JP2000080469A - Ito sputtering target material - Google Patents

Ito sputtering target material

Info

Publication number
JP2000080469A
JP2000080469A JP11163949A JP16394999A JP2000080469A JP 2000080469 A JP2000080469 A JP 2000080469A JP 11163949 A JP11163949 A JP 11163949A JP 16394999 A JP16394999 A JP 16394999A JP 2000080469 A JP2000080469 A JP 2000080469A
Authority
JP
Japan
Prior art keywords
ito
raw material
sintering
sintered body
powder
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11163949A
Other languages
Japanese (ja)
Inventor
Mitsuteru Toishi
光輝 戸石
Koichiro Ejima
光一郎 江島
Hiroaki Urano
広明 浦野
Masako Tanaka
理子 田中
Masaharu Abe
正春 阿部
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dowa Holdings Co Ltd
Original Assignee
Dowa Mining Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dowa Mining Co Ltd filed Critical Dowa Mining Co Ltd
Priority to JP11163949A priority Critical patent/JP2000080469A/en
Publication of JP2000080469A publication Critical patent/JP2000080469A/en
Pending legal-status Critical Current

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  • Physical Vapour Deposition (AREA)

Abstract

PROBLEM TO BE SOLVED: To obtain a target material for a transparent conductive film of high performance composed of ITO of high density under the ordinary compacting and sintering conditions of ceramics by using ITO contg. a specified amt. of indium oxide having specified surface arer value as the raw material to form a sintered body. SOLUTION: A target obtd. by executing sintering using ITO as the raw material is subjected to sputtering to form a transparent conductive film. As to IN2O3 in this sintering raw material, the specific surface area value is controlled to >=20 m2/g, preferably to 20 to 60 m2/g, most preferably to 20 to 40 m2/g, the average crystal particle size is limited to an ultrafine range of about 0.01 to 0.05 μm, and, it is used by 85 to 95 wt% in the whole raw material. This raw material powder composed of In2O3 and SnO2 is subjected to compacting and sintering in such a manner that the cold compacting pressure is 1 to 3 ton/cm2, and the sintering temp. in the atmosphere is 1,450 to 1,600 deg.C to obtain an ITO sputtering target material composed of the sintered body having >=83.5%, preferably 83.5 to 95% relative density.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、透明導電膜形成用
の高密度ITO(錫を含有する酸化インジウムのこと
で、Indium-Tin-Oxideの略称)スパッタリングターゲッ
ト材に関するものである。
[0001] 1. Field of the Invention [0002] The present invention relates to a high-density ITO (indium oxide containing tin, abbreviated as Indium-Tin-Oxide) sputtering target material for forming a transparent conductive film.

【0002】[0002]

【従来の技術】薄膜技術の発達に伴ない、表示素子分野
などでは透明導電膜が太陽電池や液晶ディスプレイ等に
利用されて来ており、その中でも酸化インジウムおよび
酸化錫からなるIn23・SnO2(ITO)膜は光透
過性や導電性等の特性を有することから、酸化物系透明
導電膜として広範囲に利用されている。
2. Description of the Related Art With the development of thin film technology, transparent conductive films have been used for solar cells, liquid crystal displays and the like in the field of display devices and the like. Among them, In 2 O 3. Since the SnO 2 (ITO) film has characteristics such as light transmittance and conductivity, it is widely used as an oxide-based transparent conductive film.

【0003】ITOからなる透明導電膜の作製法として
は、塗布法,CVD法,真空蒸着法,電子ビーム蒸着
法,インジウム−錫メタルターゲットを用いた反応性ス
パッタ法,およびITOターゲットを用いたスパッタリ
ング法等が提案されているが、このうちITOターゲッ
トを用いたスパッタリング法が主流となっているのが現
状である。
As a method for producing a transparent conductive film made of ITO, there are a coating method, a CVD method, a vacuum evaporation method, an electron beam evaporation method, a reactive sputtering method using an indium-tin metal target, and a sputtering method using an ITO target. Methods and the like have been proposed, and among them, the sputtering method using an ITO target is currently the mainstream.

