JP2000097884A - Fluorescence x-ray analyzer - Google Patents

Abstract

PROBLEM TO BE SOLVED: To easily and properly conduct determination for an upper limit value and a lower limit value of a wave height selected by a wave height analyzer, in a wavelength dispersion type fluorescence X-ray analyzer. SOLUTION: This analyzer is provided at least with a memory means 15 for storing energy of each fluorescent X-ray 7, an escape peak generated probably in a detector 8, the X-ray 7 generated in a spectrograph 6 as data, an operation means 11 for identifying a peak in a differential curve indicating a counting rate with respect to a voltage of a pulse generated in the detector 8 based on the data stored in the memory means 15, and a display means 16 for displaying an identified result of the peak in the differential curve by the operation means 11.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a so-called wavelength-dispersive X-ray fluorescence spectrometer, which can easily and appropriately determine the upper and lower limits of the wave height to be selected by a wave height analyzer. is there.

[0002]

2. Description of the Related Art Conventionally, in a wavelength-dispersive X-ray fluorescence analysis, a sample is irradiated with primary X-rays from an X-ray source such as an X-ray tube, and the X-ray fluorescence generated from the sample is separated by a spectroscope. Then, the detected fluorescent X-rays are detected by a detector to generate a pulse. The voltage of the pulse, that is, the peak value, is based on the energy of the fluorescent X-ray, and the number per unit time is based on the intensity of the fluorescent X-ray. Sorting is performed by a wave height analyzer, and the counting rate (the number of pulses per unit time) is obtained by a counting means such as a rate meter or a scaler.

Here, when a difference between an upper limit value and a lower limit value of a wave height selected by a wave height analyzer, that is, a window is set narrow and a lower limit value is scanned, a so-called differential curve is obtained. The differential curve shows the counting rate for the peak value of the pulse generated by the detector. In the vicinity of the fluorescent X-ray to be analyzed, a higher-order line of another fluorescent X-ray or its escape peak, a spectrometer Fluorescent X-rays and the like generated from the light can also appear. Desired fluorescent X
In order to perform accurate quantitative analysis using a line, it is necessary to appropriately determine the upper limit and the lower limit of the wave height to be selected by the wave height analyzer so as not to count the higher-order lines of other fluorescent X-rays. Therefore, conventionally, the operator identifies whether the peak in the differential curve is that of the fluorescent X-ray to be analyzed or that of a higher-order fluorescent X-ray, and determines the upper and lower limits of the wave height. Was decided.

[0004]

However, such identification requires a high degree of knowledge about X-rays, and accurate identification is not always easy for ordinary operators. Therefore, it is not easy to appropriately determine the upper and lower limits of the wave height.

SUMMARY OF THE INVENTION The present invention has been made in view of the above-mentioned conventional problems. In a wavelength-dispersive X-ray fluorescence spectrometer, it is easy and appropriate to determine an upper limit value and a lower limit value of a wave height to be selected by a wave height analyzer. It is an object of the present invention to provide a device which can be used.

[0006]

To achieve the above object, an X-ray fluorescence spectrometer according to claim 1 comprises a sample stage on which a sample is fixed and an X-ray for irradiating the sample with primary X-rays. Source
A spectroscope that disperses the fluorescent X-rays generated from the sample, and a detector that receives the fluorescent X-rays separated by the spectrometer and generates a number of voltage pulses corresponding to the energy of the fluorescent X-rays according to the intensity And a pulse height analyzer for selecting pulses in a predetermined voltage range among the pulses generated by the detector, and counting means for determining a counting rate of the pulses selected by the pulse height analyzer.

Further, this apparatus is provided with the following storage means, calculation means, and display means. The storage unit stores at least the energy of each fluorescent X-ray, an escape peak that can be generated by the detector, and the fluorescent X-ray generated by the spectroscope. The calculating means identifies a peak in a differential curve indicating a count rate with respect to a voltage of a pulse generated by the detector based on data stored in the storage means. The display means displays the result of peak identification in the differential curve by the calculation means.

