JP2000076142A - Diagnostic device for ram - Google Patents

Diagnostic device for ram

Info

Publication number
JP2000076142A
JP2000076142A JP10242221A JP24222198A JP2000076142A JP 2000076142 A JP2000076142 A JP 2000076142A JP 10242221 A JP10242221 A JP 10242221A JP 24222198 A JP24222198 A JP 24222198A JP 2000076142 A JP2000076142 A JP 2000076142A
Authority
JP
Japan
Prior art keywords
ram
flag
diagnosis
address
fail
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10242221A
Other languages
Japanese (ja)
Other versions
JP3741873B2 (en
Inventor
Kenichi Machida
憲一 町田
Tatsuji Okubo
達司 大久保
Masahiro Iriyama
正浩 入山
Kenichi Goto
健一 後藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Unisia Automotive Ltd
Nissan Motor Co Ltd
Original Assignee
Nissan Motor Co Ltd
Unisia Jecs Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nissan Motor Co Ltd, Unisia Jecs Corp filed Critical Nissan Motor Co Ltd
Priority to JP24222198A priority Critical patent/JP3741873B2/en
Priority to DE19940871A priority patent/DE19940871A1/en
Priority to US09/384,403 priority patent/US6490697B1/en
Publication of JP2000076142A publication Critical patent/JP2000076142A/en
Application granted granted Critical
Publication of JP3741873B2 publication Critical patent/JP3741873B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To surely shift to a fail-safe processing in the case of detecting a fault in a RAM diagnosis. SOLUTION: A RAM is diagnosed by a read-write system and a diagnosed result is written double in the mutually different two addresses of the RAM as a flag. Then, the flags (NG flag 1 and NG flag 2) of the diagnosed result written double are read (S21 and S22) and the fail-safe processing is performed (S23, S24 and S25) when at least one of them is the flag of fault presence (NG flag 1=1 or NG flag 2=1). Also, the bit allocation of the flags provided double is separated so as to cope with a bit line fault and the address allocation of the flags provided double is arranged by shifting it for a prescribed interval so as to cope with a word line fault.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、自動車用エンジン
などにおいて各種電子制御機器の制御用マイコンに使用
されるRAMの診断装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a diagnostic device for a RAM used in a microcomputer for controlling various electronic control devices in an automobile engine or the like.

【0002】[0002]

【従来の技術】従来より、自動車用エンジンの制御装置
においては、制御用マイコンのCPUの自己診断の他、
CPUによるROM、RAM等の診断を行っている。R
AM診断は、所定診断タイミング毎に、例えば4バイト
分ずつの診断対象RAMに対し、リード・ライトチェッ
クを行い、故障(NG)を検出した場合に、診断結果
を、フラグとして、RAMの所定のアドレスに書込んで
いる。
2. Description of the Related Art Conventionally, in an automobile engine control device, in addition to self-diagnosis of a CPU of a control microcomputer,
Diagnosis of ROM, RAM, etc. is performed by the CPU. R
In the AM diagnosis, a read / write check is performed on a diagnosis target RAM of, for example, 4 bytes each at a predetermined diagnosis timing, and when a failure (NG) is detected, a diagnosis result is set as a flag in a predetermined RAM of the RAM. Writing to the address.

【0003】そして、この診断結果のフラグを読込ん
で、故障有りのフラグのときに、制御対象機器の電源O
FF等のフェイルセーフ処理を行わせるようにしてい
る。
[0003] Then, the flag of this diagnosis result is read, and when a flag indicating that there is a failure, the power supply O
Fail-safe processing such as FF is performed.

【0004】[0004]

【発明が解決しようとする課題】しかしながら、このよ
うな従来のRAMの診断装置にあっては、診断結果のフ
ラグ自身が故障した場合、RAM診断で故障を検出して
も、フェイルセーフ処理に移行できないという問題点が
あった。本発明は、このような従来の問題点に鑑み、R
AM診断で故障を検出した場合に、確実にフェイルセー
フ処理に移行できるようにすることを目的とする。
However, in such a conventional RAM diagnostic device, when the flag itself of the diagnostic result fails, even if the failure is detected by the RAM diagnosis, the process shifts to fail-safe processing. There was a problem that it was not possible. The present invention has been made in view of such a conventional problem,
It is an object of the present invention to reliably shift to fail-safe processing when a failure is detected by AM diagnosis.