【0004】このITOターゲットの成形方法として
は、下記の諸法が提案されているが、未だ多くの解決す
べき問題点がある。 イ)熱間加圧成形法:(特開昭61−55811号公報
参照) この方法はIn23とSnO2の粉末材料を高温高圧
(1ton/cm2で1×103℃程度以上)で圧搾して板状成
形体を作製するため、簡単に高密度化できるが、装置及
び型が極めて高価となり、生産性も1〜10枚/1〜2
日程度と悪いので極めて高価なターゲットとなる。
The following methods have been proposed as a method of forming the ITO target, but there are still many problems to be solved. A) Hot pressing method: (See Japanese Patent Application Laid-Open No. 61-55811) In this method, the powder material of In 2 O 3 and SnO 2 is heated to a high temperature and a high pressure (about 1 × 10 3 ° C. at 1 ton / cm 2 ). Squeezing to produce a plate-like molded body, so that the density can be easily increased, but the equipment and the mold become extremely expensive, and the productivity is also 1 to 10 sheets / 1-2.
It is a very expensive target because it is as bad as a day.

【0005】ロ)冷間静水圧プレス法:(特開平1−2
90551号公報参照) ITO粉末をバインダーと共に金型に装入し、加圧して
予備成形体を作り、該予備成形体を脱脂後5ton/cm2
度で再プレスした後、焼成する方法であるため、製造工
程が極めて複雑で多工程を必要とする上、更に高圧処理
を必要とするので技術的,経済的に問題があり、実用的
でない。
[0005] b) Cold isostatic pressing method:
This is a method in which an ITO powder is charged into a mold together with a binder, pressurized to form a preform, and the preform is degreased, repressed at about 5 ton / cm 2 , and then fired. In addition, the manufacturing process is extremely complicated, requires many steps, and further requires high-pressure treatment, which is technically and economically problematic and impractical.

【0006】ハ)鋳込み成形法:(特開平1−2905
50号公報参照) 酸化インジウム−酸化錫の成形体を泥漿鋳込み成型法に
より成形し、該成形体を焼成する方法であり、この方法
ではスラリーの流動特性の適正化を図ると粉の焼結性が
劣化するため、高密度化にはおのずから限界がある。
C) Cast molding method: (JP-A-1-2905)
No. 50) A method of molding a molded product of indium oxide-tin oxide by a slurry casting method and firing the molded product. In this method, if the flow characteristics of the slurry are optimized, the sinterability of the powder is reduced. However, there is a natural limit to achieving high density.

【0007】以上列記したようなITOターゲットの高
密度化を実現するために、熱間加圧成形法を用いたり、
3〜5ton/cm2の高圧で再プレスを行なったり、又は高
濃度のスラリーを型に流し込んで鋳込むことで、一応相
対密度70%以上の成形体が得られるが、上記のように
各方法とも解決すべき問題点が多い。
[0007] In order to realize the densification of the ITO targets listed above, a hot pressing method is used,
By re-pressing at a high pressure of 3 to 5 ton / cm 2 or by casting a high-concentration slurry into a mold and casting, a compact having a relative density of 70% or more can be obtained. There are many problems to be solved.

【0008】また、通常の冷間加圧成形法や常圧焼結法
では相対密度が60%程度であって高密度とはいえず、
所期の目的を達し得ないのである。
Further, the relative density is about 60% in a normal cold pressure molding method or a normal pressure sintering method, which cannot be said to be a high density.
It cannot achieve its intended purpose.

【0009】[0009]

【発明が解決しようとする課題】本発明は上記のような
状況に鑑み、冷間加圧成形法および常圧焼結法による高
密度ITOターゲット材について検討の結果、原料粉体
の比表面積値あるいは粉体を構成する平均結晶子径が目
的とする焼結体密度に著しく影響を及ぼすとの知見を
得、ITOターゲット製造時の原料粉(主原料である酸
化インジウム)の比表面積値(又は結晶子径)を微細粒
子範囲に限定することにより、特殊な高温高圧処理を行
なうことなく、通常のセラミックスの成形及び焼成条件
で得られる高密度のITOターゲット材を見出したので
ある。
SUMMARY OF THE INVENTION In view of the above situation, the present invention has examined the high-density ITO target material by the cold pressing method and the normal pressure sintering method, and Alternatively, it has been found that the average crystallite diameter constituting the powder has a significant effect on the target sintered body density, and the specific surface area value of the raw powder (indium oxide which is a main raw material) during the production of the ITO target (or By limiting the crystallite diameter to the range of fine particles, a high-density ITO target material obtained under ordinary ceramic forming and firing conditions without special high-temperature and high-pressure treatment was found.

