IT1086177B - Apparecchio per misurare almeno una dimensione di un oggetto e procedimento per il funzionamento dell'apparecchio stesso - Google Patents

Apparecchio per misurare almeno una dimensione di un oggetto e procedimento per il funzionamento dell'apparecchio stesso

Info

Publication number
IT1086177B
IT1086177B IT23109/77A IT2310977A IT1086177B IT 1086177 B IT1086177 B IT 1086177B IT 23109/77 A IT23109/77 A IT 23109/77A IT 2310977 A IT2310977 A IT 2310977A IT 1086177 B IT1086177 B IT 1086177B
Authority
IT
Italy
Prior art keywords
dimension
measure
procedure
equipment itself
itself
Prior art date
Application number
IT23109/77A
Other languages
English (en)
Italian (it)
Original Assignee
Zumbach Electronic Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Zumbach Electronic Ag filed Critical Zumbach Electronic Ag
Application granted granted Critical
Publication of IT1086177B publication Critical patent/IT1086177B/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
    • G01B11/10—Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving
    • G01B11/105—Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving using photoelectric detection means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
IT23109/77A 1976-05-05 1977-05-03 Apparecchio per misurare almeno una dimensione di un oggetto e procedimento per il funzionamento dell'apparecchio stesso IT1086177B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CH560776A CH611017A5 (US06330241-20011211-M00004.png) 1976-05-05 1976-05-05

Publications (1)

Publication Number Publication Date
IT1086177B true IT1086177B (it) 1985-05-28

Family

ID=4296429

Family Applications (1)

Application Number Title Priority Date Filing Date
IT23109/77A IT1086177B (it) 1976-05-05 1977-05-03 Apparecchio per misurare almeno una dimensione di un oggetto e procedimento per il funzionamento dell'apparecchio stesso

Country Status (14)

Country Link
US (1) US4115702A (US06330241-20011211-M00004.png)
JP (1) JPS52134466A (US06330241-20011211-M00004.png)
AU (1) AU505346B2 (US06330241-20011211-M00004.png)
BE (1) BE854164A (US06330241-20011211-M00004.png)
CA (1) CA1071396A (US06330241-20011211-M00004.png)
CH (1) CH611017A5 (US06330241-20011211-M00004.png)
DE (1) DE2718807C2 (US06330241-20011211-M00004.png)
DK (1) DK184077A (US06330241-20011211-M00004.png)
ES (1) ES458433A1 (US06330241-20011211-M00004.png)
FR (1) FR2350581A1 (US06330241-20011211-M00004.png)
GB (1) GB1555874A (US06330241-20011211-M00004.png)
IT (1) IT1086177B (US06330241-20011211-M00004.png)
NL (1) NL7704638A (US06330241-20011211-M00004.png)
SE (1) SE7704821L (US06330241-20011211-M00004.png)

