JP2001041987A - Device and method for analyzing near magnetic field data and computer-readable recording medium in which program to make computer execute the same method is recorded - Google Patents

Abstract

PROBLEM TO BE SOLVED: To speedily and accurately analyze the overall spectrums of electronic equipment with a single or plurality of clock frequency emitting sources for measures to suppress electromagnetic waves (unnecessary radiation spectrums) effectively, etc. SOLUTION: This device is provided with a part 201 for receiving the input of data to be analyzed to receive input of the near magnetic field data of a predetermined frequency of a printed circuit board and location information on a measurement region in the printed circuit board of which near magnetic field data is measured, a part 202 for computing the mean value of the data to be analyzed to compute the mean value for every measurement region of near magnetic field data at the inputted predetermined frequency, and a display control part 200 to control a display part 206 to display the computed mean value in every measurement region.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a near-field data analyzer for analyzing near-field data of an electronic device measured by an electromagnetic scanner, a near-field data analysis method, and a program for causing a computer to execute the method. The present invention relates to a computer-readable recording medium.

[0002]

2. Description of the Related Art Conventionally, an electronic device, for example, a near-field map measuring device (an electromagnetic scanner, for example, EMSCAN (registered trademark) manufactured by Northern Telecom) has been used to grasp the causes of unnecessary radiation phenomena of printed circuit boards and the effects of countermeasures. In order to use this method, all harmonics of the clock frequency, two-dimensional spatial distribution, and total four-dimensional data before and after the countermeasures (time axis) used in the printed circuit board are continuous. Need to look at.

[0003]

However, in the conventional analysis method, much time is required to view such an enormous amount of data. Therefore, since the data amount is enormous and the measurement time is long, the actual measurement can be performed only at a few of the frequencies, and it is not possible to accurately identify a defective portion. was there.

[0004] Due to this problem, it is often not possible to take an appropriate measure against the problem caused by the near magnetic field. For example, there is a problem that even if an improvement is seen at a certain frequency, it becomes worse at another frequency. in this way,
In the near-field map analysis, it is desired that the information is provided in a form that does not cause oversight and has good reproducibility of the effect of the trouble spots and countermeasures on the printed circuit board.

SUMMARY OF THE INVENTION The present invention has been made in view of the above-described problems of the related art, and has a plurality or a single clock frequency source for efficient electromagnetic wave (unwanted radiation spectrum) suppression measures and the like. A near-field data analyzer, a near-field data analysis method, which can quickly and accurately analyze the entire spectrum of an electronic device,
It is another object of the present invention to provide a computer-readable recording medium on which a program for causing a computer to execute the method is recorded.

[0006]

Means for Solving the Problems To solve the above-mentioned problems,
In order to achieve the object, a near-field data analyzer according to claim 1 is a near-field data analyzer that analyzes near-field data of an electronic device measured by an electromagnetic scanner. Analyzed data input means for inputting near field data of the frequency of the frequency and position information on the measurement area in the electronic device at which the near magnetic field data was measured, and at each of the predetermined frequencies input by the analyzed data input means Analyzing data average value calculating means for calculating an average value of near magnetic field data for each of the measurement areas.

According to the first aspect of the present invention, by obtaining an average value in each measurement area, the resonance phenomenon can be made inconspicuous, and it becomes easy to specify the area of the true cause.

Further, the near-field data analyzer according to the second aspect of the present invention provides the near-field data analyzer according to the first aspect of the invention.
Further, reference data input means for inputting reference data,
A reference data average value calculating means for calculating an average value of the reference data at each of the predetermined frequencies input by the reference data input means for each of the measurement areas; and a near magnetic field calculated by the analyzed data average value calculating means. Difference data calculation means for calculating difference data by subtracting the average value of the reference data calculated by the reference data average value calculation means corresponding to the near magnetic field data from the average value of the data. It is assumed that.

According to the second aspect of the present invention, comparison with reference data can be performed, and it is possible to easily understand how much unnecessary radiation phenomenon has been improved by the improvement processing.

A near-field data analyzer according to a third aspect of the present invention is the invention according to the first or second aspect, further comprising: a display unit having a display screen; The average value calculated by the analyzed data average value calculation means and / or the average value calculated by the reference data average value calculation means and / or the difference data calculated by the difference data calculation means is calculated for each of the measurement areas. Display control means for displaying.

According to the third aspect of the present invention, the analysis result can be easily grasped.

Further, the near-field data analyzing apparatus according to the invention of claim 4 is the invention according to claim 3,
The display control means may be configured to calculate the average value calculated by the analyzed data average value calculation means and / or the average value calculated by the reference data average value calculation means and / or the difference data calculated by the difference data calculation means. Is a visual feature changed based on the amount of data,
The measurement area is displayed in correspondence with the two-dimensional coordinate position.

According to the fourth aspect of the present invention, the analysis result can be grasped intuitively.

According to a fifth aspect of the present invention, in the near-field data analyzer according to the first or second aspect, further, an average value of the entire measurement area at each of the predetermined frequencies is calculated. The apparatus is characterized in that it comprises means for calculating an average value of all measurement areas.

According to the fifth aspect of the present invention, it can be grasped at any place on the electronic device.
It is possible to grasp the entire frequency characteristic that reflects the influence on the entire region.

The near-magnetic field data analyzer according to the invention described in claim 6 is the invention described in claim 5,
Further, a display unit having a display screen, and a display control unit that controls the display unit and displays the average value calculated by the entire measurement area average value calculation unit, is provided. is there.

According to the sixth aspect of the present invention, it is possible to easily grasp the analysis result reflecting the influence on the entire area.

A near-field data analyzer according to a seventh aspect of the present invention is the near-field data analyzing apparatus according to the first to sixth aspects, further comprising frequency input means for inputting a desired frequency, wherein the display control means comprises: By displaying the analyzed data and / or the reference data and / or the difference data corresponding to the frequency corresponding to or close to the frequency input by the frequency input means, and further by inserting a special value into the frequency input means The average value calculated by the reference data calculation unit and / or the average value calculated by the analyzed data calculation unit and / or the average value data calculated by the difference data calculation unit are also displayed. Is also good.

According to the seventh aspect of the present invention, it is possible to search for an analysis result at a desired frequency, and to easily grasp the searched analysis result.

The near-magnetic field data analyzer according to the invention of claim 8 is the invention according to claims 1 to 7, further comprising a printed circuit board structure information storage for storing printed circuit board structure information of the electronic device. Means, the highest value of near magnetic field data at each of the predetermined frequencies input by the analyzed data input means for each of the measurement areas, and / or
Alternatively, a maximum value storage means for storing a maximum value of average value data for each of the measurement areas is provided, and the display control means includes a maximum value of each predetermined frequency stored in the maximum value storage means and / or the measurement area. And displaying the printed circuit board structure information stored by the printed circuit board structure information storage means corresponding to the measurement area corresponding to the highest value of the average value data for each.

According to the eighth aspect of the present invention, it is possible to visually and instantaneously grasp a cause at each predetermined frequency or a region considered to be a true cause common to all frequencies.

According to a ninth aspect of the present invention, there is provided a near-magnetic field data analyzer according to the first to seventh aspects, wherein a printed circuit board structure information storage means for storing printed circuit board structure information of the electronic device. Designating means for designating the measurement area, wherein the display control means displays the printed circuit board structure information stored by the printed circuit board structure information storage means corresponding to the measurement area designated by the designating means. It is characterized by the following.

According to the ninth aspect of the present invention, it is possible to easily know the structure on the printed circuit board in the area considered to be the cause.

According to a tenth aspect of the present invention, in the near magnetic field data analyzer according to the first to ninth aspects, the predetermined frequency is a harmonic of a clock frequency of an electronic device. It is a feature.

According to the tenth aspect of the present invention, analysis can be performed based on the clock frequency of the source.

The near-field data analysis method according to the present invention is a near-field data analysis method for analyzing near-field data of an electronic device measured by an electromagnetic scanner. An analyzed data inputting step of inputting near field data of a frequency and position information on a measurement region in the electronic device where the near magnetic field data is measured; and a near field at each of the predetermined frequencies input in the analyzed data inputting step. Calculating an average value of the magnetic field data for each of the measurement areas.

