IN2013MU02485A - - Google Patents

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Publication number
IN2013MU02485A
IN2013MU02485A IN2485MU2013A IN2013MU02485A IN 2013MU02485 A IN2013MU02485 A IN 2013MU02485A IN 2485MU2013 A IN2485MU2013 A IN 2485MU2013A IN 2013MU02485 A IN2013MU02485 A IN 2013MU02485A
Authority
IN
India
Prior art keywords
switching
voltage
current
current versus
under test
Prior art date
Application number
Inventor
N H Sri Krishna
Kumar Patro Gajendra
Bal Abhinav
M N Gurushiddappa
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Priority to IN2485MU2013 priority Critical patent/IN2013MU02485A/en
Priority to US14/257,845 priority patent/US11181581B2/en
Priority to JP2014152213A priority patent/JP6483368B2/en
Priority to CN201410359046.2A priority patent/CN104345193B/en
Priority to EP14178601.2A priority patent/EP2829883B1/en
Publication of IN2013MU02485A publication Critical patent/IN2013MU02485A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/02—Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form
    • G01R13/0218—Circuits therefor
    • G01R13/0236—Circuits therefor for presentation of more than one variable
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • G01R31/2603—Apparatus or methods therefor for curve tracing of semiconductor characteristics, e.g. on oscilloscope
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2608—Circuits therefor for testing bipolar transistors
    • G01R31/2617—Circuits therefor for testing bipolar transistors for measuring switching properties thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16—Spectrum analysis; Fourier analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
    • H02M3/00—Conversion of dc power input into dc power output
    • H02M3/02—Conversion of dc power input into dc power output without intermediate conversion into ac
    • H02M3/04—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters
    • H02M3/10—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode
    • H02M3/145—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal
    • H02M3/155—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal using semiconductor devices only
    • H02M3/156—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal using semiconductor devices only with automatic control of output voltage or current, e.g. switching regulators
    • H02M3/157—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal using semiconductor devices only with automatic control of output voltage or current, e.g. switching regulators with digital control

Abstract

The disclosed technology relates to a method and apparatus for graphically displaying a switching cycle of a switching device. A switching voltage and a switching current are acquired for a device under test via a voltage probe and a current probe, respectively, for a plurality of switching cycles of the device under test. The switching current versus the switching voltage is plotted on a current versus voltage plot as a curve for each of the switching cycles. Each of the curves on the current versus voltage plot overlap each other and are displayed to a user.
IN2485MU2013 2013-07-26 2013-07-26 IN2013MU02485A (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
IN2485MU2013 IN2013MU02485A (en) 2013-07-26 2013-07-26
US14/257,845 US11181581B2 (en) 2013-07-26 2014-04-21 Switching loss measurement and plot in test and measurement instrument
JP2014152213A JP6483368B2 (en) 2013-07-26 2014-07-25 Switching cycle display method and test measurement apparatus
CN201410359046.2A CN104345193B (en) 2013-07-26 2014-07-25 Switching loss measurement and drawing in test and sensing device
EP14178601.2A EP2829883B1 (en) 2013-07-26 2014-07-25 Switching loss measurement and plot in test and measurement instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IN2485MU2013 IN2013MU02485A (en) 2013-07-26 2013-07-26

Publications (1)

Publication Number Publication Date
IN2013MU02485A true IN2013MU02485A (en) 2015-09-25

Family

ID=51485423

Family Applications (1)

Application Number Title Priority Date Filing Date
IN2485MU2013 IN2013MU02485A (en) 2013-07-26 2013-07-26

Country Status (5)

Country Link
US (1) US11181581B2 (en)
EP (1) EP2829883B1 (en)
JP (1) JP6483368B2 (en)
CN (1) CN104345193B (en)
IN (1) IN2013MU02485A (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9465074B2 (en) * 2013-10-09 2016-10-11 Ford Global Technologies, Llc System and method for measuring switching loss associated with semiconductor switching devices
GB2563686A (en) * 2017-06-23 2018-12-26 Nidec Control Techniques Ltd Method and apparatus for monitoring a semiconductor switch
US11705894B2 (en) * 2019-08-27 2023-07-18 Keithley Instruments, Llc Pulsed high current technique for characterization of device under test
JP7413124B2 (en) 2020-03-31 2024-01-15 横河電機株式会社 Waveform measuring device and recalculation method using the waveform measuring device

