JP2000105201A - Search device for faulty part in condenser - Google Patents

Abstract

PROBLEM TO BE SOLVED: To search automatically and detect surely a faulty part such as a damaged part of a film in a short time. SOLUTION: A film fed out of a roller 1 is wound around a winding roller 3 via relay rollers 7, between which a light source 4 and a light receiving section 5 are provided. In the event that there is a damaged part in the film passing under the light source 4, light is transmitted through the damaged part, being received by the light receiving section 5. When the light receiving section 5 receives the light transmitted through the damaged part, a controller 8 stops a rotation of a feeding roller 2. Accordingly, the damaged part of the film can be automatically recognized.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a capacitor used in the fields of industrial equipment and communication equipment. The present invention searches for damages caused by film damage in the manufacturing process and damages caused by short-circuiting of the capacitor during use. The present invention relates to an apparatus for searching for a failure location of a capacitor for identifying a location where insulation degradation or capacitance of a film is reduced.

[0002]

2. Description of the Related Art Capacitors used in the field of industrial equipment and communication equipment, such as film damage during the manufacturing process and damage holes formed by short-circuiting of the capacitor during use (such as conductive fine particles in the capacitor) It is necessary to search for a defective portion such as a damaged hole which is formed when the film is lost due to external inflow current and energy due to self-discharge of the capacitor when a short circuit occurs and the insulation voltage is reduced due to the presence of a defective portion. .

Further, it is necessary to identify a defective portion of the capacitor where the insulation of the film is deteriorated or the capacitance is reduced. In such a case, conventionally, a damaged portion of the film has been searched visually using a magnifying glass or the like while manually pulling out the film.

[0004]

In the above-mentioned prior art, a damaged portion is visually searched for while manually pulling out the film. Therefore, when the damaged portion is small, it may be missed. In addition, there is a possibility that a difference may be found in finding a damaged portion depending on a shape of a film and an ability (sight) of an operator.

SUMMARY OF THE INVENTION It is an object of the present invention to provide an apparatus for searching for a defective portion of a capacitor which can automatically search for a defective portion such as a damaged portion of a film and which can be reliably found in a short time.

[0006]

According to a first aspect of the present invention, there is provided an apparatus for locating a failure of a capacitor according to the present invention, which draws a film from a winding-type capacitor having a film as a dielectric. Means, a light source for irradiating light to the film drawn by this means, a light receiving unit for receiving light obtained from a damaged portion of the film among the light irradiated by the light source, and Means for recognizing a damaged portion.

[0007] In the apparatus configured as described above, the damaged portion of the film is automatically searched, so that even if the damaged portion is smaller than in the case of visual observation, it is possible to reliably search. Further, by performing the search continuously, a plurality of damaged portions can be found.

According to a second aspect of the present invention, there is provided an apparatus for searching for a failure location of a capacitor, comprising: a roller for extracting a film from a winding-type capacitor having a film as a dielectric; A light source that irradiates light to the film drawn by the roller, a light receiving unit that receives light obtained from a damaged portion of the film among the light irradiated by the light source, and a light receiving unit that receives the light. Means for identifying the position of the damaged portion of the film from the measured value of the measuring means when receiving light obtained from the damaged portion of the film.

[0009] In the device configured as described above, the distance from the search start point can always be recorded and confirmed. Therefore, the operator does not need to measure the distance from the starting point of searching for the film to the damaged part. In particular, when there are a plurality of damaged portions, the distance between each damaged portion can be accurately measured.

According to a third aspect of the present invention, in the capacitor failure location searching device according to the first or second aspect, the light source scans light from the point light source in the width direction of the extracted film. It is characterized by including scanning means for irradiating the film.

In the apparatus constructed as described above, by adjusting the distance between the scanning means, for example, the prism and the film surface, the irradiation light of the point light source is uniformly applied to the film surface in accordance with various film widths. Therefore, only one light source is required even when the film width is wide.

According to a fourth aspect of the present invention, there is provided an apparatus for searching for a failure location of a capacitor, comprising: means for separately winding a plus electrode film and a minus electrode film from a winding structure having a film as a dielectric; A means for measuring an impedance value between the plus electrode film and the minus electrode film wound by the means while winding the same; and a means for identifying a defective portion of the film from a change in the impedance value measured by the means. It is characterized by having.

