JP2000275285A - Coaxial connector for high-frequency measurement - Google Patents
Coaxial connector for high-frequency measurementInfo
- Publication number
- JP2000275285A JP2000275285A JP11084413A JP8441399A JP2000275285A JP 2000275285 A JP2000275285 A JP 2000275285A JP 11084413 A JP11084413 A JP 11084413A JP 8441399 A JP8441399 A JP 8441399A JP 2000275285 A JP2000275285 A JP 2000275285A
- Authority
- JP
- Japan
- Prior art keywords
- coaxial connector
- contact conductor
- measurement
- measuring
- calibration
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Measurement Of Resistance Or Impedance (AREA)
- Coupling Device And Connection With Printed Circuit (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は、高周波測定におい
てネットワークアナライザ等の測定器と校正用標準器又
は被測定物とを接続する同軸接続器に関するものであ
る。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a coaxial connector for connecting a measuring instrument such as a network analyzer and a calibration standard or a device under test in high frequency measurement.
【0002】[0002]
【従来の技術】従来、ネットワーク・アナライザ等の測
定器を用いて被測定物の各種特性を測定する際には、測
定装置メーカー等から供給される校正用標準器(Calibr
ationStandard)を用いた測定装置の校正が行われてい
る。この校正作業は、測定時に被測定物と測定器を接続
する測定ケーブルによって生じる測定誤差を求め、これ
により測定器の補正を行うものであり、被測定物の測定
に先立ち行われる。一般的に、この測定誤差は特に高周
波領域における測定値に大きな影響を与えるため、この
誤差を補正する校正作業は重要な作業である。2. Description of the Related Art Conventionally, when measuring various characteristics of a device under test using a measuring instrument such as a network analyzer, a calibration standard (Calibr
Calibration of the measurement device using ation Standard) has been performed. This calibration operation is to obtain a measurement error caused by a measurement cable connecting the device under test and the measuring device at the time of measurement, thereby correcting the measuring device, and is performed prior to the measurement of the device under test. Generally, this measurement error has a great effect on the measurement value especially in a high frequency region, and therefore, a calibration operation for correcting this error is an important operation.
【0003】この校正用標準器は、所定の特性を有して
いる。この特性を表すものが校正用標準器の定義値と呼
ばれるものである。前記校正では、測定ケーブルを用い
て校正用標準器の特性を測定し、この測定値と前記定義
値とを比較する。そして、この測定値と定義値との差か
ら校正用補正値を算出し、この校正用補正値を用いて測
定器の校正を行う。被測定物の測定は、校正時の測定ケ
ーブル及び校正を行った測定器を用いて行われる。これ
により、被測定物の各種特性を高精度に測定することが
できる。なお、ここで測定としては、例えば高周波部品
や高周波回路の伝送・反射特性等の測定である。[0003] This calibration standard has predetermined characteristics. What represents this characteristic is called a defined value of the calibration standard. In the calibration, the characteristics of the calibration standard are measured using a measurement cable, and the measured value is compared with the defined value. Then, a correction value for calibration is calculated from the difference between the measured value and the defined value, and the measuring device is calibrated using the correction value for calibration. The measurement of the device under test is performed using a measuring cable at the time of calibration and a measuring instrument that has been calibrated. Thereby, various characteristics of the device under test can be measured with high accuracy. Here, the measurement is, for example, measurement of transmission / reflection characteristics of a high-frequency component or a high-frequency circuit.
【0004】[0004]
【発明が解決しようとする課題】ところで、前記測定
器、校正用標準器及び測定ケーブルの接続用端子は通常
同軸形状となっている。例えばSMA型の同軸コネクタ
である。したがって、被測定物が表面実装部品(Surfac
e Mount Device:以下「SMD」という)等の部品であ
る場合には、測定器を直接接続することができない。こ
のため、SMDを測定装置に接続するために伝送線路変
換具を用いる。この変換具は、同軸伝送線路をマイクロ
ストリップラインやコプレーナーラインに変換するもの
である。前記SMDは、この変換具のマイクロストリッ
プライン又はコプレーナーラインに接続可能となってい
る。通常は、SMDをマイクロストリップライン又はコ
プレーナーラインに圧着させることにより接続する。The connection terminals of the measuring instrument, the calibration standard and the measuring cable are usually coaxial. For example, it is an SMA type coaxial connector. Therefore, if the device under test is a surface mount component (Surfac
e Mount Device (hereinafter referred to as “SMD”) cannot be directly connected to a measuring instrument. For this reason, a transmission line converter is used to connect the SMD to the measuring device. This converter converts a coaxial transmission line into a microstrip line or a coplanar line. The SMD can be connected to a microstrip line or a coplanar line of the converter. Usually, the connection is made by crimping the SMD to a microstrip line or a coplanar line.