Family Cites Families (36)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3246177A (en) * 1963-06-19 1966-04-12 Rca Corp Electronic switching circuit employing an insulated gate field-effect transistor having rectifier means connected between its gate and source or drain electrodes
US3278760A (en) * 1964-06-25 1966-10-11 Bell Telephone Labor Inc High speed binary counter
US4287604A (en) * 1979-04-18 1981-09-01 The United States Of America As Represented By The Secretary Of The Navy RF and IF Circuitry of an uplink receiver
JPS6012582B2 (en) 1980-03-12 1985-04-02 三菱電機株式会社 Method for measuring switching loss of power semiconductor devices
US5057760A (en) * 1985-01-31 1991-10-15 Aeg Westinghouse Transportation Systems, Inc. Torque determination for control of an induction motor apparatus
US4934775A (en) * 1989-01-18 1990-06-19 Gte Laboratories Incorporated Optical space switches using cascaded coupled-waveguide optical gate arrays
JP2959960B2 (en) * 1994-06-08 1999-10-06 シャープ株式会社 Information processing device with multiple graph display function
EP0702235A1 (en) * 1994-09-15 1996-03-20 Fluke Corporation Graphical trend display methods and apparatus in a test instrument
US5801519A (en) * 1996-06-21 1998-09-01 The Board Of Trustees Of The University Of Illinois Self-excited power minimizer/maximizer for switching power converters and switching motor drive applications
JP3361047B2 (en) * 1998-01-30 2003-01-07 株式会社東芝 Power supply for vehicles
US6876936B2 (en) 2003-07-25 2005-04-05 Tektronix, Inc. Measurement of inductance using a digital storage oscilloscope under real-time operating environments
US6856127B1 (en) 2003-07-25 2005-02-15 Tektronix, Inc. Oscilloscope-based automatic finder for locating high power dissipation areas in switch-mode power supply (SMPS) switching devices
US7496480B2 (en) * 2003-08-15 2009-02-24 National Instruments Corporation Sweep manager for signal analysis
US7110897B2 (en) 2003-09-22 2006-09-19 Tektronix, Inc. Identification of average total loss and switching loss in duty cycle and/or frequency variation signals acquired across a switching device using a DSO
US20050185769A1 (en) * 2004-02-25 2005-08-25 Pickerd John J. Calibration method and apparatus
JP5240596B2 (en) * 2005-04-22 2013-07-17 独立行政法人産業技術総合研究所 Semiconductor integrated circuit
JP2007064834A (en) * 2005-08-31 2007-03-15 Agilent Technol Inc Device characteristic measuring system
US8116704B2 (en) * 2006-11-09 2012-02-14 Parkervision, Inc. Switching power supply
US7423446B2 (en) * 2006-08-03 2008-09-09 International Business Machines Corporation Characterization array and method for determining threshold voltage variation
JP4553395B2 (en) * 2007-06-15 2010-09-29 シャープ株式会社 Oscilloscope and semiconductor evaluation apparatus using the same
CN101359687B (en) * 2007-07-30 2010-06-09 联华电子股份有限公司 MOS element
US8482564B2 (en) 2007-10-31 2013-07-09 Tektronix, Inc. Region overlap control for autorange/autoset functions
US8278936B2 (en) * 2007-11-23 2012-10-02 Evan Grund Test circuits and current pulse generator for simulating an electrostatic discharge
JP2009257997A (en) 2008-04-18 2009-11-05 Yokogawa Electric Corp Data management system
JP4986940B2 (en) * 2008-06-27 2012-07-25 三菱電機株式会社 Electronic indicator
US20130234103A1 (en) * 2009-08-31 2013-09-12 Hewlett-Packard Development Company, L.P. Nanoscale switching device with an amorphous switching material
US20120018698A1 (en) * 2009-08-31 2012-01-26 Jianhua Yang Low-power nanoscale switching device with an amorphous switching material
JP5717332B2 (en) 2009-11-12 2015-05-13 横河電機株式会社 Digital oscilloscope
JP5296117B2 (en) * 2010-03-12 2013-09-25 東京エレクトロン株式会社 Probe device
CN102832245B (en) * 2011-11-29 2014-12-10 电子科技大学 Super junction MOSFET (Metal-Oxide-Semiconductor Field-Effect Transistor) device with optimized avalanche breakdown current path
US9035624B1 (en) * 2011-12-27 2015-05-19 International Rectifier Corporation Power supply circuitry and current measurement
WO2013132298A1 (en) * 2012-03-04 2013-09-12 Varun Aggarwal Electrical measurement device
US9310408B2 (en) * 2012-04-30 2016-04-12 Keysight Technologies, Inc. Power device analyzer
CN102760761B (en) * 2012-06-30 2014-12-03 东南大学 Latch-preventing N type silicon on insulator transverse isolated gate bipolar transistor
JP2014092370A (en) * 2012-10-31 2014-05-19 Agilent Technologies Inc Volt-ampere characteristic generator
US9641099B2 (en) * 2013-03-15 2017-05-02 Sparq Systems Inc. DC-AC inverter with soft switching

Also Published As

Publication number Publication date
US11181581B2 (en) 2021-11-23
CN104345193A (en) 2015-02-11
US20150032393A1 (en) 2015-01-29
JP2015025807A (en) 2015-02-05
EP2829883A1 (en) 2015-01-28
CN104345193B (en) 2019-07-16
EP2829883B1 (en) 2020-03-25
JP6483368B2 (en) 2019-03-13

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