According to the eleventh aspect of the present invention, by obtaining the average value in each measurement area, the resonance phenomenon can be made inconspicuous, and the area of the true cause can be easily specified.

According to a twelfth aspect of the present invention, there is provided a near-field data analysis method according to the eleventh aspect, wherein the reference data input step of inputting reference data and the reference data input step are performed by the reference data input step. A reference data average value calculating step of calculating an average value of the reference data for each of the measurement areas at each of the predetermined frequencies; and the near magnetic field data from the average value of the near magnetic field data calculated by the analyzed data average value calculating step. And a difference data calculation step of calculating difference data by subtracting the average value of the reference data calculated in the reference data average value calculation step corresponding to the above.

According to the twelfth aspect of the present invention, comparison with reference data can be made, and it is possible to easily understand how much unnecessary radiation phenomenon has been improved by the improvement processing.

A near-field data analysis method according to a thirteenth aspect of the present invention is the near-field data analysis method according to the eleventh or twelfth aspect, wherein the average value calculated in the analysis target data average value calculation step and / or A display step of displaying, for each of the measurement areas, the average value calculated in the reference data average value calculation step and / or the difference data calculated in the difference data calculation step.

According to the thirteenth aspect, the analysis result can be easily grasped.

According to a fourteenth aspect of the present invention, in the near magnetic field data analysis method according to the thirteenth aspect, the displaying step includes the step of calculating the average value calculated in the analyzed data average value calculating step. And / or the average value calculated by the reference data average value calculation step and / or the difference data calculated by the difference data calculation step is changed based on the data amount as a visual feature.
The measurement area is displayed in correspondence with the two-dimensional coordinate position.

According to the present invention, the analysis result can be intuitively grasped.

In the near-field data analysis method according to the present invention, the average value of the entire measurement region at each of the predetermined frequencies is further calculated. The method includes a step of calculating an average value of all measurement areas.

According to the fifteenth aspect of the present invention, it is possible to ascertain wherever it appears in the electronic device, and it is also possible to ascertain the entire frequency characteristic reflecting the influence on the entire area.

In the near-field data analysis method according to the present invention, a display step for displaying the average value calculated in the entire measurement area average value calculating step is provided. It is characterized by including.

According to the sixteenth aspect of the present invention, it is possible to easily grasp the analysis result reflecting the influence on the entire area.

A near-field data analysis method according to a seventeenth aspect of the present invention is the method according to the eleventh to sixteenth aspects, further comprising a frequency inputting step of inputting a desired frequency. By displaying the analyzed data and / or the reference data and / or the difference data corresponding to the frequency corresponding to or close to the frequency input in the frequency input step, and further by inserting a special value in the frequency input step, Displaying the average value calculated in the reference data calculation step and / or the average value calculated in the analysis target data calculation step and / or the average value data calculated in the difference data calculation step. It is.

According to the seventeenth aspect, an analysis result at a desired frequency can be searched, and the searched analysis result can be easily grasped.

In the near-field data analysis method according to the eighteenth aspect of the present invention, there is provided the near-field data analysis method according to the eleventh to seventeenth aspects, further comprising: inputting printed board structure information of the electronic device. A step of displaying the maximum value of near magnetic field data at each of the predetermined frequencies input in the analyzed data input step for each of the measurement regions and / or a maximum value of an average value for each of the measurement regions. The printed circuit board structure information input in the printed circuit board structure information input step corresponding to the relevant measurement area is displayed.

According to the eighteenth aspect of the present invention, it is possible to visually and instantaneously grasp a cause at each predetermined frequency or a region considered to be a true cause common to all frequencies.

A near-field data analysis method according to a nineteenth aspect of the present invention is the near-field data analysis method according to the eleventh to seventeenth aspects, wherein a printed circuit board structure information input step of inputting printed circuit board structure information of the electronic device is provided. Specifying the measurement area, wherein the display step displays the printed circuit board structure information input in the printed circuit board structure information input step corresponding to the measurement area specified in the specification step. It is characterized by the following.

According to the nineteenth aspect of the present invention, it is possible to easily know the structure on the printed circuit board in the area considered to be the cause.

In the near-field data analysis method according to the present invention, the predetermined frequency is a harmonic of a clock frequency of an electronic device. It is a feature.

According to the twentieth aspect, the analysis can be performed based on the clock frequency of the generation source.

The storage medium according to the twenty-first aspect of the present invention records a program for causing a computer to execute the method according to the eleventh to twentieth aspects, so that the program becomes machine-readable. ,
The operations of claims 11 to 20 can be realized by a computer.

[0047]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS With reference to the accompanying drawings, a near-field data analyzing apparatus, a near-field data analyzing method, and a computer-readable recording medium storing a program for causing a computer to execute the method will be described below. A preferred embodiment will be described in detail.

(Hardware Configuration) First, the hardware configuration of the near magnetic field data analyzer according to the embodiment of the present invention will be described. FIG. 1 is a block diagram illustrating a hardware configuration of the near-field data analyzer according to the present embodiment.

In FIG. 1, 101 is a CPU for controlling the entire spectrum analyzer, 102 is a ROM storing a boot program and the like, 103 is a RAM used as a work area of the CPU 101, and 104 is a C
HD (hard disk) under control of PU101
HD that controls the reading / writing of data from / to 105
D (hard disk drive), 105 is HDD1
HD that stores data written under the control of the control unit 04 is shown.

Reference numeral 106 denotes an FDD (floppy disk drive) for controlling reading / writing of data from / to an FD (floppy disk) 107 under the control of the CPU 101, and 107 stores data written under the control of the FDD 106. Reference numeral 108 denotes an FD as an example of a removable storage medium, and 108 denotes a display for displaying documents, images including tables and graphs, function information, and the like.

An interface (I / I / I) 109 is connected to a network via a communication line 110 and controls an internal interface with the network NET.
F), 111 is a keyboard provided with keys for inputting characters, numerical values, various instructions, etc. 112 is moving the cursor, selecting a range, pressing an icon or button displayed on the display screen, or selecting a window. The mouse is used to move the mouse, change the size, and the like.

Reference numeral 113 denotes an OCR (optical).
A scanner for optically reading an image provided with a character reader (Character Reader) function; 114, a printer for printing search results and other data contents displayed on the display screen; 115, a bus for connecting the above-described units; Each is shown.

The HD 105 stores application software such as near-field analysis software, data conversion software, spreadsheet software, software for connecting to a network such as the Internet, and macro programs such as dynamic format macro programs. May be performed.

(Functional Configuration) Next, the functional configuration of the near-field data analyzer according to the present embodiment will be described. FIG. 2 and FIG. 3 are block diagrams functionally showing the configuration of the near-field data analyzer according to the present embodiment.

In the block diagram of FIG. 2, the near-field data analyzer includes a display control unit 200, an analyzed data input unit 201, an analyzed data average value calculation unit 202, a reference data input unit 203, and a reference data input unit 203. Average value calculation unit 204
, A difference data calculation unit 205, a display unit 206, a frequency input unit 207, a printed circuit board structure information storage unit 208
And a maximum value storage unit 209 and a measurement area designating unit 210.

FIG. 3 is another block diagram functionally showing the configuration of the near magnetic field data analyzer according to the present embodiment. In the block diagram of FIG. 3, the near-field data analyzer includes a display control unit 200 and an analyzed data input unit 20.
1, the analyzed data average value calculation unit 202, the reference data input unit 203, the reference data average value calculation unit 204, the difference data calculation unit 205, the display unit 206, and the entire measurement region average value calculation unit 301. It is a configuration including. The same components are denoted by the same reference numerals.

The analyzed data input unit 201 inputs and stores near-magnetic field data of each predetermined frequency of the electronic device and position information on a measurement region in the electronic device where the near-field data is measured.

The near magnetic field data includes data related to a near magnetic field strength map measured by a near magnetic field map measuring device described later. Further, the position information on the measurement area is, specifically, information on two-dimensional coordinates of the measurement area.

The data-to-be-analyzed calculating unit 202 calculates the average value of the near-field data at each predetermined frequency, which is input by the data-to-be-analyzed input unit 201, for each measurement region, for the purpose of making the resonance phenomenon unnoticeable. calculate. Since the calculation of the average value uses a general method, a detailed description thereof is omitted. This makes it easier to identify the true cause area.

