JP2000292355A - Light emitting stand - Google Patents

Abstract

PROBLEM TO BE SOLVED: To closely fit a metal sample to a sample loading surface of a light emitting stand, even if polishing of the metal sample is executed roughly, and to prevent gastightness of a discharge chamber from being damaged. SOLUTION: This light emitting stand 1 is so composed that a metal sample 5 is loaded on a conductive sample loading part 6 formed on the periphery of an opening 4 on the upper part of a discharge chamber 3, and that a voltage is applied between the metal sample 5 and a counter electrode 10 formed on the lower part of the discharge chamber 3 to generate discharge between articles. In this case, an electrically-insulating elastic member 8 is installed on the sample loading part 6, and the lower surface 5a of the metal sample 5 is allowed to abut on the sample loading part 6 and to closely fit to the elastic member 8.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a light-emitting stand used in an emission spectrometer such as a solid-state emission analyzer utilizing spark discharge.

[0002]

2. Description of the Related Art The light-emitting stand is entirely formed of a conductive material, and a metal sample is placed on a sample-mounting portion above a discharge chamber formed in the light-emitting stand. And a spark discharge is generated between the counter electrode protruding into the discharge chamber from below the discharge chamber. In this case, the lower surface of the metal sample on the sample mounting portion side is sufficiently polished. If not smoothed, a gap is generated between the lower surface and the sample mounting part, the airtightness of the discharge chamber is not maintained, turbulence occurs during the measurement, and air outside the discharge chamber is entrained. In some cases, discharge became unstable. For this reason, conventionally, the lower surface of the metal sample used for analysis has been sufficiently polished.

[0003]

However, the polishing of the sample requires a considerable amount of time and effort, and if an unfamiliar person performs polishing, a predetermined polished surface cannot be obtained. was there.

The present invention has been made in consideration of the above-mentioned matters, and an object of the present invention is to allow a metal sample to be brought into close contact with a sample mounting surface of a light emitting stand even when a metal sample is roughly polished. Another object of the present invention is to provide a light emitting stand in which the airtightness of a discharge chamber is not impaired.

[0005]

According to the present invention, a metal sample is mounted on a conductive sample mounting portion formed around an upper opening of a discharge chamber. In a light emitting stand configured to apply a voltage between a counter electrode formed below a discharge chamber and generate a discharge between the two, an electrically insulating elastic member is provided on the sample mounting portion. The lower surface of the metal sample is brought into contact with the sample mounting portion and is brought into close contact with the elastic member (claim 1).

In the light emitting stand of the present invention, a conductive elastic member may be provided on the sample mounting portion, and the lower surface of the metal sample may be brought into close contact with the elastic member. .

In the light emitting stand according to the present invention, a conductive elastic member and an electrically insulating elastic member are provided on the sample mounting portion, and a lower surface of the metal sample is brought into contact with the conductive elastic member. At the same time, it may be made to adhere to an electrically insulating elastic member (claim 3).

In any of the above inventions, even if the metal sample is roughly polished, the metal sample can be brought into close contact with the sample mounting surface of the light emitting stand, and the airtightness of the discharge chamber is not impaired. In addition, the metal sample can be set to the same potential as the light emitting stand. Therefore, a desired measurement can be reliably performed.

[0009]

Embodiments of the present invention will be described with reference to the drawings. 1 and 2 show a first embodiment of the present invention. First, FIG. 1 shows an example of a light emitting stand. In this figure, reference numeral 1 denotes a light emitting stand, for example, a rectangular parallelepiped shape made of metal such as stainless steel.
Reference numeral 2 denotes a spectroscope continuously provided on one end side of the light emitting stand 1 in the longitudinal direction (left side in the figure, hereinafter referred to as front side).
Since the spectroscope 2 has nothing to do with the main subject of the present invention, its detailed illustration is omitted, but there is no difference from the configuration of the conventional emission spectrometer, and the inside thereof is in a vacuum state or It is kept in a state of being purged with nitrogen gas, and an entrance slit, a mirror, a diffraction grating, an exit slit and the like are provided as appropriate. A detector such as a photomultiplier tube is provided at a stage subsequent to the exit slit.