【0010】[0010]

【課題を解決するための手段】即ち、本発明は、比表面
積値20m2/g以上の酸化インジウムを全原料中の85
〜95wt%使用してなる相対密度83.5%以上の焼結体か
らなるITOスパッタリングターゲット材に関するもの
である。次に、本発明のターゲット材を詳細に説明す
る。
That is, according to the present invention, indium oxide having a specific surface area value of 20 m 2 / g or more is contained in 85% of all raw materials.
The present invention relates to an ITO sputtering target material made of a sintered body having a relative density of 83.5% or more using up to 95% by weight. Next, the target material of the present invention will be described in detail.

【0011】本発明者等は上記の知見に基き、多くの試
作・実験を重ね、原料粉末である酸化インジウムの比表
面積を大きくすること、換言すれば原粉粉末の平均結晶
子径を超微細な粒子範囲に限定することにより、冷間成
形圧力:1〜3ton/cm2,焼成温度:大気中1450℃
を越える1600℃以下の温度の条件で成形・焼成する
ことにより、相対密度83.5%〜95%の焼結体が得られ
ることを見出したのである。
Based on the above findings, the present inventors have repeated many trials and experiments to increase the specific surface area of indium oxide as a raw material powder, in other words, to reduce the average crystallite diameter of the raw powder powder to ultra-fine. Cold forming pressure: 1 to 3 ton / cm 2 , firing temperature: 1450 ° C in air
It has been found that a sintered body having a relative density of 83.5% to 95% can be obtained by molding and firing at a temperature of 1600 ° C. or less, which exceeds 1600 ° C.

【0012】原料粉末の比表面積値としては、20m2/
g以上、好ましくは20〜60m2/gで、最も好ましくは
20〜40m2/gであり、この条件範囲の原料粉末であ
る酸化インジウムを使用することにより、相対密度の高
い焼結体が得られるのである。
The specific surface area of the raw material powder is 20 m 2 /
g or more, preferably 20 to 60 m 2 / g, most preferably 20 to 40 m 2 / g. By using indium oxide which is a raw material powder in this condition range, a sintered body having a high relative density can be obtained. It is done.

【0013】本発明で使用する酸化インジウム粉末とし
ては、比表面積値20m2/g以上、換言すれば平均結晶
子径として0.01〜0.05μmの範囲のものであれば、通常
の市販品の酸化インジウム粉と酸化錫粉末とを所定割合
に混合したもの、あるいは共沈法で製造した粉末でも差
支えなく、更に導電性および光透過性向上のために第三
成分を微量添加しても良い。
As the indium oxide powder used in the present invention, a commercially available indium oxide powder having a specific surface area of 20 m 2 / g or more, in other words, an average crystallite diameter in the range of 0.01 to 0.05 μm is used. A mixture of powder and tin oxide powder at a predetermined ratio or a powder produced by a coprecipitation method may be used, and a small amount of a third component may be added for improving conductivity and light transmittance.

【0014】酸化インジウムの配合比としては、原料全
体の85〜95wt%が相対密度83.5%以上の焼結体を得
るために必要である。
As for the compounding ratio of indium oxide, 85 to 95 wt% of the whole raw material is necessary to obtain a sintered body having a relative density of 83.5% or more.

【0015】次に、成形方法としては、金型を用いた冷
間加圧成形でも、ゴム型を用いた冷間静水圧成形法でも
良いが、原料粉末の比表面積値が20m2/g以上と大き
いため、スラリー化した時の粘性が高くなり、鋳込み成
形法は適切とはいえない。
Next, the molding method may be cold pressure molding using a mold or cold isostatic pressing using a rubber mold. The specific surface area of the raw material powder is 20 m 2 / g or more. Therefore, the viscosity of the slurry becomes high, and the casting method is not appropriate.

