JP2000002642A - Scratch property evaluation device and method therefor - Google Patents

Scratch property evaluation device and method therefor

Info

Publication number
JP2000002642A
JP2000002642A JP16677898A JP16677898A JP2000002642A JP 2000002642 A JP2000002642 A JP 2000002642A JP 16677898 A JP16677898 A JP 16677898A JP 16677898 A JP16677898 A JP 16677898A JP 2000002642 A JP2000002642 A JP 2000002642A
Authority
JP
Japan
Prior art keywords
resistance
electrodes
conductive film
scratch
abrasion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16677898A
Other languages
Japanese (ja)
Inventor
Kazutoshi Kiyokawa
和利 清川
Yutaka Kobayashi
裕 小林
Takahiro Harada
隆宏 原田
Haruo Uyama
晴夫 宇山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toppan Inc
Original Assignee
Toppan Printing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toppan Printing Co Ltd filed Critical Toppan Printing Co Ltd
Priority to JP16677898A priority Critical patent/JP2000002642A/en
Publication of JP2000002642A publication Critical patent/JP2000002642A/en
Pending legal-status Critical Current

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  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)

Abstract

PROBLEM TO BE SOLVED: To reduce measurement errors and measurement scattering and to evaluate the scratch resistance of a conductive film rapidly, by arranging a plurality of electrodes in contact with the conductive film including one portion or all of regions where a scratch test is performed, and connecting the electrodes to a resistance-measuring instrument. SOLUTION: For example, a PET substrate 1 with a hard coat where an ITO film (conductive film) is formed is set onto a stand 5. Then, at least two electrodes 2 are arranged so that they touch the ITO film to include one portion or entire portion of a region 3 where a scratch-resistance test is performed by scratching the ITO film, for example, with a steel wool or paper. Then, the resistance between the electrodes 2 is measured by a tester (resistance- measuring instrument) 4, and the scratch property of the ITO film is evaluated from change in resistance due to scratches.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、導電膜の擦傷性評
価装置および評価方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an apparatus and method for evaluating the abrasion of a conductive film.

【0002】[0002]

【従来の技術】導電膜の耐擦傷性は、膜の利用において
ひとつの重要な性能であり、実際の製品への応用に当た
り擦傷性試験を行うことが非常に多い。しかしながら通
常は傷を付けるための物品で導電膜を擦った後、人間の
目で評価することが極めて多い。このことは評価にかか
る時間、また評価者間による誤差を生む要因のひとつと
なっている。
2. Description of the Related Art The abrasion resistance of a conductive film is one important performance in the use of a film, and abrasion tests are very often performed in application to actual products. However, usually, the conductive film is often evaluated by human eyes after rubbing the conductive film with an article for scratching. This is one of the factors that cause an evaluation time and an error between evaluators.

【0003】[0003]

【発明が解決しようとする課題】本発明は、上記の問題
に鑑みなされたものであり、比較的測定誤差が少なく、
また評価者間によるバラツキが少なくかつ迅速な耐擦傷
性評価のできる装置および方法を達成する。
SUMMARY OF THE INVENTION The present invention has been made in view of the above problems, and has relatively few measurement errors.
Further, an apparatus and a method capable of quickly evaluating abrasion resistance with little variation among evaluators are achieved.

【0004】[0004]

【課題を解決するための手段】本発明はかかる課題を解
決するものであり、請求項1の発明は、基材上に形成さ
れた導電膜の擦傷性試験の評価装置であって、導電膜上
の擦傷試験を行った領域の一部または全部を含む如く2
つ以上の電極が導電膜に接するように配置され、かつそ
の電極が抵抗を測定できる測定器に接続されていること
を特徴とする擦傷性評価装置、としたものである。
SUMMARY OF THE INVENTION The present invention has been made to solve the above problems, and the invention of claim 1 is an apparatus for evaluating the abrasion test of a conductive film formed on a substrate, comprising: 2 including part or all of the area where the above-mentioned abrasion test was performed.
An abrasion evaluation apparatus characterized in that one or more electrodes are arranged so as to be in contact with the conductive film, and the electrodes are connected to a measuring instrument capable of measuring resistance.