【0005】[0005]

【課題を解決するための手段】このため、請求項1に係
る発明では、図1に示すように、RAMを診断するRA
M診断手段と、診断結果をフラグとしてRAMの互いに
異なる2つのアドレスに2重に書込む診断結果書込み手
段と、2重に書込まれた診断結果のフラグを読込んで少
なくとも一方が故障有りのフラグのときにフェイルセー
フ処理を行わせるフェイルセーフ処理手段と、を設け
て、RAMの診断装置を構成する。
According to the first aspect of the present invention, as shown in FIG.
M diagnostic means, diagnostic result writing means for doubly writing diagnostic results as two flags to two different addresses in the RAM, and a double-written diagnostic result flag which is read and at least one of which is a failure flag And a fail-safe processing means for performing the fail-safe processing at the time of (1) to constitute a diagnostic device for the RAM.

【0006】また、ビット線故障に対応するため、2重
に持つフラグのビット割付けは別々にするのがよい。こ
のため、請求項2に係る発明では、前記診断結果書込み
手段は、RAMの互いに異なる2つのアドレスで、互い
に異なる位置のビットに2重に書込むことを特徴とす
る。また、ワード線故障に対応するため、2重の持つフ
ラグのアドレス割付けは所定間隔ずらして配置するのが
よい。このため、請求項3に係る発明では、前記診断結
果書込み手段は、RAMの互いに異なる2つのアドレス
で、かつワード線のアドレス間隔以外の間隔を有するア
ドレスに2重に書込むことを特徴とする。
Further, in order to cope with a bit line failure, it is preferable that the bit assignment of the double flag is performed separately. For this reason, the invention according to claim 2 is characterized in that the diagnosis result writing means double-writes bits at different positions in the RAM at two different addresses. Further, in order to cope with a word line failure, it is preferable that the address assignment of the double flag is shifted by a predetermined interval. Therefore, the invention according to claim 3 is characterized in that the diagnosis result writing means double-writes at two different addresses of the RAM and at an address having an interval other than the address interval of the word line. .

【0007】[0007]

【発明の効果】請求項1に係る発明によれば、RAM診
断の診断結果を2重に持ち、2重に持った診断結果のO
Rによってフェイルセーフ処理に移行するようにしたた
め、RAM診断で故障を検出した場合に、確実にフェイ
ルセーフ処理に移行することができるという効果が得ら
れる。
According to the first aspect of the present invention, the diagnostic result of the RAM diagnosis is doubled, and the diagnostic result of the doubled diagnostic result is doubled.
Since the process shifts to the fail-safe process by R, the effect that the process can be reliably shifted to the fail-safe process when a failure is detected by the RAM diagnosis is obtained.

【0008】請求項2に係る発明によれば、ビット線故
障に対応できる。請求項3に係る発明によれば、ワード
線故障に対応できる。
According to the invention of claim 2, it is possible to cope with a bit line failure. According to the invention of claim 3, it is possible to cope with a word line failure.

【0009】[0009]

【発明の実施の形態】以下に本発明の一実施形態につい
て説明する。図2は制御用マイコンのCPUにより実行
されるRAM診断のフローチャートであり、例えば4バ
イト分ずつの診断対象RAMに対して行う診断内容を示
している。本フローがRAM診断手段に相当する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS One embodiment of the present invention will be described below. FIG. 2 is a flowchart of the RAM diagnosis executed by the CPU of the control microcomputer, and shows the contents of the diagnosis performed on the diagnosis target RAM of, for example, 4 bytes. This flow corresponds to RAM diagnosis means.