In the apparatus configured as described above, the impedance value, for example, the resistance value or the capacitance value of the capacitor is measured while the film is being wound, and the correlation between the length of the film and the impedance value or the amount of change in the impedance value is measured. Defective parts can be specified.

[0014]

Embodiments of the present invention will be described below in detail with reference to the drawings. In the following drawings, the same symbols indicate the same or corresponding parts.

(First Embodiment) FIG. 1 is a block diagram showing a first embodiment of a capacitor failure point searching device according to the present invention.

In FIG. 1, a capacitor element is fixed to a roller 1, and a film 10 of the capacitor element is fixed to a winding roller 3 via a relay roller 7. The film is fed from the roller 1 by the rotation of the feed roller 2 driven by the motor 6. The film unwound from the roller 1 is sent to the relay roller 7 and finally wound up by the winding roller 3, and in the middle thereof, a light source 4 composed of, for example, a sodium lamp or a mercury lamp, and a CCD sensor of the light receiving unit 5. Is provided.

The light emitted from the light source 4 is a prism (FIG. 1)
When the film running under the light source 4 has a damaged portion, light is transmitted therefrom and received by the light receiving unit 5. When the light receiving unit 5 receives the light transmitted through the damaged portion, the control unit 8 transmits a stop signal to the motor 6 to stop the rotation of the feed roller 2. Thereby, winding of the film is stopped at the damaged portion of the film, so that the damaged portion can be reliably found in a short time. Then, by measuring the distance from the search start point of the film to the damaged portion thus found, the damaged portion can be identified. Further, by performing such a search continuously, a plurality of damaged portions can be found and identified.

(Second Embodiment) Next, as a second embodiment of the capacitor failure point searching apparatus according to the present invention,
A case will be described in which the distance from the search start point of the film to the damaged point is measured.

FIG. 2 is a block diagram showing a configuration of a main part in the second embodiment. In the second embodiment, as shown in FIG. 2, as in the first embodiment, the film is wound around the winding roller 3 by rotation of the feeding roller 2. A running sensor 11 for measuring the number of rotations of the roller is installed in the unit 2, and has a function of measuring and displaying the distance of the running film. When the light receiving unit 5 receives the light transmitted through the damaged portion, the data measured by the travel sensor 11 is sent to the control unit 8, and the control unit 8 stores the received data and displays the data on the CRT 13. Thus, the distance from the search start point can always be confirmed, so that the operator does not need to measure the distance from the film search start point to the damaged point every time a damaged point is found.

(Third Embodiment) Next, as a third embodiment of the capacitor failure point searching apparatus according to the present invention,
The specific configuration of the light source for irradiating the film will be described.

FIG. 3 is a block diagram showing a configuration of a light source according to a third embodiment. In FIG. 3, a light source 4 includes a sodium lamp, a mercury lamp, or the like, and light emitted from the light source is applied to a film 10 through a prism 9.
Light is transmitted through the damaged portion of the film 10 and received by the CCD sensor of the light receiving section 5.

The light amount of the light source 4 can be changed by the light amount adjusting section 4A, and the color of the light can be arbitrarily selected by the color selecting section 4B. Thereby, the optimum light can be adjusted according to the width, thickness, and color of the film, so that the accuracy of searching for a damaged portion is improved.

For example, the thicker the film, the greater the amount of light,
Regarding the color, for example, when the film is a silver-based metal color, the light source may be orange, which is the opposite color.
In addition, since the irradiation light from the point light source is scanned in the width direction of the film 10 by rotating the prism 9, by adjusting the distance between the prism 9 and the surface of the film 10,
Irradiation light from a point light source can be uniformly applied to the surface of the film 10 in accordance with various film widths. Even if the film width is wide, one light source is sufficient.

(Fourth Embodiment) Next, a description will be given of a fourth embodiment of the apparatus for searching for a failure location of a capacitor according to the present invention.

In the fourth embodiment, as shown in FIG. 4, a camera 14 is attached so that a damaged portion can be observed. The light emitted from the light source 4 is applied to the film 10 through the prism 9. Film 10
If there is a damaged part in the light receiving part 5
The light is received by the CCD sensor.

