IT7824513A0 - Dispositivo per individuare punti difettosi sulla superficie riflettente di un nastro. - Google Patents

Dispositivo per individuare punti difettosi sulla superficie riflettente di un nastro.

Info

Publication number
IT7824513A0
IT7824513A0 IT7824513A IT2451378A IT7824513A0 IT 7824513 A0 IT7824513 A0 IT 7824513A0 IT 7824513 A IT7824513 A IT 7824513A IT 2451378 A IT2451378 A IT 2451378A IT 7824513 A0 IT7824513 A0 IT 7824513A0
Authority
IT
Italy
Prior art keywords
tape
reflective surface
identifying defective
defective points
points
Prior art date
Application number
IT7824513A
Other languages
English (en)
Other versions
IT1096673B (it
Original Assignee
Sick Optik Elektronik Erwin
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sick Optik Elektronik Erwin filed Critical Sick Optik Elektronik Erwin
Publication of IT7824513A0 publication Critical patent/IT7824513A0/it
Application granted granted Critical
Publication of IT1096673B publication Critical patent/IT1096673B/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
IT24513/78A 1977-06-21 1978-06-13 Dispositivo per individuare punti difettosi sulla superficie riflettente di un nastro IT1096673B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2727926A DE2727926C3 (de) 1977-06-21 1977-06-21 Vorrichtung zur Ermittlung von Fehlstellen auf der reflektierenden Oberfläche einer Bahn

Publications (2)

Publication Number Publication Date
IT7824513A0 true IT7824513A0 (it) 1978-06-13
IT1096673B IT1096673B (it) 1985-08-26

Family

ID=6011989

Family Applications (1)

Application Number Title Priority Date Filing Date
IT24513/78A IT1096673B (it) 1977-06-21 1978-06-13 Dispositivo per individuare punti difettosi sulla superficie riflettente di un nastro

Country Status (4)

Country Link
JP (1) JPS548583A (it)
DE (1) DE2727926C3 (it)
GB (1) GB1598244A (it)
IT (1) IT1096673B (it)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2827705C3 (de) * 1978-06-23 1981-07-30 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Gerät zur Feststellung von Fehlern an Bahnmaterial
DE2836280C3 (de) * 1978-08-18 1981-04-30 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optische Abtastvorrichtung für kontinuierlich fortbewegte Materialbahnen
IT1126842B (it) * 1979-12-21 1986-05-21 Autostrade Concessioni & Costr Retroriflettometro perfezionato a lettura diretta
DE3000352C2 (de) * 1980-01-07 1986-07-24 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optoelektronisches Überwachungsgerät
US4335316A (en) * 1980-04-09 1982-06-15 Baldwin-Korthe Web Controls, Inc. Web break detector with adjustable scanning head
DE3036886A1 (de) * 1980-09-30 1982-05-13 Siemens AG, 1000 Berlin und 8000 München Verfahren zum korrigieren eines messsignals
DE3212190A1 (de) * 1982-04-01 1983-10-06 Siemens Ag Opto-elektronische unterscheidung von strukturen auf oberflaechen
DE3232885A1 (de) * 1982-09-04 1984-03-08 Robert Bosch Gmbh, 7000 Stuttgart Verfahren zur automatischen pruefung von oberflaechen
DE3428435A1 (de) * 1984-08-01 1986-02-06 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Rauheitssonde
DE3446355C2 (de) * 1984-12-19 1986-11-06 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optisches Fehlersuchgerät
DE3540916A1 (de) * 1985-11-19 1987-05-21 Zeiss Carl Fa Verfahren und vorrichtung zur raster-lichtmikroskopischen darstellung von objekten im dunkelfeld

Also Published As

Publication number Publication date
IT1096673B (it) 1985-08-26
DE2727926B2 (de) 1980-02-14
JPS548583A (en) 1979-01-22
DE2727926C3 (de) 1980-11-13
DE2727926A1 (de) 1979-01-11
GB1598244A (en) 1981-09-16

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