IT201700040531A1 - Method for vectorial measurement of electric fields and related equipment. - Google Patents

Method for vectorial measurement of electric fields and related equipment.

Info

Publication number
IT201700040531A1
IT201700040531A1 IT102017000040531A IT201700040531A IT201700040531A1 IT 201700040531 A1 IT201700040531 A1 IT 201700040531A1 IT 102017000040531 A IT102017000040531 A IT 102017000040531A IT 201700040531 A IT201700040531 A IT 201700040531A IT 201700040531 A1 IT201700040531 A1 IT 201700040531A1
Authority
IT
Italy
Prior art keywords
electric fields
related equipment
vectorial measurement
vectorial
measurement
Prior art date
Application number
IT102017000040531A
Other languages
Italian (it)
Inventor
Luca Barbieri
Villa Andrea Barbareschi
Marco Gondola
Roberto Malgesini
Marco Alberto Carlo Potenza
Original Assignee
Ricerca Sul Sist Energetico Rse S P A
Univ Degli Studi Milano
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ricerca Sul Sist Energetico Rse S P A, Univ Degli Studi Milano filed Critical Ricerca Sul Sist Energetico Rse S P A
Priority to IT102017000040531A priority Critical patent/IT201700040531A1/en
Priority to EP18723964.5A priority patent/EP3610273A1/en
Priority to PCT/IB2018/052532 priority patent/WO2018189692A1/en
Publication of IT201700040531A1 publication Critical patent/IT201700040531A1/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08Measuring electromagnetic field characteristics
    • G01R29/0864Measuring electromagnetic field characteristics characterised by constructional or functional features
    • G01R29/0878Sensors; antennas; probes; detectors
    • G01R29/0885Sensors; antennas; probes; detectors using optical probes, e.g. electro-optical, luminescent, glow discharge, or optical interferometers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/22Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-emitting devices, e.g. LED, optocouplers

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
IT102017000040531A 2017-04-12 2017-04-12 Method for vectorial measurement of electric fields and related equipment. IT201700040531A1 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
IT102017000040531A IT201700040531A1 (en) 2017-04-12 2017-04-12 Method for vectorial measurement of electric fields and related equipment.
EP18723964.5A EP3610273A1 (en) 2017-04-12 2018-04-11 A method for vector measurement of electric fields and corresponding apparatus
PCT/IB2018/052532 WO2018189692A1 (en) 2017-04-12 2018-04-11 A method for vector measurement of electric fields and corresponding apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT102017000040531A IT201700040531A1 (en) 2017-04-12 2017-04-12 Method for vectorial measurement of electric fields and related equipment.

Publications (1)

Publication Number Publication Date
IT201700040531A1 true IT201700040531A1 (en) 2018-10-12

Family

ID=59683956

Family Applications (1)

Application Number Title Priority Date Filing Date
IT102017000040531A IT201700040531A1 (en) 2017-04-12 2017-04-12 Method for vectorial measurement of electric fields and related equipment.

Country Status (3)

Country Link
EP (1) EP3610273A1 (en)
IT (1) IT201700040531A1 (en)
WO (1) WO2018189692A1 (en)

Citations (10)

