IT201900008994A1 - RADAR SYSTEM TO MEASURE THE THICKNESS OF AN OBJECT AND METHOD TO MEASURE THE THICKNESS OF AN OBJECT. - Google Patents

RADAR SYSTEM TO MEASURE THE THICKNESS OF AN OBJECT AND METHOD TO MEASURE THE THICKNESS OF AN OBJECT.

Info

Publication number
IT201900008994A1
IT201900008994A1 IT102019000008994A IT201900008994A IT201900008994A1 IT 201900008994 A1 IT201900008994 A1 IT 201900008994A1 IT 102019000008994 A IT102019000008994 A IT 102019000008994A IT 201900008994 A IT201900008994 A IT 201900008994A IT 201900008994 A1 IT201900008994 A1 IT 201900008994A1
Authority
IT
Italy
Prior art keywords
measure
thickness
radar system
radar
Prior art date
Application number
IT102019000008994A
Other languages
Italian (it)
Inventor
Davide D'aria
Original Assignee
Aresys S R L
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Aresys S R L filed Critical Aresys S R L
Priority to IT102019000008994A priority Critical patent/IT201900008994A1/en
Publication of IT201900008994A1 publication Critical patent/IT201900008994A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S13/00—Systems using the reflection or reradiation of radio waves, e.g. radar systems; Analogous systems using reflection or reradiation of waves whose nature or wavelength is irrelevant or unspecified
    • G01S13/88—Radar or analogous systems specially adapted for specific applications
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S13/00—Systems using the reflection or reradiation of radio waves, e.g. radar systems; Analogous systems using reflection or reradiation of waves whose nature or wavelength is irrelevant or unspecified
    • G01S13/02—Systems using reflection of radio waves, e.g. primary radar systems; Analogous systems
    • G01S13/06—Systems determining position data of a target
    • G01S13/08—Systems for measuring distance only
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/02—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S13/00
    • G01S7/40—Means for monitoring or calibrating
    • G01S7/4052—Means for monitoring or calibrating by simulation of echoes
    • G01S7/406—Means for monitoring or calibrating by simulation of echoes using internally generated reference signals, e.g. via delay line, via RF or IF signal injection or via integrated reference reflector or transponder

Landscapes

  • Engineering & Computer Science (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Physics & Mathematics (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
IT102019000008994A 2019-06-14 2019-06-14 RADAR SYSTEM TO MEASURE THE THICKNESS OF AN OBJECT AND METHOD TO MEASURE THE THICKNESS OF AN OBJECT. IT201900008994A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
IT102019000008994A IT201900008994A1 (en) 2019-06-14 2019-06-14 RADAR SYSTEM TO MEASURE THE THICKNESS OF AN OBJECT AND METHOD TO MEASURE THE THICKNESS OF AN OBJECT.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT102019000008994A IT201900008994A1 (en) 2019-06-14 2019-06-14 RADAR SYSTEM TO MEASURE THE THICKNESS OF AN OBJECT AND METHOD TO MEASURE THE THICKNESS OF AN OBJECT.

Publications (1)

Publication Number Publication Date
IT201900008994A1 true IT201900008994A1 (en) 2020-12-14

Family

ID=68234167

Family Applications (1)

Application Number Title Priority Date Filing Date
IT102019000008994A IT201900008994A1 (en) 2019-06-14 2019-06-14 RADAR SYSTEM TO MEASURE THE THICKNESS OF AN OBJECT AND METHOD TO MEASURE THE THICKNESS OF AN OBJECT.

Country Status (1)

Country Link
IT (1) IT201900008994A1 (en)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1997007416A1 (en) * 1995-08-18 1997-02-27 London Electricity Plc System for and method of determining the location of an object in a medium
US5673050A (en) * 1996-06-14 1997-09-30 Moussally; George Three-dimensional underground imaging radar system
US6130637A (en) 1998-08-18 2000-10-10 Usx Corporation Measuring the thickness of hot slag in steelmaking
WO2007149918A2 (en) * 2006-06-20 2007-12-27 Rehabtek High-resolution ultrasound displacement measurement apparatus and method

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1997007416A1 (en) * 1995-08-18 1997-02-27 London Electricity Plc System for and method of determining the location of an object in a medium
US5673050A (en) * 1996-06-14 1997-09-30 Moussally; George Three-dimensional underground imaging radar system
US6130637A (en) 1998-08-18 2000-10-10 Usx Corporation Measuring the thickness of hot slag in steelmaking
WO2007149918A2 (en) * 2006-06-20 2007-12-27 Rehabtek High-resolution ultrasound displacement measurement apparatus and method

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
N. S. SCHREINER ET AL., HIGH-RESOLUTION FMCW MILLIMETER-WAVE TERAHERTZ AND THICKNESS MEASUREMENTS
STEFAN KREMLING SKZ ET AL.: "PIPES", GERMAN PLASTICS CENTER WURZBURG, GERMANY, article "potentials of terahertz TECHNOLOGY FOR THE INSPECTION OF PLASTIC"
VAN DEN BERGFRENKYANG: "Real-time Bionix Meniscus level and slag Thickness Measurement by radar", HAIBING, 2011

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