JP2000200768A - Semiconductor manufacturing equipment - Google Patents

Semiconductor manufacturing equipment

Info

Publication number
JP2000200768A
JP2000200768A JP11000254A JP25499A JP2000200768A JP 2000200768 A JP2000200768 A JP 2000200768A JP 11000254 A JP11000254 A JP 11000254A JP 25499 A JP25499 A JP 25499A JP 2000200768 A JP2000200768 A JP 2000200768A
Authority
JP
Japan
Prior art keywords
wafer
enclosure
processing tank
carrier
processing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11000254A
Other languages
Japanese (ja)
Other versions
JP3205986B2 (en
Inventor
Haruhiko Matsushita
晴彦 松下
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP00025499A priority Critical patent/JP3205986B2/en
Publication of JP2000200768A publication Critical patent/JP2000200768A/en
Application granted granted Critical
Publication of JP3205986B2 publication Critical patent/JP3205986B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • ing And Chemical Polishing (AREA)
  • Weting (AREA)

Abstract

PROBLEM TO BE SOLVED: To prevent the steam of a processing liquid evaporating from a wafer from being attached to the wafer again and being particles in a semiconductor manufacturing equipment, which is used as an etching device of a semiconductor wafer, by quickly discharging a large amount of steam generated when a wafer is picked up from a processing tank or by preventing the generation of the steam itself. SOLUTION: A semiconductor processing equipment has a processing tank 4 for receiving a processing liquid, a carrying unit for carrying a carrier 3 receiving a wafer 2 into the processing tank 4, a cover 7 arranged above the processing tank 4 and provided with an opening 9 for taking outside air at the top, a mechanism 6 for moving up and down the cover 7, and a unit 8 for discharging gas in the cover 7. Alternatively, the device has a processing tank, a cover arranged above the processing tank, a mechanism for moving the cover, and a mechanism for introducing inert gas heated into the cover.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、半導体ウェハーの
エッチング処理装置等として好適に使用される半導体製
造装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor manufacturing apparatus suitably used as an apparatus for etching a semiconductor wafer.

【0002】[0002]

【従来の技術】従来、窒化膜を形成した半導体ウェハー
のエッチングを行う場合、図3に示すように、キャリア
3に収納したウェハー2を搬送機5によって高温(14
0〜160℃)の燐酸を入れた処理槽4内に収容し、処
理槽4の蓋1を閉めてエッチング処理を行っている。ま
た、エッチング終了後は、処理槽4からキャリア3を引
き上げ、キャリア3に収納したウェハー2をそのまま搬
送機5で次の水洗槽に移して水洗している。
2. Description of the Related Art Conventionally, when etching a semiconductor wafer having a nitride film formed thereon, as shown in FIG.
(0 to 160 ° C.) in a processing bath 4 containing phosphoric acid, and the lid 1 of the processing bath 4 is closed to perform an etching process. After the completion of the etching, the carrier 3 is pulled up from the processing tank 4, and the wafer 2 stored in the carrier 3 is transferred to the next washing tank by the transfer device 5 as it is and washed.

【0003】[0003]

【発明が解決しようとする課題】前述した従来技術で
は、高温の燐酸が入った処理槽から引き上げたウェハー
をそのまま次の水洗槽に入れて水洗している。しかし、
この方法では、処理槽からウェハーを引き上げた時に、
ウェハーに付着している燐酸が常温の空気に触れて気化
し、大量の蒸気を発生させるため、この蒸気がウェハー
に再付着することによりパーティクルとしてウェハーに
現れていた。また、このパーティクルは、次の水洗槽で
も除去することができなかった。
In the prior art described above, the wafer pulled up from the processing tank containing the high-temperature phosphoric acid is directly put into the next washing tank to be washed with water. But,
In this method, when the wafer is lifted from the processing tank,
Phosphoric acid adhering to the wafer is vaporized upon contact with air at normal temperature and generates a large amount of vapor. This vapor re-adheres to the wafer and appears as particles on the wafer. The particles could not be removed in the next washing tank.

