deposition or sputtering) and plating (electroless plating, electroplating). Conductive metal layer may be formed. In addition,
Depending on the environment, the porous polyimide film of the present invention may be used after removing moisture contained in the pores or polyimide by heating and drying.

【0042】[0042]

【実施例】以下、実施例により本発明を具体的に説明す
るが、本発明はこれらに限定されない。以下の各例にお
いて、多孔質フィルムについて以下の物性を測定し評価
した。
EXAMPLES The present invention will now be described specifically with reference to examples, but the present invention is not limited to these examples. In each of the following examples, the following physical properties of the porous film were measured and evaluated.

【0043】引張強さ JIS K7127に準じて測定した。テンシロン万能
試験機(東洋ボ−ルドウイン社製)を使用し、引張速度
10mm/分で測定した。 空孔率 所定の大きさに切取った多孔質フィルムの膜厚及び重量
を測定し、目付重量から空孔率を次の式によって求め
た。式中のSは多孔質フィルムの面積、dは膜厚、Wは
測定した重量、Dはポリイミドの密度を意味し、ポリイ
ミドの密度は1.34g/m3とした。 空孔率(%)=100−100×(W/D)/(S×
d)
Tensile strength Measured according to JIS K7127. Using a Tensilon universal testing machine (manufactured by Toyo Boldwin Co., Ltd.), the measurement was performed at a tensile speed of 10 mm / min. Porosity The thickness and weight of the porous film cut into a predetermined size were measured, and the porosity was determined from the basis weight by the following formula. In the formula, S is the area of the porous film, d is the film thickness, W is the measured weight, D is the density of the polyimide, and the density of the polyimide was 1.34 g / m 3 . Porosity (%) = 100−100 × (W / D) / (S ×
d)

【0044】緻密層の厚さ、割合 多孔質フィルムの断面を切り取り、走査型顕微鏡で緻密
層厚、フィルム全体厚を測定し、緻密層の割合を求め
た。 熱収縮率 所定の長さに目盛りを記した試料を、無拘束状態で10
5℃に設定したオ−ブン中で8時間静置し、取出した後
の寸法を測定した。熱収縮率は次式に従う。次式のL1
はオーブンから取出した後のフィルム寸法を意味し、L
0は初期のフィルム寸法を意味する。 熱収縮率(%)=[1−(L1/L0)]×100
Thickness and Ratio of Dense Layer The cross section of the porous film was cut out, and the thickness of the dense layer and the total thickness of the film were measured with a scanning microscope to determine the ratio of the dense layer. Heat shrinkage A sample with a scale marked on a predetermined length
After leaving still in an oven set at 5 ° C. for 8 hours, the dimensions after removal were measured. The heat shrinkage ratio follows the following equation. L 1 in the following equation
Means the film dimensions after removal from the oven;
0 means the initial film size. Heat shrinkage (%) = [1− (L 1 / L 0 )] × 100

【0045】突刺強度 試料を直径11.28mm、面積1cm2の円孔ホルダ
−に固定し、先端形状が0.5R、直径1mmΦのニ−
ドルを2mm/secの速度で下降させ突刺し、貫通荷
重を測定した。 誘電率 周波数1000Hzで、JIS−C−6481に準じて測
定した。
Piercing Strength A sample was fixed to a circular holder having a diameter of 11.28 mm and an area of 1 cm 2 , and a tip having a tip shape of 0.5R and a diameter of 1 mmΦ.
The dollar was lowered at a speed of 2 mm / sec and pierced, and the penetration load was measured. The dielectric constant was measured at a frequency of 1000 Hz according to JIS-C-6481.

【0046】実施例1 テトラカルボン酸成分としてs−BPDAを、ジアミン
成分としてDADEを用い、s−BPDAに対するDA
DEのモル比が0.994で且つ該モノマ−成分の合計
重量が18重量%になるようにNMP(bp202℃)
に溶解し、40℃で6時間重合を行ってポリイミド前駆
体の均一溶液(A)を得た。
Example 1 s-BPDA was used as a tetracarboxylic acid component and DADE was used as a diamine component.
NMP (bp 202 ° C.) so that the molar ratio of DE is 0.994 and the total weight of the monomer components is 18% by weight.
And polymerized at 40 ° C. for 6 hours to obtain a homogeneous solution (A) of a polyimide precursor.