【0010】ステップ1(図にはS1と記す。以下同
様)では、診断対象RAMアドレスを参照する。尚、診
断対象RAMアドレスは、1フロー毎に、4バイト分ず
つの診断対象RAMに対して診断を行って、最終的にR
AMの全アドレスに対して診断を行うように、別途設定
される(初期設定後は、1フロー毎にインクリメントさ
れる)。
In step 1 (referred to as S1 in the figure, the same applies hereinafter), a diagnosis target RAM address is referred to. The diagnosis target RAM address is obtained by diagnosing the diagnosis target RAM of 4 bytes for each flow and finally determining the R address.
It is separately set so that diagnosis is performed for all addresses of the AM (after the initial setting, it is incremented for each flow).

【0011】ステップ2では、診断対象RAMアドレス
に基づく診断対象RAMのデータをバッファに退避す
る。ステップ3では、診断対象RAMに例えばAAAA
AAAAh(4バイトデータ)を格納する。ステップ4
では、診断対象RAMのデータをテンポラリ(CPU側
の一時レジスタ)にコピーする。
In step 2, the data in the RAM to be diagnosed based on the address of the RAM to be diagnosed is saved in a buffer. In step 3, for example, AAAA is stored in the diagnosis target RAM.
AAAAh (4 byte data) is stored. Step 4
Then, the data of the diagnosis target RAM is copied to a temporary (temporary register on the CPU side).

【0012】ステップ5では、テンポラリのデータをビ
ット反転する。これにより、AAAAAAAAhの場
合、55555555hとなる。ステップ6では、診断
対象RAMにテンポラリのデータを再格納する。ステッ
プ7では、診断対象RAMのデータとテンポラリのデー
タとの比較を行う。
In step 5, the temporary data is bit-inverted. Thereby, in the case of AAAAAAAAh, it becomes 55555555h. In step 6, the temporary data is stored again in the diagnosis target RAM. In step 7, the data of the diagnosis target RAM and the temporary data are compared.

【0013】この比較の結果、相違があった場合に、R
AM診断NGとして、ステップ8で、RAMの第1の所
定アドレスにNGフラグ1(=1)をセットし、また、
ステップ9で、RAMの第2の所定アドレスにNGフラ
グ2(=1)をセットする。ステップ10では、診断対
象RAMにバッファのデータを復帰する。ステップ11
では、診断対象RAMのデータとバッファのデータとの
比較を行う。
As a result of this comparison, if there is a difference,
In step 8, the NG flag 1 (= 1) is set to the first predetermined address of the RAM as the AM diagnosis NG, and
In step 9, the NG flag 2 (= 1) is set to the second predetermined address of the RAM. In step 10, the data in the buffer is restored to the diagnosis target RAM. Step 11
Then, the data of the RAM to be diagnosed is compared with the data of the buffer.

【0014】この比較の結果、相違があった場合に、R
AM診断NGとして、ステップ12で、RAMの第1の
所定アドレスにNGフラグ1(=1)をセットし、ま
た、ステップ13で、RAMの第2の所定アドレスにN
Gフラグ2(=1)をセットする。ここで、特にステッ
プ8,9,12,13の部分が診断結果書込み手段に相
当する。
If there is a difference as a result of this comparison, R
In step 12, the NG flag 1 (= 1) is set to the first predetermined address of the RAM as the AM diagnosis NG, and in step 13, the NG flag 1 is set to the second predetermined address of the RAM.
G flag 2 (= 1) is set. Here, in particular, the steps 8, 9, 12, and 13 correspond to a diagnosis result writing unit.

【0015】図3は制御用マイコンのCPUにより実行
されるフェイルセーフ処理のフローチャートである。本
フローがフェイルセーフ処理手段に相当する。ステップ
21では、RAMの第1の所定アドレスからNGフラグ
1を読込む。ステップ22では、RAMの第2の所定ア
ドレスからNGフラグ2を読込む。ステップ23では、
NGフラグ1=1(故障有り)か否かを判定する。
FIG. 3 is a flowchart of the fail-safe process executed by the CPU of the control microcomputer. This flow corresponds to the fail-safe processing means. In step 21, the NG flag 1 is read from the first predetermined address of the RAM. In step 22, the NG flag 2 is read from the second predetermined address of the RAM. In step 23,
It is determined whether NG flag 1 = 1 (there is a failure).