According to the first aspect of the present invention, the calculating means identifies peaks in the differential curve based on data such as the energy of each fluorescent X-ray stored in the storage means, and the display means displays the identification result. Since the display is performed, the operator can easily and appropriately determine the upper limit and the lower limit of the crest to be selected by the crest analyzer based on the differential curve in which the peak is identified.

The X-ray fluorescence spectrometer according to the second aspect is the first aspect of the invention.
In the apparatus described above, the storage means further stores, as data, a result of a qualitative analysis performed in advance for elements other than the element that generates fluorescent X-rays to be analyzed.
According to the apparatus of claim 2, since the result of the so-called all-element qualitative analysis performed in advance is also considered in the identification by the arithmetic means, the identification becomes more accurate, and the determination of the upper limit value and the lower limit value of the wave height by the operator. Can also be performed more appropriately.

According to a third aspect of the present invention, there is provided an X-ray fluorescence spectrometer including a sample stage, an X-ray source, a spectroscope, a detector, a pulse height analyzer, and a counting means, as in the first embodiment. It has. Further, this device includes the following calculation means and display means. The calculating means is based on a differential curve indicating a counting rate for the voltage of the pulse generated by the detector,
A predetermined voltage range suitable for selecting pulses based on fluorescent X-rays to be analyzed in the wave height analyzer is determined. The display means displays an appropriate predetermined voltage range determined by the calculation means.

According to the third aspect of the present invention, the calculating means automatically determines the upper limit value and the lower limit value of the wave height to be selected by the wave height analyzer based on the differential curve, and the display means determines the upper limit value and the lower limit value. The value and lower limit are displayed so that the operator can
It is only necessary to judge or correct the displayed value, and it is particularly easy to determine appropriate upper and lower limits of the wave height.

According to a fourth aspect of the present invention, there is provided an X-ray fluorescence analyzer.
Or the apparatus of (2), wherein the calculating means further comprises a predetermined voltage suitable for selecting a pulse based on the fluorescent X-ray to be analyzed in the pulse height analyzer based on the differential curve in which the peak is identified. After determining the range, the display means further displays the appropriate predetermined voltage range determined by the calculation means. According to the device of claim 4,
Automatically, the calculating means determines an upper limit value and a lower limit value of the wave height to be selected by the wave height analyzer based on the differential curve in which the peak is identified, and the display means displays the upper limit value and the lower limit value. Therefore, as in the case of the apparatus of claim 3, the operator only needs to judge or correct the displayed value, and the peak is identified as in the case of the apparatus of claim 1 or 2. Since it is based on the differential curve, the upper limit value and the lower limit value of the wave height can be particularly easily and appropriately determined.

[0013]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An apparatus according to an embodiment of the present invention will be described below. First, the configuration of this device will be described with reference to FIG. In this apparatus, first, a sample table 2 on which a sample 1 is fixed, an X-ray source 4 such as an X-ray tube for irradiating the sample 1 with primary X-rays 3, and a sample 1 A spectroscope 6 for dispersing the fluorescent X-rays 5 and the fluorescent X-rays 7 separated by the spectroscope 6 are incident thereon, and generate voltage pulses corresponding to the energy of the fluorescent X-rays 7 by the number corresponding to the intensity. A detector 8; a pulse height analyzer 13 for selecting pulses within a predetermined voltage (wave height) from the pulses generated by the detector 8; and a counting device for determining a counting rate of the pulses selected by the pulse height analyzer 13. Means 14.

Further, there is provided a linking means 10 for linking the spectroscope 6 and the detector 8, that is, a so-called goniometer, so that the wavelength of the fluorescent X-ray 7 incident on the detector 8 changes. When the fluorescent X-rays 5 enter the spectroscope 6 at a certain incident angle θ, the extension line 9 of the fluorescent X-rays 5 and the fluorescent X-rays 7 spectrally (diffracted) by the spectroscope 6 are separated by twice the incident angle θ. Although the angle 2θ is formed, the interlocking means 10 changes the spectral angle 2θ to change the wavelength of the fluorescent X-rays 7 to be separated, and keeps the separated fluorescent X-rays 7 to be incident on the detector 8. , The spectrometer 6 is rotated about an axis O perpendicular to the plane of the paper passing through the center of its surface, and the detector 8 is rotated about the axis O along the circle 12 by twice the rotation angle. In the interlocking means 10, the incident angle θ and the spectral angle 2θ formed as a result of the rotation of the spectroscope 6 and the detector 8 are confirmed by, for example, a potentiometer attached to the axis O.