Families Citing this family (58)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4197888A (en) * 1978-02-21 1980-04-15 The Coe Manufacturing Company Log centering apparatus and method using transmitted light and reference edge log scanner
JPS5667704A (en) * 1979-11-08 1981-06-08 Kobe Steel Ltd Automatic nondestructive measuring method for eccentricity of coated welding rod
DE3261325D1 (en) * 1981-03-09 1985-01-10 Temova Ets Protective bandage for legs and joints of hoofed animals
DE3112026C2 (de) * 1981-03-26 1985-10-03 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 8000 München Vorrichtung zur Messung der Lage und Bewegung eines schwingfähigen Körpers
DE3229264C2 (de) * 1982-08-05 1986-01-02 Dipl.-Ing. Bruno Richter GmbH & Co. Elektronische Betriebskontroll-Geräte KG, 8602 Stegaurach Optisch-elektrische Meßeinrichtung zum Messen der Lage und/oder der Abmessung von Gegenständen
GB2124760B (en) * 1982-08-05 1986-02-12 Electricity Council Temperature of elongate articles
JPS5968606A (ja) * 1982-10-13 1984-04-18 Aichi Boseki Kk 繊維糸条体の太さむら検出装置
DE3334976A1 (de) * 1983-09-27 1985-04-18 Dr.-Ing. Wolfgang Schulz, Meßtechnik, 4020 Mettmann Verfahren und vorrichtung zur beruehrungslosen ermittlung von rundlaufabweichungen eines rotationskoerpers
DE3422988A1 (de) * 1984-06-22 1986-01-02 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 8000 München Verfahren und vorrichtung zum messen der querkontraktion einer laenglichen probe
CA1253620A (en) * 1985-04-30 1989-05-02 Jon Claesson Method relating to three dimensional measurement of objects
US4764015A (en) * 1986-12-31 1988-08-16 Owens-Illinois Television Products Inc. Method and apparatus for non-contact spatial measurement
DE3718192A1 (de) * 1987-05-29 1988-12-08 Hommelwerke Gmbh Vorrichtung zur messung des abstandes zwischen der vorrichtung und einer messflaeche
JPH0781833B2 (ja) * 1987-12-07 1995-09-06 日本たばこ産業株式会社 長さ測定装置
US6067379A (en) * 1988-12-09 2000-05-23 Cognex Corporation Method and apparatus for locating patterns in an optical image
JPH086244Y2 (ja) * 1990-08-07 1996-02-21 オムロン株式会社 寸法測定装置
US5371690A (en) * 1992-01-17 1994-12-06 Cognex Corporation Method and apparatus for inspection of surface mounted devices
US5383021A (en) * 1993-04-19 1995-01-17 Mectron Engineering Company Optical part inspection system
US5602937A (en) * 1994-06-01 1997-02-11 Cognex Corporation Methods and apparatus for machine vision high accuracy searching
US5801966A (en) * 1995-07-24 1998-09-01 Cognex Corporation Machine vision methods and articles of manufacture for determination of convex hull and convex hull angle
US6026176A (en) 1995-07-25 2000-02-15 Cognex Corporation Machine vision methods and articles of manufacture for ball grid array inspection
US5754679A (en) * 1995-10-31 1998-05-19 Cognex Corp. Image rotating method for locating bond pads in an image
US5757956A (en) * 1995-10-31 1998-05-26 Cognex Corp. Template rotating method for locating bond pads in an image
US5845007A (en) * 1996-01-02 1998-12-01 Cognex Corporation Machine vision method and apparatus for edge-based image histogram analysis
US5872870A (en) * 1996-02-16 1999-02-16 Cognex Corporation Machine vision methods for identifying extrema of objects in rotated reference frames
US5909504A (en) * 1996-03-15 1999-06-01 Cognex Corporation Method of testing a machine vision inspection system
US6298149B1 (en) 1996-03-21 2001-10-02 Cognex Corporation Semiconductor device image inspection with contrast enhancement
US6259827B1 (en) 1996-03-21 2001-07-10 Cognex Corporation Machine vision methods for enhancing the contrast between an object and its background using multiple on-axis images
US5949901A (en) * 1996-03-21 1999-09-07 Nichani; Sanjay Semiconductor device image inspection utilizing image subtraction and threshold imaging
US5978502A (en) * 1996-04-01 1999-11-02 Cognex Corporation Machine vision methods for determining characteristics of three-dimensional objects
US6137893A (en) * 1996-10-07 2000-10-24 Cognex Corporation Machine vision calibration targets and methods of determining their location and orientation in an image
US5960125A (en) * 1996-11-21 1999-09-28 Cognex Corporation Nonfeedback-based machine vision method for determining a calibration relationship between a camera and a moveable object
US5953130A (en) * 1997-01-06 1999-09-14 Cognex Corporation Machine vision methods and apparatus for machine vision illumination of an object
US6075881A (en) * 1997-03-18 2000-06-13 Cognex Corporation Machine vision methods for identifying collinear sets of points from an image
US5974169A (en) * 1997-03-20 1999-10-26 Cognex Corporation Machine vision methods for determining characteristics of an object using boundary points and bounding regions
US6141033A (en) * 1997-05-15 2000-10-31 Cognex Corporation Bandwidth reduction of multichannel images for machine vision
US6608647B1 (en) 1997-06-24 2003-08-19 Cognex Corporation Methods and apparatus for charge coupled device image acquisition with independent integration and readout
US5978080A (en) * 1997-09-25 1999-11-02 Cognex Corporation Machine vision methods using feedback to determine an orientation, pixel width and pixel height of a field of view
US6025854A (en) * 1997-12-31 2000-02-15 Cognex Corporation Method and apparatus for high speed image acquisition
US6236769B1 (en) 1998-01-28 2001-05-22 Cognex Corporation Machine vision systems and methods for morphological transformation of an image with zero or other uniform offsets
US6282328B1 (en) 1998-01-28 2001-08-28 Cognex Corporation Machine vision systems and methods for morphological transformation of an image with non-uniform offsets
US6215915B1 (en) 1998-02-20 2001-04-10 Cognex Corporation Image processing methods and apparatus for separable, general affine transformation of an image
US6381375B1 (en) 1998-02-20 2002-04-30 Cognex Corporation Methods and apparatus for generating a projection of an image
US6516092B1 (en) 1998-05-29 2003-02-04 Cognex Corporation Robust sub-model shape-finder
US7016539B1 (en) 1998-07-13 2006-03-21 Cognex Corporation Method for fast, robust, multi-dimensional pattern recognition
US6381366B1 (en) 1998-12-18 2002-04-30 Cognex Corporation Machine vision methods and system for boundary point-based comparison of patterns and images
US6687402B1 (en) 1998-12-18 2004-02-03 Cognex Corporation Machine vision methods and systems for boundary feature comparison of patterns and images
DE19905778A1 (de) * 1999-02-12 2000-08-17 Schlafhorst & Co W Verfahren und Vorrichtung zur Bestimmung wenigstens eines Parameters eines fadenförmigen Körpers
US6684402B1 (en) 1999-12-01 2004-01-27 Cognex Technology And Investment Corporation Control methods and apparatus for coupling multiple image acquisition devices to a digital data processor
US6748104B1 (en) 2000-03-24 2004-06-08 Cognex Corporation Methods and apparatus for machine vision inspection using single and multiple templates or patterns
US7006669B1 (en) 2000-12-31 2006-02-28 Cognex Corporation Machine vision method and apparatus for thresholding images of non-uniform materials
US7190834B2 (en) 2003-07-22 2007-03-13 Cognex Technology And Investment Corporation Methods for finding and characterizing a deformed pattern in an image
US8081820B2 (en) * 2003-07-22 2011-12-20 Cognex Technology And Investment Corporation Method for partitioning a pattern into optimized sub-patterns
US7639861B2 (en) 2005-09-14 2009-12-29 Cognex Technology And Investment Corporation Method and apparatus for backlighting a wafer during alignment
US8111904B2 (en) 2005-10-07 2012-02-07 Cognex Technology And Investment Corp. Methods and apparatus for practical 3D vision system
US8162584B2 (en) 2006-08-23 2012-04-24 Cognex Corporation Method and apparatus for semiconductor wafer alignment
DE102008004731A1 (de) * 2007-09-28 2009-04-02 Vienco Gmbh Verfahren und Anordnung zur Bestimmung des Durchmessers eines laufenden Fadens
CN103971457A (zh) * 2013-01-24 2014-08-06 鸿富锦精密工业(武汉)有限公司 掉货检测系统
US9679224B2 (en) 2013-06-28 2017-06-13 Cognex Corporation Semi-supervised method for training multiple pattern recognition and registration tool models