【0005】このような変換具を用いた測定では、測定
結果に測定ケーブルと変換具の有する特性が誤差として
含まれる。例えば、反射特性を測定することを考える。
ここで、測定に先立ち測定ケーブル及び校正用標準器を
用いて校正作業を行えば、校正が完了した接続面(これ
を校正面という)は測定ケーブルと変換具の接続面とな
る。この場合、校正面から供給された信号は変換具を経
由してSMDに達し、SMDから反射された反射波は再
び変換具を経由して校正面に到達する。これにより、信
号が変換具を伝搬する間にその位相がずれて、本来測定
しようとしている反射特性とは異なる特性が観測される
ことになる。したがって、伝送線路である変換具及び測
定ケーブルによる測定誤差を排除するように測定器を校
正する必要がある。[0005] In the measurement using such a conversion tool, the measurement results include characteristics of the measurement cable and the conversion tool as errors. For example, consider measuring reflection characteristics.
Here, if the calibration operation is performed using the measurement cable and the calibration standard before the measurement, the connection surface on which the calibration is completed (this is referred to as a calibration surface) becomes the connection surface between the measurement cable and the converter. In this case, the signal supplied from the calibration surface reaches the SMD via the converter, and the reflected wave reflected from the SMD again reaches the calibration surface via the converter. As a result, the phase of the signal is shifted while the signal propagates through the converter, and a characteristic different from the reflection characteristic originally intended to be measured is observed. Therefore, it is necessary to calibrate the measuring instrument so as to eliminate a measurement error caused by the converter and the measuring cable, which are transmission lines.
【0006】しかしながら、前記校正用標準器も接続用
端子が同軸形状となっているため、変換具についての測
定誤差を排除することができない。すなわち、測定ケー
ブルと校正用標準器を用いれば校正面を測定ケーブルと
変換具の接続面にすることは可能であるが、校正面を変
換具とSMDとの接続面にすることができなかった。However, the calibration standard also has a coaxial connection terminal, so that a measurement error of the converter cannot be excluded. That is, if the measurement cable and the calibration standard are used, the calibration surface can be used as the connection surface between the measurement cable and the converter, but the calibration surface cannot be used as the connection surface between the converter and the SMD. .
【0007】本発明は、上記事情に鑑みてなされたもの
であり、その目的とするところは、被測定物の形状等に
関わらず測定器具による測定誤差を軽減し高精度の測定
を行うことができる高周波測定用同軸接続器を提供する
ことにある。The present invention has been made in view of the above circumstances, and an object of the present invention is to perform measurement with high accuracy by reducing a measurement error caused by a measuring instrument regardless of the shape of an object to be measured. It is an object of the present invention to provide a coaxial connector for high frequency measurement that can be performed.
【0008】[0008]
【課題を解決するための手段】上記目的を達成するため
に、請求項1の発明では、高周波測定器と校正用標準器
又は被測定物とを接続する高周波測定用同軸接続器にお
いて、標準器に設けられたオス型の同軸接続器に対して
電気的に接続可能なメス型構造を有するとともに、標準
器と対向する側の端面に被測定物を当接させた際に被測
定物に形成された複数の端子電極がそれぞれ中心接触導
体又は外部接触導体に電気的に接続するように中心接触
導体及び外部接触導体を前記端面上に露出させたことを
特徴とするものを提案する。In order to achieve the above object, according to the first aspect of the present invention, there is provided a high-frequency measurement coaxial connector for connecting a high-frequency measurement device to a calibration standard device or a device under test. Has a female structure that can be electrically connected to the male coaxial connector provided in the device, and is formed on the device when the device is brought into contact with the end face on the side facing the standard device. A center contact conductor and an external contact conductor are exposed on the end face such that the plurality of terminal electrodes are electrically connected to the center contact conductor or the external contact conductor, respectively.
【0009】本発明によれば、同軸接続器に校正用標準
器を接続するとともに、被測定物の端子電極を中心接触
導体又は外部接触導体に直接接続することができる。し
たがって、校正用標準器を接続して測定器の校正を行っ
た後に、被測定物を接続すれば、当該被測定物の測定を
高精度で行うことができる。すなわち、校正面を被測定
物の接続面にすることができるので、他の接続用具を媒
介させることによる測定誤差の発生をなくすことができ
る。According to the present invention, the calibration standard can be connected to the coaxial connector, and the terminal electrode of the device under test can be directly connected to the center contact conductor or the external contact conductor. Therefore, if the device under test is connected after the calibration standard is connected and the measuring device is calibrated, the device under test can be measured with high accuracy. That is, since the calibration surface can be used as the connection surface of the device under test, it is possible to eliminate the occurrence of measurement errors due to the intermediary of other connection tools.
【0010】また、請求項2の発明では、請求項1記載
の高周波測定用同軸接続器において、標準器と対向する
側の端面には被測定物を係止する係止部が形成されてい
ることを特徴とするものを提案する。According to a second aspect of the present invention, in the high frequency measuring coaxial connector according to the first aspect, a locking portion for locking an object to be measured is formed on an end face on a side facing the standard device. We propose one that is characterized.
【0011】本発明によれば、当該係止部により被測定
物と接続器との接続を容易且つ確実に行うことができ
る。According to the present invention, the connection between the device under test and the connector can be easily and reliably performed by the locking portion.
