JP2000180102A - Measuring gauge for film thickness - Google Patents

Abstract

PROBLEM TO BE SOLVED: To enhance work efficiency, reduce measurement errors, and suppress coating defects by stably contacting a substrate in measurement with constitution including three points that are not located on a straight line so that a base forms a reference plane contacted with the substrate. SOLUTION: A gauge 1 cylindrically is formed a predetermined size easily carried by a worker and is provided with a base 2 and a measuring portion 3 at an end of it. The base 2 has a constitution including at least three points that are not located on a straight line so that a reference plane 4 corresponding to a substrate is formed. A plane including the base 2 and a contact point with the substrate becomes the reference plane 4. Both of the substrate and reference plane 4 are plain faces, and they form the reference plane 4 at an end plane of the base 2. The base 2 is constituted based on the substrate having a curved plane so that the reference plane 4 corresponding to the substrate having a curved plane is formed when the substrate is a curved plane. Thereby, the base 2 stably contacts the substrate as the contact points with the base 2 and the substrate including three points that are not located on a straight line.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a film thickness measuring device having a base portion which is inserted into a coating film in an undried state and abuts against a base, and a measuring portion which measures the film thickness of the coating film by applying a paint. About gauges.

[0002]

2. Description of the Related Art Generally, when coating a structure, the thickness of a coating film is controlled in order to prevent coating defects.
In controlling the film thickness, the thickness of the coating film in an undried state is set to a predetermined value based on a correlation confirmed in advance in order to set the thickness of the coating film in a dried state to a value within a predetermined range. Measure if it is a range. Conventionally, a film thickness measuring gauge 30 as shown in FIG. 7 has been used for measuring the film thickness of the coating film in an undried state. The film thickness measuring gauge 30 is composed of a thin flat plate member 31 such as a stainless steel plate, and measures the film thickness of the coating film by attaching a base 32 which is inserted into the coating film and abuts on the base and a coating material is adhered. And a measuring unit 33. The measuring unit 33 measures the teeth 3 such that the distance from the end face of the base 32 changes stepwise at a predetermined pitch.
4, 35, 36, 37, and 38 are formed in a comb shape. The distance between the end face of the base 32 and the end faces of the teeth 34 to 38 is marked on the scale 39. And
When measuring the film thickness, the base 32 is inserted into the coating film in an undried state, is brought into contact with the base, and the paint is adhered to the measuring section 33.
4, 35) on a scale 39 (for example, 50 μm) marked on a tooth (for example, tooth 35) having a large distance from the end face of the base 32.
m) was set as the thickness of the coating film.

[0003]

However, in the film thickness measuring gauge 30 as described above, since the gauge 30 is a flat plate, the state of contact of the base 32 with the base is not stable, and
It was difficult to stably set 0 vertically from the ground. For this reason, there has been a problem that the attitude of the gauge 30 with respect to the base changes, causing a measurement error, and the thickness of the dried coating film becomes a value outside a predetermined range, resulting in defective coating. Further, since the measuring section 33 is formed in a comb shape, the film thickness measurement can be read only at the stepwise value marked on the scale 39, and it is not possible to estimate a value smaller than the pitch of the scale 39. It was difficult.

[0004] The present invention has been made in view of the above-mentioned problems, and by configuring a film thickness measurement gauge so as to stably abut against a substrate at the time of measurement, it is possible to improve work efficiency and to improve measurement error. It is intended to reduce the number of coatings and to suppress coating defects.

[0005]

Means for Solving the Problems In order to solve the above-mentioned problems, the invention according to claim 1 is directed to a base which is inserted into a coating film in an undried state and abuts a base, and a coating material is applied by applying a coating material. In a film thickness measuring gauge including a measuring unit for measuring a film thickness, a technique is adopted in which a base includes at least three points that are not on a straight line so as to form a reference surface to be brought into contact with a base. You. This film thickness measuring gauge has at least three bases that are not in a straight line in contact with the substrate.
Since it is constituted by points, a reference plane corresponding to the base is formed, and the base stably abuts on the base.

According to a second aspect of the present invention, in the film thickness measuring gauge of the first aspect, a technique is employed in which the base is formed in a cylindrical shape and a reference surface is formed at an end face. In this film thickness measuring gauge, the reference surface is formed at the end face of the base formed in a cylindrical shape, so that the base always stably comes into contact with the base.

