JP2000121700A5 - - Google Patents

Download PDF

Info

Publication number
JP2000121700A5
JP2000121700A5 JP1999290335A JP29033599A JP2000121700A5 JP 2000121700 A5 JP2000121700 A5 JP 2000121700A5 JP 1999290335 A JP1999290335 A JP 1999290335A JP 29033599 A JP29033599 A JP 29033599A JP 2000121700 A5 JP2000121700 A5 JP 2000121700A5
Authority
JP
Japan
Prior art keywords
branch
rank order
branch voltage
subset
voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1999290335A
Other languages
English (en)
Japanese (ja)
Other versions
JP2000121700A (ja
Filing date
Publication date
Priority claimed from US09/169,597 external-priority patent/US6266787B1/en
Application filed filed Critical
Publication of JP2000121700A publication Critical patent/JP2000121700A/ja
Publication of JP2000121700A5 publication Critical patent/JP2000121700A5/ja
Pending legal-status Critical Current

Links

JP11290335A 1998-10-09 1999-10-12 アクセスを制限した回路テストにおいて刺激位置を選択するための方法及び装置 Pending JP2000121700A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US169597 1998-10-09
US09/169,597 US6266787B1 (en) 1998-10-09 1998-10-09 Method and apparatus for selecting stimulus locations during limited access circuit test

Publications (2)

Publication Number Publication Date
JP2000121700A JP2000121700A (ja) 2000-04-28
JP2000121700A5 true JP2000121700A5 (https=) 2006-11-24

Family

ID=22616365

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11290335A Pending JP2000121700A (ja) 1998-10-09 1999-10-12 アクセスを制限した回路テストにおいて刺激位置を選択するための方法及び装置

Country Status (4)

Country Link
US (1) US6266787B1 (https=)
EP (1) EP0992804B1 (https=)
JP (1) JP2000121700A (https=)
DE (1) DE69923045T2 (https=)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6968285B1 (en) * 2003-04-09 2005-11-22 Hamid Adnan A Method and apparatus for scenario search based random generation of functional test suites
US7111198B2 (en) * 2003-06-12 2006-09-19 Inventec Corporation Multithread auto test method
US7779374B1 (en) 2006-09-29 2010-08-17 Breker Verification Systems, Inc. Generating self-checking test cases from reduced case analysis graphs
WO2014121138A2 (en) * 2013-01-31 2014-08-07 The Regents Of The University Of California Method and apparatus for solving an optimization problem using an analog circuit

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4012625A (en) * 1975-09-05 1977-03-15 Honeywell Information Systems, Inc. Non-logic printed wiring board test system
US4204633A (en) * 1978-11-20 1980-05-27 International Business Machines Corporation Logic chip test system with path oriented decision making test pattern generator
US5012180A (en) * 1988-05-17 1991-04-30 Zilog, Inc. System for testing internal nodes
JPH07113898B2 (ja) * 1989-05-09 1995-12-06 株式会社日立製作所 障害検出方式
US5323108A (en) * 1992-01-23 1994-06-21 Hewlett-Packard Company Method for generating functional tests for printed circuit boards based on pattern matching of models
US5808919A (en) 1993-11-23 1998-09-15 Hewlett-Packard Company Diagnostic system
US5530372A (en) * 1994-04-15 1996-06-25 Schlumberger Technologies, Inc. Method of probing a net of an IC at an optimal probe-point
US5521513A (en) * 1994-10-25 1996-05-28 Teradyne Inc Manufacturing defect analyzer
US5732209A (en) * 1995-11-29 1998-03-24 Exponential Technology, Inc. Self-testing multi-processor die with internal compare points
EP0794495A3 (en) * 1996-03-08 1998-07-22 Hewlett-Packard Company Automated analysis of a model-based diagnostic system
US5734661A (en) * 1996-09-20 1998-03-31 Micron Technology, Inc. Method and apparatus for providing external access to internal integrated circuit test circuits

Similar Documents

Publication Publication Date Title
Jenkins et al. An application of functional dependencies to the topological analysis of protection schemes
Flanders Infinite networks: I--Resistive networks
CA2171802A1 (en) Comparative performance modeling for distributed object oriented applications
RU95121102A (ru) Способ инициализации и актуализации модели сети
SE9702763D0 (sv) Metod vid databas
WO2007076357A3 (en) System and method for finite element based topology optimization
WO2000072256A3 (de) Neuronales netz zum computergestützten wissensmanagement
JPH11330967A5 (https=)
JP2000121700A5 (https=)
DE60323532D1 (de) Schnelle wiederherstellung von einem unbrauchbaren heimat-server
CN106709134B (zh) 一种煤矿高压电网短路电流并行计算方法
CN108959300A (zh) 文件存储方法和存储装置
Segal Two-sided ideals in operator algebras
JP2000121698A5 (https=)
CN109412138A (zh) 均流控制系统和方法
DE60131889D1 (de) Verfahren und telekommunikationsknoten zur verteilung von abschlussverkehr in einem telekommunikationsknoten
JPH10327211A5 (https=)
Tippe et al. Modular simulation of zonal architectures and ring topologies for automotive power nets
Watanabe A method of tree expansion in network topology
JP2003067440A5 (https=)
JP2002313307A5 (https=)
JP2021170511A5 (https=)
JPS5812424A (ja) 逐次比較型ａ／ｄ変換器
CN111626463B (zh) 一种基于Hadoop架构的电力系统短路电流并行协调方法
CN106528573B (zh) HBase数据库的数据查询方法和装置