【0047】前記のポリイミド前駆体の均一溶液(A)
に貧溶媒(B)としてn−デカノ−ル(bp231℃)
を添加し、前記ポリイミド前駆体が約15重量%、NM
Pが68重量%、n−デカノ−ルが17重量%であるド
−プ溶液を調製した。
A homogeneous solution of the above-mentioned polyimide precursor (A)
N-decanol (bp 231 ° C.) as a poor solvent (B)
Is added, the polyimide precursor is about 15% by weight, NM
A dope solution containing 68% by weight of P and 17% by weight of n-decanol was prepared.

【0048】前記のド−プ溶液をガラス板上に厚みが約
150μmになるように流延し、80℃程度で乾燥し
た。乾燥の初期にガラス板から剥離したポリイミド前駆
体フィルム状物(ポリイミド前駆体ゲル)をピンテンタ
−に固定した状態で、大気中にて300℃で40分間熱
処理を行って、多孔質ポリイミドフィルムを得た。
The above dope solution was cast on a glass plate so as to have a thickness of about 150 μm, and dried at about 80 ° C. In a state where the polyimide precursor film (polyimide precursor gel) peeled off from the glass plate at the beginning of drying is fixed to a pin tenter, heat treatment is performed at 300 ° C. for 40 minutes in the air to obtain a porous polyimide film. Was.

【0049】得られた多孔質ポリイミドフィルムは、膜
断面の走査型顕微鏡観察によって、両表面層は緻密層で
中央部に膜断面方向に連続微細孔を有したものであるこ
とが確認された。この多孔質ポリイミドフィルムの引張
強度、膜厚、空孔率、表面の形態、緻密層厚み、中央部
の形態、熱収縮率、突刺強度の測定結果を以下に示す。
Observation of the cross section of the obtained porous polyimide film with a scanning microscope showed that both surface layers were dense layers and had continuous fine pores in the center in the cross section direction. The measurement results of the tensile strength, film thickness, porosity, surface morphology, dense layer thickness, central morphology, heat shrinkage, and piercing strength of this porous polyimide film are shown below.

【0050】評価結果 引張強度 460kgf/cm2 膜厚 85μm 空孔率 65% 表面の形態 緻密層 緻密層厚み 2.1μm(両側とも) 中央部の形態 多孔層 熱収縮率 0.3% 突刺強度 385gfEvaluation results Tensile strength 460 kgf / cm 2 Film thickness 85 μm Porosity 65% Surface morphology Dense layer Dense layer thickness 2.1 μm (both sides) Central part porosity Layer heat shrinkage 0.3% Puncture strength 385 gf

【0051】実施例2 ポリイミド前駆体の均一溶液(A)に加える貧溶媒
(B)としてn−デカノ−ルに代えてエチレングリコ−
ル(bp197.8℃)を添加し、前記ポリイミド前駆
体が約10重量%、NMPが48重量%、エチレングリ
コ−ルが42重量%であるド−プ溶液を調製し、このド
−プ溶液を使用した他は実施例1と同様に実施して多孔
質ポリイミドフィルムを得た。得られた多孔質ポリイミ
ドフィルムは、膜断面の走査型顕微鏡観察による構造お
よび引張強度が実施例1で得られたものと同等であっ
た。膜厚、空孔率、表面の形態、緻密層の厚み、中央部
の形態、熱収縮率、突刺強度の測定結果を以下に示す。
Example 2 As a poor solvent (B) added to a homogeneous solution (A) of a polyimide precursor, ethylene glycol was used in place of n-decanol.
(Bp 197.8 ° C.) to prepare a dope solution containing about 10% by weight of the polyimide precursor, 48% by weight of NMP, and 42% by weight of ethylene glycol. Was carried out in the same manner as in Example 1 except that a porous polyimide film was obtained. The structure and tensile strength of the obtained porous polyimide film obtained by observing the cross section of the film with a scanning microscope were the same as those obtained in Example 1. The measurement results of the film thickness, porosity, surface morphology, dense layer thickness, central morphology, heat shrinkage, and piercing strength are shown below.