Further, this apparatus has the following storage means 1
5, operation means 11 and display means 16. The storage means 15 stores the energy of each fluorescent X-ray 7 and the detector 8
The escape peak that can be generated in the above, the fluorescent X-rays 7 generated from the spectroscope 6, and the results of the qualitative analysis performed in advance for elements other than the elements that generate the fluorescent X-rays to be analyzed. To be stored. The calculating means 11 identifies a peak in a differential curve indicating a counting rate with respect to a voltage of a pulse generated by the detector 8 based on the data stored in the storage means 15, and further,
Based on the differential curve whose peak is identified, a predetermined voltage range suitable for selecting a pulse based on the fluorescent X-rays 7 to be analyzed in the pulse height analyzer 13 is determined. The display means 16 displays the result of identification of the peak in the differential curve by the calculating means 11, and further displays an appropriate predetermined voltage range determined by the calculating means 11.

Next, the operation of this apparatus will be described by taking as an example a case in which it is analyzed whether or not phosphorus P is contained in the sample 1 as cement. First, in advance, the energy of each fluorescent X-ray 7 is stored in the storage unit 15 of this device.
An escape peak that can be generated by the detector 8 and a fluorescent X-ray 7 that is generated by exciting an element included in the spectroscope 6 are stored as data.

The energy of each fluorescent X-ray 7 is, for example,
P-K [alpha line 2.01keV, 4.01 of Ca -Kβ ₁ wire
The energy of each fluorescent X-ray 7 such as keV. The escape peak that can be generated in the detector 8 is, for example, an Ar-K absorption edge energy (3 if the detector 8 is an F-PC using P-10 gas (Ar gas 10%) as a detection gas. X-ray fluorescence 7 having an energy higher than .20 keV)
Can be generated when the fluorescent X-rays 7
From the energy of the Ar-Kα ray (2.96
keV) refers to the peak from which, for example, Ca-Kβ
The escape peak of _one line is 4.01-2.96 = 1.
It is 05 keV. The fluorescent X-rays 7 generated by exciting the elements included in the spectroscope 6 are, for example, T
It refers to Tl-Mα radiation generated when AP is used.

A so-called all-element qualitative analysis is performed on the sample 1 to be analyzed in advance. That is, the sample 1 is fixed to the sample stage 2, the primary X-ray 3 is irradiated from the X-ray source 4, the generated fluorescent X-ray 5 is separated by the spectroscope 6, and the intensity is detected by the detector 8 and the wave height analysis. It is measured by the measuring device 13 and the counting means 14. Here, the spectroscope 6 and the detector 8 are continuously linked by the linking means 10 so that the fluorescence X generated from the sample 1 is changed.
The line 5 is separated into respective wavelengths and detected. Thus, similarly to the conventional scan-type X-ray fluorescence spectrometer, based on the signal related to the spectral angle 2θ from the interlocking unit 10 and the signal related to the intensity of the fluorescent X-ray 7 from the detector 8, at each spectral angle 2θ, A spectrum indicating the intensity of the fluorescent X-ray 7 is obtained, and peak search and identification analysis are performed. And
The result of the qualitative analysis including elements other than the element P that generates the fluorescent X-ray P-Kα ray to be analyzed is stored in the storage unit 15 as data.

At the spectral angle 2θ corresponding to the P-Kα ray to be analyzed, the difference between the upper limit value and the lower limit value of the wave height selected by the wave height analyzer 13, that is, the so-called window is set narrow, and the lower limit value is scanned. Then, a differential curve as shown in FIG. 2 is obtained. In this differential curve, three peaks appear,
On the other hand, the calculating means 11 identifies each peak based on the data stored in the storage means 15 as follows.

