JP1524346S - - Google Patents
Info
- Publication number
- JP1524346S JP1524346S JPD2014-22941F JP2014022941F JP1524346S JP 1524346 S JP1524346 S JP 1524346S JP 2014022941 F JP2014022941 F JP 2014022941F JP 1524346 S JP1524346 S JP 1524346S
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
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Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPD2014-22941F JP1524346S (ko) | 2014-10-14 | 2014-10-14 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPD2014-22941F JP1524346S (ko) | 2014-10-14 | 2014-10-14 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JP1524346S true JP1524346S (ko) | 2015-05-25 |
Family
ID=53511943
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JPD2014-22941F Active JP1524346S (ko) | 2014-10-14 | 2014-10-14 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP1524346S (ko) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11656184B2 (en) | 2018-10-11 | 2023-05-23 | Nanotronics Imaging, Inc. | Macro inspection systems, apparatus and methods |
| US11663703B2 (en) | 2019-08-07 | 2023-05-30 | Nanotronics Imaging, Inc. | System, method and apparatus for macroscopic inspection of reflective specimens |
| US11961210B2 (en) | 2019-08-07 | 2024-04-16 | Nanotronics Imaging, Inc. | System, method and apparatus for macroscopic inspection of reflective specimens |
-
2014
- 2014-10-14 JP JPD2014-22941F patent/JP1524346S/ja active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11656184B2 (en) | 2018-10-11 | 2023-05-23 | Nanotronics Imaging, Inc. | Macro inspection systems, apparatus and methods |
| US11663703B2 (en) | 2019-08-07 | 2023-05-30 | Nanotronics Imaging, Inc. | System, method and apparatus for macroscopic inspection of reflective specimens |
| US11961210B2 (en) | 2019-08-07 | 2024-04-16 | Nanotronics Imaging, Inc. | System, method and apparatus for macroscopic inspection of reflective specimens |