JP2000012247A - Lamp temperature abnormality detecting device - Google Patents

Abstract

PROBLEM TO BE SOLVED: To prevent abnormal temperature rising caused by failure of a cooling device or contact failure of a power source connection part by measuring the temperature with a non-contact type temperature measuring means, and comparing the measured temperature with a reference temperature to detect temperature abnormality. SOLUTION: Thermal radiation energy from a metal part at both ends of a Xe lamp is converted into a temperature signal with a temperature detecting part 12, and the temperature signal is sent to a comparing part 14 through an amplifying part 13. The comparing part 14 compares the measured temperature signal with a signal from a reference temperature signal part 15, and if the measured temperature is higher than a reference temperature, a signal of an abnormal temperature rising display is sent to a display part 16. At the same time, a lamp extinguishing signal is sent to a lamp power source control part 17 to control a lamp power source 18 and to put out lights. The temperature detecting part 12 converts thermal radiation energy into an electric signal with a silicon photocell through a protection filter, a condenser lens, a light quantity adjusting plate, and a spectral sensitivity adjusting filter, and directly measures the temperature of the metal part at both ends of the lamp 11.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

The present invention relates to an apparatus using a lamp.

[0002]

2. Description of the Related Art Conventionally, an abnormal temperature rise of a lamp using a high voltage such as a Xe lamp is measured not by directly measuring the temperature of the lamp but by measuring the temperature of a structure around the lamp with a contact-type temperature sensor and cooling the lamp. A device error was detected.

[0003]

In the above prior art,
Since the temperature of the lamp itself is not measured, there has been a problem that abnormal temperature rise due to poor contact at the power supply connection portion of the lamp cannot be detected.

An object of the present invention is to provide a device for measuring the temperature of a lamp itself and preventing an abnormal rise in the temperature of the lamp.

[0005]

In order to achieve the above object, the temperature of the lamp is measured by a non-contact type measuring temperature means to detect an abnormal temperature rise.

[0006]

BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 shows an embodiment of the present invention.

FIG. 1 shows the basic configuration of a lamp temperature abnormality detecting device. The heat radiation energy from the metal parts at both ends of the Xe lamp 11 is converted into a measured temperature signal by the temperature detection unit 12 and sent to the comparison unit 14 via the amplification unit 13. Comparison section 1
When the measured temperature is higher than the reference temperature as compared with the signal from the reference temperature signal section 15 according to (4), an abnormal temperature rise display signal is sent to the display section 16. At the same time, a lamp extinguishing signal is sent to the lamp power controller 17 to control the lamp power 18 and extinguish the lamp.

FIG. 2 is an optical system configuration diagram of the temperature detecting section 12 of FIG. The light from the light emitting portion of the Xe lamp is
To shield light. Thermal radiation energy from the metal parts at both ends of the Xe lamp is introduced into the silicon photocell 26 via the protective filter 22, the condenser lens 23, the light quantity adjusting plate 24, and the spectral sensitivity correction filter 25. The introduced thermal radiation energy is converted into an electric signal by the silicon photocell 26.

[0009]

According to the present invention, there is an effect that a device for detecting an abnormal temperature rise due to a contact failure of the lamp cooling device or the power supply connection portion of the lamp and preventing the abnormal temperature rise of the lamp can be supplied.

[Brief description of the drawings]

FIG. 1 is a basic configuration diagram of a temperature abnormality detection device of the present invention.

FIG. 2 is a configuration diagram showing an optical system of a temperature detection unit in FIG. 1;

[Explanation of symbols]

11: Xe lamp, 12: temperature detector, 13: amplifier,
14 ... Comparison unit, 15 ... Reference temperature signal unit, 16 ... Display unit,
17 lamp power control section, 18 lamp power supply, 21 light shielding plate, 22 protection filter, 23 condenser lens, 24
Light amount adjusting plate, 25: spectral sensitivity correction filter, 26: silicon photocell.

 ────────────────────────────────────────────────── ─── Continuing from the front page (72) Inventor Osamu Kato 882, Imo, Oaza, Hitachinaka-shi, Ibaraki F-term in the measuring instrument division of Hitachi, Ltd. (Reference) 3K073 AA21 AA33 AA92 BA31 CF18 CF22 CG02 CJ16

Claims (1)

[Claims] 1. A lamp temperature abnormality detecting device comprising: a non-contact measuring temperature means for measuring a temperature of a lamp; a means for comparing the measured temperature with a specified temperature; and a means for outputting an abnormal temperature.