【0004】本発明は、前記事情に鑑みてなされたもの
で、処理槽よりウェハーを引き上げる際に発生する大量
の蒸気を素早く排気したり、その蒸気自体の発生を防止
したりすることにより、ウェハーから蒸発した処理液の
蒸気がウェハーに再付着してパーティクルとして現れる
ことを防止することができる半導体製造装置を提供する
ことを目的とする。
SUMMARY OF THE INVENTION The present invention has been made in view of the above circumstances, and a large amount of vapor generated when a wafer is lifted from a processing tank is quickly exhausted, and the generation of the vapor itself is prevented. It is an object of the present invention to provide a semiconductor manufacturing apparatus capable of preventing a vapor of a processing liquid evaporated from water from re-adhering to a wafer and appearing as particles.

【0005】[0005]

【課題を解決するための手段】本発明は、前記目的を達
成するため、第1発明として、処理液が入れられた処理
槽と、ウェハーを収納したキャリアを前記処理槽内に搬
送する搬送機とを備えた半導体製造装置において、処理
槽の上方に設置された囲いであって、上部に外気を取り
入れる開口部を有する囲いと、この囲いを上下動させる
囲い上下動機構と、囲い内の気体を排出する排気手段と
を設けたことを特徴とする半導体製造装置を提供する。
In order to achieve the above-mentioned object, the present invention provides, as a first invention, a processing tank containing a processing liquid and a carrier for transferring a carrier containing wafers into the processing tank. In a semiconductor manufacturing apparatus comprising: an enclosure installed above a processing tank, an upper part having an opening for taking in outside air, an enclosure vertical movement mechanism for moving the enclosure up and down, and gas in the enclosure. And an exhaust means for exhausting gas.

【0006】第1発明によれば、処理槽からキャリアを
搬送機で引き上げる際に、処理槽上方の囲いを囲い上下
動機構により下降させ、キャリアを囲いの中に入れると
ともに、開口部から囲い内に外気を導入しつつ囲い内の
蒸気を排気口から排出することにより、処理槽からウェ
ハーを引き上げる際に発生する大量の蒸気を素早く排気
して、ウェハーから蒸発した薬品がウェハーに再付着し
てパーティクルとして現れることを防止することができ
る。
According to the first aspect of the present invention, when the carrier is lifted from the processing tank by the transporter, the enclosure above the processing tank is lowered by the enclosing vertical movement mechanism, and the carrier is inserted into the enclosure and the opening is opened. By discharging the vapor inside the enclosure from the exhaust port while introducing outside air into the enclosure, a large amount of vapor generated when the wafer is pulled up from the processing tank is quickly exhausted, and the chemicals evaporated from the wafer adhere to the wafer again. It can be prevented from appearing as particles.

【0007】また、本発明は、第2発明として、処理液
が入れられた処理槽と、ウェハーを収納したキャリアを
前記処理槽内に搬送する搬送機とを備えた半導体製造装
置において、処理槽の上方に設置された囲いと、この囲
いを上下動させる囲い上下動機構と、囲い内に加熱され
た不活性ガスを導入する加熱不活性ガス導入機構とを設
けたことを特徴とする半導体製造装置を提供する。
According to a second aspect of the present invention, there is provided a semiconductor manufacturing apparatus comprising: a processing tank containing a processing liquid; and a transfer device for transferring a carrier containing a wafer into the processing tank. Semiconductor manufacturing, comprising: an enclosure installed above the enclosure, an enclosure vertical movement mechanism for moving the enclosure up and down, and a heating inert gas introduction mechanism for introducing heated inert gas into the enclosure. Provide equipment.

【0008】第2発明によれば、後述する実施例に示す
ように、処理槽からキャリアを搬送機で引き上げる際
に、処理槽上方の囲いを囲い上下動機構により下降さ
せ、キャリアを囲いの中に入れることにより、処理槽よ
りウェハーを引き上げる際に発生する大量の蒸気を素早
く排気して、ウェハーから蒸発した薬品がウェハーに再
付着してパーティクルとして現れることを防止すること
ができる。
According to the second aspect of the present invention, as shown in an embodiment described later, when the carrier is lifted from the processing tank by the transporter, the enclosure above the processing tank is lowered by the up-down movement mechanism, and the carrier is placed inside the processing tank. Thus, a large amount of vapor generated when the wafer is lifted from the processing tank can be quickly exhausted to prevent chemicals evaporated from the wafer from re-adhering to the wafer and appearing as particles.