The reference data input section 203 inputs and stores the reference data, and the reference data average value calculation section 204 calculates the average value of the reference data at each predetermined frequency input by the reference data input section 203 for each measurement area. Is calculated.
The process of calculating the average value is the same as the process of calculating the average value in the analyzed data average value calculation unit.

The difference data calculation unit 205 calculates the average of the reference data calculated by the reference data average value calculation unit 204 corresponding to the near magnetic field data from the average value of the near magnetic field data calculated by the analyzed data average value calculation unit 202. The difference data is obtained by subtracting the value. The reason for the subtraction is to compare the analyzed data with the reference data so that it is possible to easily understand how much the unnecessary radiation phenomenon has been improved by the improvement processing.

The display section 206 has a display screen, and can be realized by, for example, the display 108 such as a CRT or a liquid crystal display. The display control unit 200 controls the display unit 206 to calculate the average value calculated by the analyzed data average value calculation unit 202 and / or the average value calculated by the reference data average value calculation unit 204 and / or the difference. The difference data calculated by the data calculation unit 205 is displayed for each of the measurement areas.

Further, the display control unit 200 controls the average value calculated by the analyzed data average value calculation unit 202 and / or the average value calculated by the reference data average value calculation unit 204 and / or the difference data calculation unit 205. The calculated difference data is displayed in a manner corresponding to the two-dimensional coordinate position of the measurement area, with a visual feature changed based on the data amount, for example, color-coded.

The frequency input section 207 inputs and stores a desired frequency. That is, the frequency of the harmonic that the operator wants to know the analysis result is input and stored. Details of the frequency input unit 207 will be described later.

At this time, the display control unit 200 displays the analyzed data and / or the reference data and / or the difference data thereof corresponding to the frequency corresponding to or close to the frequency input by the frequency input unit 207.

The printed circuit board structure information storage unit 208
Stores the printed circuit board structure information of the electronic device, and stores the maximum value storage unit 209 for each measurement area of the near magnetic field data at each of the predetermined frequencies input by the analyzed data input unit 201 and the reference data input unit 203. The maximum value and / or the maximum value of the average value data for each measurement area is stored.

The printed circuit board structure information storage unit 208 and the maximum value storage unit 209 store the HD 105 and the HDD 10
4 or a storage medium such as the FD 107 and the FDD 106 and a device for writing / reading information to / from the storage medium. Note that the algorithm of the maximum value storage unit 209 occupies most of the flowchart of FIG. 10 described later.

At this time, the display control unit 200 corresponds to the maximum value of each predetermined frequency stored in the maximum value storage unit 209 and / or the measurement area corresponding to the maximum value of the average value data for each measurement area. The printed circuit board structure information stored by the printed circuit board structure information storage unit 208 is displayed. Therefore, it is possible to visually and instantaneously grasp a cause at each predetermined frequency or a region considered to be a true cause common to all frequencies.

The measurement area specifying section 210 specifies a measurement area. That is, for example, when the operator
11 or by inputting a two-dimensional coordinate value, or by using the mouse 112 to display the area displayed on the display screen.
The measurement area is designated by pointing using such as.

At this time, the display control section 200 displays the printed circuit board structure information stored in the printed circuit board structure information storage section 208 corresponding to the measurement area specified by the measurement area specifying section 210. Therefore, it is possible to easily know the structure on the printed circuit board in the region considered to be the cause.

Further, in the block diagram of FIG. 3, the entire measurement area average value calculation section 301 calculates the average value of the entire measurement area at each predetermined frequency. Since the average value is calculated using a general method, a detailed description thereof is omitted.

Since the average value of the entire measurement area at each predetermined frequency is calculated by the entire measurement area average value calculation unit 301, it can be grasped at any place in the electronic device, and the influence on the entire area can be grasped. The entire reflected frequency characteristic can be grasped. Note that the algorithm of the entire measurement area average value calculation unit 301 occupies most of the flowchart of FIG. 10 described later.

At this time, the display control section 200 displays the average value calculated by the entire measurement area average value calculation section 301. Therefore, it is possible to easily grasp the analysis result that also reflects the influence on the entire region, and thereby, it is possible to have a plurality or a single clock frequency source for efficient electromagnetic wave (unwanted radiation spectrum) suppression measures and the like. It is possible to quickly and accurately analyze the entire spectrum of electronic equipment.

The display control unit 200, the analyzed data input unit 201, the analyzed data average value calculation unit 202, the reference data input unit 203, the reference data average value calculation unit 204, the difference data calculation unit 205, the display unit 206, Frequency input unit 2
07, the printed circuit board structure information storage unit 208, the maximum value storage unit 209, the measurement region designation unit 210, and the total measurement region average value calculation unit 301 are stored in a program or the like recorded on a recording medium such as the ROM 102, the RAM 103, or the hard disk 105. The function of each unit may be realized by the CPU 101 or the like executing the instruction processing according to the described instruction.

(Outline of Near-Magnetic Field Map Measurement Apparatus)
An outline of the near-field map measuring device will be described. Near-field map measurement devices (electromagnetic scanners, for example, EMSCAN® from Northern Telecom) measure high-frequency radiation from printed circuit boards without entering into details. The amplitude of the radiation from the substrate is plotted against the frequency, and the X and Y coordinate diagrams of the magnetic field distribution corresponding to the substrate surface current are plotted for a specific frequency.

FIG. 4 shows an example of an array of antennas of the near-field map measuring device connected to the near-field data analyzing device according to the present embodiment. FIG. 5 shows an example of a circuit of an antenna array of the near-field map measurement device connected to the near-field data analyzer according to the present embodiment.

The antenna substrate of the near magnetic field map measuring device is
It consists of two elements: an antenna array and a control logic circuit. The antenna array is composed of an orthogonal lattice of microprobes and, as shown in FIG. 4, is composed of an arrow-shaped pattern embedded in a 16-layer printed circuit board.
Each probe consists of a capacitor 501, a diode 502 and one of each a printed loop 503.

The antenna array is made using stripline technology, and each line is terminated with a substantially characteristic impedance. Each row and each stage of the antenna array is terminated with a chip capacitor, allowing high frequency voltage to be supplied to the input of the receiver through a mini coaxial cable.

The control logic is located at the end of the antenna array and is composed of high-speed CMOS logic. Under the control of the processor, the appropriate columns and stages are selected to enable the recording of values on the receiver. This switch selects one loop, and the high frequency voltage induced therein is coupled to the measuring receiver through this chip capacitor. In this way,
Analyzed data can be obtained from the near-field map measurement device.

(Contents of Each Processing) Next, the contents of each processing in the near-field data analyzer according to the present embodiment will be described. A list of each process is shown below.

(1) Measurement Data Conversion Process A process of converting a measurement data file (binary data) output from a measurement device (including a control program) into a data file according to a readable format in the following measurement data analysis process. It is.

(2) Measurement data analysis processing This is measurement data analysis processing according to the following algorithm (1) to (5).

Data reading processing Two-dimensional filter processing of near-field map data Averaging processing over all frequencies for all area coordinates over all areas Characteristic data extraction processing Analysis data output processing

(3) Analysis data display processing The analysis data and printed circuit board data (conductor pattern and component information) output by the measurement data analysis processing are read and converted into visually recognizable forms (maps and spectrum graphs). This is a process having the following processes:

Report creation processing Automatic identification of the maximum radiation point on the printed circuit board and visual automatic display processing Frequency search processing of map data Printed circuit board position search processing

(1) Measurement Data Conversion Process First, the measurement data conversion process will be described. FIG. 6 is a flowchart showing the contents of the measurement data conversion process of the near magnetic field data analyzer according to the present embodiment.

The measurement data file (usually binary data), which is the analyzed data output by the near-field map measuring apparatus, stores all harmonics of the clock frequency in question within the measurable range of the near-field map measuring apparatus. It is assumed that they are arranged one by one.

The measurement data conversion function first reads the header in the flowchart of FIG. 6 (step S601). After that, necessary information of the header part is extracted (step S602). The necessary information in the header section includes, for example, a measurement frequency, a measurement title, and the like. Further, data output is also performed.

Next, measurement data is fetched (step S603), and string conversion of the fetched measurement data is performed (step S604). Further, the string-converted data is output.