【0052】評価結果 膜厚 83μm 空孔率 52% 表面の形態 緻密層 緻密層厚み 3.0μm(両側とも) 中央部の形態 多孔層 熱収縮率 0.3% 突刺強度 408gfEvaluation result Film thickness 83 μm Porosity 52% Surface morphology Dense layer Dense layer thickness 3.0 μm (both sides) Central part form Porous layer Heat shrinkage 0.3% Puncture strength 408 gf

【0053】実施例3 貧溶媒(B)としてエチレングリコ−ル(bp197.
8℃)を使用し、ポリイミド前駆体の均一溶液(A)を
ガラス板上流延して溶液フィルムとし、これをガラス板
とともににエチレングリコ−ルの凝固浴に浸漬してフィ
ルム状物を析出させ、析出したフィルム状物を凝固浴か
ら取出し、ピンテンタ−で固定し、直ちに300℃で4
0分間加熱しイミド化して、多孔質ポリイミドフィルム
を得た。得られた多孔質ポリイミドフィルムは、膜断面
の走査型顕微鏡観察による構造および引張強度が実施例
1で得られたものと同等であった。膜厚、空孔率、表面
の形態、緻密層の厚み中央部の形態、熱収縮率、突刺強
度の測定結果を以下に示す。
Example 3 As a poor solvent (B), ethylene glycol (bp 197.
(8 ° C.), a homogeneous solution (A) of the polyimide precursor is spread upstream of the glass plate to form a solution film, which is immersed together with the glass plate in a coagulation bath of ethylene glycol to precipitate a film. The deposited film was taken out of the coagulation bath, fixed with a pin tenter, and immediately
Heating for 0 minutes and imidization yielded a porous polyimide film. The structure and tensile strength of the obtained porous polyimide film obtained by observing the cross section of the film with a scanning microscope were the same as those obtained in Example 1. The measurement results of the film thickness, the porosity, the surface shape, the shape of the dense layer at the center of the thickness, the heat shrinkage, and the piercing strength are shown below.

【0054】評価結果 膜厚 84μm 空孔率 49% 表面の形態 緻密層 緻密層厚み 1.8μm(両側とも) 中央部の形態 多孔層 熱収縮率 0.3% 突刺強度 410gfEvaluation Results Thickness 84 μm Porosity 49% Surface Morphology Dense Layer Dense Layer Thickness 1.8 μm (both sides) Central Morphology Porous Layer Heat Shrinkage 0.3% Puncture Strength 410 gf

【0055】比較例1〜2 貧溶媒(B)としてn−デカノ−ルに代えてエタノ−ル
(bp78.3℃)を使用する(比較例1)か、あるい
はメタノ−ル(bp64.1℃)を使用した他は実施例
1と同様に実施した。得られたポリイミドフィルムは、
膜断面の走査型顕微鏡観察によればいずれも多孔質層を
有さない緻密層のみのフィルムであった。
Comparative Examples 1-2 Ethanol (bp 78.3 ° C.) was used in place of n-decanol as the poor solvent (B) (Comparative Example 1), or methanol (bp 64.1 ° C.) ) Was performed in the same manner as in Example 1 except that) was used. The resulting polyimide film is
According to the scanning microscope observation of the film cross section, each of the films was a film having only a dense layer without a porous layer.

【0056】実施例4 ジアミン成分としてDADEに代えてPPDを使用して
得たポリイミド前駆体の均一溶液(A)を使用し、加熱
温度(最高温度)を425℃に変えた他は実施例1と同
様に実施して、多孔質ポリイミドフィルムを得た。この
多孔質ポリイミドフィルムの評価結果は実施例1のもの
と同等である。
Example 4 A homogeneous solution (A) of a polyimide precursor obtained by using PPD instead of DADE as the diamine component was used, and the heating temperature (maximum temperature) was changed to 425 ° C. And a porous polyimide film was obtained. The evaluation result of this porous polyimide film is equivalent to that of Example 1.

