JP1536854S - - Google Patents
Info
- Publication number
- JP1536854S JP1536854S JPD2014-28000F JP2014028000F JP1536854S JP 1536854 S JP1536854 S JP 1536854S JP 2014028000 F JP2014028000 F JP 2014028000F JP 1536854 S JP1536854 S JP 1536854S
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US29/494,233 USD806892S1 (en) | 2014-06-18 | 2014-06-18 | Tip of a sample holder |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JP1536854S true JP1536854S (de) | 2015-11-02 |
Family
ID=54353812
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JPD2014-28000F Active JP1536854S (de) | 2014-06-18 | 2014-12-16 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | USD806892S1 (de) |
| JP (1) | JP1536854S (de) |
Families Citing this family (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD841183S1 (en) * | 2016-03-08 | 2019-02-19 | Protochips, Inc. | Window E-chip for an electron microscope |
| JP1619171S (de) | 2018-01-19 | 2018-11-26 | ||
| JP1614365S (de) | 2018-01-19 | 2018-09-25 | ||
| JP1614535S (de) * | 2018-01-19 | 2018-09-25 | ||
| JP1614369S (de) * | 2018-01-19 | 2018-09-25 | ||
| USD895832S1 (en) | 2018-01-19 | 2020-09-08 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
| JP1614541S (de) | 2018-01-19 | 2018-09-25 | ||
| JP1614536S (de) * | 2018-01-19 | 2018-09-25 | ||
| JP1614364S (de) | 2018-01-19 | 2018-09-25 | ||
| USD891635S1 (en) * | 2018-01-19 | 2020-07-28 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
| USD894421S1 (en) * | 2018-01-19 | 2020-08-25 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
| JP1619173S (de) * | 2018-01-19 | 2018-11-26 | ||
| USD898940S1 (en) | 2018-01-19 | 2020-10-13 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
| USD901715S1 (en) | 2018-01-19 | 2020-11-10 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
| USD895835S1 (en) | 2018-01-19 | 2020-09-08 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
| JP1614542S (de) | 2018-01-19 | 2018-09-25 | ||
| JP1614538S (de) | 2018-01-19 | 2018-09-25 | ||
| USD895142S1 (en) * | 2018-01-19 | 2020-09-01 | Hamamatsu Photonics K.K. | Sample holder for ionized sample analysis |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| AU103430S (en) * | 1987-12-10 | 1989-03-23 | Mb Group Plc | A test strip |
| US4974244A (en) * | 1988-08-04 | 1990-11-27 | Angelo M. Torrisi | Sample positioning method and system for X-ray spectroscopic analysis |
| US5084910A (en) * | 1990-12-17 | 1992-01-28 | Dow Corning Corporation | X-ray diffractometer sample holder |
| US5127039A (en) * | 1991-01-16 | 1992-06-30 | The United States Of America As Represented By The United States Department Of Energy | Sample holder for X-ray diffractometry |
| EP0538861B1 (de) * | 1991-10-24 | 1999-06-16 | Hitachi, Ltd. | Probenhalter für Elektronenmikroskop |
| US5350923A (en) * | 1992-02-06 | 1994-09-27 | Northern Telecom Limited | Apparatus for use with analytical measuring instruments using electromagnetic radiation analysis methods |
| US5359640A (en) * | 1993-08-10 | 1994-10-25 | Siemens Industrial Automation, Inc. | X-ray micro diffractometer sample positioner |
| US5698856A (en) * | 1996-08-05 | 1997-12-16 | Frasca; Peter | Specimen holder for electron microscope |
| US6968037B2 (en) * | 2002-04-10 | 2005-11-22 | Bristol-Myers Squibb Co. | High throughput X-ray diffraction filter sample holder |
| JP4711430B2 (ja) * | 2006-08-01 | 2011-06-29 | 株式会社リガク | Ｘ線回折装置 |
| US7986005B2 (en) * | 2007-07-27 | 2011-07-26 | Infineon Technologies Austria Ag | Short circuit limiting in power semiconductor devices |
| USD628709S1 (en) * | 2007-11-30 | 2010-12-07 | X-Ray Optical Systems, Inc. | Sample cell for x-ray analyzer |
-
2014
- 2014-06-18 US US29/494,233 patent/USD806892S1/en active Active
- 2014-12-16 JP JPD2014-28000F patent/JP1536854S/ja active Active
Also Published As
| Publication number | Publication date |
|---|---|
| USD806892S1 (en) | 2018-01-02 |