【0016】ステップ24では、NGフラグ2=1(故
障有り)か否かを判定する。これらの判定の結果、NG
フラグ1及びNGフラグ2の少なくとも一方が1(故障
有りのフラグ)のときに、ステップ25へ進んで、フェ
イルセーフ処理を行わせる。フェイルセーフ処理として
は、制御対象機器の電源OFF等を行う。例えば、自動
車用エンジンの制御装置で、電制スロットル弁を制御し
ている場合は、電制スロットル弁のモータに対する電源
回路のリレーをOFFにする。リレーOFFにより、電
制スロットル弁はリターンスプリングの作用で、比較的
低開度側のフェイルセーフ開度に固定され、エンジン出
力が規制されるものの、最低限のリンプホーム運転が可
能となる。
In step 24, it is determined whether or not the NG flag 2 = 1 (there is a failure). As a result of these determinations, NG
When at least one of the flag 1 and the NG flag 2 is 1 (fault flag), the routine proceeds to step 25, where the fail-safe processing is performed. As the fail-safe process, the power of the control target device is turned off and the like. For example, when the electronically controlled throttle valve is controlled by the control device of the automobile engine, the relay of the power supply circuit for the motor of the electronically controlled throttle valve is turned off. When the relay is turned off, the electronically controlled throttle valve is fixed to the fail-safe opening on the relatively low opening side by the action of the return spring, and the engine output is regulated, but the minimum limp home operation becomes possible.

【0017】以上のように、RAM診断の診断結果をフ
ラグとしてRAMの互いに異なる2つのアドレス(第1
及び第2の所定アドレス)に2重に書込むようにし、2
重に書込まれた診断結果のフラグを読込んで、少なくと
も一方が故障有りのフラグのときにフェイルセーフ処理
を行わせるため、RAM診断でNGを検出した場合に、
確実にフェイルセーフ処理に移行することができる。
As described above, the two different addresses (the first address) of the RAM are determined by using the diagnosis result of the RAM diagnosis as a flag.
And a second predetermined address).
In order to perform the fail-safe processing when at least one of the flags of the diagnosis result written is read and at least one of the flags indicates a failure, when the RAM diagnosis detects NG,
It is possible to surely shift to the fail-safe processing.

【0018】ここで、ビット線故障に対応するため、2
重に持つフラグのビット割付けは別々にする。すなわ
ち、RAM診断の診断結果をフラグとしてRAMの互い
に異なる2つのアドレスで、互いに異なる位置のビット
に2重に書込む。具体的には、図4を参照し、NGフラ
グ1(=1)を例えばアドレス0000hのbit1に
配置する場合、NGフラグ2(=1)を他のアドレスに
配置したとしても、同じbit1ではビット線故障の場
合に同時に故障する可能性が高いので、他のアドレスの
異なるビット、例えはbit7に配置する。
Here, in order to cope with a bit line failure, 2
The bit assignment of the duplicated flag shall be different. In other words, the diagnostic result of the RAM diagnosis is written as a flag at two different addresses of the RAM in two different bits at different positions. Specifically, referring to FIG. 4, when NG flag 1 (= 1) is placed in bit 1 of address 0000h, for example, even if NG flag 2 (= 1) is placed in another address, Since there is a high possibility that a line failure will occur at the same time, a different bit of another address, for example, bit 7 is arranged.

【0019】また、ワード線故障に対応するため、2重
の持つフラグのアドレス割付けは所定間隔ずらして配置
する。すなわち、RAM診断の診断結果をフラグとして
RAMの互いに異なる2つのアドレスで、かつワード線
のアドレス間隔(ワード線故障の場合に同じ故障の発生
するアドレス間隔)以外の間隔を有するアドレスに2重
に書込む。
Further, in order to cope with a word line failure, the address assignment of the double flag is arranged at a predetermined interval. In other words, the diagnosis result of the RAM diagnosis is used as a flag to overlap two addresses different from each other in the RAM and having an interval other than a word line address interval (an address interval where the same failure occurs in the case of a word line failure). Write.