Reference numeral 3 denotes a discharge chamber formed inside the luminous stand 1, and an opening 4 having an appropriate size is formed at an appropriate position on the upper part thereof, and is used for mounting a metal sample 5 to be analyzed. A sample mounting part 6 is formed. The sample mounting part 6 is a part of the light emitting stand 1 and has the same potential as the light emitting stand 1, and is connected to the anode side of the DC power supply 7 as shown in FIG. An electrically insulating elastic member 8 such as neoprene (registered trademark) rubber or silicon rubber is provided around the opening 4 of the sample mounting portion 6.
However, as shown in FIG. 2 (A), when the metal sample 5 is not mounted, it is provided so as to be slightly protruded from the upper surface of the conductive sample mounting portion 6.

A counter electrode 10 is provided below the discharge chamber 3 with an electric insulator 9 interposed therebetween. This counter electrode 10 is connected to the anode side of the DC power supply 7 as shown in FIG.

Reference numeral 11 denotes a horizontal through hole provided so as to communicate the discharge chamber 3 and the spectroscope 2, one end of which is open above the front side of the discharge chamber 3, and the other end of which is open to the spectroscope 2. are doing. The through-hole 11 has a function of guiding the light 12 generated in the discharge chamber 3 toward the spectroscope 2 and a function of guiding the light 12 to the discharge chamber 3.
And a function of introducing an inert gas (eg, argon gas) IG in the direction. And this through hole 11
A condensing lens 13 for converging light 12 generated in the discharge chamber 3 and a window 15 made of magnesium fluoride for preventing dust 14 generated in the discharge chamber 3 from flying toward the condensing lens 13 and adhering thereto. It is provided airtight.

Reference numeral 16 denotes an inert gas IG for the through hole 11.
One end communicates with the through hole 11 and an inert gas supply path (not shown) is connected to the connection part 17 at the other end.

Numeral 18 denotes dust 1 generated in the discharge chamber 3.
A gas discharge port for discharging the gas 4 together with the inert gas IG. The gas discharge port is formed at the other end of the discharge chamber 3 (at a position substantially opposed to the through hole 11), and is connected to a dust collection device (not shown).

The operation of the light emitting stand 1 having the above configuration will be described. When the metal sample 5 is not set on the sample mounting portion 6, the electrically insulating elastic member 8 slightly protrudes from the upper surface of the sample mounting portion 6 as shown in FIG.

At the time of analysis, as shown in FIG. 2 (B), the metal sample 5 is set on the sample mounting portion 6, and the metal sample 5 is pressed by a pressing member 19 driven by a cylinder (not shown). When the elastic member 8 is pressed downward, the lower surface 5a of the metal sample 5 comes into contact with the surface of the sample mounting portion 6 to have the same potential as the lower surface 5a of the metal sample 5, and the elastic member 8 is brought into contact with the lower surface 5a of the metal sample 5. The discharge chamber 3 is brought into close contact with the outside and hermetically shut off.

In the above state, the DC power supply 7 is turned on in a state where the inert gas IG is introduced into the through hole 11 through the gas supply path 16, so that a negative voltage is applied to the metal sample 5 and the counter electrode 6. Is applied between the metal sample 5 and the counter electrode 10, and a light 12 is generated by the discharge. The light 12 is guided to the spectroscope 2 through the through hole 11. The light is received by a detector provided at the subsequent stage of the spectroscope 2, and its spectral intensity is measured.

As described above, in the light emitting stand 1 having the above-described structure, the electrically conductive elastic member 8 is provided on the conductive sample mounting portion 6, and the lower surface 5 a of the metal sample 5 is attached to the sample mounting portion 6. The electrical contact and the sealing are performed simultaneously by bringing the metal sample 5 into close contact with the elastic member 8, so that the lower surface 5a of the metal sample 5 is not finished to a sufficiently smooth surface. In addition, the metal sample 5 can be set to a desired potential, the airtightness in the discharge chamber 3 is maintained, and turbulence does not occur during discharge.
Therefore, a desired measurement can be reliably performed.

FIG. 3 shows a second embodiment of the present invention. In this embodiment, a conductive elastic member 20 is provided around an opening 4 of a sample mounting portion 6. I have.
More specifically, an O-ring 20 made of conductive rubber is provided in the groove 21. In this case, when the metal sample 5 is not set on the sample mounting portion 6, the electrically insulating elastic member 20 slightly protrudes from the upper surface of the sample mounting portion 6, as in the first embodiment. So that And
When the metal sample 5 is set on the sample mounting portion 6 and the metal sample 5 is pressed by the pressing member 19, the elastic member 20 is pressed, and the lower surface 5a of the metal sample 5 is brought into close contact with the elastic member 20. Thereby, electrical conduction and sealing are performed simultaneously, and the same operation and effect as in the first embodiment can be obtained.