【0057】実施例5 実施例1〜4で得られた多孔質ポリイミドフィルムを使
用して、絶縁材料として評価した。いずれも良好な特性
を示した。また、実施例1で得られた多孔質ポリイミド
フィルムについて、23℃、1000Hzで測定した誘
電率が2.1、損失係数が0.004であった。
Example 5 The porous polyimide films obtained in Examples 1 to 4 were evaluated as insulating materials. All exhibited good characteristics. The dielectric constant of the porous polyimide film obtained in Example 1 measured at 23 ° C. and 1000 Hz was 2.1, and the loss factor was 0.004.

【0058】比較例3 多孔質ではない市販の厚み25μmのポリイミドフィル
ムを使用して、評価した。23℃、1000Hzで誘電
率が3.2、損失係数が0.004であり、誘電率が不
十分であった。
Comparative Example 3 Evaluation was made using a commercially available nonporous polyimide film having a thickness of 25 μm. At 23 ° C. and 1000 Hz, the dielectric constant was 3.2, the loss coefficient was 0.004, and the dielectric constant was insufficient.

【0059】[0059]

【発明の効果】本発明によると、耐熱性、耐薬品性及び
機械的強度に優れるポリイミドからなる、両表面層が緻
密層で中央部に膜断面方向に連続微細孔を有した多孔質
ポリイミドフィルムを製造することが可能となった。
According to the present invention, a porous polyimide film comprising a polyimide having excellent heat resistance, chemical resistance and mechanical strength, having both surface layers being dense layers and having continuous fine pores in the center in the cross-sectional direction of the film. Can be manufactured.

フロントページの続き Fターム(参考) 4F071 AA60 AC05 AC06 AF37 AH12 BB02 BC01 BC02 BC12 4F074 AA74 AD04 CB43 CB45 CC04W CC29Y CC29Z DA02 DA08 DA19 DA20 DA22 DA23 DA24 DA47 DA54 4J043 PA02 PC015 PC115 RA35 SA06 TA14 TA22 UA122 UA131 UA132 UA361 UB022 UB121 UB122 UB152 UB292 UB302 UB401 UB402 VA021 VA022 VA062 YA06 Continued on front page F-term (reference) 4F071 AA60 AC05 AC06 AF37 AH12 BB02 BC01 BC02 BC12 4F074 AA74 AD04 CB43 CB45 CC04W CC29Y CC29Z DA02 DA08 DA19 DA20 DA22 DA23 DA24 DA47 DA54 4J043 PA02 PC015 PC115 RA35 SA06 TA14 UA UA 012 UA UB122 UB152 UB292 UB302 UB401 UB402 VA021 VA022 VA062 YA06

Claims (9)