【0016】成形時の成形圧力としては、冷間成形圧力
1〜3ton/cm2で、更に焼結体の相対密度を90%以上
するためには1.5 ton/cm2以上が好ましいのである。成
形圧力が1ton/cm2未満の場合でも、一応所期の目的を
達成することができ、例えば成形圧力250Kg/cm2
焼結温度1500℃、焼結時間60分間の条件で製造し
た焼結体の相対密度は73%程度である。
Examples of the molding pressure in molding, cold-molding pressure 1~3ton / cm 2, in order to further the relative density of the sintered body 90% or more is the preferred 1.5 ton / cm 2 or more. Even if the molding pressure is less than 1 ton / cm 2 , the intended purpose can be achieved for a time, for example, the molding pressure is 250 kg / cm 2 ,
The relative density of the sintered body manufactured under the conditions of a sintering temperature of 1500 ° C. and a sintering time of 60 minutes is about 73%.

【0017】本発明は上記のように構成されてなり、比
表面積値20m2/g以上、好ましくは20〜60m2/g,
最も好ましくは20〜40m2/gの酸化インジウム粉末
を85〜95wt%と、酸化錫を5〜15wt%、その他不
可避不純物からなる原料粉末を使用し、冷間加圧成形法
で圧力1〜3ton/cm2で成形し、1450℃を越える温
度で常圧焼結法により焼結して製造された相対密度83.5
%以上の高密度ITOスパッタリング材である。
The present invention is constituted as described above, and has a specific surface area of 20 m 2 / g or more, preferably 20 to 60 m 2 / g,
Most preferably, a raw material powder consisting of 85 to 95 wt% of indium oxide powder of 20 to 40 m 2 / g, 5 to 15 wt% of tin oxide, and other unavoidable impurities is used, and a pressure of 1 to 3 tons is applied by a cold pressing method. / cm 2 , and sintered at atmospheric pressure sintering at a temperature exceeding 1450 ° C.
% Or more high-density ITO sputtering material.

【0018】上記の比表面積値20〜60m2/gの微粉
末は、透過型電子顕微鏡で精査の結果、一次粒子が0.01
〜0.05μmの範囲であり、この一次粒子を「結晶子」と
呼称した。即ち、平均結晶子径0.01〜0.05μm粉末が比
表面積20〜60m2/gの粉末に相当するのである。次
に、本発明を実施例により説明する。
The fine powder having a specific surface area of 20 to 60 m 2 / g was examined by a transmission electron microscope to find that the primary
The primary particles were referred to as “crystallites”. That is, a powder having an average crystallite diameter of 0.01 to 0.05 μm corresponds to a powder having a specific surface area of 20 to 60 m 2 / g. Next, the present invention will be described with reference to examples.

【0019】[0019]

【発明の実施の形態】実施例1 比表面積36m2/gの酸化インジウム微粉末190gと
酸化錫微粉末10gを採取し、この原料粉末に対して1
0wt%の水をバインダーとして添加し、メノウ製自動乳
鉢で5時間混合してITO粉を得た。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Example 1 190 g of indium oxide fine powder and 10 g of tin oxide fine powder having a specific surface area of 36 m 2 / g were collected.
0 wt% of water was added as a binder and mixed in an agate automatic mortar for 5 hours to obtain ITO powder.

【0020】このITO粉を目開き200μmの篩で造
粒した後、内径25.4mmφの金型に充填して約10gのペ
レットとし、1.5 ton/cm2で冷間加圧成形した後、15
00℃で1時間常圧焼成して焼結体を製造した。この焼
結体の相対密度は90.2%であった。
After the ITO powder is granulated with a sieve having an opening of 200 μm, it is filled into a mold having an inner diameter of 25.4 mmφ to form pellets of about 10 g, and subjected to cold pressure molding at 1.5 ton / cm 2 , and
It was fired at 00 ° C. for 1 hour under normal pressure to produce a sintered body. The relative density of this sintered body was 90.2%.