【0009】[0009]

【発明の実施の形態】第1発明の実施例を図1を用いて
説明する。本実施例の半導体製造装置は、内部に窒化膜
をエッチングする高温(140〜160℃)の燐酸を入
れた処理槽4と、ウェハー2を収納したキャリア3を搬
送する搬送機5と、処理槽4の上方に設置された略四角
筒状の囲い7と、囲い7を上下動させる囲い上下動機構
6とを具備する。囲い7は内部に清浄な空気を取り入れ
ることができるよう上端に開口部9を有し、開口部9よ
り取り入れた空気は排気口8(排気手段)により排気さ
れるようになっている。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the first invention will be described with reference to FIG. The semiconductor manufacturing apparatus according to the present embodiment includes a processing tank 4 in which high-temperature (140 to 160 ° C.) phosphoric acid for etching a nitride film is contained, a transfer machine 5 for transferring a carrier 3 containing a wafer 2, An enclosure 7 having a substantially rectangular cylindrical shape installed above the enclosure 4 and an enclosure vertical movement mechanism 6 for vertically moving the enclosure 7 are provided. The enclosure 7 has an opening 9 at an upper end so that clean air can be taken into the inside, and the air taken in from the opening 9 is exhausted by an exhaust port 8 (exhaust means).

【0010】本実施例の半導体製造装置を用いて窒化膜
を形成したウェハーのエッチングを行う場合、まず処理
槽4の蓋1を開け、キャリア3に収納したウェハー2を
搬送機5によって処理槽4内に収容し、高温の燐酸中に
ウェハー2を浸漬した後、処理槽4の蓋1を閉める。こ
れにより、処理槽4内に入れられたウェハー2は高温の
燐酸によってエッチングされる。
When etching a wafer on which a nitride film has been formed using the semiconductor manufacturing apparatus of this embodiment, first, the lid 1 of the processing tank 4 is opened, and the wafer 2 stored in the carrier 3 is transferred by the transfer machine 5 to the processing tank 4. After the wafer 2 is immersed in high-temperature phosphoric acid, the lid 1 of the processing tank 4 is closed. Thus, the wafer 2 placed in the processing bath 4 is etched by the high-temperature phosphoric acid.

【0011】所定時間エッチングを行った後、処理槽4
の蓋1を開け、キャリア3を搬送機5で引き上げるが、
引き上げの際には処理槽4上方の囲い7を囲い上下動機
構6により下降させ、キャリア3を囲い7の中に入れ
る。このとき、高温の燐酸が入った処理槽4から引き上
げられたキャリア3及びウェハー2は、付着した燐酸が
常温の空気に触れて気化するために大量の蒸気を発生さ
せるが、囲い7に接続された排気口8により蒸気は効率
良く排気され、ウェハー2に再付着することなく取り除
かれる。
After etching for a predetermined time, the treatment tank 4
Is opened, and the carrier 3 is pulled up by the transporter 5,
At the time of lifting, the enclosure 7 above the processing tank 4 is lowered by the enclosure vertical movement mechanism 6, and the carrier 3 is put into the enclosure 7. At this time, the carrier 3 and the wafer 2 pulled up from the processing tank 4 containing the high-temperature phosphoric acid generate a large amount of vapor because the attached phosphoric acid comes into contact with the room-temperature air and evaporates, but is connected to the enclosure 7. Vapor is efficiently exhausted by the exhaust port 8, and is removed without re-adhering to the wafer 2.

【0012】キャリア3及びウェハー2が冷えてきて蒸
気を発することがなくなってきた時(通常は2分〜10
分程度が経過した時)、囲い7を囲い上下動機構6によ
り上昇させ、キャリア3を搬送機5によって次の水洗槽
に移して水洗する。
When the carrier 3 and the wafer 2 are cooled and no longer emit steam (usually 2 minutes to 10 minutes).
(When about minutes have passed), the enclosure 7 is raised by the enclosure vertical movement mechanism 6, and the carrier 3 is transferred to the next washing tank by the transporter 5 and washed.

【0013】本実施例によれば、処理槽よりキャリア及
びウェハーを引き上げたときにこれらから蒸発する燐酸
の蒸気がウェハーに再付着することを防止できるため、
パーティクルの付着を低減することが可能である。
According to this embodiment, when the carrier and the wafer are lifted out of the processing tank, the vapor of phosphoric acid evaporated from these can be prevented from re-adhering to the wafer.
It is possible to reduce adhesion of particles.