A camera 14 is provided at a predetermined distance from the CCD sensor of the light receiving section 5. Camera 14
Is located opposite to the light source 4 and the film 10, the transmitted light is detected as a damaged portion. However, when the camera 14 and the light source 4 are at the same position with respect to the film 10, the dark portion of the image is The light incident on the camera 14, which is a damaged portion, is reflected light of the film 10.

When a damaged portion is detected by the CCD sensor of the light receiving portion 5, the damaged portion is photographed by the camera 14, the image is processed by the control portion 8, and is output to the CRT 13 of the output device.
The control unit 8 can calculate the number of pixels of the received image to measure the area of the damaged portion, that is, the size of the damaged portion, and can also determine the shape of the damaged portion by performing image processing. The measurement accuracy is improved as compared with the case of. In addition, by projecting the damaged portion on the CRT 13 of the output device, observation can be easily performed, and discoloration of the film around the damaged portion can be observed.

(Fifth Embodiment) Next, a description will be given of a fifth embodiment of the capacitor failure point searching apparatus according to the present invention.

FIG. 5 is a block diagram showing a configuration of a main part in the fifth embodiment. In the fifth embodiment, as shown in FIG. 5, a structure in which the positive electrode film 10A and the negative electrode film 10B are separately wound up by a winding roller 3A and a winding roller 3B is provided. The resistance between the electrode film 10A and the negative electrode film 10B of the winding roller 3B is measured by the measuring device 12. The data measured by the measuring device 12 is sent to the control unit 8, and the control unit 8 stores the measured values and displays them on the CRT 13 of the output device. Thereby, the resistance value of the capacitor element is measured while the film is being wound up, so that a portion having insulation failure can be automatically found from the correlation between the film length and the resistance value.

FIG. 6 shows the relationship between the film length L and the resistance value R in this case. In the case where the film has no damage holes, the resistance value measured by the measuring device 12 increases as indicated by a dotted line as the film is wound by the winding roller 3A and the winding roller 3B. However, when there is a defective portion such as a damaged hole in the film, the insulation is defective at that portion, and the resistance value is lower than that in a normal case. The resistance value measured by is as shown by the solid line. In other words, the resistance value between the winding roller 3A and the winding roller 3B from the start of winding to the first defective point L1 is lower than that in the normal case by the reduction in resistance value due to the two defective points. The first portion L1 of the defective portion is a positive electrode film 10A and a negative electrode film 10A.
B, the resistance value measured by the measuring instrument 12 is no longer affected by the decrease in resistance value due to the damaged hole at the first defective location L1, and the resistance value due to the damaged hole at the second defective location L2. It changes at a reduced value only by the decrease of. When the winding is further advanced and the second defective portion L2 is separated into the positive electrode film 10A and the negative electrode film 10B, the resistance value measured by the measuring device 12 depends on the damaged hole of the second defective portion L2. It is no longer affected by a decrease in the resistance value, and changes in the same manner as in a normal case. in this way,
Since the resistance value changes steeply at the first location L1 and the second location L2 of the defective location, a defective location such as a damaged hole can be identified by detecting that the resistance value has changed irregularly. .

In the case of a capacitor having an electrolyte therein, as shown in FIG. 7, the resistance value is high at a defective portion such as an evaporating portion of the electrolyte or a defective portion due to poor penetration. The resistance value measured by the measuring device 12 changes at a value indicated by a solid line higher than a normal case indicated by a dotted line.
Since the resistance value changes irregularly at the location L2, a defective location can be identified by detecting this.

(Sixth Embodiment) Next, a description will be given of a sixth embodiment of the capacitor failure point searching apparatus according to the present invention.

The configuration of the sixth embodiment is the same as that of the fifth embodiment shown in FIG. 5, but instead of measuring the resistance value as in the fifth embodiment, the winding roller 3A Positive electrode film 10A and winding roller 3
The capacitance value between the negative electrode films 10B of B is measured by the measuring device 12.

That is, in this embodiment, by measuring the capacitance value of the capacitor element while winding the film, a defective portion such as a damaged hole can be specified from the correlation between the film length and the capacitance value. Further, in a capacitor having an electrolytic solution inside, a defective portion such as a defective portion due to an evaporating portion or a poor penetration of the electrolytic solution can be specified.