【0012】本発明の好適な態様の一例として、請求項
3の発明では、請求項2記載の高周波測定用同軸接続器
において、前記係止部は外部接触導体の端縁部を軸方向
に張り出してなり、この張出部の縁部に被測定物を係止
することを特徴とするものを提案する。As a preferred embodiment of the present invention, according to the third aspect of the present invention, in the high-frequency measuring coaxial connector according to the second aspect, the locking portion projects in the axial direction from the edge of the external contact conductor. The present invention proposes a feature in which an object to be measured is locked to an edge of the overhang.
【0013】さらに、請求項4の発明では、請求項2記
載の高周波測定用接続器において、前記係止部は前記端
面に段差を形成してなり、この段差面に被測定物を係止
することを特徴とするものを提案する。According to a fourth aspect of the present invention, in the high frequency measurement connector according to the second aspect, the locking portion has a step formed on the end surface, and the object to be measured is locked on the stepped surface. We propose one that is characterized.
【0014】さらに、請求項5の発明では、請求項4記
載の高周波測定用同軸接続器において、前記端面は半円
形状の2つの面が所定の段差をもって形成されてなり、
その段差面に中心接触導体が形成されていることを特徴
とするものを提案する。According to a fifth aspect of the present invention, in the high-frequency measuring coaxial connector according to the fourth aspect, the end face is formed by two semicircular surfaces having a predetermined step.
The present invention proposes a feature in which a center contact conductor is formed on the step surface.
【0015】さらに、請求項6発明では、請求項1〜5
記載の高周波測定用同軸接続器において、前記中心接触
導体に対して相互に電気的に接続するとともに着脱自在
に係合する導体片を設けたことを特徴とするものを提案
する。Further, in the sixth aspect of the present invention, the first to fifth aspects are provided.
In the above-mentioned coaxial connector for high-frequency measurement, there is proposed a coaxial connector characterized in that a conductor piece electrically connected to the center contact conductor and removably engaged with the center contact conductor is provided.
【0016】[0016]
【発明の実施の形態】本発明の一実施の形態にかかる高
周波測定用同軸接続器について図1〜図9を参照して説
明する。図1は高周波測定用同軸接続器の外観斜視図、
図2は被測定物の外観斜視図、図3は被測定物の測定方
法を説明する斜視図、図4は被測定物の測定方法を説明
する断面図、図5は他の被測定物の測定方法を説明する
斜視図、図6は被測定物の他の測定方法を説明する断面
図、図7及び図8は測定器の校正方法を説明する断面
図、図9は高周波測定用同軸接続器を用いた測定及び校
正方法を説明する図である。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS A high-frequency measuring coaxial connector according to an embodiment of the present invention will be described with reference to FIGS. FIG. 1 is an external perspective view of a coaxial connector for high frequency measurement,
2 is a perspective view illustrating an external appearance of the object to be measured, FIG. 3 is a perspective view illustrating a method of measuring the object to be measured, FIG. 4 is a cross-sectional view illustrating a method of measuring the object to be measured, and FIG. FIG. 6 is a perspective view illustrating a measuring method, FIG. 6 is a cross-sectional view illustrating another measuring method of an object to be measured, FIGS. 7 and 8 are cross-sectional views illustrating a calibrating method of a measuring instrument, and FIG. It is a figure explaining a measurement and calibration method using a device.
【0017】図1に示すように、この高周波測定用同軸
接続器(以下、同軸接続器という)10は、同軸ケーブ
ルの中心導体と導通接続する中心接触導体11と、同軸
ケーブルの外部導体と接続する外部接触導体12と、中
心接触導体11と外部接触導体12との間に介在する絶
縁体13と、中心接触導体11に導通接続するとともに
挿脱自在な導体片である測定ピン14を備えている。こ
の同軸接続器10は、所定の特性インピーダンス値を有
している。この特性インピーダンス値は、不要な反射を
抑えるべく、同軸ケーブルや他の機器類と同一のものが
好ましい。一般的には、特性インピーダンス値が50Ω
や75Ωである。As shown in FIG. 1, a coaxial connector for high frequency measurement (hereinafter referred to as a coaxial connector) 10 is connected to a center contact conductor 11 which is conductively connected to a center conductor of a coaxial cable, and is connected to an outer conductor of the coaxial cable. An external contact conductor 12, an insulator 13 interposed between the center contact conductor 11 and the external contact conductor 12, and a measuring pin 14, which is a conductive piece that is conductively connected to and removable from the center contact conductor 11. I have. The coaxial connector 10 has a predetermined characteristic impedance value. This characteristic impedance value is preferably the same as that of a coaxial cable or other equipment in order to suppress unnecessary reflection. Generally, the characteristic impedance value is 50Ω
And 75Ω.
【0018】中心接触導体11は、端部が略円筒状に形
成されバネ性を有する金属部材からなり、その内面を接
触面としている。中心接触導体11の材質としては、例
えば黄銅やベリリウム銅などに、必要に応じて銀等でメ
ッキを施した導通性の良好なものが好ましい。The center contact conductor 11 is formed of a metal member having a substantially cylindrical end and having a spring property, and has an inner surface serving as a contact surface. As a material of the center contact conductor 11, for example, brass, beryllium copper, or the like, which is plated with silver or the like as necessary, and has good conductivity is preferable.