Subsequently, the next header is searched (step S605), and it is determined whether or not the next header is found (step S606). Here, when the next header is found (Yes at Step S606), Step S601 is performed.
Then, a series of processes from steps S601 to S606 are repeatedly performed.

On the other hand, when the next header is not found in step S606 (No in step S606)
Determines that all the measurement data has been captured, and ends the processing.

((2) Measurement Analysis Process) Next, the measurement analysis process will be described in the following order with reference to FIGS.

Data Read Processing FIG. 7 is a flowchart showing the procedure of the data read processing of the near magnetic field data analyzer according to the present embodiment.

In the flowchart of FIG. 7, first, the analyzed data file name and the referenced data file name are fetched (steps S701 and S702). Further, an output file name is created (step S703).

Next, the analyzed data file is read (step S704), and the read analyzed data file is temporarily stored (such as in a buffer memory). Similarly, the reference data file is read (step S70).
6) The read reference data file is stored in the temporary storage (step S707), and the process ends.

Two-Dimensional Filtering of Near-Field Map Data The average value filtering of four values in each of the binary values in each of the X-direction and Y-direction is performed by using a near-field map measuring apparatus in which the directivity in the magnetic field direction of a magnetic field antenna which is close to each other is determined. This is performed to obtain a value corresponding to the magnitude of the magnetic field vector based on the orthogonality.

FIG. 8 is a flowchart showing a procedure of the mean value filter processing of the near magnetic field data analyzer according to the present embodiment.

In the flowchart of FIG. 8, first, X
A data value at an arbitrary point (x: for example, a minimum value) in the direction is input (step S801). Step S80
The value input at 1 is x1.

Next, a data value next to an arbitrary point xX in step S801 is input (step S802). The value input in step S802 is x2.

Next, the data value at the point (y) corresponding to x in the Y direction is input (step S80).
3). The value input in step S803 is defined as y1. Further, a next data value in the X direction, that is, a data value at a point corresponding to the above x2 in the Y direction is input (step S804).

It is assumed that the value input in step S804 is y2. Next, an average value of x1, x2, y1, and y2 is calculated (step S805). The calculated average value is output or stored (step S
806).

Next, it is determined whether or not the processing for all data has been completed (step S807). Here, if the processing on all the data has not been completed (No at Step S807), the next point, that is, the point of x = x + 1 is searched (Step S80).
8).

Thereafter, the flow shifts to step S801, and thereafter, the processing of steps S801 to S808 is repeated. If the processing on all data has been completed in step S807 (Yes in step S807),
A series of two-dimensional filter processing ends.

By the two-dimensional filter processing, a magnetic field map described later can clearly show continuous contour lines. Therefore, the spatial distribution state of the near magnetic field can be viewed correctly.

Averaging Processing over All Frequencies for Each Area Coordinate over All Regions Next, the contents of the averaging processing over all frequencies over each area coordinates for every area will be described.

FIG. 9 is a flowchart showing the procedure of the averaging process over all the frequencies with respect to each region coordinate over the entire region of the near-field data analyzing apparatus according to the present embodiment.

In the flowchart of FIG. 9, first, the first area to be averaged is extracted (step S901). Then, an average value at the first harmonic is calculated for the first region (step S902). The calculated average value is output or stored (step S903).

Next, it is determined whether or not the harmonic whose average value has been calculated is the last harmonic to be processed (step S904). Here, if it is not the last harmonic (No at Step S904), the average value at the next harmonic is continuously calculated (Step S905), and the process proceeds to Step S903. Hereinafter, steps S903 to S903 are performed until the average value calculation processing for all harmonics is completed.
Each process between S905 is repeatedly performed.

If it is the last harmonic in step S904 (Yes in step S904), it is next determined whether or not the area subjected to the averaging processing is the last area to be processed. (Step S906). Here, when it is not the last area (No at Step S906)
Extracts the next area (step S907).

Thereafter, the flow shifts to step S902, and repeats the processing of steps S902 to S907 until the averaging calculation processing for all the areas is completed. If it is the last region in step S906 (Yes in step S906), all the processes of the averaging process over all frequencies for all region coordinates over all regions are completed.

Although not shown, the same processing as the above processing is performed on the reference data. further,
The data obtained by subtracting the data obtained by averaging over all the harmonics of the data corresponding to each region of the reference data from the data obtained by averaging over all the harmonics of the data corresponding to each region of the data to be analyzed. create.

Processing for extracting characteristic data The following processing is performed on each of the analyzed data, the reference data, and the difference data.

FIG. 10 is a flowchart showing a procedure of characteristic data extraction processing of the near-magnetic-field data analyzing apparatus according to the present embodiment.

In the flowchart of FIG. 10, first,
First harmonic data is extracted from a plurality of harmonic data (step S1001). Next, step S
The first map coordinate data (analyzed data and reference data) is extracted from the harmonic data extracted in step 1001 (step S1002). Next, step S
The reference data value is subtracted from the analyzed data value corresponding to the map coordinates extracted in 1002, and a value derived as a result of the subtraction is set as a difference data value (step S100).
3).

Thereafter, it is determined whether or not the processing has been completed for all the map coordinates (step S1004). If the processing has not been completed (No at step S1004), the data of the next map coordinate is extracted (step S100).
5) The process proceeds to step S1003. Hereinafter, step S1003 is performed until all map coordinates are completed.
To S1005 are repeatedly performed.

If the process has been completed for all map coordinates in step S1004 (Yes in step S1004), then the maximum value in the map for each of the data to be analyzed, the reference data, and the difference data is obtained and the values are stored. (Step S1006).

Similarly, the minimum value in the map for each of the data to be analyzed, the reference data, and the difference data is obtained, and the obtained value is stored (step S1007). Further, an average value of the harmonic data over the entire map is calculated (step S1).
008).

Thereafter, it is determined whether or not the processing has been completed for all the harmonic data (step S1009). If the processing has not been completed (No at step S1009), the next harmonic data is extracted (step S1010). The process moves to step S1001. Hereinafter, steps S1001 to S1 are performed until all the harmonic data is completed.
Step 010 is repeated.

In step S1009, the above steps S1001 to S10 are executed for all harmonic data.
If the processing up to 08 has been completed (Yes at Step S1009), the entire series of processing ends. A similar process is performed on the all-frequency averaged data. That is, in these processes, data averaged for each coordinate for all frequencies is processed in the same manner as one harmonic data.

Analysis Data Output Processing Data generated by averaging processing over all frequencies for each area coordinate over the entire area and extracting characteristic data is output according to a predetermined format.

((3) Analysis Data Display Processing) Next, the measurement analysis processing will be described with reference to FIGS.
Will be described in this order.

Report Creation Process The report creation process is created during the work of the display control unit 200 reading the data of the analysis result. That is, it is executed by the algorithm shown in the flowchart of FIG.

FIG. 11 is a flowchart showing the procedure of a report creation process of the near-field data analyzer according to the present embodiment.

In the flowchart of FIG. 11, first,
An activation dialog is activated (step S1101).
The startup dialog is a dialog for describing necessary data, and includes “number / title of analysis”, “analysis directory”, “analysis file name”, “difference directory”,
Describe "difference file name" and the like.

Next, the date and time of analysis is written in a predetermined place of the sheet (step S1102). Further, a report sheet is written in a predetermined location (step S1103).

Thereafter, the data portion necessary for the report of the read data is copied to the report sheet to write the data (step S110).
4). Finally, steps S1101 to S110
Based on the processing of No. 4, a map is created (step S1105), and all the processing for creating a series of reports is completed.

FIG. 12 is an explanatory diagram showing the structure of a report of the near-field data analysis device according to the present embodiment. In FIG. 12, the configuration of the report includes a printed circuit board information display area 1201, a spectrum display area 1202, a near magnetic field map display area 1203, and a difference map display area 120.
4. Scan map display area 1205, comment area A
1206, a comment area B1207, and the like.

In the printed circuit board information display area 1201,
Information about the printed circuit board, such as "information about the subject of evaluation", "measurement place", "use period", "assembly specification", "whole function specification", "information about the person in charge", etc. is displayed. In the spectrum display area 1202, the frequency versus effect (average value over the entire area) is displayed for each of the analyzed data, the reference data, and the difference data.