【特許請求の範囲】[Claims] 【請求項1】 ポリイミド前駆体の均一溶液(A)と、
該ポリイミド前駆体の貧溶媒(B)からなるフィルム状
組成物(C)であって、上記貧溶媒はポリイミド前駆体
のイミド化開始温度より高い温度あるいはそれと同等の
温度に沸点または熱分解点を有し、前記フィルム状組成
物を加熱処理してイミド化することを特徴とするフィル
ム両面に緻密層を有し、フィルム中央部は多孔質層から
なる多孔質ポリイミドフィルムの製造法。
1. A homogeneous solution (A) of a polyimide precursor,
A film composition (C) comprising a poor solvent (B) of the polyimide precursor, wherein the poor solvent has a boiling point or a thermal decomposition point at a temperature higher than or equal to the imidation start temperature of the polyimide precursor. A method for producing a porous polyimide film comprising a dense layer on both surfaces of a film and a porous layer at the center of the film, wherein the film-like composition is subjected to a heat treatment to imidize the film.
【請求項2】 ポリイミド前駆体の均一溶液(A)が、
ポリイミド前駆体0.3〜60重量%と良溶媒99.7
〜40重量%からなるものである請求項1記載の多孔質
ポリイミドフィルムの製造法。
2. A homogeneous solution (A) of a polyimide precursor,
0.3 to 60% by weight of polyimide precursor and 99.7 of good solvent
2. The method for producing a porous polyimide film according to claim 1, comprising from about 40% by weight to about 40% by weight.
【請求項3】 フィルム状組成物(C)が、ポリイミド
前駆体の均一溶液(A)100重量部に対して貧溶媒
(B)10〜40重量部を加えて均一な混合溶液とし、
この混合溶液を基板上に流延することによって得られる
ものである請求項1記載の多孔質ポリイミドフィルムの
製造法。
3. A film-form composition (C) is obtained by adding 10 to 40 parts by weight of a poor solvent (B) to 100 parts by weight of a homogeneous solution (A) of a polyimide precursor to form a uniform mixed solution.
2. The method for producing a porous polyimide film according to claim 1, obtained by casting the mixed solution on a substrate.
【請求項4】 フィルム状組成物(C)が、ポリイミド
前駆体の均一溶液(A)を基板上に流延して溶液フィル
ムとし、この溶液フィルムを貧溶媒(B)の凝固浴に浸
漬してフィルム状物を析出させ、このフィルム状物を凝
固浴から取り出して得られるものである請求項1記載の
多孔質ポリイミドフィルムの製造法。
4. A film composition (C) is prepared by casting a uniform solution (A) of a polyimide precursor on a substrate to form a solution film, and dipping the solution film in a coagulation bath of a poor solvent (B). 2. The method for producing a porous polyimide film according to claim 1, wherein the film-like substance is precipitated by removing the film-like substance from a coagulation bath.
【請求項5】 貧溶媒(B)が、ポリイミド前駆体を加
熱処理してイミド化が進行する工程中において、気化ま
たは熱分解によってフィルム状組成物(C)から除去さ
れる請求項1記載の多孔質ポリイミドフィルムの製造
法。
5. The method according to claim 1, wherein the poor solvent (B) is removed from the film-like composition (C) by vaporization or thermal decomposition during a step in which the polyimide precursor is heated and imidization proceeds. Manufacturing method of porous polyimide film.
【請求項6】 フィルム状組成物(C)を加熱処理して
イミド化することによって得られるフィルムが、全体の
厚さが5〜150μmであり、緻密層の厚さが各側で1
0nm以上であり、さらにフィルム両側の緻密層の厚さ
の和がフィルム全体の厚さの約50%以下である請求項
1記載の多孔質ポリイミドフィルムの製造法。
6. A film obtained by subjecting the film-like composition (C) to heat treatment and imidization has a total thickness of 5 to 150 μm and a thickness of the dense layer of 1% on each side.
0 nm or more, and the sum of the thicknesses of the dense layers on both sides of the film is about 50% or less of the total thickness of the film.
2. The method for producing a porous polyimide film according to 1.
【請求項7】 請求項1に記載の製造法によって得られ
る多孔質ポリイミドフィルムを構成要素として含む単層
または複層の多孔質フィルム。
7. A single-layer or multi-layer porous film containing the porous polyimide film obtained by the production method according to claim 1 as a constituent element.
【請求項8】 請求項1に記載の製造法によって得られ
る多孔質ポリイミドからなる低誘電率フィルム。
8. A low dielectric constant film comprising a porous polyimide obtained by the production method according to claim 1.
【請求項9】 絶縁材料と金属層とを必須の構成材料と
して含む金属層−絶縁材料積層体において、絶縁材料と
して使用される請求項8記載の低誘電率フィルム。
9. The low dielectric constant film according to claim 8, which is used as an insulating material in a metal layer-insulating material laminate including an insulating material and a metal layer as essential constituent materials.
JP33744599A 1999-04-23 1999-11-29 Method for producing porous polyimide film and film Expired - Lifetime JP3687448B2 (en)