【0019】外部導体12は、中心接触導体11と中心
軸を共通にした略円筒状に形成された金属部材からな
り、外周面にはネジ山が形成されている。また、外部導
体12には、その端縁部が軸方向に張り出した張出部1
2aが形成されている。この張出部12aの端縁は半円
弧となっている。すなわち、張出部12aの両側縁12
bを結ぶ線が同軸接続器10の中心軸を通過するように
形成されている。換言すれば、同軸接続器10の端面
は、半円状の2つ面が段差をもって形成されているもの
である。外部接触導体12の材質としては、例えば黄銅
やベリリウム銅などに、必要に応じて銀等でメッキを施
した導通性の良好なものが好ましい。The outer conductor 12 is made of a substantially cylindrical metal member having a common central axis with the center contact conductor 11, and has a thread formed on the outer peripheral surface. Further, the outer conductor 12 has an extended portion 1 whose end edge is extended in the axial direction.
2a is formed. The edge of the overhang 12a is a semicircular arc. That is, both side edges 12 of the overhang portion 12a
The line connecting b is formed so as to pass through the central axis of the coaxial connector 10. In other words, the end surface of the coaxial connector 10 has two semicircular surfaces formed with a step. As a material of the external contact conductor 12, for example, brass, beryllium copper, or the like, which is plated with silver or the like as necessary, and has good conductivity is preferable.
【0020】絶縁体13は、中心接触導体11の位置を
定めるとともに、中心接触導体11と外部接触導体12
とを電気的に絶縁するものである。絶縁体13の材質と
しては、例えばフッ素樹脂などが用いられる。なお、中
心接触導体11の位置を定められ、また同軸接合器10
が前記所定の特性インピーダンス値を有することができ
るならば、この絶縁体13を不要にできる場合もある。
この場合には、中心接触導体11と外部接触導体12と
は空気によって電気的に絶縁される。The insulator 13 determines the position of the center contact conductor 11, and the center contact conductor 11 and the external contact conductor 12
Are electrically insulated from each other. As a material of the insulator 13, for example, a fluororesin is used. The position of the center contact conductor 11 is determined, and the coaxial
Can have the above-mentioned predetermined characteristic impedance value, the insulator 13 can be unnecessary in some cases.
In this case, the center contact conductor 11 and the outer contact conductor 12 are electrically insulated by air.
【0021】測定ピン14は、中心接触導体11と電気
的に接続可能な導電性部材からなり、中心接触導体11
の内面と接触するよう略円柱形状に形成されている。こ
の測定ピン14の一端は、半円柱形状に切り欠かれてい
る。これにより、測定ピン14を中心接触導体11の内
側に挿入すると、外部接触導体12の張出部12aの両
側縁部12bを結ぶ線上に測定ピン14の切欠断面部1
4aが配置される。The measuring pin 14 is made of a conductive member which can be electrically connected to the center contact conductor 11.
It is formed in a substantially cylindrical shape so as to be in contact with the inner surface. One end of the measuring pin 14 is cut out in a semi-cylindrical shape. Thus, when the measurement pin 14 is inserted inside the center contact conductor 11, the cutout section 1 of the measurement pin 14 is placed on a line connecting the both side edges 12b of the overhang portion 12a of the external contact conductor 12.
4a is arranged.
【0022】このように本実施の形態にかかる同軸接続
器10はメス型同軸接続器の構造を有している。したが
って、中心接触導体11及び外部接触導体12の寸法等
を、校正用標準器等が有するオス型構造の接続器と係合
するように設定すれば、測定ピン14を取り外した後に
当該オス型接続器と接続することができる。As described above, the coaxial connector 10 according to the present embodiment has the structure of a female coaxial connector. Therefore, if the dimensions and the like of the center contact conductor 11 and the external contact conductor 12 are set so as to engage with the male-type connector of the calibration standard device or the like, the male-type connection after the measurement pin 14 is removed. Can be connected to the container.
【0023】また、この同軸接続器10は、例えば積層
フィルタ等の被測定物を直接接続することができる。図
2では、被測定物20の一例として積層フィルタを示
す。この被測定物20は、側面から上面及び下面に亘っ
て形成された複数の端子電極21を備えている。端子電
極21は両側面にそれぞれ所定の間隔をおいて3つずつ
形成されており、中央の端子電極21aがそれぞれ信号
用の端子であり、他の端子電極21bがそれぞれ接地用
である。The coaxial connector 10 can directly connect a device under test such as a multilayer filter. FIG. 2 shows a multilayer filter as an example of the device under test 20. The device under test 20 includes a plurality of terminal electrodes 21 formed from the side surface to the upper surface and the lower surface. Three terminal electrodes 21 are formed on both side surfaces at predetermined intervals, and the terminal electrode 21a at the center is a signal terminal, and the other terminal electrodes 21b are each for grounding.
