IN2013MU02542A - - Google Patents
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- Publication number
- IN2013MU02542A IN2013MU02542A IN2542MU2013A IN2013MU02542A IN 2013MU02542 A IN2013MU02542 A IN 2013MU02542A IN 2542MU2013 A IN2542MU2013 A IN 2542MU2013A IN 2013MU02542 A IN2013MU02542 A IN 2013MU02542A
- Authority
- IN
- India
- Prior art keywords
- electrical
- housing
- under test
- device under
- contacts
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06772—High frequency probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
- H01R12/70—Coupling devices
- H01R12/71—Coupling devices for rigid printing circuits or like structures
- H01R12/712—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit
- H01R12/716—Coupling device provided on the PCB
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/62—Means for facilitating engagement or disengagement of coupling parts or for holding them in engagement
- H01R13/629—Additional means for facilitating engagement or disengagement of coupling parts, e.g. aligning or guiding means, levers, gas pressure electrical locking indicators, manufacturing tolerances
- H01R13/633—Additional means for facilitating engagement or disengagement of coupling parts, e.g. aligning or guiding means, levers, gas pressure electrical locking indicators, manufacturing tolerances for disengagement only
- H01R13/635—Additional means for facilitating engagement or disengagement of coupling parts, e.g. aligning or guiding means, levers, gas pressure electrical locking indicators, manufacturing tolerances for disengagement only by mechanical pressure, e.g. spring force
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/646—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00 specially adapted for high-frequency, e.g. structures providing an impedance match or phase match
- H01R13/6473—Impedance matching
- H01R13/6477—Impedance matching by variation of dielectric properties
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/66—Structural association with built-in electrical component
- H01R13/719—Structural association with built-in electrical component specially adapted for high frequency, e.g. with filters
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R2201/00—Connectors or connections adapted for particular applications
- H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Measuring Leads Or Probes (AREA)
- Connecting Device With Holders (AREA)
- Coupling Device And Connection With Printed Circuit (AREA)
- Details Of Connecting Devices For Male And Female Coupling (AREA)
- Connector Housings Or Holding Contact Members (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US13/662,317 US8714988B1 (en) | 2012-10-26 | 2012-10-26 | Connector for selectively coupling an electrical load to a device under test |
Publications (1)
Publication Number | Publication Date |
---|---|
IN2013MU02542A true IN2013MU02542A (es) | 2015-06-12 |
Family
ID=49518681
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IN2542MU2013 IN2013MU02542A (es) | 2012-10-26 | 2013-08-01 |
Country Status (4)
Country | Link |
---|---|
US (1) | US8714988B1 (es) |
EP (1) | EP2725369A3 (es) |
JP (1) | JP2014086425A (es) |
IN (1) | IN2013MU02542A (es) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9880199B2 (en) | 2014-08-21 | 2018-01-30 | Teradyne, Inc. | Probe alignment connection device |
USD751433S1 (en) * | 2015-01-06 | 2016-03-15 | Modus Test Automation, LLC | Capsule |
US10856432B1 (en) * | 2019-11-27 | 2020-12-01 | TE Connectivity Services Gmbh | Socket connector and cable assembly for a communication system |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4713014A (en) * | 1986-12-23 | 1987-12-15 | Hughes Aircraft Company | Quick-release multi-module terminating assembly |
US6636058B2 (en) | 2001-12-12 | 2003-10-21 | Tektronix, Inc. | Adapter for a multi-channel, low input capacitance signal probe |
US6781391B2 (en) | 2001-12-12 | 2004-08-24 | Tektronix, Inc. | Multi-channel, low input capacitance signal probe and probe head |
US6888361B1 (en) | 2004-03-12 | 2005-05-03 | Tektronix, Inc. | High density logic analyzer probing system |
US7118393B1 (en) * | 2005-08-08 | 2006-10-10 | Tyco Electronics Corporation | Bonded elastomeric connector |
JP4735285B2 (ja) * | 2006-01-24 | 2011-07-27 | パナソニック電工株式会社 | コネクタ |
US7291035B2 (en) * | 2006-02-28 | 2007-11-06 | General Electric Company | System and apparatus for cable connector fastening |
JP5245279B2 (ja) * | 2007-04-16 | 2013-07-24 | 日本電産リード株式会社 | 基板検査用治具及びこの治具における接続電極部の電極構造 |
DE102007054592B4 (de) * | 2007-11-15 | 2014-04-30 | Siemens Aktiengesellschaft | Steckverbindungsvorrichtung, ausgebildet zur Verbindung zweier Funktionselemente zur Signal- und Leistungsübertragung |
US7918670B2 (en) * | 2008-03-28 | 2011-04-05 | Joy Signal Technology, Llc | Cable assembly |
US8963568B2 (en) * | 2010-03-31 | 2015-02-24 | Tektronix, Inc. | Resistive probing tip system for logic analyzer probing system |
-
2012
- 2012-10-26 US US13/662,317 patent/US8714988B1/en not_active Expired - Fee Related
-
2013
- 2013-08-01 IN IN2542MU2013 patent/IN2013MU02542A/en unknown
- 2013-10-25 EP EP13190368.4A patent/EP2725369A3/en not_active Withdrawn
- 2013-10-28 JP JP2013223652A patent/JP2014086425A/ja not_active Ceased
Also Published As
Publication number | Publication date |
---|---|
EP2725369A2 (en) | 2014-04-30 |
US20140120777A1 (en) | 2014-05-01 |
EP2725369A3 (en) | 2017-03-08 |
US8714988B1 (en) | 2014-05-06 |
JP2014086425A (ja) | 2014-05-12 |
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