JP2000356660A5 - - Google Patents
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- JP2000356660A5 JP2000356660A5 JP1999168648A JP16864899A JP2000356660A5 JP 2000356660 A5 JP2000356660 A5 JP 2000356660A5 JP 1999168648 A JP1999168648 A JP 1999168648A JP 16864899 A JP16864899 A JP 16864899A JP 2000356660 A5 JP2000356660 A5 JP 2000356660A5
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- JP
- Japan
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Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11168648A JP2000356660A (ja) | 1999-06-15 | 1999-06-15 | 絶縁物の劣化状態診断方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11168648A JP2000356660A (ja) | 1999-06-15 | 1999-06-15 | 絶縁物の劣化状態診断方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2000356660A JP2000356660A (ja) | 2000-12-26 |
| JP2000356660A5 true JP2000356660A5 (enrdf_load_stackoverflow) | 2005-05-26 |
Family
ID=15871935
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11168648A Pending JP2000356660A (ja) | 1999-06-15 | 1999-06-15 | 絶縁物の劣化状態診断方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2000356660A (enrdf_load_stackoverflow) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1725859A4 (en) * | 2004-02-24 | 2007-10-17 | Polymer Aging Concepts Inc | METHOD AND APPARATUS FOR CONTROLLING THE HEALTH OF COMPOSITE MATERIALS |
| US7659728B1 (en) | 2006-08-23 | 2010-02-09 | Watkins Jr Kenneth S | Method and apparatus for measuring degradation of insulation of electrical power system devices |
| US7612325B1 (en) | 2007-08-22 | 2009-11-03 | Watkins Jr Kenneth S | Electrical sensor for monitoring degradation of products from environmental stressors |
| JP5332037B2 (ja) * | 2009-04-01 | 2013-11-06 | 三菱電機株式会社 | 絶縁劣化モニタ装置、電気機器および絶縁劣化モニタ方法 |
| JP5562287B2 (ja) * | 2011-04-27 | 2014-07-30 | 三菱電機株式会社 | 受配電機器の余寿命診断方法および余寿命診断装置 |
| JP6495738B2 (ja) * | 2015-05-19 | 2019-04-03 | 日鉄住金防蝕株式会社 | 現場作業性が良好な実構造物用のイオン透過抵抗測定装置およびそれを用いたイオン透過抵抗測定方法 |
| JP6941994B2 (ja) * | 2017-07-18 | 2021-09-29 | 株式会社明電舎 | 絶縁物の絶縁抵抗値の低下または低下状態からの復帰を評価する方法及び装置 |
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1999
- 1999-06-15 JP JP11168648A patent/JP2000356660A/ja active Pending