Further, in the near magnetic field map display area 1203, the spatial position versus the observed value (average of all frequencies) is displayed by continuous contour lines. Also, the difference map display area 1
At 204, the spatial position versus effect (average over all frequencies) is displayed by continuous contours as well as the spatial position versus observations. In the scan map display area 1205, an image of the target printed circuit board is displayed.

[0130] In the comment area A1206, a comment with automatic description is displayed. Further, a comment described in a manual performed by the operator is displayed in a comment area B1207.

Automatic Identification and Visual Automatic Display Processing of the Maximum Radiation Location on the Printed Circuit Board The display control section 200 can view the analyzed data, the near-magnetic field map of each harmonic, etc., in addition to the report format part. It has a viewer. FIG. 13 is an explanatory diagram illustrating a configuration of a viewer unit of the near-field data analysis device according to the present embodiment.

As described above, the reference data average value calculating section 20
4, the data of the analyzed data average value calculation unit 202 and the data of the difference data calculation unit 205 are displayed in the near magnetic field map display area 1203 and the difference map display areas 1204, 1302, and 1303 in FIG.

In FIG. 13, in addition to a display area 1301 for the analyzed spectral data, a viewer section includes a near magnetic field map display area 1302, an analysis numerical data display area 1303, a board map display area 1304,
An operation button area 1305 is provided.

In the analysis numerical data display area 1303, there is a portion for displaying the coordinates where the absolute value of the near magnetic field map is the largest,
When the near magnetic field map is switched, the numerical value is updated accordingly, and at the same time, a portion of the printed circuit board corresponding to the coordinates is displayed in the board map display area 1304.

The display control section 200 has a map data section for storing printed circuit board map data to be displayed in the board map display area 1304 in accordance with the near-field map coordinates for each layer according to the layer configuration of the printed circuit board. May be.

The printed circuit board map data can be stored manually using the cut and paste function. Also, an automatic storage function for storing predetermined printed circuit board map data can be used. FIG. 14 is an explanatory diagram showing a dialog for starting the printed circuit board map data automatic storage function of the near magnetic field data analyzer according to the present embodiment.

In the start dialog 1400 shown in FIG.
Multiple map file names 1401, import magnification 140
2, capture coordinates X1403, capture coordinates Y140
4 can be input, and data that has been input or that has been input in advance is displayed. After the data is input, the data is stored by clicking an “execute” button 1405.

Frequency Search Process of Map Data In the near magnetic field map display area 1302 of the viewer, data of a required frequency can be searched and displayed in the near magnetic field map data of the measured harmonics. FIG.
FIG. 5 is an explanatory diagram showing a dialog for starting map data frequency search processing of the spectrum analyzer according to the present embodiment;

In FIG. 15, the frequency search processing activation dialog 1500 is provided with a frequency entry column 1501 for inputting a frequency to be searched, and a numerical value of the corresponding frequency is entered in the frequency entry column 1501. OK "
By clicking button 1502, a frequency search process is executed.

As a result of the search processing, near-field map data of the frequency closest to the frequency input in the frequency entry field 1501 is displayed in the near-field map display area 1302 shown in FIG. When a negative value is entered, the near-field map data subjected to the analysis processing is displayed.

In the near magnetic field map area 1302, three types of data, that is, the analyzed data, the reference data, and the difference data can be switched and displayed. For each of the switched data, a frequency search can be similarly performed. Can be.

The position of the printed circuit board is searched. By specifying the coordinates of the problem site in the near magnetic field map display area 1302 in the viewer,
Image information (inner layer pattern of the board) indicating the printed board structure at the location can be searched.

FIG. 16 is an explanatory diagram showing a dialog box for starting a printed circuit board position search process of the near magnetic field data analyzing apparatus according to the present embodiment.

In FIG. 16, the dialog box 1600 for starting the position search processing of the printed circuit board is an X coordinate input field 160.
1, a Y coordinate input field 1602, and an "execute" button 160
And 3. After inputting coordinate values in the X coordinate input field 1601 and the Y coordinate input field 1602, by clicking an “execute” button 1603, a corresponding portion of the image information indicating the printed circuit board structure is displayed in the board map display area 1304. . By clicking the map selection button 1306 shown in FIG. 13, the layer information of the printed circuit board displayed in the board map display area 1304 can be switched.

With the conventional apparatus, it was possible to grasp the approximate position of a problem spot on the printed circuit board. However, the structure of the spot on the printed circuit board (for example, an inner layer structure that cannot be seen from the surface) is located on the spot. Can not grasp in the
Although the analysis work could not be made more efficient, the printed circuit board position search process stores the printed circuit board structure information and allows searching for the board structure at the location of the problem corresponding to the near magnetic field map display. The problem of the structure of the printed circuit board can be quickly grasped.

As described above, according to the present embodiment, the analyzed data input unit 201 relates to the near-field data of each predetermined frequency of the electronic device and the measurement area on the printed circuit board where the near-field data is measured. The position information is input, and the analyzed data average value calculation unit 202 calculates the average value of the near magnetic field data at each predetermined frequency input by the analyzed data input unit 201 for each measurement region, so that the resonance phenomenon is noticeable. Can be eliminated, making it easier to identify the real cause area.

As a result, the entire spectrum of a printed circuit board having a plurality of or a single clock frequency source can be analyzed quickly and accurately for efficient electromagnetic wave (unwanted radiation spectrum) suppression measures and the like. Can be.

Further, according to the present embodiment, reference data input section 203 inputs reference data, and reference data average value calculation section 204 generates reference data at each predetermined frequency input through reference data input 203. The average value of the data for each measurement area is calculated, and the difference data calculation unit 205 calculates
Difference data is calculated by subtracting the average value of the reference data calculated by the reference data average value calculation unit 204 corresponding to the near magnetic field data from the average value of the near magnetic field data calculated by the analyzed data average value calculation unit 202 So
The comparison with the reference data can be performed, and it is possible to easily understand how much the unnecessary radiation phenomenon has been improved by the improvement processing.

Further, according to the present embodiment, display control section 200 controls display section 206 having a display screen, and
The average value calculated by the analyzed data average value calculation unit 202 and / or the average value calculated by the reference data average value calculation unit 204 and / or the difference data calculation unit 20
Since the difference data calculated in step 5 is displayed for each measurement area, the analysis result can be easily grasped.

Further, according to the present embodiment, display control section 200 controls average value calculated by analyzed data average value calculation section 202 and / or reference data average value calculation section 2.
Since the average value calculated in step 04 and / or the difference data calculated by the difference data calculation unit 205 are displayed as visual features changed based on the data amount in correspondence with the two-dimensional coordinate position of the measurement area. It is possible to intuitively grasp the analysis result.

Further, according to the present embodiment, all measurement area average value calculation section 301 calculates the average value of the entire measurement area at each predetermined frequency, so that it can be recognized at any place on the printed circuit board. In addition, it is possible to grasp the entire frequency characteristic reflecting the influence on the entire region.

Further, according to the present embodiment, display control section 200 controls display section 206 having a display screen, and
Since the average value calculated by the entire measurement area average value calculation unit 301 is displayed, it is possible to easily grasp the analysis result reflecting the influence on the entire area.

Further, according to the present embodiment, frequency input section 207 inputs a desired frequency, and display control section 200
Is the analyzed data corresponding to the frequency corresponding to or close to the frequency input by the frequency input unit, and / or
Alternatively, since the reference data and / or their difference data is displayed, the analysis result at the desired frequency can be searched, and the searched analysis result can be easily grasped.

Further, according to the present embodiment, the printed circuit board structure information storage unit 208 stores the printed circuit board structure information, and the maximum value storage unit 209 stores the analyzed data input unit 201.
And the highest value of the near magnetic field data at each predetermined frequency input by the reference data input unit 203 for each measurement area, and the display control unit 200 stores the highest value of each predetermined frequency stored by the highest value storage unit 209. Since the printed circuit board structure information stored by the printed circuit board structure information storage unit 208 corresponding to the measurement area corresponding to the value is displayed, the area at each predetermined frequency or the area considered to be the true cause common to all frequencies is determined. It can be grasped visually instantly.

Further, according to the present embodiment, printed circuit board structure information storage section 208 stores printed circuit board structure information, measurement area specifying section 210 specifies a measurement area, and display control section 200 executes measurement Printed circuit board structure information storage unit 2 corresponding to the measurement area specified by area specification unit 210
Since the printed circuit board structure information stored in step 08 is displayed, it is possible to easily know the structure on the printed circuit board of the area considered to be the cause.