【0005】本発明の請求項2の発明は、基材上に形成
された導電膜の擦傷性試験の評価方法であって、導電膜
上の擦傷試験を行った領域の−部または全部を含む如く
2つ以上の電極が導電膜に接するように配置し、かつそ
の電極を抵抗を測定できる測定器に接続し、端子間の抵
抗値の変化から表面に付いた傷を評価することを特徴と
する擦傷性評価方法、としたものである。
[0005] The invention of claim 2 of the present invention is a method for evaluating the abrasion test of a conductive film formed on a base material, and includes the-part or all of the region on the conductive film where the abrasion test was performed. As described above, two or more electrodes are arranged so as to be in contact with the conductive film, and the electrodes are connected to a measuring instrument capable of measuring resistance, and the flaw on the surface is evaluated from a change in resistance between the terminals. Abrasion evaluation method.

【0006】[0006]

【発明の実施の形態】本発明は、擦傷性試験により導電
膜に傷が付くとその抵抗値が変化することを利用したも
のである。
BEST MODE FOR CARRYING OUT THE INVENTION The present invention utilizes the fact that when a conductive film is scratched by a scratch test, its resistance changes.

【0007】擦傷性を調べるために傷を付ける方法は、
いかなる方法であっても良いが、例えばスチールウー
ル、鉛筆、金属棒、布、紙、ティッシュ等で擦る方法が
あり、また場合に応じて擦る前もしくは同時に何らかの
薬品を掛ける場合もある。傷を付ける方法は、手動であ
っても機械的動作であっても構わない。膜を形成する基
材はいかなるものであっても良い。膜は導電性を有して
いればいかなる膜であっても構わない。その厚さもいか
なる厚さでっても良い。ここで、導電性を有するとは、
電気的な常識の範囲でその抵抗値が測定できることをい
う。
[0007] In order to examine the abrasion property, a method of making a wound is as follows.
Although any method may be used, for example, there is a method of rubbing with steel wool, a pencil, a metal bar, a cloth, paper, a tissue, or the like. The method of scratching may be manual or mechanical. The substrate on which the film is formed may be any. The film may be any film as long as it has conductivity. The thickness may be any thickness. Here, having conductivity means
It means that its resistance can be measured within the range of common electrical knowledge.

【0008】図1は擦傷性評価装置の実施例を概略に示
す説明図である。ここでは、図を理解しやすくするため
傷を付けるための部分を省いてあるが、たとえば機械的
(自動的)に擦傷性試験を行うときでもその試験が電極
間で行われるよう設置すればよいだけである。電極間で
行われた擦傷性試験によって導電膜に傷が付けば電極間
の電気抵抗値が変化するので、これを測定することによ
り耐擦傷性の指標を得ることができる。
FIG. 1 is an explanatory view schematically showing an embodiment of an abrasion evaluation apparatus. Here, a part for making a scratch is omitted for easy understanding of the drawing, but, for example, even when a scratch test is performed mechanically (automatically), it may be installed so that the test is performed between the electrodes. Only. If the conductive film is scratched by the abrasion test performed between the electrodes, the electrical resistance value between the electrodes changes. By measuring this, an index of the abrasion resistance can be obtained.

【0009】[0009]

【実施例】次に、本発明の具体的実施例を以下に詳細に
説明する。
Next, specific embodiments of the present invention will be described in detail below.