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2565500A (en) * 1947-08-06 1951-08-28 Deering Milliken Res Trust Control of filamentary material
US2548755A (en) * 1947-12-12 1951-04-10 Standard Electronics Res Corp Optical area measuring system
US2699701A (en) * 1950-08-01 1955-01-18 Deering Milliken Res Trust Yarn diameter measuring and recording instrument
CH347358A (de) * 1954-11-18 1960-06-30 Standard Telephon & Radio Ag Vergleichsverfahren zur Prüfung mindestens einer radialen Ausdehnung eines Drahtes
US3187183A (en) * 1960-10-17 1965-06-01 Lindly & Company Inc Balanced output photoelectric gage
US3141057A (en) * 1961-02-15 1964-07-14 Gen Electric Non-contacting measuring apparatus
US3428813A (en) * 1966-05-04 1969-02-18 Jones & Laughlin Steel Corp Photodiodes and heat sensitive resistors in series controlling the same circuit
FR1590632A (US06330241-20011211-M00004.png) * 1968-06-21 1970-04-20
DE2053017A1 (de) * 1970-10-29 1972-05-04 Grundig Emv Verfahren zur berührungslosen Abstandsmessung
US3749500A (en) * 1970-12-23 1973-07-31 Gen Electric Optical caliper and edge detector-follower for automatic gaging
CH534342A (de) * 1971-07-17 1973-02-28 Bbc Brown Boveri & Cie Verfahren zur Ausmessung kleiner Objekte
US4021119A (en) * 1975-06-24 1977-05-03 Honeywell Inc. Position gauge
US4037103A (en) * 1975-08-07 1977-07-19 Exxon Research And Engineering Company Diameter measuring system for cylindrical objects