【0014】次に、第2発明の実施例を図2を用いて説
明する。本実施例の半導体製造装置は、内部に窒化膜を
エッチングする高温(140〜160℃)の燐酸を入れ
た処理槽4と、ウェハー2を収納したキャリア3を搬送
する搬送機5と、処理槽4の上方に設置された囲い7
と、囲い7を上下動させる囲い上下動機構(図示せず)
とを具備する。囲い7の上壁には加熱不活性ガス供給口
10が設けられているとともに、この供給口10には囲
い7の内部に加熱された不活性ガスを導入する加熱不活
性ガス導入機構11が接続されている。
Next, an embodiment of the second invention will be described with reference to FIG. The semiconductor manufacturing apparatus according to the present embodiment includes a processing tank 4 in which high-temperature (140 to 160 ° C.) phosphoric acid for etching a nitride film is contained, a transfer machine 5 for transferring a carrier 3 containing a wafer 2, Enclosure 7 installed above 4
And an enclosure vertical movement mechanism (not shown) for moving the enclosure 7 up and down.
And A heating inert gas supply port 10 is provided on the upper wall of the enclosure 7, and a heating inert gas introduction mechanism 11 for introducing heated inert gas into the enclosure 7 is connected to the supply port 10. Have been.

【0015】本実施例の半導体製造装置を用いて窒化膜
を形成したウェハーのエッチングを行う場合、まず処理
槽4の蓋1を開け、キャリア3に収納したウェハー2を
搬送機5によって処理槽4内に収容し、高温の燐酸中に
ウェハー2を浸漬した後、処理槽4の蓋1を閉める。こ
れにより、処理槽4内に入れられたウェハー2は高温の
燐酸によってエッチングされる。
When etching a wafer on which a nitride film has been formed using the semiconductor manufacturing apparatus of this embodiment, first, the lid 1 of the processing tank 4 is opened, and the wafer 2 stored in the carrier 3 is transferred by the transfer machine 5 to the processing tank 4. After the wafer 2 is immersed in high-temperature phosphoric acid, the lid 1 of the processing tank 4 is closed. Thus, the wafer 2 placed in the processing bath 4 is etched by the high-temperature phosphoric acid.

【0016】所定時間エッチングを行った後、処理槽4
の蓋1を開け、キャリア3を搬送機5で引き上げる
が、、引き上げの際には処理槽4上方の囲い7を囲い上
下動機構により下降させ、キャリア3を囲い7の中に入
れるとともに、加熱不活性ガス導入機構11によって囲
い7の内部に燐酸と同程度の温度(140〜160℃)
に加熱された不活性ガスを導入する。このように燐酸の
温度と囲い7内の温度とをほぼ等しくすることにより、
キャリア3及びウェハー2に付着した燐酸の気化を防
ぎ、蒸気が発生しないようにする。
After etching for a predetermined time, the treatment tank 4
The cover 3 is opened and the carrier 3 is pulled up by the transfer device 5. When the carrier 3 is pulled up, the enclosure 7 above the processing tank 4 is lowered by an up-down movement mechanism, and the carrier 3 is put into the enclosure 7 and heated. The same temperature as phosphoric acid (140 to 160 ° C.) inside the enclosure 7 by the inert gas introduction mechanism 11.
A heated inert gas is introduced into the reactor. By making the temperature of the phosphoric acid substantially equal to the temperature in the enclosure 7 in this manner,
The vaporization of the phosphoric acid attached to the carrier 3 and the wafer 2 is prevented so that no vapor is generated.

【0017】キャリア3及びウェハー2に付着した燐酸
が十分にしたたり落ちた後、囲い7を囲い上下動機構に
より上昇させ、囲い7を囲い上下動機構6により上昇さ
せ、キャリア3を搬送機5によって次の水洗槽に移して
水洗する。
After the phosphoric acid adhering to the carrier 3 and the wafer 2 is sufficiently dripped and dropped, the enclosure 7 is raised by an enclosure vertical movement mechanism, the enclosure 7 is raised by an enclosure vertical movement mechanism 6, and the carrier 3 Transfer to the next washing tank and wash with water.

【0018】本実施例によれば、処理槽よりキャリア及
びウェハーを引き上げたときにこれらから蒸気が発生す
ることを防止できるため、燐酸の蒸気に起因するパーテ
ィクルの付着を低減することが可能である。
According to this embodiment, when the carrier and the wafer are lifted up from the processing tank, it is possible to prevent vapor from being generated from the carrier and the wafer. Therefore, it is possible to reduce the adhesion of particles due to the phosphoric acid vapor. .

