IN2014KO00118AIN118KO2014AIN2014KO00118AIN 2014KO00118 AIN2014KO00118 AIN 2014KO00118AIN 118KO2014 AIN118KO2014 AIN 118KO2014AIN 2014KO00118 AIN2014KO00118 AIN 2014KO00118A
Authority
IN
India
Prior art keywords
imaging device
image
ray imaging
intensity
determined
Prior art date
Application number
Inventor
Das Saptarshi
Dubey Satish
Viswanathan Venkateswaran Sornam
Original Assignee
Siemens Ag
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Publication date
Application filed by Siemens AgfiledCriticalSiemens Ag
Priority to IN118KO2014priorityCriticalpatent/IN2014KO00118A/en
Publication of IN2014KO00118ApublicationCriticalpatent/IN2014KO00118A/en
A system and a method for control-l-ing an intens:-ty of X-rays generated by an X-ray imaging device The present. invention anci the embodiments thereof relate to a system (5) and a method for control-ling an intensity of an Xray imaging device (15). An image brightness value is determined for an image (180) obtained therein and an electrical parameter thereof is determined. The image (180) obtained therein is via nonlinear attenuation of visible light (98) obtained from an X-ray detector (40) comprised in the X-ray imaging device (15). The electrj-ca1 paramet'er is thereafter provided to the x-ray imaging device (15) for 15 controlling the intensity of the generated X-rays (10).
imaging device, external device, imaging system, control method for imaging device, control method for external device, control method for imaging system and program