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JP33744599A JP3687448B2 (en) 1999-11-29 1999-11-29 Method for producing porous polyimide film and film
US09/539,929 US20030129379A1 (en) 1999-04-23 2000-03-31 Porous insulating film and its laminates
US10/785,413 US7303811B2 (en) 1999-04-23 2004-02-25 Porous insulating film and its laminates
US10/784,982 US20040241419A1 (en) 1999-04-23 2004-02-25 Porous insulating film and its laminates
US11/516,045 US7311966B2 (en) 1999-04-23 2006-09-06 Porous insulating film and its laminates
US11/802,557 US20070275222A1 (en) 1999-04-23 2007-05-23 Porous insulating film and its laminates

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EP1327517A2 (en) * 2002-01-10 2003-07-16 Nitto Denko Corporation Method of metal layer formation and metal foil-based layered product
CN100445322C (en) * 2006-08-21 2008-12-24 浙江大学 Ultralow dielectric constant polyimide film and its preparation method
JP2012101438A (en) * 2010-11-10 2012-05-31 Unitika Ltd Laminate and method for manufacturing the same, and substrate for low-permitivity printed wiring board including the laminate
JP2013064122A (en) * 2011-09-01 2013-04-11 Unitika Ltd Porous polyimide film and method for producing the same, and porous polyimide coating composition
JP2014070111A (en) * 2012-09-28 2014-04-21 Nippon Zeon Co Ltd Insulator, insulating film, laminate, and method for manufacturing laminate
JP2014132057A (en) * 2013-01-07 2014-07-17 Unitika Ltd Polyimide porous film and its use
JP2015052061A (en) * 2013-09-06 2015-03-19 宇部興産株式会社 Polyimide precursor solution, method for producing porous film or coated material, polyimide porous film, and coated material
WO2018020746A1 (en) * 2016-07-25 2018-02-01 日東電工株式会社 Low-dielectric porous polymer film and film for millimeter-wave antenna
CN113054322A (en) * 2019-12-27 2021-06-29 富士胶片商业创新有限公司 Porous polyimide film, separator for secondary battery, and secondary battery
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JPH02208324A (en) * 1989-02-08 1990-08-17 Nitto Denko Corp Low-permittivity sheet, and laminate and multilayer circuit board prepared by using same sheet
JPH11166051A (en) * 1997-12-05 1999-06-22 Kanegafuchi Chem Ind Co Ltd Polyamic acid composition and polyimide film made therefrom

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JPH02208324A (en) * 1989-02-08 1990-08-17 Nitto Denko Corp Low-permittivity sheet, and laminate and multilayer circuit board prepared by using same sheet
JPH11166051A (en) * 1997-12-05 1999-06-22 Kanegafuchi Chem Ind Co Ltd Polyamic acid composition and polyimide film made therefrom

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* Cited by examiner, † Cited by third party
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EP1327517A3 (en) * 2002-01-10 2004-01-07 Nitto Denko Corporation Method of metal layer formation and metal foil-based layered product
US6773572B2 (en) 2002-01-10 2004-08-10 Nitto Denko Corporation Method of metal layer formation and metal foil-based layered product
CN100445322C (en) * 2006-08-21 2008-12-24 浙江大学 Ultralow dielectric constant polyimide film and its preparation method
JP2012101438A (en) * 2010-11-10 2012-05-31 Unitika Ltd Laminate and method for manufacturing the same, and substrate for low-permitivity printed wiring board including the laminate
JP2013064122A (en) * 2011-09-01 2013-04-11 Unitika Ltd Porous polyimide film and method for producing the same, and porous polyimide coating composition
JP2014070111A (en) * 2012-09-28 2014-04-21 Nippon Zeon Co Ltd Insulator, insulating film, laminate, and method for manufacturing laminate
JP2014132057A (en) * 2013-01-07 2014-07-17 Unitika Ltd Polyimide porous film and its use
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WO2018020746A1 (en) * 2016-07-25 2018-02-01 日東電工株式会社 Low-dielectric porous polymer film and film for millimeter-wave antenna
JP2018021172A (en) * 2016-07-25 2018-02-08 日東電工株式会社 Film for millimeter-wave antenna
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