【0019】[0019]

【発明の効果】以上のように、本発明の半導体製造装置
によれば、ウェハーから蒸発した処理液の蒸気がウェハ
ーに再付着してパーティクルとして現れることを防止す
ることが可能である。
As described above, according to the semiconductor manufacturing apparatus of the present invention, it is possible to prevent the vapor of the processing liquid evaporated from the wafer from adhering to the wafer and appearing as particles.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明に係る半導体製造装置の一実施例を示す
概略斜視図である。
FIG. 1 is a schematic perspective view showing one embodiment of a semiconductor manufacturing apparatus according to the present invention.

【図2】本発明に係る半導体製造装置の他の実施例を示
す概略斜視図である。
FIG. 2 is a schematic perspective view showing another embodiment of the semiconductor manufacturing apparatus according to the present invention.

【図3】従来の半導体製造装置(エッチング処理装置)
の一例を示す概略斜視図である。
FIG. 3 shows a conventional semiconductor manufacturing apparatus (etching processing apparatus).
FIG. 3 is a schematic perspective view showing an example of FIG.

【符号の説明】[Explanation of symbols]

1 蓋 2 ウェハー 3 キャリア 4 処理槽 5 搬送機 6 囲い上下動機構 7 囲い 8 排気口 9 開口部 10 加熱不活性ガス供給口 11 加熱不活性ガス導入機構 DESCRIPTION OF SYMBOLS 1 Cover 2 Wafer 3 Carrier 4 Processing tank 5 Conveyor 6 Enclosure vertical movement mechanism 7 Enclosure 8 Exhaust port 9 Opening 10 Heating inert gas supply port 11 Heating inert gas introduction mechanism

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 処理液が入れられた処理槽と、ウェハー
を収納したキャリアを前記処理槽内に搬送する搬送機と
を備えた半導体製造装置において、処理槽の上方に設置
された囲いであって、上部に外気を取り入れる開口部を
有する囲いと、この囲いを上下動させる囲い上下動機構
と、囲い内の気体を排出する排気手段とを設けたことを
特徴とする半導体製造装置。
An enclosure provided above a processing tank in a semiconductor manufacturing apparatus having a processing tank containing a processing liquid and a transfer device for transferring a carrier containing a wafer into the processing tank. And an enclosure having an opening at the top for taking in outside air, an enclosure vertical movement mechanism for moving the enclosure up and down, and exhaust means for discharging gas in the enclosure.
【請求項2】 処理液が入れられた処理槽と、ウェハー
を収納したキャリアを前記処理槽内に搬送する搬送機と
を備えた半導体製造装置において、処理槽の上方に設置
された囲いと、この囲いを上下動させる囲い上下動機構
と、囲い内に加熱された不活性ガスを導入する加熱不活
性ガス導入機構とを設けたことを特徴とする半導体製造
装置。
2. A semiconductor manufacturing apparatus comprising: a processing tank containing a processing liquid; and a transfer device for transferring a carrier containing a wafer into the processing tank, wherein an enclosure installed above the processing tank is provided. A semiconductor manufacturing apparatus, comprising: an enclosure vertical movement mechanism for moving the enclosure up and down; and a heated inert gas introduction mechanism for introducing heated inert gas into the enclosure.
JP00025499A 1999-01-05 1999-01-05 Semiconductor manufacturing equipment Expired - Fee Related JP3205986B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP00025499A JP3205986B2 (en) 1999-01-05 1999-01-05 Semiconductor manufacturing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP00025499A JP3205986B2 (en) 1999-01-05 1999-01-05 Semiconductor manufacturing equipment

Publications (2)

Publication Number Publication Date
JP2000200768A true JP2000200768A (en) 2000-07-18
JP3205986B2 JP3205986B2 (en) 2001-09-04

Family

ID=11468802

Family Applications (1)

Application Number Title Priority Date Filing Date
JP00025499A Expired - Fee Related JP3205986B2 (en) 1999-01-05 1999-01-05 Semiconductor manufacturing equipment

Country Status (1)

Country Link
JP (1) JP3205986B2 (en)

Also Published As

Publication number Publication date
JP3205986B2 (en) 2001-09-04

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