IT8423301A0 - DEVICE, EQUIPMENT AND PROCEDURE FOR THE DETECTION OF THERMAL NEUTRONS. - Google Patents

DEVICE, EQUIPMENT AND PROCEDURE FOR THE DETECTION OF THERMAL NEUTRONS.

Info

Publication number
IT8423301A0
IT8423301A0 IT8423301A IT2330184A IT8423301A0 IT 8423301 A0 IT8423301 A0 IT 8423301A0 IT 8423301 A IT8423301 A IT 8423301A IT 2330184 A IT2330184 A IT 2330184A IT 8423301 A0 IT8423301 A0 IT 8423301A0
Authority
IT
Italy
Prior art keywords
procedure
detection
equipment
thermal neutrons
neutrons
Prior art date
Application number
IT8423301A
Other languages
Italian (it)
Other versions
IT1213233B (en
Inventor
Gianfranco Cerofolini
Original Assignee
Sgs Thomson Microelectronics
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sgs Thomson Microelectronics filed Critical Sgs Thomson Microelectronics
Priority to IT8423301A priority Critical patent/IT1213233B/en
Publication of IT8423301A0 publication Critical patent/IT8423301A0/en
Priority to GB08525754A priority patent/GB2166280A/en
Priority to FR8515769A priority patent/FR2572540A1/en
Priority to DE19853537802 priority patent/DE3537802A1/en
Application granted granted Critical
Publication of IT1213233B publication Critical patent/IT1213233B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T3/00—Measuring neutron radiation
    • G01T3/08—Measuring neutron radiation with semiconductor detectors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
    • H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
    • H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
    • H01L25/041—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L31/00
    • H01L25/042—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L31/00 the devices being arranged next to each other
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
    • H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by at least one potential-jump barrier or surface barrier, e.g. phototransistors
    • H01L31/115—Devices sensitive to very short wavelength, e.g. X-rays, gamma-rays or corpuscular radiation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Molecular Biology (AREA)
  • Health & Medical Sciences (AREA)
  • Sustainable Development (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Electromagnetism (AREA)
  • Measurement Of Radiation (AREA)
IT8423301A 1984-10-25 1984-10-25 DEVICE, PROCESSING EQUIPMENT FOR THE DETECTION OF THERMAL NEUTRONS. IT1213233B (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
IT8423301A IT1213233B (en) 1984-10-25 1984-10-25 DEVICE, PROCESSING EQUIPMENT FOR THE DETECTION OF THERMAL NEUTRONS.
GB08525754A GB2166280A (en) 1984-10-25 1985-10-18 Semiconductor thermal neutron detector and thermal neutron detection method
FR8515769A FR2572540A1 (en) 1984-10-25 1985-10-23 DETECTOR AND METHOD FOR DETECTION OF THERMAL NEUTRONS
DE19853537802 DE3537802A1 (en) 1984-10-25 1985-10-24 SEMICONDUCTOR DETECTOR FOR DETECTING THERMAL NEUTRON

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT8423301A IT1213233B (en) 1984-10-25 1984-10-25 DEVICE, PROCESSING EQUIPMENT FOR THE DETECTION OF THERMAL NEUTRONS.

Publications (2)

Publication Number Publication Date
IT8423301A0 true IT8423301A0 (en) 1984-10-25
IT1213233B IT1213233B (en) 1989-12-14

Family

ID=11205856

Family Applications (1)

Application Number Title Priority Date Filing Date
IT8423301A IT1213233B (en) 1984-10-25 1984-10-25 DEVICE, PROCESSING EQUIPMENT FOR THE DETECTION OF THERMAL NEUTRONS.

Country Status (4)

Country Link
DE (1) DE3537802A1 (en)
FR (1) FR2572540A1 (en)
GB (1) GB2166280A (en)
IT (1) IT1213233B (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1991009425A1 (en) * 1989-12-07 1991-06-27 Teleki Peter Method of manufacturing a solid-state device and solid-state device, particularly semiconductor device
US5707879A (en) * 1997-01-08 1998-01-13 Reinitz; Karl Neutron detector based on semiconductor materials
US9261468B2 (en) 2010-07-23 2016-02-16 Ut-Battelle, Llc Multi-particle inspection using associated particle sources
US8586939B2 (en) 2010-07-23 2013-11-19 Ut-Battelle, Llc Multiple source associated particle imaging for simultaneous capture of multiple projections
FR3030781B1 (en) 2014-12-19 2016-12-16 Commissariat Energie Atomique METHOD FOR MAKING A NEUTRON DETECTOR AND NEUTRON SENSOR
CN109016198B (en) * 2018-07-24 2020-06-02 滁州中星光电科技有限公司 Sapphire window assembly production process

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB800636A (en) * 1955-03-18 1958-08-27 Siemens Ag Improvements in or relating to methods and devices for the sensing of neutrons
GB862425A (en) * 1956-03-09 1961-03-08 Siemens Ag Improvements in or relating to methods of testing neutron radiation
BE576106A (en) * 1958-03-04 1959-06-15 Commissariat Energie Atomique Improvements in neutron flux detection methods.
US3312823A (en) * 1961-07-07 1967-04-04 Mobil Oil Corp Semiconductor radiation detector for use in nuclear well logging
GB1076826A (en) * 1964-10-28 1967-07-26 Vakutronik Veb High sensitivity neutron ionisation chamber
ZA696958B (en) * 1968-10-03 1971-05-27 Fizichesky I Im Pn Lebedeva Device for neutron detection
BE758334A (en) * 1969-11-04 1971-04-01 Eastman Kodak Co PRODUCT FOR NEUTROGRAPHY
FR2184535B1 (en) * 1972-05-19 1980-03-21 Commissariat Energie Atomique
GB1520903A (en) * 1974-08-29 1978-08-09 France Armed Forces Nuclear radiation detector

Also Published As

Publication number Publication date
GB2166280A (en) 1986-04-30
DE3537802A1 (en) 1986-04-30
GB8525754D0 (en) 1985-11-20
FR2572540A1 (en) 1986-05-02
IT1213233B (en) 1989-12-14

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