Further, according to the present embodiment, since the predetermined frequency is a harmonic of the clock frequency of the printed circuit board, analysis based on the clock frequency of the source can be performed.

Therefore, the following effects can be obtained. (1) It is easy to specify the location of a problematic return path or violation. (2) It is possible to quantitatively evaluate the effect of the countermeasure component on the printed circuit board. (3) By quantifying the effects, it is possible to minimize the necessary number of countermeasure components on the printed circuit board and minimize costs. (4) Common problems can be grasped by accumulating and classifying analysis data.

The near-field data analysis method described in the present embodiment or 2 is realized by executing a prepared program on a computer such as a personal computer or a workstation. This program is a hard disk, floppy disk, C
The program is recorded on a computer-readable recording medium such as a D-ROM, an MO, and a DVD, and is executed by being read from the recording medium by the computer. This program can be distributed via the recording medium and a network such as the Internet.

[0159]

As described above, according to the first aspect of the present invention, the data-to-be-analyzed means includes a near-field data of each predetermined frequency of the electronic device and the near-field data for which the near-field data is measured. The position information on the measurement area in the device is input, and the analyzed data average value calculation means calculates the average value of the near magnetic field data at each of the predetermined frequencies input by the analyzed data input means for each of the measurement areas. Therefore, by obtaining the average value in each measurement area, the resonance phenomenon can be made inconspicuous, and the true cause area can be easily specified.

As a result, the spectrum of an electronic device having a plurality of or a single clock frequency source can be analyzed quickly and accurately as a whole for efficient electromagnetic wave (unwanted radiation spectrum) suppression measures and the like. There is an effect that a near-field data analyzer capable of performing the above-mentioned is obtained.

According to a second aspect of the present invention, in the first aspect of the present invention, further, the reference data input means inputs reference data, and the reference data average value calculation means outputs the reference data input value. Calculating an average value of the reference data at each of the predetermined frequencies input by the means for each of the measurement regions, and calculating the difference data from the average value of the near magnetic field data calculated by the analyzed data average value calculation means. Since the difference data is calculated by subtracting the average value of the reference data calculated by the reference data average value calculation means corresponding to the near magnetic field data, the difference data can be compared with the reference data. It is possible to easily grasp whether the unnecessary radiation phenomenon has been improved, and to take measures such as efficient electromagnetic wave (unwanted radiation spectrum) suppression measures. Of an effect that overall quickly and accurately near field data analysis apparatus capable of analyzing the spectrum of an electronic device having a source of clock frequency of multiple or singular is obtained.

According to a third aspect of the present invention, in the first or second aspect, the display control means controls the display means having a display screen to calculate the average value of the analyzed data. The average value calculated by the means and / or
Alternatively, since the average value calculated by the reference data average value calculation means and / or the difference data calculated by the difference data calculation means is displayed for each of the measurement areas, the analysis result can be easily grasped. As a result, it is possible to quickly and accurately analyze the entire spectrum of an electronic device having a plurality of or a single clock frequency source for efficient electromagnetic wave (unwanted radiation spectrum) suppression measures and the like. There is an effect that a near-field data analyzer can be obtained.

According to a fourth aspect of the present invention, in the third aspect of the present invention, the display control means is configured to determine the average value calculated by the analyzed data average value calculation means and / or the reference value. The average value calculated by the data average value calculation means and / or the difference data calculated by the difference data calculation means corresponds to the two-dimensional coordinate position of the measurement area as a visual feature changed based on the data amount. The electronic device having a plurality or a single clock frequency source for effective measures for suppressing electromagnetic waves (unnecessary radiation spectrum) can be intuitively grasped. This provides an effect of obtaining a near-magnetic-field data analyzer capable of quickly and accurately analyzing the spectrum as a whole.

According to a fifth aspect of the present invention, in the first or second aspect of the present invention, the average value calculating means for all measurement areas calculates an average value of the entire measurement area at each of the predetermined frequencies. Since it is calculated, it can be grasped wherever it appears in the electronic device, and it is possible to grasp the entire frequency characteristic that also reflects the effect on the entire area.
A near-magnetic field capable of quickly and accurately analyzing the entire spectrum of an electronic device having a plurality or a single clock frequency source for efficient electromagnetic wave (unwanted radiation spectrum) suppression measures and the like. There is an effect that a data analyzer can be obtained.

According to the invention of claim 6, in the invention of claim 5, the display control means controls the display means having a display screen, and the display control means controls the display means having the entire measurement area average value calculation means. Since the calculated average value is displayed, it is possible to easily grasp the analysis result that reflects the influence on the entire area, and thereby, it is possible to efficiently control electromagnetic waves (unnecessary radiation spectrum) by a plurality or a single unit. This provides an effect of obtaining a near-magnetic-field data analyzer capable of quickly and accurately analyzing the entire spectrum of an electronic device having a clock frequency generation source.

According to the seventh aspect of the present invention, in the first to sixth aspects, the frequency input means inputs a desired frequency, and the display control means inputs the desired frequency by the frequency input means. The analyzed data and / or the reference data and / or the difference data corresponding to the frequency corresponding to or approximated to the determined frequency are displayed, and furthermore, by inputting a special value to the frequency input means, Since the average value calculated by the analysis data average value calculation means and / or the average value calculated by the reference data average value calculation means and / or the difference data calculated by the difference data calculation means is displayed, a desired frequency is displayed. Can be searched, and the searched analysis results can be easily grasped. Magnetic field data that can quickly and accurately analyze the entire spectrum of an electronic device having multiple or single clock frequency sources, such as for measures to effectively control electromagnetic waves (unwanted radiation spectra) There is an effect that an analyzer can be obtained.

According to the invention of claim 8, in the invention of claims 1 to 7, the printed circuit board structure information storage means stores printed circuit board structure information of the electronic device, and stores a maximum value. Means for storing a maximum value of near magnetic field data at each of the predetermined frequencies input by the analyzed data input means for each of the measurement areas and / or a maximum value of average value data for each of the measurement areas; The printed circuit board structure information storage means corresponding to the measurement area corresponding to the maximum value of each predetermined frequency stored in the maximum value storage means and / or the maximum value of the average value data for each measurement area. Display the printed circuit board structure information stored in the area, the cause at each predetermined frequency, or the area considered to be the true cause common to all frequencies Can be grasped instantly Satoshiteki,
This makes it possible to quickly and accurately analyze the entire spectrum of an electronic device having a plurality of or a single clock frequency source for efficient electromagnetic wave (unwanted radiation spectrum) suppression measures and the like. This provides an effect that a suitable near-field data analyzer can be obtained.

According to the ninth aspect of the present invention, in the first to seventh aspects, the printed circuit board structure information storage means stores the printed circuit board structure information of the electronic device, and the designating means stores the printed circuit board structure information of the electronic device. , The measurement area is specified, and the display control means displays the printed circuit board structure information stored by the printed circuit structure information storage means corresponding to the measurement area specified by the specification means, which is considered to be a cause. The structure on the printed circuit board in the area can be easily known, and thereby, the spectrum of an electronic device having a plurality or a single clock frequency source for efficient electromagnetic wave (unwanted radiation spectrum) suppression measures and the like can be obtained. There is an effect that a near-field data analyzer capable of performing the analysis as a whole quickly and accurately can be obtained.

According to the tenth aspect of the present invention,
According to the present invention, the predetermined frequency is a harmonic of the clock frequency of the electronic device, so that it is possible to perform an analysis based on the clock frequency of the generation source. A near-magnetic field data analyzer capable of quickly and accurately analyzing the entire spectrum of an electronic device having a plurality of or a single clock frequency source for electromagnetic wave (unwanted radiation spectrum) suppression measures and the like. Is obtained.

According to the eleventh aspect of the present invention,
Analyzed data input step, near field data of each predetermined frequency of the electronic device and position information about the measurement area in the electronic device where the near magnetic field data is measured, the analyzed data average value calculating step, Since the average value of the near magnetic field data at each of the predetermined frequencies input in the analyzed data input step is calculated for each of the measurement areas, the resonance value is made inconspicuous by obtaining the average value in each measurement area. And it becomes easier to identify the real cause area.