【0020】具体的には、図4を参照し、NGフラグ1
(=1)を例えばアドレス0000hに配置する場合、
NGフラグ2(=1)を他のアドレスに配置したとして
も、そのアドレス間隔が、ワード線のアドレス間隔(マ
イコンにより異なるが、例えば80h)に一致している
と、ワード線故障の場合に同時に故障する可能性が高い
ので、ワード線のアドレス間隔以外の間隔になるよう
に、ワード線のアドレス間隔が80hの場合、アドレス
0002h、0082hなどに配置する。
More specifically, referring to FIG.
For example, when (= 1) is arranged at the address 0000h,
Even if the NG flag 2 (= 1) is arranged at another address, if the address interval coincides with the address interval of the word line (depending on the microcomputer, for example, 80h), simultaneously in the case of a word line failure. Since the possibility of failure is high, when the address interval of the word lines is 80h, it is arranged at addresses 0002h, 0082h, etc. so that the intervals are other than the address intervals of the word lines.

【0021】尚、RAM診断の方式自体については、図
2の方式に限るものではなく、例えば、ステップ3を省
略したリード・ライトチェックとしてもよい。すなわ
ち、診断対象RAMアドレスを参照し(S1)、そのア
ドレスに基づく診断対象RAMのデータをバッファに退
避し(S2)、診断対象RAMのデータをテンポラリに
コピーし(S4)、テンポラリのデータをビット反転し
(S5)、診断対象RAMにテンポラリのデータを格納
し(S6)、診断対象RAMのデータとテンポラリのデ
ータとの比較を行って(S7)、相違があった場合に、
RAM診断NGとして、NGフラグ1及びNGフラグ2
をセットし(S8,S9)、診断対象RAMにバッファ
のデータを復帰し(S10)、診断対象RAMのデータ
とバッファのデータとの比較を行って(S11)、相違
があった場合に、RAM診断NGとして、NGフラグ1
及びNGフラグ2をセットする(S12,S13)よう
にしてもよい。
Incidentally, the RAM diagnosis method itself is not limited to the method shown in FIG. 2, but may be, for example, a read / write check in which step 3 is omitted. That is, the address of the diagnosis target RAM is referred to (S1), the data of the diagnosis target RAM based on the address is saved in a buffer (S2), the data of the diagnosis target RAM is temporarily copied (S4), and the temporary data is Invert (S5), the temporary data is stored in the diagnosis target RAM (S6), and the data of the diagnosis target RAM and the temporary data are compared (S7).
NG flag 1 and NG flag 2 as RAM diagnosis NG
Is set (S8, S9), the buffer data is restored to the diagnosis target RAM (S10), and the data in the diagnosis target RAM and the buffer data are compared (S11). NG flag 1 as diagnosis NG
And the NG flag 2 may be set (S12, S13).

【図面の簡単な説明】[Brief description of the drawings]

【図1】 本発明の構成を示す機能ブロック図FIG. 1 is a functional block diagram showing a configuration of the present invention.

【図2】 本発明の一実施形態のRAM診断のフローチ
ャート
FIG. 2 is a flowchart of a RAM diagnosis according to the embodiment of the present invention;

【図3】 同上実施形態のフェイルセーフ処理のフロー
チャート
FIG. 3 is a flowchart of a fail-safe process according to the embodiment;

【図4】 NGフラグのセット位置を説明するための図FIG. 4 is a diagram for explaining a setting position of an NG flag.

