IT983459B - SYSTEM FOR PERFORMING TEST TESTS OF ELECTRONIC AND ELECTRONIC COMPONENTS OF THE ANA LOGIC TYPE - Google Patents

SYSTEM FOR PERFORMING TEST TESTS OF ELECTRONIC AND ELECTRONIC COMPONENTS OF THE ANA LOGIC TYPE

Info

Publication number
IT983459B
IT983459B IT2053873A IT2053873A IT983459B IT 983459 B IT983459 B IT 983459B IT 2053873 A IT2053873 A IT 2053873A IT 2053873 A IT2053873 A IT 2053873A IT 983459 B IT983459 B IT 983459B
Authority
IT
Italy
Prior art keywords
electronic
performing test
logic type
test tests
electronic components
Prior art date
Application number
IT2053873A
Other languages
Italian (it)
Inventor
B Bertossa
Original Assignee
Siemens Spa Italiana
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Spa Italiana filed Critical Siemens Spa Italiana
Priority to IT2053873A priority Critical patent/IT983459B/en
Priority to FR7342155A priority patent/FR2218721B1/fr
Priority to ES421945A priority patent/ES421945A1/en
Priority to DE19742407963 priority patent/DE2407963A1/en
Application granted granted Critical
Publication of IT983459B publication Critical patent/IT983459B/en

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M3/00—Automatic or semi-automatic exchanges
    • H04M3/22—Arrangements for supervision, monitoring or testing
    • H04M3/24—Arrangements for supervision, monitoring or testing with provision for checking the normal operation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors

Landscapes

  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
IT2053873A 1973-02-19 1973-02-19 SYSTEM FOR PERFORMING TEST TESTS OF ELECTRONIC AND ELECTRONIC COMPONENTS OF THE ANA LOGIC TYPE IT983459B (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
IT2053873A IT983459B (en) 1973-02-19 1973-02-19 SYSTEM FOR PERFORMING TEST TESTS OF ELECTRONIC AND ELECTRONIC COMPONENTS OF THE ANA LOGIC TYPE
FR7342155A FR2218721B1 (en) 1973-02-19 1973-11-27
ES421945A ES421945A1 (en) 1973-02-19 1973-12-31 System for carrying out acceptance tests of electronic and electronic components of analogy type. (Machine-translation by Google Translate, not legally binding)
DE19742407963 DE2407963A1 (en) 1973-02-19 1974-02-19 CIRCUIT ARRANGEMENT FOR ACCEPTANCE TESTING OF CIRCUIT COMPONENTS

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT2053873A IT983459B (en) 1973-02-19 1973-02-19 SYSTEM FOR PERFORMING TEST TESTS OF ELECTRONIC AND ELECTRONIC COMPONENTS OF THE ANA LOGIC TYPE

Publications (1)

Publication Number Publication Date
IT983459B true IT983459B (en) 1974-10-31

Family

ID=11168444

Family Applications (1)

Application Number Title Priority Date Filing Date
IT2053873A IT983459B (en) 1973-02-19 1973-02-19 SYSTEM FOR PERFORMING TEST TESTS OF ELECTRONIC AND ELECTRONIC COMPONENTS OF THE ANA LOGIC TYPE

Country Status (4)

Country Link
DE (1) DE2407963A1 (en)
ES (1) ES421945A1 (en)
FR (1) FR2218721B1 (en)
IT (1) IT983459B (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2405607A1 (en) * 1977-10-10 1979-05-04 Cit Alcatel ELECTRICAL CONTROL SYSTEM
EP0128946A4 (en) * 1982-12-15 1988-03-22 Equipment Sales Company Inc High speed testing of complex circuits.
GB2157922B (en) * 1984-03-14 1988-01-13 Teradyne Inc Relay multiplexing for circuit testers
JPH0743413B2 (en) * 1984-05-09 1995-05-15 三菱電機株式会社 Semiconductor test equipment

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3219927A (en) * 1958-09-15 1965-11-23 North American Aviation Inc Automatic functional test equipment utilizing digital programmed storage means
US3546582A (en) * 1968-01-15 1970-12-08 Ibm Computer controlled test system for performing functional tests on monolithic devices
US3597682A (en) * 1968-11-12 1971-08-03 E H Research Lab Inc Programmable testing unit for single shot testing

Also Published As

Publication number Publication date
DE2407963A1 (en) 1974-11-21
FR2218721A1 (en) 1974-09-13
ES421945A1 (en) 1976-05-01
FR2218721B1 (en) 1977-06-10

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