First, by the action of the interlocking means 10, one of the fluorescent X-rays 7 corresponding to the spectral angle 2.theta.
Since the peak of the next line always appears at the same peak value, in the case of FIG. 2, it is identified that the central peak is the P-Kα line. It may be more strictly identified as P-Kα radiation + background. Since the peak value is proportional to the energy of the X-ray, the energy is 2.01 keV at the peak value.
The peak on the right, which appears at twice the position of the P-Kα ray, is a Ca − energy having an energy of 2.01 × 2 ≒ 4.01 keV.
Identifying that the Kbeta ₁ line. Here, if Ca-Kα rays appear in the result of the all-element qualitative analysis performed in advance, the identification becomes more accurate.

Further, in this device, the detector 8 is provided with the F
Since using -PC, since the escape peak of 1.05keV may occur from Ca -Kβ ₁ line of 4.01KeV, in peak value, the peak of the left appearing at a position corresponding to 1.05keV is, Ca identifying that an escape peak of -Keibeta ₁ line. In FIG. 2, for simplicity, the scale of the peak value is the corresponding energy value itself. In addition, it is assumed that no fluorescent X-ray including a higher-order line is generated from the PET crystal used in the spectroscope 6 of the present apparatus, such that the fluorescent X-ray is near the P-Kα line in wavelength.

Next, based on the differential curve whose peak has been identified as described above, the calculating means 11 determines a predetermined voltage suitable for selecting a pulse based on the P-Kα line to be analyzed in the peak height analyzer 13. , Ie, the upper and lower limits of the wave height. Specifically, in FIG. 2, as right and Ca -Kβ ₁ line and its escape peak appearing in the left P-K [alpha line to be analyzed is not as much as possible the counting, Ca -
The lower limit X-ray intensity between the peaks of the escape peak and P-K [alpha line Kbeta ₁ line is searching for peak value takes the minimum value, the peak of the peak and Ca -Kβ ₁ line of P-K [alpha line A peak value at which the X-ray intensity takes the minimum value is searched for as the upper limit value.

The display means 16 displays the result of the peak identification in the differential curve by the arithmetic means 11 and the appropriate upper and lower limits of the wave height determined by the arithmetic means 11, for example, in a format as shown in FIG. To display. If the appropriate upper and lower limits of the wave height are set in the wave height analyzer 13 and qualitative analysis is performed, only the P-Kα line appears as shown in the lower part of FIG. Therefore, if the measurement of the P-Kα ray is performed using the upper and lower limits, Ca-K
The effect of β ₁ radiation can be reduced, and more accurate quantitative analysis becomes possible. In contrast, as a conventional so tend, for example, improperly setting a small lower limit value, the escape peak of the Ca -Kβ ₁ line is also counted, performing qualitative analysis, as shown in the upper part of FIG. 3 And PK
immediately to the right of the α rays (6.16Å), overlap profile, Ca -Kβ ₁ line (3.09Å) appears as a secondary line. Therefore, when the P-Kα ray is measured, the escape of the Ca-Kβ ₁ ray is also counted, and accurate quantitative analysis using the P-Kα ray cannot be performed.

Thus, according to the apparatus of the present embodiment,
The calculating means 11 automatically determines the upper and lower limits of the wave height to be selected by the wave height analyzer 13 based on the differential curve whose peak has been identified, and the display means 16 determines the upper and lower limits. Is displayed, the operator only needs to judge or correct the displayed value, and furthermore, since the value is based on the differential curve whose peak is identified, the upper and lower limits of the wave height are displayed. Can be determined particularly easily and appropriately.

As described above, in general, due to the action of the interlocking means, the peak of the primary line of the fluorescent X-ray corresponding to the spectral angle always appears at the same predetermined peak value in the differential curve. Even if the calculating means does not identify a peak in the differential curve, X and X on the left and right of the peak appearing at the predetermined peak value can be determined based on the shape of the differential curve.
The peak value at which the line intensity takes the minimum value is searched, and the peak value can be determined as the lower limit value and the upper limit value, respectively.

