IN2013MU03413A - - Google Patents

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Publication number
IN2013MU03413A
IN2013MU03413A IN3413MU2013A IN2013MU03413A IN 2013MU03413 A IN2013MU03413 A IN 2013MU03413A IN 3413MU2013 A IN3413MU2013 A IN 3413MU2013A IN 2013MU03413 A IN2013MU03413 A IN 2013MU03413A
Authority
IN
India
Prior art keywords
temperature sensor
temperature
bjts
embed
mismatch
Prior art date
Application number
Other languages
English (en)
Inventor
Kwak Kevin
Tiruvuru Rajesh
Mahesh Karanam Krishna
Ravindra Joharapurkar Ashutosh
Original Assignee
Maxim Integrated Products
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Maxim Integrated Products filed Critical Maxim Integrated Products
Priority to IN3413MU2013 priority Critical patent/IN2013MU03413A/en
Priority to US14/171,580 priority patent/US20150117495A1/en
Publication of IN2013MU03413A publication Critical patent/IN2013MU03413A/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/006—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using superconductive elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K15/00—Testing or calibrating of thermometers
    • G01K15/005—Calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/01—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using semiconducting elements having PN junctions
IN3413MU2013 2013-10-29 2013-10-29 IN2013MU03413A (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
IN3413MU2013 IN2013MU03413A (fr) 2013-10-29 2013-10-29
US14/171,580 US20150117495A1 (en) 2013-10-29 2014-02-03 Systems and methods for on-chip temperature sensor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IN3413MU2013 IN2013MU03413A (fr) 2013-10-29 2013-10-29

Publications (1)

Publication Number Publication Date
IN2013MU03413A true IN2013MU03413A (fr) 2015-09-25

Family

ID=52995424

Family Applications (1)

Application Number Title Priority Date Filing Date
IN3413MU2013 IN2013MU03413A (fr) 2013-10-29 2013-10-29

Country Status (2)

Country Link
US (1) US20150117495A1 (fr)
IN (1) IN2013MU03413A (fr)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI558095B (zh) * 2014-05-05 2016-11-11 瑞昱半導體股份有限公司 時脈產生電路與方法
US9804036B2 (en) * 2014-06-19 2017-10-31 Infineon Technologies Ag Temperature sensor calibration
US10088855B2 (en) 2015-05-13 2018-10-02 Infineon Technologies Ag Corrected temperature sensor measurement
US11063870B2 (en) * 2015-12-11 2021-07-13 Arista Networks, Inc. Selective route download traffic sampling
US10341218B2 (en) 2016-02-29 2019-07-02 Arista Networks, Inc. Forwarding information base entry priority
US10228294B2 (en) 2016-05-12 2019-03-12 Infineon Technologies Ag System and method for temperature sensing
US10386243B2 (en) * 2016-11-28 2019-08-20 Nxp Usa, Inc. Temperature sensor circuitry and method therefor
CN110612436B (zh) * 2017-05-15 2022-01-07 株式会社索思未来 温度测定装置以及温度测定方法
US10712210B2 (en) * 2017-12-29 2020-07-14 Nxp Usa, Inc. Self-referenced, high-accuracy temperature sensors
US11431324B1 (en) * 2021-08-25 2022-08-30 Apple Inc. Bandgap circuit with beta spread reduction
TWI778815B (zh) * 2021-09-27 2022-09-21 大陸商常州欣盛半導體技術股份有限公司 動態調整偏壓電流之通道運算放大器電路
US11927493B2 (en) 2021-12-14 2024-03-12 Nxp B.V. Temperature sensor

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4071813A (en) * 1974-09-23 1978-01-31 National Semiconductor Corporation Temperature sensor
US4338580A (en) * 1980-05-09 1982-07-06 Motorola, Inc. Self balancing amplitude modulator
US5068595A (en) * 1990-09-20 1991-11-26 Delco Electronics Corporation Adjustable temperature dependent current generator
US5929689A (en) * 1996-09-05 1999-07-27 Sensarray Corporation Photodetector quiescent current compensation method and apparatus
US5955793A (en) * 1998-02-11 1999-09-21 Therm-O-Disc, Incorporated High sensitivity diode temperature sensor with adjustable current source
US6342997B1 (en) * 1998-02-11 2002-01-29 Therm-O-Disc, Incorporated High sensitivity diode temperature sensor with adjustable current source
US6133749A (en) * 1999-01-04 2000-10-17 International Business Machines Corporation Variable impedance output driver circuit using analog biases to match driver output impedance to load input impedance
US6192859B1 (en) * 1999-05-14 2001-02-27 Robert P. Lefevre Low cost, temperature stable, analog circuit RPM limiter
US7323922B1 (en) * 2004-07-20 2008-01-29 Analog Devices, Inc. Digitally controlled gain stage having an analogue control input
US20080218257A1 (en) * 2007-03-05 2008-09-11 Jaesik Lee Distributed track-and-hold amplifier

Also Published As

Publication number Publication date
US20150117495A1 (en) 2015-04-30

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