FIG. 8 shows the relationship between the film length L and the capacitance value C in this case. In either case where there is a defective portion such as a damaged hole, or where there is a defective portion such as a defective portion due to an evaporating portion or poor penetration of the electrolyte, as shown in FIG. Therefore, the capacitance value measured by the measuring device 12 while being wound changes with a value indicated by a solid line lower than a normal case indicated by a dotted line, but also in this case, the first and second defective portions L3 and L4 , The capacitance changes irregularly, and by detecting this, the defective portion can be identified.

[0036]

As described above, according to the capacitor failure location searching apparatus of the present invention, it is possible to automatically search for a defective location such as a damaged portion of a film, and to find it reliably in a short time. Can be.

[Brief description of the drawings]

FIG. 1 is a block diagram showing a configuration of a first embodiment of the present invention.

FIG. 2 is a block diagram showing a configuration of a main part according to a second embodiment of the present invention.

FIG. 3 is a block diagram showing a configuration of a third embodiment of the present invention.

FIG. 4 is a block diagram showing a configuration of a fourth embodiment of the present invention.

FIG. 5 is a block diagram showing a configuration of a main part in fifth and sixth embodiments of the present invention.

FIG. 6 is a diagram showing a change in resistance value when measuring a resistance value between both electrodes while separately winding a plus electrode film and a minus electrode film in the fifth embodiment of the present invention.

FIG. 7 shows a fifth embodiment of the present invention in which a positive electrode film and a negative electrode film of a capacitor having an electrolytic solution therein are separately wound and wound while measuring the resistance value between both electrodes. The figure which shows a change.

FIG. 8 is a diagram showing a change in capacitance value when measuring a capacitance value between both electrodes while winding a plus electrode and a minus electrode of a film separately in a sixth embodiment of the present invention.

[Explanation of symbols]

 DESCRIPTION OF SYMBOLS 1 ... Roller 2 ... Feeding roller 3 ... Winding roller 4 ... Light source 5 ... Light-receiving part 6 ... Motor 7 ... Relay roller 8 ... Control part 9 ... Prism 10 ... Film 11 ... Running sensor 12 ... Measuring instrument 13 ... CRT 14 ... Camera 2A: feed roller (for plus electrode film) 2B: feed roller (for minus electrode film) 3A: take-up roller (for plus electrode film) 3B ... take-up roller (for minus electrode film) 4A: light intensity control unit 4B: color Selector 10A: plus electrode film 10B: minus electrode film

 ──────────────────────────────────────────────────続 き Continued on the front page F term (reference) 2G051 AA41 AA90 AB02 BA20 BB20 BC06 CA03 CB02 DA01 DA06 EA11 EB01 ED09 5E082 FG06 MM04 MM32 MM35 PP01

Claims (4)

[Claims] 1. A means for extracting a film from a winding capacitor having a film as a dielectric, a light source for irradiating the film drawn by this means with light, and a light source for irradiating the film out of the light irradiated by the light source. An apparatus for searching for a fault location of a capacitor, comprising: a light receiving unit that receives light obtained from a damaged portion; and a unit that recognizes a damaged portion of the film based on an output of the light receiving unit. 2. A roller for pulling out a film from a winding capacitor having a film as a dielectric, a measuring means for measuring the length of the running film from the number of rotations of the roller, and A light source that irradiates light, a light receiving unit that receives light obtained from a damaged portion of the film out of light irradiated by the light source, and a light receiving unit that receives light obtained from the damaged portion of the film by the light receiving unit. Means for identifying a position of a damaged portion of the film from a measurement value of the measuring means. 3. The light source according to claim 1, wherein the light source includes a scanning unit that scans light from a point light source in a width direction of the extracted film and irradiates the film with the light. Locating device for capacitor failure. 4. A means for separately winding a plus electrode film and a minus electrode film from a winding structure capacitor having a film as a dielectric, and a means for winding the plus electrode film and the minus electrode film wound by this means. An apparatus for searching for a failure point of a capacitor, comprising: means for measuring an impedance value while winding the same; and means for identifying a defective part of the film from a change in the impedance value measured by the means.