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US3527532A (en) * 1967-07-03 1970-09-08 North American Rockwell Digital optical frequency shifter
US5335066A (en) * 1991-08-29 1994-08-02 Nkk Corporation Measuring method for ellipsometric parameter and ellipsometer
JPH09264939A (en) * 1996-03-29 1997-10-07 Hitachi Cable Ltd Polarization-independent-type physical-quantity measuring method
US20020132383A1 (en) * 2001-03-19 2002-09-19 Semiconductor Energy Laboratory Co., Ltd. Method of manufacturing a semiconductor device
EP1310802A2 (en) * 2001-11-13 2003-05-14 NxtPhase Technology SRL Optical sensor for sensing of a magnetic field or a voltage
US20060072922A1 (en) * 2004-10-06 2006-04-06 Macdonald Gregory G Method for polarization-based intrusion monitoring in fiberoptic links
KR100826505B1 (en) * 2000-12-01 2008-05-02 도판 인사츠 가부시키가이샤 Circuit pattern detecting device and circuit pattern detecting method
US20090066952A1 (en) * 2007-09-06 2009-03-12 Dong Ho Wu Apparatus and system for electro magnetic field measurements and automatic analyses of phase modulated optical signals from electrooptic devices
JP2012103200A (en) * 2010-11-12 2012-05-31 National Institute Of Information & Communication Technology Modulation light analysis device and electric field or magnetic field measurement probe device using modulation light analysis device
EP2479581A1 (en) * 2011-01-21 2012-07-25 PowerSense A/S An AC or DC power transmission system and a method of measuring a voltage

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4588296A (en) * 1981-10-07 1986-05-13 Mcdonnell Douglas Corporation Compact optical gyro
US5113131A (en) * 1990-02-16 1992-05-12 Southern California Edison Company Voltage measuring device having electro-optic sensor and compensator
WO2001007881A1 (en) * 1999-07-27 2001-02-01 Colorado School Of Mines Parallel detecting, spectroscopic ellipsometers/polarimeters
US8692539B2 (en) * 2006-11-30 2014-04-08 Powersense A/S Faraday effect current sensor

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3527532A (en) * 1967-07-03 1970-09-08 North American Rockwell Digital optical frequency shifter
US5335066A (en) * 1991-08-29 1994-08-02 Nkk Corporation Measuring method for ellipsometric parameter and ellipsometer
JPH09264939A (en) * 1996-03-29 1997-10-07 Hitachi Cable Ltd Polarization-independent-type physical-quantity measuring method
KR100826505B1 (en) * 2000-12-01 2008-05-02 도판 인사츠 가부시키가이샤 Circuit pattern detecting device and circuit pattern detecting method
US20020132383A1 (en) * 2001-03-19 2002-09-19 Semiconductor Energy Laboratory Co., Ltd. Method of manufacturing a semiconductor device
EP1310802A2 (en) * 2001-11-13 2003-05-14 NxtPhase Technology SRL Optical sensor for sensing of a magnetic field or a voltage
US20060072922A1 (en) * 2004-10-06 2006-04-06 Macdonald Gregory G Method for polarization-based intrusion monitoring in fiberoptic links
US20090066952A1 (en) * 2007-09-06 2009-03-12 Dong Ho Wu Apparatus and system for electro magnetic field measurements and automatic analyses of phase modulated optical signals from electrooptic devices
JP2012103200A (en) * 2010-11-12 2012-05-31 National Institute Of Information & Communication Technology Modulation light analysis device and electric field or magnetic field measurement probe device using modulation light analysis device
EP2479581A1 (en) * 2011-01-21 2012-07-25 PowerSense A/S An AC or DC power transmission system and a method of measuring a voltage

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
"Computer Vision and Machine Learning with RGB-D Sensors", 1 January 2016, SPRINGER INTERNATIONAL PUBLISHING, Cham, ISBN: 978-3-319-08651-4, ISSN: 2191-6586, article YONGQIANG ZHAO ET AL: "Polarization Imaging", pages: 13 - 45, XP055432379, DOI: 10.1007/978-3-662-49373-1_2 *
VALK VAN DER N C J ET AL: "TERAHERTZ POLARIZATION IMAGING", OPTICS LETTERS, OPTICAL SOCIETY OF AMERICA, vol. 30, no. 20, 15 October 2005 (2005-10-15), pages 2802 - 2804, XP001235423, ISSN: 0146-9592, DOI: 10.1364/OL.30.002802 *

Also Published As

Publication number Publication date
EP3610273A1 (en) 2020-02-19
WO2018189692A1 (en) 2018-10-18

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