【0010】<実施例1>図1の装置においてITO薄
膜を形成したハードコート付きPET基材1を台5上に
セットした。つぎに電極2間の耐擦傷性試験領域3の抵
抗値をテスタ4で測定することにより、その擦傷性を評
価した。擦りはスチールウール0000番で行った。荷重は
およそ100g/cm2とした。その結果、電極間の抵
抗値は、擦り回数とともに増加した。
<Embodiment 1> In the apparatus shown in FIG. 1, a PET substrate 1 with a hard coat on which an ITO thin film was formed was set on a table 5. Next, the abrasion resistance was evaluated by measuring the resistance value of the abrasion resistance test area 3 between the electrodes 2 with a tester 4. Rubbing was performed with steel wool No. 0000. The load was about 100 g / cm 2 . As a result, the resistance between the electrodes increased with the number of times of rubbing.

【0011】 擦り回数(往復) 0 10 20 30 抵抗値(Ω) 1k 4k 20k 400kNumber of times of rubbing (round trip) 0 10 20 30 Resistance value (Ω) 1k 4k 20k 400k

【0012】これにより、たとえば成膜条件の異なる導
電膜の耐擦傷性の試料間の差異を評価することが可能な
ことがわかった。
Thus, it has been found that it is possible to evaluate, for example, differences between samples having scratch resistance of conductive films having different film forming conditions.

【0013】<実施例2>プラスチックフィルムなど可
とう性の基材を用いる場合には巻き取り方式による連続
性により、その大量生産が利点となる。それゆえ、検査
も連続的に行えることが望ましい場合もある。以下その
実施例を示す。
<Example 2> When a flexible substrate such as a plastic film is used, its mass production is advantageous due to the continuity of the winding method. Therefore, it may be desirable that the inspection can be performed continuously. Hereinafter, examples thereof will be described.

【0014】図2擦傷性評価装置の実施例を概略に示す
説明図である。図で示したようにITO薄膜を形成した
ハードコート付きPET基材6を巻きかえる際に、本発
明の装置を利用しその擦傷性を評価した。擦りはスチー
ルウール80000番で行った。荷重9はおよそ0〜200
g/cm2とした。その結果、回転式電極7間の抵抗値
は、荷重9とともにおよそ1kΩ〜1MΩまで変化し
た。電極7にはベアリングを用い回転できるようにし
た。これにより、たとえば成膜条件の異なる導電膜の耐
擦傷性の試料間の差異を評価することが可能なことがわ
かった。
FIG. 2 is an explanatory view schematically showing an embodiment of the abrasion evaluation apparatus. As shown in the figure, when the PET substrate 6 with the hard coat on which the ITO thin film was formed was rolled, the scratch resistance was evaluated using the apparatus of the present invention. Rubbing was performed with steel wool No. 80,000. Load 9 is approximately 0 to 200
g / cm 2 . As a result, the resistance value between the rotary electrodes 7 changed from about 1 kΩ to 1 MΩ together with the load 9. The electrode 7 was made rotatable using a bearing. Thus, for example, it was found that it was possible to evaluate the difference between the scratch resistance samples of the conductive films having different film forming conditions.

【0015】[0015]

【発明の効果】本発明は以上のように、導電膜上の擦傷
性試験の評価を、擦傷試験を行った領域の抵抗値を測定
することにより、誤差が少なく評価者間によるバラツキ
も少なくかつ迅速に実施できる。
As described above, the present invention evaluates the abrasion test on the conductive film by measuring the resistance value of the area subjected to the abrasion test, thereby reducing errors and reducing variation among evaluators. Can be implemented quickly.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明に係る擦傷性評価装置の実施例を概略に
示す説明図である。
FIG. 1 is an explanatory view schematically showing an embodiment of a scratch evaluation apparatus according to the present invention.

【図2】本発明に係る擦傷性評価装置の他の実施例を概
略に示す説明図である。
FIG. 2 is an explanatory view schematically showing another embodiment of the abrasion evaluation apparatus according to the present invention.