Also Published As

Publication number Publication date
FR2350581A1 (fr) 1977-12-02
SE7704821L (sv) 1977-11-06
GB1555874A (en) 1979-11-14
DE2718807C2 (de) 1982-09-30
DK184077A (da) 1977-11-06
JPS52134466A (en) 1977-11-10
DE2718807A1 (de) 1977-11-24
NL7704638A (nl) 1977-11-08
FR2350581B1 (US06330241-20011211-M00004.png) 1980-01-18
ES458433A1 (es) 1978-11-16
CA1071396A (en) 1980-02-12
AU505346B2 (en) 1979-11-15
CH611017A5 (US06330241-20011211-M00004.png) 1979-05-15
BE854164A (fr) 1977-09-01
AU2458877A (en) 1978-11-02
US4115702A (en) 1978-09-19

Similar Documents

Publication Publication Date Title
IT1086177B (it) Apparecchio per misurare almeno una dimensione di un oggetto e procedimento per il funzionamento dell'apparecchio stesso
IT1083284B (it) Procedimento e dispositivo per la produzione dell acciaio
IT1116389B (it) Metodo e apparecchiatura per la politura elettrochimica
IT1084064B (it) Dispositivo per la misura della planarita' di nastri metallici
IT1097107B (it) Procedimento ed apparecchiatura per lavorare mediante
IT1140004B (it) Procedimento e dispositivo di misura dell'ovalizzazione di una condotta
IT7849392A0 (it) Apparecchio per separare e misurare parti componenti-campioni
IT1070170B (it) Apparecchio per effettuare misure di conicita
IT1083102B (it) Procedimento e dispositivo per la costruzione di tomogrammi
IT1071586B (it) Apparecchio per determinare il posizionamento di un oggetto
IT1069771B (it) Metodo ed apparecchiatura per la distagnatura continua
IT1086182B (it) Metodo e apparecchiatura per forniere porzioni misurate di una sostanza
IT1116909B (it) Apparecchio per la misura di lunghezze
IT1075551B (it) Procedimento ad autorefrigerazione per la polimerizzazione di olefine e relativa apparecchiatura
SE421594B (sv) Forfarande och anordning for tillverkning av block av olegerade och legerade stal
IT1115500B (it) Procedimento e apparecchiatura di collegamento
IT7847722A0 (it) Procedimento per la pulizia di nastri e relativa apparecchiatura
IT1192195B (it) Procedimento ed apparecchiatura per il pedinamento di oggetti
IT1114173B (it) Apparecchiatura e procedimento di pulitura idordinamici
JPS5393863A (en) Method of measuring idle gap and apparatus for carrying out the method
IT1067327B (it) Procedimento e apparecciatura per estrusione
IT1081166B (it) Procedimento ed apparecchiatura per la elettro-immunoprecipitazione
IT1115868B (it) Procedimento ed apparecchio per la distribuzione di fogli
IT1061084B (it) Apparato per la rivelazione di giunzioni di filo
IT1090805B (it) Procedimento e dispositivo per la produzione di blocchi