IT8822224A0 - CONTACT DEVICE. - Google Patents

CONTACT DEVICE.

Info

Publication number
IT8822224A0
IT8822224A0 IT8822224A IT2222488A IT8822224A0 IT 8822224 A0 IT8822224 A0 IT 8822224A0 IT 8822224 A IT8822224 A IT 8822224A IT 2222488 A IT2222488 A IT 2222488A IT 8822224 A0 IT8822224 A0 IT 8822224A0
Authority
IT
Italy
Prior art keywords
contact device
contact
Prior art date
Application number
IT8822224A
Other languages
Italian (it)
Other versions
IT1228167B (en
Inventor
Klaus Giringer
Original Assignee
Feinmetal Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Feinmetal Gmbh filed Critical Feinmetal Gmbh
Publication of IT8822224A0 publication Critical patent/IT8822224A0/en
Application granted granted Critical
Publication of IT1228167B publication Critical patent/IT1228167B/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02Contact members
    • H01R13/22Contacts for co-operating by abutting
    • H01R13/24Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2407Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
    • H01R13/2421Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means using coil springs
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716Elastic
    • G01R1/06722Spring-loaded
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • G01R1/07307Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R11/00Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
    • H01R11/11End pieces or tapping pieces for wires, supported by the wire and for facilitating electrical connection to some other wire, terminal or conductive member
    • H01R11/18End pieces terminating in a probe

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
IT8822224A 1987-10-09 1988-10-07 CONTACT DEVICE. IT1228167B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE3734195 1987-10-09

Publications (2)

Publication Number Publication Date
IT8822224A0 true IT8822224A0 (en) 1988-10-07
IT1228167B IT1228167B (en) 1991-05-31

Family

ID=6337981

Family Applications (1)

Application Number Title Priority Date Filing Date
IT8822224A IT1228167B (en) 1987-10-09 1988-10-07 CONTACT DEVICE.

Country Status (4)

Country Link
CH (1) CH676510A5 (en)
DE (1) DE3832410C2 (en)
FR (1) FR2621701B1 (en)
IT (1) IT1228167B (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2236630A (en) * 1989-10-02 1991-04-10 Tektronix Inc Twist lock probe tip
TW441227B (en) 1995-05-26 2001-06-16 E Tec Ag Contact arrangement for detachably attaching an electric component, especially an integrated circuit to a printed circuit board
CH693478A5 (en) 1996-05-10 2003-08-15 E Tec Ag Contact socket for detachable connection of IC to PCB
US6937045B2 (en) * 2002-07-18 2005-08-30 Aries Electronics, Inc. Shielded integrated circuit probe
FR2887034A1 (en) * 2005-06-08 2006-12-15 Wan Chuan Chou Signal transmitting method for probe, involves compressing metal spring and passing signal through spring, where spring includes intermediate portion and two end portions that are connected to starting terminal

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1800657C3 (en) * 1968-10-02 1975-05-22 Siemens Ag, 1000 Berlin Und 8000 Muenchen Contact device, in particular for the electrical testing of the lines of printed or etched circuit boards
CA1162243A (en) * 1979-12-26 1984-02-14 Jonathon H. Katz Test pin
US4496903A (en) * 1981-05-11 1985-01-29 Burroughs Corporation Circuit board test fixture
HU192083B (en) * 1984-11-29 1987-05-28 Bhg Hiradastech Vallalat Testing probe for testing printed wiring and printed circuit panels
DE3500227A1 (en) * 1985-01-05 1986-07-10 Riba-Prüftechnik GmbH, 7801 Schallstadt Probe needle
AT395485B (en) * 1985-01-22 1993-01-25 Feinmetall Gmbh PRUEFADAPTER

Also Published As

Publication number Publication date
DE3832410C2 (en) 1994-07-28
CH676510A5 (en) 1991-01-31
IT1228167B (en) 1991-05-31
FR2621701B1 (en) 1992-10-02
FR2621701A1 (en) 1989-04-14
DE3832410A1 (en) 1989-04-20

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