【0021】また、上記と同様の原料粉末を使用し、同
様の操作を行ない、加圧成形圧を3.0ton/cm2で成形した
後、1500℃で1時間常圧焼成して焼結体を製造し
た。その結果、焼結体の相対密度は94.5%であった。
The same operation is performed using the same raw material powder as described above, and the molded body is molded at a press molding pressure of 3.0 ton / cm 2 and fired at 1500 ° C. for 1 hour under normal pressure to obtain a sintered body. Manufactured. As a result, the relative density of the sintered body was 94.5%.

【0022】参考例 また、上記実施例と同様の原料粉末を使用して同様の操
作を行ない、加圧成形圧を0.25ton/cm2で成形した後、
1500℃で1時間常圧焼成して焼結体を製造した。そ
の結果、焼結体の相対密度は73.0%であった。
REFERENCE EXAMPLE Further, the same operation was performed using the same raw material powder as in the above-mentioned example, and after molding at a pressure molding pressure of 0.25 ton / cm 2 ,
It was fired at 1500 ° C. for 1 hour under normal pressure to produce a sintered body. As a result, the relative density of the sintered body was 73.0%.

【0023】実施例2 比表面積36m2/gの酸化インジウム3800gと酸化
錫微粉末200gを採取し、この原料粉末に対して10
wt%の水をバインダーとして添加し、実施例1と同様に
混合・造粒処理した後、150×450mmの金型に充填
し、1ton/cm2の圧力で冷間加圧成形した後、1500
℃で3時間常圧焼成して焼結体を製造した。この焼結体
の相対密度は84.0%であった。
EXAMPLE 2 3800 g of indium oxide having a specific surface area of 36 m 2 / g and 200 g of tin oxide fine powder were sampled.
After adding water by weight as a binder and mixing and granulating in the same manner as in Example 1, filling in a 150 × 450 mm mold, cold pressing at a pressure of 1 ton / cm 2 , and 1500
The sintered body was manufactured by baking at normal pressure for 3 hours at ℃. The relative density of this sintered body was 84.0%.

【0024】実施例3 比表面積55m2/gのインジウム微粉末190gと酸化
錫微粉末10gを採取し、この原料粉末に対して10wt
%の水をバインダーとして添加し、メノウ製自動乳鉢で
5時間混合し、ITO粉を得た。このITO粉を目開き
200μmの篩で裏ごしして造粒し、内径25.4mmφの金
型に約10g充填し、成形圧力1.5 ton/cm2で冷間成形
した後、1500℃で1時間常圧焼結して焼結体を製造
した。この焼結体の相対密度は83.5%であった。
Example 3 190 g of indium fine powder and 10 g of tin oxide fine powder having a specific surface area of 55 m 2 / g were collected, and 10 wt.
% Of water was added as a binder and mixed in an agate automatic mortar for 5 hours to obtain ITO powder. The ITO powder was sifted through a sieve having an opening of 200 μm, granulated, filled in a mold having an inner diameter of 25.4 mmφ with about 10 g, cold-formed at a molding pressure of 1.5 ton / cm 2 , and then subjected to normal pressure at 1500 ° C. for 1 hour. It was sintered to produce a sintered body. The relative density of this sintered body was 83.5%.

【0025】比較例1 比表面積6m2/gと8m2/gの酸化インジウム微粉末を各
準備し、各酸化インジウム微粉末に酸化錫微粉末を各5
wt%となるように配合し、更にバインダーとして水を各
10wt%となるように添加した後、実施例1と同様に各
配合原料粉をメノウ製自動乳鉢で5時間混合し、各IT
O粉を得た。
Comparative Example 1 Fine powders of indium oxide having specific surface areas of 6 m 2 / g and 8 m 2 / g were prepared, and fine powder of tin oxide was added to each fine powder of indium oxide.
wt.%, and water was added as a binder so as to be 10 wt.% each. Then, as in Example 1, each raw material powder was mixed in an agate automatic mortar for 5 hours.
O powder was obtained.

【0026】このITO粉を目開き200μmの篩で裏
ごしして造粒し、内径25.4mmφの金型にそれぞれ約10
g充填し、成形圧力1ton/cm2で冷間加圧成形した後、
1500℃で1時間常圧焼成して焼結体を製造した。
The ITO powder is sieved through a sieve having a mesh size of 200 μm, granulated, and placed in a mold having an inner diameter of 25.4 mmφ for about 10 minutes.
g and cold-press molding at a molding pressure of 1 ton / cm 2 ,
The resultant was fired at 1500 ° C. for 1 hour under normal pressure to produce a sintered body.