【0024】この積層フィルタ等の被測定物20を同軸
接続器10に接続するには、図3及び図4に示すよう
に、被測定物20の側部を同軸接続器10の端面に圧着
させればよい。具体的には、測定ピン14の切欠断面部
14aが被測定物20の信号用端子電極21aに接触す
るとともに、外部接触導体12が接地用端子電極21b
に接触するように配置する。ここで、被測定物20の縁
部が外部接触導体12の張出部12aにより係止される
ので、被測定物20と同軸接続器10の接続が確実且つ
容易なものとなる。また、図5に示すように、両端に外
部電極31が形成されたチップ状電子部品等の被測定物
30も同様に接続可能である。さらに、図6に示すよう
に、積層フィルタ等の前記被測定物20の両側に一対の
同軸接続器10及び10’を互いに上下逆にして圧着し
て接続することもできる。To connect the device under test 20 such as a laminated filter to the coaxial connector 10, as shown in FIGS. 3 and 4, the side of the device under test 20 is pressed against the end face of the coaxial connector 10. Just do it. Specifically, the notch section 14a of the measuring pin 14 contacts the signal terminal electrode 21a of the device under test 20, and the external contact conductor 12 is connected to the ground terminal electrode 21b.
Arrange so that it contacts. Here, since the edge of the device under test 20 is locked by the protruding portion 12a of the external contact conductor 12, the connection between the device under test 20 and the coaxial connector 10 is reliable and easy. In addition, as shown in FIG. 5, a device under test 30 such as a chip-shaped electronic component having external electrodes 31 formed at both ends can be similarly connected. Further, as shown in FIG. 6, a pair of coaxial connectors 10 and 10 'may be connected to both sides of the device under test 20 such as a laminated filter by inverting and pressing upside down.
【0025】さらに、この同軸接続器10では、図7及
び図8に示すように、一対の同軸接続器10及び10’
を互いに接続することができる。この場合には、中心接
触導体11の内側に嵌合する導電性部材からなる接続ピ
ン15を用い、この接続ピン15を同軸接続器10及び
10’の中心接触導体11及び11’の双方に挿入す
る。これにより中心接触導体11及び11’が相互に導
通接続される。また、同軸接続器10及び10’の端面
を互いに重ね合わせることにより外部接触導体12及び
12’同士が相互に接続される。ここで、同軸接続器1
0及び10’は、互いに外部接触導体12及び12’の
張出部12a及び12a’が対向する外部接触導体1
2’及び12の張出部が形成されていない部位に接触す
るように対向させる。すなわち、中心軸に対して相対的
に180°回転して対向させる。これにより外部接触導
体12及び12’相互の接続が確実なものになる。この
ような接続は、同軸接続器10及び同軸接続器10と測
定器を接続する同軸ケーブル等からなる測定系について
被測定物の測定に先立ち行う校正作業時に有効である。
すなわち、このような接続により、当該測定系のTHR
OUGH特性を取得することができる。Further, in this coaxial connector 10, as shown in FIGS. 7 and 8, a pair of coaxial connectors 10 and 10 'are provided.
Can be connected to each other. In this case, a connection pin 15 made of a conductive member that fits inside the center contact conductor 11 is used, and this connection pin 15 is inserted into both the center contact conductors 11 and 11 ′ of the coaxial connectors 10 and 10 ′. I do. As a result, the center contact conductors 11 and 11 'are electrically connected to each other. The external contact conductors 12 and 12 'are connected to each other by overlapping the end faces of the coaxial connectors 10 and 10'. Here, the coaxial connector 1
0 and 10 'are the external contact conductors 1 with the overhangs 12a and 12a' of the external contact conductors 12 and 12 'facing each other.
The portions 2 'and 12 are opposed to each other so as to come into contact with portions where the overhang portions are not formed. That is, they are rotated by 180 ° relative to the central axis to face each other. This ensures that the external contact conductors 12 and 12 'are connected to each other. Such a connection is effective at the time of a calibration operation performed prior to the measurement of an object to be measured in a measurement system including the coaxial connector 10 and a coaxial cable connecting the coaxial connector 10 and the measuring device.
That is, by such a connection, the THR of the measurement system is changed.
OUGH characteristics can be obtained.
【0026】このような同軸接続器10を用いた高周波
測定について図9を参照して説明する。この測定は、図
9に示すように、一端に同軸接続器10を有するととも
に他端に測定器60と接続可能な同軸接続器51を有す
る同軸ケーブル50を、ネットワークアナライザ等の測
定器60の接続器61に接続して行う。The high frequency measurement using such a coaxial connector 10 will be described with reference to FIG. In this measurement, as shown in FIG. 9, a coaxial cable 50 having a coaxial connector 10 at one end and a coaxial connector 51 connectable to the measuring device 60 at the other end is connected to a measuring instrument 60 such as a network analyzer. This is performed by connecting to the vessel 61.