フロントページの続き (72)発明者 大久保 達司 神奈川県厚木市恩名1370番地 株式会社ユ ニシアジェックス内 (72)発明者 入山 正浩 神奈川県横浜市神奈川区宝町2番地 日産 自動車株式会社内 (72)発明者 後藤 健一 神奈川県横浜市神奈川区宝町2番地 日産 自動車株式会社内 Fターム(参考) 3G084 DA26 DA31 EB02 EB07 5B018 GA03 GA06 HA01 HA03 KA01 MA23 NA01 NA04 QA13 5L106 AA00 DD24 Continued on the front page (72) Inventor Tatsushi Okubo 1370 Onna, Atsugi-shi, Kanagawa Prefecture Inside Unisex Gex Co., Ltd. (72) Inventor Masahiro Iriyama 2 Takaracho, Kanagawa-ku, Yokohama-shi, Kanagawa Prefecture Nissan Motor Co., Ltd. (72) Invention Person Kenichi Goto 2 Takaracho, Kanagawa-ku, Yokohama-shi, Kanagawa F-term in Nissan Motor Co., Ltd. (reference) 3G084 DA26 DA31 EB02 EB07 5B018 GA03 GA06 HA01 HA03 KA01 MA23 NA01 NA04 QA13 5L106 AA00 DD24

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】RAMを診断するRAM診断手段と、 診断結果をフラグとしてRAMの互いに異なる2つのア
ドレスに2重に書込む診断結果書込み手段と、 2重に書込まれた診断結果のフラグを読込んで少なくと
も一方が故障有りのフラグのときにフェイルセーフ処理
を行わせるフェイルセーフ処理手段と、 を含んで構成されるRAMの診断装置。
1. A diagnostic means for diagnosing a RAM, a diagnostic result writing means for writing a diagnostic result as a flag to two different addresses of the RAM doubly, and a diagnostic result flag written twice. A fail-safe processing means for reading and performing fail-safe processing when at least one of them is a flag indicating that there is a failure;
【請求項2】前記診断結果書込み手段は、RAMの互い
に異なる2つのアドレスで、互いに異なる位置のビット
に2重に書込むことを特徴とする請求項1記載のRAM
の診断装置。
2. The RAM according to claim 1, wherein said diagnosis result writing means double-writes bits at mutually different positions at two different addresses of the RAM.
Diagnostic device.
【請求項3】前記診断結果書込み手段は、RAMの互い
に異なる2つのアドレスで、かつワード線のアドレス間
隔以外の間隔を有するアドレスに2重に書込むことを特
徴とする請求項1又は請求項2記載のRAMの診断装
置。
3. The method according to claim 1, wherein said diagnosis result writing means double-writes at two different addresses of the RAM and at an address having an interval other than the address interval of the word line. 2. The diagnostic device for a RAM according to 2.
JP24222198A 1998-08-27 1998-08-27 RAM diagnostic device Expired - Fee Related JP3741873B2 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP24222198A JP3741873B2 (en) 1998-08-27 1998-08-27 RAM diagnostic device
DE19940871A DE19940871A1 (en) 1998-08-27 1999-08-27 Diagnostic device for random access memory used in microcomputer of motor vehicle engine, performs failure prevention process based on diagnostic result stored in predefined register during failure
US09/384,403 US6490697B1 (en) 1998-08-27 1999-08-27 Diagnosing apparatus and method for RAM

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24222198A JP3741873B2 (en) 1998-08-27 1998-08-27 RAM diagnostic device

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JP2000076142A true JP2000076142A (en) 2000-03-14
JP3741873B2 JP3741873B2 (en) 2006-02-01

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Country Link
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006293649A (en) * 2005-04-08 2006-10-26 Denso Corp Electronic controller
JP2009174979A (en) * 2008-01-24 2009-08-06 Oki Semiconductor Co Ltd Earthquake disaster prevention system

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006293649A (en) * 2005-04-08 2006-10-26 Denso Corp Electronic controller
JP4639920B2 (en) * 2005-04-08 2011-02-23 株式会社デンソー Electronic control unit
JP2009174979A (en) * 2008-01-24 2009-08-06 Oki Semiconductor Co Ltd Earthquake disaster prevention system

Also Published As

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