FIG. 4 shows a third embodiment of the present invention. In this embodiment, the sample mounting portion 6 is provided.
A conductive elastic member 22 and an electrically insulating elastic member 23
Are provided. More specifically, the conductive elastic member 22
As the elastic member 23, an O-ring made of silicon rubber or the like is used. With this configuration, when the metal sample 5 is set on the sample mounting portion 6 in a predetermined pressing state, the lower surface 5a of the metal sample 5 contacts the conductive elastic member 22 and the electrically insulating elastic member. 2
3, electrical conduction and sealing are performed simultaneously, and the same operation and effect as those of the first embodiment can be obtained. In this embodiment, the lower surface 5a of the metal sample 5 is used.
This is particularly effective when the surface has irregularities. Reference numerals 24 and 25 denote recesses (grooves) for providing the elastic members 22 and 23, respectively.

FIG. 5 shows a fourth embodiment of the present invention. In this embodiment, the sample mounting portion 6 is provided.
Then, an O-ring 26 made of an electrically insulating elastic member, for example, silicon rubber is provided, and a needle electrode 27 connected to the anode of the DC power supply 7 is brought into contact with the upper surface of the metal sample 5. 28 is an O-ring groove. In this embodiment, although it is necessary to apply the potential of the DC power supply 7 to the metal sample 5 via the needle electrode 27,
The metal sample 5 can be brought into close contact with the sample mounting portion 6, and the discharge chamber 3 can be hermetically sealed.

[0022]

As described in detail above, according to the light emitting stand of the present invention, even if the metal sample is roughly polished, the metal sample can be brought into close contact with the sample mounting surface of the light emitting stand. The airtightness of the discharge chamber is not impaired, and the metal sample can be set to the same potential as the light emitting stand. Therefore, a desired measurement can be reliably performed.

[Brief description of the drawings]

FIG. 1 is a longitudinal sectional view showing an example of a light emitting stand of the present invention.

FIGS. 2A and 2B are enlarged longitudinal sectional views showing a main part of the light emitting stand, wherein FIG. 2A shows a state where a metal sample is not mounted, and FIG. 2B shows a state where a metal sample is mounted.

FIG. 3 is a longitudinal sectional view showing another example of the main part of the light emitting stand of the present invention.

FIG. 4 is a longitudinal sectional view showing still another example of the main part of the light emitting stand of the present invention.

FIG. 5 is a longitudinal sectional view showing still another example of the main part of the light emitting stand of the present invention.

[Explanation of symbols]

DESCRIPTION OF SYMBOLS 1 ... Light-emitting stand, 3 ... Discharge chamber, 4 ... Upper opening, 5 ... Metal sample, 5a ... Lower surface of metal sample, 6 ... Sample mounting part, 8 ...
Electrically insulating elastic member, 10 ... counter electrode, 20 ... conductive elastic member, 22 ... conductive elastic member, 23 ... electric insulating elastic member.

Claims (3)

[Claims] A metal sample is mounted on a conductive sample mounting portion formed around an upper opening of a discharge chamber, and a metal sample is placed between the metal sample and a counter electrode formed below the discharge chamber. In a light emitting stand in which a voltage is applied to generate a discharge between the two, an electrically insulating elastic member is provided on the sample mounting portion, and a lower surface of the metal sample is brought into contact with the sample mounting portion. And a light-emitting stand that is brought into close contact with the elastic member. 2. A metal sample is mounted on a conductive sample mounting portion formed around an upper opening of a discharge chamber, and a metal sample is placed between the metal sample and a counter electrode formed below the discharge chamber. In a light emitting stand in which a voltage is applied to cause a discharge between the two, a conductive elastic member is provided on the sample mounting portion, and the lower surface of the metal sample is brought into close contact with the elastic member. A light emitting stand characterized by the above. 3. A metal sample is mounted on a conductive sample mounting portion formed around an upper opening of a discharge chamber, and a metal sample is placed between the metal sample and a counter electrode formed below the discharge chamber. In a light-emitting stand in which a voltage is applied to cause a discharge between the two, a conductive elastic member and an electrically insulating elastic member are provided on the sample mounting portion, and the lower surface of the metal sample is electrically conductive. A light-emitting stand, wherein the light-emitting stand is brought into contact with a conductive elastic member and is brought into close contact with an electrically insulating elastic member.