【0027】まず、積層フィルタなどの被測定物20の
測定に先立ち、同軸接続器10、同軸ケーブル50、同
軸接続器51からなる測定系の校正を行う。ここで、同
軸接続器10の中心接触導体11は同軸ケーブル50の
中心導体と導通接続しており、また、外部接触導体12
は同軸ケーブルの外部導体と導通接続している。また、
この校正の際には、オス型接続器71を有する校正用標
準器70を用いる。この校正用標準器70は、通常は測
定器60と共に提供されるものであり、「LOAD」
「OPEN」「SHORT」の3種類がある。First, prior to the measurement of the device under test 20 such as a laminated filter, the measurement system including the coaxial connector 10, the coaxial cable 50, and the coaxial connector 51 is calibrated. Here, the center contact conductor 11 of the coaxial connector 10 is conductively connected to the center conductor of the coaxial cable 50, and the external contact conductor 12
Is electrically connected to the outer conductor of the coaxial cable. Also,
For this calibration, a calibration standard 70 having a male connector 71 is used. The calibration standard 70 is usually provided together with the measuring instrument 60, and is referred to as “LOAD”.
There are three types, "OPEN" and "SHORT".
【0028】この校正は、校正用標準器70のオス型接
続器71を直接同軸接続10に接続して行う。このよう
な接続状態において、各種特性を測定し、この測定値と
標準器70の有する特性(定義値)とから校正用補正値
を算出し、これにより測定器60の校正を行う。なお、
図7及び図8を参照して前述したように、本発明では、
THROUGH特性の測定時には、当該標準器を接続せ
ず、同軸接続器10を相互に直接接続することにより、
正確な特性を得ることができる。This calibration is performed by connecting the male connector 71 of the calibration standard 70 directly to the coaxial connection 10. In such a connection state, various characteristics are measured, and a correction value for calibration is calculated from the measured values and the characteristics (definition values) of the standard device 70, thereby calibrating the measuring device 60. In addition,
As described above with reference to FIGS. 7 and 8, in the present invention,
When measuring the THROUGH characteristics, by connecting the coaxial connectors 10 directly to each other without connecting the standard device,
Accurate characteristics can be obtained.
【0029】このようにして測定器60の校正が終了し
た後に、校正用標準器70を取り外し、積層フィルタ等
の被測定物20を直接同軸接続器10に接続し、この接
続状体で各種測定を行えばよい。なお、ここでの接続に
ついては、図3〜図6を参照して前述したとおりであ
り、同軸接続器や伝送変換具等の部材を用いずに被測定
物を直接接続することができる。After the calibration of the measuring device 60 is completed in this way, the calibration standard device 70 is removed, and the device under test 20 such as a laminated filter is directly connected to the coaxial connector 10. Should be performed. Note that the connection here is as described above with reference to FIGS. 3 to 6, and the device under test can be directly connected without using members such as a coaxial connector and a transmission converter.
【0030】このように本実施の形態にかかる同軸接続
器10によれば、当該同軸接続器10に校正用標準器7
0を接続可能であるとともに、被測定物20の端子電極
21を中心接触導体11又は外部接触導体12に直接接
続することができる。したがって、校正用標準器70を
接続して測定器60の校正を行った後に、被測定物20
を接続すれば、当該被測定物20の測定を高精度で行う
ことができる。すなわち、校正面を被測定物20の接続
面にすることができるので、他の接続用具を媒介させる
ことによる測定誤差の発生をなくすことができる。これ
は、特に表面実装部品(SMD)を測定する際に有効で
ある。As described above, according to the coaxial connector 10 according to the present embodiment, the coaxial connector 10 is
0 can be connected, and the terminal electrode 21 of the device under test 20 can be directly connected to the center contact conductor 11 or the external contact conductor 12. Therefore, after the calibration standard 70 is connected and the measuring device 60 is calibrated,
Is connected, the measurement of the DUT 20 can be performed with high accuracy. In other words, since the calibration surface can be used as the connection surface of the device under test 20, it is possible to eliminate the occurrence of measurement errors caused by intervening other connection tools. This is particularly effective when measuring a surface mount component (SMD).
【0031】次に、この同軸接続器10の製造方法につ
いて図10〜図12を参照して説明する。図10〜図1
2は同軸接続器の製造方法を説明する断面図である。Next, a method of manufacturing the coaxial connector 10 will be described with reference to FIGS. 10 to 1
2 is a cross-sectional view illustrating a method for manufacturing a coaxial connector.
【0032】この同軸接続器10は、前述したようにメ
ス型の同軸接続器としての構造を有している。また、こ
の同軸接続器10は校正用標準器が有するオス型の接続
器と接続可能である。そこで、同軸接続器10は、校正
用標準器のオス型接続器と係合可能な通常のメス型同軸
接続器を加工して製造するとよい。例えば、SMA型や
PC(プリシジョン・コネクタ)3.5mm型のメス型
同軸接続器である。本実施の形態ではSMA型の接続器
を用いた。As described above, the coaxial connector 10 has a structure as a female coaxial connector. The coaxial connector 10 can be connected to a male connector included in the calibration standard. Therefore, the coaxial connector 10 may be manufactured by processing a normal female coaxial connector that can be engaged with the male connector of the calibration standard device. For example, a female coaxial connector of SMA type or 3.5 mm type PC (Precision Connector) is used. In the present embodiment, an SMA type connector is used.