【符号の説明】[Explanation of symbols]

1・・・PET基材 2・・・電極 3・・・耐擦傷性試験領域 4・・・テスタ 5・・・台 6・・・PET基材 7・・・回転式電極 8・・・スチールウール 9・・・荷重 DESCRIPTION OF SYMBOLS 1 ... PET base material 2 ... Electrode 3 ... Scratch resistance test area 4 ... Tester 5 ... Table 6 ... PET base material 7 ... Rotary electrode 8 ... Steel Wool 9 ... Load

───────────────────────────────────────────────────── フロントページの続き (72)発明者 宇山 晴夫 東京都台東区台東1丁目5番1号 凸版印 刷株式会社内 Fターム(参考) 2G060 AA09 AE02 AF07 AG07 AG09 AG11 EA04 EB07 HC10 KA12 ────────────────────────────────────────────────── ─── Continuing on the front page (72) Inventor Haruo Uyama 1-5-1, Taito, Taito-ku, Tokyo Toppan Printing Co., Ltd. F-term (reference) 2G060 AA09 AE02 AF07 AG07 AG09 AG11 EA04 EB07 HC10 KA12

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】基材上に形成された導電膜の擦傷性試験の
評価装置であって、導電膜上の擦傷試験を行った領域の
一部または全部を含む如く2つ以上の電極が導電膜に接
するように配置され、かつその電極が抵抗を測定できる
測定器に接続されていることを特徴とする擦傷性評価装
置。
An apparatus for evaluating the abrasion test of a conductive film formed on a base material, wherein two or more electrodes are electrically conductive so as to include a part or all of a region where the abrasion test was performed on the conductive film. An abrasion-evaluating apparatus characterized by being arranged so as to be in contact with a membrane, and having its electrode connected to a measuring instrument capable of measuring resistance.
【請求項2】基材上に形成された導電膜の擦傷性試験の
評価方法であって、導電膜上の擦傷試験を行った領域の
−部または全部を含む如く2つ以上の電極が導電膜に接
するように配置し、かつその電極を抵抗を測定できる測
定器に接続し、端子間の抵抗値の変化から表面に付いた
傷を評価することを特徴とする擦傷性評価方法。
2. A method for evaluating an abrasion test of a conductive film formed on a substrate, wherein two or more electrodes are electrically conductive so as to include-or all of the region on the conductive film where the abrasion test was performed. A method for evaluating abrasion, comprising arranging an electrode so as to be in contact with a film, connecting an electrode thereof to a measuring instrument capable of measuring resistance, and evaluating a scratch on a surface from a change in resistance between terminals.
JP16677898A 1998-06-15 1998-06-15 Scratch property evaluation device and method therefor Pending JP2000002642A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16677898A JP2000002642A (en) 1998-06-15 1998-06-15 Scratch property evaluation device and method therefor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16677898A JP2000002642A (en) 1998-06-15 1998-06-15 Scratch property evaluation device and method therefor

Publications (1)

Publication Number Publication Date
JP2000002642A true JP2000002642A (en) 2000-01-07

Family

ID=15837518

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16677898A Pending JP2000002642A (en) 1998-06-15 1998-06-15 Scratch property evaluation device and method therefor

Country Status (1)

Country Link
JP (1) JP2000002642A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111006960A (en) * 2019-11-08 2020-04-14 宇龙计算机通信科技(深圳)有限公司 Test pressure head and wear-resisting testing arrangement
EP3644051A1 (en) * 2018-10-26 2020-04-29 Deere & Company Device for detecting wear of an electrically resistive wear member

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3644051A1 (en) * 2018-10-26 2020-04-29 Deere & Company Device for detecting wear of an electrically resistive wear member
US11549797B2 (en) 2018-10-26 2023-01-10 Deere & Company Device for detecting wear of replaceable components
US11719526B2 (en) 2018-10-26 2023-08-08 Deere & Company Device for detecting wear of replacable components
CN111006960A (en) * 2019-11-08 2020-04-14 宇龙计算机通信科技(深圳)有限公司 Test pressure head and wear-resisting testing arrangement

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