According to a third aspect of the present invention, in the film thickness measuring gauge according to the second aspect, a technique is employed in which the distance from the reference surface of the measuring section changes smoothly. In this film thickness measurement gauge, the distance between the measurement part and the reference surface changes smoothly,
It is possible to estimate the film thickness between the pitches written on the gauge.

[0008]

DESCRIPTION OF THE PREFERRED EMBODIMENTS One embodiment of the present invention will be described below with reference to FIGS. FIG. 1 shows a film thickness measuring gauge 1 according to the present invention, and FIG. 2 shows a cross section of an end portion of the film thickness measuring gauge 1. The gauge 1 is formed in a cylindrical shape with a predetermined size that is easy for an operator to hold.
At one end, a base 2 and a measuring section 3 are provided.
The material used for the gauge 1 is a material that is not deteriorated by the paint, for example, a stainless material.

The base 2 includes at least three points that are not on a straight line so as to form the reference plane 4 corresponding to the base. Here, the end of the cylindrical gauge 1 is the base 2, and the contact between the base 2 and the base forms an annular shape including three points that are not on a straight line, and the surface including this contact becomes the reference surface 4. . That is, since the base of the present embodiment is a flat surface, the reference surface 4 is also flat, and the reference surface 4 is formed on the end surface of the base 2. The base 2 has a larger number of portions (points) forming the reference surface 4 and the wider the interval between the portions, the more stable the contact state with the base. When the base is a curved surface, the base 2 is configured in accordance with the curved surface of the base so as to form the reference surface 4 of the curved surface corresponding to the base. Thus, the base 2 is stably abutted on the base by including three points where the contact point between the base 2 and the base is not on a straight line.

The measuring section 3 is configured to have a predetermined distance from the reference plane 4 according to the range of the film thickness to be measured. The measuring portion 3 is a top portion of the groove 5 shown in FIG. 2 formed along the circumference at the end face of the gauge 1, and as shown in FIG. The range is configured to change smoothly. That is, the depth of the groove 5 is formed so as to be gradually deeper at a predetermined angle from the reference plane 4, so that the distance between the measuring unit 3 and the base 2 is set along the circumference of the thickness range of the measuring object. Change. In addition, the groove 5
A shape such as a substantially U shape or a substantially V shape is applied.
When the base 2 is inserted into the undried coating film and comes into contact with the base, the paint adheres to the measuring portion 3 which is the top of the groove 5.
At this time, the paint adheres to a portion of the measuring unit 3 where the distance from the base 2 is smaller than the thickness of the coating film.

On the peripheral surface of the gauge 1, a scale 6 (25, 50, 7 shown in FIG. 1) corresponding to the distance between the base 2 and the measuring section 3 is provided.
Numerals such as 5, 100: the unit is μm). The boundary between the portion where the paint is attached and the portion where the paint is not attached in the measuring section 3 is illuminated on the scale 6 to measure the film thickness. As described above, since the measuring section 3 is not formed in a comb-like shape but is formed smoothly, it is determined whether the boundary of the applied paint is close to the scale 6 or not. Can be estimated.

As described above, by forming the base 2 into a cylindrical shape so as to form the reference surface 4 corresponding to the base, a film thickness measuring gauge that stably abuts the base during measurement is configured.

Next, another embodiment of the present invention will be described with reference to FIGS. The gauge A shown in FIG. 3 has a cylindrical shape, and the measuring section 3 of the gauge 1 in the above-described embodiment is configured by forming the groove 5, whereas the measuring section of the gauge A shown in FIG. Reference numeral 10 is formed by forming a step on the outer periphery of the end of the gauge A. The measurement unit 10 as a step surface is formed at a predetermined angle from the reference surface 12 so that the distance from the reference surface 12 smoothly changes the thickness range to be measured. Since the measuring unit 10 is formed on the peripheral surface of the gauge A in this manner, it is easy to illuminate a scale (not shown) marked on the peripheral surface with a position where the paint adheres in the measuring operation.