[0026]

As described above in detail, according to the present invention, in the wavelength-dispersive X-ray fluorescence spectrometer, it is easy to determine the upper and lower limits of the wave height to be selected by the wave height analyzer. Appropriately, so that quantitative analysis can be performed easily and accurately.

[Brief description of the drawings]

FIG. 1 is a schematic diagram showing an X-ray fluorescence analyzer according to one embodiment of the present invention.

FIG. 2 is a diagram showing an example of a differential curve obtained by the same device.

FIG. 3 is a diagram showing an example of spectra obtained by the same device and a conventional device.

[Explanation of symbols]

DESCRIPTION OF SYMBOLS 1 ... sample, 2 ... sample stage, 3 ... primary X-ray, 4 ... X-ray source, 5
... X-ray fluorescence generated from the sample, 6 ... Spectroscope, 7 ... X-ray fluorescence separated by the spectroscope, 8 ... Detector, 11 ... Calculation means,
13: height analyzer, 14: counting means, 15: storage means,
16 Display means.

 ──────────────────────────────────────────────────続 き Continuing on the front page (72) Inventor Eiichi Furusawa 14-8 Akaoji-cho, Takatsuki-shi, Osaka Prefecture Inside Rigaku Denki Kogyo Co., Ltd. No. F-term in Rigaku Denki Kogyo Co., Ltd. (reference) 2G001 AA01 BA04 CA01 DA01 EA02 EA03 EA20 FA01 FA06 FA19 FA21 GA01 GA09 JA05 KA01 LA03 NA07

Claims (4)

[Claims] 1. A sample stage on which a sample is fixed, an X-ray source for irradiating the sample with primary X-rays, a spectroscope for dispersing fluorescent X-rays generated from the sample, and fluorescence separated by the spectroscope. A detector that receives X-rays and generates pulses of a voltage corresponding to the energy of the fluorescent X-rays in a number corresponding to the intensity, and a wave height for selecting pulses within a predetermined voltage range among the pulses generated by the detector. An X-ray fluorescence analyzer, comprising: an analyzer; and counting means for determining a counting rate of the pulses selected by the wave height analyzer, wherein at least the energy of each fluorescent X-ray and an escape peak that can be generated by the detector And storage means for storing, as data, fluorescent X-rays generated from the spectroscope; and a differential curve indicating a counting rate for a voltage of a pulse generated by the detector based on the data stored in the storage means. Fluorescent X, wherein the calculating means of identifying over click, further comprising a display means for displaying the identification results of the peak in the derivative curve by the computing means
Line analyzer. 2. The X-ray fluorescence analyzer according to claim 1, wherein the storage unit further stores, as data, a result of a qualitative analysis performed in advance for an element other than an element that generates X-ray fluorescence to be analyzed. . 3. A sample stage on which a sample is fixed, an X-ray source for irradiating the sample with primary X-rays, a spectroscope for dispersing fluorescent X-rays generated from the sample, and fluorescence separated by the spectroscope. A detector that receives X-rays and generates pulses of a voltage corresponding to the energy of the fluorescent X-rays in a number corresponding to the intensity, and a wave height for selecting pulses within a predetermined voltage range among the pulses generated by the detector. An X-ray fluorescence analyzer, comprising: an analyzer; and counting means for determining a counting rate of the pulses selected by the pulse height analyzer, based on a differential curve indicating a counting rate with respect to a voltage of a pulse generated by the detector. Calculating means for determining a predetermined voltage range suitable for selecting pulses based on fluorescent X-rays to be analyzed in the pulse height analyzer; and displaying an appropriate predetermined voltage range determined by the calculating means. Display means and Fluorescent X, characterized in that it comprises
Line analyzer. 4. The method according to claim 1, wherein the calculating means further selects a pulse based on a fluorescent X-ray to be analyzed in the pulse height analyzer based on a differential curve in which the peak is identified. An X-ray fluorescence spectrometer that determines an appropriate predetermined voltage range, and wherein the display unit further displays the appropriate predetermined voltage range determined by the calculation unit.