【0033】同軸接続器10を製造するには、図10に
示すように、このSMA型のメス型同軸接続器80の先
端部を切断する。この切断は、まず、同軸接続器80の
先端部から所定距離の位置で切断し、外部接触導体の端
縁部が半円状になるように上半分のみを切断する。この
ように接続することにより、図11に示すような接続器
80が得られる。最後に、図12に示すように、この接
続器80の中心接触導体に測定ピン14を挿入すること
により同軸接続器10を得る。To manufacture the coaxial connector 10, as shown in FIG. 10, the tip of the SMA female coaxial connector 80 is cut off. In this cutting, first, the coaxial connector 80 is cut at a position at a predetermined distance from the tip, and only the upper half is cut so that the edge of the external contact conductor becomes semicircular. By connecting in this manner, a connector 80 as shown in FIG. 11 is obtained. Finally, as shown in FIG. 12, the coaxial connector 10 is obtained by inserting the measuring pin 14 into the center contact conductor of the connector 80.
【0034】なお、本実施の形態では、メス型同軸接続
器として、SMA型のものを加工して製造したが、本発
明はこれに限定されることはない。例えば、前述したよ
うに、PC3.5mm型のものや、他の規格・形式のも
のであってもよい。例えば、C01型(N型)、C02
型(BNC型)、C03型(C型)、C04型(HN
型)、C11型、UHF型、S型、C05型(SMB
型)、TNC型等であってもよい。In this embodiment, the female coaxial connector is manufactured by processing an SMA type coaxial connector, but the present invention is not limited to this. For example, as described above, a PC 3.5 mm type or another standard / type may be used. For example, C01 type (N type), C02
Type (BNC type), C03 type (C type), C04 type (HN
Type), C11 type, UHF type, S type, C05 type (SMB
Type), TNC type, and the like.
【0035】また、本実施の形態では、同軸接続器10
は、一端側に同軸ケーブルを接続するものとしたが、本
発明はこれに限定されるものではない。例えば、両端に
メス型構造を有する中継用接続器や、一端側がメス型で
他端側にオス型構造を有する中継用接続器であってもよ
い。In the present embodiment, the coaxial connector 10
Has a coaxial cable connected to one end, but the present invention is not limited to this. For example, a relay connector having a female structure at both ends or a relay connector having a female structure at one end and a male structure at the other end may be used.
【0036】また、本実施の形態では、被測定物の一例
として積層フィルタやチップ状電子部品を示したが、本
発明はこれに限定されるものではない。すなわち、接続
用の端子電極を有しており、同軸接続器10の中心接触
導体11と外部接触導体12と接触可能であれば、形状
や種類等は問わない。この場合には、被測定物に応じて
測定ピン14の形状を加工するとよい。なお、同軸接続
器を有する回路モジュール等を接続できることは言うま
でもない。In this embodiment, the multilayer filter and the chip-shaped electronic component are shown as examples of the device under test, but the present invention is not limited to this. That is, as long as it has a connection terminal electrode and can contact the center contact conductor 11 and the external contact conductor 12 of the coaxial connector 10, the shape and the type are not limited. In this case, the shape of the measuring pin 14 may be processed according to the measured object. It goes without saying that a circuit module having a coaxial connector can be connected.
【0037】[0037]
【発明の効果】以上詳述したように、本発明によれば、
同軸接続器に校正用標準器を接続するとともに、被測定
物の端子電極を中心接触導体又は外部接触導体に直接接
続することができる。したがって、校正用標準器を接続
して測定器の校正を行った後に、被測定物を接続すれ
ば、当該被測定物の測定を高精度で行うことができる。
すなわち、校正面を被測定物の接続面にすることができ
るので、他の接続用具を媒介させることによる測定誤差
の発生をなくすことができる。As described in detail above, according to the present invention,
The calibration standard can be connected to the coaxial connector, and the terminal electrodes of the device under test can be directly connected to the center contact conductor or the external contact conductor. Therefore, if the device under test is connected after the calibration standard is connected and the measuring device is calibrated, the device under test can be measured with high accuracy.
That is, since the calibration surface can be used as the connection surface of the device under test, it is possible to eliminate the occurrence of measurement errors due to the intermediary of other connection tools.
【図1】高周波測定用同軸接続器の外観斜視図FIG. 1 is an external perspective view of a coaxial connector for high frequency measurement.
【図2】被測定物の外観斜視図FIG. 2 is an external perspective view of an object to be measured.
【図3】被測定物の測定方法を説明する斜視図FIG. 3 is a perspective view illustrating a method of measuring an object to be measured.
【図4】被測定物の測定方法を説明する断面図FIG. 4 is a cross-sectional view illustrating a method for measuring an object to be measured.
【図5】他の被測定物の測定方法を説明する斜視図FIG. 5 is a perspective view for explaining another method for measuring an object to be measured.
【図6】被測定物の他の測定方法を説明する断面図FIG. 6 is a cross-sectional view illustrating another method for measuring an object to be measured.