The gauge B shown in FIG. 4 is of a type constituted by a plurality of flat plates, and here is constituted by two flat plates 13 and 14 combined in an X-shape. The gauge B has a flat plate 13 at one end of the X-shape.
Each of 14 has a base 15 and a measuring unit 16. The base 15 is provided on both sides of the measuring unit 16 and is divided into four places. And all the bases 1
5 is configured to abut the ground plane,
The base portion 15 forms a reference surface (not shown) by abutting on the base in a state including at least three points that are not on a straight line. The measurement section 16 is formed such that the distance from the reference plane smoothly changes the thickness range of the measurement target. Thus, the gauge B constituted by the flat plates 13 and 14 can stably contact the base while having a simple configuration. It should be noted that the gauge B is not limited to the X-shaped configuration shown in FIG. 4, but may be a V-shaped configuration made of one plate or a W-shaped configuration.

The gauge C shown in FIG. 5 has a structure in which a supporting member 18 is attached to a flat plate member 17 formed similarly to the conventional gauge 30 shown in FIG. The base 19 is formed by three ends of the end of the flat plate member 17 and the end of the support member 18.
And all the bases 19 are configured to abut against the plane of the base, and at least three
A reference plane (not shown) is formed by abutting the base with the points included. The measuring section 20 has a comb shape like the conventional gauge 30. In the conventional gauge 30, since the base 32 and the base contacted in a straight line, it was difficult to stably contact the gauge 30 with the base.
Is configured so that the base 19 is in contact with the base at three or more points that are not on a straight line, so that the contact state is stable and the gauge C can be used in the same measurement method as the conventional gauge 30. It is possible.

A gauge D shown in FIG. 6 has a flat plate member 21 formed similarly to the conventional gauge 30 shown in FIG.
It is configured in a shape bent in a letter shape. Also, the measuring unit 23
Has a comb shape like the conventional gauge 30. The gauge D has a simple configuration in which only the conventional gauge 30 is bent, but forms a reference plane (not shown) by abutting on the base in a state where the base 22 includes at least three points that are not on a straight line. Therefore, stable film thickness measurement can be performed.

The various shapes and combinations of the constituent members shown in the above embodiment are merely examples, and can be variously changed without departing from the spirit of the present invention.

[0018]

As described above, the film thickness measuring gauge according to the first aspect is configured so that the base portion includes at least three points that are not on a straight line so as to form a reference surface to be brought into contact with the base. As a result, the film thickness can be stably measured, the measurement error can be reduced, and the coating failure can be reliably prevented. In addition, when the base stably abuts against the base, the measurement operation can be performed efficiently, so that the operation cost can be reduced.

In the film thickness measuring gauge according to the second aspect, the end face of the base formed in a cylindrical shape is the reference plane, and the base is always kept the same regardless of the rotation angle of the gauge about the cylindrical axis. Since it comes into contact with the base, it is easy to stably contact the gauge with the base, thereby improving work efficiency. Further, since the manufacture of the gauge is easy, the cost can be reduced.

In the film thickness measuring gauge according to the third aspect, the measuring unit is configured so that the distance between the measuring unit and the reference surface changes smoothly, and a fine film thickness value is estimated from the boundary of the paint that has adhered. Therefore, the measurement error can be reduced.

[Brief description of the drawings]

FIG. 1 is a side view showing an embodiment of a film thickness measuring gauge according to the present invention.

FIG. 2 is a cross-sectional view of an end of FIG.

FIG. 3 is a schematic view showing another embodiment of the film thickness measuring gauge according to the present invention.

FIG. 4 is a perspective view showing another embodiment of the film thickness measurement gauge according to the present invention.

FIG. 5 is a perspective view showing another embodiment of the film thickness measuring gauge according to the present invention.

FIG. 6 is a perspective view showing another embodiment of the film thickness measuring gauge according to the present invention.

FIG. 7 is a front view showing a conventional thickness gauge.

[Explanation of symbols]

 1 Thickness measurement gauge 2 Base 3 Measurement section 4 Reference plane

Claims (3)

[Claims] 1. A film thickness comprising: a base portion (2) inserted into a coating film in an undried state and in contact with a substrate; and a measuring portion (3) for measuring the film thickness of the coating film by applying a paint. In the measurement gauge, the base (2) may be a reference surface (4) to be brought into contact with the base.
Characterized in that it comprises at least three points that are not on a straight line so as to form. 2. The film thickness measuring gauge according to claim 1, wherein said base portion is formed in a cylindrical shape and forms said reference surface at an end face. 3. The film thickness measuring gauge according to claim 2, wherein the distance from the reference surface of the measuring section changes smoothly.