IT202200002168A1 - SYSTEM FOR THE AUTOMATED MEASUREMENT OF SUPERFICIAL LESIONS - Google Patents

SYSTEM FOR THE AUTOMATED MEASUREMENT OF SUPERFICIAL LESIONS Download PDF

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Publication number
IT202200002168A1
IT202200002168A1 IT102022000002168A IT202200002168A IT202200002168A1 IT 202200002168 A1 IT202200002168 A1 IT 202200002168A1 IT 102022000002168 A IT102022000002168 A IT 102022000002168A IT 202200002168 A IT202200002168 A IT 202200002168A IT 202200002168 A1 IT202200002168 A1 IT 202200002168A1
Authority
IT
Italy
Prior art keywords
automated measurement
superficial lesions
superficial
lesions
automated
Prior art date
Application number
IT102022000002168A
Other languages
Italian (it)
Inventor
Nicola Giulietti
Paolo Chiariotti
Gian Marco Revel
Original Assignee
Univ Politecnica Delle Marche
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univ Politecnica Delle Marche filed Critical Univ Politecnica Delle Marche
Priority to IT102022000002168A priority Critical patent/IT202200002168A1/en
Publication of IT202200002168A1 publication Critical patent/IT202200002168A1/en

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Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/40—Extraction of image or video features
    • G06V10/44—Local feature extraction by analysis of parts of the pattern, e.g. by detecting edges, contours, loops, corners, strokes or intersections; Connectivity analysis, e.g. of connected components

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  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Multimedia (AREA)
  • Theoretical Computer Science (AREA)
IT102022000002168A 2022-02-07 2022-02-07 SYSTEM FOR THE AUTOMATED MEASUREMENT OF SUPERFICIAL LESIONS IT202200002168A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
IT102022000002168A IT202200002168A1 (en) 2022-02-07 2022-02-07 SYSTEM FOR THE AUTOMATED MEASUREMENT OF SUPERFICIAL LESIONS

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT102022000002168A IT202200002168A1 (en) 2022-02-07 2022-02-07 SYSTEM FOR THE AUTOMATED MEASUREMENT OF SUPERFICIAL LESIONS

Publications (1)

Publication Number Publication Date
IT202200002168A1 true IT202200002168A1 (en) 2023-08-07

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Application Number Title Priority Date Filing Date
IT102022000002168A IT202200002168A1 (en) 2022-02-07 2022-02-07 SYSTEM FOR THE AUTOMATED MEASUREMENT OF SUPERFICIAL LESIONS

Country Status (1)

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IT (1) IT202200002168A1 (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013020142A2 (en) 2011-08-04 2013-02-07 University Of Southern California Image-based crack detection
US20190154442A1 (en) * 2016-01-15 2019-05-23 Fugro Roadware Inc. High speed stereoscopic pavement surface scanning system and method
US20200364849A1 (en) 2018-01-03 2020-11-19 Southeast University Method and device for automatically drawing structural cracks and precisely measuring widths thereof

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013020142A2 (en) 2011-08-04 2013-02-07 University Of Southern California Image-based crack detection
US20190154442A1 (en) * 2016-01-15 2019-05-23 Fugro Roadware Inc. High speed stereoscopic pavement surface scanning system and method
US20200364849A1 (en) 2018-01-03 2020-11-19 Southeast University Method and device for automatically drawing structural cracks and precisely measuring widths thereof

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
CAO WENMING ET AL: "Review of Pavement Defect Detection Methods", IEEE ACCESS, IEEE, USA, vol. 8, 14 January 2020 (2020-01-14), pages 14531 - 14544, XP011768466, DOI: 10.1109/ACCESS.2020.2966881 *
HAN JIALI ET AL: "Urban Scene LOD Vectorized Modeling From Photogrammetry Meshes", IEEE TRANSACTIONS ON IMAGE PROCESSING, IEEE, USA, vol. 30, 27 August 2021 (2021-08-27), pages 7458 - 7471, XP011875733, ISSN: 1057-7149, [retrieved on 20210831], DOI: 10.1109/TIP.2021.3106811 *

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