IT1006058B - DEVICE FOR ANALYZING AND IDENTIFYING SPECTRA AT RIGH - Google Patents

DEVICE FOR ANALYZING AND IDENTIFYING SPECTRA AT RIGH

Info

Publication number
IT1006058B
IT1006058B IT2561073A IT2561073A IT1006058B IT 1006058 B IT1006058 B IT 1006058B IT 2561073 A IT2561073 A IT 2561073A IT 2561073 A IT2561073 A IT 2561073A IT 1006058 B IT1006058 B IT 1006058B
Authority
IT
Italy
Prior art keywords
righ
analyzing
identifying spectra
spectra
identifying
Prior art date
Application number
IT2561073A
Other languages
Italian (it)
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibm filed Critical Ibm
Application granted granted Critical
Publication of IT1006058B publication Critical patent/IT1006058B/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/205Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials using diffraction cameras

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Spectrometry And Color Measurement (AREA)
IT2561073A 1972-06-26 1973-06-20 DEVICE FOR ANALYZING AND IDENTIFYING SPECTRA AT RIGH IT1006058B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US26611972A 1972-06-26 1972-06-26

Publications (1)

Publication Number Publication Date
IT1006058B true IT1006058B (en) 1976-09-30

Family

ID=23013245

Family Applications (1)

Application Number Title Priority Date Filing Date
IT2561073A IT1006058B (en) 1972-06-26 1973-06-20 DEVICE FOR ANALYZING AND IDENTIFYING SPECTRA AT RIGH

Country Status (6)

Country Link
JP (1) JPS4953094A (en)
CA (1) CA974651A (en)
DE (1) DE2332100A1 (en)
FR (1) FR2191737A5 (en)
GB (1) GB1431207A (en)
IT (1) IT1006058B (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6193936A (en) * 1984-10-13 1986-05-12 Furukawa Electric Co Ltd:The Method for analyzing composition of material to be measured by radiation
GB8826816D0 (en) * 1988-11-16 1988-12-21 Atomic Energy Authority Uk Method for spectrum matching
CN105354419B (en) * 2015-11-02 2018-01-30 中国电子科技集团公司第四十一研究所 A kind of trajectory processing method being applied in spectrum analyzer
CN115112605B (en) * 2022-07-21 2023-08-08 湖南五凌电力科技有限公司 Wavelength correction method for transformer oil spectrum, computer equipment and storage medium
CN116609370A (en) * 2023-04-13 2023-08-18 深圳市埃芯半导体科技有限公司 Wafer detection method and electronic equipment

Also Published As

Publication number Publication date
JPS4953094A (en) 1974-05-23
DE2332100A1 (en) 1974-01-10
CA974651A (en) 1975-09-16
GB1431207A (en) 1976-04-07
FR2191737A5 (en) 1974-02-01

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