IN2012DN05048A - - Google Patents

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Publication number
IN2012DN05048A
IN2012DN05048A IN5048DEN2012A IN2012DN05048A IN 2012DN05048 A IN2012DN05048 A IN 2012DN05048A IN 5048DEN2012 A IN5048DEN2012 A IN 5048DEN2012A IN 2012DN05048 A IN2012DN05048 A IN 2012DN05048A
Authority
IN
India
Application number
Inventor
William Henry Lueckenbach
Original Assignee
Ge Intelligent Platforms Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ge Intelligent Platforms Inc filed Critical Ge Intelligent Platforms Inc
Publication of IN2012DN05048A publication Critical patent/IN2012DN05048A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/08—Locating faults in cables, transmission lines, or networks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • G01R31/31715—Testing of input or output circuits; test of circuitry between the I/C pins and the functional core, e.g. testing of input or output driver, receiver, buffer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/40—Testing power supplies
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03B—GENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING, BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN A NON-SWITCHING MANNER; GENERATION OF NOISE BY SUCH CIRCUITS
    • H03B1/00—Details

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Electronic Switches (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Emergency Protection Circuit Devices (AREA)
  • Power Sources (AREA)
  • Direct Current Feeding And Distribution (AREA)
IN5048DEN2012 2009-12-11 2012-06-07 IN2012DN05048A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US12/636,056 US20110140708A1 (en) 2009-12-11 2009-12-11 System, method, and apparatus for providing redundant power control using a digital output module
PCT/US2010/056111 WO2011071644A2 (en) 2009-12-11 2010-11-10 System, methods, and apparatus for providing redundant power control using a digital output module

Publications (1)

Publication Number Publication Date
IN2012DN05048A true IN2012DN05048A (en) 2015-10-09

Family

ID=44142208

Family Applications (1)

Application Number Title Priority Date Filing Date
IN5048DEN2012 IN2012DN05048A (en) 2009-12-11 2012-06-07

Country Status (7)

Country Link
US (1) US20110140708A1 (en)
EP (1) EP2510369A2 (en)
JP (1) JP2013513798A (en)
KR (1) KR20120092703A (en)
CN (1) CN102933976A (en)
IN (1) IN2012DN05048A (en)
WO (1) WO2011071644A2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8698505B2 (en) * 2009-08-06 2014-04-15 Yokogawa Electric Corporation Measurement apparatus detecting consumption current of a display

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EP1356308A4 (en) * 2000-11-08 2005-08-03 Gen Electric Apparatus and method for detecting and calculating ground fault resistance
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US6448748B1 (en) * 2001-03-01 2002-09-10 Teradyne, Inc. High current and high accuracy linear amplifier
US6509722B2 (en) * 2001-05-01 2003-01-21 Agere Systems Inc. Dynamic input stage biasing for low quiescent current amplifiers
US20030095366A1 (en) * 2001-09-21 2003-05-22 John Pellegrino Fault-tolerant power-supply current-sharing apparatus and methods
US6762614B2 (en) * 2002-04-18 2004-07-13 Agilent Technologies, Inc. Systems and methods for facilitating driver strength testing of integrated circuits
US6829188B2 (en) * 2002-08-19 2004-12-07 Micron Technology, Inc. Dual loop sensing scheme for resistive memory elements
US20040230402A1 (en) * 2003-04-29 2004-11-18 Texas Instruments Incorporated Integrated furnace control board and method
SE527677C2 (en) * 2004-02-18 2006-05-09 Peter Sandquist Amplifier with low output impedance and low distortion
JP4092580B2 (en) * 2004-04-30 2008-05-28 新神戸電機株式会社 Multi-series battery control system
US7412305B2 (en) * 2004-05-06 2008-08-12 Tellabs Bedford, Inc. Power supply detection device and method
US7633482B2 (en) * 2005-06-06 2009-12-15 Himax Technologies Limited Operational amplifier circuit having digitally controllable output stage
US7512163B2 (en) * 2005-10-04 2009-03-31 Microsoft Corporation Dual current control for laser diode driver circuit
CN104852346B (en) * 2005-10-27 2018-02-06 施恩禧电气有限公司 Circuit testing closer
US7256626B2 (en) * 2005-11-22 2007-08-14 United Microelectronics Corp. Low-voltage differential signal driver with pre-emphasis circuit
JP2007157944A (en) * 2005-12-02 2007-06-21 Matsushita Electric Ind Co Ltd Semiconductor integrated circuit device
US7505820B2 (en) * 2006-03-30 2009-03-17 Honeywell International Inc. Backup control for solid state power controller (SSPC)
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US8099611B2 (en) * 2008-10-10 2012-01-17 Cisco Technology, Inc. Powered communications interface with pre-operating mode using low voltages and currents for information signaling

Also Published As

Publication number Publication date
EP2510369A2 (en) 2012-10-17
KR20120092703A (en) 2012-08-21
CN102933976A (en) 2013-02-13
WO2011071644A3 (en) 2012-05-10
WO2011071644A2 (en) 2011-06-16
JP2013513798A (en) 2013-04-22
US20110140708A1 (en) 2011-06-16

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