As a result, the spectrum of an electronic device having a plurality of or a single clock frequency source can be analyzed quickly and accurately as a whole for efficient electromagnetic wave (unwanted radiation spectrum) suppression measures and the like. There is an effect that a near-field data analysis method capable of performing the above can be obtained.

According to the twelfth aspect of the present invention,
12. The invention according to claim 11, wherein the reference data input step inputs reference data, and the reference data average value calculation step includes the measurement area of the reference data at each of the predetermined frequencies input in the reference data input step. Is calculated by the reference data average value calculating step corresponding to the near magnetic field data from the average value of the near magnetic field data calculated in the analyzed data average value calculating step. Since the difference data is calculated by subtracting the average value of the reference data, the comparison with the reference data makes it easy to grasp how much unnecessary radiation phenomenon has been improved by the improvement process. A plurality or a single clock frequency source for efficient electromagnetic wave (unwanted radiation spectrum) suppression measures, etc. The analysis of the whole spectrum of the child device, quickly and accurately near field data analysis method capable of performing is an effect that is obtained.

According to the thirteenth aspect of the present invention,
13. The invention according to claim 11, wherein the displaying step includes the step of calculating the average value calculated in the analyzed data average value calculating step and / or the average value calculated in the reference data average value calculating step and / or the difference. Since the difference data calculated in the data calculation step is displayed for each of the measurement areas, the analysis result can be easily grasped, and thereby, a plurality of measures can be taken for efficient electromagnetic wave (unwanted radiation spectrum) suppression measures and the like. Alternatively, it is possible to obtain a near-magnetic field data analysis method capable of quickly and accurately analyzing the entire spectrum of an electronic device having a single clock frequency source.

According to the fourteenth aspect of the present invention,
14. The invention according to claim 13, wherein the displaying step includes the step of calculating the average value calculated in the analyzed data average value calculating step and / or the average value calculated in the reference data average value calculating step and / or the difference data. Since the difference data calculated in the calculation step is displayed as a visual feature changed based on the data amount in association with the two-dimensional coordinate position of the measurement area, the analysis result can be intuitively grasped. This makes it possible to quickly and accurately analyze the entire spectrum of an electronic device having a plurality or a single clock frequency source for efficient electromagnetic wave (unwanted radiation spectrum) suppression measures and the like. There is an effect that a possible near-field data analysis method can be obtained.

According to the fifteenth aspect of the present invention,
In the invention according to claim 11 or 12, since the average value calculation step for all measurement areas calculates an average value of the entire measurement area at each of the predetermined frequencies, it is possible to ascertain wherever it appears in the electronic device. In addition, it is possible to grasp the entire frequency characteristics that also reflect the effect on the entire region, and thereby, it is possible to obtain an electronic device having a plurality or a single clock frequency source for efficient electromagnetic wave (unwanted radiation spectrum) suppression measures and the like. Analysis of the instrument spectrum as a whole,
There is an effect that a near-field data analysis method that can be performed quickly and accurately can be obtained.

According to the sixteenth aspect of the present invention,
In the invention according to claim 15, the display step displays the average value calculated in the entire measurement area average value calculation step, so that the analysis result reflecting the influence on the entire area can be easily grasped, This makes it possible to quickly and accurately analyze the entire spectrum of an electronic device having a plurality of or a single clock frequency source for efficient electromagnetic wave (unwanted radiation spectrum) suppression measures and the like. This provides an effect that a simple near-field data analysis method can be obtained.

According to the seventeenth aspect,
17. The data analysis method according to claim 11, wherein the frequency input step inputs a desired frequency, and the display step corresponds to a frequency corresponding to or approximate to the frequency input in the frequency input step. And / or display reference data and / or difference data, and furthermore, by inserting a special value in the frequency input step,
Since the average value calculated in the analyzed data average value calculation step and / or the average value calculated in the reference data average value calculation step and / or the difference data calculated in the minute data calculation step are displayed, An analysis result at a desired frequency can be searched, and the searched analysis result can be easily grasped. Thereby, a plurality of or a plurality of singularities for efficient electromagnetic wave (unwanted emission spectrum) suppression measures and the like can be obtained. This has the effect of providing a near-field data analysis method capable of quickly and accurately analyzing the spectrum of an electronic device having a clock frequency generation source as a whole.

According to the eighteenth aspect of the present invention,
18. The printed circuit board structure information input step according to claim 11, wherein the printed circuit board structure information of the electronic device is input, and the display step is performed by the predetermined data input in the analyzed data input step. Printed circuit board structure information input in the printed circuit board structure information input step corresponding to the measurement area corresponding to the highest value of the near magnetic field data at each frequency and / or the highest value of the average value for each measurement area at a frequency Is displayed, it is possible to visually and instantaneously grasp a cause at each predetermined frequency or a region considered to be a true cause common to all frequencies, thereby efficiently electromagnetic waves (unwanted radiation spectrum) Analyze the spectrum of an electronic device as a whole with multiple or single clock frequency sources for suppression measures, etc. Near field data analysis method capable of performing quickly and accurately an effect that can be obtained.

Further, according to the nineteenth aspect,
18. The printed circuit board structure information input step according to claim 11, wherein the printed circuit board structure information of the electronic device is input, the specifying step specifies the measurement area, and the displaying step includes the specifying step. Since the printed circuit board structure information input in the printed circuit board structure information input step corresponding to the measurement area specified by is displayed, it is possible to easily know the structure on the printed circuit board of the area considered to be the cause. In order to efficiently take measures against electromagnetic wave (unwanted radiation spectrum) suppression, etc., it is possible to quickly and accurately analyze the entire spectrum of an electronic device having a plurality or a single clock frequency source. There is an effect that a magnetic field data analysis method can be obtained.

According to the twentieth aspect of the present invention,
In the invention according to claims 1 to 17, since the predetermined frequency is a harmonic of a clock frequency of an electronic device,
The analysis can be performed based on the clock frequency of the generation source, whereby the spectrum of an electronic device having a generation source of a plurality or a single clock frequency can be measured for efficient electromagnetic wave (unwanted radiation spectrum) suppression measures and the like. This brings about an effect that a near magnetic field data analysis method capable of performing analysis as a whole quickly and accurately can be obtained.

According to the twenty-first aspect of the present invention, by recording a program for causing a computer to execute the method according to the eleventh to twentieth aspects, the program becomes machine-readable. ~ 20
There is an effect that a recording medium capable of realizing the above operation by a computer can be obtained.

[Brief description of the drawings]

FIG. 1 is a block diagram illustrating a hardware configuration of a near-field data analyzer according to an embodiment of the present invention.

FIG. 2 is a block diagram functionally showing a configuration of a near-field data analyzer according to the present embodiment.

FIG. 3 is a block diagram functionally showing another configuration of the near magnetic field data analyzer according to the present embodiment.

FIG. 4 is an explanatory diagram showing an example of an antenna arrangement of a near-field map measurement device connected to the near-field data analyzer according to the embodiment;

FIG. 5 is an explanatory diagram showing an example of an antenna array circuit of the near-field map measurement device connected to the near-field data analyzer according to the embodiment;

FIG. 6 is a flowchart showing the contents of a measurement data conversion process of the near magnetic field data analysis device according to the present embodiment.

FIG. 7 is a flowchart illustrating a procedure of a data reading process of the near-field data analyzer according to the embodiment;

FIG. 8 is a flowchart illustrating a procedure of an average value filtering process performed by the near-field data analyzer according to the embodiment;

FIG. 9 is a flowchart illustrating a procedure of an averaging process over all frequencies with respect to each region coordinate over the entire region of the near-field data analysis apparatus according to the present embodiment;

FIG. 10 is a flowchart illustrating a procedure of characteristic data extraction processing of the near-field data analysis device according to the present embodiment;

FIG. 11 is a flowchart illustrating a procedure of a report creation process of the near-field data analysis device according to the present embodiment;

FIG. 12 is an explanatory diagram showing a configuration of a report of the near magnetic field data analysis device according to the present embodiment.