【0027】各焼結体の相対密度は、比表面積6m2/g
の酸化インジウムを主原料粉とした焼結体の相対密度は
56.3%であり、比表面積8m2/gの場合の相対密度は60.
1%であった。
The relative density of each sintered body is 6 m 2 / g specific surface area.
The relative density of the sintered body using indium oxide as the main raw material powder is
56.3%, and the relative density when the specific surface area is 8 m 2 / g is 60.
1%.

【0028】[0028]

【発明の効果】本発明法は上述したように、従来のよう
な特殊な高温・高圧処理や特殊で高価程装置を使用する
ことなく、通常のセラミックス製造プロセスと同様な簡
単な工程で、冷間成形圧力も低く、生産性も1時間当り
20〜30枚程度と高いので、低コストでの量産が可能
となる。
As described above, according to the method of the present invention, a simple process similar to a normal ceramics manufacturing process can be carried out without using a special high-temperature and high-pressure treatment or a special expensive device as in the prior art. Since the molding pressure is low and the productivity is as high as about 20 to 30 sheets per hour, mass production at low cost becomes possible.

【0029】また、本発明によれば、常圧焼結法で従来
法では達成できなかった高密度の透明導電膜スパッタリ
ングターゲット材が実現できたのである。
Further, according to the present invention, a high-density transparent conductive film sputtering target material that could not be achieved by the conventional method can be realized by the normal pressure sintering method.

【0030】しかも、本発明によれば到達相対密度が高
いので、高品質の透明導電膜用ターゲットを製造するこ
とができるのである。
Further, according to the present invention, since the reached relative density is high, a high quality transparent conductive film target can be manufactured.

フロントページの続き (72)発明者 浦野 広明 東京都八王子市戸吹町277番地1 同和鉱 業株式会社中央研究所内 (72)発明者 田中 理子 東京都八王子市戸吹町277番地1 同和鉱 業株式会社中央研究所内 (72)発明者 阿部 正春 東京都八王子市戸吹町277番地1 同和鉱 業株式会社中央研究所内Continued on the front page (72) Inventor Hiroaki Urano 277-1, Tobukicho, Hachioji-shi, Tokyo Inside Dowa Mining Co., Ltd. Central Research Laboratory (72) Inventor Riko Tanaka 277-1, Tobukicho, Hachioji-shi, Tokyo Dowa Mining Co., Ltd. Inside the research institute (72) Inventor Masaharu Abe 277-1, Tobukicho, Hachioji-shi, Tokyo Dowa Mining Co., Ltd.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 比表面積値20m2/g以上の酸化インジ
ウムを全原料中の85〜95wt%使用してなる相対密度
83.5%以上の焼結体からなるITOスパッタリングター
ゲット材。
1. A relative density obtained by using indium oxide having a specific surface area value of 20 m 2 / g or more in a proportion of 85 to 95% by weight of all raw materials.
ITO sputtering target material consisting of a sintered body of 83.5% or more.
JP11163949A 1999-06-10 1999-06-10 Ito sputtering target material Pending JP2000080469A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11163949A JP2000080469A (en) 1999-06-10 1999-06-10 Ito sputtering target material

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11163949A JP2000080469A (en) 1999-06-10 1999-06-10 Ito sputtering target material

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP18512990A Division JP3184977B2 (en) 1990-07-12 1990-07-12 Method for producing ITO sputtering target material

Publications (1)

Publication Number Publication Date
JP2000080469A true JP2000080469A (en) 2000-03-21

Family

ID=15783894

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11163949A Pending JP2000080469A (en) 1999-06-10 1999-06-10 Ito sputtering target material

Country Status (1)

Country Link
JP (1) JP2000080469A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102531636A (en) * 2011-12-26 2012-07-04 昆明理工大学 Preparation method of large-size ITO target material

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102531636A (en) * 2011-12-26 2012-07-04 昆明理工大学 Preparation method of large-size ITO target material

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