【図7】測定器の校正方法を説明する断面図FIG. 7 is a cross-sectional view illustrating a method of calibrating a measuring instrument.
【図8】測定器の校正方法を説明する断面図FIG. 8 is a cross-sectional view illustrating a method of calibrating a measuring instrument.
【図9】高周波測定用同軸接続器を用いた測定及び校正
方法を説明する図FIG. 9 is a diagram illustrating a measurement and calibration method using a coaxial connector for high frequency measurement.
【図10】同軸接続器の接続方法を説明する断面図FIG. 10 is a sectional view illustrating a method of connecting a coaxial connector.
【図11】同軸接続器の接続方法を説明する断面図FIG. 11 is a sectional view illustrating a method of connecting a coaxial connector.
【図12】同軸接続器の接続方法を説明する断面図FIG. 12 is a sectional view illustrating a method of connecting a coaxial connector.
10…高周波測定用同軸接続器、11…中心接触導体、
12…外部接触導体、13…絶縁体、14…測定ピン、
15…接続ピン、20,30…被測定物、21,31…
端子電極、50…同軸ケーブル、60…測定器、70…
標準用測定器、71…オス型接続器、80…同軸接続器10 ... coaxial connector for high frequency measurement, 11 ... center contact conductor,
12: external contact conductor, 13: insulator, 14: measuring pin,
15 Connection pins, 20, 30 DUT, 21, 31 ...
Terminal electrode, 50: coaxial cable, 60: measuring instrument, 70:
Standard measuring instrument, 71: male connector, 80: coaxial connector
───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.7 識別記号 FI テーマコート゛(参考) H01R 17/12 Z ──────────────────────────────────────────────────続 き Continued on the front page (51) Int.Cl. 7 Identification symbol FI Theme coat ゛ (Reference) H01R 17/12 Z
Claims (6)
物とを接続する高周波測定用同軸接続器において、 標準器に設けられたオス型の同軸接続器に対して電気的
に接続可能なメス型構造を有するとともに、標準器と対
向する側の端面に被測定物を当接させた際に被測定物に
形成された複数の端子電極がそれぞれ中心接触導体又は
外部接触導体に電気的に接続するように中心接触導体及
び外部接触導体を前記端面上に露出させたことを特徴と
する高周波測定用同軸接続器。1. A high-frequency measuring coaxial connector for connecting a high-frequency measuring instrument to a calibration standard or an object to be measured, wherein the male high-frequency coaxial connector provided on the standard is electrically connectable. Having a female structure, a plurality of terminal electrodes formed on the DUT when the DUT is brought into contact with the end face on the side facing the standard device are electrically connected to the center contact conductor or the external contact conductor, respectively. A coaxial connector for high frequency measurement, wherein a center contact conductor and an external contact conductor are exposed on the end face so as to be connected.
を係止する係止部が形成されていることを特徴とする請
求項1記載の高周波測定用同軸接続器。2. The coaxial connector for high-frequency measurement according to claim 1, wherein a locking portion for locking an object to be measured is formed on an end face on a side facing the standard device.
方向に張り出してなり、この張出部の縁部に被測定物を
係止することを特徴とする請求項2記載の高周波測定用
同軸接続器。3. The device according to claim 2, wherein the locking portion projects from an edge of the external contact conductor in the axial direction, and locks an object to be measured at an edge of the projection. Coaxial connector for high frequency measurement.
なり、この段差面に被測定物を係止することを特徴とす
る請求項2記載の高周波測定用同軸接続器。4. The coaxial connector for high-frequency measurement according to claim 2, wherein said locking portion has a step formed on said end face, and locks an object to be measured on said stepped surface.
段差をもって形成されてなり、その段差面に中心接触導
体が形成されていることを特徴とする請求項4記載の高
周波測定用同軸接続器。5. The high-frequency measuring device according to claim 4, wherein the end face is formed by forming two semicircular surfaces with a predetermined step, and a center contact conductor is formed on the step surface. Coaxial connector.
に接続するとともに着脱自在に係合する導体片を設けた
ことを特徴とする請求項1〜5記載の高周波測定用同軸
接続器。6. The coaxial connector for high-frequency measurement according to claim 1, further comprising a conductor piece that is electrically connected to and detachably engages with the center contact conductor.
Priority Applications (1)
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JP11084413A JP2000275285A (en) | 1999-03-26 | 1999-03-26 | Coaxial connector for high-frequency measurement |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11084413A JP2000275285A (en) | 1999-03-26 | 1999-03-26 | Coaxial connector for high-frequency measurement |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2000275285A true JP2000275285A (en) | 2000-10-06 |
Family
ID=13829911
Family Applications (1)
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JP (1) | JP2000275285A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010008363A (en) * | 2008-06-30 | 2010-01-14 | Tdk Corp | Impedance measuring method |
-
1999
- 1999-03-26 JP JP11084413A patent/JP2000275285A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010008363A (en) * | 2008-06-30 | 2010-01-14 | Tdk Corp | Impedance measuring method |
JP4561887B2 (en) * | 2008-06-30 | 2010-10-13 | Tdk株式会社 | Impedance measurement method |
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