IT201600132813A1 - Metodo e apparato per rilevare particelle di dimensioni subdiffrattive - Google Patents

Metodo e apparato per rilevare particelle di dimensioni subdiffrattive

Info

Publication number
IT201600132813A1
IT201600132813A1 IT102016000132813A IT201600132813A IT201600132813A1 IT 201600132813 A1 IT201600132813 A1 IT 201600132813A1 IT 102016000132813 A IT102016000132813 A IT 102016000132813A IT 201600132813 A IT201600132813 A IT 201600132813A IT 201600132813 A1 IT201600132813 A1 IT 201600132813A1
Authority
IT
Italy
Prior art keywords
subdiffractive
detecting
dimensions
particles
dimensions particles
Prior art date
Application number
IT102016000132813A
Other languages
English (en)
Inventor
Lellis Giovanni De
Andrey Alexandrov
Valeri Tioukov
Nicola D'ambrosio
Original Assignee
Istituto Naz Fisica Nucleare
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Istituto Naz Fisica Nucleare filed Critical Istituto Naz Fisica Nucleare
Priority to IT102016000132813A priority Critical patent/IT201600132813A1/it
Priority to PCT/IB2017/058544 priority patent/WO2018122814A1/en
Publication of IT201600132813A1 publication Critical patent/IT201600132813A1/it

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/0092—Polarisation microscopes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G01N21/553—Attenuated total reflection and using surface plasmons
    • G01N21/554—Attenuated total reflection and using surface plasmons detecting the surface plasmon resonance of nanostructured metals, e.g. localised surface plasmon resonance
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N2015/0038—Investigating nanoparticles

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Optics & Photonics (AREA)
  • Dispersion Chemistry (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Nanotechnology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
IT102016000132813A 2016-12-30 2016-12-30 Metodo e apparato per rilevare particelle di dimensioni subdiffrattive IT201600132813A1 (it)

Priority Applications (2)

Application Number Priority Date Filing Date Title
IT102016000132813A IT201600132813A1 (it) 2016-12-30 2016-12-30 Metodo e apparato per rilevare particelle di dimensioni subdiffrattive
PCT/IB2017/058544 WO2018122814A1 (en) 2016-12-30 2017-12-30 Method and optical microscope for detecting particles having sub-diffractive size

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT102016000132813A IT201600132813A1 (it) 2016-12-30 2016-12-30 Metodo e apparato per rilevare particelle di dimensioni subdiffrattive

Publications (1)

Publication Number Publication Date
IT201600132813A1 true IT201600132813A1 (it) 2018-06-30

Family

ID=58671783

Family Applications (1)

Application Number Title Priority Date Filing Date
IT102016000132813A IT201600132813A1 (it) 2016-12-30 2016-12-30 Metodo e apparato per rilevare particelle di dimensioni subdiffrattive

Country Status (2)

Country Link
IT (1) IT201600132813A1 (it)
WO (1) WO2018122814A1 (it)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2020188368A1 (en) 2019-03-19 2020-09-24 Omek Optics Ltd. Unit magnification microscope
CN111855662B (zh) * 2019-04-30 2023-07-25 芯恩（青岛）集成电路有限公司 一种晶圆缺陷检测装置及方法
CN115657279A (zh) * 2022-11-02 2023-01-31 核工业西南物理研究院 一种光路结构及应用于磁约束等离子体的成像设备

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5521705A (en) * 1994-05-12 1996-05-28 Oldenbourg; Rudolf Polarized light microscopy
DE102005005757A1 (de) * 2005-02-07 2006-08-10 Octax Microscience Gmbh Anordnung und ein Verfahren zur mikroskop-optischen Erfassung von Anisotropien
EP2081070A2 (en) * 2008-01-18 2009-07-22 Gwangju Institute of Science and Technology Polariscopic phase microscope
WO2016191004A1 (en) * 2015-05-26 2016-12-01 Becton, Dickinson And Company Methods and systems for high resolution fluorescence microscopy of polymeric dye-labeled samples using polarized light

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5521705A (en) * 1994-05-12 1996-05-28 Oldenbourg; Rudolf Polarized light microscopy
DE102005005757A1 (de) * 2005-02-07 2006-08-10 Octax Microscience Gmbh Anordnung und ein Verfahren zur mikroskop-optischen Erfassung von Anisotropien
EP2081070A2 (en) * 2008-01-18 2009-07-22 Gwangju Institute of Science and Technology Polariscopic phase microscope
WO2016191004A1 (en) * 2015-05-26 2016-12-01 Becton, Dickinson And Company Methods and systems for high resolution fluorescence microscopy of polymeric dye-labeled samples using polarized light

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
YIKAI CHEN ET AL: "Surface-plasmon-coupled emission microscopy with a polarization converter", OPTICS LETTERS, OPTICAL SOCIETY OF AMERICA, vol. 38, no. 5, 1 March 2013 (2013-03-01), pages 736 - 738, XP001580595, ISSN: 0146-9592, DOI: HTTP://DX.DOI.ORG/10.1364/OL.38.000736 *

Also Published As

Publication number Publication date
WO2018122814A1 (en) 2018-07-05

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