FIG. 13 is an explanatory diagram illustrating a configuration of a viewer unit of the near-field data analysis device according to the present embodiment;

FIG. 14 is an explanatory diagram showing a dialog for activating a printed circuit board map data automatic storage function of the near magnetic field data analysis apparatus according to the embodiment;

FIG. 15 is an explanatory diagram showing a dialog for starting map data frequency search processing of the spectrum analyzer according to the present embodiment;

FIG. 16 is an explanatory diagram showing a dialog box for starting a printed circuit board position search process of the near magnetic field data analysis apparatus according to the embodiment;

[Explanation of symbols]

 101 CPU 102 ROM 103 RAM 104 HDD 105 HD 106 FDD 107 FD 108 Display 109 I / F 110 Communication line 111 Keyboard 112 Mouse 114 Printer 115 Bus 200 Display control unit 201 Analyzed data input unit 202 Analyzed data average calculation unit 203 Reference data input unit 204 Reference data average value calculation unit 205 Difference data calculation unit 206 Display unit 207 Frequency input unit 208 Printed circuit board structure information storage unit 209 Maximum value storage unit 210 Measurement region designation unit 301 All measurement region average value calculation unit 1201 Print Substrate information display area 1202 Spectrum display area 1203 Near magnetic field map display area 1204 Difference map display area 1205 Scan map display area 1206 Comment area A 1207 Rice Preparative region B 1301 spectral data display area 1302 near field map display area 1303 analyze numerical data display area 1304 board map display area 1305 the operation button region 1400 starting dialog 1500 frequency search processing starts dialog 1600 position search processing activation dialog

Claims (21)

[Claims] 1. A near-field data analyzer for analyzing near-field data of an electronic device measured by an electromagnetic scanner, wherein the near-field data of each predetermined frequency of the electronic device and the electronic device from which the near-field data is measured. Analyzed data input means for inputting position information on a measurement area in the device; and analyzed data for calculating an average value of near magnetic field data at each of the predetermined frequencies input by the analyzed data input means for each of the measurement areas. A near-field data analyzer, comprising: an average value calculating unit. 2. A reference data input unit for inputting reference data, and a reference data average value for calculating an average value of the reference data at each of the predetermined frequencies input by the reference data input unit for each of the measurement areas. Calculating means, and subtracting the average value of the reference data calculated by the reference data average value calculating means corresponding to the near magnetic field data from the average value of the near magnetic field data calculated by the analyzed data average value calculating means. The near-field data analyzing apparatus according to claim 1, further comprising: a difference data calculating unit configured to calculate the difference data by: A display unit having a display screen; and an average value calculated by the analyzed data average value calculation unit and / or the reference data average value calculated by the reference data average value calculation unit. 3. A near-field data analysis according to claim 1, further comprising: display control means for displaying the average value and / or the difference data calculated by the difference data calculation means for each of the measurement areas. apparatus. 4. The display control means according to claim 1, wherein said average value calculated by said analyzed data average value calculation means and / or said average value calculated by said reference data average value calculation means and / or said difference data calculation means. The near-field magnetic field data analyzer according to claim 3, wherein the calculated difference data is displayed as a visual feature changed based on the data amount in correspondence with the two-dimensional coordinate position of the measurement area. . 5. The near-magnetic field data analysis according to claim 1, further comprising an entire measurement area average value calculating means for calculating an average value of the entire measurement area at each of the predetermined frequencies. apparatus. 6. A display device comprising: a display unit having a display screen; and a display control unit that controls the display unit and displays an average value calculated by the total measurement region average value calculation unit. The near-magnetic-field data analyzer according to claim 5, wherein: 7. A display device comprising: frequency input means for inputting a desired frequency; wherein the display control means includes analyzed data and / or reference data corresponding to a frequency corresponding to or close to the frequency input by the frequency input means. And / or displaying the difference data, and further inserting a special value into the frequency input means, so that the average value calculated by the reference data calculation means and / or the average value calculated by the analyzed data calculation means is calculated. 7. The near-field data analyzer according to claim 1, wherein the average data calculated by the difference data calculator is displayed. 8. A printed circuit board structure information storing means for storing printed circuit board structure information of the electronic device, and for each measurement area of near magnetic field data at each of the predetermined frequencies inputted by the analyzed data input means. A maximum value storage means for storing a maximum value of the maximum value and / or a maximum value of the average value data for each of the measurement areas, wherein the display control means includes a maximum value of each predetermined frequency stored by the maximum value storage means and And / or displaying printed circuit board structure information stored by the printed circuit board structure information storage means corresponding to the measurement area corresponding to the highest value of the average value data for each of the measurement areas. 2. The near-field data analyzer according to item 1. 9. A printed circuit board structure information storage unit for storing printed circuit board structure information of the electronic device; and a designation unit for designating the measurement area, wherein the display control unit is designated by the designation unit. The near-field data analyzer according to any one of claims 1 to 7, wherein the printed circuit board structure information stored by the printed circuit board structure information storage means corresponding to the measurement area is displayed. 10. The apparatus according to claim 1, wherein the predetermined frequency is a harmonic of a clock frequency of an electronic device.
10. The near-field data analyzer according to 9. 11. A near-field data analysis method for analyzing near-field data of an electronic device measured by an electromagnetic scanner, wherein the near-field data of each predetermined frequency of the electronic device and the electronic device from which the near-field data is measured. An analyzed data input step of inputting position information about a measurement area in the device; and an analyzed data for calculating an average value of the near magnetic field data at each of the predetermined frequencies input in the analyzed data input step for each of the measurement areas. A method for analyzing near-magnetic field data, comprising: an average value calculating step; 12. A reference data input step of inputting reference data, and a reference data average value calculating step of calculating an average value of the reference data at each of the predetermined frequencies input in the reference data input step for each of the measurement areas. And subtracting the average value of the reference data calculated by the reference data average value calculation step corresponding to the near magnetic field data from the average value of the near magnetic field data calculated by the analyzed data average value calculation step. The near-field data analysis method according to claim 11, further comprising: a difference data calculation step of calculating data. 13. An average value calculated in the analyzed data average value calculating step and / or an average value calculated in the reference data average value calculating step and / or the difference data calculated in the difference data calculating step. 13. The near-field data analysis method according to claim 11, further comprising a display step of displaying each of the measurement areas. 14. The displaying step may include calculating the average value calculated in the analyzed data average value calculating step and / or the average value calculated in the reference data average value calculating step and / or calculating the average value calculated in the difference data calculating step. 14. The near-field data analysis method according to claim 13, wherein the obtained difference data is displayed as a visual feature changed based on a data amount in correspondence with a two-dimensional coordinate position of the measurement area. 15. The method according to claim 11, further comprising the step of calculating an average value of the entire measurement area for calculating an average value of the entire measurement area at each of the predetermined frequencies.
3. The near-magnetic field data analysis method according to 2. 16. The near-field data analysis method according to claim 15, further comprising a display step of displaying an average value calculated in the entire measurement area average value calculation step. 17. A frequency inputting step of inputting a desired frequency, wherein the displaying step includes analyzing data and / or reference data corresponding to a frequency corresponding to or approximate to the frequency input in the frequency inputting step. And / or displaying the difference data, and further inserting a special value in the frequency input step, so that the average value calculated in the reference data calculation step and / or the average value calculated in the analyzed data calculation step and 17. The near-field data analysis method according to claim 11, wherein the average value data calculated in the difference data calculation step is displayed. 18. A printed circuit board structure information input step of inputting printed circuit board structure information of the electronic device, wherein the displaying step includes a near magnetic field at each of the predetermined frequencies input in the analyzed data input step. Displaying printed circuit board structure information input in the printed circuit board structure information input step corresponding to the measurement area corresponding to the highest value of data for each measurement area and / or the highest value of the average value for each measurement area. Claim 1 characterized by the following:
18. The near-field data analysis method according to any one of 1 to 17. 19. A printed circuit board structure information input step of inputting printed circuit board structure information of the electronic device; and a designating step of designating the measurement area, wherein the display step is a measurement designated by the designating step. 18. The near-magnetic field data analysis method according to claim 11, wherein printed circuit board structure information input in the printed circuit board structure information input step corresponding to an area is displayed. 20. The apparatus according to claim 1, wherein the predetermined frequency is a harmonic of a clock frequency of an electronic device.
18. The near-magnetic field data analysis method according to 17. 21. A computer-readable recording medium on which a program for causing a computer to execute the method according to claim 11 is recorded.